CN103185707A - Optical material high temperature transmittance testing device - Google Patents
Optical material high temperature transmittance testing device Download PDFInfo
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- CN103185707A CN103185707A CN2013100317229A CN201310031722A CN103185707A CN 103185707 A CN103185707 A CN 103185707A CN 2013100317229 A CN2013100317229 A CN 2013100317229A CN 201310031722 A CN201310031722 A CN 201310031722A CN 103185707 A CN103185707 A CN 103185707A
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Abstract
The invention discloses an optical material high temperature transmittance testing device. The device adopts a silicon carbide rod as an infrared source, adopts a narrow band filter for filtering and providing infrared monochromatic light, adopts a chopper to modulate the infrared light, adopts a precise temperature control furnace to heat a sample material, uses the alternating current phase locked amplification technology to measure an infrared signal, and uses a planar reflecting mirror group to split one beam of infrared light into two beams for a sample light path and a reference light path respectively. As a result, the high temperature transmittance of the infrared band with temperature ranging from room temperature to 700 DEG C and wavelength ranging from 1 micron to 14 microns can be measured.
Description
Technical field
The present invention relates to the optical material transmission measurement device in a kind of optical metrology and the fields of measurement, relate in particular to a kind of infrared band optical material high temperature transmitance measurement mechanism.
Background technology
Transmitance is one of the most basic optical performance parameter of optical material, also is simultaneously the basis of optical system design, no matter is that optical design is used or optical material production, all must accurately measure the transmitance value of optical material.
Because optical system is generally operational in normal temperature condition, only measure the transmitance of optical material at ambient temperature usually for this reason.But in some special application field, as guided missile dome, because the high-speed flight of aircraft, dome material can temperature raise rapidly under aerodynamic effect, the temperature of fluoran stream surface even can reach hundreds of degree centigrade.After temperature raise, remarkable change can take place in the transmitance performance of optical material, and was particularly outstanding for its change of infrared optical material.Along with the rising of temperature, the infrared transmission performance of material obviously descends, and is example with infrared germanium material, and under normal temperature condition, the transmitance of mid and far infrared wave band can reach more than 45%, and after the temperature of material only is elevated to 60 ℃, the just obvious variation of light transmission rate; If material temperature further raises, as after reaching 300 ℃, almost completely opaque to the infrared light of far infrared band, and the light transmission rate of middle-infrared band also drops to less than 20%.
The reduction of dome material transmitance weakens the infrared signal that arrives its inner electro-optical weapons system through radome fairing, and the consequence of generation is exactly to cause the operating distance of electro-optical weapons system to shorten, and performance descends.If the speed of aircraft further improves, the temperature of window material further improves, and makes window material opaque to the infrared light of a certain wave band, and it is blind to cause its inner electro-optical system thoroughly to be lost, and can't work.Therefore, must measure the high temperature transmitance of optical material.
At present, the infrared optical material transmitance is general uses infrared fourier transform spectrophotometer to measure.But for the transmitance of measuring optical material under the hot conditions just must be useful on heated sample material heating equipment, and infrared Fourier spectrophotometer does not have the high temperature firing equipment.On the other hand, under hot conditions, infrared optical material self also can become an infrared origin, also outside irradiating infrared light, this a part of infrared light is superimposed with the infrared light that is used for measuring, detector can't be distinguished this two parts infrared signal, thereby causes equipment can't accurately measure the transmitance of material.Therefore infrared fourier transform spectrophotometer can only be measured the transmitance of optical material under the room temperature condition, and the transmitance that is not suitable for material under the hot conditions is measured.
In order to realize that the optical material transmitance is measured under the hot conditions, producer and the user of material often adopt easy method at present, after namely utilizing heating furnace that sample is heated to a certain temperature, taking-up is placed in the air, put into light path rapidly, measure after sample is put into light path, the change situation of signal is calculated transmitance.Because sample temperature after leaving firing equipment can reduce rapidly, thereby measurement result can not reflect the light transmission rate of material under the true temperature, measurement result can only be obtained to measure qualitatively, the quantitative measurment of 700 ℃ of optical material high temperature of temperature transmitance can't be realized.
Summary of the invention
The technical problem to be solved in the present invention is according to the measuring principle of transmitance, to provide a kind of infrared optical material high temperature transmitance measurement mechanism.
For solving the problems of the technologies described above, infrared optical material high temperature transmitance measurement mechanism provided by the invention comprises infrared light supply system, plane mirror group one, accurate temperature controlling stove, plane mirror group two, focusing mirror, the photodetection disposal system that contains infrared eye, prime amplifier, lock-in amplifier and controller, and the built-in computing machine of transmitance Survey Software bag;
Described infrared light supply system contains infrared light supply, collimating mirror, chopper and filter set, and filter set comprises the different narrow band pass filter of a group switching centre wavelength;
Described accurate temperature controlling stove left side wall has two and goes into perforation, right side wall has with two goes into perforation two perforation holes of symmetry one by one, two alundum tubes run through the furnace chamber of accurate temperature controlling stove and two ends respectively by going into accordingly in perforation and the perforation hole to stretch out, and wherein an alundum tube is used for placing sample;
Described plane mirror group one has identical structure with described plane mirror group two, all contain electronic control translation stage and two plane mirrors being parallel to each other of surface, two plane mirrors are connected and are on its corresponding electronic control translation stage and from the horizontal by 45 ° of angles;
The infrared light that described infrared light supply sends collimates the directional light that becomes with horizontal direction parallel through collimating mirror, this directional light is modulated into the infrared beam of alternation by chopper, this infrared beam becomes monochromatic infrared light through corresponding narrow band pass filter, when moving into, plane mirror group one measures light path, and plane mirror group two is positioned at when measuring outside the light path, monochromatic infrared light enters an alundum tube through one reflection of plane mirror group, is directly focused on the target surface of infrared eye by focusing mirror by the monochromatic infrared light of this alundum tube outgoing;
When described plane mirror group one shifts out the measurement light path, and described plane mirror group two moves into when measuring light path, monochromatic infrared light directly enters another alundum tube, is focused on the target surface of infrared eye by focusing mirror after two reflections of plane mirror group by the monochromatic infrared light of this alundum tube outgoing; Infrared eye is converted to electric signal with light signal, this electric signal after prime amplifier amplifies, through lock-in amplifier the signal of corresponding frequencies is locked again and amplify after send into computing machine; Controller drives two electronic control translation stages and moves accordingly under the control of computing machine;
Described transmitance Survey Software includes interface module, control module, acquisition module, computing module and memory module, and the function of interface module is, by measurement wavelength, sample measurement temperature, the sample title of keyboard acceptance test personnel setting; The function of control module is that the measurement wavelength driving filter set rotation according to setting makes the narrow band pass filter incision of respective wavelength measure light path, instructs to the driving that controller sends corresponding automatically controlled platform according to measuring sequential; The function of acquisition module is that four groups of voltage signals gathering lock-in amplifier output are namely measured one group of background voltage value of light path one, measured one group of measuring voltage value of one group of background voltage value of light path two, one group of measuring voltage value measuring light path one, measurement light path two; The function of computing module, calculate the transmitance T of sample under Current Temperatures, current wavelength according to formula T=(V2/V02)/(V1/V01) or T=(V1/V01)/(V2/V02), wherein, the average background magnitude of voltage that V01, V02 are respectively and measure light path one, measure light path two, V1, V2 are respectively the average measurement magnitude of voltage of measuring light path one and measuring light path two, sample is put into the measurement light path and is used last calculating formula for the moment, and sample is put into when measuring light path two with back one calculating formula; The function of memory module is to store the measurement data in the measuring process, and transmitance measurement result T is stored as the Excell file.
Beneficial effect of the present invention is embodied in following three aspects.
(1) the present invention has adopted phase lock amplifying technology that the high temperature transmitance of optical material is measured, and has avoided because tested optical material temperature rising back self produces the problem that the transmitance that stack causes of the infrared radiation of infrared radiation and measuring-signal light path can't be measured.Realized that wavelength coverage is 1 μ m～14 μ m, temperature range is that the infrared optical material high temperature transmitance of room temperature～700 ℃ is accurately measured.
(2) adopt accurate temperature controlling stove that specimen material is heated up and temperature control, can be in room temperature～700 ℃ well the specimen material temperature be controlled, can obtain the transmitance of the material under the arbitrary temp; Sample heats for a long time and is incubated at accurate temperature controlling stove, make material reach thermal equilibrium fully, in addition, adopt the mode of radiation heating that optical material is heated, but not heat conducting mode directly utilizes heating module that sample is heated, these two measures make sample have good temperature homogeneity when measuring, and have improved the transmitance accuracy of measurement.
(3) utilize the plane mirror group that infrared light supply is divided into two bundles, a branch of as measuring light path, a branch of conduct is with reference to light path, utilize detector to receive respectively behind the transmission sample and from the light signal of light source, thereby can real-time monitor the variation of system's intensity of light source in the long course of work, avoided since the drift of infrared light supply and the transmissivity of optical system and the variation of reflectivity etc. to the influence of transmitance measurement result.Particularly measure for the high temperature transmitance, in long heating and measuring process, bigger variation can take place in the reflectivity of optical system components, transmissivity, and the intensity of infrared light supply also can be drifted about, if adopt monochromatic light road rule to revise the variation of system self light signal strength, therefore further improved the transmitance measurement accuracy.
Description of drawings
Fig. 1 is that the system of high temperature transmitance measurement mechanism of the present invention constitutes synoptic diagram.
Fig. 2 is the composition synoptic diagram of mid-infrared light origin system shown in Figure 1.
Fig. 3 is the composition synoptic diagram of midplane catoptron group one shown in Figure 1.
Fig. 4 is the composition synoptic diagram of accurate temperature controlling stove.
Fig. 5 is the composition synoptic diagram of midplane catoptron group two shown in Figure 1.
Fig. 6 is the synoptic diagram that concerns of focusing mirror and detector.
Fig. 7 is detection system principle of compositionality figure.
Fig. 8 is the workflow diagram of transmitance Survey Software bag among the present invention.
Embodiment
The invention will be further described below in conjunction with accompanying drawing and preferred embodiment.
As shown in Figure 1, the high temperature transmitance measuring instrument of the preferred embodiment of the present invention is by infrared light supply system, plane mirror group one, accurate temperature controlling stove, and plane mirror group two, focusing mirror, photodetection disposal system and computing machine constitute.
According to shown in Figure 2, the infrared light supply system comprises infrared light supply 1-1, collimating mirror 1-4, imaging len 1-2, plane mirror 1-3, chopper 1-5, filter set 1-6, and infrared light supply 1-1 is the Elema lamp, and collimating mirror 1-4 is off-axis parabolic mirror.The Elema lamp uses the accurate constant-current source power supply of direct current, and continuous infrared light is provided.The infrared beam that the Elema lamp sends converges to plane mirror 1-3 place by imaging len 1-2, and the effect of imaging len 1-2 is the utilization factor that improves the Elema lamp.Plane mirror 1-3 is positioned at the place, focal position of off-axis parabolic mirror, becomes directional light after the reflection through collimating mirror 1-4 again through the infrared beam after the plane mirror 1-3 reflection.Chopper 1-5 is arranged in parallel light path, and directional light is modulated, and makes it become the infrared light of alternation.Filter set 1-6 is positioned at after the chopper, and filter set is that one group of wavelength coverage contains the narrow band pass filter of different centre wavelengths at 1 μ m～14 μ m, becomes monochromatic light through continuous light behind the narrow-band-filter.The end face of chopper and narrow band pass filter is all vertical with parallel infrared light, selects suitable narrow band pass filter according to necessary wavelength, has just obtained the monochromatic collimated beam under a certain wavelength.In this preferred embodiment, filter set contains 10 altogether, and centre wavelength has comprised that the wavelength at 1 μ m, 14 μ m two ends has comprised optical maser wavelength commonly used at present simultaneously, as 1.064 μ m, 1.54 μ m, 3.39 μ m and 10.6 μ m.
According to shown in Figure 3, plane mirror group one comprises electronic control translation stage 2-1, the first plane mirror 2-2 and the second plane mirror 2-3.The first plane mirror 2-2 and the second plane mirror 2-3 all connect firmly on electronic control translation stage 2-1, and the both ends of the surface of two plane mirrors are parallel.The reflecting surface of the first plane mirror 2-2 and the second plane mirror 2-3 and optical axis angle at 45 from the directional light of infrared light supply system outgoing.
According to shown in Figure 4, accurate temperature controlling stove is used for placing tested optical material.Adopt the structure of enclosure-type, be incubated with the asbestos tile material, utilize resistance wire to heat.Be with common high-temperature heater structure difference, the hole that the burner hearth left and right sides symmetry of accurate temperature controlling stove is opened two groups of Φ 30mm, for the light path design that cooperates plane mirror group one and the flat-temperature zone that rationally utilizes temperature controlling stove, two pitchs of holes are 80mm.The internal capacity of the burner hearth of accurate temperature controlling stove is length * height * wide=200mm * 130mm * 320mm.Use two length to run through burner hearth as Φ 30mm, internal diameter as the alundum tube of Φ 26mm as 600mm, external diameter, the upside of burner hearth and downside coiling resistance wire are used for the whole burner hearth of heating.Can obtain the flat-temperature zone that area is about 100mm * 100mm in burner hearth, sample just is placed in the flat-temperature zone.The temperature homogeneity of flat-temperature zone is better than 5 ‰, and temperature-controlled precision is ± 1 ℃.Accurate temperature controlling stove adopts the digital pid temperature control method, and maximum heating temperature can reach 1100 ℃, considers the serviceability temperature of present most optical materials less than 700 ℃, in this preferred embodiment, has only measured the transmitance of material below 700 ℃.
The hole end surface (being alundum tube perforate end face) of accurate temperature controlling stove is vertical with the directional light optical axis that the infrared light supply system produces, then the directional light of infrared light supply system generation just can from accurate temperature controlling stove go into perforation one incident, from accurate temperature controlling stove perforation hole one outgoing.To be processed into diameter be Φ 25mm to tested optical material in this preferred embodiment, and thickness is the circular print of 3mm, the both ends of the surface polishing of print.Print is placed in the stainless steel structure, utilizes a stock that this is pushed into the alundum tube inside center position of temperature controlling stove.Print can be positioned in any alundum tube of the alundum tube one of accurate temperature controlling stove or alundum tube two.In this preferred embodiment, print is positioned in the alundum tube two.By target temperature and the temperature stabilization time of setting accurate temperature controlling stove, can be with the control of print temperature stabilization at the required target temperature of test.
According to shown in Figure 5, plane mirror group two is identical with the structure of plane mirror group one, and plane mirror group two also comprises electronic control translation stage 4-1, the 3rd plane mirror 4-2 and the face catoptron 4-3 of Siping City.The 3rd plane mirror 4-2 and the face catoptron 4-3 of Siping City all connect firmly on electronic control translation stage 4-1, and the both ends of the surface of two plane mirrors are parallel.The reflecting surface of the 3rd plane mirror 4-2 and the face catoptron 4-3 of Siping City and optical axis angle at 45 from the directional light of infrared light supply system outgoing.
The perforates distance that the first plane mirror 2-2 of plane mirror group one and the centre distance of the second plane mirror 2-3 and temperature controlling stove two go into perforation equates and is 80mm.The centre distance of the 3rd plane mirror 4-2 of plane mirror group two and the face catoptron 4-3 of Siping City also equates with the perforate of two perforation holes of temperature controlling stove distance and also is 80mm.
According to shown in Figure 6, focusing mirror 5 is off axis paraboloidal mirror, and it will focus on the detector photosurface from the directional light of accurate temperature controlling stove perforation hole outgoing.Effective clear aperture of off axis paraboloidal mirror is 50mm, and focal length is 120mm, is 30 ° from the axle degree.The off axis paraboloidal mirror center is aimed at accurate temperature controlling stove perforation hole two.
After plane mirror group one moves in the collimated light path, the directional light that is produced by the infrared light supply system will the reflection through the first plane mirror 2-2 of plane mirror group one and the second plane mirror 2-3 after, go into perforation two incidents by accurate temperature controlling stove, from accurate temperature controlling stove perforation hole two outgoing, directly project on the off axis paraboloidal mirror.After plane mirror group one shifts out collimated light path, plane mirror group two is moved into light path, the directional light that the infrared light supply system produces just can be from accurate temperature controlling stove go into perforation one incident, from accurate temperature controlling stove perforation hole one outgoing, after passing through the reflection of the 3rd plane mirror 4-2 of plane mirror group two and the face catoptron 4-3 of Siping City again, project on the off axis paraboloidal mirror.Adopt the advantage of two groups of plane mirror groups to be that two-beam has all experienced identical light path, make two-beam have good symmetry.
In this preferred embodiment, all reflective optical devices all adopt K
9Glass is made, light receiving surface polishing and plating highly reflecting films, and in the wavelength coverage of 1 μ m～14 μ m, reflectivity reaches 98%.
According to shown in Figure 7, the photodetection disposal system comprises infrared eye 6-2, diaphragm 6-1 and contains prime amplifier 6-3 and the detectable signal treatment circuit of lock-in amplifier 6-4.The spectral response range of infrared eye 6-2 is 1 μ m～14 μ m, diaphragm 6-1 is fixed on the position of the preceding 1mm of detector 6-2, the focus of off axis paraboloidal mirror overlaps with diaphragm 6-1, then can avoid extraneous parasitic light to arrive on the photosurface of detector 6-2, thereby improve the signal to noise ratio (S/N ratio) of photodetection disposal system.The signal of infrared eye 6-2 output is sent into prime amplifier 6-3 and is amplified, and the signal after the amplification is input to be done in the lock-in amplifier 6-4 further to amplify.The reference frequency of lock-in amplifier 6-4 equates with the modulating frequency of chopper 1-5, only the frequency light signal identical with the modulating frequency of chopper 1-5 carried out filtering and amplification, and the heat radiation that under hot conditions, produces for specimen material, because this thermal radiation signal is direct current signal, lock-in amplifier 6-4 can carry out filtering to direct current signal to be handled, thereby what measure only is that the infrared light supply system sends and by the infrared signal of specimen material transmission, just useful infrared signal and background infrared radiation signal can be separated accordingly, thereby realize the measurement of optical material high temperature transmitance.Signal is input in the computing machine and handles after the processing of process lock-in amplifier 6-4.
Electronic control translation stage 2-1 all links to each other with controllor for step-by-step motor 6-6 with electronic control translation stage 4-1, and controllor for step-by-step motor links to each other with computer processing system.
Computing machine is equipped with transmitance Survey Software bag.Computing machine is connected with lock-in amplifier 6-4, controller 6-6 by the RS232 interface.Transmitance Survey Software bag is divided by function, contains interface module, control module, acquisition module, computing module and memory module.
The major function of interface module is: by measurement wavelength, sample measurement temperature, the sample title of keyboard acceptance test personnel setting; The function of control module is, the measurement wavelength of setting according to interface module drives the filter set rotation, make the narrow band pass filter incision of specified wavelength measure light path, instruct to the driving that controller sends corresponding automatically controlled platform according to measuring sequential, carry out the translation of horizontal direction to drive electronic control translation stage 2-1 and electronic control translation stage 4-1, thereby make focusing mirror 5 aim at accurate temperature controlling stove perforation hole one and perforation hole two corresponding light paths respectively.The function of acquisition module is, gather four groups of digital voltage signals of lock-in amplifier output by the RS232 interface, these four groups of digital voltage signals are respectively: namely measure one group of background voltage value and one group of measuring voltage value of light path one from perforation hole one, namely measure one group of background voltage value and one group of measuring voltage value of light path two from perforation hole two; Measure the background signal of light path one and measuring-signal and be to enter in plane mirror group one and measure light path and plane mirror group two shifts out and obtains under the prerequisite of measuring light path, measure the background signal of light path two and measuring-signal and be to enter in plane mirror group two and measure light path and plane mirror group one shifts out under the prerequisite of measuring light path and obtains.The function of computing module, calculate the transmitance T of sample under Current Temperatures, current wavelength according to formula T=(V2/V02)/(V1/V01), wherein, the average background magnitude of voltage that V01, V02 are respectively and measure light path one, measure light path two, V1, V2 are respectively the average measurement magnitude of voltage of measuring light path one and measuring light path two; The function of memory module is to store the measurement data in the measuring process, and transmitance measurement result T is stored as the Excell file.The workflow of transmitance Survey Software bag is seen shown in Figure 8.
This preferred embodiment has been realized infrared optical material high temperature transmitance in 1 μ m～14 mu m waveband wavelength coverages is accurately measured, and high temperature transmitance uncertainty of measurement reaches 2%.
Claims (4)
1. optical material high temperature transmission measurement device, comprise the infrared light supply system, focusing mirror (5), contain infrared eye (6-2), prime amplifier (6-3), the photodetection disposal system of lock-in amplifier (6-4) and controller (6-6), and the built-in computing machine of transmitance Survey Software bag, described infrared light supply system contains infrared light supply (1-1), collimating mirror (1-4), chopper (1-5) and filter set (1-6), filter set (1-6) comprises the different narrow band pass filter of a group switching centre wavelength, the infrared light that described infrared light supply (1-1) sends collimates the directional light that becomes with horizontal direction parallel through collimating mirror (1-4), this directional light is modulated into the infrared beam of alternation by chopper (1-5), and this infrared beam becomes monochromatic infrared light through corresponding narrow band pass filter; It is characterized in that: also comprise accurate temperature controlling stove, plane mirror group one and plane mirror group two;
The left side wall of described accurate temperature controlling stove has two and goes into perforation, right side wall has with two goes into perforation two perforation holes of symmetry one by one, two alundum tubes run through accurate temperature controlling stove furnace chamber and two ends respectively by going into accordingly in perforation and the perforation hole to stretch out, and wherein an alundum tube is used for placing sample;
Described plane mirror group one has identical structure with described plane mirror group two, all contain electronic control translation stage and two plane mirrors being parallel to each other of surface, two plane mirrors are connected and are on its corresponding electronic control translation stage and from the horizontal by 45 ° of angles;
When moving into, described plane mirror group one measures light path, and described plane mirror group two is positioned at when measuring outside the light path, described monochromatic infrared light enters an alundum tube through one reflection of plane mirror group, monochromatic infrared light by this alundum tube outgoing is directly focused on the target surface of infrared eye by described focusing mirror, when plane mirror group one shifts out the measurement light path, and plane mirror group two moves into when measuring light path, described monochromatic infrared light directly enters another alundum tube, is focused on the target surface of infrared eye (6-2) by described focusing mirror (5) after two reflections of plane mirror group by the monochromatic infrared light of this alundum tube outgoing; Described infrared eye (6-2) is converted to electric signal with light signal, this electric signal after prime amplifier (6-3) amplifies, pass through again lock-in amplifier (6-4) signal of corresponding frequencies is locked and amplify after send into computing machine (6-5); Controller (6-6) drives two electronic control translation stages and moves accordingly under the control of computing machine (6-5);
Described transmitance Survey Software includes interface module, control module, acquisition module, computing module and memory module, and the function of interface module is, by measurement wavelength, sample measurement temperature, the sample title of keyboard acceptance test personnel setting; The function of control module is that the measurement wavelength driving filter set rotation according to setting makes the narrow band pass filter incision of respective wavelength measure light path, instructs to the driving that controller sends corresponding automatically controlled platform according to measuring sequential; The function of acquisition module is that four groups of voltage signals gathering lock-in amplifier output are namely measured one group of background voltage value of light path one, measured one group of measuring voltage value of one group of background voltage value of light path two, one group of measuring voltage value measuring light path one, measurement light path two; The function of computing module, calculate the transmitance T of sample under Current Temperatures, current wavelength according to formula T=(V2/V02)/(V1/V01) or T=(V1/V01)/(V2/V02), wherein, the average background magnitude of voltage that V01, V02 are respectively and measure light path one, measure light path two, V1, V2 are respectively the average measurement magnitude of voltage of measuring light path one and measuring light path two, sample is put into the measurement light path and is used last calculating formula for the moment, and sample is put into when measuring light path two with back one calculating formula; The function of memory module is to store the measurement data in the measuring process, and transmitance measurement result T is stored as the Excell file.
2. optical material high temperature transmission measurement device according to claim 1 is characterized in that: described focusing mirror 5 is off axis paraboloidal mirror.
3. optical material high temperature transmission measurement device according to claim 1, it is characterized in that: the wavelength coverage of described filter set (1-6) is 1 μ m～14 μ m, the spectral response range of described infrared eye (6-2) is 1 μ m～14 μ m.
4. optical material high temperature transmission measurement device according to claim 1, it is characterized in that: also comprise a diaphragm (6-1), described diaphragm (6-1) is positioned at the preceding 1mm of described infrared eye (6-2) place.
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103712958A (en) * | 2014-01-03 | 2014-04-09 | 哈尔滨工业大学 | Method for measuring high-temperature directional transmittance of semi-transparent solid material |
| CN104777084A (en) * | 2015-03-23 | 2015-07-15 | 中山大学 | Lock-in amplifier based gas transmission rate optical measurement method and system |
| CN105223230A (en) * | 2015-09-29 | 2016-01-06 | 北京航天自动控制研究所 | A kind of infrared electromagnetic wave transparent material radiation measurement of transmission characterist method |
| CN105223229A (en) * | 2015-09-29 | 2016-01-06 | 北京航天自动控制研究所 | A kind of infrared wave transparent window radiation measurement of transmission characterist platform |
| CN107290298A (en) * | 2017-07-17 | 2017-10-24 | 电子科技大学 | A kind of device and method that mixed gas is detected based on Fast Fourier Transform (FFT) |
| CN109060731A (en) * | 2018-06-25 | 2018-12-21 | 中国科学院西安光学精密机械研究所 | Infrared optical system spectral transmittance test device and method |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6128093A (en) * | 1998-10-08 | 2000-10-03 | Nikon Corporation | Unit for measuring optical properties |
| CN201402207Y (en) * | 2009-05-07 | 2010-02-10 | 上海师范大学附属中学 | Testing device for detecting ultraviolet transmittance of lens |
| CN202710473U (en) * | 2012-08-16 | 2013-01-30 | 英利能源（中国）有限公司 | Light transmittance testing device |
-
2013
- 2013-01-12 CN CN201310031722.9A patent/CN103185707B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6128093A (en) * | 1998-10-08 | 2000-10-03 | Nikon Corporation | Unit for measuring optical properties |
| CN201402207Y (en) * | 2009-05-07 | 2010-02-10 | 上海师范大学附属中学 | Testing device for detecting ultraviolet transmittance of lens |
| CN202710473U (en) * | 2012-08-16 | 2013-01-30 | 英利能源（中国）有限公司 | Light transmittance testing device |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103712958A (en) * | 2014-01-03 | 2014-04-09 | 哈尔滨工业大学 | Method for measuring high-temperature directional transmittance of semi-transparent solid material |
| CN103712958B (en) * | 2014-01-03 | 2015-09-09 | 哈尔滨工业大学 | The measuring method of high-temperature directional transmittance of semi-transparent solid material |
| CN104777084A (en) * | 2015-03-23 | 2015-07-15 | 中山大学 | Lock-in amplifier based gas transmission rate optical measurement method and system |
| CN104777084B (en) * | 2015-03-23 | 2018-02-16 | 中山大学 | A kind of gas permeation rate measuring method and system based on lock-in amplifier |
| CN105223230A (en) * | 2015-09-29 | 2016-01-06 | 北京航天自动控制研究所 | A kind of infrared electromagnetic wave transparent material radiation measurement of transmission characterist method |
| CN105223229A (en) * | 2015-09-29 | 2016-01-06 | 北京航天自动控制研究所 | A kind of infrared wave transparent window radiation measurement of transmission characterist platform |
| CN107290298A (en) * | 2017-07-17 | 2017-10-24 | 电子科技大学 | A kind of device and method that mixed gas is detected based on Fast Fourier Transform (FFT) |
| CN109060731A (en) * | 2018-06-25 | 2018-12-21 | 中国科学院西安光学精密机械研究所 | Infrared optical system spectral transmittance test device and method |
| CN109781671B (en) * | 2019-03-11 | 2021-11-05 | 西北核技术研究所 | Transmission rate on-line test method and device |
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