CN114333978A - Solid state hard drives test fixture - Google Patents
Solid state hard drives test fixture Download PDFInfo
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- CN114333978A CN114333978A CN202210074237.9A CN202210074237A CN114333978A CN 114333978 A CN114333978 A CN 114333978A CN 202210074237 A CN202210074237 A CN 202210074237A CN 114333978 A CN114333978 A CN 114333978A
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- test
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- state disk
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Abstract
The invention discloses a solid state disk test fixture, which comprises an object stage, wherein a plurality of accommodating cavities are arranged on the object stage at intervals, and the accommodating cavities are used for accommodating solid state disk chips; the test assembly comprises a substrate and a plurality of test interfaces, the plurality of test interfaces are arranged on one side of the substrate facing the accommodating cavity at intervals and are electrically connected with the substrate, and the substrate is electrically connected with external test equipment; and the lifting mechanism is arranged below the objective table and is connected with the objective table, and the lifting mechanism can drive the objective table to move up and down so as to enable the solid state disk chip to be abutted or separated with the test interface. The solid state disk test fixture can improve the test efficiency of the solid state disk chip and can avoid scratching fingers or damaging the solid state disk chip when the solid state disk chip is manually plugged and pulled.
Description
Technical Field
The invention relates to the technical field of test jigs, in particular to a solid state disk test jig.
Background
A Solid State Drive (SSD), also called solid state drive, is a hard disk made of an array of solid state electronic memory chips. The solid state disk is popular in the market due to the advantages of high reading speed, portability, low power consumption and the like, and the demand is increasing.
However, there is currently a limit on the efficiency of producing solid state disks. For example, in a mode of testing a solid state disk chip, the solid state disk chip is usually manually aligned to a test port, inserted into the test port after no error is confirmed, and then pulled out after the test is completed. The manual plugging and unplugging test mode greatly reduces the test efficiency of the solid state disk, and the actual production requirements cannot be met. Therefore, it is very important to improve the testing efficiency of the solid state disk chip.
Disclosure of Invention
The invention mainly aims to provide a solid state disk test fixture, and aims to solve the technical problem of low efficiency of manual plugging and unplugging tests of the conventional solid state disk chip.
In order to achieve the above object, the solid state disk testing fixture provided by the present invention comprises:
the solid state disk drive comprises an object stage, a plurality of accommodating cavities and a plurality of clamping pieces, wherein the object stage is provided with a plurality of accommodating cavities at intervals, and the accommodating cavities are used for accommodating solid state disk chips;
the test assembly comprises a substrate and a plurality of test interfaces, the plurality of test interfaces are arranged on one side of the substrate facing the accommodating cavity at intervals and are electrically connected with the substrate, and the substrate is electrically connected with external test equipment; and
and the lifting mechanism is arranged below the objective table and connected with the objective table, and can drive the objective table to move up and down so that the solid state disk chip is abutted against or separated from the test interface.
Preferably, the base plate includes the fixed plate and locates the test circuit board of fixed plate bottom surface, the one side of test circuit board is with a plurality of test interface connection, and the another side is connected with a plurality of connectors, and is a plurality of the connector sets up with a plurality of test interface one-to-one, the connector is used for connecting test equipment.
Preferably, the test interface is provided with a plurality of test probes, the solid state disk chip is provided with a plurality of test points, and the plurality of test probes and the plurality of test points are arranged in a one-to-one correspondence manner.
Preferably, the fixed plate is provided with a plurality of avoiding holes at intervals, the avoiding holes are arranged in one-to-one correspondence with the connectors, and the avoiding holes are used for avoiding the connectors.
Preferably, the object stage comprises a bearing plate and an object carrying plate arranged on the bearing plate, the bearing plate is connected with the lifting mechanism, and the accommodating cavity is arranged on the object carrying plate.
Preferably, the bearing plate is provided with three limiting strips, the three limiting strips form a limiting groove, and the limiting groove is used for limiting the carrying plate.
Preferably, elevating system includes drive assembly, pivot and fixing base, drive assembly one end with the objective table is connected, and another pot head is located the pivot, the fixing base is located the both ends of pivot and with the pivot is rotated and is connected.
Preferably, the number of the transmission assemblies is three, and the three transmission assemblies are axially arranged on the rotating shaft at intervals along the rotating shaft.
Preferably, a guide shaft is arranged between the test component and the fixed seat, the objective table is provided with a guide hole, one end of the guide shaft is connected with the test component, and the other end of the guide shaft penetrates through the guide hole to be connected with the fixed seat.
Preferably, the number of the guide shafts is four, and the four guide shafts are arranged on two sides of the transmission assembly in pairs.
In the technical scheme of the invention, the lifting mechanism can drive the objective table to move upwards, so that the plurality of solid state disk chips to be tested on the objective table are abutted to the plurality of test interfaces, and the performance of the plurality of solid state disk chips can be tested at one time through the test equipment. The solid state disk test fixture can improve the test efficiency of the solid state disk chip and can avoid scratching fingers or damaging the solid state disk chip when the solid state disk chip is manually plugged and pulled.
Drawings
FIG. 1 is a schematic structural diagram of a solid state disk test fixture according to an embodiment of the present invention;
FIG. 2 is an exploded view of FIG. 1;
FIG. 3 is a schematic structural diagram of a test assembly according to an embodiment of the present invention;
FIG. 4 is an exploded view of FIG. 3;
FIG. 5 is a schematic structural diagram of a test interface according to an embodiment of the present invention;
fig. 6 is a schematic structural diagram of an object stage according to an embodiment of the invention.
Description of the reference numerals
| Reference numerals | Name (R) | Reference numerals | Name (R) |
| 1 | |
11 | Containing |
| 2 | Test assembly | 21 | |
| 22 | |
3 | |
| 211 | |
212 | |
| 23 | Connector with a |
221 | |
| 211a | Avoiding |
12 | |
| 13 | Loading |
14 | |
| 31 | |
32 | |
| 33 | Fixed |
34 | Guide shaft |
The implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary and intended to be illustrative of the present invention and should not be construed as limiting the present invention, and all other embodiments that can be obtained by one skilled in the art based on the embodiments of the present invention without inventive efforts shall fall within the scope of protection of the present invention.
It should be noted that all the directional indicators (such as up, down, left, right, front, and rear … …) in the embodiment of the present invention are only used to explain the relative position relationship between the components, the movement situation, etc. in a specific posture (as shown in the drawing), and if the specific posture is changed, the directional indicator is changed accordingly.
It will also be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present.
In addition, the descriptions related to "first", "second", etc. in the present invention are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present invention.
Referring to fig. 1 to 4, fig. 1 is a schematic structural diagram of an embodiment of a solid state disk test fixture of the present invention, fig. 2 is an exploded view of the solid state disk test fixture of the embodiment of the present invention, and fig. 3 is a schematic structural diagram of a test assembly 2 of the embodiment of the present invention; fig. 4 is an exploded view of the test assembly 2 in one embodiment of the invention.
The embodiment of the invention provides a solid state disk test fixture, which comprises:
the solid state disk drive comprises an object stage 1, wherein a plurality of accommodating cavities 11 are arranged on the object stage 1 at intervals, and the accommodating cavities 11 are used for accommodating solid state disk chips;
the test assembly 2 comprises a substrate 21 and a plurality of test interfaces 22, the plurality of test interfaces 22 are arranged on one side of the substrate 21 facing the accommodating cavity 11 at intervals and are electrically connected with the substrate 21, and the substrate 21 is electrically connected with external test equipment; and
and the lifting mechanism 3 is arranged below the objective table 1 and is connected with the objective table 1, and the lifting mechanism 3 can drive the objective table 1 to move up and down so that the solid state disk chip is abutted against or separated from the test interface 22.
In this embodiment, a plurality of accommodating cavities 11 are formed on the upper surface of the stage 1, and the accommodating cavities 11 are arranged at linear intervals. The accommodating cavity 11 is mainly used for accommodating a solid state disk chip, and the shape of the accommodating cavity is matched with that of the solid state disk. The number of the accommodating cavities 11 can be set according to actual test requirements, the number of the accommodating cavities 11 in the implementation is six, and six solid state hard disk chips can be tested at one time.
The test component 2 of the embodiment is mainly used for testing the performance of the solid state disk chip. Specifically, the test assembly 2 is located the top of objective table 1, and the test assembly 2 includes base plate 21 and a plurality of test interface 22, and a plurality of test interface 22 locate the lower surface of base plate 21 and towards the holding chamber 11 of objective table 1, and a plurality of test interface 22 set up with a plurality of holding chamber 11 one-to-one. The test interface 22 is electrically connected with the substrate 21, the substrate 21 is electrically connected with an external test device, and the test interface 22 can be abutted against the solid state disk in the accommodating cavity 11 to realize electrical connection.
The lifting mechanism 3 of this embodiment mainly used drives objective table 1 and removes in vertical direction, and the solid state hard drives chip and the test interface 22 butt on the objective table 1 make solid state hard drives chip and test interface 22 electric communication. The lifting mechanism 3 may be driven by an air cylinder, a motor or manually pulled, as long as the lifting function of the object stage 1 can be realized, which is not limited herein.
During the test, place a plurality of solid state hard disk chips in objective table 1 earlier, drive 1 rebound of objective table through elevating system 3, a plurality of solid state hard disk chips and a plurality of test interface 22 butt of awaiting measuring on the objective table 1, solid state hard disk chip and test interface 22 electric property intercommunication. And then the performance of the plurality of solid state disk chips can be tested at one time through the testing equipment. The solid state disk test fixture can improve the test efficiency of the solid state disk chip and can avoid scratching fingers or damaging the solid state disk chip when the solid state disk chip is manually plugged and pulled.
In some embodiments, referring to fig. 4, the substrate 21 includes a fixing plate 211 and a test circuit board 212 disposed on a bottom surface of the fixing plate 211, one surface of the test circuit board 212 is connected to the plurality of test interfaces 22, the other surface is connected to the plurality of connectors 23, the plurality of connectors 23 are disposed in one-to-one correspondence with the plurality of test interfaces 22, and the connectors 23 are used for connecting test equipment.
In this embodiment, the substrate 21 includes a fixing plate 211 and a test circuit board 212, and the test circuit board 212 is a Printed Circuit Board (PCB). The test circuit board 212 is fixed on the lower surface of the fixing plate 211, one surface of the test circuit board 212 is electrically connected with the plurality of test interfaces 22, the other surface is connected with the plurality of connectors 23, the plurality of connectors 23 are arranged in one-to-one correspondence with the plurality of test interfaces 22, and the connectors 23 are used for connecting external test equipment. During testing, the test interface 22 is electrically connected with the solid state disk, the connector 23 is electrically connected with external test equipment, and the external test equipment tests the performance of the solid state disk chip.
In some embodiments, referring to fig. 5, fig. 5 is a schematic structural diagram of the test interface 22 according to an embodiment of the present invention. The test interface 22 is provided with a plurality of test probes 221, the solid state disk chip is provided with a plurality of test points, and the plurality of test probes 221 and the plurality of test points are arranged in a one-to-one correspondence manner.
In this embodiment, one side of the test interface 22 facing the solid state disk chip is provided with a plurality of test probes 221, the solid state disk chip is provided with a plurality of test points, and each test point corresponds to one test probe 221. The test probe 221 can abut against the test point to electrically connect the solid state disk and the test interface 22.
In some embodiments, referring to fig. 4, the fixing plate 211 is provided with a plurality of spacing holes 211a at intervals, the plurality of spacing holes 211a are arranged in one-to-one correspondence with the plurality of connectors 23, and the spacing holes 211a are used for avoiding the connectors 23.
In this embodiment, the test circuit board 212 is connected with a plurality of connectors 23, and the connectors 23 protrude from the surface of the test circuit board 212. Therefore, in order to electrically connect the connector 23 to the external test equipment, the fixing plate 211 is provided with a plurality of clearance holes 211a, and the plurality of clearance holes 211a are provided in one-to-one correspondence with the plurality of connectors 23. When the test circuit board 212 is mounted, the connector 23 on the test circuit board 212 passes through the clearance hole 211a and is not pressed against the fixing plate 211, thereby preventing the test circuit board 212 from being damaged. Furthermore, the plurality of avoiding holes 211a on the fixing plate 211 greatly reduce the material consumption and save the cost. Meanwhile, the arrangement of the avoiding hole 211a increases the heat dissipation area of the test circuit board 212, which is beneficial to the heat dissipation of the test circuit board 212.
In some embodiments, referring to fig. 6, fig. 6 is a schematic structural diagram of the object stage 1 according to an embodiment of the invention. The objective table 1 comprises a bearing plate 12 and an objective plate 13 arranged on the bearing plate 12, the bearing plate 12 is connected with the lifting mechanism 3, and the accommodating cavity 11 is arranged on the objective plate 13.
In this embodiment, the object stage 1 includes a loading plate 12 and an object carrying plate 13, and the loading plate 12 is disposed below the object carrying plate 13 and connected to the lifting mechanism 3. The loading plate 13 is disposed above the loading plate 12, and the loading plate 13 and the loading plate 12 may be connected in a fixed manner, or may be connected in a sliding manner or in an abutting manner. The carrying plate 13 is mainly used for placing solid state disk chips, and the accommodating cavity 11 is arranged on the carrying plate 13.
Further, the bearing plate 12 is provided with three limiting strips 14, the three limiting strips 14 form limiting grooves, and the limiting grooves are used for limiting the carrying plate 13. Specifically, the limiting groove formed by the three limiting strips 14 is "U" shaped, and the loading plate 13 is limited on the loading plate 12 by the "U" shaped limiting groove. One side of the carrying plate 13 facing the opening of the U-shaped limiting groove is provided with a pull groove, and the pull groove is used for pulling out or pushing the carrying plate 13 into the bearing plate 12. During the use, will carry thing board 13 and pull out through the kerve, put solid state hard disk chip in the holding chamber 11 on carrying thing board 13, will carry thing board 13 propulsion spacing inslot at last.
In some embodiments, referring to fig. 2, the lifting mechanism 3 includes a transmission assembly 31, a rotating shaft 32 and a fixing seat 33, one end of the transmission assembly 31 is connected to the stage 1, the other end is sleeved on the rotating shaft 32, and the fixing seat 33 is disposed at two ends of the rotating shaft 32 and is rotatably connected to the rotating shaft 32. Specifically, the transmission assembly 31 includes a first connecting block, a second connecting block, and a connecting seat. One end of the first connecting block is sleeved on the rotating shaft 32, the other end of the first connecting block is hinged with the second connecting block, the second connecting block is hinged with the connecting seat, and the connecting seat is fixedly connected with the objective table 1. The rotating shaft 32 passes through the first connecting block and is rotatably connected with the fixed seat 33. During operation, pivot 32 rotates under the effect of external force, drives first connecting block and rotates, and first connecting block drives the second connecting block and rotates, and the second connecting block drives the connecting seat and shifts up to drive objective table 1 upward movement. It should be noted that the external force may be driven by a motor, and an output end of the motor is connected to the rotating shaft 32 to drive the rotating shaft 32 to rotate. Or manually pulled, the rotating shaft 32 is connected with a rotating rod, and the rotating rod is manually rotated so as to drive the rotating shaft 32 to rotate.
Further, there are three transmission assemblies 31, and the three transmission assemblies 31 are axially spaced on the rotating shaft 32 along the rotating shaft 32. In order to make the transmission smoother during the elevation of the stage 1, a plurality of transmission assemblies 31 may be provided. In the present embodiment, preferably, three transmission assemblies 31 are provided, and the three transmission assemblies 31 are axially spaced on the rotating shaft 32 along the rotating shaft 32.
In some embodiments, referring to fig. 2, a guide shaft 34 is disposed between the testing component 2 and the fixing seat 33, the stage 1 is provided with a guide hole, one end of the guide shaft 34 is connected to the testing component 2, and the other end of the guide shaft passes through the guide hole and is connected to the fixing seat 33.
In this embodiment, one end of the guide shaft 34 is fixedly disposed on the fixing base 33, the other end of the guide shaft is fixedly connected with the testing component 2, and the objective table 1 is sleeved on the guide shaft 34 through the guide hole. Therefore, the object stage 1 moves up and down along the guide shaft 34 under the driving of the lifting mechanism 3, and the object stage 1 is prevented from deviating when moving up and down, so that the moving precision of the object stage 1 is improved, and the accuracy of a test result is ensured.
Further, four guide shafts 34 are provided, and two of the four guide shafts 34 are disposed on two sides of the transmission assembly 31. In order to make the up-and-down movement of the objective table 1 more stable, the number of the guide posts is four, and two of the four guide shafts 34 are arranged on two sides of the transmission assembly 31. In addition, a spring is arranged between the object stage 1 and the fixed seat 33, the spring is sleeved on the guide shaft 34, one end of the spring is abutted against the object stage 1, and the other end of the spring is abutted against the fixed seat 33. The spring mainly plays a role of buffering. After the test is finished, the objective table 1 is slowly moved downwards under the action of the spring, so that the damage to the solid state disk chip caused by rapid descending is avoided.
The above is only a part or preferred embodiment of the present invention, and neither the text nor the drawings should limit the scope of the present invention, and all equivalent structural changes made by the present specification and the contents of the drawings or the related technical fields directly/indirectly using the present specification and the drawings are included in the scope of the present invention.
Claims (10)
1. The utility model provides a solid state hard drives test fixture which characterized in that includes:
the solid state disk drive comprises an object stage, a plurality of accommodating cavities and a plurality of clamping pieces, wherein the object stage is provided with a plurality of accommodating cavities at intervals, and the accommodating cavities are used for accommodating solid state disk chips;
the test assembly comprises a substrate and a plurality of test interfaces, the plurality of test interfaces are arranged on one side of the substrate facing the accommodating cavity at intervals and are electrically connected with the substrate, and the substrate is electrically connected with external test equipment; and
and the lifting mechanism is arranged below the objective table and connected with the objective table, and can drive the objective table to move up and down so that the solid state disk chip is abutted against or separated from the test interface.
2. The solid state disk test fixture of claim 1, wherein the substrate comprises a fixed plate and a test circuit board disposed on a bottom surface of the fixed plate, one surface of the test circuit board is connected to the plurality of test interfaces, the other surface of the test circuit board is connected to a plurality of connectors, the plurality of connectors and the plurality of test interfaces are arranged in a one-to-one correspondence, and the connectors are used for connecting the test equipment.
3. The solid state disk test fixture of claim 2, wherein the test interface is provided with a plurality of test probes, the solid state disk chip is provided with a plurality of test points, and the plurality of test probes and the plurality of test points are arranged in a one-to-one correspondence manner.
4. The solid state disk test fixture of claim 2, wherein the fixing plate is provided with a plurality of clearance holes at intervals, the plurality of clearance holes are arranged in one-to-one correspondence with the plurality of connectors, and the clearance holes are used for avoiding the connectors.
5. The solid state disk test fixture of any one of claims 1 to 4, wherein the stage comprises a loading plate and a loading plate disposed on the loading plate, the loading plate is connected to the lifting mechanism, and the receiving cavity is disposed on the loading plate.
6. The solid state disk test fixture of claim 5, wherein three limiting strips are disposed on the carrier plate, and form a limiting groove, and the limiting groove is used for limiting the carrier plate.
7. The solid state disk testing fixture of claim 1, wherein the lifting mechanism comprises a transmission assembly, a rotating shaft and a fixing seat, one end of the transmission assembly is connected with the stage, the other end of the transmission assembly is sleeved on the rotating shaft, and the fixing seat is arranged at two ends of the rotating shaft and is rotatably connected with the rotating shaft.
8. The solid state disk test fixture of claim 7, wherein the number of the transmission assemblies is three, and the three transmission assemblies are axially arranged on the rotating shaft at intervals along the rotating shaft.
9. The solid state disk testing fixture of claim 7 or 8, wherein a guide shaft is disposed between the testing component and the fixing base, the stage is provided with a guide hole, one end of the guide shaft is connected to the testing component, and the other end of the guide shaft passes through the guide hole and is connected to the fixing base.
10. The solid state disk test fixture of claim 9, wherein the number of the guide shafts is four, and four guide shafts are disposed on two sides of the transmission assembly.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210074237.9A CN114333978A (en) | 2022-01-21 | 2022-01-21 | Solid state hard drives test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210074237.9A CN114333978A (en) | 2022-01-21 | 2022-01-21 | Solid state hard drives test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114333978A true CN114333978A (en) | 2022-04-12 |
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ID=81028215
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210074237.9A Pending CN114333978A (en) | 2022-01-21 | 2022-01-21 | Solid state hard drives test fixture |
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| Country | Link |
|---|---|
| CN (1) | CN114333978A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115151022A (en) * | 2022-06-30 | 2022-10-04 | 苏州浪潮智能科技有限公司 | Solid state disk power consumption testing arrangement |
-
2022
- 2022-01-21 CN CN202210074237.9A patent/CN114333978A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115151022A (en) * | 2022-06-30 | 2022-10-04 | 苏州浪潮智能科技有限公司 | Solid state disk power consumption testing arrangement |
| CN115151022B (en) * | 2022-06-30 | 2024-01-19 | 苏州浪潮智能科技有限公司 | Solid state disk power consumption testing device |
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