CN115020191A - Circuit board production method - Google Patents
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 21
- 238000004140 cleaning Methods 0.000 claims abstract description 61
- 239000007789 gas Substances 0.000 claims abstract description 59
- 239000011261 inert gas Substances 0.000 claims abstract description 50
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 24
- 229910002804 graphite Inorganic materials 0.000 claims abstract description 24
- 239000010439 graphite Substances 0.000 claims abstract description 24
- 238000005530 etching Methods 0.000 claims abstract description 13
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 32
- 239000011347 resin Substances 0.000 claims description 20
- 229920005989 resin Polymers 0.000 claims description 20
- 238000002955 isolation Methods 0.000 claims description 17
- 229910052786 argon Inorganic materials 0.000 claims description 16
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- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 15
- 239000004020 conductor Substances 0.000 claims description 7
- 239000000463 material Substances 0.000 claims description 4
- 239000000758 substrate Substances 0.000 claims description 4
- 229910052734 helium Inorganic materials 0.000 claims description 3
- 239000001307 helium Substances 0.000 claims description 3
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 3
- 229910052754 neon Inorganic materials 0.000 claims description 3
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 claims description 3
- 239000000498 cooling water Substances 0.000 claims description 2
- 229910052743 krypton Inorganic materials 0.000 claims description 2
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 claims description 2
- 238000000059 patterning Methods 0.000 claims description 2
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- 229910052724 xenon Inorganic materials 0.000 claims description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 claims description 2
- 239000003292 glue Substances 0.000 claims 1
- 238000007254 oxidation reaction Methods 0.000 abstract description 9
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- MKYBYDHXWVHEJW-UHFFFAOYSA-N N-[1-oxo-1-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)propan-2-yl]-2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidine-5-carboxamide Chemical compound O=C(C(C)NC(=O)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F)N1CC2=C(CC1)NN=N2 MKYBYDHXWVHEJW-UHFFFAOYSA-N 0.000 description 1
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- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 150000002927 oxygen compounds Chemical class 0.000 description 1
- -1 oxygen ions Chemical class 0.000 description 1
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B7/00—Cleaning by methods not provided for in a single other subclass or a single group in this subclass
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- Condensed Matter Physics & Semiconductors (AREA)
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- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
本发明是一种电路板生产方法,包括以下步骤:S1、将刻蚀电路板用晶圆表面进行粗清洗;S2、将粗清理后晶圆放置入真空腔中,对真空腔进行抽真空,真空腔中真空度范围为5pa‑2pa;S3、向真空腔内通入惰性气体,通入惰性气体速度范围为10‑5000sccm,对石墨电极进行通电,通电电压范围为200‑5000v;完成一次清洗;本发明中采用石墨电极作为靶源,对惰性气体与活性气体进行电离,解决了金属电极作为靶源对电路板表面清理造成损伤的问题,有效提升了电路板的表面达因值;采用惰性气体与活性气体同时对电路板表面进行清理,可使清理后电路板表面膜氧化率达到99.9%,对晶圆表面进行两次清理,确保晶圆的表面洁净度,提升了电路板的使用效果。
The present invention is a circuit board production method, comprising the following steps: S1, rough cleaning the surface of a wafer for etching the circuit board; S2, placing the rough cleaned wafer into a vacuum chamber, and vacuuming the vacuum chamber, The vacuum degree range in the vacuum chamber is 5pa‑2pa; S3, inert gas is introduced into the vacuum chamber, and the speed range of the inert gas is 10‑5000sccm, and the graphite electrode is energized, and the energization voltage range is 200‑5000v; complete one cleaning In the present invention, the graphite electrode is used as the target source to ionize the inert gas and the active gas, which solves the problem of damage to the surface of the circuit board caused by the metal electrode as the target source, and effectively improves the surface dyne value of the circuit board; The surface of the circuit board is cleaned by the gas and the active gas at the same time, so that the oxidation rate of the surface film of the circuit board after cleaning can reach 99.9%, and the surface of the wafer is cleaned twice to ensure the surface cleanliness of the wafer and improve the use effect of the circuit board. .
Description
技术领域technical field
本发明涉及电路板技术领域,特别涉及一种电路板生产方法。The invention relates to the technical field of circuit boards, in particular to a method for producing circuit boards.
背景技术Background technique
电路板是指制作硅半导体电路所用的硅晶片,其原始材料是硅。高纯度的多晶硅溶解后掺入硅晶体晶种,然后慢慢拉出,形成圆柱形的单晶硅,硅晶棒在经过研磨,抛光,切片后,形成硅电路板片,也就是电路板,目前国内电路板生产线以 8英寸和 12 英寸为主,电路板的主要加工方式为片加工和批加工,即同时加工1片或多片电路板。随着半导体特征尺寸越来越小,加工及测量设备越来越先进,使得电路板加工出现了新的数据特点。同时,特征尺寸的减小,使得电路板加工时,空气中的颗粒数对电路板加工后质量及可靠性的影响增大,而随着洁净的提高,颗粒数也出现了新的数据特点。Circuit board refers to the silicon wafer used to make silicon semiconductor circuits, and its original material is silicon. High-purity polysilicon is dissolved and mixed with silicon crystal seeds, and then slowly pulled out to form cylindrical monocrystalline silicon. At present, the domestic circuit board production lines are mainly 8 inches and 12 inches. The main processing methods of circuit boards are sheet processing and batch processing, that is, one or more circuit boards are processed at the same time. As semiconductor feature sizes become smaller and processing and measurement equipment becomes more and more advanced, new data characteristics appear in circuit board processing. At the same time, the reduction of the feature size increases the influence of the number of particles in the air on the quality and reliability of the circuit board after processing during circuit board processing. With the improvement of cleanliness, the number of particles also has new data characteristics.
现有技术中,在对电路板进行表面清洗时,常采用金属电极,金属电极在通入活性气体氛围中发生氧化,在高电压下电离,对电路板表面冲击,造成电路板表面清洁度较差,而且由于离子束多为正面冲击,不能够对电路板两侧进行有效清洗。In the prior art, when cleaning the surface of the circuit board, metal electrodes are often used, and the metal electrodes are oxidized in the active gas atmosphere, ionized under high voltage, and impact on the surface of the circuit board, resulting in poor surface cleanliness of the circuit board. Poor, and because the ion beam is mostly frontal impact, it cannot effectively clean both sides of the circuit board.
发明内容SUMMARY OF THE INVENTION
有鉴于此,本发明旨在提出一种电路板生产方法,以解决现有在对电路板进行表面清洗时,常采用金属电极,金属电极在通入活性气体氛围中发生氧化,在高电压下电离,对电路板表面冲击,造成电路板表面清洁度较差的问题。In view of this, the present invention aims to propose a circuit board production method to solve the problem that metal electrodes are often used in the surface cleaning of circuit boards. Ionization, impact on the surface of the circuit board, resulting in poor surface cleanliness of the circuit board.
为达到上述目的,本发明的技术方案是这样实现的:In order to achieve the above object, the technical scheme of the present invention is achieved in this way:
一种电路板生产方法,包括以下步骤:A method for producing a circuit board, comprising the following steps:
S1、将刻蚀电路板用晶圆表面进行粗清洗;S1. Roughly clean the surface of the etched circuit board wafer;
S2、将粗清理后的晶圆放置入真空腔中,对真空腔进行抽真空,真空腔中真空度范围为5pa-2pa;S2. Place the roughly cleaned wafer into a vacuum chamber, and evacuate the vacuum chamber, and the vacuum degree in the vacuum chamber is 5pa-2pa;
S3、向真空腔内通入惰性气体,通入惰性气体速度范围为10-5000sccm,向石墨电极通入恒温冷却水,高速旋转装有基片的笼架,同时旋转圆柱靶材,磁场面向基材通过绝缘电极,将电源负高压连接到石墨电极上,对石墨电极进行通电,通电电压范围为200-5000v;S3. Inert gas is introduced into the vacuum chamber, the speed range of the inert gas is 10-5000sccm, constant temperature cooling water is introduced into the graphite electrode, the cage with the substrate is rotated at a high speed, and the cylindrical target is rotated at the same time, and the magnetic field faces the substrate. The material passes through the insulating electrode, and the negative high voltage of the power supply is connected to the graphite electrode, and the graphite electrode is energized, and the energization voltage range is 200-5000v;
S4、向真空腔中通入活性气体,通入活性气体的速度范围为10-5000sccm,清洗时长为0.5-2h,完成一次清洗;S4, introducing active gas into the vacuum chamber, the speed range of introducing active gas is 10-5000sccm, the cleaning time is 0.5-2h, and one cleaning is completed;
S5、将一次清洗后晶圆放置入真空腔中,真空腔中设置有隔离板,隔离板将真空腔分为惰性气体室与活性气体室,对真空腔进行抽真空,真空腔中真空度范围为5pa-2pa;S5. Place the wafer after one cleaning into a vacuum chamber. The vacuum chamber is provided with an isolation plate. The isolation plate divides the vacuum chamber into an inert gas chamber and an active gas chamber. The vacuum chamber is evacuated, and the vacuum degree in the vacuum chamber is within the range 5pa-2pa;
S6、向惰性气体室内通入惰性气体,通入惰性气体速度范围为10-5000sccm,向活性气体室中通入活性气体,通入活性气体的速度范围为10-5000sccm;S6. Inert gas is introduced into the inert gas chamber, and the speed range of the inert gas is 10-5000sccm, and the active gas is introduced into the active gas chamber, and the speed of the active gas is 10-5000sccm;
S7、对惰性气体室中与活性气体室中石墨电极分别通电,通电电压范围为200-5000v;S7, energize the graphite electrodes in the inert gas chamber and the active gas chamber respectively, and the energization voltage range is 200-5000v;
S8、将晶圆从惰性气体室转动到活性气体室中,转动速度范围为0.2-0.6r/min,清洗时长为1.5-2h,完成二次清洗;S8. Rotate the wafer from the inert gas chamber to the active gas chamber, the rotation speed range is 0.2-0.6r/min, the cleaning time is 1.5-2h, and the secondary cleaning is completed;
S9、在清洗后的晶圆表面进行图案化和刻蚀。S9, patterning and etching are performed on the cleaned wafer surface.
优选的,所述步骤S1中晶圆表面粗清理为将电路板放入NMP溶液中进行脱胶以去除电路板表面上的胶质物体。Preferably, the rough cleaning of the wafer surface in the step S1 is to put the circuit board in an NMP solution for degumming to remove colloidal objects on the surface of the circuit board.
优选的,所述步骤S2中在真空腔中设置有转动架,所述转动架带动电路板从惰性气体室转动至活性气体室。Preferably, in the step S2, a turret is arranged in the vacuum chamber, and the turret drives the circuit board to rotate from the inert gas chamber to the active gas chamber.
优选的,所述步骤S3与所述步骤S6中惰性气体为氦、氖、氩、氪、氙、氡气体中的任意一种。Preferably, in the step S3 and the step S6, the inert gas is any one of helium, neon, argon, krypton, xenon, and radon.
优选的,所述步骤S4与所述步骤S6中活性气体为氧气。Preferably, the active gas in the step S4 and the step S6 is oxygen.
优选的,所述步骤S9中刻蚀步骤为用特定形态的树脂体系;采用与电路板的外形以及电路板上布线图形相匹配的模具;将上述树脂体系置于上述模具内;通过所述模具直接浇注或者模压成型电路板的外形以及电路板上布线图形;在所述布线图形上填充导电材料以形成电路板导电图形。Preferably, the etching step in the step S9 is to use a resin system of a specific shape; use a mold that matches the shape of the circuit board and the wiring pattern on the circuit board; put the resin system in the mold; pass the mold The shape of the circuit board and the wiring pattern on the circuit board are directly cast or molded; the conductive material is filled on the wiring pattern to form the circuit board conductive pattern.
相对于现有技术,本发明所述的一种电路板生产方法具有以下优势:Compared with the prior art, the circuit board production method of the present invention has the following advantages:
1、采用石墨电极作为靶源,对惰性气体与活性气体进行电离,解决了金属电极作为靶源对电路板表面清理造成损伤的问题,有效提升了电路板的表面达因值;1. The graphite electrode is used as the target source to ionize the inert gas and the active gas, which solves the problem of damage to the surface of the circuit board caused by the metal electrode as the target source, and effectively improves the surface dyne value of the circuit board;
2、采用惰性气体与活性气体同时对电路板表面进行清理,可使清理后电路板表面膜氧化率达到99.9%;2. The use of inert gas and active gas to clean the surface of the circuit board at the same time can make the oxidation rate of the surface film of the circuit board reach 99.9% after cleaning;
3、对晶圆表面进行两次清理,确保晶圆的表面洁净度,提升了电路板的使用效果。3. Clean the wafer surface twice to ensure the surface cleanliness of the wafer and improve the use effect of the circuit board.
附图说明Description of drawings
为了更清楚地说明本发明实施例的技术方案,下文中将对本发明实施例的附图进行简单介绍。其中,附图仅仅用于展示本发明的一些实施例,而非将本发明的全部实施例限制于此。In order to illustrate the technical solutions of the embodiments of the present invention more clearly, the accompanying drawings of the embodiments of the present invention will be briefly introduced hereinafter. The accompanying drawings are only used to illustrate some embodiments of the present invention, but not to limit all the embodiments of the present invention thereto.
图1为本发明实施例四中电路板清洗流程图;1 is a flow chart of circuit board cleaning in
图2为本发明实施例四中电路板清洗装置图;2 is a diagram of a circuit board cleaning device in
图3为本发明电路板清洗过程中的物质分布状态图;FIG. 3 is a state diagram of material distribution in the circuit board cleaning process of the present invention;
图4为本发明电路板清洗系统的简图;4 is a schematic diagram of the circuit board cleaning system of the present invention;
图5为本发明清洗系统中离子分布区域的简图。FIG. 5 is a schematic diagram of the ion distribution area in the cleaning system of the present invention.
附图标记:Reference number:
1、主机体;2、腔体;3、真空泵组;4、隔离板;5、柔性接头;6、转动架;7、石墨电极;8、惰性气体箱;9、电磁阀;10、真空度检测器;11、高压电源;12、活性气体箱。1. Main body; 2. Cavity; 3. Vacuum pump set; 4. Isolation plate; 5. Flexible joint; 6. Turret; 7. Graphite electrode; 8. Inert gas box; 9. Solenoid valve; 10. Vacuum degree Detector; 11. High voltage power supply; 12. Active gas box.
具体实施方式Detailed ways
为使本发明的上述目的、特征和优点能够更为明显易懂,下面结合附图对本发明的具体实施例做详细的说明。In order to make the above objects, features and advantages of the present invention more clearly understood, the specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
实施例一:Example 1:
一种电路板生产方法,包括以下步骤:A method for producing a circuit board, comprising the following steps:
S1、将刻蚀电路板用晶圆表面放入NMP溶液中进行脱胶;S1, put the wafer surface for etching circuit board into NMP solution for degumming;
S2、将粗清理后晶圆放置入真空腔中,对真空腔进行抽真空,真空腔中真空度为5pa;S2, place the wafer after rough cleaning into a vacuum chamber, and evacuate the vacuum chamber, and the vacuum degree in the vacuum chamber is 5pa;
S3、向真空腔内通入氩气,通入氩气速度为10sccm,对石墨电极进行通电,通电电压为200v;S3. Pour argon gas into the vacuum chamber at a speed of 10 sccm, and energize the graphite electrode, and the energization voltage is 200v;
S4、向真空腔中通入氧气,通入氧气的速度为10sccm,清洗时长为0.5h,完成一次清洗;S4. Pour oxygen into the vacuum chamber at a rate of 10sccm and a cleaning time of 0.5h to complete one cleaning;
S5、将一次清洗后晶圆放置入真空腔中,真空腔中设置有隔离板,隔离板将真空腔分为惰性气体室与活性气体室,对真空腔进行抽真空,真空腔中真空度为5pa;S5. Place the wafer after one cleaning into a vacuum chamber. The vacuum chamber is provided with an isolation plate. The isolation plate divides the vacuum chamber into an inert gas chamber and an active gas chamber, and evacuates the vacuum chamber. The vacuum degree in the vacuum chamber is 5pa;
S6、向惰性气体室内通入氩气,通入氩气速度为10sccm,向活性气体室中通入氧气,通入氧气的速度为10sccm;S6, feed argon gas into the inert gas chamber, the speed of feeding argon gas is 10sccm, and feeding oxygen into the active gas chamber, the speed of feeding oxygen gas is 10sccm;
S7、对惰性气体室中与活性气体室中石墨电极分别通电,通电电压为200v;S7, energize the graphite electrodes in the inert gas chamber and the active gas chamber respectively, and the energization voltage is 200v;
S8、将晶圆从惰性气体室转动到活性气体室中,转动速度为0.2r/min,清洗时长为1.5h,完成二次清洗;S8, rotate the wafer from the inert gas chamber to the active gas chamber, the rotation speed is 0.2r/min, the cleaning time is 1.5h, and the secondary cleaning is completed;
S9、对清洗后晶圆进行刻蚀,刻蚀步骤为用特定形态的树脂体系;采用与电路板的外形以及电路板上布线图形相匹配的模具;将上述树脂体系置于上述模具内;通过所述模具直接浇注或者模压成型电路板的外形以及电路板上布线图形;在所述布线图形上填充导电材料以形成电路板导电图形。S9, the wafer after cleaning is etched, and the etching step is to use a resin system of a specific shape; adopt a mold that matches the shape of the circuit board and the wiring pattern on the circuit board; place the above-mentioned resin system in the above-mentioned mold; The mold directly casts or presses the shape of the circuit board and the wiring pattern on the circuit board; and the wiring pattern is filled with conductive material to form the circuit board conductive pattern.
实施例二:Embodiment 2:
在实施例一的基础上,对实施例一电路板生产方法进行进一步优化:On the basis of Embodiment 1, the circuit board production method of Embodiment 1 is further optimized:
一种电路板生产方法,包括以下步骤:A method for producing a circuit board, comprising the following steps:
S1、将刻蚀电路板用晶圆表面放入NMP溶液中进行脱胶;S1, put the wafer surface for etching circuit board into NMP solution for degumming;
S2、将粗清理后晶圆放置入真空腔中,对真空腔进行抽真空,真空腔中真空度为4pa;S2. Place the wafer after rough cleaning into a vacuum chamber, and evacuate the vacuum chamber, and the vacuum degree in the vacuum chamber is 4pa;
S3、向真空腔内通入氩气,通入氩气速度为500sccm,对石墨电极进行通电,通电电压为500v;S3. Pour argon into the vacuum chamber at a rate of 500sccm, energize the graphite electrode, and energize at a voltage of 500v;
S4、向真空腔中通入氧气,通入氧气的速度为500sccm,清洗时长为1h,完成一次清洗;S4. Pour oxygen into the vacuum chamber at a rate of 500sccm and a cleaning time of 1h to complete one cleaning;
S5、将一次清洗后晶圆放置入真空腔中,真空腔中设置有隔离板,隔离板将真空腔分为惰性气体室与活性气体室,对真空腔进行抽真空,真空腔中真空度为4pa;S5. Place the wafer after one cleaning into a vacuum chamber. The vacuum chamber is provided with an isolation plate. The isolation plate divides the vacuum chamber into an inert gas chamber and an active gas chamber, and evacuates the vacuum chamber. The vacuum degree in the vacuum chamber is 4pa;
S6、向惰性气体室内通入氩气,通入氩气速度为500sccm,向活性气体室中通入氧气,通入氧气的速度为500sccm;S6, feed argon into the inert gas chamber, and the speed of feeding argon is 500 sccm, and feeding oxygen into the active gas chamber, and the speed of feeding oxygen is 500 sccm;
S7、对惰性气体室中与活性气体室中石墨电极分别通电,通电电压为500v;S7, energize the graphite electrodes in the inert gas chamber and the active gas chamber respectively, and the energization voltage is 500v;
S8、将晶圆从惰性气体室转动到活性气体室中,转动速度为0.5r/min,清洗时长为1.5h,完成二次清洗;S8. Rotate the wafer from the inert gas chamber to the active gas chamber, the rotation speed is 0.5r/min, the cleaning time is 1.5h, and the secondary cleaning is completed;
S9、对清洗后晶圆进行刻蚀,刻蚀步骤为用特定形态的树脂体系;采用与电路板的外形以及电路板上布线图形相匹配的模具;将上述树脂体系置于上述模具内;通过所述模具直接浇注或者模压成型电路板的外形以及电路板上布线图形;在所述布线图形上填充导电材料以形成电路板导电图形。S9, the wafer after cleaning is etched, and the etching step is to use a resin system of a specific shape; adopt a mold that matches the shape of the circuit board and the wiring pattern on the circuit board; place the above-mentioned resin system in the above-mentioned mold; The mold directly casts or presses the shape of the circuit board and the wiring pattern on the circuit board; and the wiring pattern is filled with conductive material to form the circuit board conductive pattern.
实施例三:Embodiment three:
在实施例一的基础上,对实施例一电路板生产方法进行进一步优化:On the basis of Embodiment 1, the circuit board production method of Embodiment 1 is further optimized:
一种电路板生产方法,包括以下步骤:A method for producing a circuit board, comprising the following steps:
S1、将刻蚀电路板用晶圆表面放入NMP溶液中进行脱胶;S1, put the wafer surface for etching circuit board into NMP solution for degumming;
S2、将粗清理后晶圆放置入真空腔中,对真空腔进行抽真空,真空腔中真空度为3pa;S2. Put the wafer after rough cleaning into a vacuum chamber, and vacuumize the vacuum chamber, and the vacuum degree in the vacuum chamber is 3pa;
S3、向真空腔内通入氩气,通入氩气速度为2500sccm,对石墨电极进行通电,通电电压为2500v;S3. Pour argon gas into the vacuum chamber at a speed of 2500sccm, and energize the graphite electrode, and the energization voltage is 2500v;
S4、向真空腔中通入氧气,通入氧气的速度为2500sccm,清洗时长为2h,完成一次清洗;S4. Pour oxygen into the vacuum chamber at a rate of 2500sccm and a cleaning time of 2h to complete one cleaning;
S5、将一次清洗后晶圆放置入真空腔中,真空腔中设置有隔离板,隔离板将真空腔分为惰性气体室与活性气体室,对真空腔进行抽真空,真空腔中真空度为3pa;S5. Place the wafer after one cleaning into a vacuum chamber. The vacuum chamber is provided with an isolation plate. The isolation plate divides the vacuum chamber into an inert gas chamber and an active gas chamber, and evacuates the vacuum chamber. The vacuum degree in the vacuum chamber is 3pa;
S6、向惰性气体室内通入氩气,通入氩气速度为2500sccm,向活性气体室中通入氧气,通入氧气的速度为2500sccm;S6, feed argon into the inert gas chamber, the speed of feeding argon is 2500sccm, and feeding oxygen into the active gas chamber, the speed of feeding oxygen is 2500sccm;
S7、对惰性气体室中与活性气体室中石墨电极分别通电,通电电压为3000v;S7, energize the graphite electrodes in the inert gas chamber and the active gas chamber respectively, and the energization voltage is 3000v;
S8、将晶圆从惰性气体室转动到活性气体室中,转动速度为0.4r/min,清洗时长为2h,完成二次清洗;S8. Rotate the wafer from the inert gas chamber to the active gas chamber, the rotation speed is 0.4r/min, the cleaning time is 2h, and the secondary cleaning is completed;
S9、对清洗后晶圆进行刻蚀,刻蚀步骤为用特定形态的树脂体系;采用与电路板的外形以及电路板上布线图形相匹配的模具;将上述树脂体系置于上述模具内;通过所述模具直接浇注或者模压成型电路板的外形以及电路板上布线图形;在所述布线图形上填充导电材料以形成电路板导电图形。S9, the wafer after cleaning is etched, and the etching step is to use a resin system of a specific shape; adopt a mold that matches the shape of the circuit board and the wiring pattern on the circuit board; place the above-mentioned resin system in the above-mentioned mold; The mold directly casts or presses the shape of the circuit board and the wiring pattern on the circuit board; and the wiring pattern is filled with conductive material to form the circuit board conductive pattern.
实施例四:Embodiment 4:
在实施例一的基础上,对实施例一电路板生产方法进行进一步优化:On the basis of Embodiment 1, the circuit board production method of Embodiment 1 is further optimized:
一种电路板生产方法,包括以下步骤:A method for producing a circuit board, comprising the following steps:
S1、将刻蚀电路板用晶圆表面放入NMP溶液中进行脱胶;S1, put the wafer surface for etching circuit board into NMP solution for degumming;
S2、将粗清理后晶圆放置入真空腔中,对真空腔进行抽真空,真空腔中真空度为2pa;S2. Place the wafer after rough cleaning into a vacuum chamber, and evacuate the vacuum chamber, and the vacuum degree in the vacuum chamber is 2pa;
S3、向真空腔内通入氩气,通入氩气速度为5000sccm,对石墨电极进行通电,通电电压为5000v;S3. Pour argon gas into the vacuum chamber at a speed of 5000sccm, and energize the graphite electrode, and the energization voltage is 5000v;
S4、向真空腔中通入氧气,通入氧气的速度为5000sccm,清洗时长为2h,完成一次清洗;S4. Pour oxygen into the vacuum chamber at a rate of 5000sccm and a cleaning time of 2h to complete one cleaning;
S5、将一次清洗后晶圆放置入真空腔中,真空腔中设置有隔离板,隔离板将真空腔分为惰性气体室与活性气体室,对真空腔进行抽真空,真空腔中真空度为2pa;S5. Place the wafer after one cleaning into a vacuum chamber. The vacuum chamber is provided with an isolation plate. The isolation plate divides the vacuum chamber into an inert gas chamber and an active gas chamber, and evacuates the vacuum chamber. The vacuum degree in the vacuum chamber is 2pa;
S6、向惰性气体室内通入氩气,通入氩气速度为5000sccm,向活性气体室中通入氧气,通入氧气的速度为5000sccm;S6, feed argon gas into the inert gas chamber, the speed of feeding argon gas is 5000sccm, and feeding oxygen into the active gas chamber, the speed of feeding oxygen gas is 5000sccm;
S7、对惰性气体室中与活性气体室中石墨电极分别通电,通电电压为5000v;S7, energize the graphite electrodes in the inert gas chamber and the active gas chamber respectively, and the energization voltage is 5000v;
S8、将晶圆从惰性气体室转动到活性气体室中,转动速度为0.2r/min,清洗时长为2h,完成二次清洗;S8, rotate the wafer from the inert gas chamber to the active gas chamber, the rotation speed is 0.2r/min, the cleaning time is 2h, and the secondary cleaning is completed;
S9、对清洗后晶圆进行刻蚀,刻蚀步骤为用特定形态的树脂体系;采用与电路板的外形以及电路板上布线图形相匹配的模具;将上述树脂体系置于上述模具内;通过所述模具直接浇注或者模压成型电路板的外形以及电路板上布线图形;在所述布线图形上填充导电材料以形成电路板导电图形。S9, the wafer after cleaning is etched, and the etching step is to use a resin system of a specific shape; adopt a mold that matches the shape of the circuit board and the wiring pattern on the circuit board; place the above-mentioned resin system in the above-mentioned mold; The mold directly casts or presses the shape of the circuit board and the wiring pattern on the circuit board; and the wiring pattern is filled with conductive material to form the circuit board conductive pattern.
所述隔离板4将真空腔分为惰性气体室与活性气体室,所述柔性接头5对转动架与所述隔离板4处进行密封,将被清洗零件放置在所述转动架6上,所述真空泵组3先对所述主机体1的所述腔体2进行抽真空,使所述腔体2为真空腔体2;所述真空度检测器10对所述腔体2内部真空度进行检测,可以根据零件不同在不同真空度下进行清洗,随之将所述石墨电极7与高压电源11电连接,使所述腔体2内形成一个交变电场,接着,通过所述惰性气体箱8与所述活性气体箱12向所述腔体2内通入惰性气体与活性气体,所述电磁阀9控制惰性气体与活性气体的通气速度,所述隔离板4将所述腔体2隔离,使所述隔离板4两侧分别处于惰性气体氛围与活性气体氛围,在惰性气体氛围中,惰性气体可以为氦气、氖气、氩气等,可根据生产需求进行选择,石墨电极在电场的作用下发射出大量电子飞向接地阳极,并与真空中的氩气、氧气发生碰撞发生电离产生等离子体,等离子体对电路板表面的残留物进行轰击清洗,对于强力残留于电路板表面的污染物,利用等离子轰击清洗电路板表面,离子轰击清洗为绿色无损伤清洗,并且由于等离子体积小于水分子,其可以深入到电路板微细孔眼和内部完成清洗,提高了清洗效果;在活性气体氛围内,正离子加速撞向石墨电极后产生溅射反应,并且石墨电极与活性气体发生氧化反应,溅射出来的物质与真空中的氧气、氧离子反应生成氧化合物后轰击电路板表面,部分氧气被高压电离生成臭氧,生成的臭氧与电路板表面的残留物发生强氧化反应,在电路板表面生成氧化产物,氧化产物受到等离子体的轰击与电路板表面脱离,从而到达辅助清洗的目的,而负离子加速撞向电路板和没有完成氧化的C、CC发生反应,反应所生成的CO2、CO轰击清洗电路板表面,以上所有物质最后都以气体或电子的形式存在,所以电路板上无残留或极少残留,从而达到清洗的目的;The
将树脂体系进行物理混合,混合均匀后升温进行半固化,半固化至一定程度后保持树脂体系的熔融状态,添加有序的增强材料,将增强材料有序的悬空挂设在独立式模具内对独立式模具与树脂体系接触的一面涂抹脱模剂将呈熔融状态的树脂体系浇注到与清洗后的晶圆的外形以及电路板上布线图形相匹配的独立式模具内,使熔融状态的树脂体系溶液与增强材料的混合物在独立式模具内通过热固化方式固化完全,加热温度在120℃~150℃将固化完全的树脂体系与独立式模具分离,此时树脂体系的外形符合电路板所需要的外形以及树脂体系的表面形成有布线图形,将晶圆表面的脱模剂清除掉,在通过独立式模具直接成型的布线图形上填充导电材料以形成电路板布线图形。The resin system is physically mixed, and after mixing evenly, the temperature is raised for semi-curing. After semi-curing to a certain extent, the molten state of the resin system is maintained, and orderly reinforcing materials are added. The side of the free-standing mold that is in contact with the resin system is coated with a release agent, and the molten resin system is poured into a free-standing mold that matches the shape of the cleaned wafer and the wiring pattern on the circuit board, so that the molten resin system The mixture of solution and reinforcing material is completely cured by thermal curing in the independent mold, and the heating temperature is between 120°C and 150°C to separate the fully cured resin system from the independent mold. At this time, the shape of the resin system meets the requirements of the circuit board. The outer shape and the surface of the resin system are formed with wiring patterns, the mold release agent on the wafer surface is removed, and conductive materials are filled on the wiring patterns directly formed by the independent mold to form the circuit board wiring patterns.
测试实施例1-4中清洗后电路板的表面达因值与膜层氧化率结果如表1所示:The results of the surface dyne value and film oxidation rate of the circuit board after cleaning in Test Example 1-4 are shown in Table 1:
表1Table 1
电路板采用本实施例的清洗方法处理后的表面清洁度达因值可达60,膜层氧化率可达到99.9%,有效提升了对电路板表面清理的效果。After the circuit board is treated by the cleaning method of this embodiment, the dyne value of the surface cleanliness can reach 60, and the oxidation rate of the film layer can reach 99.9%, which effectively improves the effect of cleaning the surface of the circuit board.
虽然本发明披露如上,但本发明并非限定于此。任何本领域技术人员,在不脱离本发明的精神和范围内,均可作各种更动与修改,因此本发明的保护范围应当以权利要求所限定的范围为准。Although the present invention is disclosed above, the present invention is not limited thereto. Any person skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention should be based on the scope defined by the claims.
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