CN114397553A

CN114397553A - High-voltage and high-current high-end suspension driver circuit testing method

Info

Publication number: CN114397553A
Application number: CN202111519747.4A
Authority: CN
Inventors: 康锡娥; 孙曦东; 薛宏
Original assignee: No47 Institute Of China Electronics Technology Group Corp
Current assignee: No47 Institute Of China Electronics Technology Group Corp
Priority date: 2021-12-13
Filing date: 2021-12-13
Publication date: 2022-04-26

Abstract

The invention belongs to the technical field of integrated circuit testing, and particularly relates to a high-voltage and high-current high-end suspension driver circuit testing method. Square waves generated by a digital channel of the enhanced tester of the N-channel MOSFET are used as logic input signals of the driver circuit; the high-end power supply end of the driver circuit is connected with the floating source H end in series, the floating source L end is connected with the H end of the high-voltage source of the testing machine, and the high-voltage source H end of the testing machine is connected to the high-end suspension offset voltage end of the driver circuit, so that high-voltage power supply is achieved, and then the full parameters of the driver circuit are tested. The invention can complete the test requirement of the whole circuit only by manufacturing one test circuit board, thereby saving the test cost.

Description

High-voltage and high-current high-end suspension driver circuit testing method

Technical Field

The invention belongs to the technical field of integrated circuit testing, and particularly relates to a high-voltage and high-current high-end suspension driver circuit testing method.

Background

In the power conversion device, according to the structure of a main circuit, a power switch device of the power conversion device generally adopts two modes of direct drive and isolated drive, the isolated drive is divided into electromagnetic isolation and photoelectric isolation, the photoelectric isolation has the defects of poor common mode rejection capability and low transmission speed, a pulse transformer is used as an isolation component for the electromagnetic isolation, the electromagnetic isolation has the advantages of fast response and strong anti-interference capability, but the maximum transmission width of a signal is limited by the magnetic saturation characteristic, so that the top of the signal is not easy to transmit, and a driver circuit takes the advantages of optical coupling isolation and electromagnetic isolation into account, so that the power conversion device is the first choice in medium and small power conversion devices.

The test system is used as a platform, and under the premise of technical indexes of a system platform, peripheral components are used to convert the test conditions to meet the test requirements, so that full-parameter test is realized, the stability and accuracy of the test result are considered, the test efficiency is improved, and the test system is a better solution for testing the driver circuit.

Disclosure of Invention

The invention aims to provide a method for testing a high-voltage and high-current suspension driver circuit, which can realize full-parameter testing of the circuit and make up for the defect of insufficient driving capability of an integrated circuit testing system.

The technical scheme adopted by the invention for realizing the purpose is as follows:

a high-voltage and high-current high-side suspension driver circuit test system comprises an N-channel MOSFET tube, a driver circuit, a plurality of resistors and a plurality of relays, wherein: the grid electrode of the N-channel MOSFET is connected with a digital channel of the testing machine through a resistor R1, the drain electrode of the N-channel MOSFET is respectively connected with a logic input end IN of the driver circuit and a common power supply end FOVI-0 of the testing machine through a resistor R2, a high-end power supply end VB of the driver circuit is connected with an H end of a floating power supply FPVI-0 of the testing machine, a high-end floating offset voltage end VS of the driver circuit is connected with the H end of a high-voltage source HVIK of the testing machine through a relay K3, the H end of the floating power supply FPVI-0 of the testing machine is connected with the H end of the high-voltage source HVIK of the testing machine through a relay K2, and an L end of the floating power supply FPVI-0 of the testing machine is connected with the H end of the high-voltage source HVIK of the testing machine through a relay K1.

A method for testing a high-voltage and high-current high-end suspension driver circuit comprises the steps of inputting square waves output by a testing machine into the driver circuit through an N-channel MOSFET, connecting a high-end power supply end VB of the driver circuit, a high-end suspension offset voltage end VS of the driver circuit, a floating power supply FPVI-0 of the testing machine and a high-voltage source HVIK of the testing machine through different relays, and respectively testing alternating current parameters and high-voltage leakage parameters of the driver circuit and testing short-circuit pulse current by controlling the on-off of the different relays.

Testing the alternating current parameters of the driver circuit, specifically:

setting a voltage threshold A of a logic input end IN and a voltage threshold B of an output end of the driver circuit, wherein when the voltage value of the logic input end IN reaches the threshold A, the time at the moment is taken as reference time 1, when the voltage value of the output end reaches the threshold B, the time at the moment is taken as reference time 2, and the difference value between the reference time 2 and the reference time 1 is an alternating current parameter to be tested.

The method for testing the high-voltage leakage parameters of the driver circuit specifically comprises the following steps:

the relay K2 is controlled to enable a power supply end VB of a high-end power supply and a high-end suspension offset voltage end VS to be in short circuit through the relay, the high-end suspension offset voltage end VS is connected to a high-voltage source HVIK through the relay K3, high voltage is provided for the VB and the VS through the high-voltage source HVIK at the same time, and the sum of currents on the VB and the VS at the moment is tested to be the high-voltage leakage parameter to be tested.

The short-circuit pulse current of the driver circuit is tested, and the method specifically comprises the following steps:

the output end of the driver circuit is connected with a resistor, square waves are input to a grid electrode of an N-channel MOSFET through a digital channel of a testing machine, reverse square waves are obtained at a drain electrode of the N-channel MOSFET, the drain electrode is connected to a logic input end IN of the driver circuit, voltage values of output waveforms IN one period or a plurality of periods are collected at the output end of the driver circuit according to sampling periods and sampling intervals, the average value of the collected voltages is calculated, and the short-circuit pulse current to be detected is obtained through the ratio of the average voltage value to the resistance value of the resistor.

The invention has the following beneficial effects and advantages:

1. the invention can use one test device to complete the full parameter test of the whole circuit.

2. The invention can be used in any tester as long as the hardware index of the tester meets the index requirement of the circuit.

3. The invention can complete the test requirement of the whole circuit only by manufacturing one test circuit board, thereby saving the test cost.

Drawings

FIG. 1 is a flow chart of the present invention;

FIG. 2 is a MOSFET drive schematic;

FIG. 3 is a block diagram of the circuit connections;

FIG. 4 is a test waveform;

FIG. 5 is a block diagram of AC parametric testing;

fig. 6 is a block diagram of a driver circuit configuration.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings and examples.

A method for testing a high-voltage high-current suspension driver circuit, comprising:

the large current is the current with the current value exceeding 1A, and a test program developer selects proper components to meet the test requirement according to the detailed specification of the high-end suspension driver circuit or the logic input signal high level voltage, the high-end power supply end voltage, the high-end suspension offset voltage end voltage, the high pulse short-circuit current and the low pulse short-circuit current value of the output end required by foreign data. As shown in fig. 3, the component includes: completing the MOSFET circuit required for inputting high level; the high-voltage relay required by the voltage of the power supply terminal of the high-end power supply and the high-end suspension offset voltage is completed; finishing a filter capacitor required by the AC parameter test at the output end; and finishing a large-current relay and a power resistor required by the short-circuit current of the output end. The layout of components on the circuit test board is reasonably arranged according to the arrangement of pins of the circuit, and the high-voltage input part is isolated without copper laying. The device is debugged on a tester directly according to the data requirement, completes the full parameter test of the high-voltage and heavy-current suspension driver, and solves the problems of low input level and low measurement voltage of a digital channel of the tester.

A high-voltage and large-current high-end suspension driver circuit testing method is characterized in that a digital channel of a testing machine is connected to a G end of an N-channel MOSFET through a resistor R1, a common source of the testing machine is connected to a D end of the MOSFET through a resistor R2, the other end of a resistor R2 is connected to a logic input end of a driver circuit, so that the driving capacity of the digital channel of the testing machine is enhanced, and a new waveform is generated to serve as a logic input signal of the driver circuit, and is shown in figure 2. Connecting a VB pin of a high-end power supply terminal of a driver circuit and an H terminal of a PVI of a floating source in series, wherein an L terminal of the PVI source is connected to the ground through a normally closed terminal of a relay K1, a normally open terminal of the PVI source is connected to an H terminal of a high-voltage source, an H terminal of the high-voltage source HVIK is connected to a high-end floating offset voltage terminal VS of the driver circuit through a normally open terminal of a relay K3, an L terminal of the high-voltage source HVIK is grounded, and a normally closed terminal of the relay K3 is grounded; the VB and VS pins are shorted through a relay K2. As shown in fig. 1, the floating source and the high voltage source are connected in series by closing the normally open end of the relay K1, so that the maximum 1040V voltage can be provided; k1 is in normally closed state, VB pin is in normal power state; k2 is closed, K3 is normally open and closed, so that the same high voltage is supplied to VB and VS, and K3 is in a normally closed mode, K2 is opened, and the VS is directly grounded; the normally open mode of K3 is closed, K2 is opened, and VS high-voltage power supply is realized; according to the above description, the full parameter test is realized by adopting different operations to the relay according to the test condition requirements of the driver circuit parameters.

As shown in fig. 6, the driver circuit is used for driving the MOSFET device, and generally includes a logic input terminal, a power terminal, an output terminal, a control terminal, and a ground terminal; the power supply end comprises a low-side power supply and mainly supplies power to a low-side output end and a logic input end, a control end and the like of the device; the high-end power supply end mainly supplies power to the high-side output end, and is matched with the high-end suspension offset voltage end to output higher voltage to the high-side output end. From the above, it can be seen that the logic input of the driver is one of the key conditions for determining whether the device can operate normally. Taking IR2110L4 of IR company as an example, the high level is required to be more than or equal to 9.5V and the low level is required to be less than or equal to 6.0V at normal temperature, and the high level is required to be more than or equal to 10V and the low level is required to be less than or equal to 5.7V at high temperature and low temperature, so that the input level limit of the advanced test systems such as J750, 93000K, Ultra Flex, STS8205 and the like of the integrated circuit test systems familiar in the market is-2.5V-7V, and the circuit test requirements such as IR2110L4 cannot be directly met. Considering that each test system is provided with an arbitrary waveform generator, square waves can be generated by the waveform generator, and the driving capability of an input signal of the test machine is enhanced by using an N-channel MOSFET. Thereby meeting the requirements of the input level of the driver circuit. The MOFET is selected according to the input level value and the AC parameter value of the tested driver circuit.

As shown in fig. 3, according to the data requirement, when performing the parameter test, the voltage difference between the high-side power supply terminal and the high-side floating offset voltage terminal of the driver is 15V, and the voltage of the high-side floating offset voltage terminal is required to be more than or equal to 100V, so the voltage of the high-side power supply terminal is required to be more than or equal to 115V, in this case, the floating source of the test system is connected in series, that is, the high-voltage source and the floating source are connected in series, and the positive terminal of the high-voltage source is required to be connected to the high-side floating offset voltage terminal, and the floating source after the series connection is connected to the high-side power supply terminal. Thereby realizing high-voltage power supply. Taking IR2110L4 as an example, this circuit requires that a high voltage be applied to the circuit when testing some of the parameters. Typical integrated circuit test system power supply voltages are between 40-180V. Any tester is suitable as long as the power supply of the tester can be used in series to meet the test requirements. The whole test of the circuit is completed on an STS8205 test machine which is a domestic test machine and can provide a 1000V high-voltage source and a 40V universal power supply, so that the circuit is more convenient and flexible to use. The HVIK high-voltage source and the FPVI source on the testing machine are selected to be connected in series through a relay, namely L _ F and L _ S of the FPVI are in short circuit with HVIKH _ F and HVIKH _ S of the high-voltage source, H _ S and H _ F of the FPVI are connected to a high-side power supply end, and HVIKL _ S and HVIKL _ F are connected to the ground end, so that the testing requirement is met.

As shown in fig. 4, when performing ac parameter testing, the amplitude of the output terminal voltage is substantially equal to the voltage of the power supply terminal of the high-end power supply, the time measurement reference point of the ac parameter is 10% of the rising edge of the input voltage, 90% of the output voltage, and 90% of the output voltage of 115V is 103.5V, the maximum voltage measurement point of the time measurement module of the tester is 25V, which cannot meet the requirement, the ac measurement of the driver circuit generally requires the output terminal to have a capacitive load, and therefore, the output terminal is connected with a capacitor with a withstand voltage value more than 2 times the voltage of the output terminal, however, because the impedance of the capacitor is relatively small, the direct grounding of the capacitor can introduce very significant noise, so the end of the capacitor is connected with a large-resistance resistor which is grounded, and the resistance value of the resistor is more than K Ω, and the test waveform is smooth and stable.

When testing the ac parameters of the driver circuit, the time measurement units QTMUA and QTMUB of the tester are connected to the logic input of the driver circuit and the output of the circuit, respectively, as shown in fig. 5. According to the test waveform of the circuit shown in fig. 4, QTMUA acquires the waveform of the logic input end of the driver circuit, QTMUB acquires the waveform of the output end of the driver circuit, and taking the test alternating current parameter Ton as an example, the time difference between 50% of the rising edge of the input waveform and 10% of the rising edge of the output waveform is observed in the measurement range of Ton in the test waveform diagram, so the voltage values of the two points of voltage are set in the program before the test, the voltage value is acquired by QTMUA according to the voltage value set in the test program and is used as the reference voltage, the time at the time is used as the reference time, and the voltage value and the time value set by the output end are acquired by QTMUB, and the difference between the two time values is Ton.

When a high-voltage leakage test required in data is carried out, a high-end power supply end and a high-end suspension offset voltage end are required to be connected together through a relay, or the high-end suspension offset voltage end is directly connected to a high-voltage source, and at the moment, the leakage current is required to be small and is generally in a microampere level. In the manufacturing process of the PCB, related elements for high-voltage source-drain current testing are involved, copper cannot be laid at the output end, otherwise, leakage current is large, and misjudgment is caused to the circuit. Therefore, high-voltage components, high-voltage output ends and the like are placed in the same area and separated from the copper laying area as much as possible on the PCB layout;

when testing the high-voltage leakage parameters of the driver circuit, the power supply end VB of a high-end power supply and the high-end suspension offset voltage end VS are in short circuit through a relay, the high-end suspension offset voltage end VS is connected to a high-voltage source through the relay, high voltage is simultaneously provided for the VB and the VS through the high-voltage source, and the sum of currents on pins VB and VS at the moment is tested.

According to the requirement of driver data, short-circuit pulse current test is required, the current value of a common short-circuit pulse is more than 1A, the effective time of the pulse is 10 mus, according to the technical index of the current analog integrated circuit test system, the current measurement by adopting a source cannot be realized, the measurement speed of the source is the fastest 10 mus, therefore, the short-circuit pulse current test is carried out by adopting a voltage measurement module on a test machine, a suspension driver is used as a driver of an MOSFET circuit, the on-resistance of the MOSFET is very small, the resistance of the output end is preferably within 100m omega, vectors are compiled in a test program as much as possible, only one vector is required to be a low pulse or a high pulse in the middle, the output of all vectors needs to be collected, comparison is carried out according to the predicted test result and the actual measurement result, the required collection point of the test result is found, 30-80 points after the collection point are selected for data collection, thereby calculating the average value of the voltage and obtaining the short-circuit current.

The high-voltage and high-current driver circuit testing method provided by the embodiment of the application can complete the conversion from low voltage to high voltage of input high level and low level according to the data of the circuit, thereby meeting the input condition of the circuit; by connecting the high-voltage source and the floating source in series, the voltage difference value between the power supply end of the high-end power supply and the voltage of the high-end suspension offset voltage is realized with the help of the high-voltage relay, the requirement of a test condition is met, and therefore the alternating current parameter test can be smoothly realized; for the short pulse current test, the output end is connected with a small resistor, a plurality of groups of data are collected, and the ampere-level short circuit current test is realized by analyzing the data; in the manufacture of the test circuit board, the high-voltage related part is selected to be placed in one area, and copper laying is not adopted, so that the phenomenon that the leakage current is too large and misjudgment is caused is avoided. Through the above description, the full parameter test of the high-voltage and high-current driver circuit is realized by selecting different components.

Example one

Fig. 1 is a flowchart of a testing method of a high-voltage and large-current driver circuit according to an embodiment of the present disclosure, which is applicable to a testing situation of a high-voltage and large-current circuit, and specifically includes the following steps:

1. according to the high level voltage and the low level voltage of the logic input signal in the circuit data, whether the requirements of the testing machine are met or not is judged, if the requirements cannot be met, the logic input signal of the testing machine is driven by the MOSFET circuit, and therefore the MOSFET output signal meets the requirements of a driver circuit.

2. In the test condition, the maximum voltage value needed by the high-end power supply end and the high-end suspension offset voltage end is determined by the voltage provider of the high-end suspension offset voltage end, if the voltage is higher than the voltage provided by the test machine source, a high-voltage source and floating source series mode is adopted, all relays in the series mode adopt high-voltage relays, any device directly connected with a high-voltage pin needs to adopt the high-voltage relays for safety, and the current limiting range of the high-voltage source cannot be smaller than that of the floating source connected with the high-voltage relays in series.

3. The function test of the driver circuit can be realized according to 1 and 2, corresponding input and output waveforms can be observed through an oscilloscope, but a tester cannot normally acquire the voltage value of an output end, so that a capacitive load is connected to the output end, the voltage withstanding value of the capacitive load is 2 times that of the voltage value of a high-end suspension offset voltage, a resistor with the resistance value above K omega is connected to the tail end of the capacitive load for reducing noise, and the tester can measure direct current parameters and alternating current parameters between the capacitive load and the resistor.

4. On the basis of realizing the function test of the driver circuit according to 1 and 2, a small resistor within 100m omega is connected to an output end through a large-current relay, when high-pulse short-circuit current is measured, a test vector is invalid at first, only one vector is valid in 100 compiled vectors, the effective pulse width of the vector is 10 mu S, voltage at two ends of the resistor is measured by adopting a voltmeter of a testing machine, 10000 data are collected in 100 vectors when the sampling time of the voltmeter is 0.1 mu S, the data are judged, the data meeting the requirements are counted, and the short-circuit voltage is obtained by calculating the average value, so that the short-circuit current is never obtained.

5. The other parameters in the data can be completely applied according to the test conditions, thereby completing the full parameter test of the circuit.

Claims

1. The utility model provides a high-pressure, heavy current high side suspension driver circuit test system which characterized in that, includes N passageway MOSFET pipe, driver circuit, a plurality of resistance and a plurality of relay, wherein: the grid electrode of the N-channel MOSFET is connected with a digital channel of the testing machine through a resistor R1, the drain electrode of the N-channel MOSFET is respectively connected with a logic input end IN of the driver circuit and a common power supply end FOVI-0 of the testing machine through a resistor R2, a high-end power supply end VB of the driver circuit is connected with an H end of a floating power supply FPVI-0 of the testing machine, a high-end floating offset voltage end VS of the driver circuit is connected with the H end of a high-voltage source HVIK of the testing machine through a relay K3, the H end of the floating power supply FPVI-0 of the testing machine is connected with the H end of the high-voltage source HVIK of the testing machine through a relay K2, and an L end of the floating power supply FPVI-0 of the testing machine is connected with the H end of the high-voltage source HVIK of the testing machine through a relay K1.

2. A high-voltage and high-current high-end suspension driver circuit testing method is characterized in that square waves output by a testing machine are input into a driver circuit through an N-channel MOSFET, a high-end power supply end VB of the driver circuit, a high-end suspension offset voltage end VS, a floating power supply FPVI-0 of the testing machine and a high-voltage source HVIK of the testing machine are connected through different relays, and alternating current parameters and high-voltage leakage parameters of the driver circuit are respectively tested and short-circuit pulse current is tested by controlling the connection and disconnection of the different relays.

3. The method for testing the high-voltage high-current high-end suspension driver circuit according to claim 2, wherein the testing of the alternating current parameters of the driver circuit is specifically as follows:

4. The method for testing the high-voltage and high-current high-end suspension driver circuit according to claim 2, wherein the high-voltage leakage parameters of the driver circuit are tested, and specifically:

5. The method for testing the high-voltage high-current high-end suspension driver circuit according to claim 2, wherein the short-circuit pulse current of the driver circuit is tested, and specifically comprises the following steps: