CN116705129A - Testing method of solid state disk - Google Patents
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Abstract
The application discloses a method for testing a solid state disk, which comprises the steps of partitioning the solid state disk to be tested, installing an operating system in one partition of the solid state disk, and generating a first test parameter for executing an initial test mode on the solid state disk; calling test software, and setting the current test object of the test software as a solid state disk; setting test software according to the first test parameters to perform a first test on the solid state disk in an initial test mode to obtain a first test result; monitoring a first test result of the test software, and generating a connection instruction for selecting one test mode from the test modes to be executed when the first test result is a passing test; and generating corresponding test parameters according to the associated instructions, setting test software according to the test parameters to test the solid state disk, and realizing automatic switching of test modes so as to ensure the test reliability of the solid state disk.
Description
Technical Field
The application relates to the technical field of solid state disks, in particular to a method for testing a solid state disk.
Background
The solid state disk, SSD (Solid State Disk) for short, is a carrier for storing data information, has the characteristics of quick reading and writing, light weight, low energy consumption, small volume and the like, and is widely applied to video monitoring equipment, network terminal equipment, power equipment, medical equipment, aviation equipment, navigation equipment and the like. In order to ensure the stability of the solid state disk, stability test is required before the solid state disk leaves the factory. In the related art, a stability test is generally performed on a solid state disk under a single test scene, and after the test is completed, a test mode is manually switched. However, in the stability test process, multiple test scenes are required to be configured, and a mode of manually switching test modes is adopted, so that omission and repetition are easy to occur, and the reliability of the test of the solid state disk is low.
Disclosure of Invention
The embodiment of the application provides a method for testing a solid state disk, which can effectively improve the test reliability of the solid state disk.
The embodiment of the application provides a method for testing a solid state disk, which comprises the following steps:
partitioning a solid state disk to be tested, installing an operating system in one partition of the solid state disk, and generating first test parameters for executing an initial test mode on the solid state disk;
calling test software, and setting the current test object of the test software as the solid state disk;
setting the test software according to the first test parameters, and performing a first test on the solid state disk in the initial test mode to obtain a first test result;
monitoring the first test result of the test software, and generating a joint instruction when the first test result is a passing test, wherein the joint instruction is used for selecting one test mode from test modes to be executed;
and generating corresponding test parameters according to the associated instructions, and setting the test software according to the test parameters so as to test the solid state disk.
The method for testing the solid state disk has the following advantages: partitioning the solid state disk to be tested so as to test the performance of the solid state disk in different partition states. Then, an operating system is installed in one partition of the solid state disk, first test parameters for executing an initial test mode on the solid state disk are generated, and then the first test parameters are utilized to set test software, so that the test software can test the solid state disk in the initial test mode, and performance test of the solid state disk based on the current test scene is achieved. The method comprises the steps of firstly testing the solid state disk for the first time in an initial test mode to obtain a first test result, and generating a connection instruction when the first test result is a passing test so as to select one test mode from the test modes to be executed. And generating corresponding test parameters according to the associated instructions, so that the test software can test the solid state disk for the next time in a test mode corresponding to the test parameters, automatic switching of the test mode is realized, and the test efficiency of the solid state disk is effectively improved. Based on the associated instructions, all test modes are traversed, the problem that the test modes are omitted and repeated in the test process of the solid state disk can be avoided, and the test reliability of the solid state disk is effectively ensured. Based on the testing method of the solid state disk, provided by the application, according to the testing result of the current testing mode, one testing mode is selected from the testing modes to be executed by utilizing the associated instructions, so that the testing software is tested in the selected testing mode, the automatic switching of the testing mode is realized, and compared with the mode of manually switching the testing mode in the related art, the problems of missing and repeating the testing mode in the testing process can be avoided, and the testing reliability of the solid state disk is effectively ensured.
According to some embodiments of the first aspect of the present application, the partitioning the solid state disk to be tested, and installing an operating system in a partition of the solid state disk, includes:
formatting the solid state disk into a single partition, setting the single partition as a system partition, and installing an operating system in the system partition;
or formatting the solid state disk into four partitions, selecting one of the partitions as a system partition, and installing an operating system in the system partition.
According to some embodiments of the first aspect of the present application, the installing an operating system in the system partition includes:
under the condition of a single partition, the system partition is guided to install the Windows10 system according to the installation mode of the Windows10 system, or the system partition is guided to install the Windows11 system according to the installation mode of the Windows11 system;
and under the condition of four partitions, the system partition is guided to install the Windows10 system according to the installation mode of the Windows10 system, or the system partition is guided to install the Windows11 system according to the installation mode of the Windows11 system.
According to some embodiments of the first aspect of the application, the test pattern comprises four preset patterns, the method further comprising:
selecting one preset mode from the four preset modes as an initial test mode;
and selecting one preset mode from the three remaining preset modes as a test mode corresponding to the associated instruction.
According to some embodiments of the first aspect of the present application, the upper computer is connected to a plurality of solid state disks to be tested, and for a current solid state disk to be tested, one preset mode is selected from the four preset modes as an initial test mode, including:
counting the number of each test mode of all solid state disks connected with the upper computer for testing;
and confirming the test mode with the least number as the initial test mode.
According to some embodiments of the first aspect of the present application, the four preset modes are a Highlow mode, a Butterfly mode, a Random mode, and a Default mode.
According to some embodiments of the first aspect of the present application, the number of test days in the Highlow mode, the Butterfly mode, and the Random mode is 4 days, and the number of test days in the Default mode is 2 days.
According to some embodiments of the first aspect of the application, the method further comprises:
determining an inspection time interval according to the test days of the current test mode;
and acquiring the test progress information of the test software according to the checking time interval.
According to some embodiments of the first aspect of the present application, the test progress information includes at least one of an operation state of test software, a serial port log, and an operation state of the solid state disk.
According to some embodiments of the first aspect of the present application, when the test progress information indicates that the current test is in an abnormal state, the current test of the solid state disk is terminated, and a completed test mode is recorded.
Drawings
The accompanying drawings are included to provide a further understanding of the application and are incorporated in and constitute a part of this specification, illustrate and do not limit the application.
FIG. 1 is a flow chart of a testing method of a solid state disk according to an embodiment of the present application;
FIG. 2 is a flow chart of a testing method of a solid state disk according to another embodiment of the present application;
FIG. 3 is a flowchart illustrating a method for selecting an initial test pattern according to an embodiment of the present application;
FIG. 4 is a flow chart of a testing method of a solid state disk according to another embodiment of the present application;
FIG. 5 is a flow chart of a testing method of a solid state disk according to another embodiment of the present application;
fig. 6 is a schematic hardware structure of an electronic device according to an embodiment of the present application.
Detailed Description
The present application will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present application more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application.
It will be appreciated that although functional block diagrams are depicted in the device diagrams, logical sequences are shown in the flowchart, in some cases, the steps shown or described may be performed in a different order than the block diagrams in the device. The terms first, second and the like in the description, in the claims and in the above-described figures, are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order.
The application provides a method for testing a solid state disk, which partitions the solid state disk to be tested so as to test the performance of the solid state disk in different partition states. Then, an operating system is installed in one partition of the solid state disk, first test parameters for executing an initial test mode on the solid state disk are generated, and then the first test parameters are utilized to set test software, so that the test software can test the solid state disk in the initial test mode, and performance test of the solid state disk based on the current test scene is achieved. The method comprises the steps of firstly testing the solid state disk for the first time in an initial test mode to obtain a first test result, and generating a connection instruction when the first test result is a passing test so as to select one test mode from the test modes to be executed. And generating corresponding test parameters according to the associated instructions, so that the test software can test the solid state disk for the next time in a test mode corresponding to the test parameters, automatic switching of the test mode is realized, and the test efficiency of the solid state disk is effectively improved. Based on the associated instructions, all test modes are traversed, the problem that the test modes are omitted and repeated in the test process of the solid state disk can be avoided, and the test reliability of the solid state disk is effectively ensured. Based on the testing method of the solid state disk, provided by the application, according to the testing result of the current testing mode, one testing mode is selected from the testing modes to be executed by utilizing the associated instructions, so that the testing software is tested in the selected testing mode, the automatic switching of the testing mode is realized, and compared with the mode of manually switching the testing mode in the related art, the problems of missing and repeating the testing mode in the testing process can be avoided, and the testing reliability of the solid state disk is effectively ensured.
Embodiments of the present application will be further described below with reference to the accompanying drawings.
Referring to fig. 1, fig. 1 is a step flowchart of a method for testing a solid state disk according to an embodiment of the present application, where the method for testing a solid state disk includes, but is not limited to, the following steps:
step S110, partitioning the solid state disk to be tested, installing an operating system in one partition of the solid state disk, and generating first test parameters for executing an initial test mode on the solid state disk;
step S120, calling test software, and setting the current test object of the test software as a solid state disk;
step S130, setting test software according to the first test parameters to perform a first test on the solid state disk in an initial test mode, so as to obtain a first test result;
step S140, monitoring a first test result of the test software, and generating a joint instruction for selecting one test mode from the test modes to be executed when the first test result is a passing test;
and S150, generating corresponding test parameters according to the associated instructions, and setting test software according to the test parameters so as to test the solid state disk.
It should be noted that, the embodiment of the present application is not limited to the specific type of calling the Test software, and may call only the BIT Test software, or call both the BIT Test software and the sds Test software, or call the H2Test software, etc. The embodiment of the application also does not limit the specific type of the first test parameter, and can comprise a writing speed, a reading speed, a seek speed, a data block size and the like.
It can be understood that the solid state disk to be tested is partitioned so as to be convenient for performance test of the solid state disk in different partition states. And then, installing an operating system in one partition of the solid state disk, and generating first test parameters for executing an initial test mode on the solid state disk. And setting the test software by using the first test parameters, so that the test software can test the solid state disk in an initial test mode, and further, the performance test of the solid state disk based on the current test scene is realized. The method comprises the steps of firstly testing the solid state disk for the first time in an initial test mode to obtain a first test result, and when the first test result is a passing test, indicating that the solid state disk has good performance in the current test scene, generating a connection instruction so as to be convenient for selecting one test mode from the test modes to be executed. And generating corresponding test parameters according to the associated instructions, so that the test software can perform the next test on the solid state disk in a test mode corresponding to the test parameters, thereby realizing automatic switching of the test mode and effectively improving the test efficiency of the solid state disk. Based on the associated instructions, all test modes are traversed, the problem that the test modes are omitted and repeated in the test process of the solid state disk can be avoided, and the test reliability of the solid state disk is effectively ensured. Based on the testing method of the solid state disk, provided by the application, according to the testing result of the current testing mode, one testing mode is selected from the testing modes to be executed by utilizing the associated instructions, so that the testing software is tested in the selected testing mode, the automatic switching of the testing mode is realized, and compared with the mode of manually switching the testing mode in the related art, the problems of missing and repeating the testing mode in the testing process can be avoided, and the testing reliability of the solid state disk is effectively ensured.
It can be understood that when the first test result is that the test is passed, the solid state disk can be safely erased so as to ensure the accuracy of the next test.
It can be understood that the corresponding test parameters are generated according to the associated instruction, and may be generated according to a test mode selected from test modes to be executed and a preset test parameter generation rule; or generating corresponding test parameters according to the test mode selected from the test modes to be executed and the first test result, and adaptively finding out the optimal test parameters so as to be close to a real test scene, thereby ensuring the test accuracy of the solid state disk.
In addition, in an embodiment, the method steps of partitioning the solid state disk to be tested and installing the operating system in one partition of the solid state disk further include, but are not limited to, the following steps:
formatting the solid state disk into a single partition, setting the single partition as a system partition, and installing an operating system in the system partition;
or formatting the solid state disk into four partitions, selecting one of the partitions as a system partition, and installing an operating system in the system partition.
It should be noted that, the embodiment of the present application does not limit a specific manner of formatting the solid state disk into four partitions, and may format the solid state disk into four partitions with equal capacity, or format the solid state disk into four partitions with equal capacity ratio, or may be adjusted according to actual test requirements. The embodiment of the application also does not limit the partition number of the solid state disk, and the solid state disk can be one partition, four partitions, six partitions and the like.
It can be understood that, because the service life of the main control of the solid state disk is overall, the firmware algorithm in the main control can dynamically map the logical address corresponding to the data in the solid state disk to the physical space of the whole solid state disk, so as to ensure the data transmission rate and service life of the solid state disk, format the solid state disk into a single partition, set the single partition as a system partition, and install an operating system in the system partition, so as to realize the performance state of the solid state disk under the test scene of the single partition.
It will be appreciated that in the case of formatting a solid state disk as a single partition, subsequent data reading, fetching, erasing, etc. operations are performed in the single partition.
It can be understood that the solid state disk is partitioned into a plurality of partitions, and the system and the data are stored separately, so that the risk of losing the hard disk file can be reduced. Formatting the solid state disk into four partitions, selecting one of the partitions as a system partition, and installing an operating system in the system partition to realize the performance state of the solid state disk under the test scene of a plurality of partitions.
It can be understood that based on the same test parameters, after a plurality of solid state disks are formatted into a single partition, a plurality of solid state disks are formatted into four partitions with equal capacity, and a plurality of solid state disks are formatted into four partitions with unequal capacity, the same test modes are respectively performed, and the test results are compared and analyzed to determine the optimal partition scheme of the solid state disks. Different partition treatments are carried out on the solid state disk so as to meet the requirement that more test scenes can be covered for testing the solid state disk, and the test reliability of the solid state disk is ensured.
Additionally, in one embodiment, the method steps of installing an operating system in a system partition further include, but are not limited to, the steps of:
under the condition of a single partition, the system partition is guided to install the Windows10 system according to the installation mode of the Windows10 system, or the system partition is guided to install the Windows11 system according to the installation mode of the Windows11 system;
in the case of four partitions, the system partition is booted to install the Windows10 system according to the installation mode of the Windows10 system, or the system partition is booted to install the Windows11 system according to the installation mode of the Windows11 system.
It should be noted that, the embodiment of the present application is not limited to the specific type of the operating system, and may be a Windows10 system or a Windows11 system, a Windows7 system or a Windows XP system, a linux system or a Mac OS system, or the like.
It can be understood that only one operating system can be installed in the using process of each solid state disk, and the performances of the solid state disks are different based on different operating systems. Under the condition of a single partition, the system partition is guided to install the Windows10 system according to the installation mode of the Windows10 system, or the system partition is guided to install the Windows11 system according to the installation mode of the Windows11 system, after different operating systems are installed on a plurality of solid state disks under the same partition condition, the same test mode is respectively carried out, and the optimal operating system installation scheme of the solid state disk under the condition of the single partition can be determined by comparing and analyzing the test results.
It can be understood that in the case of four partitions, the system partition is guided to install the Windows10 system according to the installation mode of the Windows10 system, or the system partition is guided to install the Windows11 system according to the installation mode of the Windows11 system, so that the optimal operating system installation scheme in the case that the solid state disk is based on four partitions can be determined. And the test results obtained by the single-partition solid state disk under the Windows10 system and the four-partition solid state disks under the Windows10 system based on the same test mode can be compared and analyzed to determine the most scientific configuration scheme of the solid state disk. Different operating systems are installed on the solid state disk, so that the test of the solid state disk can be met, more test scenes can be covered, and the test reliability of the solid state disk is guaranteed.
In addition, referring to fig. 2, in an embodiment, the test mode includes four preset modes, and the method for testing a solid state disk further includes, but is not limited to, the following steps:
step S210, selecting a preset mode from four preset modes as an initial test mode;
step S220, selecting one preset mode from the three remaining preset modes as a test mode corresponding to the associated instruction.
It can be understood that one preset mode is selected from the four preset modes as an initial test mode, so that a first test parameter is generated according to the initial test mode, and therefore, the test software is set according to the first test parameter to perform a first test on the solid state disk in the initial test mode. And selecting one preset mode from the three remaining preset modes as a test mode corresponding to the associated instruction so as to generate corresponding test parameters according to the selected preset mode, thereby setting test software according to the test parameters to perform the next test on the solid state disk. One preset mode is selected from the remaining three preset modes to serve as a test mode corresponding to the associated instruction, so that the problem of missing and repeated test modes in the test process of the solid state disk is avoided, and the test efficiency of the solid state disk can be ensured.
In addition, referring to fig. 3, in an embodiment, step S210 in the embodiment shown in fig. 2 further includes, but is not limited to, the following steps:
step S310, counting the number of each test mode of all solid state disks connected with an upper computer for testing;
in step S320, the test mode with the least number is confirmed as the initial test mode.
It can be understood that the number of each test mode of all the solid state disks connected with the upper computer for testing is counted, so that the current situation of the test mode is known, the test mode with the least number is confirmed as the initial test mode, the problem of crowding in test caused by excessive number of the same test mode can be avoided, the test of the solid state disks is orderly carried out, and the test efficiency of the solid state disks is ensured.
It can be appreciated that in an embodiment, when there are a plurality of test modes with the smallest number, the test mode with the shortest test time length in the plurality of test modes with the smallest number can be confirmed as the initial test mode, so as to improve the test efficiency of the solid state disk.
In one embodiment, the four preset modes are a Highlow mode, a Butterfly mode, a Random mode, and a Default mode.
It can be understood that the Highlow mode can be used for testing the performance of the solid state disk in a test scene with overweight high and low frequency data; the Butterfly mode can be used for testing the seek performance of the solid state disk; the Random mode can be used for testing the Random data processing performance of the solid state disk; the Default mode is used for carrying out cyclic test on the solid state disk so as to test the service life of the solid state disk. The solid state disk is tested in four preset modes, namely a high mode, a button mode, a Random mode and a Default mode, so that the solid state disk is tested more comprehensively, and the testing reliability of the solid state disk can be ensured.
In one embodiment, the high, button, and Random modes are tested for 4 days and the Default mode is tested for 2 days.
It can be understood that the number of test days of the high mode, the button mode and the Random mode is 4 days, the number of test days of the Default mode is 2 days, and the test time cost of the solid state disk can be reduced while the test reliability of the solid state disk is ensured through reasonable test time length setting.
It can be understood that the number of test days in the Highlow mode, the button mode and the Random mode may be 5 days or 6 days, and the number of test days in the Default mode may be 3 days or 4 days, and may be adjusted according to the actual test requirement, which is not repeated herein.
In addition, referring to fig. 4, in an embodiment, the method for testing a solid state disk further includes, but is not limited to, the following steps:
step S410, determining an inspection time interval according to the test days of the current test mode;
step S420, test progress information of the test software is obtained according to the checking time interval.
It can be understood that the checking time interval is determined according to the number of test days of the current test mode, so as to set a reasonable checking scheme, for example, the number of test days is 4 days, and the checking time interval is 4 hours, so that the problem of information redundancy caused by frequently acquiring the test progress information of the test software is avoided. The test progress information of the test software is acquired according to the checking time interval, so that whether the current test mode is wrong or not can be confirmed in time, the problem of test resource loss caused by the fact that the current test mode is wrong and the problem of continuous test is solved, and the test time cost and the resource cost of the solid state disk can be effectively reduced.
In an embodiment, the test progress information includes at least one of an operating state of the test software, a serial log, and an operating state of the solid state disk.
It can be understood that by acquiring the running state of the test software, whether the test software can run normally is judged, the problem that the test accuracy of the solid state disk is low due to the fact that the test software crashes in the test process is avoided, and the stable running of the test can be ensured by checking the running state of the test software. By acquiring the serial port log, the data processing performance of the current solid state disk can be accurately confirmed, so that whether the performance of the solid state disk meets preset delivery requirements or not and whether the current test mode is finished or not can be checked. By acquiring the working state of the solid state disk, whether the solid state disk has faults, crashes, damages and the like can be confirmed, so that stable test is ensured.
It can be understood that the test progress information can also include the test time length, the temperature of the solid state disk, and the like.
In addition, referring to fig. 5, in an embodiment, the method for testing a solid state disk further includes, but is not limited to, the following steps:
and step S510, when the test progress information indicates that the current test is in an abnormal state, terminating the current test of the solid state disk and recording the completed test mode.
It can be understood that when the test progress information indicates that the current test is in an abnormal state, the current test of the solid state disk is terminated, damage to the solid state disk is avoided, meanwhile, the problem of test resource loss caused by the fact that the current test mode is wrong and the problem of continuous test is still solved is avoided, and the test time cost and the resource cost of the solid state disk are reduced. The completed test mode is recorded, so that the performance of the solid state disk before the test abnormality is analyzed conveniently, and the subsequent maintenance of the solid state disk is facilitated.
It can be understood that when the test progress information indicates that the current test is in an abnormal state, abnormal information can be generated, so that a manager can modify or maintain the test software, the test parameters or the solid state disk in time according to the abnormal information.
In an embodiment, the method for testing a solid state disk may further include, but is not limited to, the following steps: and responding to the specified test mode instruction, determining a test mode of the next test according to the specified test mode instruction, and generating test parameters according to the test mode. When the specified test mode instruction is generated after the corresponding test parameters are generated according to the associated instruction, replacing the current test parameters with the test parameters corresponding to the specified test mode instruction; when the specified test mode instruction is generated before the corresponding test parameters are generated according to the associated instruction, the step of generating the corresponding test parameters according to the associated instruction is skipped.
It can be appreciated that when the test mode corresponding to the specified test mode instruction is completed or in progress, a prompt message is generated to facilitate the subsequent modification of the specified test mode; or after the prompt message is generated, if a new instruction of the specified test mode is not received within a preset time length, generating a connection instruction.
In addition, referring to fig. 6, an embodiment of the present application further provides an electronic device 600, the electronic device 600 including: memory 610, processor 620, and computer programs stored on memory 610 and executable on processor 620.
The processor 620 and the memory 610 may be connected by a bus or other means.
The non-transitory software program and instructions required to implement the method for testing a solid state disk of the above embodiments are stored in the memory 610, and when executed by the processor 620, the method for testing a solid state disk of the above embodiments is performed, for example, the method steps S110 to S150 in fig. 1, the method steps S210 to S220 in fig. 1, the method steps S310 to S320 in fig. 3, the method steps S410 to S420 in fig. 4, and the method step S510 in fig. 5 described above are performed.
The above described apparatus embodiments are merely illustrative, wherein the units illustrated as separate components may or may not be physically separate, i.e. may be located in one place, or may be distributed over a plurality of network elements. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
Furthermore, an embodiment of the present application provides a computer-readable storage medium storing computer-executable instructions that are executed by a processor 620 or a controller, for example, by the processor 620 in the electronic device 600, so that the processor 620 performs the method for testing the solid state disk in the embodiment, for example, the method steps S110 to S150 in fig. 1, the method steps S210 to S220 in fig. 1, the method steps S310 to S320 in fig. 3, the method steps S410 to S420 in fig. 4, and the method step S510 in fig. 5 described above. Those of ordinary skill in the art will appreciate that all or some of the steps, systems, and methods disclosed above may be implemented as software, firmware, hardware, and suitable combinations thereof. Some or all of the physical components may be implemented as software executed by a processor 620, such as a central processing unit, digital signal processor, or microprocessor, or as hardware, or as an integrated circuit, such as an application specific integrated circuit. Such software may be distributed on computer readable media, which may include computer storage media (or non-transitory media) and communication media (or transitory media). The term computer storage media includes both volatile and nonvolatile, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data, as known to those skilled in the art. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital Versatile Disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can be accessed by a computer. Furthermore, as is well known to those of ordinary skill in the art, communication media typically embodies computer readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism and includes any information delivery media.
In the description of the present specification, reference to the terms "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
While the preferred embodiment of the present application has been described in detail, the present application is not limited to the above embodiment, and various equivalent modifications and substitutions can be made by those skilled in the art without departing from the spirit of the present application, and these equivalent modifications and substitutions are intended to be included in the scope of the present application as defined in the appended claims.
Claims (10)
1. The method for testing the solid state disk is characterized by comprising the following steps of:
partitioning a solid state disk to be tested, installing an operating system in one partition of the solid state disk, and generating first test parameters for executing an initial test mode on the solid state disk;
calling test software, and setting the current test object of the test software as the solid state disk;
setting the test software according to the first test parameters, and performing a first test on the solid state disk in the initial test mode to obtain a first test result;
monitoring the first test result of the test software, and generating a joint instruction when the first test result is a passing test, wherein the joint instruction is used for selecting one test mode from test modes to be executed;
and generating corresponding test parameters according to the associated instructions, and setting the test software according to the test parameters so as to test the solid state disk.
2. The method for testing a solid state disk according to claim 1, wherein partitioning the solid state disk to be tested and installing an operating system in a partition of the solid state disk comprises:
formatting the solid state disk into a single partition, setting the single partition as a system partition, and installing an operating system in the system partition;
or formatting the solid state disk into four partitions, selecting one of the partitions as a system partition, and installing an operating system in the system partition.
3. The method for testing a solid state disk according to claim 2, wherein installing an operating system in the system partition comprises:
under the condition of a single partition, the system partition is guided to install the Windows10 system according to the installation mode of the Windows10 system, or the system partition is guided to install the Windows11 system according to the installation mode of the Windows11 system;
and under the condition of four partitions, the system partition is guided to install the Windows10 system according to the installation mode of the Windows10 system, or the system partition is guided to install the Windows11 system according to the installation mode of the Windows11 system.
4. The method for testing a solid state disk according to claim 1, wherein the test modes include four preset modes, the method further comprising:
selecting one preset mode from the four preset modes as an initial test mode;
and selecting one preset mode from the three remaining preset modes as a test mode corresponding to the associated instruction.
5. The method for testing a solid state disk according to claim 4, wherein the upper computer is connected to a plurality of solid state disks to be tested, and for the current solid state disk to be tested, selecting one preset mode from the four preset modes as an initial test mode comprises:
counting the number of each test mode of all solid state disks connected with the upper computer for testing;
and confirming the test mode with the least number as the initial test mode.
6. The method for testing a solid state disk according to claim 4, wherein the four preset modes are a Highlow mode, a button mode, a Random mode and a Default mode.
7. The method for testing a solid state disk according to claim 6, wherein the number of test days in the high mode, the button mode, and the Random mode is 4 days, and the number of test days in the Default mode is 2 days.
8. The method for testing a solid state disk of claim 7, further comprising:
determining an inspection time interval according to the test days of the current test mode;
and acquiring the test progress information of the test software according to the checking time interval.
9. The method for testing a solid state disk according to claim 8, wherein the test progress information includes at least one of an operation state of test software, a serial port log, and an operation state of the solid state disk.
10. The method for testing a solid state disk of claim 8, further comprising:
and when the test progress information indicates that the current test is in an abnormal state, terminating the current test of the solid state disk and recording the completed test mode.
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