CN115144719A - Power device testing device - Google Patents
Power device testing device Download PDFInfo
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- CN115144719A CN115144719A CN202210821180.4A CN202210821180A CN115144719A CN 115144719 A CN115144719 A CN 115144719A CN 202210821180 A CN202210821180 A CN 202210821180A CN 115144719 A CN115144719 A CN 115144719A
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G01R31/2642—Testing semiconductor operation lifetime or reliability, e.g. by accelerated life tests
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Abstract
The application relates to a power device testing device. The device comprises: the device comprises a controller, an energy storage circuit, a power supply, a first inductance circuit, a power device to be tested and computer equipment; the controller is used for receiving a periodic test instruction sent by the computer equipment and controlling the power device to be tested to be switched off and the power supply to charge the energy storage circuit according to the test instruction; the controller is further used for stopping charging the energy storage circuit if the charging voltage of the energy storage circuit is greater than or equal to a preset voltage threshold, controlling the energy storage circuit to charge the first inductance circuit and controlling the power device to be tested to be conducted; the controller is further used for detecting the drain current of the power device to be tested, and if the drain current is larger than or equal to a preset current threshold, the power device to be tested is controlled to be turned off, so that the first inductance circuit applies voltage to the power device to be tested within a preset time period to obtain an avalanche test result. By adopting the device, the avalanche test can be automatically and repeatedly carried out on the power device, and the test efficiency is improved.
Description
Technical Field
The application relates to the technical field of semiconductor device reliability testing, in particular to a power device testing device.
Background
The power device has the characteristics of good electrical property and low price, so that the power device is widely applied to the fields of automotive electronics, consumer electronics, aerospace and the like. The large-scale use of power devices in power electronic circuits makes the study of their reliability particularly important. In industrial application, voltage surge or current surge often occurs to the power device due to an inductive load at the moment of turning off, so that avalanche failure of the power device is caused, and the failure is usually irreversible, so that the avalanche tolerance capability of the power device affects the safe operating area and the service life of the device, and therefore, it is necessary to perform an avalanche tolerance characteristic study on the power device.
In the conventional technology, the research on the avalanche tolerance characteristic of the power device is to repeatedly carry out a non-clamped Inductive Switching UIS (unshipped Inductive Switching UIS) test and simulate the actual working environment of the power device. In the existing UIS test method, avalanche testing can only be achieved by manually controlling a gate pulse generator.
However, since only a single avalanche test can be achieved by manually controlling the gate pulse generator once, if a plurality of avalanche tests are performed, the gate pulse generator needs to be manually controlled many times, so that the test is time-consuming and labor-consuming, and the test efficiency is low.
Because the power device usually has repeated voltage surge or current surge in practical application, the conventional technology cannot automatically repeat the avalanche test on the power device, and the test efficiency is low.
Disclosure of Invention
In view of the above, it is necessary to provide a power device testing apparatus capable of improving testing efficiency in view of the above technical problems.
The application provides a power device testing device. The device comprises: the device comprises a controller, an energy storage circuit, a power supply, a first inductance circuit, a power device to be tested and computer equipment;
the controller is used for receiving a periodic test instruction sent by the computer equipment and controlling the power device to be tested to be switched off and the power supply to charge the energy storage circuit according to the test instruction;
the controller is further configured to stop charging the energy storage circuit, control the energy storage circuit to charge the first inductor circuit, and control the power device to be tested to be turned on if the charging voltage of the energy storage circuit is greater than or equal to a preset voltage threshold;
the controller is further configured to detect a drain current of the power device to be tested, and if the drain current is greater than or equal to a preset current threshold, the power device to be tested is controlled to be turned off, so that the first inductance circuit applies a voltage to the power device to be tested within a preset time period to obtain an avalanche test result.
In one embodiment, the apparatus further includes a first switch and a second switch, the first switch is disposed between the tank circuit and the power supply, a first end of the second switch is connected to the source of the power device to be tested, and a second end of the second switch is grounded;
the controller is used for controlling the first switch to be closed and the second switch to be opened according to the test instruction, so that the energy storage circuit is charged through the power supply when the first switch is closed, and the power device to be tested is turned off when the second switch is opened.
In one embodiment, the controller is further configured to open the first switch to stop charging the energy storage circuit, control the energy storage circuit to charge the first inductor circuit, and control the second switch to close to turn on the power device to be tested if the charging voltage of the energy storage circuit is greater than or equal to a preset voltage threshold.
In one embodiment, the device further comprises a constant current controller, and the constant current controller is respectively connected with the controller and the energy storage circuit;
the constant current controller is used for controlling the current of the energy storage circuit when the energy storage circuit charges the first inductance circuit to reach a set current value.
In one embodiment, the apparatus further comprises a current probe and an oscilloscope, wherein a first end of the current probe is grounded, a second end of the current probe is connected with the second switch, and a third end of the current probe is connected with the computer equipment through the oscilloscope;
the current probe is used for detecting avalanche current generated when the first inductance circuit applies voltage to the power device to be tested within the preset time length, wherein the avalanche test result comprises the avalanche current;
and the oscilloscope is used for measuring the waveform of the avalanche current.
In one embodiment, the apparatus further comprises a voltage probe, a first end of the voltage probe is connected with the drain of the device to be tested, a second end of the voltage probe is connected with a second end of the second switch and a second end of the current probe, and a third end of the voltage probe is connected with the computer device through the oscilloscope;
the voltage probe is used for detecting avalanche voltage generated when the first inductance circuit applies voltage to the power device to be tested within the preset time length, wherein the avalanche test result comprises the avalanche voltage;
the oscilloscope is further used for measuring the waveform of the avalanche voltage.
In one embodiment, the apparatus further comprises a resistor, the controller comprises a drain current detection circuit, a processing circuit and a gate control circuit, a first end of the resistor is connected with the drain current detection circuit and the source of the power device to be tested, and a second end of the resistor is grounded;
the drain current detection circuit and the gate control circuit are connected with the processing circuit.
In one embodiment, the controller further comprises an interface circuit and a driving circuit, the interface circuit is connected with the computer device, and the interface circuit and the driving circuit are connected with the processing circuit;
the interface circuit is used for receiving a periodic test instruction sent by the computer equipment and sending the test instruction to the drive circuit, so that the drive circuit controls the first switch to be closed and the second switch to be opened according to the test instruction.
In one embodiment, the controller further comprises a voltage measurement circuit connected to the processing circuit;
the voltage measuring circuit is used for measuring the charging voltage of the energy storage circuit and sending the charging voltage to the processing circuit, so that the processing circuit judges whether the charging voltage of the energy storage circuit is larger than or equal to a preset voltage threshold value or not according to the charging voltage.
In one embodiment, the apparatus further includes a second inductive circuit, a third switch, and a fourth switch, a first end of the third switch is connected to a first end of the second inductive circuit, and a second end of the second inductive circuit is connected to the first end of the voltage probe and the drain of the device under test;
and the second end of the third switch is connected with the fourth switch and the constant current controller.
The power device testing device comprises a controller, an energy storage circuit, a power supply, a first inductance circuit, a power device to be tested and computer equipment; the controller is used for receiving a periodic test instruction sent by the computer equipment and controlling the power device to be tested to be switched off and the power supply to charge the energy storage circuit according to the test instruction; the controller is further used for stopping charging the energy storage circuit, controlling the energy storage circuit to charge the first inductance circuit and controlling the power device to be tested to be conducted if the charging voltage of the energy storage circuit is greater than or equal to a preset voltage threshold; the controller is further used for detecting the drain current of the power device to be tested, and if the drain current is larger than or equal to a preset current threshold, the power device to be tested is controlled to be turned off, so that the first inductance circuit applies voltage to the power device to be tested within a preset time period to obtain an avalanche test result. That is to say, in the embodiment of the application, the controller receives a periodic avalanche test instruction sent by the computer device, and controls the power device to be tested to be turned off and the power supply to charge the energy storage circuit according to the test instruction, when the charging voltage of the energy storage circuit is greater than or equal to the preset voltage threshold, the controller controls the power supply to stop charging the energy storage circuit, and controls the energy storage circuit to charge the first inductance circuit, and controls the power device to be tested to be turned on, and then the controller controls the power device to be tested to be turned off by detecting whether the drain current of the power device to be tested is greater than or equal to the preset current threshold, so that the voltage is applied to the power device to be tested by the first inductance circuit within the preset time period to obtain an avalanche test result. For example, the controller receives a test instruction at intervals of a certain duration, where the certain duration is equal to 1 minute, for example, after the controller receives the first test instruction at 10 o' clock, the controller executes a test according to the method provided in this embodiment, so as to obtain an avalanche test result corresponding to the test. And then the controller receives a test instruction again at 10 o' clock and zero 1 min, and then executes a test according to the method provided by the embodiment to obtain an avalanche test result corresponding to the test, and the test is automatically repeated according to the method, so that the labor is saved, and the test efficiency is improved.
Drawings
FIG. 1 is a schematic diagram of a prior art circuit for performing an avalanche test on a power device;
fig. 2 is a schematic structural diagram of a power device testing apparatus according to an embodiment of the present disclosure;
fig. 3 is a schematic circuit diagram of a power device testing apparatus according to an embodiment of the present application;
fig. 4 is a schematic structural diagram of an interior of a controller according to an embodiment of the present disclosure;
fig. 5 is a schematic circuit diagram of a power device testing apparatus according to another embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
In an actual application circuit, at the moment of turning off, the circuit often generates a large induced electromotive force at the moment of turning off due to an inductive load, and all energy stored in the induced electromotive force is released by the power device. Power devices are highly susceptible to failure under high voltage and high current, i.e., avalanche failure, and such avalanche failure is generally irreversible. Therefore, the avalanche capability of the power device may affect the safe operating area and the service life of the device.
In the conventional art, when a power device to be tested is subjected to UIS test, an external signal generator, such as a gate pulse generator, is required, and the gate pulse generator is manually controlled to emit a voltage pulse, so that a single avalanche test is realized, referring to fig. 1, fig. 1 is a schematic circuit diagram of performing an avalanche test on the power device in the prior art, and the specific test process is as follows:
firstly, setting the test environment temperature to a specified value, and setting the power supply voltage V DD The grid pulse generator V is adjusted manually to a specified value GG The generated voltage pulse width further adjusts the turn-on time of the power device DUT to be measured, and according to the monitored drain current I d The value is determined so that the drain current I d The value reaches the specified valueAn avalanche current. So that the gate pulse generator V is manually controlled a plurality of times under the prescribed avalanche current condition GG The power device under test DUT is subjected to avalanche test with a prescribed number of pulses and repetition rate. And after carrying out a plurality of avalanche tests, determining whether the characteristic of the power device to be tested DUT is normal or not according to the failure criterion of the power device.
However, in practical applications of the power device, the system with the inductive load usually has multiple repeated voltage surges or current surges, and the manually controlled gate pulse generator can only realize a single avalanche test once, and if the avalanche test is performed for multiple times, the manually controlled gate pulse generator needs to be controlled for multiple times, so that the test efficiency is low.
In order to solve the above technical problem, an embodiment of the present application provides a power device testing apparatus. Referring to fig. 2, fig. 2 is a schematic structural diagram of a power device testing apparatus according to an embodiment of the present application, where the apparatus includes: the device comprises a controller 21, an energy storage circuit 24, a power supply 25, a first inductance circuit 23, a power device 22 to be tested and computer equipment 20; the controller 21 is configured to receive a periodic test instruction sent by the computer device 20, and control the power device 22 to be tested to turn off and the power supply 25 to charge the energy storage circuit 24 according to the test instruction; the controller 21 is further configured to stop charging the energy storage circuit 24, control the energy storage circuit 24 to charge the first inductance circuit 23, and control the power device 22 to be tested to be turned on if the charging voltage of the energy storage circuit 24 is greater than or equal to the preset voltage threshold; the controller 21 is further configured to detect a drain current of the power device 22 to be tested, and if the drain current is greater than or equal to a preset current threshold, control the power device 22 to be tested to turn off, so that the first inductor circuit 23 applies a voltage to the power device 22 to be tested within a preset time period to obtain an avalanche test result.
The drain current is a current flowing from the drain of the power device under test DUT22 to the source of the power device under test DUT22, i.e., a leakage current.
Alternatively, the power supply 25 may be, for example, a high voltage program-controlled adjustable power HVG, and the energy storage circuit 24 may be an energy storage capacitor C1. Wherein the controller 21 receives the calculationSending periodic test instructions by the machine equipment 20 and controlling the grid-source voltage V of the power device to be tested DUT22 according to the test instructions gs And when the voltage is less than or equal to the threshold voltage, the DUT22 of the power device to be tested is turned off, and meanwhile, the high-voltage program-controlled adjustable power supply HVG is controlled to charge the energy storage capacitor C1.
Optionally, as described with reference to the foregoing example, after the charging voltage of the energy storage capacitor C1 reaches the preset voltage threshold, the controller 21 controls the high-voltage program-controlled adjustable power supply HVG to stop charging the energy storage capacitor C1, and controls the gate-source voltage V of the power device to be tested DUT22 gs If the voltage is larger than the threshold voltage, the power device under test DUT22 is turned on, and the energy storage capacitor C1 is controlled to discharge through the first inductor circuit 23, that is, the first inductor circuit 23 is charged.
Optionally, when the controller 21 detects that the drain current of the power device under test DUT22 reaches the preset current threshold, the controller 21 controls the gate-source voltage V of the power device under test DUT22 gs And when the voltage is less than or equal to the threshold voltage, the DUT22 of the power device to be tested is turned off, and because the current of the first inductance circuit 23 cannot change suddenly, voltage impact is generated at two ends of the first inductance circuit 23 within a preset time length, and an avalanche test result is obtained through the DUT22 of the power device to be tested.
It should be noted that: if the grid source voltage V of the power device 22 to be tested gs If the voltage is less than or equal to the threshold voltage, the power device 22 to be tested is turned off; if the grid source voltage V of the power device 22 to be tested gs If the threshold voltage is higher, the power device 22 is turned on.
The power device testing apparatus comprises a controller 21, an energy storage circuit 24, a power supply 25, a first inductance circuit 23, a power device 22 to be tested, and a computer device 20; the controller 21 is configured to receive a periodic test instruction sent by the computer device 20, and control the power device 22 to be tested to turn off and the power supply 25 to charge the energy storage circuit 24 according to the test instruction; the controller 21 is further configured to stop charging the energy storage circuit 24, control the energy storage circuit 24 to charge the first inductor circuit 23, and control the power device 22 to be tested to be turned on if the charging voltage of the energy storage circuit 24 is greater than or equal to the preset voltage threshold; the controller 21 is further configured to detect a drain current of the power device 22 to be tested, and if the drain current is greater than or equal to a preset current threshold, control the power device 22 to be tested to turn off, so that the first inductance circuit 23 applies a voltage to the power device 22 to be tested within a preset time period to obtain an avalanche test result. That is to say, in this embodiment, the controller 21 receives a periodic test instruction sent by the computer device 20, and controls the power device 22 to be tested to turn off and the power supply 25 to charge the energy storage circuit 24 according to the test instruction, when the charging voltage of the energy storage circuit 24 is greater than or equal to the preset voltage threshold, the controller 21 controls the power supply 25 to stop charging the energy storage circuit 24, and controls the energy storage circuit 24 to charge the first inductor circuit 23, and controls the power device 22 to be tested to turn on, and then the controller 21 controls the power device 22 to be tested to turn off by detecting whether the drain current of the power device 22 to be tested is greater than or equal to the preset current threshold, so as to apply voltage to the power device 22 to be tested by the first inductor circuit 23 within the preset time length to obtain an avalanche test result. The controller 21 can receive the periodic test instruction sent by the computer device 20, so that the power device 22 to be tested can be controlled to be turned on and off according to the test instruction, the power device 22 to be tested is in the repeated avalanche test process, the power device 22 to be tested can be automatically and repeatedly subjected to avalanche test, and the test efficiency is improved. For example, the controller 21 receives a test command at intervals of a certain duration, where the certain duration is equal to 1 minute, for example, after the controller 21 receives the first test command at 10 o' clock, the controller then performs a test according to the method provided in this embodiment to obtain an avalanche test result corresponding to the test. Then, the controller 21 receives a test command again at point 10 and time zero 1, and then executes a test according to the method provided by the embodiment to obtain an avalanche test result corresponding to the test, and the test is automatically repeated according to the method, so that the labor is saved and the test efficiency is improved.
In one embodiment, as shown in fig. 3, fig. 3 is a schematic circuit diagram of a power device testing apparatus provided in the embodiment of the present application, the apparatus further includes a first switch 31 and a second switch 32, the first switch 31 is disposed between the energy storage circuit 24 and the power supply 25, a first end of the second switch 32 is connected to the source of the power device 22 to be tested, and a second end of the second switch 32 is grounded; and the controller 21 is configured to control the first switch 31 to be closed and the second switch 32 to be opened according to the test instruction, so as to charge the tank circuit 24 through the power supply 25 when the first switch 31 is closed, and to turn off the power device 22 to be tested when the second switch 32 is opened.
As described in connection with the above example, the controller 21 controls the first switch 31 to be closed and the second switch 32 to be opened according to the test instruction, and controls the gate-source voltage V of the power device under test DUT22 gs And when the voltage is less than or equal to the threshold voltage, the DUT22 of the power device to be tested is turned off, and the energy storage capacitor C1 is charged by the high-voltage program-controlled adjustable power supply HVG.
In the embodiment of the present application, the apparatus further includes a first switch 31 and a second switch 32, the first switch 31 is disposed between the energy storage circuit 24 and the power supply 25, a first end of the second switch 32 is connected to the source of the power device 22 to be tested, and a second end of the second switch 32 is grounded; and the controller 21 is configured to control the first switch 31 to be closed and the second switch 32 to be opened according to the test instruction, so as to charge the energy storage circuit 24 through the power supply 25 when the first switch 31 is closed, and to turn off the power device 22 to be tested when the second switch 32 is opened. That is to say, the controller 21 in this embodiment controls the first switch 31 to be closed and the second switch 32 to be opened according to the test instruction, so that the power supply 25 charges the energy storage circuit, the energy storage circuit 24 charges the first inductor circuit 23, and the first inductor circuit 23 can apply a voltage to the power device 22 to be tested to obtain an avalanche test result.
In one embodiment, the controller 21 is further configured to open the first switch 31 to stop charging the energy storage circuit 24, control the energy storage circuit 24 to charge the first inductor circuit 23, and control the second switch 32 to close to turn on the power device 22 to be tested, if the charging voltage of the energy storage circuit 24 is greater than or equal to the preset voltage threshold.
Optionally, as described with reference to fig. 3, if the charging voltage of the energy-storage capacitor C1 is greater than or equal to the preset voltage threshold, the controller 21 controls the first switch 31 to be turned off, and the second switch is turned offThe switch 32 is closed and controls the gate-source voltage V of the DUT22 gs If the voltage is larger than the threshold voltage, the power device to be tested DUT22 is turned on, and the energy storage capacitor C1 discharges with a constant current through the first inductor circuit 23, that is, charges the first inductor circuit 23.
Optionally, the first inductor circuit 23 includes a plurality of inductors connected in series, and a plurality of inductor selection switches connected in parallel with the inductors, and before the avalanche test of the apparatus, the controller 21 controls the number of closed inductor selection switches, so that the inductance of the first inductor circuit 23 reaches a set value. For example, as described with reference to fig. 3, if the inductance of the first inductor circuit 23 for performing the avalanche test needs 180mH, the controller 21 controls S11 and S12 corresponding to L1 of 120mH and L2 of 60mH to be closed, respectively, and the other inductor selection switches to be opened.
Optionally, the first inductor circuit 23 includes fixed inductors (L1 to L7), 100 μ H groups of tap inductors (L8), and 10 μ H groups of tap inductors (L9), then inductor selection switches corresponding to L1 to L7 are S11 to S17, inductor selection switches corresponding to L8 are S20 to S28, and inductor selection switches corresponding to L9 are S30 to S38, where L1 to L9 are used for the avalanche energy storage inductor.
In this embodiment, the controller 21 is further configured to turn off the first switch 31 to stop charging the energy storage circuit 24, control the energy storage circuit 24 to charge the first inductor circuit 23, and control the second switch 32 to be turned on to turn on the power device 22 to be tested if the charging voltage of the energy storage circuit 24 is greater than or equal to the preset voltage threshold. That is to say, when the charging voltage of the energy storage circuit 24 is greater than or equal to the preset voltage threshold, the controller 21 in this embodiment controls the first switch 31 to be turned off, the second switch 32 to be turned on, and controls the power device 22 to be tested to be turned on, so that the energy storage circuit 24 can charge the first inductance circuit 23.
In one embodiment, the device further comprises a constant current controller 39, wherein the constant current controller 39 is respectively connected with the controller 21 and the energy storage circuit 24; and a constant current controller 39 for controlling the current when the energy storage circuit 24 charges the first inductance circuit 23 to reach a set current value.
As described with reference to fig. 3, one end of the constant current controller 39 is connected to the controller 21, the other end of the constant current controller 39 is connected to the energy storage circuit 24, the other end of the constant current controller 39 is further connected to one end of the discharge resistor 40, the other end of the discharge resistor 40 is connected to the discharge switch, and the energy storage circuit 24 is connected to the discharge resistor 40 in parallel.
In the embodiment of the application, the device further comprises a constant current controller 39, and the constant current controller 39 is respectively connected with the controller 21 and the energy storage circuit 24; and a constant current controller 39 for controlling the current when the energy storage circuit 24 charges the first inductance circuit 23 to reach a set current value. That is, the constant current controller 39 in the present embodiment can control the current when the tank circuit 24 charges the first inductance circuit 23 to reach the set current value, and can also control the tank circuit 24 to charge the first inductance circuit 23 with a constant current.
In one embodiment, the apparatus further comprises a current probe 33 and an oscilloscope 35, wherein a first end of the current probe 33 is grounded, a second end of the current probe 33 is connected with the second switch 32, and a third end of the current probe 33 is connected with the computer device 20 through the oscilloscope 35; the current probe 33 is used for detecting avalanche current generated when the first inductance circuit 23 applies voltage to the power device 22 to be tested within a preset time length, wherein the avalanche test result comprises the avalanche current; and an oscilloscope 35 for measuring the waveform of the avalanche current.
With reference to fig. 3, it is described that the controller 21 detects that the drain current value of the power device under test DUT22 is greater than or equal to the preset current threshold, and the controller 21 controls the gate-source voltage V of the power device under test DUT22 gs And when the voltage is less than or equal to the threshold voltage, the power device to be tested DUT22 is turned off, and the current on the first inductance circuit 23 can not suddenly change, so that high voltage is generated at two ends of the first inductance circuit 23, the avalanche current generated when the voltage is applied to the power device to be tested DUT22 by the first inductance circuit 23 within a preset time is measured by a current probe 33 connected in series with the power device to be tested DUT22, the waveform of the avalanche current is measured by an oscilloscope 35 connected with the current probe 33, and the current I curve is recorded and stored in the computer device 20.
In the embodiment of the present application, the apparatus further includes a current probe 33 for detecting an avalanche current generated when the first inductor circuit 23 applies a voltage to the power device 22 to be measured within a preset time period, and an oscilloscope 35 for measuring an avalanche current waveform, a first end of the current probe 33 is grounded, a second end of the current probe 33 is connected to the second switch 32, and a third end of the current probe 33 is connected to the computer device 20 through the oscilloscope 35. That is to say, in this embodiment, the current probe 33 detects the avalanche current generated when the first inductance circuit 23 applies a voltage to the power device 22 to be measured within a preset time period, and the oscilloscope 35 measures the waveform of the avalanche current, so that the value and the waveform of the avalanche current can be measured, and further, a current signal invisible to the naked eye is converted into a current curve visible to the naked eye, so that a researcher can conveniently research the change process of the avalanche current, and meanwhile, the current probe 33 can realize the acquisition and recording of avalanche current data.
In one embodiment, the apparatus further comprises a voltage probe 34, a first end of the voltage probe 34 is connected to the drain of the power device 22 to be tested, a second end of the voltage probe 34 is connected to the second end of the second switch 32 and the second end of the current probe 33, and a third end of the voltage probe 34 is connected to the computer device 20 through an oscilloscope 35; the voltage probe 34 is used for detecting an avalanche voltage generated when the first inductance circuit 23 applies a voltage to the power device 22 to be tested within a preset time length, wherein the avalanche test result comprises the avalanche voltage; the oscilloscope 35 is also used for measuring the waveform of the avalanche voltage.
With reference to fig. 3, it is described that the controller 21 detects that the drain current value of the power device under test DUT22 is greater than or equal to the preset current threshold, and the controller 21 controls the gate-source voltage V of the power device under test DUT22 gs The voltage is less than or equal to the threshold voltage, the power device DUT22 to be tested is turned off, because the current on the first inductance circuit 23 can not change suddenly, the two ends of the first inductance circuit 23 generate high voltage, the avalanche voltage generated when the first inductance circuit 23 applies voltage to the power device DUT22 to be tested in a preset time period is measured by the voltage probes 34 connected in parallel with the two ends of the power device DUT22 to be tested, the waveform of the avalanche voltage is measured by the oscilloscope 35 connected with the voltage probes 34, and the electricity is recordedThe pressure V curve is stored in the computer device 20.
In the embodiment of the present application, the apparatus further includes a voltage probe 34 for detecting an avalanche voltage generated when the first inductor circuit 23 applies a voltage to the power device 22 to be measured within a preset time period, and an oscilloscope 35 for measuring an avalanche voltage waveform, a first end of the voltage probe 34 is connected to the drain of the power device 22 to be measured, a second end of the voltage probe 34 is connected to a second end of the second switch 32 and a second end of the current probe 33, and a third end of the voltage probe 34 is connected to the computer device 20 through the oscilloscope 35. That is to say, in this embodiment, the voltage probe 34 detects the avalanche voltage generated when the first inductance circuit 23 applies a voltage to the power device 22 to be measured within the preset time period, and the oscilloscope 35 measures the waveform of the avalanche voltage, so that the value and the waveform of the avalanche voltage can be measured, and further, a voltage signal invisible to the naked eye is converted into a voltage curve visible to the naked eye, so that a researcher can conveniently research the change process of the avalanche voltage, and the voltage probe 34 can realize the acquisition and recording of the avalanche voltage data.
In one embodiment, the apparatus further includes a resistor 38, the controller 21 includes a drain current detection circuit 43, a processing circuit and 41 a gate control circuit 44, a first end of the resistor 38 is connected to the drain current detection circuit 43 and the source of the power device 22 to be tested, and a second end of the resistor 38 is grounded; the drain current detection circuit 43 and the gate control circuit 44 are connected to the processing circuit 41.
Optionally, fig. 4 is a schematic structural diagram of an inside of a controller provided in an embodiment of the present application, and as shown in fig. 4, the controller 21 includes a drain current detection circuit 43, a processing circuit 41 and a gate control circuit 44, and the drain current detection circuit 43 and the gate control circuit 44 are connected to the processing circuit 41.
Optionally, since the current flows from the drain of the power device under test DUT22 to the source of the power device under test DUT22, the drain current detection circuit 43 detects the drain current of the power device under test DUT22 through the resistor R2, and if the drain current exceeds the allowable drain current of the power device under test DUT22, it is determined that the power device under test DUT22 or the test socket for carrying the power device under test DUT22 is shorted, that is, the power device under test DUT22 or the test socket is damaged and the avalanche test is terminated.
Optionally, the drain current detection circuit 43 detects the drain current of the power device DUT22 to be tested through the resistor R2, if the drain current does not exceed the allowable drain current of the power device DUT22 to be tested, it is determined that the power device DUT22 to be tested or the test socket for carrying the power device DUT22 to be tested is not shorted, that is, the power device DUT22 to be tested or the test socket is intact, when the drain current detection circuit 43 detects that the drain current of the power device DUT22 to be tested is greater than or equal to the preset current threshold, and sends drain current information that the drain current is greater than or equal to the preset current threshold to the processing circuit 41, the processing circuit 41 receives the drain current information and sends the drain current information to the gate control circuit 44, and the gate control circuit 44 controls the gate-source voltage V of the power device DUT22 to be tested according to the drain current information gs And when the voltage is less than or equal to the threshold voltage, the power device to be tested DUT22 is turned off, and because the current of the first inductance circuit 23 can not change suddenly, voltage impact is generated at two ends of the first inductance circuit 23 within a preset time, and an avalanche test result is obtained through the power device to be tested DUT 22.
In the embodiment of the present application, the controller 21 includes a processing circuit connected to the drain current detection circuit 43 and the gate control circuit 44, respectively, a first end of the resistor 38 is connected to the drain current detection circuit 43 and the source of the power device 22 to be tested, and a second end of the resistor 38 is grounded. That is, in this embodiment, the controller 21 can control the gate-source voltage V of the power device 22 to be tested by the processing circuit 41 connected to the drain current detection circuit 43 and the gate control circuit 44, respectively gs The power device 22 to be tested is in the repeated avalanche process by continuously switching between positive and negative, so that the avalanche test can be automatically and repeatedly carried out, and the reliability of the avalanche current of the power device 22 to be tested can be conveniently evaluated.
In one embodiment, the controller 21 further comprises an interface circuit 42 and a driving circuit 46, the interface circuit 42 being connected to the computer device 20, the interface circuit 42 and the driving circuit 46 being connected to the processing circuit 41; the interface circuit 42 is configured to receive the periodic test command sent by the computer device 20, and send the test command to the driving circuit 46, so that the driving circuit 46 controls the first switch 31 to be closed and the second switch 32 to be opened according to the test command.
As described with reference to fig. 4, the controller 21 further includes an interface circuit 42 and a driving circuit 46, the interface circuit 42 is connected to the computer device 20, and both the interface circuit 42 and the driving circuit 46 are connected to the processing circuit 41.
Optionally, the interface circuit 42 receives a periodic test instruction sent by the computer device 20, the driving circuit 46 controls the first switch 31 to be closed and the second switch 32 to be opened according to the periodic test instruction sent by the interface circuit 42, and sends a switch state signal indicating that the first switch 32 is closed and the second switch 32 is opened to the processing circuit 41, the processing circuit 41 sends the switch state signal to the gate control circuit 44, the gate control circuit 44 controls the gate-source voltage V of the power device under test DUT22 according to the switch state signal gs And when the voltage is less than or equal to the threshold voltage, the DUT22 of the power device to be tested is turned off, and the energy storage capacitor C1 is charged through the high-voltage program-controlled adjustable power supply HVG.
Optionally, the interface circuit 42 receives a periodic test instruction sent by the computer device 20 and sends the test instruction to the processing circuit 41, the processing circuit 41 receives the test instruction and sends the test instruction to the driving circuit 46, the driving circuit 46 controls the first switch 31 to be closed and the second switch 32 to be opened according to the test instruction, and sends a switch state signal that the first switch 31 is closed and the second switch 32 is opened to the processing circuit 41, the processing circuit 41 sends the switch state signal to the gate control circuit 44, and the gate control circuit 44 controls the gate source voltage V of the power device under test DUT22 according to the switch state signal gs And when the voltage is less than or equal to the threshold voltage, the DUT22 of the power device to be tested is turned off, and the energy storage capacitor C1 is charged through the program-controlled adjustable power supply HVG.
In the embodiment of the present application, the controller 21 further includes an interface circuit 42 and a driving circuit 46 connected to the computer device 20, and the interface circuit 42 and the driving circuit 46 are connected to the processing circuit 41; the interface circuit 42 receives periodic test instructions sent by the computer device 20 and sends test instructions to the drive circuit 46 to control the first switch 31 to be closed and the second switch 32 to be opened by the drive circuit 46 according to the test instructions. That is, in the present embodiment, the interface circuit 42 receives a periodic test instruction sent by the computer device 20, and sends a test instruction to the driving circuit 46, so that the driving circuit 46 controls the first switch 31 to be closed and the second switch 32 to be opened according to the test instruction.
In one embodiment, the controller 21 further comprises a voltage measuring circuit 45, the voltage measuring circuit 45 being connected to the processing circuit 41; and the voltage measuring circuit 45 is used for measuring the charging voltage of the energy storage circuit 24 and sending the charging voltage to the processing circuit 41, so that the processing circuit 41 judges whether the charging voltage of the energy storage circuit 24 is greater than or equal to a preset voltage threshold value or not according to the charging voltage.
In the description with reference to fig. 4, the voltage measuring circuit 45 in the controller 21 is connected to the processing circuit 41, and the processing circuit 41 is connected to the gate control circuit 44.
As described in connection with the above example, the voltage measuring circuit 45 measures the charging voltage of the energy storage capacitor C1, and sends the charging voltage to the processing circuit 41, when the processing circuit 41 determines that the charging voltage of the energy storage capacitor C1 reaches the preset voltage threshold, and sends the charging voltage information that the charging voltage reaches the preset voltage threshold to the gate control circuit 44 and the driving circuit 46, the gate control circuit 44 controls the gate-source voltage V of the power device under test DUT22 according to the charging voltage information gs When the voltage is larger than the threshold voltage, the DUT22 is turned on, and the driving circuit 46 controls the first switch 31 to be turned off and the second switch 32 to be turned on according to the charging voltage information, so that the energy storage capacitor C1 discharges at a constant current through the first inductor circuit 23, that is, charges the first inductor circuit 23.
In this embodiment, the controller 21 further includes a voltage measurement circuit 45, and the voltage measurement circuit 45 is connected to the processing circuit 41; and the voltage measuring circuit 45 is used for measuring the charging voltage of the energy storage circuit 24 and sending the charging voltage to the processing circuit 41, so that the processing circuit 41 judges whether the charging voltage of the energy storage circuit 24 is greater than or equal to a preset voltage threshold value or not according to the charging voltage. That is, the present embodiment is connected to the processing circuit 41 through the voltage measuring circuit 45, so that the controller 21 can determine whether the charging voltage of the tank circuit 24 is greater than or equal to the preset voltage threshold.
In one embodiment, the apparatus further comprises a second inductive circuit, a third switch 37 and a fourth switch 36, a first terminal of the third switch 37 is connected to a first terminal of the second inductive circuit, a second terminal of the second inductive circuit is connected to a first terminal of the voltage probe 34 and the drain of the power device 22 to be tested; a second terminal of the third switch 37 is connected to the fourth switch 36 and the constant current controller 39.
Wherein, the second inductance circuit is connected with the first inductance circuit 23 through the external inductance connection terminal when the inductance value is not large enough.
Optionally, the apparatus further comprises a diode, a first end of the diode is connected to the fourth switch 36, and a second end of the diode is connected to the power supply 25, wherein the specification of the diode is 200A rectifying diode.
Optionally, the third switch 37 is, for example, an external inductor selection switch, the second inductor circuit is, for example, an external inductor, the fourth switch 36 is, for example, an internal inductor selection switch, and both the external inductor selection switch and the internal inductor selection switch are 200A dc contactors.
It should be noted that, after the avalanche test is completed, the voltage measurement circuit 45 detects whether the charging voltage in the energy storage circuit 24 is empty, and if the charging voltage is not empty, the voltage measurement circuit 45 sends the non-empty charging voltage to the processing circuit 41, so that the driving circuit 46 controls the third switch 37 or the fourth switch 36, which is in the closed state when the energy storage circuit 24 charges the first inductance circuit 23 or the second inductance circuit, to be opened according to the non-empty charging voltage sent by the processing circuit 41, and controls the discharge switch 40 to be closed so as to empty the charge in the energy storage circuit 24.
Optionally, the apparatus further comprises: a liquid crystal display, which is connected to the computer device 20. The computer device 20 and the liquid crystal display are used for setting the test parameters and displaying the test parameters and curves during the avalanche test. The test parameters are specifically shown in table 1, where the test interval is the time for performing the avalanche test interval each time, and the test times are the times for repeating the avalanche test. The number of tests and the test interval may be preset before the test, and the test may be repeated based on the number of tests and the test interval.
Table 1 description of the test parameters
| Name of test parameter | Numerical value | Description of the invention |
| Output voltage of energy supply | 1～400V | Adjustable by using 1V as step length |
| Output current of energy supply | 0.5A | / |
| Energy storage circuit | 220μF/400V | / |
| Gate source voltage V gs | -15～+20V | Adjustable by using 1V as step length |
| Current output by constant current controller | 4～200A | 2A is step length adjustable |
| First inductance circuit | 0.01～239.99mH | The step length is adjustable by 0.01mH |
| A preset time duration | 1～200μs | Adjustable by taking 1 mus as step length |
| Allowing drain current | 1μA～2mA | Adjustable by using 1 muA as step length |
| Test interval | 10～9999s | / |
| Number of tests | 1 to 9999 times | / |
In the embodiment of the present application, the apparatus further includes a second inductive circuit, a third switch 37 and a fourth switch 36, a first end of the third switch 37 is connected to a first end of the second inductive circuit, a second end of the second inductive circuit is connected to the first end of the voltage probe 34 and the drain of the power device 22 to be tested, and a second end of the third switch 37 is connected to the fourth switch 36 and the constant current controller 39. That is, in the present embodiment, the second inductor circuit can avoid the problem that the avalanche test cannot be performed due to the insufficient inductance of the first inductor circuit 23.
In an embodiment, for example, the capacitor C is used as the energy storage circuit 24, the first inductance circuit 23 is L1 with a specification of 120mH and L2 with a specification of 60mH in the internal inductance, the resistor 38 is R2, the controller 21 is a central controller, the first switch 31 is S01, the second switch 32 is S04, the third switch 37 is S03, the fourth switch 36 is S02, the discharging switch is S05, the power supply 25 is a high-voltage programmable adjustable power supply HVG, the constant current controller 39 is a constant current source CS1, the current probe 33 is a current probe P1, the voltage probe 34 is a high-voltage differential probe P2, the driving circuit 46 is a relay array driving circuit, the interface circuit 42 is a host computer communication interface circuit, the voltage measuring circuit 45 is a capacitor bank voltage measuring circuit, the drain current detecting circuit 43 is a device under test current detecting circuit, the gate control circuit 44 is a device under test gate control circuit, the processing circuit 41 is an MCU + FPGA processing unit as an example, as shown in fig. 5, fig. 5 is another embodiment of the present application, and a schematic diagram of the power testing apparatus of the present application is provided, and the following specific steps are described as:
s501, before the test starts, the inductance of the inductor group is adjusted according to a set value, the central controller controls S02 to be closed to select the internal inductor, and controls S11 and S12 to be closed to enable the inductance of the internal inductor to be 180mH.
S502, an upper computer communication interface circuit in the central controller receives a test instruction of a computer and sends the test instruction to the relay array driving circuit, the relay array driving circuit controls S01 to be closed and S04 to be disconnected, switch state signals of S01 to be closed and S04 to be disconnected are sent to the MCU + FPGA processing unit, the MCU + FPGA processing unit sends the switch state signals to the grid control circuit of the device to be tested, and the grid control circuit of the device to be tested controls the grid source voltage V of the DUT (power device to be tested) according to the switch state signals gs And when the voltage is less than the threshold voltage, the DUT (device under test) is disconnected, and the high-voltage program-controlled adjustable power supply HVG charges the capacitor C.
S503, the leakage current detection circuit of the device to be tested detects the leakage current of the power device DUT to be tested through R2, and if the leakage current exceeds an allowable value, the power device DUT to be tested is judged to be damaged and the test is terminated.
S504, the capacitor bank voltage measuring circuit detects that the charging voltage of the capacitor C reaches a preset voltage threshold value, the current value of the constant current source CS1 is set through the MCU and FPGA processing unit, and the MCU and FPGA processing unit sends the current value of the constant current source CS1 to the relay array driving circuit and the grid control of the device to be testedThe control circuit is characterized in that the relay array driving circuit controls S01 to be disconnected and S04 to be closed according to the current value of the constant current source CS1, and meanwhile, the grid control circuit of the device to be tested controls the grid-source voltage V of the DUT (device under test) according to the current value of the constant current source CS1 gs When the voltage is larger than the threshold voltage, the DUT (device under test) is conducted, and the capacitor C1 discharges through the constant current of the internal inductor.
S505, the leakage current detection circuit of the power device to be tested detects that the drain current value of the power device to be tested reaches a preset current threshold value, the MCU + FPGA processing unit receives drain current information that the drain current value of the power device to be tested reaches the preset current threshold value and is sent by the leakage current detection circuit of the power device to be tested, the drain current information is sent to the grid control circuit of the power device to be tested, and the grid control circuit controls grid source voltage V of the power device to be tested DUT according to the grid current information gs And when the voltage is lower than the threshold voltage, the power device to be tested DUT is turned off, because the current of the internal inductor can not suddenly change, high voltage is generated at two ends of the internal inductor, avalanche testing is carried out on the power device to be tested DUT, the current probe P1 connected in series on the circuit and the high-voltage differential probe P2 connected in parallel at two sides of the power device to be tested DUT detect avalanche current and avalanche voltage in the avalanche testing, and record a V/I curve and store the V/I curve in the computer.
And S506, completing the avalanche test after a preset time.
S507, controlling the whole testing device through a computer, and controlling the grid source voltage V of the power device DUT to be tested by the grid control circuit of the device to be tested gs And continuously converting when the voltage is greater than or equal to and less than the threshold voltage, so that the power device to be tested DUT is in the repeated avalanche test process.
And S508, after all avalanche tests are finished, opening S02, and closing S05 to empty the charges in the capacitor C1.
The power device testing device comprises a controller, an energy storage circuit, a power supply, a first inductance circuit, a power device to be tested and computer equipment; the controller is used for receiving a periodic test instruction sent by the computer equipment and controlling the power device to be tested to be switched off and the power supply to charge the energy storage circuit according to the test instruction; the controller is further used for stopping charging the energy storage circuit, controlling the energy storage circuit to charge the first inductance circuit and controlling the power device to be tested to be conducted if the charging voltage of the energy storage circuit is greater than or equal to a preset voltage threshold; the controller is further used for detecting the drain current of the power device to be tested, and if the drain current is larger than or equal to a preset current threshold, the power device to be tested is controlled to be turned off, so that the first inductance circuit applies voltage to the power device to be tested within a preset time period to obtain an avalanche test result. That is to say, in the embodiment of the application, the controller receives a periodic test instruction sent by the computer device, and controls the power device to be tested to be turned off and the power supply to charge the energy storage circuit according to the test instruction, when the charging voltage of the energy storage circuit is greater than or equal to the preset voltage threshold, the controller controls the power supply to stop charging the energy storage circuit, and controls the energy storage circuit to charge the first inductor circuit, and controls the power device to be tested to be turned on, and then the controller controls the power device to be tested to be turned off by detecting whether the drain current of the power device to be tested is greater than or equal to the preset current threshold, so that the voltage is applied to the power device to be tested by the first inductor circuit within the preset time period to obtain an avalanche test result. For example, the controller receives a test instruction at intervals of a certain duration, where the certain duration is equal to, for example, 1 minute, and after the controller receives the first test instruction at 10 o' clock, the controller performs a test according to the method provided in this embodiment, so as to obtain an avalanche test result corresponding to the test. And then the controller receives a test instruction again at 10 o' clock and zero 1 min, and then executes a test according to the method provided by the embodiment to obtain an avalanche test result corresponding to the test, and the test is automatically repeated according to the method, so that the labor is saved and the test efficiency is improved.
It should be understood that, although the steps in the flowcharts related to the embodiments described above are shown in sequence as indicated by the arrows, the steps are not necessarily performed in sequence as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least a part of the steps in the flowcharts related to the embodiments described above may include multiple steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, and the execution order of the steps or stages is not necessarily sequential, but may be performed alternately or alternately with other steps or at least a part of the steps or stages in other steps.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, database, or other medium used in the embodiments provided herein may include at least one of non-volatile and volatile memory. The nonvolatile Memory may include a Read-Only Memory (ROM), a magnetic tape, a floppy disk, a flash Memory, an optical Memory, a high-density embedded nonvolatile Memory, a resistive Random Access Memory (ReRAM), a Magnetic Random Access Memory (MRAM), a Ferroelectric Random Access Memory (FRAM), a Phase Change Memory (PCM), a graphene Memory, and the like. Volatile Memory can include Random Access Memory (RAM), external cache Memory, and the like. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM), among others. The databases involved in the embodiments provided herein may include at least one of relational and non-relational databases. The non-relational database may include, but is not limited to, a block chain based distributed database, and the like. The processors referred to in the embodiments provided herein may be general purpose processors, central processing units, graphics processors, digital signal processors, programmable logic devices, quantum computing based data processing logic devices, etc., without limitation.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present application. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present application shall be subject to the appended claims.
Claims (10)
1. A power device testing device is characterized by comprising a controller, an energy storage circuit, a power supply, a first inductance circuit, a power device to be tested and computer equipment, wherein the controller is used for controlling the energy storage circuit to store energy;
the controller is used for receiving a periodic test instruction sent by the computer equipment and controlling the power device to be tested to be switched off and the power supply to charge the energy storage circuit according to the test instruction;
the controller is further configured to stop charging the energy storage circuit, control the energy storage circuit to charge the first inductor circuit, and control the power device to be tested to be turned on if the charging voltage of the energy storage circuit is greater than or equal to a preset voltage threshold;
the controller is further configured to detect a drain current of the power device to be tested, and if the drain current is greater than or equal to a preset current threshold, the power device to be tested is controlled to be turned off, so that the first inductance circuit applies a voltage to the power device to be tested within a preset time period to obtain an avalanche test result.
2. The apparatus according to claim 1, further comprising a first switch and a second switch, wherein the first switch is disposed between the energy storage circuit and the power supply, a first end of the second switch is connected to the source of the device under test, and a second end of the second switch is grounded;
the controller is used for controlling the first switch to be closed and the second switch to be opened according to the test instruction, so that the energy storage circuit is charged through the power supply when the first switch is closed, and the power device to be tested is turned off when the second switch is opened.
3. The apparatus of claim 2, wherein the controller is further configured to open the first switch to stop charging the tank circuit, control the tank circuit to charge the first inductor circuit, and control the second switch to close to turn on the power device under test if the charging voltage of the tank circuit is greater than or equal to a preset voltage threshold.
4. The device of claim 3, further comprising a constant current controller, wherein the constant current controller is respectively connected with the controller and the energy storage circuit;
the constant current controller is used for controlling the current of the energy storage circuit when the energy storage circuit charges the first inductance circuit to reach a set current value.
5. The apparatus according to claim 4, further comprising a current probe and an oscilloscope, wherein a first end of the current probe is grounded, a second end of the current probe is connected with the second switch, and a third end of the current probe is connected with the computer device through the oscilloscope;
the current probe is used for detecting avalanche current generated when the first inductance circuit applies voltage to the power device to be tested within the preset time length, wherein the avalanche test result comprises the avalanche current;
the oscilloscope is used for measuring the waveform of the avalanche current.
6. The apparatus according to claim 5, further comprising a voltage probe, wherein a first end of the voltage probe is connected to the drain of the device to be tested, a second end of the voltage probe is connected to a second end of the second switch and a second end of the current probe, and a third end of the voltage probe is connected to the computer device through the oscilloscope;
the voltage probe is used for detecting avalanche voltage generated when the first inductance circuit applies voltage to the power device to be tested within the preset time length, wherein the avalanche test result comprises the avalanche voltage;
the oscilloscope is further used for measuring the waveform of the avalanche voltage.
7. The device according to any one of claims 1-6, wherein the device further comprises a resistor, the controller comprises a drain current detection circuit, a processing circuit and a gate control circuit, a first end of the resistor is connected with the drain current detection circuit and the source of the power device to be tested, and a second end of the resistor is grounded;
the drain current detection circuit and the gate control circuit are connected with the processing circuit.
8. The apparatus of claim 7, wherein the controller further comprises an interface circuit and a driver circuit, the interface circuit being coupled to the computer device, the interface circuit and the driver circuit being coupled to the processing circuit;
the interface circuit is used for receiving a periodic test instruction sent by the computer equipment and sending the test instruction to the drive circuit, so that the drive circuit controls the first switch to be closed and the second switch to be opened according to the test instruction.
9. The apparatus of claim 8, wherein the controller further comprises a voltage measurement circuit coupled to the processing circuit;
the voltage measuring circuit is used for measuring the charging voltage of the energy storage circuit and sending the charging voltage to the processing circuit, so that the processing circuit judges whether the charging voltage of the energy storage circuit is larger than or equal to a preset voltage threshold value or not according to the charging voltage.
10. The apparatus of claim 6, further comprising a second inductive circuit, a third switch, and a fourth switch, wherein a first terminal of the third switch is connected to a first terminal of the second inductive circuit, and a second terminal of the second inductive circuit is connected to the first terminal of the voltage probe and the drain of the power device under test;
and the second end of the third switch is connected with the fourth switch and the constant current controller.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210821180.4A CN115144719A (en) | 2022-07-13 | 2022-07-13 | Power device testing device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202210821180.4A CN115144719A (en) | 2022-07-13 | 2022-07-13 | Power device testing device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115684864A (en) * | 2023-01-05 | 2023-02-03 | 佛山市联动科技股份有限公司 | Test circuit and test method suitable for switch time test and threshold voltage test |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115684864A (en) * | 2023-01-05 | 2023-02-03 | 佛山市联动科技股份有限公司 | Test circuit and test method suitable for switch time test and threshold voltage test |
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