CN105223230A - A kind of infrared electromagnetic wave transparent material radiation measurement of transmission characterist method - Google Patents

A kind of infrared electromagnetic wave transparent material radiation measurement of transmission characterist method Download PDF

Info

Publication number
CN105223230A
CN105223230A CN201510633286.1A CN201510633286A CN105223230A CN 105223230 A CN105223230 A CN 105223230A CN 201510633286 A CN201510633286 A CN 201510633286A CN 105223230 A CN105223230 A CN 105223230A
Authority
CN
China
Prior art keywords
delta
infrared
transparent material
electromagnetic wave
wave transparent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201510633286.1A
Other languages
Chinese (zh)
Inventor
王亚辉
周斌
郑文娟
刘彦
肖利平
肖练刚
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
China Academy of Launch Vehicle Technology CALT
Beijing Aerospace Automatic Control Research Institute
Original Assignee
China Academy of Launch Vehicle Technology CALT
Beijing Aerospace Automatic Control Research Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by China Academy of Launch Vehicle Technology CALT, Beijing Aerospace Automatic Control Research Institute filed Critical China Academy of Launch Vehicle Technology CALT
Priority to CN201510633286.1A priority Critical patent/CN105223230A/en
Publication of CN105223230A publication Critical patent/CN105223230A/en
Pending legal-status Critical Current

Links

Landscapes

  • Measuring And Recording Apparatus For Diagnosis (AREA)
  • Radiation Pyrometers (AREA)

Abstract

The invention provides a kind of infrared electromagnetic wave transparent material thermal radiation property measuring method, comprise, infrared electromagnetic wave transparent material is made into treadmill test part, and be heated to measurement and require temperature; The temperature arranging extend blackbody, to assigned temperature, measures the infrared radiation of extend blackbody with Infrared survey instrument; Measure the black matrix infrared radiation of permeability test part; Change the assigned temperature of extend blackbody, duplicate measurements; Calculate infrared electromagnetic wave transparent material and measure the transmitance and self heat radiation that require temperature; Specify new testpieces measurement to require temperature, surface source blackbody temperature gets back to initial value, and duplicate measurements also calculates the transmitance of infrared electromagnetic wave transparent material under multiple measurement requires temperature and autoradiolysis.The present invention, for measuring infrared electromagnetic wave transparent material transmitance under the condition of high temperature and self heat radiation, compensate for routine measurement and is only applicable to normal temperature state measurement and the deficiency that only directly can provide transmitance.

Description

A kind of infrared electromagnetic wave transparent material radiation measurement of transmission characterist method
Technical field
The present invention relates to infrared detection technique field, particularly relate to a kind of infrared electromagnetic wave transparent material radiation measurement of transmission characterist method.
Background technology
The features such as infrared detection technique has the passive work of round-the-clock, energy resolution is high, antijamming capability is strong, spatial resolution is high, disguise is strong, are widely used in UAV electro-optical's detection systems such as mapping, remote sensing, military affairs.All temperature are higher than the object all outwards emitting infrared radiation of zero K, and this is that the application of infrared detection technique provides the foundation condition.The infrared wave transparent window that infrared electromagnetic wave transparent material is made is the critical component of protection infrared detection system, but when hot outer wave transparent window is in the condition of high temperature, the performance of its radiation transport property also appreciable impact infrared detection system
The unmanned vehicle carrying infrared detection system, when atmospheric envelope hypersonic flight state, occurs that strong Aerodynamic Heating makes the temperature of infrared wave transparent window rise.High-temperature infrared wave transparent window not only forms decay to the infrared radiation of distant object, target detection signal to noise ratio (S/N ratio) is caused to reduce, also produce self heat radiation strong, very easily cause infrared eye saturated, make it can not differentiate signal from target, reduce the performance of infrared detection system, even make it lose efficacy, constrain the widespread use of infrared imaging detection technology in hypersonic speed field.Some researchs show, self heat radiation of infrared wave transparent window increases with the flight time and strengthens rapidly.Therefore, the radiation transmission characteristic parameter such as the transmitance of the infrared electromagnetic wave transparent material of Obtaining Accurate and self heat radiation, become particularly important in infrared wave transparent window is to the impact evaluation of detection performance.
But the existing research about infrared electromagnetic wave transparent material focuses mostly at intensity, Ying Du ﹑ fusing point, thermal conductivity and the physical and chemical performance such as corrosion-resistant, to the research of radiation transport property and measurement data less.The measurement data of open report is the transmitance of normal temperature state mostly, and because temperature contrast is large, normal temperature data are difficult to expand to the condition of high temperature, can not meet infrared wave transparent window to the demand of detection performance impact evaluation.At present, infrared electromagnetic wave transparent material radiation measurement of transmission characterist adopts the method measuring transmitance, attenuation coefficient is provided based on transmitance, self heat radiation of further reckoning, this measuring method not only have ignored Scattering Factors that is that produce in infrared electromagnetic wave transparent material preparation process or material itself, the more important thing is and need to adopt self heat radiation of infrared electromagnetic wave transparent material to be the hypothesis of zero, cause the method can not be used for the condition of high temperature and measure.
Summary of the invention
The technical problem to be solved in the present invention is: for the infrared electromagnetic wave transparent material radiation measurement of transmission characterist problem of the condition of high temperature, invent a kind of infrared electromagnetic wave transparent material radiation measurement of transmission characterist method, to draw transmitance and self heat radiation and the spectral characteristic thereof of infrared electromagnetic wave transparent material.
A kind of infrared electromagnetic wave transparent material radiation measurement of transmission characterist method, step comprises,
S1, is made into treadmill test part by infrared electromagnetic wave transparent material, two side plane plating anti-reflection films;
S2, is heated to measurement by treadmill test part and requires temperature T;
S3, the temperature of adjustment extend blackbody is to T b, adopt Infrared survey instrument to measure the infrared radiation L of extend blackbody at response wave band Δ λ Δ λ, obj;
S4, be positioned over by treadmill test part between extend blackbody and Infrared survey instrument, optical path passes perpendicularly through treadmill test part, adopts Infrared survey instrument to measure the extend blackbody infrared radiation L of permeability test part at response wave band Δ λ Δ λ, tot;
S5, changes T b, repeat S2 and S4, measure the ir radiation data L of the different surface source blackbody temperature of at least two groups Δ λ, objand L Δ λ, tot, until saturated phenomenon appears in Infrared survey instrument, the measurement data that saturated phenomenon is corresponding is invalid;
S6, according to the measurement data L of testpieces at temperature T Δ λ, objand L Δ λ, tot, carry out linear fit, obtain infrared electromagnetic wave transparent material treadmill test part and measuring the transmitance requiring temperature T, response wave band Δ λ with self heat radiation fitting formula is:
L Δ λ , t o t = L Δ λ , o b j · τ Δ λ , w i n T + L Δ λ , w i n T ;
S7, according to measuring the infrared electromagnetic wave transparent material microlayer thickness Δ required expwith infrared electromagnetic wave transparent material treadmill test part thickness deltat wincalculate highest common factor Δ com, obtain hierarchy number calculated thickness is Δ cominfrared electromagnetic wave transparent material transmitance with self heat radiation be respectively
τ Δ λ , w i n T , Δ c o m = τ Δ λ , w i n T n
L Δ λ , w i n T , Δ c o m = L Δ λ , w i n T Σ i = 1 n ( τ Δ λ , w i n T , Δ c o m ) i - 1
S8, according to what calculate computation and measurement required thickness is Δ expthe transmitance of infrared electromagnetic wave transparent material with self heat radiation be respectively
τ Δ λ , w i n T , Δ exp = ( τ Δ λ , w i n T , Δ c o m ) m
L Δ λ , w i n T , Δ exp = L Δ λ , w i n T , Δ c o m · Σ k = 1 m ( τ Δ λ , w i n T , Δ c o m ) k - 1
S9, specifies new treadmill test part measurement to require temperature T, surface source blackbody temperature T bcome back to initial value, repeat S2 to S8, calculate multiple measurement require temperature under the transmitance of infrared electromagnetic wave transparent material and self heat radiation; Until measure, to require temperature all to measure complete.
Described Infrared survey instrument is infrared spectrometer or infrared thermoviewer or infrared radiometer.
Described infrared electromagnetic wave transparent material is germanium, sapphire or chalcogenide glass.
The present invention's advantage is compared with prior art:
(1) do not adopt self heat radiation of infrared electromagnetic wave transparent material to be the hypothesis of zero in measuring process, make the method may be used for the condition of high temperature and measure.
(2) not only directly measure the transmitance of infrared electromagnetic wave transparent material, also directly measure self heat radiation of infrared electromagnetic wave transparent material simultaneously.In the prior art, self heat radiation calculates out.
(3) infrared electromagnetic wave transparent material self heat radiation of directly measuring contains the Scattering Factors of material itself, has truly shown the road radiation transmission process in infrared electromagnetic wave transparent material.In the prior art, suppose scattered radiation be zero or scattered radiation consider imperfection.
(4) the infrared electromagnetic wave transparent material of any type is applicable to.
Accompanying drawing explanation
Fig. 1 is the process flow diagram of the inventive method.
Fig. 2 is the infrared electromagnetic wave transparent material testpieces of sapphire measurement data linear fit when temperature is 100 DEG C
Fig. 3 is the infrared electromagnetic wave transparent material testpieces of sapphire transmitance at different temperatures.
Fig. 4 is self heat radiation at different temperatures of the infrared electromagnetic wave transparent material testpieces of sapphire.
Fig. 5 is the infrared electromagnetic wave transparent material of 0.1 millimeters thick sapphire transmitance at different temperatures.
Fig. 6 is self heat radiation at different temperatures of the infrared electromagnetic wave transparent material of 0.1 millimeters thick sapphire.
Embodiment
The invention provides a kind of infrared electromagnetic wave transparent material radiation measurement of transmission characterist method, shown in Figure 1, concrete implementation step is as follows:
(1) the infrared electromagnetic wave transparent material of sapphire being used for making medium-wave infrared wave transparent window is made treadmill test part, thickness is Δ win, two side plane plating anti-reflection films.
(2) require temperature according to the measurement of the infrared electromagnetic wave transparent material testpieces of application analysis, select measurement to require temperature set T={100,150,200,250,300,350} at this, unit is DEG C, and selects surface source blackbody temperature T binitial value be 0 DEG C.First selected first measurement requires temperature T=100 DEG C
(3) infrared electromagnetic wave transparent material treadmill test part is placed in high-temperature heater, arranging furnace temp is that measurement requires temperature T=100 DEG C, after heating furnace reaches set temperature, insulation a period of time (about 30 minutes), makes testpieces bulk temperature distribute more even;
(4) temperature of extend blackbody is set to assigned temperature T b=0 DEG C, after surface source blackbody temperature is stable, adopt Infrared survey instrument measure extend blackbody wave band Δ λ infrared radiation L Δ λ, obj.In this specific embodiment, the SC7300M medium-wave infrared thermal imaging system of FLIR company selected by Infrared survey instrument, response wave band Δ λ=3.7 ~ 4.8um, measures the transmitance and self heat radiation this wave band all corresponding that obtain.
(5) from high-temperature heater, take out infrared electromagnetic wave transparent material treadmill test part, and be positioned between extend blackbody and thermal infrared imager, optical path passes perpendicularly through treadmill test part, adopts the extend blackbody infrared radiation L of infrared heat image instrument measuring permeability test part Δ λ, tot.
(6) surface source blackbody temperature T is improved b, amplitude is 20 DEG C, but keeps the measurement of treadmill test part to require that temperature T is constant, repeat (3)-(5), measure the ir radiation data of the different surface source blackbody temperature of many groups, until there is saturated phenomenon in thermal infrared imager, the measurement data L that saturated phenomenon is corresponding Δ λ, objand L Δ λ, totinvalid.Improve surface source blackbody temperature T bafter, L Δ λ, objor L Δ λ, totthere is one not change, then think saturated phenomenon.
(7) according to the effective measurement data L of infrared electromagnetic wave transparent material treadmill test part at temperature T Δ λ, objand L Δ λ, tot, adopt least square method linear fit, namely
L Δ λ , t o t = L Δ λ , o b j · τ Δ λ , w i n T + L Δ λ , w i n T
So fitting parameter of this linear relationship with be respectively testpieces under temperature T, the transmitance of corresponding wave band Δ λ and self heat radiation, if Fig. 2 is the infrared electromagnetic wave transparent material testpieces of sapphire measurement data linear fit when temperature is 100 DEG C, slope is the transmitance of testpieces, is self heat radiation of testpieces with the intersection point of Y-axis.
(8) according to measuring the infrared electromagnetic wave transparent material microlayer thickness Δ required expwith infrared electromagnetic wave transparent material treadmill test part thickness deltat wincalculate highest common factor Δ com, then calculate hierarchy number infrared electromagnetic wave transparent material treadmill test part through-thickness is divided into n layer, and so thickness is Δ cominfrared electromagnetic wave transparent material transmitance with self heat radiation be respectively
τ Δ λ , w i n T , Δ co m = τ Δ λ , w i n T n
L Δ λ , w i n T , Δ c o m = L Δ λ , w i n T Σ i = 1 n ( τ Δ λ , w i n T , Δ c o m ) i - 1
(9) if thickness deltat comwith measurement required thickness Δ expunanimously, the transmitance of so infrared electromagnetic wave transparent material with self heat radiation
τ Δ λ , w i n T , Δ exp = τ Δ λ , w i n T , Δ c o m
L Δ λ , w i n T , Δ exp = L Δ λ , w i n T , Δ c o m
If thickness deltat comwith measurement required thickness Δ expinconsistent, according to both multiples computation and measurement required thickness Δ expradiation characteristic transmitance with self heat radiation namely
τ Δ λ , w i n T , Δ exp = ( τ Δ λ , w i n T , Δ c o m ) m
L Δ λ , w i n T , Δ exp = L Δ λ , w i n T , Δ c o m · Σ k = 1 m ( τ Δ λ , w i n T , Δ c o m ) k - 1
(10) specify next measurement to require temperature T, surface source blackbody temperature gets back to initial value T b=0 DEG C, repeat (3)-(9), measure and obtain the radiation characteristic transmitance of infrared electromagnetic wave transparent material under other measurements require temperature T with self heat radiation until all measurements require that temperature T measurement is complete, the infrared electromagnetic wave transparent material testpieces of sapphire transmitance at different temperatures and self heat radiation are as Fig. 3 and Fig. 4, the infrared electromagnetic wave transparent material of 0.1 millimeters thick sapphire transmitance at different temperatures and self heat radiation, as shown in Figure 5 and Figure 6.
Infrared survey instrument is thermal infrared imager, infrared radiation timing, obtains the infrared electromagnetic wave transparent material radiation transport property of corresponding infrared response wave band.
Infrared survey instrument also can be infrared spectrometer, now can repeat (3)-(10) to each spectrum point, obtains transmitance and self thermal-radiating spectral characteristic of infrared electromagnetic wave transparent material treadmill test part.
The content be not described in detail in instructions of the present invention belongs to the known technology of those skilled in the art.

Claims (3)

1. an infrared electromagnetic wave transparent material radiation measurement of transmission characterist method, is characterized in that, comprise,
S1, is made into treadmill test part by infrared electromagnetic wave transparent material, two side plane plating anti-reflection films;
S2, is heated to measurement by treadmill test part and requires temperature T;
S3, the temperature of adjustment extend blackbody is to T b, adopt Infrared survey instrument to measure the infrared radiation L of extend blackbody at response wave band Δ λ Δ λ, obj;
S4, be positioned over by treadmill test part between extend blackbody and Infrared survey instrument, optical path passes perpendicularly through treadmill test part, adopts Infrared survey instrument to measure the extend blackbody infrared radiation L of permeability test part at response wave band Δ λ Δ λ, tot;
S5, changes T b, repeat S2 to S4, measure the ir radiation data L of the different surface source blackbody temperature of at least two groups Δ λ, objand L Δ λ, tot, until there is saturated phenomenon in Infrared survey instrument;
S6, according to the measurement data L of testpieces at temperature T Δ λ, objand L Δ λ, tot, carry out linear fit, obtain infrared electromagnetic wave transparent material treadmill test part and measuring the transmitance requiring temperature T, response wave band Δ λ with self heat radiation fitting formula is:
L Δ λ , t o t = L Δ λ , o b j · τ Δ λ , w i n T + L Δ λ , w i n T ;
S7, measures required thickness Δ according to infrared electromagnetic wave transparent material expwith infrared electromagnetic wave transparent material treadmill test part thickness deltat wincalculate highest common factor Δ com, obtain hierarchy number calculated thickness is Δ cominfrared electromagnetic wave transparent material transmitance with self heat radiation be respectively
τ Δ λ , w i n T , Δ c o m = τ Δ λ , w i n T n
L Δ λ , w i n T , Δ c o m = L Δ λ , w i n T Σ i = 1 n ( τ Δ λ , w i n T , Δ c o m ) i - 1
S8, according to what calculate computation and measurement required thickness is Δ expthe transmitance of infrared electromagnetic wave transparent material with self heat radiation be respectively
τ Δ λ , w i n T , Δ e x p = ( τ Δ λ , w i n T , Δ c o m ) m
L Δ λ , w i n T , Δ e x p = L Δ λ , w i n T , Δ c o m · Σ k = 1 m ( τ Δ λ , w i n T , Δ c o m ) k - 1 ;
S9, specifies new treadmill test part measurement to require temperature T, repeats S2 to S8, calculate multiple measurement require temperature under the transmitance of infrared electromagnetic wave transparent material and self heat radiation; Until measure, to require temperature all to measure complete.
2. one according to claim 1 infrared electromagnetic wave transparent material radiation measurement of transmission characterist method, is characterized in that, described Infrared survey instrument is infrared spectrometer or infrared thermoviewer or infrared radiometer.
3., according to the one infrared electromagnetic wave transparent material radiation measurement of transmission characterist method of claim 1 or 2, it is characterized in that, described infrared electromagnetic wave transparent material is germanium, sapphire or chalcogenide glass.
CN201510633286.1A 2015-09-29 2015-09-29 A kind of infrared electromagnetic wave transparent material radiation measurement of transmission characterist method Pending CN105223230A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510633286.1A CN105223230A (en) 2015-09-29 2015-09-29 A kind of infrared electromagnetic wave transparent material radiation measurement of transmission characterist method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510633286.1A CN105223230A (en) 2015-09-29 2015-09-29 A kind of infrared electromagnetic wave transparent material radiation measurement of transmission characterist method

Publications (1)

Publication Number Publication Date
CN105223230A true CN105223230A (en) 2016-01-06

Family

ID=54992303

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510633286.1A Pending CN105223230A (en) 2015-09-29 2015-09-29 A kind of infrared electromagnetic wave transparent material radiation measurement of transmission characterist method

Country Status (1)

Country Link
CN (1) CN105223230A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106066340A (en) * 2016-05-24 2016-11-02 南京航空航天大学 A kind of analogue experiment method measuring solid target infrared signature in normal temperature environment
CN106501305A (en) * 2016-10-18 2017-03-15 上海大学 Measuring method based on the infra-red radiation film transmission rate of thermal infrared imager
CN109708853A (en) * 2019-02-27 2019-05-03 长春理工大学 A kind of integral transmitance of infrared transmittivity piece determines method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103185707A (en) * 2013-01-12 2013-07-03 中国兵器工业第二0五研究所 Optical material high temperature transmittance testing device
CN104007137A (en) * 2014-04-30 2014-08-27 中国人民解放军63983部队 Device and method for measuring infrared thermal transmittance of camouflage screen
CN104833695A (en) * 2015-05-14 2015-08-12 电子科技大学 Infrared thermal imaging technology-based method for measuring heat conductivity of sheet metal based on

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103185707A (en) * 2013-01-12 2013-07-03 中国兵器工业第二0五研究所 Optical material high temperature transmittance testing device
CN104007137A (en) * 2014-04-30 2014-08-27 中国人民解放军63983部队 Device and method for measuring infrared thermal transmittance of camouflage screen
CN104833695A (en) * 2015-05-14 2015-08-12 电子科技大学 Infrared thermal imaging technology-based method for measuring heat conductivity of sheet metal based on

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
王亚辉 等: "红外窗口材料的热辐射特性测量方法", 《北京航空航天大学学报》 *
王亚辉 等: "高超声速飞行器红外窗口热辐射特性试验", 《红外和激光工程》 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106066340A (en) * 2016-05-24 2016-11-02 南京航空航天大学 A kind of analogue experiment method measuring solid target infrared signature in normal temperature environment
CN106501305A (en) * 2016-10-18 2017-03-15 上海大学 Measuring method based on the infra-red radiation film transmission rate of thermal infrared imager
CN106501305B (en) * 2016-10-18 2019-05-28 上海大学 The measurement method of infra-red radiation film transmission rate based on thermal infrared imager
CN109708853A (en) * 2019-02-27 2019-05-03 长春理工大学 A kind of integral transmitance of infrared transmittivity piece determines method

Similar Documents

Publication Publication Date Title
Zhang et al. A method for reducing the influence of measuring distance on infrared thermal imager temperature measurement accuracy
CN103076101B (en) Method for calibrating thermal infrared imager pixel point
CN104266762A (en) Site target emissivity measuring system and method based on environmental radiation change
CN103439003A (en) Infrared temperature measurement accuracy improving method
CN103675019B (en) A kind of method of thermal infrared imager Quick Measurement material surface emissivity by virtue
CN107817054B (en) Temperature measurement method of infrared imager for parts in vacuum cavity
CN105628208B (en) A kind of thermometry based on infrared imaging system
CN104155008A (en) Method for correcting measuring errors of infrared temperature monitoring system
CN102620833B (en) Infrared temperature measurement method and infrared temperature measurement system
CN103335717B (en) A kind of thermal infrared imager high precision temperature resistance drift temp measuring method based on becoming integral mode
CN105352988A (en) System for evaluating thermal insulation performance of exterior wall of building and method thereof
CN105223230A (en) A kind of infrared electromagnetic wave transparent material radiation measurement of transmission characterist method
Zhang et al. The research on the effect of atmospheric transmittance for the measuring accuracy of infrared thermal imager
CN103983365B (en) Multi-measuring-head transient radiation heat flow meter and measuring method for thermal radiation heat flow density
CN105004754A (en) Emissivity measurement method
CN105223229A (en) A kind of infrared wave transparent window radiation measurement of transmission characterist platform
CN201892573U (en) Near-infrared radiation thermometer
CN106370311A (en) Temperature measuring device and measuring method for thermal analyzer
CN116183036A (en) Method for correcting background radiation response of short wave infrared band of polarized remote sensor
Vollmer et al. Characterization of IR cameras in student labs
CN206339310U (en) The measurement apparatus of smooth surface Temperature Distribution
Yuan et al. Modeling of the Mid-wave Infrared Radiation Characteristics of the Sea surface based on Measured Data
Yuan et al. An empirical method for improving accuracy of human eye temperature measured by uncooled infrared thermal imager
Chen et al. An in situ online methodology for emissivity measurement between 100° C and 500° C utilizing infrared sensor
CN112362168B (en) Body temperature measuring method, device, system and storage medium

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20160106