CN114725248A - 一种钝化背接触式太阳能电池的制作方法 - Google Patents

一种钝化背接触式太阳能电池的制作方法 Download PDF

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CN114725248A
CN114725248A CN202210258658.7A CN202210258658A CN114725248A CN 114725248 A CN114725248 A CN 114725248A CN 202210258658 A CN202210258658 A CN 202210258658A CN 114725248 A CN114725248 A CN 114725248A
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polycrystalline silicon
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高嘉庆
屈小勇
郭永刚
吴翔
张博
杨爱静
张天杰
王永冈
李翔虹
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Qinghai Huanghe Hydropower Development Co Ltd
Huanghe Hydropower Development Co Ltd
Xian Solar Power Branch of Qinghai Huanghe Hydropower Development Co Ltd
Xining Solar Power branch of Qinghai Huanghe Hydropower Development Co Ltd
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Qinghai Huanghe Hydropower Development Co Ltd
Huanghe Hydropower Development Co Ltd
Xian Solar Power Branch of Qinghai Huanghe Hydropower Development Co Ltd
Xining Solar Power branch of Qinghai Huanghe Hydropower Development Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/20Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials
    • H01L31/202Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials including only elements of Group IV of the Periodic Table
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0352Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions
    • H01L31/035272Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions characterised by at least one potential jump barrier or surface barrier
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
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    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/20Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials
    • H01L31/208Particular post-treatment of the devices, e.g. annealing, short-circuit elimination
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Abstract

本发明公开了一种钝化背接触式太阳能电池的制作方法,包括:在N型单晶硅基片的一侧面上依序层叠形成隧穿氧化层和P型多晶硅层;刻除P型多晶硅层的预设区域形成第一开槽;在第一开槽内填充形成钝化层,钝化层的厚度与P型多晶硅层的厚度相同;刻除钝化层的预设区域形成第二开槽,并在第二开槽内填充形成N型多晶硅层,使P型多晶硅层与N型多晶硅层之间具有由钝化层构成的间隔区域;在P型多晶硅层和N型多晶硅层上分别形成接触电极。本发明解决了背接触式太阳能电池的制作过程中不容易形成型多晶硅层与N型多晶硅层之间的隔离区域的问题。

Description

一种钝化背接触式太阳能电池的制作方法
技术领域
本发明涉及太阳能发电技术领域,尤其涉及一种钝化背接触式太阳能电池的制作方法。
背景技术
在背接触式太阳能电池技术领域中,形成掺杂多晶硅结构时,通常采用在本征多晶硅上高温扩散杂质的方式。比如在本征多晶硅上高温磷扩散可以形成N型多晶硅,或者高温硼扩散可以形成P型多晶硅。但是高温硼扩散形成的P型多晶硅很难被酸/碱溶液去除(理由是掺硼多晶硅很难酸碱腐蚀)。因此,如果采用高温硼扩散的方式在本征多晶硅上形成P型多晶硅,那么就无法通过清洗工艺来去除多余的P型多晶硅,从而导致无法在P型多晶硅与N型多晶硅之间形成隔离区域。
发明内容
鉴于现有技术存在的不足,本发明提供了一种钝化背接触式太阳能电池的制作方法,包括:
在N型单晶硅基片的一侧面上依序层叠形成隧穿氧化层和P型多晶硅层;
刻除所述P型多晶硅层的预设区域形成第一开槽;
在所述第一开槽内填充形成钝化层,所述钝化层的厚度与所述P型多晶硅层的厚度相同;
刻除所述钝化层的预设区域形成第二开槽,并在所述第二开槽内填充形成N型多晶硅层,使所述P型多晶硅层与所述N型多晶硅层之间具有由所述钝化层构成的间隔区域;
在所述P型多晶硅层和所述N型多晶硅层上分别形成接触电极。
优选地,在所述第一开槽内填充形成钝化层包括:
在所述P型多晶硅层上进行掩膜处理;
在所述第一开槽内沉积填充氮化硅材料,以形成所述钝化层。
优选地,在所述第二开槽内填充形成N型多晶硅层包括:
在所述钝化层上进行掩膜处理;
在所述第二开槽内沉积填充本征多晶硅材料,形成本征多晶硅层;
对所述本征多晶硅层进行磷掺杂,形成所述N型多晶硅层。
优选地,彼此相邻的所述第一开槽的边缘与所述第二开槽的边缘之间的间距为1μm~50μm。
优选地,对所述本征多晶硅层进行磷掺杂的掺磷温度为700℃~900℃,掺磷时间为5分钟~60分钟。
优选地,在所述P型多晶硅层和所述N型多晶硅层上分别形成接触电极之前包括:
在所述N型单晶硅基片的背向所述隧穿氧化层的一侧表面上沉积形成减反射层。
采用本发明提供的钝化背接触式太阳能电池的制作方法可以在N型多晶硅层和P型多晶硅层之间形成隔离区域,从而可以防止背接触式太阳能电池产生漏电。
附图说明
图1a至图1f是根据本发明的实施例的钝化背接触式太阳能电池的制作方法的制程图。
具体实施方式
为使本发明的目的、技术方案和优点更加清楚,下面结合附图对本发明的具体实施方式进行详细说明。这些优选实施方式的示例在附图中进行了例示。附图中所示和根据附图描述的本发明的实施方式仅仅是示例性的,并且本发明并不限于这些实施方式。
在此,还需要说明的是,为了避免因不必要的细节而模糊了本发明,在附图中仅仅示出了与根据本发明的方案密切相关的结构和/或处理步骤,而省略了与本发明关系不大的其他细节。
针对在背景技术中所陈述的现有技术问题,本实施例提供了如下具体实施方式。
本实施例提供的钝化背接触式太阳能电池的制作方法包括:
步骤S1、如图1a所示,在N型单晶硅基片1的一侧面上依序层叠形成隧穿氧化层2和P型多晶硅层3。其中,所述N型单晶硅基片1的厚度为80μm~200μm,电阻率为0.3Ω·cm~50Ω·cm。所述P型多晶硅层3可以是先在所述隧穿氧化层2上沉积一层本征多晶硅之后,再对该本征多晶硅进行硼掺杂的方式来形成。
步骤S2、如图1b所示,刻除所述P型多晶硅层3的预设区域形成第一开槽A。具体是通过激光开槽工艺来刻除所述P型多晶硅层3的预设区域部分,形成所述第一开槽A。
步骤S3、如图1c所示,在所述第一开槽A内填充形成钝化层4,所述钝化层4的厚度与所述P型多晶硅层3的厚度相同。具体是,在所述P型多晶硅层3上进行掩膜处理,之后在所述第一开槽A内沉积填充氮化硅材料来形成所述钝化层4。在本实施例中,在所述P型多晶硅层3上进行掩膜处理的方式可采用,在所述P型多晶硅层3上设置硬掩膜版来遮挡除所述第一开槽A之外的所述P型多晶硅层3的方式。
步骤S4、如图1d和图1e所示,刻除所述钝化层4的预设区域形成第二开槽B,并在所述第二开槽B内填充形成N型多晶硅层5,使所述P型多晶硅层3与所述N型多晶硅层5之间具有由所述钝化层4构成的间隔区域。其中,彼此相邻的所述第一开槽A的边缘与所述第二开槽B的边缘之间的间距为1μm~50μm。在本实施例中,在所述第二开槽B内填充形成N型多晶硅层5的方式可采用,在所述钝化层4上进行掩膜处理,之后在所述第二开槽B内沉积填充本征多晶硅材料形成本征多晶硅层,并对所述本征多晶硅层进行磷掺杂形成所述N型多晶硅层5的方式。其中,对所述本征多晶硅层进行磷掺杂的掺磷温度为700℃~900℃,掺磷时间为5分钟~60分钟。
步骤S5、如图1f所示,在所述P型多晶硅层3和所述N型多晶硅层5上分别形成接触电极6。可选地,为了提高太阳能电池的采光效率,在所述P型多晶硅层3和所述N型多晶硅层5上分别形成接触电极6之前,可以在所述N型单晶硅基片1的背向所述隧穿氧化层2的一侧表面上沉积形成减反射层。
采用本实施例提供的钝化背接触式太阳能电池的制作方法可以在N型多晶硅层5和P型多晶硅层3之间形成隔离区域,从而可以防止背接触式太阳能电池产生漏电。
需要说明的是,在本文中,术语“包括”、“包含”或者其任何其他变体意在涵盖非排他性的包含,从而使得包括一系列要素的过程、方法、物品或者设备不仅包括那些要素,而且还包括没有明确列出的其他要素,或者是还包括为这种过程、方法、物品或者设备所固有的要素。在没有更多限制的情况下,由语句“包括一个……”限定的要素,并不排除在包括所述要素的过程、方法、物品或者设备中还存在另外的相同要素。
尽管已经示出和描述了本发明的实施例,对于本领域的普通技术人员而言,可以理解在不脱离本发明的原理和精神的情况下可以对这些实施例进行多种变化、修改、替换和变型,本发明的范围由所附权利要求及其等同物限定。

Claims (6)

1.一种钝化背接触式太阳能电池的制作方法,其特征在于,包括:
在N型单晶硅基片的一侧面上依序层叠形成隧穿氧化层和P型多晶硅层;
刻除所述P型多晶硅层的预设区域形成第一开槽;
在所述第一开槽内填充形成钝化层,所述钝化层的厚度与所述P型多晶硅层的厚度相同;
刻除所述钝化层的预设区域形成第二开槽,并在所述第二开槽内填充形成N型多晶硅层,使所述P型多晶硅层与所述N型多晶硅层之间具有由所述钝化层构成的间隔区域;
在所述P型多晶硅层和所述N型多晶硅层上分别形成接触电极。
2.根据权利要求1所述的制作方法,其特征在于,在所述第一开槽内填充形成钝化层包括:
在所述P型多晶硅层上进行掩膜处理;
在所述第一开槽内沉积填充氮化硅材料,以形成所述钝化层。
3.根据权利要求2所述的制作方法,其特征在于,在所述第二开槽内填充形成N型多晶硅层包括:
在所述钝化层上进行掩膜处理;
在所述第二开槽内沉积填充本征多晶硅材料,形成本征多晶硅层;
对所述本征多晶硅层进行磷掺杂,形成所述N型多晶硅层。
4.根据权利要求1所述的制作方法,其特征在于,彼此相邻的所述第一开槽的边缘与所述第二开槽的边缘之间的间距为1μm~50μm。
5.根据权利要求3所述的制作方法,其特征在于,对所述本征多晶硅层进行磷掺杂的掺磷温度为700℃~900℃,掺磷时间为5分钟~60分钟。
6.根据权利要求1所述的制作方法,其特征在于,在所述P型多晶硅层和所述N型多晶硅层上分别形成接触电极之前包括:
在所述N型单晶硅基片的背向所述隧穿氧化层的一侧表面上沉积形成减反射层。
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CN117637892A (zh) * 2024-01-26 2024-03-01 隆基绿能科技股份有限公司 一种背接触太阳能电池和光伏组件

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CN109216509A (zh) * 2018-08-06 2019-01-15 西安理工大学 一种叉指型背接触异质结太阳电池制备方法
CN113555469A (zh) * 2021-07-21 2021-10-26 苏州腾晖光伏技术有限公司 一种背部钝化接触结构及其制备方法、太阳能电池
CN113871494A (zh) * 2020-06-30 2021-12-31 泰州隆基乐叶光伏科技有限公司 一种太阳能电池及其制作方法

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Publication number Priority date Publication date Assignee Title
CN109216509A (zh) * 2018-08-06 2019-01-15 西安理工大学 一种叉指型背接触异质结太阳电池制备方法
CN113871494A (zh) * 2020-06-30 2021-12-31 泰州隆基乐叶光伏科技有限公司 一种太阳能电池及其制作方法
CN113555469A (zh) * 2021-07-21 2021-10-26 苏州腾晖光伏技术有限公司 一种背部钝化接触结构及其制备方法、太阳能电池

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117637892A (zh) * 2024-01-26 2024-03-01 隆基绿能科技股份有限公司 一种背接触太阳能电池和光伏组件
CN117637892B (zh) * 2024-01-26 2024-04-30 隆基绿能科技股份有限公司 一种背接触太阳能电池和光伏组件

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