CN115012039A - 一种通过氢化物气相外延法制备高质量单晶GaN的方法 - Google Patents
一种通过氢化物气相外延法制备高质量单晶GaN的方法 Download PDFInfo
- Publication number
- CN115012039A CN115012039A CN202210689600.8A CN202210689600A CN115012039A CN 115012039 A CN115012039 A CN 115012039A CN 202210689600 A CN202210689600 A CN 202210689600A CN 115012039 A CN115012039 A CN 115012039A
- Authority
- CN
- China
- Prior art keywords
- gan
- reaction kettle
- quality
- single crystal
- substrate material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims abstract description 51
- 238000002248 hydride vapour-phase epitaxy Methods 0.000 title claims abstract description 10
- 238000006243 chemical reaction Methods 0.000 claims abstract description 38
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 claims abstract description 30
- 239000013078 crystal Substances 0.000 claims abstract description 29
- 239000000463 material Substances 0.000 claims abstract description 27
- UPWPDUACHOATKO-UHFFFAOYSA-K gallium trichloride Chemical compound Cl[Ga](Cl)Cl UPWPDUACHOATKO-UHFFFAOYSA-K 0.000 claims abstract description 23
- 239000000758 substrate Substances 0.000 claims abstract description 22
- 238000001816 cooling Methods 0.000 claims abstract description 12
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims abstract description 10
- 230000015572 biosynthetic process Effects 0.000 claims abstract description 10
- 229910052733 gallium Inorganic materials 0.000 claims abstract description 10
- 238000003786 synthesis reaction Methods 0.000 claims abstract description 10
- 238000010438 heat treatment Methods 0.000 claims abstract description 9
- 229910052751 metal Inorganic materials 0.000 claims abstract description 6
- 239000002184 metal Substances 0.000 claims abstract description 6
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 claims abstract description 5
- IXCSERBJSXMMFS-UHFFFAOYSA-N hydrogen chloride Substances Cl.Cl IXCSERBJSXMMFS-UHFFFAOYSA-N 0.000 claims abstract description 5
- 229910000041 hydrogen chloride Inorganic materials 0.000 claims abstract description 5
- 238000007789 sealing Methods 0.000 claims abstract description 5
- 238000005406 washing Methods 0.000 claims description 8
- 239000012535 impurity Substances 0.000 claims description 6
- 229910052594 sapphire Inorganic materials 0.000 claims description 6
- 239000010980 sapphire Substances 0.000 claims description 6
- 238000004140 cleaning Methods 0.000 claims description 4
- 238000003837 high-temperature calcination Methods 0.000 claims description 2
- 230000007547 defect Effects 0.000 abstract description 7
- 238000002360 preparation method Methods 0.000 abstract description 7
- 238000005265 energy consumption Methods 0.000 abstract description 4
- 230000027756 respiratory electron transport chain Effects 0.000 abstract description 4
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 12
- 239000010408 film Substances 0.000 description 10
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 6
- PXIPVTKHYLBLMZ-UHFFFAOYSA-N Sodium azide Chemical compound [Na+].[N-]=[N+]=[N-] PXIPVTKHYLBLMZ-UHFFFAOYSA-N 0.000 description 6
- 229910052757 nitrogen Inorganic materials 0.000 description 6
- 239000002994 raw material Substances 0.000 description 5
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 229910000069 nitrogen hydride Inorganic materials 0.000 description 4
- 238000001451 molecular beam epitaxy Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 2
- 229910005267 GaCl3 Inorganic materials 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 238000011031 large-scale manufacturing process Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- IDBFBDSKYCUNPW-UHFFFAOYSA-N lithium nitride Chemical compound [Li]N([Li])[Li] IDBFBDSKYCUNPW-UHFFFAOYSA-N 0.000 description 2
- 238000002156 mixing Methods 0.000 description 2
- 150000002902 organometallic compounds Chemical class 0.000 description 2
- 230000035484 reaction time Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000012808 vapor phase Substances 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 239000000084 colloidal system Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000000407 epitaxy Methods 0.000 description 1
- 239000012943 hotmelt Substances 0.000 description 1
- 150000004678 hydrides Chemical class 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002105 nanoparticle Substances 0.000 description 1
- 239000011858 nanopowder Substances 0.000 description 1
- 239000002073 nanorod Substances 0.000 description 1
- 239000002070 nanowire Substances 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 238000002203 pretreatment Methods 0.000 description 1
- 238000000197 pyrolysis Methods 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
- 238000003980 solgel method Methods 0.000 description 1
- 238000004729 solvothermal method Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000001308 synthesis method Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 231100000331 toxic Toxicity 0.000 description 1
- 230000002588 toxic effect Effects 0.000 description 1
- 231100000419 toxicity Toxicity 0.000 description 1
- 230000001988 toxicity Effects 0.000 description 1
- 238000011282 treatment Methods 0.000 description 1
- XCZXGTMEAKBVPV-UHFFFAOYSA-N trimethylgallium Chemical compound C[Ga](C)C XCZXGTMEAKBVPV-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
- C30B29/406—Gallium nitride
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/10—Heating of the reaction chamber or the substrate
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/14—Feed and outlet means for the gases; Modifying the flow of the reactive gases
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B33/00—After-treatment of single crystals or homogeneous polycrystalline material with defined structure
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
Claims (7)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202210689600.8A CN115012039A (zh) | 2022-06-16 | 2022-06-16 | 一种通过氢化物气相外延法制备高质量单晶GaN的方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202210689600.8A CN115012039A (zh) | 2022-06-16 | 2022-06-16 | 一种通过氢化物气相外延法制备高质量单晶GaN的方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN115012039A true CN115012039A (zh) | 2022-09-06 |
Family
ID=83075242
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202210689600.8A Pending CN115012039A (zh) | 2022-06-16 | 2022-06-16 | 一种通过氢化物气相外延法制备高质量单晶GaN的方法 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN115012039A (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115995380A (zh) * | 2023-03-22 | 2023-04-21 | 雅安宇焜芯材材料科技有限公司 | 一种制造半导体的系统 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002161000A (ja) * | 2000-11-22 | 2002-06-04 | Otts:Kk | 窒化ガリウム単結晶の製造方法 |
US20040074437A1 (en) * | 2002-10-16 | 2004-04-22 | Fang Yean Kuen | Method of growing single crystal Gallium Nitride on silicon substrate |
CN1865192A (zh) * | 2005-05-16 | 2006-11-22 | 中国科学院合肥物质科学研究院 | 氮化镓薄膜材料的制备方法 |
US20110012109A1 (en) * | 2009-07-17 | 2011-01-20 | Applied Materials, Inc. | Method of forming a group iii-nitride crystalline film on a patterned substrate by hydride vapor phase epitaxy (hvpe) |
CN109023516A (zh) * | 2018-09-03 | 2018-12-18 | 南京大学 | 制备自支撑GaN衬底的自分离方法 |
US20190091807A1 (en) * | 2017-09-26 | 2019-03-28 | Sixpoint Materials, Inc. | Seed crystal for growth of gallium nitride bulk crystal in supercritical ammonia and fabrication method |
-
2022
- 2022-06-16 CN CN202210689600.8A patent/CN115012039A/zh active Pending
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002161000A (ja) * | 2000-11-22 | 2002-06-04 | Otts:Kk | 窒化ガリウム単結晶の製造方法 |
US20040074437A1 (en) * | 2002-10-16 | 2004-04-22 | Fang Yean Kuen | Method of growing single crystal Gallium Nitride on silicon substrate |
CN1865192A (zh) * | 2005-05-16 | 2006-11-22 | 中国科学院合肥物质科学研究院 | 氮化镓薄膜材料的制备方法 |
US20110012109A1 (en) * | 2009-07-17 | 2011-01-20 | Applied Materials, Inc. | Method of forming a group iii-nitride crystalline film on a patterned substrate by hydride vapor phase epitaxy (hvpe) |
US20190091807A1 (en) * | 2017-09-26 | 2019-03-28 | Sixpoint Materials, Inc. | Seed crystal for growth of gallium nitride bulk crystal in supercritical ammonia and fabrication method |
CN109023516A (zh) * | 2018-09-03 | 2018-12-18 | 南京大学 | 制备自支撑GaN衬底的自分离方法 |
Non-Patent Citations (2)
Title |
---|
周明斌: "GaN体单晶生长研究进展", 中国照明电器, no. 9, pages 7 - 14 * |
田媛: "hvpe生长自支撑GaN单晶及其性质研究", 中国博士学位论文全文数据库信息科技辑, no. 3, pages 135 - 22 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115995380A (zh) * | 2023-03-22 | 2023-04-21 | 雅安宇焜芯材材料科技有限公司 | 一种制造半导体的系统 |
CN115995380B (zh) * | 2023-03-22 | 2023-06-20 | 雅安宇焜芯材材料科技有限公司 | 一种制造半导体的系统 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Fukuda et al. | Prospects for the ammonothermal growth of large GaN crystal | |
CN109056058A (zh) | 一种制备GaN衬底材料的方法 | |
JP7412808B2 (ja) | ScAlMgO4基板に基づく窒化ガリウム単結晶及びその製造方法 | |
US8852341B2 (en) | Methods for producing GaN nutrient for ammonothermal growth | |
CN110195217A (zh) | 一种制备β-Ga2O3薄膜方法 | |
KR100322374B1 (ko) | 질화물결정의제조방법,혼합물,액상성장방법,질화물결정,질화물결정분말및기상성장방법 | |
CN112647130B (zh) | 一种低压化学气相沉积生长氧化镓薄膜的方法 | |
CN110144624B (zh) | 一种硒锗镓钡多晶的合成方法和硒锗镓钡单晶的生长方法 | |
CN115012039A (zh) | 一种通过氢化物气相外延法制备高质量单晶GaN的方法 | |
US20130340672A1 (en) | Using boron-containing compounds, gasses and fluids during ammonothermal growth of group-iii nitride crystals | |
US8728233B2 (en) | Method for the production of group III nitride bulk crystals or crystal layers from fused metals | |
Wang et al. | AlN thin films grown on different substrates by metal nitride vapor phase epitaxy | |
CN102534798A (zh) | 一种高温高压晶体生长设备 | |
Boćkowski et al. | Recent progress in crystal growth of bulk GaN | |
CN113186590A (zh) | 一种厘米级三氧化钼单晶的制备方法 | |
TW202323576A (zh) | 異質磊晶晶圓的製造方法 | |
CN113322522B (zh) | 一种外延大单畴大面积单层二硫化钨薄膜的制备方法 | |
US20110300051A1 (en) | Group-iii nitride monocrystal with improved purity and method of producing the same | |
CN112259446A (zh) | 高效制备氮化镓衬底的方法 | |
CN114717535B (zh) | 一种在硅衬底上制备纤锌矿InGaN纳米棒的方法 | |
Gao et al. | Research on the Key Problems in the Industrialization of SiC Substrate Materials | |
CN107628637A (zh) | 一种制备iii族氧化物及氮化物纳米柱的方法 | |
KR100975835B1 (ko) | 인듐을 이용한 저온에서의 나노 구조체 제조방법 | |
CN115198358B (zh) | 一种大尺寸hpht金刚石单晶片同质外延生长方法 | |
Wang | Current methods for GaN synthesis and the limitations |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20230719 Address after: Room 221, 2nd Floor, Block B, Building 5, No. 200 Tianfu Fifth Street, Chengdu High tech Zone, China (Sichuan) Pilot Free Trade Zone, Chengdu, Sichuan 610000 Applicant after: Guojia Xinke (Chengdu) Semiconductor Technology Co.,Ltd. Address before: 2706, block B, olive PENGYUAN, 3030 CaiTian Road, Xintian community, Huafu street, Futian District, Shenzhen, Guangdong 518000 Applicant before: Guogaxinke (Shenzhen) semiconductor technology Co.,Ltd. |
|
WD01 | Invention patent application deemed withdrawn after publication | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20220906 |