CN114777929A - Ground test temperature measurement method based on trajectory in airplane ground heat intensity test - Google Patents

Ground test temperature measurement method based on trajectory in airplane ground heat intensity test Download PDF

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CN114777929A
CN114777929A CN202210686338.1A CN202210686338A CN114777929A CN 114777929 A CN114777929 A CN 114777929A CN 202210686338 A CN202210686338 A CN 202210686338A CN 114777929 A CN114777929 A CN 114777929A
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CN114777929B (en
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柴葳
王彬文
秦强
郝庆瑞
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AVIC Aircraft Strength Research Institute
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Abstract

The invention discloses a ground test temperature measurement method based on trajectory in an airplane ground heat intensity test, which relates to the technical field of airplane test and comprises the following steps: s1, selecting an infrared point temperature instrument; s2, installing an infrared point temperature instrument; s3, temperature calibration; s4, determining an exchange temperature point; and S5, determining a final measured value. The ground test temperature measurement method can realize the measurement of the flight trajectory of the airplane from the normal temperature condition of 20-30 ℃ to the high temperature condition of more than 2000 ℃ by the infrared point thermometer, expands the application of the infrared point thermometer in the ground heat intensity, greatly improves the temperature measurement accuracy, and can be popularized to the non-contact measurement fields of metal smelting, nuclear industry, aerospace and the like.

Description

Ground test temperature measurement method based on trajectory in airplane ground heat intensity test
Technical Field
The invention relates to the technical field of airplane testing, in particular to a ground test temperature measuring method based on a trajectory in an airplane ground heat intensity test.
Background
The aerodynamic heating condition of the airplane structure test piece is simulated according to the trajectory in the airplane ground heat intensity test, the temperature response of the airplane structure test piece is accurately measured in real time in the whole process, the coverage of the temperature measurement range is very wide, and the temperature measurement range is usually related to the normal temperature condition of 20-30 ℃ to the high temperature condition of more than 2000 ℃. However, the temperature sensors commonly used in all the fields cannot meet the temperature requirement, so that a new temperature measurement method needs to be developed.
The infrared point temperature instrument is a commonly used temperature measuring element in an airplane ground heat intensity test, and the temperature measuring principle is as follows: assuming that the target is a black body, the radiation output generated by the black body is M0And the sensor part of the infrared point thermometer receives the radiation energy of the target, and the radiation temperature of the black body under the theory can be calculated through Planck's law. However, in practice blackbodies are not present, and targets have emissivity defined as: the method comprises the steps of receiving radiant energy emitted by the surface of an object under a certain temperature condition, and obtaining the ratio of the spectral energy density to the spectral energy density of a black body under the same temperature. Due to the existence of emissivity and the limitation of an infrared thermometer, the problem of inaccurate temperature measurement of a certain temperature section in the process of simulating temperature measurement of the flight trajectory of an airplane or other aircrafts is caused.
Disclosure of Invention
In order to solve the existing problems, the invention provides a ballistic ground test temperature measurement method in an aircraft ground heat intensity test.
The technical scheme of the invention is as follows:
the ground test temperature measurement method based on the trajectory in the airplane ground heat intensity test comprises the following steps:
s1, selecting an infrared point temperature instrument: two infrared point thermometers are selected to be respectively used as a low-temperature-section infrared point thermometer and a high-temperature-section infrared point thermometer, and the temperature measuring range of the low-temperature-section infrared point thermometers is T1~T1', the temperature measuring range of the high-temperature section infrared point temperature instrument is T2~T2', wherein, T1＜T2＜T1′＜T2′；
S2, installing an infrared point temperature instrument: the low-temperature section infrared point thermometer and the high-temperature section infrared point thermometer are simultaneously aligned to the same temperature measuring point of a piece to be tested, the low-temperature section infrared point thermometer and the high-temperature section infrared point thermometer are arranged at a symmetrical included angle theta with a normal line passing through a temperature measuring point plane, the distance between the temperature measuring point and the low-temperature section infrared point thermometer and the high-temperature section infrared point thermometer is D, the diameter length of the measuring range of the low-temperature section infrared point thermometer and the high-temperature section infrared point thermometer on a projection plane of the position of the piece to be tested is S, the distance coefficient of the distance D from the low-temperature section infrared point thermometer and the high-temperature section infrared point thermometer to the temperature measuring point is K, K = D/S, and the positions of the low-temperature section infrared point thermometer and the high-temperature section infrared point thermometer are determined according to the distance coefficient K;
s3, temperature calibration: selecting n temperature points t according to the temperature ranges to be measured by the low-temperature section infrared point temperature instrument and the high-temperature section infrared point temperature instrumentnTemperature calibration is carried out, and the size relation of each temperature point during temperature calibration is as follows:
T1<t1<…tj<T2<tj+1<…<tj+m<T1′<tj+m+1<…<tn<T2′；
wherein j is more than 1, m is more than 1, j is more than n, and m is more than n;
s4, determining exchange temperature points: at T according to the temperature point selected in step S32~T1Finding the temperature point with the same measured value as the low-temperature segment infrared point thermometer and the high-temperature segment infrared point thermometer, and recording as TSwitchingAnd simultaneously calculating emissivity epsilon of the piece to be tested at each temperature point according to the temperature points selected in the step S3λ；
S5, final measurement value determination: when the measured values of the low-temperature section infrared point temperature instrument and the high-temperature section infrared point temperature instrument are both lower than TSwitchingMeanwhile, the final measured value is based on the measured value of the low-temperature infrared point thermometer, and the radiation emittance M generated by the piece to be tested is calculated simultaneously0When the measured values of the low-temperature-section infrared point temperature instrument and the high-temperature-section infrared point temperature instrument are both higher than TSwitchingMeanwhile, the final measured value is based on the measured value of the high-temperature infrared point temperature instrument, and the radiation emittance M generated by the piece to be tested is calculated simultaneously0。
Further, in the step S1, the temperature measurement wavelength of the low-temperature infrared thermometer is 8 to 14 μm, and the temperature measurement wavelength of the high-temperature infrared thermometer is 5 μm. The temperature measurement of the low-temperature section and the high-temperature section is controlled by controlling infrared point temperature meters with different wavelengths.
Further, in the step S2, the included angle θ is 5 to 15 °. The temperature of the same temperature point can be more accurately measured by controlling the angle positions of the two infrared point thermometers.
Further, when the positions of the low temperature section infrared point thermometer and the high temperature section infrared point thermometer are determined according to the distance coefficient K in step S2, in order to prevent the influence of the radiation of the heater on the measurement, the test piece to be tested is placed on one side of the heating surface of the heater composed of two heating elements arranged side by side, the low temperature section infrared point thermometer and the high temperature section infrared point thermometer are placed on one side of the non-heating surface of the heater composed of two heating elements arranged side by side, the sensing signal directions of the low temperature section infrared point thermometer and the high temperature section infrared point thermometer pass through the gap between the two heating elements, the gap distance between the two heating elements is M, the vertical distance between the test piece to be tested and the heater is L, and the vertical distances between the low temperature section infrared point thermometer and the high temperature section infrared point thermometer and the heater are both DHeating deviceThe diameter length of the projection surface of the low-temperature section infrared point thermometer and the high-temperature section infrared point thermometer in the position of the gap between the two heating elements arranged side by side in the measurement range is SHeating apparatusThen S isHeating deviceShould satisfy SHeating deviceM < S < L, and DHeating device<KM is used. The temperature of the piece to be tested can be measured more accurately by controlling the distance positions of the two infrared point temperature meters, and the interference of the heater is avoided.
Further, the emissivity of the piece to be tested in the step S4 is epsilonλDefined as the radiant energy emitted by the surface of the test piece under the temperature condition of a certain temperature point, the emissivity epsilon of the test pieceλThe formula of (c) is shown as follows:
Figure DEST_PATH_IMAGE002
in the formula, eλIs the spectral energy density of the test piece to be tested at the temperature point, ehλIs the spectral energy density of the black body at that temperature point.
Further, the radiation emittance M generated by the test piece to be tested in the step S50The formula (c) is shown as follows:
Figure DEST_PATH_IMAGE004
in the formula, C1Is the first radiation constant, and has a value of 3.7418 × 10-8W∙m；C2Is the second radiation constant, and has a value of 1.4388 × 10-2m ∙ K; λ is the wavelength; t is the measured value of the infrared point temperature instrument;
Figure DEST_PATH_IMAGE006
the emissivity of the corrected piece to be tested is changed along with the temperature.
Further, the emissivity ε of the test pieceλThe correction method comprises the following steps: setting a temperature sensor comparison test, firstly, according to j + m temperature points preset in step S3, starting from t1To tj+mComparing the thermocouple temperature measurement results in the low-temperature infrared point thermometer and the temperature sensor one by one, and correcting the emissivity epsilon of the piece to be tested under the low-temperature condition through the temperature sensorλObtaining the corrected emissivity of the piece to be tested under the low-temperature condition
Figure 521603DEST_PATH_IMAGE006
(ii) a Then according to n-j-1 temperature points preset in step S3 from tj+1To tnComparing the thermocouple temperature measurement results in the high-temperature infrared point thermometer and the temperature sensor one by one, and correcting the emissivity epsilon of the piece to be tested under the high-temperature condition through the temperature sensorλObtaining the corrected emissivity of the test piece under the high-temperature condition
Figure 173164DEST_PATH_IMAGE006
. The corrected emissivity can be closer to the real test condition by setting a temperature sensor contrast test, and the test error is further reduced.
The beneficial effects of the invention are:
(1) the ground test temperature measurement method can realize the measurement of the infrared point thermometer on the high temperature condition that the flight trajectory of the airplane is from the normal temperature condition of 20-30 ℃ to more than 2000 ℃, expand the application of the infrared point thermometer in the ground heat intensity, greatly improve the temperature measurement accuracy, and can be popularized to the non-contact measurement fields of metal smelting, nuclear industry, aerospace and the like;
(2) according to the ground test temperature measurement method, two infrared point thermometers with different temperature wave bands are adopted at the same time, and an algorithm is coordinated, so that the mounting position of the infrared point thermometers is optimized, and the whole-process real-time temperature response of the structure and the material of the airplane structure test piece is realized when the aerodynamic heat of the airplane flight trajectory is simulated to act on the airplane structure test piece in the airplane ground heat intensity test;
(3) the ground test temperature measurement method further improves the temperature measurement precision of the infrared point temperature instrument by optimizing the emissivity, and can calculate the radiation emittance of the airplane structure test piece.
Drawings
FIG. 1 is a flow chart of a method for measuring temperature in a ground test according to the present invention;
FIG. 2 is a schematic diagram of the arrangement structure of the components of the temperature measuring method of the ground test of the invention;
FIG. 3 is a side view of the arrangement structure of the components of the temperature measuring method for the ground test of the invention;
FIG. 4 is a top view of the arrangement structure of the components and a schematic position diagram of an infrared thermometer in the ground test temperature measurement method.
Wherein, 1-low temperature section infrared point temperature instrument, 2-high temperature section infrared point temperature instrument, 3-test piece, 4-heating element.
Detailed Description
Example 1
The ground test temperature measuring method based on the trajectory in the airplane ground heat intensity test comprises the following steps:
s1, selecting an infrared point temperature instrument: two infrared point thermometers are selected as a low-temperature-section infrared point thermometer 1 and a high-temperature-section infrared point thermometer 2 respectively, the temperature measurement wavelength of the low-temperature-section infrared point thermometer 1 is 12 micrometers, the temperature measurement wavelength of the high-temperature-section infrared point thermometer 2 is 5 micrometers, and the temperature measurement range of the low-temperature-section infrared point thermometer 1 is T1~T1', the temperature measuring range of the high-temperature section infrared point temperature instrument 2 is T2~T2', wherein, T1＜T2＜T1′＜T2′；
S2, installing an infrared point temperature instrument: the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 are simultaneously aligned to the same temperature measuring point of a to-be-tested piece 3, the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 are arranged at a symmetrical included angle theta with a normal line passing through a temperature measuring point plane, the included angle theta is 10 degrees, the distance between the temperature measuring point and the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 is D, the diameter length of a projection plane of the measuring range of the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 at the position of the to-be-tested piece 3 is S, the distance coefficient of the distance D from the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 to the temperature measuring point is K, K = D/S, and the positions of the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point 2 are determined according to the distance coefficient K;
when determining the positions of the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 according to the distance coefficient K, in order to prevent the influence of the radiation of the heater on the measurement, the to-be-tested part 3 is placed on one side of the heating surface of the heater consisting of the two heating elements 4 arranged side by side, the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 are placed on one side of the non-heating surface of the heater consisting of the two heating elements 4 arranged side by side, the induction signal directions of the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 pass through the gap between the two heating elements 4, the gap distance between the two heating elements 4 is M, the vertical distance between the to-be-tested part 3 and the heater is L, and the vertical distances between the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point 2 and the heater are DHeating apparatusThe measurement ranges of the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 are put at the position of the gap of two heating elements 4 arranged side by sideThe diameter length of the shadow surface is SHeating apparatusThen S isHeating apparatusShould satisfy SHeating apparatusM < S < L, and DHeating apparatus<KM；
S3, temperature calibration: according to the temperature range to be measured of the low-temperature section infrared point temperature instrument 1 and the high-temperature section infrared point temperature instrument 2, n temperature points t are selectednTemperature calibration is carried out, and the size relation of each temperature point during temperature calibration is as follows:
T1<t1<…tj<T2<tj+1<…<tj+m<T1′<tj+m+1<…<tn<T2′；
wherein j is more than 1, m is more than 1, j is more than n, and m is more than n;
s4, determining an exchange temperature point: at T, according to the temperature point selected in step S32~T1The temperature point with the same measured value of the low-temperature segment infrared point thermometer 1 and the high-temperature segment infrared point thermometer 2 is found between the two temperature points and is recorded as TSwitchingWhile calculating the emissivity epsilon of the test piece 3 at each temperature point from the temperature points selected in step S3λ；
The emissivity of the test piece 3 to be tested is epsilonλDefined as the radiant energy emitted from the surface of the test piece 3 under the temperature condition of a certain temperature point, the emissivity epsilon of the test piece 3λThe formula of (c) is shown as follows:
Figure DEST_PATH_IMAGE002A
in the formula, eλIs the spectral energy density, e, of the test piece 3 to be tested at this temperature pointhλIs the spectral energy density of the black body at that temperature point;
s5, final measurement value determination: when the measured values of the low-temperature section infrared point temperature instrument 1 and the high-temperature section infrared point temperature instrument 2 are both lower than TSwitchingThen, the final measured value is based on the measured value of the low-temperature infrared point temperature instrument 1, and the radiation emittance M generated by the piece to be tested 3 is calculated0When the measured values of the low-temperature-section infrared point temperature instrument 1 and the high-temperature-section infrared point temperature instrument 2 are both higher than TSwitchingThen, the final measurement value is based on the measurement value of the high-temperature infrared thermometer 2, and the emittance M generated by the piece 3 to be tested is calculated0；
The emittance M of the radiation generated by the piece 3 to be tested0The formula (c) is shown as follows:
Figure DEST_PATH_IMAGE004A
in the formula, C1Is the first radiation constant, and has a value of 3.7418 × 10-8W∙m；C2Is the second radiation constant, and has a value of 1.4388 × 10-2m ∙ K; λ is the wavelength; t is the measured value of the infrared point temperature instrument;
Figure 421743DEST_PATH_IMAGE006
the emissivity of the corrected tested piece 3 changes along with the temperature;
emissivity epsilon of test piece 3λThe correction method comprises the following steps: setting a temperature sensor comparison test, firstly, according to j + m temperature points preset in step S3, starting from t1To tj+mComparing the temperature measuring results of the thermocouples in the low-temperature infrared thermometer 1 and the temperature sensor one by one, and correcting the emissivity epsilon of the to-be-tested piece 3 under the low-temperature condition through the temperature sensorλObtaining the corrected emissivity of the test piece 3 under the low temperature condition
Figure 816952DEST_PATH_IMAGE006
(ii) a Then according to n-j-1 temperature points preset in the step S3 from tj+1To tnComparing the temperature measuring results of the thermocouples in the high-temperature infrared point thermometer 2 and the temperature sensor one by one, and correcting the emissivity epsilon of the to-be-tested piece 3 under the high-temperature condition through the temperature sensorλObtaining the corrected emissivity of the piece to be tested 3 under the high-temperature condition
Figure 284187DEST_PATH_IMAGE006
。
Example 2
The present embodiment is different from embodiment 1 in that: in step S1, the wavelengths of the low-temperature-range infrared thermometer 1 are different.
The temperature measuring wavelength of the low-temperature-section infrared thermometer 1 is 8 μm.
Example 3
The present embodiment is different from embodiment 1 in that: in step S1, the wavelength of the low temperature section infrared thermometer 1 is different.
The temperature measuring wavelength of the low-temperature-section infrared thermometer 1 is 14 μm.
Example 4
The present embodiment is different from embodiment 1 in that: in step S2, the angle θ is different.
The included angle theta is 5 deg..
Example 4
The present embodiment is different from embodiment 1 in that: in step S2, angle θ is different.
The included angle theta is 15 deg..
Examples of the experiments
The parameters of the ground test temperature measurement method in the embodiment 1 are used for carrying out the field simulation experiment of the airplane ground heat intensity test, and the specific process is shown in figure 1:
s1, selecting an infrared point temperature instrument: selecting two infrared point thermometers as a low-temperature-section infrared point thermometer 1 and a high-temperature-section infrared point thermometer 2 respectively, wherein the temperature measuring wavelength of the low-temperature-section infrared point thermometer 1 is 12 micrometers, the temperature measuring wavelength of the high-temperature-section infrared point thermometer 2 is 5 micrometers, the temperature measuring range of the low-temperature-section infrared point thermometer 1 is-40-800 ℃, and the temperature measuring range of the high-temperature-section infrared point thermometer 2 is 400-2250 ℃;
s2, installing an infrared point temperature instrument: as shown in the figure 2-4, the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 are simultaneously aligned to the same temperature measuring point of the tested piece 3, the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 are arranged at a symmetrical included angle theta with a normal line passing through a temperature measuring point plane, the included angle theta is 10 degrees, the distance D between the temperature measuring point and the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 is 420mm, the diameter length S of a projection plane of the infrared point thermometer at the position of the tested piece 3 is 6mm, the distance coefficient K between the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 and the temperature measuring point is 70, and the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 are determined according to the distance coefficient KWhen the position of the infrared point temperature instrument 2, in order to prevent the influence of the radiation of the heater on the measurement, the to-be-tested piece 3 is placed on one side of the heating surface of the heater consisting of the two heating elements 4 arranged side by side, the low-temperature-section infrared point temperature instrument 1 and the high-temperature-section infrared point temperature instrument 2 are placed on one side of the non-heating surface of the heater consisting of the two heating elements 4 arranged side by side, the induction signal direction of the low-temperature-section infrared point temperature instrument 1 and the high-temperature-section infrared point temperature instrument 2 passes through the gap between the two heating elements 4, the gap distance M between the two heating elements 4 is 5mm, the vertical distance L between the to-be-tested piece 3 and the heater is 80mm, and the vertical distance D between the low-temperature-section infrared point temperature instrument 1 and the high-temperature-section infrared point temperature instrument 2 and the heater isHeating deviceIs 340mm, the diameter length S of the projection surface of the measurement range of the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 at the position of the gap of the two heating elements 4 arranged side by sideHeating deviceIs 4mm, then SHeating apparatusSatisfies SHeating apparatusM < S < L, while satisfying DHeating apparatus<KM; the infrared point thermometer is a commercially available aviation industry infrared single-point thermometer, and the heating element is a commercially available graphite heating element;
s3, temperature calibration: according to the temperature ranges to be measured by the low-temperature-stage infrared thermometer 1 and the high-temperature-stage infrared thermometer 2, as shown in table 1, 12 temperature points t are selected12Temperature calibration is carried out, and the size relation of each temperature point during temperature calibration is as follows:
T1<t1<…t4<T2<t5<…t8<T1′<t9<…<t12<T2′；
s4, determining exchange temperature points: at T, according to the temperature point selected in step S32~T1Finding the temperature point with the same measured value between the low-temperature segment infrared point thermometer 1 and the high-temperature segment infrared point thermometer 2, and recording as TSwitchingIs T6Simultaneously, the emissivity epsilon of the test piece 3 at each temperature point is calculated according to the temperature points selected in the step S3λ；
The emissivity of the test piece 3 is epsilonλDefined as being measured at a temperature at a certain temperature pointRadiant energy emitted from the surface of the test piece 3, emissivity epsilon of the test piece 3 to be testedλThe formula of (c) is shown as follows:
Figure DEST_PATH_IMAGE002AA
in the formula, eλIs the spectral energy density, e, of the test piece 3 to be tested at that temperature pointhλIs the spectral energy density of the black body at that temperature point;
s5, final measurement value determination: when the measured values of the low-temperature-section infrared point temperature instrument 1 and the high-temperature-section infrared point temperature instrument 2 are lower than TSwitchingThen, the final measured value is based on the measured value of the low-temperature infrared point temperature instrument 1, and the radiation emittance M generated by the piece to be tested 3 is calculated0When the measured values of the low-temperature-section infrared point temperature instrument 1 and the high-temperature-section infrared point temperature instrument 2 are higher than TSwitchingThen, the final measured value is based on the measured value of the high-temperature infrared point temperature instrument 2, and the radiation emittance M generated by the piece to be tested 3 is calculated0；
The emittance M of the radiation generated by the test piece 3 to be tested0The formula of (c) is shown as follows:
Figure DEST_PATH_IMAGE004AA
in the formula, C1Is a first radiation constant with a value of 3.7418 × 10-8W∙m；C2Is the second radiation constant and takes 1.4388 × 10-2m ∙ K; λ is the wavelength; t is the measured value of the infrared point temperature instrument;
Figure 44332DEST_PATH_IMAGE006
the emissivity of the corrected tested piece 3 changes along with the temperature;
emissivity epsilon of test piece 3λThe correction method comprises the following steps: a temperature sensor comparison test is set, first, according to the 6 temperature points preset in step S3, from t1To t6Comparing the temperature measuring results of the thermocouples in the low-temperature infrared point thermometer 1 and the temperature sensor one by one, and correcting the temperature measuring results under the low-temperature condition through the temperature sensorEmissivity epsilon of the test piece 3 to be testedλObtaining the corrected emissivity of the test piece 3 under the low temperature condition
Figure 108103DEST_PATH_IMAGE006
(ii) a Then, the temperature is measured from t at 6 temperature points preset in step S37To t12Comparing the temperature measuring results of the thermocouples in the high-temperature infrared point temperature instrument 2 and the temperature sensor one by one, and correcting the emissivity epsilon of the to-be-tested piece 3 under the high-temperature condition through the temperature sensorλObtaining the corrected emissivity of the test piece 3 under the high temperature condition
Figure 41424DEST_PATH_IMAGE006
. As shown in table 1.
Table 1 temperature corresponding to each temperature point and emissivity of the test object 3 before and after correction
Figure DEST_PATH_IMAGE008
。

Claims (7)

1. The ground test temperature measurement method based on the trajectory in the aircraft ground heat intensity test is characterized by comprising the following steps of:
s1, selecting an infrared point temperature instrument: two infrared point thermometers are selected to serve as a low-temperature-section infrared point thermometer (1) and a high-temperature-section infrared point thermometer (2) respectively, and the temperature measuring range of the low-temperature-section infrared point thermometer (1) is T1~T1', the temperature measuring range of the high-temperature section infrared point temperature instrument (2) is T2~T2', wherein, T1＜T2＜T1′＜T2′；
S2, installing an infrared point temperature instrument: the low-temperature section infrared point thermometer (1) and the high-temperature section infrared point thermometer (2) are simultaneously aligned to the same temperature measuring point of a piece to be tested (3), the low-temperature section infrared point thermometer (1) and the high-temperature section infrared point thermometer (2) are arranged at a symmetrical included angle theta with a normal line passing through a temperature measuring point plane, the distance between the temperature measuring point and the low-temperature section infrared point thermometer (1) and the distance between the temperature measuring point and the high-temperature section infrared point thermometer (2) are both D, the diameter length of a projection plane of the measuring range of the low-temperature section infrared point thermometer (1) and the high-temperature section infrared point thermometer (2) at the position of the piece to be tested (3) is S, the distance coefficient of the distance D from the low-temperature section infrared point thermometer (1) and the high-temperature section infrared point thermometer (2) to the temperature measuring point is K, K = D/S, determining the positions of the low-temperature-section infrared point thermometer (1) and the high-temperature-section infrared point thermometer (2) according to the distance coefficient K;
s3, temperature calibration: according to the temperature range to be measured of the low-temperature section infrared point thermometer (1) and the high-temperature section infrared point thermometer (2), n temperature points t are selectednTemperature calibration is carried out, and the size relation of each temperature point during temperature calibration is as follows:
T1<t1<…tj<T2<tj+1<…<tj+m<T1′<tj+m+1<…<tn<T2′；
wherein j is more than 1, m is more than 1, j is more than n, and m is more than n;
s4, determining an exchange temperature point: at T according to the temperature point selected in step S32~T1The temperature points with the same measured values of the low-temperature-section infrared point thermometer (1) and the high-temperature-section infrared point thermometer (2) are found between the two temperature points and are recorded as TSwitchingSimultaneously calculating the emissivity epsilon of the test piece (3) at each temperature point according to the temperature points selected in the step S3λ；
S5, final measurement value determination: when the measured values of the low-temperature-section infrared point temperature instrument (1) and the high-temperature-section infrared point temperature instrument (2) are both lower than TSwitchingMeanwhile, the final measurement value is based on the measurement value of the low-temperature-section infrared temperature instrument (1), and the radiation emittance M generated by the piece to be tested (3) is calculated simultaneously0When the measured values of the low-temperature-section infrared point thermometer (1) and the high-temperature-section infrared point thermometer (2) are both higher than TSwitchingMeanwhile, the final measurement value is based on the measurement value of the high-temperature section infrared point temperature instrument (2), and the radiation emittance M generated by the piece to be tested (3) is calculated simultaneously0。
2. The method for measuring temperature in a ballistic ground test in an aircraft ground thermal strength test according to claim 1, wherein in step S1, the temperature measuring wavelength of the low-temperature range infrared thermometer (1) is 8-14 μm, and the temperature measuring wavelength of the high-temperature range infrared thermometer (2) is 5 μm.
3. The method for measuring temperature in a ballistic ground test of an aircraft ground heat intensity according to claim 1, wherein the included angle θ in the step S2 is 5-15 °.
4. The ballistic ground test temperature measurement method in the aircraft ground heat intensity test according to claim 1, wherein, when determining the positions of the low-temperature-range infrared dot thermometer (1) and the high-temperature-range infrared dot thermometer (2) according to the distance coefficient K in step S2, in order to prevent the influence of the heater radiation on the measurement, the piece (3) to be tested is placed on the heating surface side of the heater composed of two heating elements (4) arranged side by side, the low-temperature-range infrared dot thermometer (1) and the high-temperature-range infrared dot thermometer (2) are placed on the non-heating surface side of the heater composed of two heating elements (4) arranged side by side, the sensing signal directions of the low-temperature-range infrared dot thermometer (1) and the high-temperature-range infrared dot thermometer (2) pass through the gap between the two heating elements (4), the gap distance between the two heating elements (4) is M, the vertical distance between the piece to be tested (3) and the heater is L, and the vertical distances between the low-temperature-section infrared point thermometer (1) and the high-temperature-section infrared point thermometer (2) and the heater are DHeating deviceThe diameter and the length of the projection surface of the measurement range of the low-temperature section infrared point thermometer (1) and the high-temperature section infrared point thermometer (2) at the position of the gap of the two heating elements (4) which are arranged side by side are SHeating apparatusThen S isHeating deviceShould satisfy SHeating deviceM < S < L, and DHeating device<KM。
5. The method for measuring temperature in a ballistic ground test in an aircraft ground heat intensity test according to claim 1, wherein the emissivity of the test piece (3) to be tested in the step S4 is SλIs defined as being at a certain temperature pointThe surface of the test piece (3) is irradiated with radiant energy at a temperature of (1), and the emissivity of the test piece (3) is epsilonλThe formula of (c) is shown as follows:
Figure 895572DEST_PATH_IMAGE002
in the formula, eλIs the spectral energy density, e, of the test piece (3) to be tested at the temperature pointhλIs the spectral energy density of the black body at that temperature point.
6. The method for measuring temperature in a ballistic ground test of an aircraft ground heat intensity according to claim 1, wherein the emittance M of radiation generated by the test piece (3) in the step S50The formula of (c) is shown as follows:
Figure 835847DEST_PATH_IMAGE004
in the formula, C1Is the first radiation constant, and has a value of 3.7418 × 10-8W∙m；C2Is the second radiation constant and takes 1.4388 × 10-2m ∙ K; λ is the wavelength; t is the measured value of the infrared point temperature instrument;
Figure DEST_PATH_IMAGE005
the emissivity of the corrected test piece (3) changes with the temperature.
7. Method for ballistic ground test thermometry in aircraft ground heat intensity tests according to claim 6, characterized in that the emissivity ε of the piece to be tested (3)λThe correction method comprises the following steps: setting a temperature sensor comparison test, firstly, according to j + m temperature points preset in step S3, starting from t1To tj+mComparing the temperature measuring results of the thermocouples in the low-temperature infrared point thermometer (1) and the temperature sensor one by one, and correcting the emission of the to-be-tested piece (3) under the low-temperature condition through the temperature sensorRate epsilonλObtaining the corrected emissivity of the piece (3) to be tested under the low temperature condition
Figure 952707DEST_PATH_IMAGE005
(ii) a Then according to n-j-1 temperature points preset in step S3 from tj+1To tnComparing the thermocouple temperature measurement results in the high-temperature infrared thermometer (2) and the temperature sensor one by one, and correcting the emissivity epsilon of the to-be-tested piece (3) under the high-temperature condition through the temperature sensorλObtaining the corrected emissivity of the test piece (3) under the high-temperature condition
Figure 648131DEST_PATH_IMAGE005
。
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