CN115480147A - Multistation chip test machine - Google Patents
Multistation chip test machine Download PDFInfo
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- CN115480147A CN115480147A CN202210838145.3A CN202210838145A CN115480147A CN 115480147 A CN115480147 A CN 115480147A CN 202210838145 A CN202210838145 A CN 202210838145A CN 115480147 A CN115480147 A CN 115480147A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
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- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention provides a multi-station chip testing machine which comprises a main substrate, wherein the main substrate is provided with a conveying device, a feeding device and a testing device, the testing device comprises a testing bottom plate and a testing lifting plate, the testing bottom plate is provided with an automatic turntable, a testing slide rail, a testing guide pillar and a lifting motor, the automatic turntable is provided with a plurality of chip carriers which are centrosymmetric, the chip carriers are provided with testing holes, the testing slide rail is provided with a slide plate, the slide plate is provided with an upper oblique pushing seat and a testing transverse pushing nut which are fixed, the lifting motor is provided with a testing transverse moving lead screw matched with the testing transverse moving nut, the bottom of the testing lifting plate is provided with a testing lifting guide sleeve and a lower oblique pushing seat, the testing lifting guide sleeve is matched with the testing guide pillar, the lower oblique pushing seat and the upper oblique pushing seat are symmetrically inclined, the top of the testing lifting plate is provided with a tester which is centrosymmetric and matched with the chip carriers, and the tester is provided with testing needles; the chip testing machine realizes the simultaneous multi-item test of a plurality of chips; the invention belongs to the technical field of test equipment.
Description
Technical Field
The invention belongs to the technical field of test equipment, and particularly relates to a multi-station chip tester.
Background
In the manufacturing process of the chip, various performances of the chip are basically tested before production so as to ensure the quality of the product after production. In the existing test engineering, a chip is taken up from a conveyor belt by a worker or a manipulator and is placed in a certain test device for testing, after the test is finished, the chip is taken back and placed on the conveyor belt, and then the chip is conveyed to another test device by the conveyor belt for testing, so that in the existing test engineering, a large amount of time is consumed to wait for each test item to finish the test, and a worker or a manipulator is required to be arranged at a station where each test device is located to place the chip in the test device for testing.
Disclosure of Invention
The invention aims to provide a multi-station chip testing machine, which can realize the simultaneous multi-item testing of a plurality of chips, thereby solving the technical problems.
The automatic loading and unloading device comprises a main substrate, wherein the main substrate is provided with a conveying device, a loading device and a testing device, the testing device comprises a testing bottom plate and a testing lifting plate, the testing bottom plate is provided with an automatic turntable, a testing slide rail, a testing guide pillar and a lifting motor, the automatic loading plate is provided with a plurality of chip carriers with centrosymmetry, the chip carriers are provided with testing holes, the testing slide rail is provided with a slide plate, the slide plate is provided with an upper oblique pushing seat, a testing transverse pushing nut and a chip information sensor, the lifting motor is provided with a testing transverse moving lead screw matched with the testing transverse moving nut, the bottom of the testing lifting plate is provided with a testing lifting guide sleeve and a lower oblique pushing seat, the testing lifting guide sleeve is matched with the testing guide pillar, the lower oblique pushing seat and the upper oblique pushing seat are symmetrically inclined, the top of the testing lifting plate is provided with a tester with centrosymmetry and matched with the chip carriers, the tester is provided with testing needles matched with the testing holes, and the testing lifting plate is provided with an induction window which is symmetrical with the center of the tester and matched with the chip information sensor.
Preferably, the testing device further comprises a testing top plate, and the testing top plate is provided with centrosymmetric burners matched with the chip carriers.
More specifically, loading attachment includes left material loading seat, right side material loading seat and material loading sideslip board, left side material loading seat top is equipped with the material loading and indulges the slide rail that moves, right side material loading seat is installed the material loading and is indulged the slip table cylinder that moves, the one end of material loading sideslip board is installed and is indulged the material loading that moves the slide rail complex with the material loading and indulge the slider that moves, the other end installation of material loading sideslip board is fixed in the material loading and indulges on moving the slip table cylinder, material loading sideslip board is installed material loading sideslip slip table cylinder, the material loading is indulged and is moved the slip table cylinder and be provided with the material loading lifter plate, material loading lift slip table cylinder is installed to the material loading lifter plate, material loading lift slip table cylinder is provided with the material loading adsorber.
More specifically, the conveying device is located below the overall substrate; the conveying device comprises a feeding rack, a material ejecting plate and a material tray; the automatic material pushing and conveying device comprises a feeding rack, a pushing nut bearing seat, a pushing motor and a pushing guide sleeve, wherein the two sides of the feeding rack are provided with feeding conveying belts for supporting the two sides of a material carrying disc, the other sides of the feeding conveying belts are provided with conveying limiting strips, the feeding rack is provided with the pushing nut bearing seat, the pushing motor is in transmission connection with the pushing nut bearing seat, the bottom of a pushing plate is provided with a pushing screw rod and a pushing guide pillar, the pushing screw rod is matched with the pushing nut bearing seat, the pushing guide pillar is matched with the pushing guide sleeve, and the pushing plate is matched with a material disc.
More specifically, the two sides of the bottom of the material tray are provided with carrying ports, and one end of the conveying device is provided with a feeding device; feed arrangement includes feeding base plate and feeding lifter plate, feeding base plate install with charging tray four corners complex blanking limiting plate and blanking telescopic cylinder, blanking telescopic cylinder be provided with hold in the palm carry mouthful complex support year lug, feeding base plate fixed mounting has feeding guide pin bushing and feeding nut, the feeding lifter plate is equipped with the feeding spout, the feeding lifter plate is installed and is pushed the cylinder, it is provided with the push pedal that is located the feeding spout to push the cylinder, the bottom of feeding lifter plate install with feeding guide pin bushing complex feeding guide pillar, the feeding bottom plate is installed to the bottom of feeding guide pillar, the feeding bottom plate is provided with feeding elevator motor and feeding lift lead screw, feeding elevator motor is connected with feeding lift lead screw transmission, feeding lift lead screw and feeding nut cooperation.
More specifically, a material pulling groove is arranged at the bottom of the material tray, and a material discharging device is arranged at the other end of the conveying device; discharging device includes ejection of compact base plate and ejection of compact lifter plate, ejection of compact base plate installs and stacks a limiting plate and stacks the material supporting seat with charging tray four corners complex, it installs the material tray piece that piles that the bearing is connected to fold the material supporting seat, it is provided with the torsional spring that resets to fold the material tray piece, ejection of compact base plate installs and stacks material lift cylinder and stacks the material guide pin bushing, it is connected with ejection of compact lifter plate to stack material lift cylinder, ejection of compact lifter plate installs and stacks material guide pin bushing complex and fold the material lift axle, ejection of compact lifter plate is equipped with ejection of compact spout, ejection of compact lifter plate installs the material cylinder, the material cylinder that draws is provided with the drawing board that is located ejection of compact spout, drawing board and drawing groove cooperation, ejection of compact lifter plate is connected with stacking the material lift cylinder, ejection of compact lifter plate installation and stacking the material guide pillar of material guide pin bushing complex.
Preferably, the total substrate is provided with the conveying devices side by side, and the material moving device is arranged above the conveying devices; move the material device including moving the material motor, move the material slide rail and move the flitch, move the material motor and move material slide rail fixed mounting on total base plate, it is provided with and moves the material lead screw to move the material motor, it has and moves the material slider and move the material nut to move flitch fixed mounting, move the material slider and move the material slide rail cooperation, move the material nut and move the material lead screw cooperation, move the flitch establish with feeding lifter plate complex hole of stepping down, the centre gripping cylinder that the symmetry set up is installed in the hole of stepping down, the centre gripping cylinder be provided with charging tray both sides complex centre gripping strip.
The following are the beneficial effects of the invention:
the chip testing machine drives a plurality of carriers for placing products to move simultaneously through the automatic turntable, when the products in one carrier finish testing on a first upper tester and move to a next tester for testing, another product synchronously moves to the first tester for testing simultaneously with the first product, and the like, the chip testing machine realizes simultaneous multiple tests on a plurality of chips, so that the waiting time of the products in each test is reduced in the testing process, and a worker or an installation manipulator is arranged on a station where each test item is positioned to place the products in the testing equipment or take the products out of the testing equipment, so that the testing cost is reduced.
Drawings
In order to more clearly illustrate the embodiments of the present invention, the drawings and reference numerals used in the description of the embodiments will be briefly described below.
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic structural view of the feeding device of the present invention;
FIG. 3 is a schematic structural diagram of the testing device of the present invention;
FIG. 4 is a side elevational view of the test device of the present invention;
FIG. 5 is a schematic view of the automatic turntable according to the present invention;
FIG. 6 is a schematic diagram of a tester according to the present invention;
FIG. 7 is a schematic view of a chip carrier according to the present invention;
FIG. 8 is a schematic view of the structure of the conveying device of the present invention
FIG. 9 is a side elevational view of the delivery device of the present invention;
FIG. 10 is a schematic view of the structure of the feeding device of the present invention;
FIG. 11 is a cross-sectional view of the feeder device of the present invention;
FIG. 12 is a schematic view of the discharge device of the present invention;
FIG. 13 is a cross-sectional view of the discharge apparatus of the present invention;
FIG. 14 is a cross-sectional view of the stack support seat of the present invention;
FIG. 15 is a schematic structural diagram of the material moving device of the present invention;
fig. 16 is a schematic view of the structure of the tray of the present invention.
Reference numerals:
10. a total substrate; 11. a material tray; 110. a carrying port; 111. a chute is pulled;
2. a conveying device; 21. a feeding frame; 211. a feeding conveyor belt; 212. conveying a limiting strip; 213. a jacking nut bearing seat; 214. a material ejecting motor; 215. a material ejecting guide sleeve; 22. a material ejecting plate; 221. a material ejecting screw rod; 222. a material ejecting guide pillar;
3. a feeding device; 31. a left feeding seat; 311. feeding and longitudinally moving the sliding rail; 32. a right feeding seat; 321. a sliding table cylinder is longitudinally moved in a feeding manner; 33. feeding and transversely moving the plates; 331. a feeding longitudinal moving slide block; 332. a feeding transverse sliding table cylinder; 34. a feeding lifting plate; 35. a feeding lifting sliding table cylinder; 36. a feeding adsorber;
4. a testing device; 41. testing the bottom plate; 411. automatic rotating disc; 412. testing the slide rail; 413. testing the guide pillar; 414. a lifting motor; 415. a chip carrier; 416. a test well; 417. testing the transverse screw rod; 42. testing the lifting plate; 421. testing the lifting guide sleeve; 422. a lower inclined pushing seat; 423. a tester; 424. a test pin; 425. an induction window; 43. a test well; 431. an upper inclined pushing seat; 432. testing the traversing nut; 433. a chip information sensor; 44. testing the top plate; 441. a burner; 43. a slider plate;
5. a feeding device; 51. a feed substrate; 511. a blanking limit plate; 512. a blanking telescopic cylinder; 513. carrying the bump; 514. a feeding guide sleeve; 515. a feed nut; 516. a feed chute; 517. pushing into a cylinder; 518. pushing the plate; 52. a feed lifter plate; 521. a feeding guide pillar; 53. a feed floor; 531. a feeding lifting motor; 532. a feeding lifting screw rod;
6. a discharging device; 61. discharging the substrate; 611. a disc stacking limiting plate; 612. stacking a material supporting seat; 613. stacking a material supporting block; 6130. a return torsion spring; 614. a stacking lifting cylinder; 615. stacking a material guide sleeve; 62. a discharging lifting plate; 621. a discharge chute; 622. a material pulling cylinder; 623. a material pulling plate; 624. stacking guide pillars;
7. a material moving device; 71. a material moving motor; 711. a material moving screw rod; 72. a material moving slide rail; 73. a material moving plate; 731. a material moving sliding block; 732. a material moving nut; 74. a hole of abdication; 741. a clamping cylinder; 742. and (4) clamping the strip.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail with reference to the accompanying drawings in conjunction with the following detailed description. It is to be understood that these descriptions are only illustrative and are not intended to limit the scope of the present invention. Moreover, in the following description, descriptions of well-known structures and techniques are omitted so as to not unnecessarily obscure the concepts of the present invention.
As shown in fig. 1, the present invention includes a total substrate 10, and the total substrate 10 is mounted with a conveying device 2, a loading device 3, a testing device 4, a feeding device 5, a discharging device 6, and a transferring device 7.
As shown in fig. 3 to 7, the testing device 4 includes a testing base plate 41 and a testing elevating plate 42;
the test base plate 41 is provided with an automatic turntable 411, a test slide rail 412, a test guide pillar 413 and a lifting motor 414;
the automatic tray loading device is provided with a plurality of chip carriers 415 which are centrosymmetric, and the chip carriers 415 are provided with test holes 43416;
the test sliding rail 412 is provided with a sliding block plate 43, the sliding block plate 43 is provided with a fixed upper inclined pushing seat 431, a test traversing nut 432 and a chip information sensor 433, and the lifting motor 414 is provided with a test traversing screw 417 matched with the test traversing nut 432;
the bottom of the test lifting plate 42 is provided with a test lifting guide sleeve 421 and a lower inclined pushing seat 422, the test lifting guide sleeve 421 is matched with the test guide post 413, the lower inclined pushing seat 422 is symmetrically inclined with the upper inclined pushing seat 431, the top of the test lifting plate 42 is provided with a tester 423 which is centrosymmetrically arranged and matched with the chip carrier 415, the tester 423 is provided with a test needle 424 matched with the test hole 43416, and the test lifting plate 42 is provided with a sensing window 425 which is centrosymmetrically arranged with the tester 423 and matched with the chip information sensor 433.
The conveying device 2 transfers the chip to the feeding device 3, and the feeding device 3 clamps and places the chip in the carrier above the induction window 425;
when reading the chip information, the lifting motor 414 drives the testing traversing screw 417 to rotate, the testing traversing screw 417 drives the slider plate 43 to move on the testing slide rail 412 by matching with the testing traversing nut 432, and the slider plate 43 drives the chip information sensor 433 to move below the sensing window 425 when moving, so as to read the information of the chip above the sensing window 425;
during testing, the lifting motor 414 drives the testing traverse screw 417 to rotate, the testing traverse screw 417 drives the slider plate 43 to move on the testing slide rail 412 through matching with the testing traverse nut 432, the slider plate 43 drives the lower inclined pushing seat 422 to move, and the lower inclined pushing seat 422 drives the testing lifting plate 42 to ascend through matching with the upper inclined pushing seat 431 when moving, so that the testing pin 424 ascends to penetrate through the testing hole 43416 to be in contact with a chip in the carrier, and is electrified with the chip for testing;
the automatic turntable 411 drives the chip carrier 415 to move, when the chip in the first chip carrier 415 is moved to the position of the first tester 423, the feeding device 3 places the second chip in the second chip carrier 415, and when the first tester 423 tests the first chip, the chip information sensor 433 reads the information of the second chip; after that, when the chip in the first chip carrier 415 is moved to the position of the second tester 423, the chip in the second chip carrier 415 is moved to the position of the first tester 423, the feeding device 3 places the nth chip in the nth chip carrier 415, the second tester 423 tests the first chip, the first tester 423 tests the second chip, the chip information sensor 433 reads the nth chip, and when all the tests of the chips in the chip carrier 415 are completed, the chips move around and move back to the sensing window 425, at this time, the feeding device 3 takes out the chips and places the chips back onto the conveying device 2, and places the (n + 1) th chip in the chip carrier 415.
In some embodiments, the testing apparatus 4 further includes a testing top plate 44, and the testing top plate 44 is installed with a programming device 441 that is centrally symmetric and cooperates with the chip carrier 415 to record information on the chip before or after the chip is tested by the testing device 423.
As shown in fig. 2, in some embodiments: loading attachment 3 includes left material loading seat 31, right side material loading seat 32 and material loading sideslip board 33, left side material loading seat 31 top is equipped with the material loading and indulges slide rail 311 that moves, right side material loading seat 32 is installed the material loading and is indulged and move slip table cylinder 321, the one end of material loading sideslip board 33 is installed and is indulged the material loading that moves slide rail 311 complex and indulge and move slider 331, the other end installation of material loading sideslip board 33 is fixed in the material loading and indulges and move on slip table cylinder 321, material loading sideslip board 33 is installed material loading sideslip slip table cylinder 332, the material loading is indulged and is moved the slip table cylinder and be provided with material loading lifter plate 34, material loading lifter plate 34 installs material loading lift slip table cylinder 35, material loading lift slip table cylinder 35 is provided with material loading adsorber 36.
The feeding longitudinal sliding table cylinder 321 drives the feeding transverse moving plate 33 to longitudinally move back and forth on the feeding longitudinal sliding rail 311, the feeding transverse sliding table cylinder 332 on the feeding transverse moving plate 33 drives the feeding lifting plate 34 to transversely move back and forth, and the feeding lifting sliding table cylinder 35 drives the feeding absorber 36 to lift back and forth, so that products on the conveying device 2 are adsorbed and placed in the chip carrier 415 or chips are taken out of the chip carrier 415.
The chip testing machine drives a plurality of carriers for placing products to move simultaneously through the automatic turntable 411, when a product in one carrier finishes testing and moves to the next tester 423 for testing on the first tester 423, another product synchronously moves to the first tester 423 for testing simultaneously with the first product, and so on, the chip testing machine realizes simultaneous multiple tests on a plurality of chips, thereby reducing the waiting time of the product during each test in the testing process, and reducing the arrangement of workers or installation manipulators on the station where each test item is positioned for placing the product in the testing equipment or taking the product out of the testing equipment, so as to reduce the testing cost.
As shown in fig. 8 and 9, in some embodiments: the conveying device 2 is positioned below the total base plate 10, and the conveying device 2 comprises a feeding rack 21, an ejector plate 22 and a material tray 11; the two sides of the feeding frame 21 are provided with feeding conveyer belts 211 for supporting the two sides of the material tray 11, and conveying limit strips 212 are arranged beside the feeding conveyer belts 211; the feeding rack 21 is provided with a material ejecting nut bearing seat 213, a material ejecting motor 214 and a material ejecting guide sleeve 215, and the material ejecting motor 214 is in transmission connection with the material ejecting nut bearing seat 213; the bottom of the ejector plate 22 is fixedly provided with an ejector screw rod 221 and an ejector guide post 222, the ejector screw rod 221 is matched with the ejector nut bearing block 213, the ejector guide post 222 is matched with the ejector guide sleeve 215, and the ejector plate 22 is matched with the material tray 11.
A plurality of chips are arranged in the material tray 11, the material conveying belt 211 drives the material tray 11 to move to the position below the material feeding device 3 and above the material ejecting plate 22, then the material ejecting motor 214 drives the material ejecting nut bearing seat 213 to rotate, and the material ejecting nut bearing seat 213 drives the material ejecting screw rod 221 to move so as to drive the material ejecting plate 22 to ascend, so that the material tray 11 ascends; thereby avoiding the problem that the material tray 11 is easy to shift on the conveyor belt when taking materials.
As shown in fig. 10, 11 and 15, in some embodiments: the two sides of the bottom of the material tray 11 are provided with a carrying port 110, and one end of the conveying device 2 is provided with a feeding device 5;
the feeding device 5 comprises a feeding base plate 51 and a feeding lifting plate 52, the feeding base plate 51 is provided with a blanking limiting plate 511 and a blanking telescopic cylinder 512 which are matched with four corners of the charging tray 11, and the blanking telescopic cylinder 512 is provided with a supporting lug 513 matched with the supporting port 110;
the feeding base plate 51 is fixedly provided with a feeding guide sleeve 514 and a feeding nut 515;
feeding lifter plate 52 is equipped with feeding spout 516, feeding lifter plate 52 is installed and is pushed cylinder 517, it is provided with the push pedal 518 that is located feeding spout 516 to push cylinder 517, feeding guide pillar 521 with feeding guide pin bushing 514 complex is installed to feeding lifter plate 52's bottom, feeding bottom plate 53 is installed to the bottom of feeding guide pillar 521, feeding bottom plate 53 is provided with feeding elevator motor 531414 and feeding elevator lead screw 532, feeding elevator motor 531414 is connected with feeding elevator lead screw 532 transmission, feeding elevator lead screw 532 cooperates with feeding nut 515.
The supporting lug 513 supports the supporting port 110 of the material tray 11, a plurality of material trays 11 are stacked on the material tray 11, and the blanking limit plate 511 enables the stacked material trays 11 to be stacked orderly;
during feeding, a feeding lifting motor 531414 drives a feeding lifting screw rod 532 to rotate in the forward direction, the feeding lifting screw rod 532 drives a feeding lifting plate 52 to ascend through matching with a feeding nut 515, so that the feeding lifting plate 52 supports the lowest material tray 11, then a blanking telescopic cylinder 512 drives a supporting lug 513 to contract inwards, a feeding lifting motor 531414 drives the feeding lifting screw rod 532 to rotate in the reverse direction, so that the feeding lifting plate 52 descends, then the blanking telescopic cylinder 512 drives the supporting lug 513 to extend outwards so as to support the material tray 11 with the lowest count to the last number, the feeding lifting plate 52 continues descending so that the lowest material tray 11 is separated from the material tray 11 with the lowest count to the last number, and then a pushing cylinder 517 drives a pushing plate 518 to move in a feeding chute 516 so as to push the material tray 11 onto a feeding conveying belt 211 through the pushing plate 518; so as to realize automated unmanned testing of a large batch of chips.
As shown in fig. 12 to 14, and 16, in the following embodiment: the bottom of the charging tray 11 is provided with a material pulling groove 111, the other end of the conveying device 2 is provided with a discharging device 6, and the discharging device 6 comprises a discharging base plate 61 and a discharging lifting plate 62;
the discharge substrate 61 is provided with a stacking limiting plate 611 and a stacking support base 612 which are matched with four corners of the charging tray 11, the stacking support base 612 is provided with a stacking support block 613 connected with a bearing, the stacking support block 613 is a one-way reset block, the bottom of the stacking support block 613 is provided with an inclined surface which inclines outwards, the top of the stacking support block 613 is a plane for supporting the charging tray 11, the side surface of the stacking support block 613 is a supporting surface matched with the stacking support base 612, and the stacking support block 613 is provided with a reset torsion spring 6130;
the material stacking lifting cylinder 614 and the material stacking guide sleeve 615 are installed on the discharging base plate 61, the material stacking lifting cylinder 614 is connected with the discharging lifting plate 62, and the material stacking lifting shaft matched with the material stacking guide sleeve 615 is installed on the discharging lifting plate 62;
the discharging lifting plate 62 is provided with a discharging chute 621, the discharging lifting plate 62 is provided with a pulling cylinder 622, the pulling cylinder 622 is provided with a pulling plate 623 located in the discharging chute 621, the pulling plate 623 is matched with the pulling chute 111, the discharging lifting plate 62 is connected with the stacking lifting cylinder 614, and the discharging lifting plate 62 is provided with a stacking guide pillar 624 matched with the stacking guide sleeve 615.
When the material tray 11 is sent out, the discharging lifting plate 62 is lower than the feeding conveying belt 211, after the feeding conveying belt 211 moves one side of the material tray 11 onto the discharging lifting plate 62, the pulling cylinder 622 drives the pulling plate 623 to move in the discharging chute 621, the pulling plate 623 pulls out the material tray 11 through the pulling groove 111, then, the stacking lifting cylinder 614 drives the discharging lifting plate 62 to ascend, the discharging lifting plate 62 drives the material tray 11 to move upwards, the stacking support block 613 pushes outwards when the material tray 11 moves upwards, after the material tray 11 passes through the stacking support block 613, the reset torsion spring 6130 drives the stacking support block 613 to reset, then, the stacking lifting cylinder 614 drives the discharging lifting plate 62 to descend, the stacking support block 613 supports the four corners of the material tray 11 so as to stack the material trays 11 one by one from below, and the stacking limit plate 611 limits the stacking position of the material tray 11, so that the material trays 11 are stacked orderly.
As depicted in fig. 15, in some embodiments: the main base plate 10 is provided with the conveying devices 2 in parallel, and the material moving device 7 is arranged above the conveying devices 2;
the material moving device 7 comprises a material moving motor 71, a material moving sliding rail 72 and a material moving plate 73, the material moving motor 71 and the material moving sliding rail 72 are fixedly installed on the main base plate 10, the material moving motor 71 is provided with a material moving screw rod 711, the material moving plate 73 is fixedly provided with a material moving sliding block 731 and a material moving nut 732, the material moving sliding block 731 is matched with the material moving sliding rail 72, the material moving nut 732 is matched with the material moving screw rod 711, the material moving plate 73 is provided with a yielding hole 74 matched with the material feeding lifting plate 52, the yielding hole 74 is provided with symmetrically arranged clamping cylinders 741, and the clamping cylinders 741 are provided with clamping strips 742 matched with two sides of the material tray 11.
The ejector plate 22 drives the tray 11 to ascend into the abdicating hole 74, the clamping cylinder 741 drives the clamping strip 742 to extend out so as to clamp and fix the tray 11, so that the loading device 3 can more stably clamp and place the chips in the tray 11 into the test carrier or clamp and place the chips in the test carrier back into the tray 11;
when two or more than two conveying devices 2 are installed on the total base plate 10, after the holding cylinder 741 holds and fixes the tray 11 by the holding strip 742, the material moving motor 71 drives the material moving screw 711 to rotate, the material moving screw 711 drives the material moving plate 73 to move on the material moving slide rail 72 by matching with the material moving nut 732, so that the tray 11 is moved to the position of the loading device 3, and the loading device 3 can take or place materials from the held and fixed tray 11.
It should be understood that the above-described embodiments of the present invention are only intended to illustrate or explain the principles of the invention, and do not constitute a limitation of the invention. Therefore, any modifications, equivalents, improvements and the like which are made without departing from the spirit and scope of the present invention shall be included in the protection scope of the present invention. Further, it is intended that the appended claims cover all such variations and modifications as fall within the scope and boundary of the appended claims, or the equivalents of such scope and boundary.
Claims (7)
1. The utility model provides a multistation chip test machine, its includes total base plate (10), conveyor (2), loading attachment (3) and testing arrangement (4) are installed to total base plate (10), characterized in that:
the testing device (4) comprises a testing bottom plate (41) and a testing lifting plate (42), wherein an automatic turntable (411), a testing slide rail (412), a testing guide post (413) and a lifting motor (414) are installed on the testing bottom plate (41), the automatic tray loading is provided with a plurality of chip carriers (415) with central symmetry, the chip carriers (415) are provided with testing holes (43) (416), the testing slide rail (412) is provided with a slide plate (43), the slide plate (43) is provided with a fixed upper oblique pushing seat (431), a testing transverse nut (432) and a chip information inductor (433), the lifting motor (414) is provided with a testing transverse moving lead screw (417) matched with the testing transverse moving nut (432), a testing lifting guide sleeve (421) and a lower oblique pushing seat (422) are installed at the bottom of the testing lifting plate (42), the testing lifting guide sleeve (421) is matched with the testing guide post (413), the lower oblique pushing seat (422) is symmetrically inclined with the upper oblique pushing seat (431), the testing guide sleeve (415) is installed at the top of the testing lifting plate (42) and is provided with a testing needle (423), and the testing needle (416) is provided with a testing needle (423), and the testing guide sleeve (423), and the testing needle (416) is arranged at the top of the testing guide sleeve (423) A sensing window (425) of the chip information sensor (433).
2. The multi-station chip testing machine according to claim 1, wherein: the testing device (4) further comprises a testing top plate (44), and the testing top plate (44) is provided with a burner (441) which is centrosymmetric and matched with the chip carrier (415).
3. The multi-station chip testing machine according to claim 1, wherein: loading attachment (3) are including left material loading seat (31), right material loading seat (32) and material loading sideslip board (33), material loading seat (31) top is equipped with the material loading and indulges slide rail (311) that moves, material loading seat (32) are installed the material loading and are indulged and move slip table cylinder (321) in the right side, the one end of material loading sideslip board (33) install with the material loading indulges to move slide rail (311) complex material loading and indulge to move slider (331), the other end installation of material loading sideslip board (33) is fixed in the material loading is indulged and is moved on slip table cylinder (321), material loading sideslip table cylinder (332) are installed in material loading sideslip board (33), the material loading is indulged and is moved slip table cylinder (321) and is provided with material loading lifter plate (34), material loading lifter plate cylinder (35) are installed, material loading lifter slip table cylinder (35) are provided with material loading adsorber (36).
4. The multi-station chip testing machine according to claim 1, wherein: the conveying device (2) is positioned below the general substrate (10);
the conveying device (2) comprises a feeding rack (21), a material ejecting plate (22) and a material tray (11); the material pushing and conveying device is characterized in that feeding conveying belts (211) which are used for supporting and carrying two sides of the material tray (11) are installed on two sides of the feeding rack (21), conveying limiting strips (212) are installed beside the feeding conveying belts (211), an ejecting nut bearing seat (213), an ejecting motor (214) and an ejecting guide sleeve (215) are installed on the feeding rack (21), the ejecting motor (214) is in transmission connection with the ejecting nut bearing seat (213), an ejecting screw rod (221) and an ejecting guide pillar (222) are installed at the bottom of the ejecting plate (22), the ejecting screw rod (221) is matched with the ejecting nut bearing seat (213), the ejecting guide pillar (222) is matched with the ejecting guide sleeve (215), and the ejecting plate (22) is matched with the material tray (11).
5. The multi-station chip testing machine according to claim 4, wherein: the two sides of the bottom of the material tray (11) are provided with carrying ports (110), and one end of the conveying device (2) is provided with a feeding device (5);
the feeding device (5) comprises a feeding base plate (51) and a feeding lifting plate (52), the feeding base plate (51) is provided with a blanking limiting plate (511) and a blanking telescopic cylinder (512) which are matched with four corners of a charging tray (11), the blanking telescopic cylinder (512) is provided with a supporting lug (513) matched with the supporting port (110), the feeding base plate (51) is fixedly provided with a feeding guide sleeve (514) and a feeding nut (515), the feeding lifting plate (52) is provided with a feeding sliding groove (516), the feeding lifting plate (52) is provided with a pushing cylinder (517), the pushing cylinder (517) is provided with a push plate (518) positioned in the feeding sliding groove (516), a feeding guide pillar (521) matched with the feeding guide sleeve (514) is installed at the bottom of the feeding lifting plate (52), a feeding bottom plate (53) is installed at the bottom end of the feeding guide pillar (521), the feeding bottom plate (53) is provided with a feeding lifting motor (531) (414) and a feeding lifting screw rod (532), the feeding lifting motor (531) (414) is connected with the feeding lifting screw rod (515), and the feeding lifting screw rod is matched with the feeding lifting screw rod (515).
6. The multi-station chip testing machine according to claim 4, wherein: a material pulling groove (111) is formed in the bottom of the material tray (11), and a material discharging device (6) is arranged at the other end of the conveying device (2);
the discharging device (6) comprises a discharging substrate (61) and a discharging lifting plate (62), the discharging substrate (61) is provided with a stacking limiting plate (611) and a stacking supporting seat (612) which are matched with four corners of the charging tray (11), the stacking supporting seat (612) is provided with a stacking supporting block (613) connected with a bearing, the stacking supporting block (613) is provided with a reset torsion spring (6130), the discharging substrate (61) is provided with a stacking lifting cylinder (614) and a stacking guide sleeve (615), the stacking lifting cylinder (614) is connected with the discharging lifting plate (62), the discharging lifting plate (62) is provided with a stacking lifting shaft matched with the stacking guide sleeve (615),
the discharging lifting plate (62) is provided with a discharging chute (621), the discharging lifting plate (62) is provided with a material pulling cylinder (622), the material pulling cylinder (622) is provided with a material pulling plate (623) located in the discharging chute (621), the material pulling plate (623) is matched with the material pulling groove (111), the discharging lifting plate (62) is connected with the material stacking lifting cylinder (614), and the discharging lifting plate (62) is provided with a material stacking guide pillar (624) matched with the material stacking guide sleeve (615).
7. The multi-station chip testing machine according to any one of claims 4 to 6, wherein: the general base plate (10) is provided with conveying devices (2) in parallel, and a material moving device (7) is arranged above the conveying devices (2);
move material device (7) including moving material motor (71), moving material slide rail (72) and moving material board (73), move material motor (71) with move material slide rail (72) fixed mounting in total on base plate (10), move material motor (71) and be provided with and move material lead screw (711), move material board (73) fixed mounting move material slider (731) and move material nut (732), move material slider (731) with move material slide rail (72) cooperation, move material nut (732) with move material lead screw (711) cooperation, move material board (73) establish with feeding lifter plate (52) complex hole of stepping down (74), the centre gripping cylinder (741) that the symmetry set up is installed in hole of stepping down (74), centre gripping cylinder (741) be provided with charging tray (11) both sides complex centre gripping strip (742).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210838145.3A CN115480147A (en) | 2022-07-17 | 2022-07-17 | Multistation chip test machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210838145.3A CN115480147A (en) | 2022-07-17 | 2022-07-17 | Multistation chip test machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN115480147A true CN115480147A (en) | 2022-12-16 |
Family
ID=84422066
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210838145.3A Pending CN115480147A (en) | 2022-07-17 | 2022-07-17 | Multistation chip test machine |
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| Country | Link |
|---|---|
| CN (1) | CN115480147A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116643147A (en) * | 2023-05-26 | 2023-08-25 | 深圳市奇易创新科技有限公司 | Welding detector for mobile power supply cell circuit board |
| CN117233579A (en) * | 2023-10-25 | 2023-12-15 | 苏州乾鸣半导体设备有限公司 | Chip aging tester and test line |
| CN117554784A (en) * | 2023-11-29 | 2024-02-13 | 中山市博测达电子科技有限公司 | Chip three-temperature test equipment |
-
2022
- 2022-07-17 CN CN202210838145.3A patent/CN115480147A/en active Pending
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116643147A (en) * | 2023-05-26 | 2023-08-25 | 深圳市奇易创新科技有限公司 | Welding detector for mobile power supply cell circuit board |
| CN116643147B (en) * | 2023-05-26 | 2024-05-07 | 深圳市奇易创新科技有限公司 | Welding detector for mobile power supply cell circuit board |
| CN117233579A (en) * | 2023-10-25 | 2023-12-15 | 苏州乾鸣半导体设备有限公司 | Chip aging tester and test line |
| CN117233579B (en) * | 2023-10-25 | 2024-05-24 | 苏州乾鸣半导体设备有限公司 | Chip aging tester and test line |
| CN117554784A (en) * | 2023-11-29 | 2024-02-13 | 中山市博测达电子科技有限公司 | Chip three-temperature test equipment |
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