CN116705137B - Test mode switching method for solid state disk - Google Patents
Test mode switching method for solid state disk Download PDFInfo
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- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
Abstract
The application discloses a method for switching test modes of a solid state disk, which comprises the following steps: when a test mode switching instruction indicating that the current test mode is finished is received, acquiring the current test mode and the historical test mode of the solid state disk, and determining a candidate test mode according to the current test mode and the historical test mode; acquiring a first test result of a current test mode; determining target test parameters according to the first test result and the candidate test mode; and calling test software, and setting the test software according to the target test parameters to test the solid state disk in a candidate test mode. Based on the method provided by the application, after the candidate test mode is automatically determined, the target test parameters are adaptively determined according to the first test result and the candidate test mode, so that the automatic switching of the test mode of the solid state disk is realized, and compared with the mode of manually setting the test parameters and switching the test mode in the related art, the reliability of the test of the solid state disk can be effectively improved.
Description
Technical Field
The application relates to the technical field of solid state disks, but is not limited to, and particularly relates to a method for switching test modes of a solid state disk.
Background
The solid state disk, SSD (Solid State Disk) for short, is a carrier for storing data information, has the characteristics of quick reading and writing, light weight, low energy consumption, small volume and the like, and is widely applied to video monitoring equipment, network terminal equipment, power equipment, medical equipment, aviation equipment, navigation equipment and the like. In order to ensure the performance stability of the solid state disk, multiple times of detection are required before the solid state disk leaves the factory. In the related art, after each test mode is completed, the parameters of the next test need to be manually reset according to the test result, so as to realize the switching of the test modes. However, by manually setting the test parameters and switching the test modes, errors corresponding to the test parameters and the test modes are easy to occur, so that the reliability of the test result of the solid state disk is low.
Disclosure of Invention
The embodiment of the application provides a solid state disk detection method, a system and a storage medium, which can effectively improve the reliability of solid state disk testing.
The embodiment of the application provides a method for switching test modes of a solid state disk, which comprises the following steps:
when a test mode switching instruction representing that a current test mode is finished is received, acquiring the current test mode and a historical test mode of the solid state disk, and determining a candidate test mode according to the current test mode and the historical test mode;
acquiring a first test result of the current test mode;
determining target test parameters according to the first test result and the candidate test mode;
and calling test software, and setting the test software to test the solid state disk in the candidate test mode according to the target test parameters.
The method for switching the test modes of the solid state disk has the following advantages: when a test mode switching instruction representing that the current test mode is finished is received, the current test mode and the historical test mode of the solid state disk are obtained, so that candidate test modes are determined according to the current test mode and the historical test mode, the problem that the candidate test modes are repeated with the current test mode and the historical test mode is avoided, and the efficiency of testing the solid state disk is improved. The method comprises the steps of obtaining a first test result of a current test mode, and determining target test parameters according to the first test result and the candidate test mode, so that the target test parameters for the candidate test mode are selected in a self-adaptive mode based on the first test result, the target test parameters and the candidate test mode can be guaranteed to correspond to each other, and further the reliability of the solid state disk test is guaranteed. And then, calling test software, and setting the test software to test the solid state disk in a candidate test mode according to the target test parameters so as to realize automatic switching of the test mode of the solid state disk. According to the method for switching the test modes of the solid state disk, after the candidate test mode is automatically determined, the target test parameters are adaptively determined according to the first test result and the candidate test mode, so that the automatic switching of the test modes of the solid state disk is realized, and compared with the mode of manually setting the test parameters and switching the test modes in the related technology, the reliability of the test of the solid state disk can be effectively improved.
According to some embodiments of the present application, the number of test patterns is at least two, and the determining the candidate test pattern according to the current test pattern and the historical test pattern includes:
determining at least one mode to be tested from the test modes according to the current test mode and the historical test mode;
determining the corresponding demand parameters of each to-be-tested mode according to a preset test mode-demand parameter mapping table;
determining standard result parameters according to the current test mode;
and matching each demand parameter with the standard result parameter to obtain a matching result, and determining the candidate test mode from each to-be-tested mode according to the matching result.
According to some embodiments of the present application, the matching the requirement parameter and the standard result parameter to obtain a matching result, and determining the candidate test mode from the to-be-tested modes according to the matching result includes:
matching each required parameter with the standard result parameter result to obtain a parameter matching duty ratio corresponding to each mode to be tested;
sequencing the modes to be tested according to the parameter matching duty ratio to obtain the matching result;
and determining the highest-ranking mode to be tested in the matching result as the candidate test mode.
According to some embodiments of the present application, the test mode switch instruction is generated by:
monitoring serial port log information of the current test mode, and generating the test mode switching instruction when the serial port log information indicates that the current test mode is completed;
or,
and acquiring the test time length of the current test mode, and generating the test mode switching instruction when the test time length is greater than a preset test time length threshold value.
According to some embodiments of the application, the determining the target test parameter according to the first test result and the candidate test pattern includes:
preprocessing the first test result to obtain initial test parameters;
and determining candidate demand parameters according to the test mode-demand parameter mapping table and the candidate test mode, and extracting the initial test parameters according to the candidate demand parameters to obtain the target test parameters.
According to some embodiments of the present application, the preprocessing the first test result to obtain initial test parameters includes: performing parameter filtering treatment on the first test result to obtain a reference test result; and classifying the reference test result to obtain the initial test parameters.
According to some embodiments of the present application, the test mode includes a Highlow mode, a Butterfly mode, a Random mode, and a Default mode.
According to some embodiments of the present application, the candidate test pattern may also be selected by: acquiring tail parameters of the first test result, wherein the tail parameters are used for indicating a next test mode; and determining the candidate test mode according to the tail parameter.
According to some embodiments of the present application, the method further comprises: accumulating the number of times of testing the solid state disk; and stopping the testing of the solid state disk when the number of times of completing the testing reaches the total number of the testing modes.
According to some embodiments of the present application, in the determining the target test parameter according to the first test result and the candidate test pattern, the method further includes: and responding to a specified test mode instruction comprising specified test mode information, and updating the test mode corresponding to the specified test mode information to the currently determined candidate test mode.
Drawings
The accompanying drawings are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate and do not limit the invention.
FIG. 1 is a flow chart of steps of a method for switching test modes of a solid state disk according to an embodiment of the present application;
FIG. 2 is a flow chart of steps of a candidate test pattern determination method provided in one embodiment of the present application;
FIG. 3 is a flow chart of steps of a candidate test pattern determination method provided in another embodiment of the present application;
FIG. 4 is a flowchart of steps in a method for determining a target test parameter according to one embodiment of the present application;
FIG. 5 is a flowchart of steps in a method for obtaining initial test parameters provided by one embodiment of the present application;
FIG. 6 is a flowchart illustrating a method for switching test modes of a solid state disk according to another embodiment of the present disclosure;
FIG. 7 is a flowchart illustrating a method for switching test modes of a solid state disk according to another embodiment of the present disclosure;
fig. 8 is a schematic hardware structure of an electronic device according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the present application.
It will be appreciated that although functional block diagrams are depicted in the device diagrams, logical sequences are shown in the flowchart, in some cases, the steps shown or described may be performed in a different order than the block diagrams in the device. The terms first, second and the like in the description, in the claims and in the above-described figures, are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order.
The application provides a method for switching test modes of a solid state disk, which is used for acquiring a current test mode and a historical test mode of the solid state disk when a test mode switching instruction representing that the current test mode is ended is received, so that candidate test modes can be conveniently determined according to the current test mode and the historical test mode, and the problem that the candidate test modes are repeated with the current test mode and the historical test mode is avoided, so that the efficiency of testing the solid state disk is improved. The method comprises the steps of obtaining a first test result of a current test mode, and determining target test parameters according to the first test result and the candidate test mode, so that the target test parameters for the candidate test mode are selected in a self-adaptive mode based on the first test result, the target test parameters and the candidate test mode can be guaranteed to correspond to each other, and further the reliability of the solid state disk test is guaranteed. And then, calling test software, and setting the test software to test the solid state disk in a candidate test mode according to the target test parameters so as to realize automatic switching of the test mode of the solid state disk. According to the method for switching the test modes of the solid state disk, after the candidate test mode is automatically determined, the target test parameters are adaptively determined according to the first test result and the candidate test mode, so that the automatic switching of the test modes of the solid state disk is realized, and compared with the mode of manually setting the test parameters and switching the test modes in the related technology, the reliability of the test of the solid state disk can be effectively improved.
Embodiments of the present application are further described below with reference to the accompanying drawings.
Referring to fig. 1, fig. 1 is a step flowchart of a method for switching a test mode of a solid state disk according to an embodiment of the present application, where the method for switching a test mode of a solid state disk includes, but is not limited to, the following steps:
step S110, when a test mode switching instruction indicating that the current test mode is finished is received, acquiring the current test mode and the historical test mode of the solid state disk, and determining a candidate test mode according to the current test mode and the historical test mode;
step S120, a first test result of a current test mode is obtained;
step S130, determining target test parameters according to the first test result and the candidate test mode;
and step S140, calling test software, and setting the test software according to the target test parameters to test the solid state disk in a candidate test mode.
It should be noted that, the embodiment of the present application does not limit the specific type of calling the Test software, and may call only the BIT Test software, or call both the BIT Test software and the sds Test software, or call the H2Test software, etc.
It can be understood that when a test mode switching instruction indicating that the current test mode is finished is received, the current test mode and the history test mode of the solid state disk are obtained, so that the candidate test mode is determined according to the current test mode and the history test mode, and the problem that the candidate test mode is repeated with the current test mode and the history test mode is avoided, so that the efficiency of testing the solid state disk is improved. The method comprises the steps of obtaining a first test result of a current test mode, and determining target test parameters according to the first test result and the candidate test mode, so that the target test parameters for the candidate test mode are selected in a self-adaptive mode based on the first test result, the mutual correspondence between the target test parameters and the candidate test mode can be ensured, the problem of error setting of the test parameters is reduced, and the reliability of the solid state disk test is effectively ensured. And then, calling test software, and setting the test software to test the solid state disk in a candidate test mode according to the target test parameters so as to realize automatic switching of the test mode of the solid state disk. According to the method for switching the test modes of the solid state disk, after the candidate test mode is automatically determined, the target test parameters are adaptively determined according to the first test result and the candidate test mode, so that the automatic switching of the test modes of the solid state disk is realized, and compared with the mode of manually setting the test parameters and switching the test modes in the related technology, the reliability of the test of the solid state disk can be effectively improved.
It can be understood that after the target test parameters are determined according to the first test result and the candidate test mode, the solid state disk can be safely erased, so as to ensure the accuracy of the next test.
It may be understood that the embodiment of the present application does not limit a specific manner of determining the target test parameter, and may screen the target test parameter from the first test result according to the candidate test mode, or calculate the first test result according to the candidate test mode to obtain the target test parameter, or automatically set the target test parameter according to the condition of the first test result and the candidate test mode, etc.
In addition, referring to fig. 2, in an embodiment, the number of test modes is at least two, and step S110 in the embodiment shown in fig. 1 further includes, but is not limited to, the following steps:
step S210, determining at least one mode to be tested from the test modes according to the current test mode and the historical test mode;
step S220, according to a preset test mode-requirement parameter mapping table, the requirement parameters corresponding to each mode to be tested are determined;
step S230, determining standard result parameters according to the current test mode;
and step S240, matching each demand parameter with the standard result parameter to obtain a matching result, and determining a candidate test mode from each to-be-tested mode according to the matching result.
It should be noted that, the embodiment of the present application does not limit the specific content of the preset test mode-requirement parameter mapping table, and one test mode may correspond to one requirement parameter, or one test mode may correspond to a plurality of requirement parameters.
It can be understood that each test mode corresponds to a standard result parameter, and the standard result parameter is a parameter to be output after the test of the test mode is completed under the standard condition, and can play a role of reference. The standard result parameters corresponding to each test mode may be preset by a worker, or may be set by the test software itself, which is not described herein.
It can be understood that the number of test modes is at least two, and the current test mode and the historical test mode are removed from the plurality of test modes to determine at least one test mode to be tested, so that the problem that the candidate test mode determined later is repeated with the current test mode and the historical test mode can be avoided. And determining the corresponding demand parameters of each mode to be tested according to a preset test mode-demand parameter mapping table. And determining standard result parameters according to the current test mode so as to conveniently match each demand parameter with the standard result parameters to obtain a matched result, and when the demand parameters and the standard result parameters are successfully matched, indicating that parameters which can be directly or indirectly used for testing the to-be-tested mode corresponding to the demand parameters exist in the first test result of the current test mode. And determining candidate test modes from all the modes to be tested according to the matching result, so as to realize self-adaptive selection of a proper mode to be tested as the candidate test mode, and effectively improve the test reliability of the solid state disk.
In addition, referring to fig. 3, in an embodiment, step S240 in the embodiment shown in fig. 2 further includes, but is not limited to, the following steps:
step S310, matching each demand parameter with the standard result parameter result to obtain the parameter matching duty ratio corresponding to each mode to be tested;
step S320, sorting all the modes to be tested according to the parameter matching duty ratio to obtain a matching result;
step S330, determining the highest-ranking mode to be tested in the matching result as a candidate test mode.
It can be understood that the result of each requirement parameter and the result of the standard result parameter are matched, when the requirement parameter and the standard result parameter are successfully matched, it is indicated that the first test result of the current test mode has the parameter which can be directly or indirectly used for testing the to-be-tested mode corresponding to the requirement parameter, and the parameter matching duty ratio corresponding to each to-be-tested mode is obtained. And sequencing all the modes to be tested according to the parameter matching duty ratio to obtain a matching result, and determining the mode to be tested with the highest sequencing in the matching result as a candidate test mode.
It can be understood that the higher the parameter matching duty ratio corresponding to the to-be-tested mode, the more the number of parameters which can be directly or indirectly used for testing with the to-be-tested mode is in the first test result of the current test mode, the highest-ordered to-be-tested mode in the matching result is determined as a candidate test mode, the first test result of the current test mode can be fully utilized, the target test parameters are determined in a self-adaptive manner according to the first test result, the fixed test parameters are reduced and set to be close to a real test scene, and the test accuracy of the solid state disk is further ensured.
It can be understood that when there are a plurality of first to-be-tested modes in parallel ordering in the matching result, the first to-be-tested modes in parallel ordering can be ordered according to the test time length, the to-be-tested mode with the minimum test time length is selected as a candidate test mode, or the first to-be-tested modes in parallel ordering can be ordered according to the preset test priority, and the to-be-tested mode with the highest test priority is selected as a candidate test mode.
Additionally, in one embodiment, the test mode switch instruction is generated by:
monitoring serial port log information of a current test mode, and generating a test mode switching instruction when the serial port log information indicates that the current test mode is completed;
or,
and acquiring the test time length of the current test mode, and generating a test mode switching instruction when the test time length is greater than a preset test time length threshold value.
The embodiment of the application does not limit the specific mode of confirming that the current test mode is completed according to the serial port log information, and can confirm the data processing performance of the current solid state disk according to the serial port log information, confirm that the current test mode is completed when the data processing performance of the solid state disk meets the preset requirement, detect the content of the serial port log information, and confirm that the current test mode is completed when the serial port log information comprises a preset completion test identifier.
It can be understood that monitoring the serial port log information of the current test mode can accurately confirm the data processing performance of the current solid state disk, so as to check whether the performance of the solid state disk meets the preset factory requirement and whether the current test mode is completed. When the serial port log information indicates that the current test mode is completed, a test mode switching instruction is generated, so that the problem of interrupting the current test mode can be avoided, and the test reliability of the solid state disk can be ensured.
It can be understood that the test time length of the current test mode is obtained, when the test time length is greater than the preset test time length threshold value, the current test mode is indicated to meet the preset test time, the current test mode is completed, a test mode switching instruction is generated, the problem that the test time of the current test mode is too long can be avoided, the current test mode is switched to the next side test in time, and the test efficiency of the solid state disk is effectively improved.
In addition, referring to fig. 4, in an embodiment, step S130 in the embodiment shown in fig. 1 further includes, but is not limited to, the following steps:
step S410, preprocessing the first test result to obtain initial test parameters;
step S420, determining candidate demand parameters according to the test mode-demand parameter mapping table and the candidate test mode, and extracting initial test parameters according to the candidate demand parameters to obtain target test parameters.
It can be understood that the first test result is preprocessed to obtain the initial test parameters, so as to ensure the parameter quality of the initial test parameters, and improve the extraction efficiency of the subsequent extraction of the initial test parameters. According to the test mode-demand parameter mapping table and the candidate test mode, candidate demand parameters are determined, initial test parameters are extracted according to the candidate demand parameters, parameters matched with the candidate demand parameters in the initial test parameters are extracted, and further target test parameters are obtained, so that the target test parameters can be close to a real test scene, the problem that the test parameters correspond to the test mode in an incorrect mode can be avoided, and the accuracy of testing the solid state disk is effectively guaranteed.
In addition, referring to fig. 5, in an embodiment, step S410 in the embodiment shown in fig. 4 further includes, but is not limited to, the following steps:
step S510, performing parameter filtering processing on the first test result to obtain a reference test result;
step S520, classifying the reference test results to obtain initial test parameters.
It can be understood that the first test result is subjected to parameter filtering processing, and the missing parameter, the accidental parameter and the irrelevant parameter are filtered to obtain a reference test result, so as to ensure the parameter quality of the reference test result. And then, classifying the reference test results to collect the same type of parameters together to obtain initial test parameters with clear parameter structures, so as to improve the extraction efficiency of the subsequent extraction of the initial test parameters.
It is understood that the first test result may include a reading speed of 300MB/s corresponding to the first 16MB size file, a reading speed of 400MB/s corresponding to the second 16MB size file, a reading speed of 400MB/s corresponding to the third 18MB size file, and a reading speed of 600MB/s corresponding to the fourth 18MB size file. Parameters corresponding to the same file size may be classified as one type, or parameters corresponding to the same reading speed may be classified as one type, for example, a reading speed corresponding to a first 16 MB-sized file is 300MB/s and a reading speed corresponding to a second 16 MB-sized file is 400MB/s, or a reading speed corresponding to a second 16 MB-sized file is 400MB/s and a reading speed corresponding to a third 18 MB-sized file is 400 MB/s.
In addition, in one embodiment, the test modes include a Highlow mode, a Butterfly mode, a Random mode, and a Default mode.
It can be understood that the Highlow mode is used for testing the read-write performance of the solid state disk under the condition of overweight of high and low frequency data; the Butterfly mode is used for testing the seek performance of the solid state disk; the Random mode is used for testing the Random data read-write performance of the solid state disk; the Default mode is used for testing the data integrity of the solid state disk in data transmission.
It can be understood that, in each test mode, data operations may be performed multiple times according to a preset test rule, for example, in the Highlow mode, the depth parameter of the IO queue is set to be 32, and data operations with different data sizes are performed on the solid state disk, where the obtained test result includes throughput corresponding to the data operations with different data sizes, that is, there are multiple throughput parameters. Thus, after the completion of the different test modes, there may be a plurality of parameters of the same type in the output test results.
It can be understood that the demand parameters of the high-speed mode include an IO queue depth parameter, when the candidate test mode is the high-speed mode, the IO queue depth parameter is extracted from the first test result, when a plurality of IO queue depth parameters exist, the plurality of IO queue depth parameters are ordered according to the read-write speed in the current test mode, and the highest-ordered IO queue depth parameter is selected as the target test parameter, which indicates that the IO performance of the solid state disk under the IO queue depth parameter is better, so that the influence of the IO queue depth on the test of the high-speed mode is reduced, and the reliability of the read-write performance of the solid state disk under the condition of overweight high-low frequency data can be effectively improved.
It can be understood that the demand parameters of the button mode include a dirty disc duty ratio parameter, the read-write performance stability of the solid state disk corresponding to different dirty disc duty ratio parameters is different, the excessive dirty disc duty ratio can cause the solid state disk to run slowly, when the candidate test mode is the button mode, the dirty disc duty ratio parameter is extracted from the first test result, when a plurality of dirty disc duty ratio parameters exist, the intermediate value of the dirty disc duty ratio parameter is calculated, and the intermediate value of the dirty disc duty ratio parameter is used as a target test parameter, so that the problem that the output seek performance result is unreliable due to the fact that the dirty disc duty ratio parameter is set too much is avoided.
It can be understood that the demand parameters of the Random mode include temperature parameters, different temperatures can affect the reading performance of the solid state disk, when the candidate test mode is the Random mode, the temperature parameters are extracted from the first test result, when a plurality of temperature parameters exist, the average value of the temperature parameters is calculated, and the calculated average value is used as a target test parameter, so that the influence of the temperature parameters on the test of the Random mode is reduced, and the reliability of the Random data reading and writing performance of the solid state disk can be effectively improved.
It can be understood that the demand parameters of the Default mode include the number of idle data blocks, the number of different idle data blocks affects the reading speed of the solid state disk, when the candidate test mode is the Default mode, the number of idle data blocks is extracted from the first test result, when there are a plurality of idle data blocks, the average value of the number of idle data blocks is calculated, and the calculated average value is used as a target test parameter, so as to reduce the influence of the number of idle data blocks on the test of the Default mode, and ensure the test reliability of the Default mode.
Additionally, in one embodiment, the candidate test patterns may also be selected by:
acquiring tail parameters of the first test result, wherein the tail parameters are used for indicating the next test mode;
and determining candidate test modes according to the tail parameters.
It can be understood that the tail parameter of the first test result is obtained, the tail parameter is used for indicating the next test mode, and the candidate test mode is determined according to the tail parameter, so that each test mode can be orderly performed.
In addition, referring to fig. 6, in an embodiment, the method for switching test modes of the solid state disk further includes, but is not limited to, the following steps:
step S610, the number of times of testing the solid state disk is accumulated;
and step S620, when the number of times of completing the test reaches the total number of test modes, the test of the solid state disk is terminated.
It can be understood that the number of times of completing the test of the solid state disk is accumulated, and when the number of times of completing the test reaches the total number of test modes, it is indicated that all the test modes are completed, and the test of the solid state disk is terminated, so that the repeated test is avoided.
In addition, referring to fig. 7, in an embodiment, before step S130 in the embodiment shown in fig. 1, the method for switching test modes of the solid state disk further includes, but is not limited to, the following steps:
step S710, in response to the specified test mode instruction including the specified test mode information, updating the currently determined candidate test mode with the test mode corresponding to the specified test mode information.
It can be understood that, in response to a specified test mode instruction including specified test mode information, a test mode corresponding to the specified test mode information is updated to the currently determined candidate test mode, so that a tester can actively modify the candidate test mode according to actual test requirements.
In addition, referring to fig. 8, an embodiment of the present application further provides an electronic device 800, where the terminal includes: memory 810, processor 820, and a computer program stored on memory 810 and executable on processor 820.
Processor 820 and memory 810 may be connected by a bus or other means.
The non-transitory software program and instructions required to implement the test mode switching method of the solid state disk of the above embodiment are stored in the memory 810, and when executed by the processor 820, the test mode switching method of the solid state disk of the above embodiment is performed, for example, the method steps S110 to S140 in fig. 1, the method steps S210 to S240 in fig. 2, the method steps S310 to S330 in fig. 3, the method steps S410 to S420 in fig. 4, the method steps S510 to S520 in fig. 5, the method steps S610 to S620 in fig. 6, and the method step S710 in fig. 7 described above are performed.
The above described apparatus embodiments are merely illustrative, wherein the units illustrated as separate components may or may not be physically separate, i.e. may be located in one place, or may be distributed over a plurality of network elements. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
Furthermore, an embodiment of the present application further provides a computer readable storage medium storing computer executable instructions that are executed by a processor 820 or a controller, for example, by one processor 820 in the embodiment of the electronic device 800, which may cause the processor 820 to perform the test mode switching method of the solid state disk in the embodiment described above, for example, perform the method steps S110 to S140 in fig. 1, the method steps S210 to S240 in fig. 2, the method steps S310 to S330 in fig. 3, the method steps S410 to S420 in fig. 4, the method steps S510 to S520 in fig. 5, the method steps S610 to S620 in fig. 6, and the method step S710 in fig. 7 described above. Those of ordinary skill in the art will appreciate that all or some of the steps, systems, and methods disclosed above may be implemented as software, firmware, hardware, and suitable combinations thereof. Some or all of the physical components may be implemented as software executed by a processor 820, such as a central processing unit, digital signal processor, or microprocessor, or as hardware, or as an integrated circuit, such as an application specific integrated circuit. Such software may be distributed on computer readable media, which may include computer storage media (or non-transitory media) and communication media (or transitory media). The term computer storage media includes both volatile and nonvolatile, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data, as known to those skilled in the art. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital Versatile Disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can be accessed by a computer. Furthermore, as is well known to those of ordinary skill in the art, communication media typically embodies computer readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism and includes any information delivery media.
In the description of the present specification, reference to the terms "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
While the preferred embodiments of the present application have been described in detail, the present application is not limited to the above embodiments, and various equivalent modifications and substitutions can be made by those skilled in the art without departing from the spirit of the present application, and these equivalent modifications and substitutions are intended to be included in the scope of the present application as defined in the appended claims.
Claims (8)
1. The method for switching the test mode of the solid state disk is characterized by comprising the following steps of:
when a test mode switching instruction representing that a current test mode is finished is received, acquiring the current test mode and a historical test mode of the solid state disk, and determining a candidate test mode according to the current test mode and the historical test mode;
acquiring a first test result of the current test mode;
determining target test parameters according to the first test result and the candidate test mode;
calling test software, and setting the test software to test the solid state disk in the candidate test mode according to the target test parameters;
wherein the number of test patterns is at least two, and determining a candidate test pattern according to the current test pattern and the historical test pattern includes:
determining at least one mode to be tested from the test modes according to the current test mode and the historical test mode;
determining the corresponding demand parameters of each to-be-tested mode according to a preset test mode-demand parameter mapping table;
determining standard result parameters according to the current test mode;
matching each demand parameter with the standard result parameter to obtain a matching result, and determining the candidate test mode from each to-be-tested mode according to the matching result;
and matching each requirement parameter with the standard result parameter to obtain a matching result, and determining the candidate test mode from each mode to be tested according to the matching result, wherein the method comprises the following steps:
matching each required parameter with the standard result parameter result to obtain a parameter matching duty ratio corresponding to each mode to be tested;
sequencing the modes to be tested according to the parameter matching duty ratio to obtain the matching result;
and determining the highest-ranking mode to be tested in the matching result as the candidate test mode.
2. The method for switching test modes of a solid state disk according to claim 1, wherein the test mode switching instruction is generated by:
monitoring serial port log information of the current test mode, and generating the test mode switching instruction when the serial port log information indicates that the current test mode is completed;
or,
and acquiring the test time length of the current test mode, and generating the test mode switching instruction when the test time length is greater than a preset test time length threshold value.
3. The method for switching test modes of a solid state disk according to claim 1, wherein determining a target test parameter according to the first test result and the candidate test mode comprises:
preprocessing the first test result to obtain initial test parameters;
and determining candidate demand parameters according to the test mode-demand parameter mapping table and the candidate test mode, and extracting the initial test parameters according to the candidate demand parameters to obtain the target test parameters.
4. The method for switching a test mode of a solid state disk according to claim 3, wherein preprocessing the first test result to obtain initial test parameters includes:
performing parameter filtering treatment on the first test result to obtain a reference test result;
and classifying the reference test result to obtain the initial test parameters.
5. The method for switching a test mode of a solid state disk according to claim 4, wherein the test mode includes a Highlow mode, a button mode, a Random mode, and a Default mode.
6. The method for switching test modes of a solid state disk according to claim 1, wherein the candidate test modes are selected by:
acquiring tail parameters of the first test result, wherein the tail parameters are used for indicating a next test mode;
and determining the candidate test mode according to the tail parameter.
7. The method for switching test modes of a solid state disk according to claim 6, further comprising:
accumulating the number of times of testing the solid state disk;
and stopping the testing of the solid state disk when the number of times of completing the testing reaches the total number of the testing modes.
8. The method for switching test modes of a solid state disk according to claim 1, wherein, in the determining a target test parameter according to the first test result and the candidate test mode, the method further comprises:
and responding to a specified test mode instruction comprising specified test mode information, and updating the test mode corresponding to the specified test mode information to the currently determined candidate test mode.
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