CN114777929B - Ground test temperature measurement method based on trajectory in airplane ground heat intensity test - Google Patents
Ground test temperature measurement method based on trajectory in airplane ground heat intensity test Download PDFInfo
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Abstract
The invention discloses a ground test temperature measurement method based on trajectory in an airplane ground heat intensity test, which relates to the technical field of airplane test and comprises the following steps: s1, selecting an infrared point temperature instrument; s2, installing an infrared point temperature instrument; s3, temperature calibration; s4, determining an exchange temperature point; and S5, determining a final measured value. The ground test temperature measurement method can realize the measurement of the flight trajectory of the airplane from the normal temperature condition of 20-30 ℃ to the high temperature condition of more than 2000 ℃ by the infrared point thermometer, expands the application of the infrared point thermometer in the ground heat intensity, greatly improves the temperature measurement accuracy, and can be popularized to the non-contact measurement fields of metal smelting, nuclear industry, aerospace and the like.
Description
Technical Field
The invention relates to the technical field of airplane testing, in particular to a ground test temperature measuring method based on a trajectory in an airplane ground heat intensity test.
Background
The aerodynamic heating condition of the airplane structure test piece is simulated according to the trajectory in the airplane ground thermal strength test, the temperature response of the airplane structure test piece is accurately measured in real time in the whole process, the coverage of the temperature measurement range is very wide, and the temperature measurement range is usually from the normal temperature condition of 20-30 ℃ to the high temperature condition of more than 2000 ℃. However, the temperature sensors commonly used in all the current fields cannot meet the temperature requirement, so that a new temperature measuring method needs to be developed.
The infrared point temperature instrument is a commonly used temperature measuring element in an airplane ground heat intensity test, and the temperature measuring principle is as follows: assuming the target is a black body, the external radiation output is M 0 And the sensor part of the infrared point thermometer receives the radiation energy of the target, and the radiation temperature of the black body under the theory can be calculated through Planck's law. However, in practical applications, blackbody is not present, and the target has emissivity defined as: receiving the radiant energy emitted from the surface of the object under a certain temperature condition to obtain the spectral energy densityThe ratio of the spectral energy density of a black body at a temperature. Due to the existence of emissivity and the limitation of an infrared thermometer, the problem of inaccurate temperature measurement of a certain temperature section in the process of simulating temperature measurement of the flight trajectory of an airplane or other aircrafts is caused.
Disclosure of Invention
In order to solve the existing problems, the invention provides a ballistic ground test temperature measurement method in an aircraft ground heat intensity test.
The technical scheme of the invention is as follows:
the ground test temperature measurement method based on the trajectory in the airplane ground heat intensity test comprises the following steps:
s1, selecting an infrared point temperature instrument: selecting two infrared point thermometers as a low-temperature-section infrared point thermometer and a high-temperature-section infrared point thermometer respectively, wherein the temperature measuring range of the low-temperature-section infrared point thermometers is T 1 ~T 1 ', the temperature measuring range of the high-temperature section infrared point temperature instrument is T 2 ~T 2 ', wherein, T 1 ＜T 2 ＜T 1 ′＜T 2 ′；
S2, installing an infrared point temperature instrument: the low-temperature section infrared point thermometer and the high-temperature section infrared point thermometer are simultaneously aligned to the same temperature measuring point of a piece to be tested, the low-temperature section infrared point thermometer and the high-temperature section infrared point thermometer are arranged at a symmetrical included angle theta with a normal line passing through a temperature measuring point plane, the distance between the temperature measuring point and the low-temperature section infrared point thermometer and the high-temperature section infrared point thermometer is D, the diameter length of the measuring range of the low-temperature section infrared point thermometer and the high-temperature section infrared point thermometer on a projection plane of the position of the piece to be tested is S, the distance coefficient of the distance D from the low-temperature section infrared point thermometer and the high-temperature section infrared point thermometer to the temperature measuring point is K, K = D/S, and the positions of the low-temperature section infrared point thermometer and the high-temperature section infrared point thermometer are determined according to the distance coefficient K;
s3, temperature calibration: selecting n temperature points t according to the temperature ranges to be measured by the low-temperature segment infrared point thermometer and the high-temperature segment infrared point thermometer n Temperature calibration is carried out, and the size relation of each temperature point during temperature calibration is as follows:
T 1 <t 1 <…t j <T 2 <t j+1 <…<t j+m <T 1 ′<t j+m+1 <…<t n <T 2 ′；
wherein j is more than 1, m is more than 1, j is more than n, and m is more than n;
s4, determining an exchange temperature point: at T according to the temperature point selected in step S3 2 ~T 1 The temperature point with the same measured value of the low-temperature-section infrared point thermometer and the high-temperature-section infrared point thermometer is found between the two temperature points and is recorded as T Switching And simultaneously calculating emissivity epsilon of the piece to be tested at each temperature point according to the temperature points selected in the step S3 λ ；
S5, final measurement value determination: when the measured values of the low-temperature section infrared point temperature instrument and the high-temperature section infrared point temperature instrument are both lower than T Switching Meanwhile, the final measured value is based on the measured value of the low-temperature infrared point thermometer, and the radiation emittance M generated by the piece to be tested is calculated simultaneously 0 When the measured values of the low-temperature-section infrared point temperature instrument and the high-temperature-section infrared point temperature instrument are both higher than T Switching Meanwhile, the final measured value is based on the measured value of the high-temperature infrared point temperature instrument, and the radiation emittance M generated by the piece to be tested is calculated simultaneously 0 。
Further, in the step S1, the temperature measurement wavelength of the low-temperature-stage infrared thermometer is 8 to 14 μm, and the temperature measurement wavelength of the high-temperature-stage infrared thermometer is 5 μm. The temperature measurement of the low-temperature section and the high-temperature section is controlled by controlling infrared point temperature meters with different wavelengths.
Further, in the step S2, the included angle θ is 5 to 15 °. The temperature of the same temperature point can be measured more accurately by controlling the angle positions of the two infrared point thermometers.
Further, when the positions of the low-temperature-range infrared thermometer and the high-temperature-range infrared thermometer are determined according to the distance coefficient K in step S2, in order to prevent the radiation of the heater from affecting the measurement, the test piece to be tested is placed on the side of the heating surface of the heater composed of two heating elements arranged side by side, the low-temperature-range infrared thermometer and the high-temperature-range infrared thermometer are placed on the side of the non-heating surface of the heater composed of two heating elements arranged side by side, and the low-temperature-range infrared thermometer and the high-temperature-range infrared thermometer are enabled to be in contact with each otherThe sensing signal direction passes through the gap between the two heating elements, the gap distance between the two heating elements is M, the vertical distance between the to-be-tested piece and the heater is L, and the vertical distances between the low-temperature-section infrared point thermometer and the high-temperature-section infrared point thermometer and the heater are D Heating device The diameter length of the projection surface of the low-temperature section infrared point thermometer and the high-temperature section infrared point thermometer in the position of the gap of the two heating elements arranged side by side is S Heating device Then S is Heating device Should satisfy S Heating device M < S < L, and D Heating device <KM is used. The temperature of the piece to be tested can be measured more accurately by controlling the distance positions of the two infrared point temperature gauges, and the interference of a heater is avoided.
Further, the emissivity of the piece to be tested in the step S4 is epsilon λ Defined as the radiant energy emitted by the surface of the test piece under the temperature condition of a certain temperature point, the emissivity epsilon of the test piece λ The formula of (c) is shown as follows:
in the formula, e λ Is the spectral energy density of the test piece to be tested at the temperature point, e hλ Is the spectral energy density of the black body at that temperature point.
Further, the radiation emittance M generated by the test piece to be tested in the step S5 0 The formula of (c) is shown as follows:
in the formula, C 1 Is a first radiation constant with a value of 3.7418 × 10 -8 W∙m；C 2 Is the second radiation constant, and has a value of 1.4388 × 10 -2 m ∙ K; λ is the wavelength; t is the measured value of the infrared point temperature instrument;
for corrected to-be-measuredEmissivity of the test piece, varying with temperature.
Further, the emissivity ε of the test piece λ The correction method comprises the following steps: setting a temperature sensor comparison test, firstly, according to j + m temperature points preset in step S3, from t 1 To t j+m Comparing the thermocouple temperature measurement results in the low-temperature infrared point thermometer and the temperature sensor one by one, and correcting the emissivity epsilon of the piece to be tested under the low-temperature condition through the temperature sensor λ Obtaining the corrected emissivity of the piece to be tested under the low-temperature condition
(ii) a Then according to n-j-1 temperature points preset in the step S3 from t j+1 To t n Comparing the thermocouple temperature measurement results in the high-temperature infrared point thermometer and the temperature sensor one by one, and correcting the emissivity epsilon of the piece to be tested under the high-temperature condition through the temperature sensor λ Obtaining the corrected emissivity of the test piece under the high-temperature condition
. The corrected emissivity can be closer to the real test condition by setting a temperature sensor contrast test, and the test error is further reduced.
The invention has the beneficial effects that:
(1) the ground test temperature measurement method can realize the measurement of the flight trajectory of the airplane from the normal temperature condition of 20-30 ℃ to the high temperature condition of more than 2000 ℃ by the infrared point thermometer, expands the application of the infrared point thermometer in the ground heat intensity, greatly improves the temperature measurement accuracy, and can be popularized to the non-contact measurement fields of metal smelting, nuclear industry, aerospace and the like;
(2) according to the ground test temperature measurement method, two infrared point thermometers with different temperature wave bands are adopted at the same time, and an algorithm is coordinated, so that the mounting position of the infrared point thermometers is optimized, and the whole-process real-time temperature response of the structure and the material of the airplane structure test piece is realized when the aerodynamic heat of the airplane flight trajectory is simulated to act on the airplane structure test piece in the airplane ground heat intensity test;
(3) the ground test temperature measurement method further improves the temperature measurement precision of the infrared point temperature instrument by optimizing the emissivity, and can calculate the radiation emittance of the airplane structure test piece.
Drawings
FIG. 1 is a flow chart of a ground test temperature measurement method of the present invention;
FIG. 2 is a schematic diagram of the arrangement structure of the components of the temperature measuring method of the ground test of the invention;
FIG. 3 is a side view of the arrangement structure of the components of the temperature measuring method for the ground test of the invention;
FIG. 4 is a top view of the arrangement structure of the components and a schematic position diagram of an infrared thermometer in the ground test temperature measurement method.
Wherein, 1-low temperature section infrared point temperature instrument, 2-high temperature section infrared point temperature instrument, 3-test piece, 4-heating element.
Detailed Description
Example 1
The ground test temperature measurement method based on the trajectory in the airplane ground heat intensity test comprises the following steps:
s1, selecting an infrared point temperature instrument: two infrared point thermometers are selected as a low-temperature-section infrared point thermometer 1 and a high-temperature-section infrared point thermometer 2 respectively, the temperature measurement wavelength of the low-temperature-section infrared point thermometer 1 is 12 micrometers, the temperature measurement wavelength of the high-temperature-section infrared point thermometer 2 is 5 micrometers, and the temperature measurement range of the low-temperature-section infrared point thermometer 1 is T 1 ~T 1 ', the temperature measuring range of the high-temperature section infrared point temperature instrument 2 is T 2 ~T 2 ', wherein, T 1 ＜T 2 ＜T 1 ′＜T 2 ′；
S2, installing an infrared point temperature instrument: the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 are simultaneously aligned to the same temperature measuring point of a to-be-tested piece 3, the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 are arranged at a symmetrical included angle theta with a normal line passing through a temperature measuring point plane, the included angle theta is 10 degrees, the distance between the temperature measuring point and the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 is D, the diameter length of a projection plane of the measuring range of the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 at the position of the to-be-tested piece 3 is S, the distance coefficient of the distance D from the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 to the temperature measuring point is K, K = D/S, and the positions of the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point 2 are determined according to the distance coefficient K;
when determining the positions of the low-temperature-section infrared point thermometer 1 and the high-temperature-section infrared point thermometer 2 according to the distance coefficient K, in order to prevent the influence of the radiation of the heater on the measurement, the to-be-tested object 3 is placed on one side of the heating surface of the heater consisting of the two heating elements 4 arranged side by side, the low-temperature-section infrared point thermometer 1 and the high-temperature-section infrared point thermometer 2 are placed on one side of the non-heating surface of the heater consisting of the two heating elements 4 arranged side by side, the induction signal directions of the low-temperature-section infrared point thermometer 1 and the high-temperature-section infrared point thermometer 2 pass through the gap between the two heating elements 4, the gap distance between the two heating elements 4 is M, the vertical distance between the to-be-tested object 3 and the heater is L, and the vertical distances between the low-temperature-section infrared point thermometer 1 and the high-temperature-section infrared point thermometer 2 and the heater are D Heating device The diameter length of the projection surface of the measurement range of the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 at the position of the gap of the two heating elements 4 arranged side by side is S Heating device Then S is Heating device Should satisfy S Heating apparatus M < S < L, and D Heating device <KM；
S3, temperature calibration: according to the temperature ranges to be measured of the low-temperature segment infrared point thermometer 1 and the high-temperature segment infrared point thermometer 2, n temperature points t are selected n Temperature calibration is carried out, and the size relation of each temperature point during temperature calibration is as follows:
T 1 <t 1 <…t j <T 2 <t j+1 <…<t j+m <T 1 ′<t j+m+1 <…<t n <T 2 ′；
wherein j is more than 1, m is more than 1, j is more than n, and m is more than n;
s4, determining an exchange temperature point: at T, according to the temperature point selected in step S3 2 ~T 1 Between the infrared thermometer 1 and the infrared thermometer 1The temperature points with the same measured value of the point temperature instrument 2 are recorded as T Switching While calculating the emissivity epsilon of the test piece 3 at each temperature point from the temperature points selected in step S3 λ ；
The emissivity of the test piece 3 is epsilon λ Defined as the radiant energy emitted from the surface of the test piece 3 under the temperature condition of a certain temperature point, the emissivity epsilon of the test piece 3 λ The formula of (c) is shown as follows:
in the formula, e λ Is the spectral energy density, e, of the test piece 3 to be tested at this temperature point hλ Is the spectral energy density of the black body at that temperature point;
s5, final measurement value determination: when the measured values of the low-temperature-section infrared point temperature instrument 1 and the high-temperature-section infrared point temperature instrument 2 are both lower than T Switching Meanwhile, the final measurement value is based on the measurement value of the low-temperature-section infrared thermometer 1, and the emittance M generated by the piece 3 to be tested is calculated 0 When the measured values of the low-temperature-section infrared point temperature instrument 1 and the high-temperature-section infrared point temperature instrument 2 are both higher than T Switching Then, the final measured value is based on the measured value of the high-temperature infrared point temperature instrument 2, and the radiation emittance M generated by the piece to be tested 3 is calculated 0 ；
The emittance M of the radiation generated by the test piece 3 to be tested 0 The formula of (c) is shown as follows:
in the formula, C 1 Is a first radiation constant with a value of 3.7418 × 10 -8 W∙m；C 2 Is the second radiation constant, and has a value of 1.4388 × 10 -2 m ∙ K; λ is the wavelength; t is the measured value of the infrared point temperature instrument;
the emissivity of the corrected tested piece 3 changes along with the temperature;
emissivity epsilon of test piece 3 λ The correction method comprises the following steps: setting a temperature sensor comparison test, firstly, according to j + m temperature points preset in step S3, starting from t 1 To t j+m Comparing the temperature measuring results of the thermocouples in the low-temperature infrared point thermometer 1 and the temperature sensor one by one, and correcting the emissivity epsilon of the to-be-tested piece 3 under the low-temperature condition through the temperature sensor λ Obtaining the corrected emissivity of the test piece 3 under the low temperature condition
(ii) a Then according to n-j-1 temperature points preset in the step S3 from t j+1 To t n Comparing the temperature measuring results of the thermocouples in the high-temperature infrared point temperature instrument 2 and the temperature sensor one by one, and correcting the emissivity epsilon of the to-be-tested piece 3 under the high-temperature condition through the temperature sensor λ Obtaining the corrected emissivity of the piece to be tested 3 under the high-temperature condition
。
Example 2
The present embodiment is different from embodiment 1 in that: in step S1, the wavelength of the low temperature section infrared thermometer 1 is different.
The temperature measuring wavelength of the low-temperature-section infrared thermometer 1 is 8 μm.
Example 3
The present embodiment is different from embodiment 1 in that: in step S1, the wavelengths of the low-temperature-range infrared thermometer 1 are different.
The temperature measuring wavelength of the low-temperature-section infrared thermometer 1 is 14 μm.
Example 4
The present embodiment is different from embodiment 1 in that: in step S2, angle θ is different.
The included angle theta is 5 deg..
Example 4
The present embodiment is different from embodiment 1 in that: in step S2, angle θ is different.
The included angle theta is 15 deg..
Examples of the experiments
The parameters of the ground test temperature measurement method in the embodiment 1 are used for carrying out the field simulation experiment of the airplane ground heat intensity test, and the specific process is shown in figure 1:
s1, selecting an infrared point temperature instrument: selecting two infrared point thermometers as a low-temperature-section infrared point thermometer 1 and a high-temperature-section infrared point thermometer 2 respectively, wherein the temperature measuring wavelength of the low-temperature-section infrared point thermometer 1 is 12 micrometers, the temperature measuring wavelength of the high-temperature-section infrared point thermometer 2 is 5 micrometers, the temperature measuring range of the low-temperature-section infrared point thermometer 1 is-40-800 ℃, and the temperature measuring range of the high-temperature-section infrared point thermometer 2 is 400-2250 ℃;
s2, installing an infrared point temperature instrument: as shown in FIGS. 2 to 4, a low temperature section infrared spot thermometer 1 and a high temperature section infrared spot thermometer 2 are simultaneously aligned with the same temperature measuring point of a test piece 3, the low temperature section infrared spot thermometer 1 and the high temperature section infrared spot thermometer 2 are installed at a symmetrical angle theta to the normal line passing through the temperature measuring point plane, the angle theta is 10 degrees, the distance D from the temperature measuring point to the low temperature section infrared spot thermometer 1 and the high temperature section infrared spot thermometer 2 is 420mm, the diameter length S of the projection plane of the infrared spot thermometer at the position of the test piece 3 is 6mm, the distance coefficient K from the low temperature section infrared spot thermometer 1 and the high temperature section infrared spot thermometer 2 to the temperature measuring point is 70 degrees, when the positions of the low temperature section infrared spot thermometer 1 and the high temperature section infrared spot thermometer 2 are determined according to the distance coefficient K, in order to prevent the heater radiation from affecting the measurement, the test piece 3 is placed on one side of the heating surface of a heater composed of two heating elements 4 arranged side by side, the method comprises the steps of placing a low-temperature-section infrared dot thermometer 1 and a high-temperature-section infrared dot thermometer 2 on one side of a non-heating surface of a heater consisting of two heating elements 4 arranged side by side, enabling induction signal directions of the low-temperature-section infrared dot thermometer 1 and the high-temperature-section infrared dot thermometer 2 to penetrate through a gap between the two heating elements 4, enabling a gap interval M between the two heating elements 4 to be 5mm, enabling a vertical distance L between a to-be-tested part 3 and the heater to be 80mm, and enabling a vertical distance D between the low-temperature-section infrared dot thermometer 1 and the high-temperature-section infrared dot thermometer 2 and the heater to be D Heating device Is 340mm, the diameter length S of the projection surface of the measurement range of the low-temperature section infrared point thermometer 1 and the high-temperature section infrared point thermometer 2 at the position of the gap of the two heating elements 4 arranged side by side Heating device Is 4mm, then S Heating device Satisfies S Heating device M < S < L, while satisfying D Heating device <KM; the infrared point thermometer is a commercially available aviation industry infrared single-point thermometer, and the heating element is a commercially available graphite heating element;
s3, temperature calibration: according to the temperature ranges to be measured by the low-temperature-stage infrared thermometer 1 and the high-temperature-stage infrared thermometer 2, as shown in table 1, 12 temperature points t are selected 12 Temperature calibration is carried out, and the size relation of each temperature point during temperature calibration is as follows:
T 1 <t 1 <…t 4 <T 2 <t 5 <…t 8 <T 1 ′<t 9 <…<t 12 <T 2 ′；
s4, determining an exchange temperature point: at T according to the temperature point selected in step S3 2 ~T 1 The temperature point with the same measured value of the low-temperature segment infrared point thermometer 1 and the high-temperature segment infrared point thermometer 2 is found between the two temperature points and is recorded as T Switching Is T 6 While calculating the emissivity epsilon of the test piece 3 at each temperature point from the temperature points selected in step S3 λ ；
The emissivity of the test piece 3 to be tested is epsilon λ Defined as the radiant energy emitted from the surface of the test piece 3 under the temperature condition of a certain temperature point, the emissivity epsilon of the test piece 3 λ The formula of (c) is shown as follows:
in the formula, e λ Is the spectral energy density, e, of the test piece 3 to be tested at that temperature point hλ Is the spectral energy density of the black body at that temperature point;
s5, final measurement value determination: when the measured values of the low-temperature-section infrared point temperature instrument 1 and the high-temperature-section infrared point temperature instrument 2 are lower than T Switching Then, the final measured value is based on the measured value of the low-temperature infrared point temperature instrument 1, and the radiation emittance M generated by the piece to be tested 3 is calculated 0 When the low-temperature section infrared point temperature instrument 1 and the high-temperature section infrared point temperature instrument 2 are used for measuringOf magnitude higher than T Switching Then, the final measured value is based on the measured value of the high-temperature infrared point temperature instrument 2, and the radiation emittance M generated by the piece to be tested 3 is calculated 0 ；
The emittance M of the radiation generated by the test piece 3 to be tested 0 The formula of (c) is shown as follows:
in the formula, C 1 Is the first radiation constant, and has a value of 3.7418 × 10 -8 W∙m；C 2 Is the second radiation constant and takes 1.4388 × 10 -2 m ∙ K; λ is the wavelength; t is the measured value of the infrared point temperature instrument;
the emissivity of the corrected tested piece 3 changes along with the temperature;
emissivity epsilon of test piece 3 λ The correction method comprises the following steps: a temperature sensor comparison test is set, first, according to the 6 temperature points preset in step S3, from t 1 To t 6 Comparing the temperature measuring results of the thermocouples in the low-temperature infrared point thermometer 1 and the temperature sensor one by one, and correcting the emissivity epsilon of the to-be-tested piece 3 under the low-temperature condition through the temperature sensor λ Obtaining the corrected emissivity of the piece to be tested 3 under the low-temperature condition
(ii) a Then, the temperature is measured from t to 6 temperature points preset in step S3 7 To t 12 Comparing the temperature measuring results of the thermocouples in the high-temperature infrared point temperature instrument 2 and the temperature sensor one by one, and correcting the emissivity epsilon of the to-be-tested piece 3 under the high-temperature condition through the temperature sensor λ Obtaining the corrected emissivity of the piece to be tested 3 under the high-temperature condition
. As shown in table 1.
Table 1 shows the temperatures corresponding to the respective temperature points and the emissivity of the test object 3 before and after correction
Claims (6)
1. The ground test temperature measuring method based on the trajectory in the airplane ground heat intensity test is characterized by comprising the following steps of:
s1, selecting an infrared point temperature instrument: two infrared point thermometers are selected to be respectively used as a low-temperature-section infrared point thermometer (1) and a high-temperature-section infrared point thermometer (2), and the temperature measuring range of the low-temperature-section infrared point thermometer (1) is T 1 ~T 1 ', the temperature measuring range of the high-temperature section infrared point temperature instrument (2) is T 2 ~T 2 ', wherein, T 1 ＜T 2 ＜T 1 ′＜T 2 ′；
S2, installing an infrared point temperature instrument: the low-temperature section infrared point thermometer (1) and the high-temperature section infrared point thermometer (2) are simultaneously aligned to the same temperature measuring point of a piece to be tested (3), the low-temperature section infrared point thermometer (1) and the high-temperature section infrared point thermometer (2) are arranged at a symmetrical included angle theta with a normal line passing through a temperature measuring point plane, the distance between the temperature measuring point and the low-temperature section infrared point thermometer (1) and the distance between the temperature measuring point and the high-temperature section infrared point thermometer (2) are both D, the diameter length of a projection plane of the measuring range of the low-temperature section infrared point thermometer (1) and the high-temperature section infrared point thermometer (2) at the position of the piece to be tested (3) is S, the distance coefficient of the distance D between the low-temperature section infrared point thermometer (1) and the high-temperature section infrared point thermometer (2) and the temperature measuring point is K, K = D/S, determining the positions of the low-temperature-section infrared point thermometer (1) and the high-temperature-section infrared point thermometer (2) according to the distance coefficient K;
when the positions of the low-temperature-section infrared dot thermometer (1) and the high-temperature-section infrared dot thermometer (2) are determined according to the distance coefficient K in the step S2, in order to prevent the radiation of the heater from influencing the measurement, the piece (3) to be tested is placed on one side of the heating surface of the heater consisting of two heating elements (4) arranged side by side, and the low-temperature-section infrared dot thermometer (1) and the high-temperature-section infrared dot thermometer (2) are placed on one side of two heating surfaces arranged side by sideThe non-heating surface side of the heater composed of the elements (4) enables the sensing signal direction of the low-temperature section infrared point thermometer (1) and the high-temperature section infrared point thermometer (2) to pass through the gap between the two heating elements (4), the gap distance between the two heating elements (4) is M, the vertical distance between the piece to be tested (3) and the heater is L, and the vertical distance between the low-temperature section infrared point thermometer (1) and the high-temperature section infrared point thermometer (2) and the heater is D Heating apparatus The diameter and the length of the projection surface of the measurement range of the low-temperature section infrared point thermometer (1) and the high-temperature section infrared point thermometer (2) at the position of the gap of the two heating elements (4) which are arranged side by side are S Heating apparatus Then S is Heating device Should satisfy S Heating apparatus M < S < L, and D Heating apparatus <KM；
S3, temperature calibration: according to the temperature range to be measured of the low-temperature section infrared point thermometer (1) and the high-temperature section infrared point thermometer (2), n temperature points t are selected n Temperature calibration is carried out, and the size relation of each temperature point during temperature calibration is as follows:
T 1 <t 1 <…t j <T 2 <t j+1 <…<t j+m <T 1 ′<t j+m+1 <…<t n <T 2 ′；
wherein j is more than 1, m is more than 1, j is more than n, and m is more than n;
s4, determining an exchange temperature point: at T according to the temperature point selected in step S3 2 ~T 1 The temperature points with the same measured values of the low-temperature-section infrared point thermometer (1) and the high-temperature-section infrared point thermometer (2) are found between the two temperature points and are recorded as T Switching Simultaneously calculating the emissivity epsilon of the test piece (3) at each temperature point according to the temperature points selected in the step S3 λ ；
S5, final measurement value determination: when the measured values of the low-temperature-section infrared point temperature instrument (1) and the high-temperature-section infrared point temperature instrument (2) are both lower than T Switching Meanwhile, the final measured value is based on the measured value of the low-temperature-section infrared point temperature instrument (1), and the radiation emittance M generated by the piece to be tested (3) is calculated simultaneously 0 When the low-temperature section infrared point temperature instrument (1) and the high-temperature sectionThe measured values of the infrared point temperature instrument (2) are all higher than T Switching Meanwhile, the final measured value is based on the measured value of the high-temperature-section infrared point temperature instrument (2), and the radiation emittance M generated by the piece to be tested (3) is calculated simultaneously 0 。
2. The temperature measuring method for the ground test based on the trajectory in the aircraft ground heat intensity test according to claim 1, wherein in the step S1, the temperature measuring wavelength of the low-temperature-range infrared dot thermometer (1) is 8-14 μm, and the temperature measuring wavelength of the high-temperature-range infrared dot thermometer (2) is 5 μm.
3. The method for measuring temperature in a ballistic ground test of an aircraft ground heat intensity according to claim 1, wherein the included angle θ in the step S2 is 5-15 °.
4. The method for measuring temperature in a ballistic ground test in an aircraft ground heat intensity test according to claim 1, wherein the emissivity of the test piece (3) to be tested in the step S4 is epsilon λ Defined as the radiant energy emitted by the surface of the piece to be tested (3) under the temperature condition of a certain temperature point, the emissivity epsilon of the piece to be tested (3) λ The formula of (c) is shown as follows:
in the formula, e λ Is the spectral energy density, e, of the test piece (3) to be tested at the temperature point hλ Is the spectral energy density of the black body at that temperature point.
5. The method for measuring temperature in a ballistic ground test of an aircraft ground heat intensity according to claim 1, wherein the emittance M of radiation generated by the test piece (3) in the step S5 0 The formula of (c) is shown as follows:
in the formula, C 1 Is a first radiation constant; c 2 Is a second radiation constant; λ is the wavelength; t is the measured value of the infrared point temperature instrument; epsilon (lambda, T) is the emissivity of the corrected piece to be tested (3) and changes with the temperature.
6. Method for ballistic ground test temperature measurement in aircraft ground heat intensity tests according to claim 5, characterized in that the emissivity ε of the piece to be tested (3) λ The correction method comprises the following steps: setting a temperature sensor comparison test, firstly, according to j + m temperature points preset in step S3, starting from t 1 To t j+m Comparing the temperature measuring results of the thermocouples in the low-temperature infrared point thermometer (1) and the temperature sensor one by one, and correcting the emissivity epsilon of the to-be-tested piece (3) under the low-temperature condition through the temperature sensor λ Obtaining the emissivity epsilon (lambda, T) of the to-be-tested piece (3) under the corrected low-temperature condition; then according to n-j-1 temperature points preset in the step S3 from t j+1 To t n Comparing the thermocouple temperature measurement results in the high-temperature infrared thermometer (2) and the temperature sensor one by one, and correcting the emissivity epsilon of the to-be-tested piece (3) under the high-temperature condition through the temperature sensor λ And obtaining the emissivity epsilon (lambda, T) of the to-be-tested piece (3) under the corrected high-temperature condition.
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| GB2113384A (en) * | 1982-01-16 | 1983-08-03 | Weinert Magdeburg Betrieb Des | Contactless measurement of temperature |
| JP2012233823A (en) * | 2011-05-06 | 2012-11-29 | Mitsubishi Electric Corp | Temperature control method of a high temperature calibration source for micro wave radiometer |
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| US5347128A (en) * | 1993-04-19 | 1994-09-13 | Vigyan, Inc. | Directional emittance surface measurement system and process |
| JP3204313B2 (en) * | 1998-12-07 | 2001-09-04 | 日本電気株式会社 | Aircraft tracking measurement method and system |
| JP5861190B2 (en) * | 2012-12-12 | 2016-02-16 | トヨタ自動車株式会社 | Non-contact temperature measurement method and non-contact temperature measurement device |
| CN113566969A (en) * | 2020-04-29 | 2021-10-29 | 福迪威（上海）工业仪器技术研发有限公司 | Device and method for measuring the temperature of an object in a space |
| CN111707374B (en) * | 2020-06-04 | 2021-08-06 | 安徽清新互联信息科技有限公司 | Distance estimation method and system for human body infrared thermometer |
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| GB2113384A (en) * | 1982-01-16 | 1983-08-03 | Weinert Magdeburg Betrieb Des | Contactless measurement of temperature |
| JP2012233823A (en) * | 2011-05-06 | 2012-11-29 | Mitsubishi Electric Corp | Temperature control method of a high temperature calibration source for micro wave radiometer |
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