CN103185707B - Optical material high temperature transmission measurement device - Google Patents
Optical material high temperature transmission measurement device Download PDFInfo
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- CN103185707B CN103185707B CN201310031722.9A CN201310031722A CN103185707B CN 103185707 B CN103185707 B CN 103185707B CN 201310031722 A CN201310031722 A CN 201310031722A CN 103185707 B CN103185707 B CN 103185707B
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Abstract
The invention discloses a kind of optical material high temperature transmission measurement device, this device adopts Elema as infrared light supply, and adopts narrow band pass filter to filter, and provides infrared monochromatic light; Chopper is adopted to modulate infrared light; Adopt accurate temperature controlling stove heated sample material, and utilize interchange phase lock amplifying technology to measure infrared signal; Utilize plane mirror group that infrared a branch of infrared light is divided into two bundles, respectively as sample arm and reference path.Thus achieving temperature range from room temperature to 700 DEG C, wavelength coverage is from the high temperature Transmissivity measurement of 1 μm ~ 14 μm of infrared bands.
Description
Technical field
The present invention relates to the optical material transmission measurement device in a kind of optical metrology and measurement field, particularly relate to a kind of infrared band optical material high temperature Transmissivity measurement device.
Background technology
Transmitance is one of the most basic optical performance parameter of optical material, is also the basis of Optical System Design simultaneously, no matter is that optical design application or optical material are produced, all must the transmitance value of Measurement accuracy optical material.
Because optical system is generally operational in normal temperature condition, usually only measure the transmitance of optical material at ambient temperature for this reason.But in some special application field, as guided missile dome, due to the high-speed flight of aircraft, dome material temperature can raise rapidly under aerodynamic effect, and the temperature of fluoran stream surface even can reach hundreds of degree Celsius.After temperature raises, can there is remarkable change in the transmitance performance of optical material, particularly outstanding for its change of infrared optical material.Along with the rising of temperature, the infrared transmission performance of material obviously declines, and for infrared germanium material, under normal temperature condition, the transmitance of mid and far infrared wave band can reach more than 45%, and after the temperature of material is only elevated to 60 DEG C, light transmission rate is just obviously deteriorated; If material temperature raises further, after reaching 300 DEG C, almost completely opaque to the infrared light of far infrared band, and the light transmission rate of middle-infrared band also drops to less than 20%.
The reduction of dome material transmitance, makes the infrared signal arriving its inner electro-optical weapons system through radome fairing weaken, and the consequence of generation is exactly cause the operating distance of electro-optical weapons system to shorten, hydraulic performance decline.If the speed of aircraft improves further, the temperature of window material improves further, makes the infrared light of window material to a certain wave band opaque, the electro-optical system of its inside can be caused thoroughly to lose blind, cannot work.Therefore, must measure the high temperature transmitance of optical material.
At present, infrared optical material transmitance generally uses Infrared Fourier Transform spectrophotometer to measure.But just must have the firing equipment for heated sample material to measure the transmitance of optical material under hot conditions, and infrared fourier spectrophotometer does not have high-temperature heating device.On the other hand, under the high temperature conditions, infrared optical material self also can become an infrared origin, also can outside irradiating infrared light, this a part of infrared light be superimposed for the infrared light measured, detector cannot distinguish this two parts infrared signal, thus causes equipment cannot the transmitance of Measurement accuracy material.Therefore Infrared Fourier Transform spectrophotometer can only measure the transmitance of optical material under room temperature condition, is not suitable for the Transmissivity measurement of material under hot conditions.
In order to realize optical material Transmissivity measurement under hot conditions, the producer of current material and user often adopt easy method, namely after utilizing heating furnace that sample is heated to a certain temperature, take out and place in atmosphere, put into light path rapidly, measure after light path put into by sample, the change situation of signal, calculate transmitance.Because sample temperature after leaving firing equipment can reduce rapidly, thus measurement result can not reflect the light transmission rate of material under true temperature, can only obtain and measure measurement result qualitatively, the quantitative measurment of temperature 700 DEG C of optical material high temperature transmitances cannot be realized.
Summary of the invention
The technical problem to be solved in the present invention is, according to the measuring principle of transmitance, provides a kind of infrared optical material high temperature Transmissivity measurement device.
For solving the problems of the technologies described above, infrared optical material high temperature Transmissivity measurement device provided by the invention comprises infrared light supply system, plane mirror group one, accurate temperature controlling stove, plane mirror group two, focusing mirror, photodetection disposal system containing infrared eye, prime amplifier, lock-in amplifier and controller, and the built-in computing machine of Transmissivity measurement assembly;
Described infrared light supply system contains infrared light supply, collimating mirror, chopper and filter set, and filter set comprises the different narrow band pass filter of a group switching centre wavelength;
Described accurate temperature controlling stove left side wall has two entrance aperture, right side wall has two perforation holes symmetrical one by one with two entrance aperture, two alundum tubes run through the furnace chamber of accurate temperature controlling stove and two ends is stretched out by corresponding entrance aperture and perforation hole respectively, and wherein an alundum tube is for placing sample;
Described plane mirror group one has identical structure with described plane mirror group two, all contain electronic control translation stage and two plane mirrors being parallel to each other of surface, two plane mirrors be connected be its correspondence electronic control translation stage on and from the horizontal by 45 ° of angles;
The infrared light that described infrared light supply sends becomes the directional light with horizontal direction parallel through collimating mirror collimation, this directional light is modulated into the infrared beam of alternation by chopper, this infrared beam becomes monochromatic infrared light through corresponding narrow band pass filter, when plane mirror group one moves into optical path, and plane mirror group two is when being positioned at outside optical path, monochromatic infrared light enters an alundum tube through plane mirror group one reflection, directly focuses on the target surface of infrared eye by focusing mirror by the monochromatic infrared light of this alundum tube outgoing;
When described plane mirror group one shifts out optical path, and described plane mirror group two is when moving into optical path, monochromatic infrared light directly enters another alundum tube, focuses on the target surface of infrared eye by the monochromatic infrared light of this alundum tube outgoing after plane mirror group two reflects by focusing mirror; Light signal is converted to electric signal by infrared eye, and this electric signal after prime amplifier amplifies, then sends into computing machine after the signal of lock-in amplifier to corresponding frequencies locks and amplify; Controller drives two electronic control translation stages to move accordingly under control of the computer;
Described Transmissivity measurement assembly contains interface module, control module, acquisition module, computing module and memory module, and the function of interface module is, is received measurement wavelength, sample measuring tempeature, the sample ID of tester's setting by keyboard; The function of control module is, drives filter set to rotate according to the measurement wavelength of setting, makes the narrow band pass filter incision optical path of respective wavelength, sends the driving instruction of corresponding electric control platform according to measurement sequential to controller; The function of acquisition module is, gathers four groups of voltage signals of lock-in amplifier output and one group of background voltage value, one group of background voltage value of optical path two, one group of measuring voltage value of optical path one, one group of measuring voltage value of optical path two of optical path one; The function of computing module, the transmitance T of sample under Current Temperatures, current wavelength is calculated according to formula T=(V2/V02)/(V1/V01) or T=(V1/V01)/(V2/V02), wherein, V01, V02 are respectively the average background magnitude of voltage of optical path one, optical path two, V1, V2 are respectively the average measurement magnitude of voltage of optical path one and optical path two, sample is put into optical path and is for the moment used last calculating formula, and by a rear calculating formula when optical path two put into by sample; The function of memory module is, stores the measurement data in measuring process, and Transmissivity measurement result T is stored as Excell file.
Beneficial effect of the present invention is embodied in following three aspects.
(1) present invention employs the high temperature transmitance of phase lock amplifying technology to optical material to measure, avoid due to tested optical material temperature raise after self produce the infrared radiation of infrared radiation and measuring-signal light path superpose the problem that caused transmitance cannot measure.Achieving wavelength coverage is 1 μm ~ 14 μm, and temperature range is the infrared optical material high temperature transmitance Measurement accuracy of room temperature ~ 700 DEG C.
(2) adopt accurate temperature controlling stove to heat up and temperature control to specimen material, DEG C well specimen material temperature can be controlled in room temperature ~ 700, the transmitance of the material under arbitrary temp can be obtained; Sample heats for a long time at accurate temperature controlling stove and is incubated, material is made to reach thermal equilibrium completely, in addition, the mode of radiation heating is adopted to heat optical material, but not heat conducting mode directly utilizes heating module to heat sample, these two measures make sample have good temperature homogeneity when measuring, and improve Transmissivity measurement accuracy.
(3) utilize plane mirror group that infrared light supply is divided into two bundles, a branch of as optical path, a branch of as reference light path, detector is utilized to receive respectively after transmission sample and from the light signal of light source, thus the change of system intensity of light source in the long course of work can be real-time monitored, avoid the impact on Transmissivity measurement result such as change due to the drift of infrared light supply and the transmissivity of optical system and reflectivity.Particularly for high temperature Transmissivity measurement, in long heating and measuring process, larger change can be there is in reflectivity, the transmissivity of optical system components, and the intensity of infrared light supply also can be drifted about, cannot revise the change of system self light signal strength according to monochromatic light road rule, therefore further increase Transmissivity measurement accuracy.
Accompanying drawing explanation
Fig. 1 is the System's composition schematic diagram of high temperature Transmissivity measurement device of the present invention.
Fig. 2 is the composition schematic diagram of the origin system of mid-infrared light shown in Fig. 1.
Fig. 3 is the composition schematic diagram of the catoptron of midplane shown in Fig. 1 group one.
Fig. 4 is the composition schematic diagram of accurate temperature controlling stove.
Fig. 5 is the composition schematic diagram of the catoptron of midplane shown in Fig. 1 group two.
Fig. 6 is the relation schematic diagram of focusing mirror and detector.
Fig. 7 is detection system principle of compositionality figure.
Fig. 8 is the workflow diagram of Transmissivity measurement assembly in the present invention.
Embodiment
Below in conjunction with accompanying drawing and preferred embodiment, the invention will be further described.
As shown in Figure 1, the high temperature Transmissivity measurement instrument of the preferred embodiment of the present invention is by infrared light supply system, plane mirror group one, accurate temperature controlling stove, and plane mirror group two, focusing mirror, photodetection disposal system and computing machine are formed.
According to Fig. 2, infrared light supply system comprises infrared light supply 1-1, collimating mirror 1-4, imaging len 1-2, plane mirror 1-3, chopper 1-5, filter set 1-6, and infrared light supply 1-1 is Elema lamp, and collimating mirror 1-4 is off-axis parabolic mirror.Elema lamp uses the accurate constant-current source of direct current to power, and provides continuous print infrared light.The infrared beam that Elema lamp sends converges to plane mirror 1-3 place by imaging len 1-2, and the effect of imaging len 1-2 is the utilization factor improving Elema lamp.Plane mirror 1-3 is positioned at the focal position place of off-axis parabolic mirror, and the infrared beam after plane mirror 1-3 reflects becomes directional light again after the reflection of collimating mirror 1-4.Chopper 1-5 is arranged in parallel light path, modulates directional light, makes it become the infrared light of alternation.After filter set 1-6 is positioned at chopper, filter set is the narrow band pass filter of one group of wavelength coverage containing different centre wavelength in 1 μm ~ 14 μm, and after narrow-band-filter, continuous light becomes monochromatic light.Chopper is all vertical with parallel infrared light with the end face of narrow band pass filter, and the narrow band pass filter suitable according to required wavelength chooses, just obtains the monochromatic collimated beam under a certain wavelength.In the preferred embodiment, filter set is altogether containing 10, and the wavelength that centre wavelength includes 1 μm, 14 μm two ends includes optical maser wavelength conventional at present, as 1.064 μm, 1.54 μm, 3.39 μm and 10.6 μm simultaneously.
According to Fig. 3, plane mirror group one comprises electronic control translation stage 2-1, the first plane mirror 2-2 and the second plane mirror 2-3.First plane mirror 2-2 and the second plane mirror 2-3 all connects firmly on electronic control translation stage 2-1, and the both ends of the surface of two plane mirrors are parallel.The reflecting surface of the first plane mirror 2-2 and the second plane mirror 2-3 with from the optical axis of the directional light of infrared light supply system exit angle at 45 °.
According to Fig. 4, accurate temperature controlling stove is for placing tested optical material.Adopt the structure of enclosure-type, be incubated with asbestos tile material, utilize resistance wire to heat.Be with common high-temperature heating furnace structure difference, the burner hearth left and right sides of accurate temperature controlling stove symmetry opens the hole of two groups of Φ 30mm, and in order to the flat-temperature zone of the light path design and Appropriate application temperature controlling stove that coordinate plane mirror group one, two pitchs of holes are 80mm.The internal capacity of the burner hearth of accurate temperature controlling stove is length × height × wide=200mm × 130mm × 320mm.Use that two length are 600mm, external diameter is Φ 30mm, internal diameter runs through burner hearth for the alundum tube of Φ 26mm, the upper side and lower side coiling resistance wire of burner hearth, for heating whole burner hearth.Can obtain the flat-temperature zone that area is about 100mm × 100mm in burner hearth, sample is just placed in flat-temperature zone.The temperature homogeneity of flat-temperature zone is better than 5 ‰, and temperature-controlled precision is ± 1 DEG C.Accurate temperature controlling stove adopts digital pid temperature control method, and maximum heating temperature can reach 1100 DEG C, considers that the serviceability temperature of current most optical material is less than 700 DEG C, in the preferred embodiment, only measures the transmitance of less than 700 DEG C materials.
The hole end surface (i.e. alundum tube perforate end face) of accurate temperature controlling stove is vertical with the directional light optical axis that infrared light supply system produces, the directional light that then infrared light supply system produces just can be incident from the entrance aperture one of accurate temperature controlling stove, from the outgoing of accurate temperature controlling stove perforation hole one.Tested optical material is processed into diameter is in the preferred embodiment Φ 25mm, and thickness is the both ends of the surface polishing of the circular print of 3mm, print.Print is placed in stainless steel structure, utilizes a stock this to be pushed into the alundum tube inner hub location place of temperature controlling stove.Print can be positioned over through in the alundum tube one of accurate temperature controlling stove or any alundum tube of alundum tube two.In the preferred embodiment, print is positioned in alundum tube two.By setting target temperature and the temperature stabilization times of accurate temperature controlling stove, print temperature stabilization can be controlled the target temperature needed for test.
According to Fig. 5, plane mirror group two is identical with the structure of plane mirror group one, and plane mirror group two also comprises electronic control translation stage 4-1, the 3rd plane mirror 4-2 and the 4th plane mirror 4-3.3rd plane mirror 4-2 and the 4th plane mirror 4-3 all connects firmly on electronic control translation stage 4-1, and the both ends of the surface of two plane mirrors are parallel.The reflecting surface of the 3rd plane mirror 4-2 and the 4th plane mirror 4-3 with from the optical axis of the directional light of infrared light supply system exit angle at 45 °.
The perforate of the first plane mirror 2-2 of plane mirror group one and the centre distance of the second plane mirror 2-3 and two entrance aperture of temperature controlling stove is apart from equal and be 80mm.3rd plane mirror 4-2 of plane mirror group two and the centre distance of the 4th plane mirror 4-3 are also equal with the perforate distance of two perforation holes of temperature controlling stove and be also 80mm.
According to Fig. 6, focusing mirror 5 is off axis paraboloidal mirror, it by the parallel light focusing from the outgoing of accurate temperature controlling stove perforation hole on detector photosurface.Effective clear aperture of off axis paraboloidal mirror is 50mm, and focal length is 120mm, is 30 ° from axle degree.Off axis paraboloidal mirror center is aimed at accurate temperature controlling stove perforation hole two.
When plane mirror group one moves into after in collimated light path, the directional light produced by infrared light supply system is by after the first plane mirror 2-2 of plane mirror group one and the reflection of the second plane mirror 2-3, incident by the entrance aperture two of accurate temperature controlling stove, from the outgoing of accurate temperature controlling stove perforation hole two, directly project on off axis paraboloidal mirror.After plane mirror group one shifts out collimated light path, plane mirror group two is moved into light path, the directional light that infrared light supply system produces just can be incident from the entrance aperture one of accurate temperature controlling stove, from the outgoing of accurate temperature controlling stove perforation hole one, again after the 3rd plane mirror 4-2 of plane mirror group two and the reflection of the 4th plane mirror 4-3, project on off axis paraboloidal mirror.Two-beam all experienced by identical light path to adopt the advantage of two groups of plane mirror groups to be, makes two-beam have good symmetry.
In the preferred embodiment, all reflective optical devices all adopt K9 glass to make, and light receiving surface polishing also plates highly reflecting films, and in the wavelength coverage of 1 μm ~ 14 μm, reflectivity reaches 98%.
According to Fig. 7, photodetection disposal system comprises infrared eye 6-2, diaphragm 6-1 and the detectable signal treatment circuit containing prime amplifier 6-3 and lock-in amplifier 6-4.The spectral response range of infrared eye 6-2 is 1 μm ~ 14 μm, diaphragm 6-1 is fixed on the position of 1mm before detector 6-2, the focus of off axis paraboloidal mirror overlaps with diaphragm 6-1, external stray light then can be avoided to arrive on the photosurface of detector 6-2, thus improve the signal to noise ratio (S/N ratio) of photodetection disposal system.The signal that infrared eye 6-2 exports is sent into prime amplifier 6-3 and is amplified, and the signal after amplification is input in lock-in amplifier 6-4 to be done to amplify further.The reference frequency of lock-in amplifier 6-4 is equal with the modulating frequency of chopper 1-5, only identical with the modulating frequency of chopper 1-5 to frequency light signal carries out filtering and amplification, and for the heat radiation that specimen material produces under the high temperature conditions, because this thermal radiation signal is direct current signal, lock-in amplifier 6-4 can carry out filtering process to direct current signal, thus measuring what obtain is only that infrared light supply system sends and by the infrared signal of specimen material transmission, just useful infrared signal and background infrared radiation signal can be separated accordingly, thus achieve optical material high temperature Transmissivity measurement.After the process of lock-in amplifier 6-4, signal is input in computing machine and processes.
Electronic control translation stage 2-1 is all connected with controllor for step-by-step motor 6-6 with electronic control translation stage 4-1, and controllor for step-by-step motor is connected with computer processing system.
Computing machine is equipped with Transmissivity measurement assembly.Computing machine is connected with lock-in amplifier 6-4, controller 6-6 by RS232 interface.Transmissivity measurement assembly divides by function, containing interface module, control module, acquisition module, and computing module and memory module.
The major function of interface module is: the measurement wavelength, sample measuring tempeature, the sample ID that are received tester's setting by keyboard; The function of control module is, filter set is driven to rotate according to the measurement wavelength of interface module setting, make the narrow band pass filter incision optical path of specified wavelength, send the driving instruction of corresponding electric control platform to controller according to measurement sequential, with the translation driving electronic control translation stage 2-1 and electronic control translation stage 4-1 to carry out horizontal direction, thus focusing mirror 5 is made to aim at accurate temperature controlling stove perforation hole one and the light path corresponding to perforation hole two respectively.The function of acquisition module is, four groups of digital voltage signals of lock-in amplifier output are gathered by RS232 interface, these four groups of digital voltage signals are respectively: from perforation hole one i.e. one group of background voltage value of optical path one and one group of measuring voltage value, from perforation hole two i.e. one group of background voltage value of optical path two and one group of measuring voltage value; The background signal of optical path one and measuring-signal enter optical path and plane mirror group two obtains under shifting out the prerequisite of optical path in plane mirror group one, and the background signal of optical path two and measuring-signal enter optical path and plane mirror group one obtains under shifting out the prerequisite of optical path in plane mirror group two.The function of computing module, the transmitance T of sample under Current Temperatures, current wavelength is calculated according to formula T=(V2/V02)/(V1/V01), wherein, V01, V02 are respectively the average background magnitude of voltage of optical path one, optical path two, and V1, V2 are respectively the average measurement magnitude of voltage of optical path one and optical path two; The function of memory module is, stores the measurement data in measuring process, and Transmissivity measurement result T is stored as Excell file.The workflow of Transmissivity measurement assembly as shown in Figure 8.
This preferred embodiment achieves accurately to be measured infrared optical material high temperature transmitance in 1 μm ~ 14 mu m waveband wavelength coverages, and high temperature Transmissivity measurement uncertainty reaches 2%.
Claims (4)
1. an optical material high temperature transmission measurement device, comprise infrared light supply system, focusing mirror (5), containing infrared eye (6-2), prime amplifier (6-3), the photodetection disposal system of lock-in amplifier (6-4) and controller (6-6), and the built-in computing machine of Transmissivity measurement assembly, described infrared light supply system contains infrared light supply (1-1), collimating mirror (1-4), chopper (1-5) and filter set (1-6), filter set (1-6) comprises the different narrow band pass filter of a group switching centre wavelength, the infrared light that described infrared light supply (1-1) sends becomes the directional light with horizontal direction parallel through collimating mirror (1-4) collimation, this directional light is modulated into the infrared beam of alternation by chopper (1-5), this infrared beam becomes monochromatic infrared light through corresponding narrow band pass filter, it is characterized in that: also comprise accurate temperature controlling stove, plane mirror group one and plane mirror group two,
The left side wall of described accurate temperature controlling stove has two entrance aperture, right side wall has two perforation holes symmetrical one by one with two entrance aperture, two alundum tubes run through accurate temperature controlling stove furnace chamber and two ends is stretched out by corresponding entrance aperture and perforation hole respectively, and wherein an alundum tube is for placing sample;
Described plane mirror group one has identical structure with described plane mirror group two, all contain electronic control translation stage and two plane mirrors being parallel to each other of surface, two plane mirrors be connected be its correspondence electronic control translation stage on and from the horizontal by 45 ° of angles;
When described plane mirror group one moves into optical path, and described plane mirror group two is when being positioned at outside optical path, described monochromatic infrared light enters an alundum tube through plane mirror group one reflection, directly focus on the target surface of infrared eye by described focusing mirror by the monochromatic infrared light of this alundum tube outgoing, when plane mirror group one shifts out optical path, and plane mirror group two is when moving into optical path, described monochromatic infrared light directly enters another alundum tube, focus on the target surface of infrared eye (6-2) on by described focusing mirror (5) by the monochromatic infrared light of this alundum tube outgoing after plane mirror group two reflects, light signal is converted to electric signal by described infrared eye (6-2), this electric signal after prime amplifier (6-3) amplifies, then sends into computing machine (6-5) after lock-in amplifier (6-4) signal to corresponding frequencies locks and amplifies, controller (6-6) driving two electronic control translation stages under the control of computing machine (6-5) move accordingly,
Described Transmissivity measurement assembly contains interface module, control module, acquisition module, computing module and memory module, and the function of interface module is, is received measurement wavelength, sample measuring tempeature, the sample ID of tester's setting by keyboard; The function of control module is, drives filter set to rotate according to the measurement wavelength of setting, makes the narrow band pass filter incision optical path of respective wavelength, sends the driving instruction of corresponding electric control platform according to measurement sequential to controller; The function of acquisition module is, gathers four groups of voltage signals of lock-in amplifier output and one group of background voltage value, one group of background voltage value of optical path two, one group of measuring voltage value of optical path one, one group of measuring voltage value of optical path two of optical path one; The function of computing module, the transmitance T of sample under Current Temperatures, current wavelength is calculated according to formula T=(V2/V02)/(V1/V01) or T=(V1/V01)/(V2/V02), wherein, V01, V02 are respectively the average background magnitude of voltage of optical path one, optical path two, V1, V2 are respectively the average measurement magnitude of voltage of optical path one and optical path two, sample is put into optical path and is for the moment used last calculating formula, and by a rear calculating formula when optical path two put into by sample; The function of memory module is, stores the measurement data in measuring process, and Transmissivity measurement result T is stored as Excel1 file.
2. optical material high temperature transmission measurement device according to claim 1, is characterized in that: described focusing mirror 5 is off axis paraboloidal mirror.
3. optical material high temperature transmission measurement device according to claim 1, it is characterized in that: the wavelength coverage of described filter set (1-6) is 1 μm ~ 14 μm, the spectral response range of described infrared eye (6-2) is 1 μm ~ 14 μm.
4. optical material high temperature transmission measurement device according to claim 1, it is characterized in that: also comprise a diaphragm (6-1), described diaphragm (6-1) is positioned at the front 1mm place of described infrared eye (6-2).
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| CN103712958B (en) * | 2014-01-03 | 2015-09-09 | 哈尔滨工业大学 | The measuring method of high-temperature directional transmittance of semi-transparent solid material |
| CN104777084B (en) * | 2015-03-23 | 2018-02-16 | 中山大学 | A kind of gas permeation rate measuring method and system based on lock-in amplifier |
| CN105223229A (en) * | 2015-09-29 | 2016-01-06 | 北京航天自动控制研究所 | A kind of infrared wave transparent window radiation measurement of transmission characterist platform |
| CN105223230A (en) * | 2015-09-29 | 2016-01-06 | 北京航天自动控制研究所 | A kind of infrared electromagnetic wave transparent material radiation measurement of transmission characterist method |
| CN107290298A (en) * | 2017-07-17 | 2017-10-24 | 电子科技大学 | A kind of device and method that mixed gas is detected based on Fast Fourier Transform (FFT) |
| CN109060731B (en) * | 2018-06-25 | 2020-04-03 | 中国科学院西安光学精密机械研究所 | Device and method for testing spectral transmittance of infrared optical system |
| CN109781671B (en) * | 2019-03-11 | 2021-11-05 | 西北核技术研究所 | Transmission rate on-line test method and device |
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| US6128093A (en) * | 1998-10-08 | 2000-10-03 | Nikon Corporation | Unit for measuring optical properties |
| CN201402207Y (en) * | 2009-05-07 | 2010-02-10 | 上海师范大学附属中学 | Testing device for detecting ultraviolet transmittance of lens |
| CN202710473U (en) * | 2012-08-16 | 2013-01-30 | 英利能源（中国）有限公司 | Light transmittance testing device |
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| US6128093A (en) * | 1998-10-08 | 2000-10-03 | Nikon Corporation | Unit for measuring optical properties |
| CN201402207Y (en) * | 2009-05-07 | 2010-02-10 | 上海师范大学附属中学 | Testing device for detecting ultraviolet transmittance of lens |
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