CN116705138A - Solid state disk testing method and storage medium - Google Patents
Solid state disk testing method and storage medium Download PDFInfo
- Publication number
- CN116705138A CN116705138A CN202310517363.1A CN202310517363A CN116705138A CN 116705138 A CN116705138 A CN 116705138A CN 202310517363 A CN202310517363 A CN 202310517363A CN 116705138 A CN116705138 A CN 116705138A
- Authority
- CN
- China
- Prior art keywords
- solid state
- test
- state disk
- preset
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 480
- 239000007787 solid Substances 0.000 title claims abstract description 415
- 238000000034 method Methods 0.000 claims abstract description 52
- 238000005192 partition Methods 0.000 claims description 87
- 238000012795 verification Methods 0.000 claims description 34
- 230000003321 amplification Effects 0.000 claims description 15
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 15
- 238000013112 stability test Methods 0.000 claims description 15
- 230000000391 smoking effect Effects 0.000 claims description 12
- 238000011056 performance test Methods 0.000 claims description 9
- 230000008859 change Effects 0.000 claims description 8
- 230000005059 dormancy Effects 0.000 claims description 8
- 230000002159 abnormal effect Effects 0.000 claims description 7
- 238000004422 calculation algorithm Methods 0.000 claims description 5
- 238000012217 deletion Methods 0.000 claims description 5
- 230000037430 deletion Effects 0.000 claims description 5
- 238000000638 solvent extraction Methods 0.000 claims description 5
- 230000006870 function Effects 0.000 description 16
- 230000000903 blocking effect Effects 0.000 description 6
- 238000009434 installation Methods 0.000 description 5
- 238000001514 detection method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 230000007958 sleep Effects 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000006467 substitution reaction Methods 0.000 description 2
- 240000000662 Anethum graveolens Species 0.000 description 1
- 241001669679 Eleotris Species 0.000 description 1
- 244000062793 Sorghum vulgare Species 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000013524 data verification Methods 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 235000019713 millet Nutrition 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000004064 recycling Methods 0.000 description 1
- 239000000779 smoke Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 230000007723 transport mechanism Effects 0.000 description 1
- 238000011282 treatment Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
Landscapes
- Recording Or Reproducing By Magnetic Means (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
The application discloses a method for testing solid state disks and a storage medium, wherein each test is to randomly extract a certain number of solid state disks from all solid state disks to be tested after card opening is completed for testing, so that batch testing of the solid state disks can be realized, and meanwhile, the accident of test results can be reduced. And after the current test is passed, automatically reselecting a certain number of solid state disks from all the solid state disks to be tested which are subjected to card opening, and carrying out the next test on the solid state disks so as to realize automatic switching among the tests. Based on the testing method of the solid state disk, after a certain number of solid state disks are selected for testing, a certain number of solid state disks are selected again for next testing, so that batch testing and automatic testing are achieved, and compared with the technical scheme that the solid state disks are manually replaced with a testing platform and a testing mode is started for next testing in the related art, the testing efficiency of the solid state disk can be effectively improved.
Description
Technical Field
The application relates to the technical field of solid state disks, in particular to a method for testing a solid state disk and a storage medium.
Background
The Solid State Disk (SSD) is a carrier for storing data information, has the characteristics of quick reading and writing, light weight, low energy consumption, small volume and the like, and is widely applied to video monitoring equipment, network terminal equipment, power equipment, medical equipment, aviation equipment, navigation equipment and the like. In order to ensure the performance stability of the solid state disk, multiple times of detection are required before the solid state disk leaves the factory. In the related art, the detection efficiency of the solid state disk is ensured by extracting a plurality of solid state disks and performing a targeted detection flow one by one. However, the test functions executed by each test platform are different, and after one test is completed, the test platform needs to be manually replaced and a test mode is started to perform the next test, so that large labor and time cost are consumed, and the test efficiency of the solid state disk is low.
Disclosure of Invention
The embodiment of the application provides a method for testing a solid state disk and a storage medium, which can effectively improve the testing efficiency of the solid state disk.
In a first aspect, an embodiment of the present application provides a method for testing a solid state disk, where the solid state disk is connected to a testing device through a testing interface, the testing device includes a plurality of testing platforms, and each testing platform provides one testing interface to connect with one solid state disk to be tested, so as to perform batch testing; comprising the following steps:
All the solid hard disks to be tested are opened and clamped into an RDT mode;
randomly extracting a first number of solid state disks from the solid state disks to be tested which are all subjected to card opening, and carrying out smoking test;
when the smoking test passes, randomly extracting a second number of solid state disks from the solid state disks to be tested which are all subjected to card opening, and performing read-write function test;
when the read-write function test passes, randomly extracting a third number of solid state disks from the solid state disks to be tested, which are all subjected to card opening, and sequentially executing a plurality of preset stability test modes on the extracted solid state disks;
when all the stability test modes pass, randomly extracting a fourth number of solid state disks from all the solid state disks to be tested after card opening is completed again to perform pressure test;
when the pressure test passes, selecting a test platform of a target type according to the type of the test platform, and performing working power consumption test and working temperature test on the solid state disk of the test platform of the target type;
when the working power consumption test and the working temperature test are passed, selecting a first solid state disk and a second solid state disk from the solid state disks to be tested, which are all subjected to card opening, setting writing data of at least two preset test software as target writing data, performing performance test on the first solid state disk and the second solid state disk through the test software and the target writing data, comparing result parameters of the performance test with standard parameters, and determining performance conditions of the first solid state disk and the second solid state disk;
And outputting a test result.
The method for testing the solid state disk according to the embodiment of the first aspect of the application has at least the following beneficial effects: the test equipment is provided with a plurality of test platforms, each test platform is provided with a test interface to be connected with a solid state disk to be tested, and each test is to randomly extract a certain number of solid state disks from all the solid state disks to be tested after card opening is completed for testing, so that batch testing of the solid state disks can be realized, meanwhile, the contingency of test results can be reduced, and the test reliability of the solid state disks is effectively improved. After the current test is passed, a certain number of solid state disks are automatically selected again from all the solid state disks to be tested after card opening is completed, and the next test is carried out on the solid state disks so as to realize automatic switching among the tests, and after all the tests are completed, test results are output, so that the test efficiency of the solid state disks can be effectively improved. Based on the testing method of the solid state disk, after a certain number of solid state disks are selected for testing, a certain number of solid state disks are selected again for next testing, so that batch testing and automatic testing are achieved, and compared with the technical scheme that the solid state disks are manually replaced with a testing platform and a testing mode is started for next testing in the related art, the testing efficiency of the solid state disk can be effectively improved.
According to some embodiments of the first aspect of the present application, the read-write function test comprises the steps of:
acquiring basic information of the solid state disk;
performing power failure test on the solid state disk to obtain information to be compared after the test is completed;
when the basic information is the same as the information to be compared, a serial port log of the solid state disk is obtained, and a write amplification factor is extracted from the serial port log;
when the write amplification factor belongs to a preset write amplification factor interval, performing cross-temperature read-write test on the solid state disk;
and when the cross-temperature read-write test passes, calling preset fio test software and preset H2test software to perform DR test on the solid state disk.
According to some embodiments of the first aspect of the present application, the cross-temperature read-write test comprises the steps of:
partitioning the solid state disk, and writing data into one partition of the solid state disk based on the highest temperature in a preset standard temperature interval until the one partition is fully written;
performing first verification on the one partition, and performing second verification on the one partition at the lowest temperature in a preset standard temperature interval when the first verification passes;
When the second verification passes, performing safe erasure on the one partition, and performing data writing on the one partition based on the lowest temperature until the one partition is fully written;
performing third verification on the one partition, and performing fourth verification on the one partition at the highest temperature when the third verification passes;
and when the fourth verification passes, performing safe erasure on the partition, and performing temperature cycle testing on the partition according to a preset temperature change rule based on the standard temperature interval.
According to some embodiments of the first aspect of the present application, partitioning the solid state disk, and writing data into one partition of the solid state disk based on a highest temperature in a preset standard temperature interval until the one partition is full, including:
formatting the solid state disk into a single partition, and writing data into the single partition based on the highest temperature in a preset standard temperature interval until the single partition is fully written;
or formatting the solid state disk into four partitions, selecting one of the partitions, and writing data into the selected one partition based on the highest temperature in a preset standard temperature interval until the selected one partition is fully written.
According to some embodiments of the first aspect of the application, the pressure test comprises the steps of:
restarting and dormancy testing the solid state disk according to the preset test times and the preset interval time;
when the restarting test and the dormancy test pass, performing an abnormal power-down test and a bad track scanning test on the solid state disk by using a preset power-down jig and preset scanning software to obtain a bad track test result;
and when the bad track test result indicates that the solid state disk has no bad track, performing GC test and WL test on the solid state disk.
According to some embodiments of the first aspect of the present application, when the bad track test result indicates that the solid state disk has no bad track, performing GC test and WL test on the solid state disk, including:
when the bad track test result indicates that the solid state disk has no bad track, calling preset fio test software, sequentially reading and writing the solid state disk and randomly reading and writing the solid state disk according to a preset reading and writing rule, and outputting a GC test result;
when the GC test result indicates that the solid state disk passes the GC test, writing data into the solid state disk by using preset H2test software until the solid state disk is fully written;
And checking the solid state disk, and when the check is passed, performing data erasure on the solid state disk according to a preset deletion proportion, and performing algorithm test on the solid state disk by adopting a preset random test mode to obtain a WL test result.
According to some embodiments of the first aspect of the present application, the test platform includes a first type platform and a second type platform, and when the pressure test passes, selecting a target type of the test platform according to a type of the test platform, and performing a working power consumption test and a working temperature test on a solid state disk of the target type of the test platform, including:
when the pressure test is passed, selecting the first type platform, and carrying out the working power consumption test on the solid state disk of the first type platform by utilizing a preset power consumption jig to obtain a working power consumption value;
and when the working power consumption value is smaller than a preset power consumption threshold, selecting the second type platform, and calling preset fio test software to perform the working temperature test on the solid state disk of the second type platform based on a preset JEDEC standard and a preset temperature time standard.
According to some embodiments of the first aspect of the application, the method further comprises:
Randomly extracting a fifth number of solid state disks from all the solid state disks to be tested, and sequentially carrying out the smoking test, the read-write function test, the stability test mode, the pressure test, the working power consumption test and the working temperature test on the solid state disks according to preset test turns to obtain PVT test results;
and calculating the yield of the solid state disk according to the fifth quantity and the PVT test result, and outputting the yield.
According to some embodiments of the first aspect of the present application, after the determining the performance of the first solid state disk and the second solid state disk, the method further includes:
and randomly extracting a sixth number of solid state disks from the solid state disks to be tested after card opening is completed, and carrying out system compatibility test and notebook computer compatibility test.
In a second aspect, an embodiment of the present application provides a computer-readable storage medium, where computer-executable instructions are stored, where the computer-executable instructions are configured to cause a computer to perform the method for testing a solid state disk according to the first aspect.
Drawings
The accompanying drawings are included to provide a further understanding of the application and are incorporated in and constitute a part of this specification, illustrate and do not limit the application.
FIG. 1 is a flow chart of a testing method of a solid state disk according to an embodiment of the present application;
FIG. 2 is a flow chart of steps of a method for testing a read/write function according to an embodiment of the present application;
FIG. 3 is a flow chart of steps of a cross-temperature read-write test method according to an embodiment of the present application;
FIG. 4 is a flow chart of the steps of a pressure testing method provided by one embodiment of the present application;
FIG. 5 is a flow chart of the steps of a pressure testing method according to another embodiment of the present application;
FIG. 6 is a flow chart of a testing method of a solid state disk according to another embodiment of the present application;
FIG. 7 is a flow chart of a testing method of a solid state disk according to another embodiment of the present application;
FIG. 8 is a flow chart of a testing method of a solid state disk according to another embodiment of the present application;
fig. 9 is a schematic hardware structure of an electronic device according to an embodiment of the present application.
Detailed Description
The present application will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present application more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application.
It will be appreciated that although functional block diagrams are depicted in the device diagrams, logical sequences are shown in the flowchart, in some cases, the steps shown or described may be performed in a different order than the block diagrams in the device. The terms first, second and the like in the description, in the claims and in the above-described figures, are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order.
The application provides a method for testing a solid state disk and a storage medium, wherein test equipment is provided with a plurality of test platforms, each test platform is provided with a test interface to be connected with the solid state disk to be tested, and based on the method for testing the solid state disk, a certain number of solid state disks are randomly extracted from all solid state disks to be tested after card opening are completed for testing each time, so that batch testing of the solid state disks can be realized, meanwhile, the accident of test results can be reduced, and the test reliability of the solid state disk is effectively improved. After the current test is passed, a certain number of solid state disks are automatically selected again from all the solid state disks to be tested after card opening is completed, and the next test is carried out on the solid state disks so as to realize automatic switching among the tests, and after all the tests are completed, test results are output, so that the test efficiency of the solid state disks can be effectively improved. Based on the testing method of the solid state disk, after a certain number of solid state disks are selected for testing, a certain number of solid state disks are selected again for next testing, so that batch testing and automatic testing are achieved, and compared with the technical scheme that the solid state disks are manually replaced with a testing platform and a testing mode is started for next testing in the related art, the testing efficiency of the solid state disk can be effectively improved.
Embodiments of the present application will be further described below with reference to the accompanying drawings.
Referring to fig. 1, fig. 1 is a step flowchart of a method for testing a solid state disk according to an embodiment of the present application, where the solid state disk is connected to a testing device through a testing interface, the testing device has a plurality of testing platforms, and each testing platform provides a testing interface to connect with a solid state disk to be tested for batch testing; the method for testing the solid state disk comprises the following steps:
step S110, all solid hard disks to be tested are opened and clamped into an RDT mode;
step S120, randomly extracting a first number of solid state disks from all the solid state disks to be tested after card opening is completed, and carrying out smoking test;
step S130, when the smoking test passes, randomly extracting a second number of solid state disks from all the solid state disks to be tested after card opening is completed again to perform a read-write function test;
step S140, when the read-write function test passes, randomly extracting a third number of solid state disks from all the solid state disks to be tested after card opening is completed, and sequentially executing a plurality of preset stability test modes on the extracted solid state disks;
step S150, when all the stability test modes pass, randomly extracting a fourth number of solid state disks from all the solid state disks to be tested after card opening is completed again to perform pressure test;
Step S160, when the pressure test is passed, selecting a test platform of a target type according to the type of the test platform, and performing the working power consumption test and the working temperature test on the solid state disk of the test platform of the target type;
step S170, when the working power consumption test and the working temperature test pass, selecting a first solid state disk and a second solid state disk from all the solid state disks to be tested which are subjected to card opening, setting writing data of at least two preset test software as target writing data, performing performance test on the first solid state disk and the second solid state disk through the test software and the target writing data, and comparing a result parameter of the performance test with a standard parameter to determine performance conditions of the first solid state disk and the second solid state disk;
step S180, outputting a test result.
It should be noted that the embodiment of the present application is not limited to the specific type of the test platform, and may be a test platform including Hasee (XS-2021S 7), WEIBU (XU 133TR 130), dynaBook e5 (TU 140ALR420, yidazhixing, etc., wherein the CPU of Hasee (XS-2021S 7) may be Intel (R) Core (TM) i7-1065G7@1.3GHz, the memory may be 12G, the operating system may be Windows10 or Windows11, and the CPU of WEIBU (XU 133TR 130) may be 11 th Gen Intel (R) Core (TM) i7-1165G7@2.8GHz, the memory may be 16G, and the operating system may be Windows10 or Windows11; dynabook e5 (TU 140ALR420 CPU may be 12) th Gen Intel (R) Core (TM) i5-1235U, the memory may be 8G, and the operating system may be Windows10 or Windows11; the CPU of the Yizhixing may be Intel (R) Core (TW) i5-12400H, the memory may be 8G, and the operating system may be Windows10 or Windows11. The embodiment of the application also does not limit the specific types of the preset test software, and can comprise a BurnIn test software, an H2test software, a fio test software, a Sdstress test software, a Reboot test software, a keeper test software, a CrystalDiskMark test software, an ATTO test software, an HDTune test software, a CrystalDiskInfo test software and the like.
It can be understood that all solid state disks to be tested are opened and clamped into an RDT mode, bad blocks or weak blocks are screened out in advance, and then a first number of solid state disks are randomly extracted from all solid state disks to be tested after the opening and clamping are completed to carry out smoking test, so that whether the solid state disks can normally operate is judged. And when the smoking test passes, the solid state disk can normally run, and a second number of solid state disks are randomly extracted again from the solid state disks to be tested which are completely opened for carrying out the read-write function test so as to test the read-write function stability of the solid state disk. When the read-write function test is passed, the read-write function stability of the solid state disk meets the factory standard, then a third number of solid state disks are randomly extracted from all the solid state disks to be tested after card opening is completed, a plurality of preset stability test modes are sequentially executed on the extracted solid state disks so as to test the stability of the solid state disk based on different test scenes, and the test modes can be sequentially executed to avoid the problems of missing and repetition of the test modes. And when all the stability test modes pass, randomly extracting a fourth number of solid state disks from all the solid state disks to be tested after card opening, and performing pressure test to test the read-write durability stability of the solid state disks. When the pressure test passes, selecting a test platform of a target type according to the type of the test platform, performing working power consumption test and working temperature test on the solid state disk of the test platform of the target type, and performing working power consumption test and working temperature test according to the test platform of a specific type so as to ensure the test reliability of the solid state disk. When the working power consumption test and the working temperature test are passed, the first solid state disk and the second solid state disk are selected from the solid state disks to be tested, which are all subjected to card opening, writing data of at least two preset test software are set as target writing data, performance test is carried out on the first solid state disk and the second solid state disk through the test software and the target writing data, the performance parameters of the performance test are compared with standard parameters, the performance conditions of the first solid state disk and the second solid state disk are determined, and when the performance parameters of the performance test are identical with the standard parameters, the performance conditions of the first solid state disk and the second solid state disk are indicated to meet factory standards. And finally, outputting a test result so as to intuitively know the test condition of the solid state disk.
It can be understood that the test equipment is provided with a plurality of test platforms, each test platform is provided with a test interface to be connected with a solid state disk to be tested, and each test is to randomly extract a certain number of solid state disks from all the solid state disks to be tested after card opening is completed for testing, so that batch testing of the solid state disks can be realized, meanwhile, the accident of test results can be reduced, and the test reliability of the solid state disks is effectively improved. After the current test is passed, a certain number of solid state disks are automatically selected again from all the solid state disks to be tested after card opening is completed, and the next test is carried out on the solid state disks so as to realize automatic switching among the tests, and after all the tests are completed, test results are output, so that the test efficiency of the solid state disks can be effectively improved. Based on the testing method of the solid state disk, after a certain number of solid state disks are selected for testing, a certain number of solid state disks are selected again for next testing, so that batch testing and automatic testing are achieved, and compared with the technical scheme that the solid state disks are manually replaced with a testing platform and a testing mode is started for next testing in the related art, the testing efficiency of the solid state disk can be effectively improved.
It can be understood that all the solid state disks to be tested are opened and clamped into an RDT mode, and when no error occurs in the opening and clamping of the RDT mode, the solid state disks can be powered on and RDT test is executed.
It can be understood that in the smoking test, the solid state disk can be used as a data disk, the solid state disk is partitioned, and then a preset default test mode is performed on the single partitioned solid state disk by using preset BIT test software, wherein the test time length can be 12 hours.
It is understood that the stability test mode may include a high test mode, a button test mode, a Random test mode, and a Default test mode, where the test sequence in the stability test mode may be performed sequentially by the high test mode, the button test mode, the Random test mode, and the Default test mode.
Additionally, referring to FIG. 2, in one embodiment, the read-write function test includes, but is not limited to, the following steps:
step S210, obtaining basic information of a solid state disk;
step S220, performing power failure test on the solid state disk to obtain information to be compared after the test is completed;
step S230, when the basic information and the information to be compared are the same, a serial port log of the solid state disk is obtained, and a write amplification factor is extracted from the serial port log;
Step S240, when the write amplification factor belongs to a preset write amplification factor interval, performing a cross-temperature read-write test on the solid state disk;
and step S250, when the cross-temperature read-write test passes, calling preset fio test software and preset H2test software to perform DR test on the solid state disk.
It can be understood that the preset CDI software may be used to obtain the basic information of the solid state disk, where the basic information may include s.m.a.r.t. parameter information. And then performing power failure test on the solid state disk to obtain information to be compared after the test is completed, and comparing the basic information with the information to be compared to distinguish valid and invalid s.m.a.r.t parameter information so as to be convenient for knowing the health condition and the service life state of the solid state disk. And when the basic information is the same as the information to be compared, acquiring a serial port log of the solid state disk, and extracting a write amplification factor from the serial port log. The change of the write amplification factor in the serial port log can be monitored in real time until the write amplification factor reaches a stable state. When the write amplification factor belongs to a preset write amplification factor interval, the write amplification factor of the solid state disk accords with factory standards, and a cross-temperature read-write test is carried out on the solid state disk so as to test the performance of the solid state disk in data processing at different cross-temperatures. When the cross-temperature read-write test passes, the preset fio test software and the preset H2test software are called to perform DR test on the solid state disk.
It can be understood that, in an embodiment, when the cross-temperature read-write test passes, invoking the preset fio test software and the preset H2test software to perform DR test on the solid state disk includes, but is not limited to, the following steps:
when the cross-temperature read-write test passes, firstly, preset fio test software is called, 128K data blocks are written into the solid state disk in sequence, and verification is carried out. And then placing the solid state disk into a incubator to perform a first power-off blocking test, and performing a verification test on the data of the solid state disk after the first blocking test and the data of the solid state disk before the first blocking test. And after the verification test is passed, calling preset H2test software to write data into the solid state disk until the solid state disk is fully written. And then placing the solid state disk into a temperature box for a second power-off blocking test, and checking and testing the data of the solid state disk after the second blocking test and the data of the solid state disk before the second blocking test.
Additionally, referring to FIG. 3, in one embodiment, the cross-temperature read-write test includes, but is not limited to, the following steps:
step S310, partitioning the solid state disk, and writing data into one partition of the solid state disk based on the highest temperature in a preset standard temperature interval until one partition is fully written;
Step S320, performing a first check on a partition, and performing a second check on the partition at the lowest temperature in a preset standard temperature interval when the first check passes;
step S330, when the second verification passes, performing safe erasure on one partition, and writing data into the one partition based on the lowest temperature until the one partition is fully written;
step S340, performing third verification on one partition, and performing fourth verification on one partition at the highest temperature when the third verification passes;
and step S350, when the fourth verification passes, performing safe erasure on one partition, and performing temperature cycle test on one partition according to a preset temperature change rule based on a standard temperature interval.
It can be understood that the solid state disk is partitioned, and based on the highest temperature in the preset standard temperature interval, the preset H2test software is adopted to write data into one partition of the solid state disk until one partition is fully written, and then the first verification is performed on the one partition. When the first verification passes, at the lowest temperature in a preset standard temperature interval, a preset H2test software is adopted to read data of one partition and perform the second verification, wherein the steps of writing in and reading in high temperature can be performed for multiple times, and the steps of writing in and reading in high temperature can be performed in a circulating way within 24 hours.
And when the second verification passes, the safe erasure is carried out on one partition, so that the interference of the previously written data on the subsequent test is avoided, and the test reliability of the solid state disk is ensured. And then, based on the lowest temperature, adopting preset H2test software to write data into one partition until one partition is fully written, and then performing third verification on one partition. When the third verification passes, at the highest temperature, the preset H2test software is adopted to read data of one partition and perform the fourth verification, wherein the step of writing the high Wen Douqu at the low temperature can be performed multiple times, and the step of writing the high Wen Douqu at the low temperature can be performed circularly within 24 hours.
And when the fourth verification is passed, safely erasing one partition, and avoiding the interference of the previously written data on the subsequent test so as to ensure the test reliability of the solid state disk. Then, the solid state disk is placed into an incubator, and a temperature cycle test is conducted on one partition by adopting preset BIT test software and preset default test mode according to a preset temperature change rule based on a standard temperature interval.
It is understood that the preset temperature change rule may be that the temperature is changed by 10 degrees celsius every 2 hours within a preset standard temperature interval, and the test time period for performing the temperature cycle test may be 3 days.
In addition, in an embodiment, step S310 in the embodiment shown in fig. 3 further includes, but is not limited to, the following steps:
formatting the solid state disk into a single partition, and writing data into the single partition based on the highest temperature in a preset standard temperature interval until the single partition is fully written;
or formatting the solid state disk into four partitions, selecting one of the partitions, and writing data into the selected one partition based on the highest temperature in a preset standard temperature interval until the selected one partition is fully written.
It can be understood that the solid state disk is formatted into a single partition, and based on the highest temperature in the preset standard temperature interval, data writing is performed on the single partition until the single partition is fully written, and the subsequent data operation performed on the solid state disk is also performed on the basis of the single partition. Or formatting the solid state disk into four partitions, selecting one of the partitions, writing data into the selected partition based on the highest temperature in a preset standard temperature interval until the selected partition is fully written, and performing subsequent data operation on the solid state disk based on the selected partition. The method has the advantages that different partition treatments are carried out on the solid state disk, the solid state disk is partitioned into a single partition or four partitions, then the test is carried out, the test scene for testing the solid state disk is enriched, the performance of the cross-temperature read-write test of the solid state disk can be tested in multiple aspects, and the test reliability of the solid state disk is effectively ensured.
It can be understood that the solid state disk may be formatted into three partitions, or may be formatted into six partitions, which are not described in detail herein.
Additionally, referring to FIG. 4, in one embodiment, the pressure test includes, but is not limited to, the following steps:
step S410, performing restarting test and dormancy test on the solid state disk according to the preset test times and the preset interval time;
step S420, when the restart test and the dormancy test pass, performing an abnormal power-down test and a bad track scanning test on the solid state disk by using a preset power-down jig and preset scanning software to obtain a bad track test result;
and step S430, when the bad track test result indicates that the solid state disk has no bad track, performing GC test and WL test on the solid state disk.
It can be understood that the restart test and the sleep test are performed on the solid state disk according to the preset test times and the preset interval time, so as to test the compatibility problem between the solid state disk and the whole machine. When the restarting test and the dormancy test pass, the abnormal power-down test and the bad track scanning test are carried out on the solid state disk by utilizing a preset power-down tool and preset scanning software, and a bad track test result is obtained so as to determine whether the solid state disk is damaged. When the bad track test result indicates that the solid state disk has no bad track, the solid state disk has good stability and read-write performance, and GC test and WL test are carried out on the solid state disk to test the efficiency of the FTL layer of the solid state disk, so that the balanced wear performance of the solid state disk is tested.
It can be understood that the solid state disk can be partitioned into two partitions, and a Windows10 system or a Windows11 system is installed in the solid state disk, and 2000 restarting tests are performed on the solid state disk by adopting preset Reboot test software, preset BIT test software and preset Sdstress test software, wherein the interval time of each restarting test is 30 seconds. And when the restarting test is completed, carrying out 2000 sleep tests on the solid state disk by adopting preset Sleeper test software, preset BIT test software and preset Sdstress test software, wherein the interval time of each sleep test is 30 seconds.
It can be understood that, in an embodiment, the step of performing the abnormal power-down test and the bad track scan test on the solid state disk by using the preset power-down tool and the preset scan software to obtain the bad track test result may further include, but is not limited to, the following steps:
dividing the solid state disk into two partitions, installing a Windows10 system or a Windows11 system in the solid state disk, configuring preset BIT test software and preset Sdstress test software into power-on self-starting, then performing complete machine power-down test 2000 times by using a preset power-down jig, and then performing bad track scanning test on the solid state disk by using preset scanning software.
It is understood that the preset scanning software may be HDTune software.
In addition, referring to fig. 5, in an embodiment, step S410 in the embodiment shown in fig. 4 further includes, but is not limited to, the following steps:
step S510, when the bad track test result indicates that the solid state disk has no bad track, calling preset fio test software, and sequentially reading and writing the solid state disk and randomly reading and writing the solid state disk according to a preset read-write rule, and outputting a GC test result;
step S520, when the GC test result indicates that the solid state disk passes the GC test, writing data into the solid state disk by using preset H2test software until the solid state disk is fully written;
and step S530, checking the solid state disk, and when the check is passed, erasing data of the solid state disk according to a preset deletion proportion, and performing algorithm test on the solid state disk by adopting a preset random test mode to obtain a WL test result.
It can be understood that when the bad track test result indicates that the solid state disk has no bad track, the solid state disk has good stability and good read-write performance, the solid state disk is sequentially read-written and randomly read-written according to a preset read-write rule, and the GC test result is output so as to test the garbage recycling processing performance of the solid state disk. When the GC test result indicates that the solid state disk passes the GC test, the solid state disk is subjected to data writing by utilizing preset H2test software until the solid state disk is fully written, and the solid state disk is checked. And when the verification is passed, performing data erasure on the solid state disk according to a preset deletion proportion, releasing part of the space of the solid state disk, and performing algorithm test on the solid state disk by adopting a preset random test mode to test whether the solid state disk distributes erasure/writing cycles to all storage units of the solid state disk evenly, so as to obtain a WL test result.
It can be understood that the solid state disk can be used as a physical disk, preset fio test software is called, 128K data blocks are written into the solid state disk in sequence and verified, 4K data blocks are written into the solid state disk in a random mode and verified, the steps are repeated for 3 times, and a GC test result is output.
It can be understood that the test time for carrying out the algorithm test on the solid state disk by adopting the preset random test mode can be 4 days or 5 days; the preset deletion ratio may be 10%, 15%, or 20%, and will not be described here.
In addition, referring to fig. 6, in an embodiment, the test platform includes a first type of platform and a second type of platform, and step S160 in the embodiment shown in fig. 1 further includes, but is not limited to, the following steps:
step S610, when the pressure test passes, selecting a first type platform, and performing a working power consumption test on the solid state disk of the first type platform by using a preset power consumption jig to obtain a working power consumption value;
step S620, when the working power consumption value is smaller than the preset power consumption threshold, selecting a second type platform, and calling preset fio test software to test the working temperature of the solid state disk of the second type platform based on the preset JEDEC standard and the preset temperature time standard.
It can be understood that when the pressure test passes, the first type platform is selected, the working power consumption test is performed on the solid state disk of the first type platform by using the preset power consumption jig, the current change value of the solid state disk is monitored, and the working power consumption value is obtained by calculation according to the current change value, so as to test whether the power consumption value of the solid state disk meets the factory standard. When the working power consumption value is smaller than the preset power consumption threshold value, the fact that the power consumption value of the solid state disk meets the factory standard is indicated, a second type platform is selected, and based on the preset JEDEC standard and the preset temperature time standard, preset fio test software is called to conduct working temperature test on the solid state disk of the second type platform so as to test the high-temperature durability performance of the solid state disk.
It can be appreciated that in an embodiment, based on the preset JEDEC standard and the preset temperature time standard, invoking the preset fio test software to perform the working temperature test on the solid state disk of the second type platform includes, but is not limited to, the following steps:
based on a preset JEDEC standard and a preset temperature time standard, placing the solid state disk of the second type platform into an incubator, calling a preset fio test software, continuously writing 128K data blocks into the solid state disk of the second type platform, and performing data reading operation. And then the solid state disk of the second type platform is taken out from the incubator, the solid state disk of the second type platform is partitioned into single partitions, and data writing is carried out on the solid state disk of the second type platform by utilizing preset H2test software until the solid state disk of the second type platform is fully written. And then placing the full solid state disk of the second type platform into an incubator, carrying out a licensing test according to the standard of 96 hours and 66 ℃, and carrying out data verification on the solid state disk from the incubator after the licensing test is completed.
It is understood that the first type of platform may be a technical ja Z490UD and the second type of platform may be a G5400 motherboard.
In addition, referring to fig. 7, in an embodiment, the method for testing a solid state disk further includes, but is not limited to, the following steps:
step S710, randomly extracting a fifth number of solid state disks from all the solid state disks to be tested, and sequentially performing a smoking test, a read-write function test, a stability test mode, a pressure test, a working power consumption test and a working temperature test on the solid state disks according to preset test turns to obtain PVT test results;
and step S720, calculating the yield of the solid state disk according to the fifth quantity and the PVT test result, and outputting the yield.
It can be understood that the fifth number of solid state disks are randomly extracted from all the solid state disks to be tested, the solid state disks are subjected to smoke test, read-write function test, stability test mode, pressure test, working power consumption test and working temperature test in sequence according to the preset test turns, and small batches of solid state disks are subjected to process verification test to obtain PVT test results, so that the overall function realization condition and overall performance reliability of the solid state disks can be tested. And calculating the yield of the solid state disks according to the fifth quantity and the PVT test result, and outputting the yield so as to determine the overall performance condition of the solid state disks in the batch and know whether the production process of the solid state disks in the batch has problems according to the yield.
In addition, referring to fig. 8, in an embodiment, after step S170 in the embodiment shown in fig. 1, the method for testing a solid state disk further includes, but is not limited to, the following steps:
and step S810, randomly extracting a sixth number of solid state disks from all the solid state disks to be tested after card opening is completed again to perform system compatibility test and notebook computer compatibility test.
It can be understood that the sixth number of solid state disks are randomly extracted again from all the solid state disks to be tested after card opening is completed to perform system compatibility test, and the solid state disks are subjected to Windows10 operating system installation, windows11 operating system installation and deep operating system installation to test the system compatibility of the solid state disks. And performing a notebook computer compatibility test on the solid state disk, traversing a preset notebook computer list, performing Windows10 operating system installation or Windows11 operating system installation on the solid state disk under different notebook computers, and performing a 500-circle restarting test and a dormancy test to test the notebook computer compatibility of the solid state disk.
It can be understood that the preset notebook list includes an associative notebook, a Hua Shuo notebook, a millet notebook, a peer notebook, a hal notebook, a dill notebook, and the like.
In an embodiment, after all the stability test modes are completed, the method for testing a solid state disk may further include, but is not limited to, the following steps: and re-opening the solid state disk into a temperature limit mode, then taking the solid state disk as a data disk, dividing the solid state disk into four partitions, and then carrying out a test of a preset default test mode on the solid state disk by utilizing preset BIT test software, wherein the test time length can be 10 days.
In an embodiment, the method for testing a solid state disk may further include, but is not limited to, the following steps: when the working power consumption test and the working temperature test pass, selecting a first solid state disk and a second solid state disk from the solid state disks to be tested, which are all subjected to card opening, and setting the writing data of preset crystal DiskMark test software and preset AS SSD standard mark test software AS target writing data. And re-opening the card of the first solid state disk and the second solid state disk, performing an empty disk test, performing an 80% data filling dirty disk test on the first solid state disk by using preset crystal disk mark test software and target writing data, and performing an 80% data filling dirty disk test on the second solid state disk by using preset AS SSD (solid state disk) standard mark test software and target writing data. After the test is completed, the first solid state disk and the second solid state disk are subjected to random writing, sequential writing, random reading and sequential reading respectively by utilizing preset fio test software. And finally, data of the first solid state disk and data of the second solid state disk are subjected to data correction, and when the data of the first solid state disk and the data of the second solid state disk are the same, the performance of the first solid state disk and the performance of the second solid state disk are consistent.
It can be understood that the third solid state disk and the fourth solid state disk may also be selected, the preset HDTune test software and the preset ATTO test software are set as target write data, the preset HDTune test software is used to perform an 80% data filling dirty disk test on the third solid state disk, and the preset ATTO test software is used to perform an 80% data filling dirty disk test on the fourth solid state disk, which is not described herein.
In an embodiment, the method for testing a solid state disk may further include, but is not limited to, the following steps: when one of the following occurs during the test: and if the test software is in error, the serial port log is abnormal and the state of the solid state disk is abnormal, the test of the solid state disk is terminated, the completed test is recorded, and the test abnormality information is output, so that a tester can find out the error in time, and the test is adjusted.
In addition, referring to fig. 9, an embodiment of the present application further provides an electronic device, the electronic device 900 including: memory 910, processor 920, and computer programs stored on memory 910 and executable on processor 920.
The processor 920 and the memory 910 may be connected by a bus or other means.
The non-transitory software program and instructions required to implement the method for testing a solid state disk of the above embodiment are stored in the memory 910, and when executed by the processor 920, the method for testing a solid state disk of the above embodiment is performed, for example, the method steps S110 to S180 in fig. 1, the method steps S210 to S250 in fig. 2, the method steps S310 to S350 in fig. 3, the method steps S410 to S430 in fig. 4, the method steps S510 to S530 in fig. 5, the method steps S610 to S620 in fig. 6, the method steps S710 to S720 in fig. 7, and the method step S810 in fig. 8 described above are performed.
The above described apparatus embodiments are merely illustrative, wherein the units illustrated as separate components may or may not be physically separate, i.e. may be located in one place, or may be distributed over a plurality of network elements. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
Furthermore, an embodiment of the present application provides a computer readable storage medium, where computer executable instructions are stored, where the computer executable instructions are executed by a processor 920 or a controller, for example, by a processor 920 in the embodiment of the electronic device 900, and the processor 920 may be caused to perform the method for testing a solid state disk in the embodiment, for example, perform the method steps S110 to S180 in fig. 1, the method steps S210 to S250 in fig. 2, the method steps S310 to S350 in fig. 3, the method steps S410 to S430 in fig. 4, the method steps S510 to S530 in fig. 5, the method steps S610 to S620 in fig. 6, the method steps S710 to S720 in fig. 7, and the method step S810 in fig. 8 described above. Those of ordinary skill in the art will appreciate that all or some of the steps, systems, and methods disclosed above may be implemented as software, firmware, hardware, and suitable combinations thereof. Some or all of the physical components may be implemented as software executed by a processor 920, such as a central processing unit, digital signal processor, or microprocessor, or as hardware, or as an integrated circuit, such as an application specific integrated circuit. Such software may be distributed on computer readable media, which may include computer storage media (or non-transitory media) and communication media (or transitory media). The term computer storage media includes both volatile and nonvolatile, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data, as known to those skilled in the art. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital Versatile Disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can be accessed by a computer. Furthermore, as is well known to those of ordinary skill in the art, communication media typically embodies computer readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism and includes any information delivery media.
In the description of the present specification, reference to the terms "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
While the preferred embodiment of the present application has been described in detail, the present application is not limited to the above embodiment, and various equivalent modifications and substitutions can be made by those skilled in the art without departing from the spirit of the present application, and these equivalent modifications and substitutions are intended to be included in the scope of the present application as defined in the appended claims.
Claims (10)
1. The testing method of the solid state disk is characterized in that the solid state disk is connected to testing equipment through a testing interface, the testing equipment is provided with a plurality of testing platforms, and each testing platform is provided with one testing interface to be connected with one solid state disk to be tested so as to carry out batch testing; comprising the following steps:
All the solid hard disks to be tested are opened and clamped into an RDT mode;
randomly extracting a first number of solid state disks from the solid state disks to be tested which are all subjected to card opening, and carrying out smoking test;
when the smoking test passes, randomly extracting a second number of solid state disks from the solid state disks to be tested which are all subjected to card opening, and performing read-write function test;
when the read-write function test passes, randomly extracting a third number of solid state disks from the solid state disks to be tested, which are all subjected to card opening, and sequentially executing a plurality of preset stability test modes on the extracted solid state disks;
when all the stability test modes pass, randomly extracting a fourth number of solid state disks from all the solid state disks to be tested after card opening is completed again to perform pressure test;
when the pressure test passes, selecting a test platform of a target type according to the type of the test platform, and performing working power consumption test and working temperature test on the solid state disk of the test platform of the target type;
when the working power consumption test and the working temperature test are passed, selecting a first solid state disk and a second solid state disk from the solid state disks to be tested, which are all subjected to card opening, setting writing data of at least two preset test software as target writing data, performing performance test on the first solid state disk and the second solid state disk through the test software and the target writing data, comparing result parameters of the performance test with standard parameters, and determining performance conditions of the first solid state disk and the second solid state disk;
And outputting a test result.
2. The method for testing a solid state disk according to claim 1, wherein the read-write function test comprises the steps of:
acquiring basic information of the solid state disk;
performing power failure test on the solid state disk to obtain information to be compared after the test is completed;
when the basic information is the same as the information to be compared, a serial port log of the solid state disk is obtained, and a write amplification factor is extracted from the serial port log;
when the write amplification factor belongs to a preset write amplification factor interval, performing cross-temperature read-write test on the solid state disk;
and when the cross-temperature read-write test passes, calling preset fio test software and preset H2test software to perform DR test on the solid state disk.
3. The method for testing a solid state disk according to claim 2, wherein the cross-temperature read-write test comprises the steps of:
partitioning the solid state disk, and writing data into one partition of the solid state disk based on the highest temperature in a preset standard temperature interval until the one partition is fully written;
performing first verification on the one partition, and performing second verification on the one partition at the lowest temperature in a preset standard temperature interval when the first verification passes;
When the second verification passes, performing safe erasure on the one partition, and performing data writing on the one partition based on the lowest temperature until the one partition is fully written;
performing third verification on the one partition, and performing fourth verification on the one partition at the highest temperature when the third verification passes;
and when the fourth verification passes, performing safe erasure on the partition, and performing temperature cycle testing on the partition according to a preset temperature change rule based on the standard temperature interval.
4. The method for testing a solid state disk according to claim 3, wherein partitioning the solid state disk, and writing data into one partition of the solid state disk based on a highest temperature in a preset standard temperature interval until the one partition is full, comprises:
formatting the solid state disk into a single partition, and writing data into the single partition based on the highest temperature in a preset standard temperature interval until the single partition is fully written;
or formatting the solid state disk into four partitions, selecting one of the partitions, and writing data into the selected one partition based on the highest temperature in a preset standard temperature interval until the selected one partition is fully written.
5. The method for testing a solid state disk according to claim 1, wherein the pressure test comprises the steps of:
restarting and dormancy testing the solid state disk according to the preset test times and the preset interval time;
when the restarting test and the dormancy test pass, performing an abnormal power-down test and a bad track scanning test on the solid state disk by using a preset power-down jig and preset scanning software to obtain a bad track test result;
and when the bad track test result indicates that the solid state disk has no bad track, performing GC test and WL test on the solid state disk.
6. The method for testing a solid state disk according to claim 5, wherein when the bad track test result indicates that the solid state disk has no bad track, performing GC test and WL test on the solid state disk, comprises:
when the bad track test result indicates that the solid state disk has no bad track, calling preset fio test software, sequentially reading and writing the solid state disk and randomly reading and writing the solid state disk according to a preset reading and writing rule, and outputting a GC test result;
when the GC test result indicates that the solid state disk passes the GC test, writing data into the solid state disk by using preset H2test software until the solid state disk is fully written;
And checking the solid state disk, and when the check is passed, performing data erasure on the solid state disk according to a preset deletion proportion, and performing algorithm test on the solid state disk by adopting a preset random test mode to obtain a WL test result.
7. The method for testing a solid state disk according to claim 1, wherein the test platform comprises a first type platform and a second type platform, and when the pressure test passes, selecting a target type of the test platform according to the type of the test platform, and performing a working power consumption test and a working temperature test on the solid state disk of the target type of the test platform, wherein the method comprises the following steps:
when the pressure test is passed, selecting the first type platform, and carrying out the working power consumption test on the solid state disk of the first type platform by utilizing a preset power consumption jig to obtain a working power consumption value;
and when the working power consumption value is smaller than a preset power consumption threshold, selecting the second type platform, and calling preset fio test software to perform the working temperature test on the solid state disk of the second type platform based on a preset JEDEC standard and a preset temperature time standard.
8. The method for testing a solid state disk of claim 1, further comprising:
randomly extracting a fifth number of solid state disks from all the solid state disks to be tested, and sequentially carrying out the smoking test, the read-write function test, the stability test mode, the pressure test, the working power consumption test and the working temperature test on the solid state disks according to preset test turns to obtain PVT test results;
and calculating the yield of the solid state disk according to the fifth quantity and the PVT test result, and outputting the yield.
9. The method for testing a solid state disk of claim 1, wherein after the determining performance conditions of the first solid state disk and the second solid state disk, the method further comprises:
and randomly extracting a sixth number of solid state disks from the solid state disks to be tested after card opening is completed, and carrying out system compatibility test and notebook computer compatibility test.
10. A computer-readable storage medium, characterized by: the computer-readable storage medium stores computer-executable instructions for causing a computer to perform the method for testing a solid state disk according to any one of claims 1 to 9.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310517363.1A CN116705138B (en) | 2023-05-08 | 2023-05-08 | Solid state disk testing method and storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310517363.1A CN116705138B (en) | 2023-05-08 | 2023-05-08 | Solid state disk testing method and storage medium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN116705138A true CN116705138A (en) | 2023-09-05 |
| CN116705138B CN116705138B (en) | 2024-07-16 |
Family
ID=87833007
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310517363.1A Active CN116705138B (en) | 2023-05-08 | 2023-05-08 | Solid state disk testing method and storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116705138B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117234826A (en) * | 2023-11-10 | 2023-12-15 | 深圳市领德创科技有限公司 | Solid state disk reliability verification interference-free test platform and working method |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5615335A (en) * | 1994-11-10 | 1997-03-25 | Emc Corporation | Storage system self-test apparatus and method |
| US6061819A (en) * | 1997-12-29 | 2000-05-09 | Hewlett-Packard Company | Generation of reproducible random initial states in RTL simulators |
| US6308288B1 (en) * | 1998-10-27 | 2001-10-23 | Inventec Corporation | Testing method of the integrity of the software pre-installed in a computer hard disk |
| US7873885B1 (en) * | 2004-01-20 | 2011-01-18 | Super Talent Electronics, Inc. | SSD test systems and methods |
| US8078421B1 (en) * | 2007-12-19 | 2011-12-13 | Western Digital Technologies, Inc. | Multi-cell disk drive test system providing a power recovery mode |
| CN111124786A (en) * | 2019-12-24 | 2020-05-08 | 深圳佰维存储科技股份有限公司 | Batch detection method, batch detection device and computer readable storage medium |
| CN112802530A (en) * | 2021-01-12 | 2021-05-14 | 成都佰维存储科技有限公司 | NAND testing method and device, readable storage medium and electronic equipment |
| US20210389882A1 (en) * | 2020-06-12 | 2021-12-16 | Raymx Microelectronics Corp. | Storage device and low-level formatting method therefor |
| CN114116357A (en) * | 2021-12-03 | 2022-03-01 | 曙光信息产业股份有限公司 | Automatic test method, device and tool for hard disk |
| CN114333977A (en) * | 2022-01-05 | 2022-04-12 | 合肥大唐存储科技有限公司 | Method and device for testing solid state disk, computer storage medium and terminal |
-
2023
- 2023-05-08 CN CN202310517363.1A patent/CN116705138B/en active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5615335A (en) * | 1994-11-10 | 1997-03-25 | Emc Corporation | Storage system self-test apparatus and method |
| US6061819A (en) * | 1997-12-29 | 2000-05-09 | Hewlett-Packard Company | Generation of reproducible random initial states in RTL simulators |
| US6308288B1 (en) * | 1998-10-27 | 2001-10-23 | Inventec Corporation | Testing method of the integrity of the software pre-installed in a computer hard disk |
| US7873885B1 (en) * | 2004-01-20 | 2011-01-18 | Super Talent Electronics, Inc. | SSD test systems and methods |
| US8078421B1 (en) * | 2007-12-19 | 2011-12-13 | Western Digital Technologies, Inc. | Multi-cell disk drive test system providing a power recovery mode |
| CN111124786A (en) * | 2019-12-24 | 2020-05-08 | 深圳佰维存储科技股份有限公司 | Batch detection method, batch detection device and computer readable storage medium |
| US20210389882A1 (en) * | 2020-06-12 | 2021-12-16 | Raymx Microelectronics Corp. | Storage device and low-level formatting method therefor |
| CN112802530A (en) * | 2021-01-12 | 2021-05-14 | 成都佰维存储科技有限公司 | NAND testing method and device, readable storage medium and electronic equipment |
| CN114116357A (en) * | 2021-12-03 | 2022-03-01 | 曙光信息产业股份有限公司 | Automatic test method, device and tool for hard disk |
| CN114333977A (en) * | 2022-01-05 | 2022-04-12 | 合肥大唐存储科技有限公司 | Method and device for testing solid state disk, computer storage medium and terminal |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117234826A (en) * | 2023-11-10 | 2023-12-15 | 深圳市领德创科技有限公司 | Solid state disk reliability verification interference-free test platform and working method |
| CN117234826B (en) * | 2023-11-10 | 2024-04-05 | 深圳市领德创科技有限公司 | Solid state disk reliability verification interference-free test platform and working method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN116705138B (en) | 2024-07-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101576860B (en) | Detection method and detection system of linux or windows operation system | |
| CN116705138B (en) | Solid state disk testing method and storage medium | |
| US20150199232A1 (en) | Implementing ecc control for enhanced endurance and data retention of flash memories | |
| EP3079067A1 (en) | Method and apparatus for using solid state disk | |
| CN110008129B (en) | Reliability test method, device and equipment for storage timing snapshot | |
| CN110992992A (en) | Hard disk test method, device and storage medium | |
| CN102024502B (en) | Flash device testing method and device as well as board and network equipment | |
| CN105469834A (en) | Testing method for embedded flash memory | |
| CN110888763A (en) | Disk fault diagnosis method and device, terminal equipment and computer storage medium | |
| CN107451003B (en) | Test method and device for storage system | |
| CN116994631B (en) | ECC-based flash memory particle multiple screening method, controller and medium | |
| CN114003477B (en) | Method, system, terminal and storage medium for collecting diagnosis information of slow disk | |
| CN110597674B (en) | Memory detection method, device, video recording system and storage medium | |
| CN112908390B (en) | Data storage method, device, electronic equipment and storage medium | |
| US20160070657A1 (en) | Electronic Apparatus and Management Method Thereof | |
| CN112486717A (en) | Method, system, terminal and storage medium for verifying consistency of disk data | |
| CN107885640B (en) | Hard disk management method and device | |
| CN110544504A (en) | test method, system and equipment for memory ADDDC function | |
| CN116301665B (en) | Metering data storage method, metering data storage device, computer equipment and storage medium | |
| CN116758973A (en) | Testing method for unexpected power failure data verification of enterprise-level solid state disk | |
| CN116844627B (en) | Method, system and medium for power failure test of hard disk | |
| CN108038033A (en) | Test method and system based on linux system | |
| CN113409871B (en) | Method and device for acquiring erasing time, electronic equipment and storage medium | |
| CN115373924A (en) | Storage device automatic test method and device, storage device and storage medium | |
| CN118152300A (en) | Batch test system and method for carrying out NVMe SSD abnormal power-off read-write on Linux PC |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |