CN219626326U - Thin test fixture of memory granule - Google Patents
Thin test fixture of memory granule Download PDFInfo
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- CN219626326U CN219626326U CN202320515686.2U CN202320515686U CN219626326U CN 219626326 U CN219626326 U CN 219626326U CN 202320515686 U CN202320515686 U CN 202320515686U CN 219626326 U CN219626326 U CN 219626326U
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Abstract
The utility model relates to a thin test fixture for memory particles, which relates to the technical field of memory particle tests, and comprises: the mounting plate is connected with the memory particle testing tool and comprises a placing groove, and the placing groove is used for placing memory particles; the clamp assembly is connected with the mounting plate and can rotate relative to the mounting plate, so that a clamping space is formed between one end of the clamp assembly and the mounting plate, and the clamping space is used for clamping memory particles. According to the utility model, the clamp assembly with the sliding clamp type structure is adopted to clamp memory particles and drive the memory particles to slide, and the clamping structure is adopted to avoid the complex structure of the jig caused by excessive assemblies.
Description
Technical Field
The utility model relates to the technical field of memory particle testing, in particular to a thin test jig for memory particles.
Background
The memory granule is also called as DDR (Double Data Rate) and in the DDR production quality inspection link, a test fixture is required to test the reading and writing speed of the memory granule. Most of the existing DDR test devices are used for manually placing DDR to be tested into a test groove of a test jig by workers, detecting the DDR by the test jig, taking the DDR out after the detection is completed, and placing the next DDR.
At present, most of memory particle testing jigs are flip-type or gland-type jigs, the size is larger, memory particles are required to be carried out on a PC main board when being tested, a plurality of sets of jigs are required to be simultaneously operated according to a testing scheme, and the flip-type or gland-type jigs can only be independently operated usually due to oversized dimension. At present, the memory particle test can be used for a plurality of sets of jigs to continue to operate, the cost of customizing a special PCBA (memory strip) is very high, and the structure is mostly provided with a turning sliding piece type, so that the jig is easy to loosen and damage.
Disclosure of Invention
The utility model mainly aims to provide a thin test fixture for memory particles, which aims to solve the problem of oversized memory particle test fixture.
In order to achieve the above objective, the present utility model provides a thin test fixture for memory particles, comprising:
the mounting plate is connected with the memory particle testing tool and comprises a placing groove used for placing memory particles;
the clamp assembly is connected with the mounting plate and can rotate relative to the mounting plate, so that a clamping space is formed between one end of the clamp assembly and the mounting plate, and the clamping space is used for clamping memory particles.
Preferably, the mounting plate comprises a front plate, a rear plate and a clamping plate, wherein the front plate is connected with the rear plate, a part of the clamping plate is arranged between the front plate and the rear plate, the placing groove is formed in the front plate, and the front plate and the rear plate are used for fixing the clamping plate and the clamp assembly.
Preferably, the front plate is provided with a front through hole, the rear plate is provided with a rear through hole corresponding to the front through hole, the front through hole is communicated with the rear through hole, the front through hole and the rear through hole form a hollow groove, and the clamp assembly is in sliding connection with the mounting plate through the hollow groove.
Preferably, a sliding groove is formed in the inner wall of the rear through hole in the vertical direction, a sliding piece is arranged on the clamp assembly corresponding to the sliding groove, and the sliding piece is in butt joint with the sliding groove, so that the clamp assembly can slide along the vertical direction of the mounting plate through the sliding groove.
Preferably, the clamp assembly includes a clamping piece, the clamping piece is disposed on the front plate corresponding to the placement groove and can rotate relative to the rear plate, so that a clamping space is formed between the clamping piece and the rear plate, and the clamping piece is used for clamping the memory particles.
Preferably, the clamping piece comprises a holding part, a clamping arm and a clamping part, wherein the holding part is connected with the clamping part through the clamping arm, the holding part can move relative to the clamping part, and the clamping part is used for fixing the memory particles.
Preferably, the clamping piece further comprises a torsion spring, wherein the torsion spring is arranged on the clamping arm and connected with the holding part and the clamping part, and the torsion spring can enable the clamping part to fix the memory particles.
Preferably, the clamping plate is provided with positioning grooves, the positioning grooves are formed in two sides of the clamping plate, the sinking direction of the positioning grooves is from two sides of the clamping plate to the center, and the positioning grooves are used for positioning and fixing with the memory particle testing tool.
Preferably, the clamping plate is provided with a fool-proof groove, the fool-proof groove is eccentrically arranged at the bottom of the clamping plate, and the fool-proof groove is used for distinguishing the positive and negative directions of the clamping plate.
Preferably, the mounting plate comprises a limit clamping tenon, the limit clamping tenon is arranged on two sides of the mounting plate, the protruding direction of the limit clamping tenon is from the mounting plate to two sides of the mounting plate to horizontally protrude, and the limit clamping tenon is used for limiting and fixing the memory particle testing tool.
According to the utility model, the clamp assembly with the sliding clamp type structure is adopted to clamp memory particles and drive the memory particles to slide, and the clamping structure is adopted to avoid the complex structure of the jig caused by excessive assemblies.
Drawings
In order to more clearly illustrate the embodiments of the present utility model or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, and it is obvious that the drawings in the following description are only some embodiments of the present utility model, and other drawings may be obtained according to the structures shown in these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic cross-sectional view of a thin test fixture for memory particles according to an embodiment of the present utility model;
FIG. 2 is a schematic diagram of a thin test fixture for memory particles according to an embodiment of the present utility model;
FIG. 3 is a schematic side view of a thin test fixture for memory particles according to an embodiment of the present utility model;
fig. 4 is a schematic structural diagram of a thin test fixture for memory particles according to another embodiment of the present utility model.
Reference numerals illustrate:
the achievement of the objects, functional features and advantages of the present utility model will be further described with reference to the accompanying drawings, in conjunction with the embodiments.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the utility model. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
It should be noted that all directional indicators (such as up, down, left, right, front, and rear … …) in the embodiments of the present utility model are merely used to explain the relative positional relationship, movement, etc. between the components in a particular posture (as shown in the drawings), and if the particular posture is changed, the directional indicator is changed accordingly.
Furthermore, the description of "first," "second," etc. in this disclosure is for descriptive purposes only and is not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In addition, the technical solutions of the embodiments may be combined with each other, but it is necessary to base that the technical solutions can be realized by those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should be considered to be absent and not within the scope of protection claimed in the present utility model.
As shown in fig. 1, the present utility model provides a memory granule thin test fixture 1000, and the memory granule thin test fixture 1000 is applied to a memory granule test fixture, and includes: the mounting plate 10, the mounting plate 10 is connected with the memory particle testing tool, the mounting plate 10 comprises a placing groove 114, and the placing groove 114 is used for placing the memory particles 2000; the fixture assembly is connected with the mounting plate 10, and the fixture assembly can rotate relative to the mounting plate 10, so that a clamping space is formed between one end of the fixture assembly and the mounting plate 10, and the clamping space is used for clamping the memory particles 2000.
In detail, the memory particle testing fixture is any one of the existing devices with a memory particle 2000 performance detecting component, the existing memory particle 2000 performance detecting component includes a transmission line, a host, and a testing connector, wherein the testing connector is used for connecting the memory particle thin testing fixture 1000 to detect the memory particle 2000 and obtain a detection signal, the detection signal is transmitted to the host through the transmission line, the host analyzes the detection signal, and finally obtains the performance of the tested memory particle 2000.
In an embodiment, as shown in fig. 1, the fixture assembly can slide up and down along the mounting plate 10, the fixture assembly is opened and closed by an elastic member arranged inside, an operator applies pressure to one end of the fixture assembly and pulls the fixture assembly upwards to expose the placement groove 114, then the memory particles 2000 are placed in the placement groove 114 corresponding to the other end of the fixture assembly, and then the fixture assembly is reset by the elastic member inside the fixture assembly, so that the memory particle thin test fixture 1000 can fix the memory particles 2000, and the existing complex fixing structure is avoided by the clamping structure, so that the overall size is light and thin, and the operation is convenient.
It can be appreciated that in another embodiment, as shown in fig. 4, the mounting board 10 is not provided with a through hole, the fixture assembly is fixedly arranged on the front board 11, and in this embodiment, the fixture assembly is fixedly arranged, so that the fixture assembly is convenient for an operator to fix and use, improves the working efficiency, has a simple structure and is low in production cost.
As shown in fig. 1, the mounting plate 10 includes a front plate 11, a rear plate 12, and a clamping plate 30, the front plate 11 is connected to the rear plate 12, a portion of the clamping plate 30 is disposed between the front plate 11 and the rear plate 12, a placement groove 114 is disposed on the front plate 11, and the front plate 11 and the rear plate 12 are used for fixing the clamping plate 30 and the clamp assembly.
In detail, in the present embodiment, the front plate 11 and the rear plate 12 are connected by screws, and the clamping plate 30 is disposed at the bottom of the mounting plate 10, and the front plate 11, the clamping plate 30, and the rear plate 12 are sequentially connected, and the clamping plate 30 is used for connecting with the memory particle testing tool.
In another embodiment, the front plate 11 and the rear plate 12 are connected by gluing.
In another embodiment, the front plate 11 and the rear plate 12 are connected by welding.
As shown in fig. 2, the front plate 1111 is provided with a front through hole 112, the rear plate 12 is provided with a rear through hole corresponding to the front through hole 112, the front through hole 112 communicates with the rear through hole, the front through hole 112 and the rear through hole form a hollow 113, and the jig assembly is slidably connected to the mounting plate 10 through the hollow 113.
In detail, in the present embodiment, the number of the empty slots 113 is eight, and the eight empty slots 113 are arranged at intervals along the horizontal direction, and the eight empty slots 113 are divided into four empty slots 113 respectively, so that an operator can test the memory particles 2000 of at most eight stations at the same time, the working efficiency is improved, and the front plate 11 is provided with the limiting plates 121 between the plurality of empty slots 113, so as to divide the empty slots 113 and avoid the clamping pieces 20 from being offset due to overlarge force during the operation of the operator.
The inner wall of the rear through hole is provided with a chute along the vertical direction, the clamp assembly is provided with a sliding piece corresponding to the chute, and the sliding piece is in butt joint with the chute, so that the clamp assembly can slide along the vertical direction of the mounting plate 10 through the chute.
In detail, in the present embodiment, the sliding member (not shown) can be a slider, a pulley, or other components capable of sliding, and the clamp assembly is connected to the chute by the sliding member so that the clamp assembly can move relative to the mounting plate 10.
As shown in fig. 1, the clamp assembly includes a clamping piece 20, the clamping piece 20 is disposed on the front plate 11 corresponding to the placement groove 114, and the clamping piece 20 can rotate relative to the rear plate 12, such that a clamping space is formed between the clamping piece 20 and the rear plate 12, and the clamping piece 20 is used for clamping the memory particles 2000.
In detail, in the present embodiment, the number of the clips 20 is plural, the number of the clips 20 is set corresponding to the placement groove 114, and a clamping space is formed between the clips 20 and the bottom plate, and the clamping space is used for clamping the memory particles 2000.
It is understood that in other embodiments, the number of clips 20 can be two, and the two clips 20 are connected by an elastic member, and the two clips 20 have a connection portion, and the connection portion is used to fix the memory particle 2000.
As shown in fig. 1, the clamping piece 20 includes a holding portion 21, a clamping arm 22, and a clamping portion 23, the holding portion 21 is connected to the clamping portion 23 through the clamping arm 22, the holding portion 21 is movable relative to the clamping portion, and the clamping portion 23 is used for fixing the memory particle 2000.
In detail, in the present embodiment, the clamping portion 23 can be abutted against the rear plate 12 through the placement groove 114 provided on the front plate 11, when the operator presses the grip portion 21, the clamping portion 23 is separated from the rear plate 12, at this time, the memory particle 2000 is placed in the placement groove 114, and the operator releases the grip portion 21 again so that the memory particle 2000 can be gripped.
As shown in fig. 3, the clip 20 further includes a torsion spring 24, where the torsion spring 24 is disposed on the clip arm 22 and connected to the grip portion 21 and the clamping portion 23, and the torsion spring 24 enables the clamping portion 23 to fix the memory particle 2000.
In detail, in the present embodiment, one end of the torsion spring 24 is connected to the grip portion 21, and the other end of the torsion spring 24 is connected to the clamping portion 23, so that an operator can manually open or combine the clamping portion 23 with the rear plate 12, facilitating the operation of the operator.
As shown in fig. 1-3, the clamping plate 30 is provided with positioning grooves 31, the positioning grooves 31 are arranged at two sides of the clamping plate 30, the recess direction of the positioning grooves 31 is from two sides of the clamping plate 30 to the center, and the positioning grooves 31 are used for positioning and fixing with the memory particle testing tool.
In this embodiment, the positioning slots 31 are disposed on two sides of the clamping plate 30, and the number of the positioning slots 31 on one side is two, and the positioning slots 31 are used for being connected with the memory particle testing tool, it can be understood that the existing memory particle testing tool is provided with positioning pieces, and when the memory particle thin testing tool 1000 is connected with the memory particle testing tool, the positioning pieces are abutted with the positioning slots 31, so that the occurrence of the displacement of the memory particle thin testing tool 1000 in the testing process is prevented.
As shown in fig. 2, the clamping plate 30 is provided with a foolproof slot 32, the foolproof slot 32 is eccentrically arranged at the bottom of the clamping plate 30, and the foolproof slot 32 is used for distinguishing the forward and reverse directions of the clamping plate 30.
It will be appreciated that in an actual production and detection environment, a technician performs detection on one side of the memory granule testing tool, in order to avoid that when the memory granule thin testing tool 1000 is inserted, the side with the placement groove 114 is opposite to the side where the technician is located, so that the memory granule testing tool needs to be specified in a use direction, and the memory granule thin testing tool 1000 also has a use direction, that is, the memory granule thin testing tool 1000 is operated in a single direction, so as to avoid that the operator fails to distinguish the direction of the memory granule thin testing tool 1000 during operation, and the repeated insertion and extraction of the memory granule thin testing tool 1000 causes the reduction of the working efficiency, thereby setting the fool-proof groove 32 at the bottom of the clamping plate 30 and deviating the fool-proof groove 32 from the central axis of the clamping plate 30.
In more detail, the specific location of the fool-proof slot 32 does not affect the technical effect thereof, i.e., the fool-proof slot 32 can be disposed at both sides of the mounting plate 10.
As shown in fig. 1, the mounting plate 10 includes a limiting latch 111, the limiting latch 111 is disposed on two sides of the mounting plate 10, the protruding direction of the limiting latch 111 is that the mounting plate 10 protrudes horizontally to two sides, and the limiting latch 111 is used for limiting and fixing with the memory particle testing tool.
In detail, in this embodiment, the limit latch 111 has a trapezoid structure, and the turning angle of the limit latch 111 is a rounded corner, so that an operator can insert the mounting board 10 into the memory particle testing tool conveniently, and it can be understood that the limit latch 111 can have other shapes, such as a rounded triangle or a rounded square.
By combining all the embodiments, the clamp assembly with the sliding clamp type structure is adopted to clamp memory particles and drive the memory particles to slide, and the clamping structure is adopted to avoid the complex structure of the jig caused by excessive assemblies.
The foregoing description is only of the preferred embodiments of the present utility model and is not intended to limit the scope of the utility model, and all equivalent structural changes made by the description of the present utility model and the accompanying drawings or direct/indirect application in other related technical fields are included in the scope of the utility model.
Claims (10)
1. The utility model provides a thin test fixture of memory granule, is applied to memory granule test fixture, its characterized in that includes:
the mounting plate is connected with the memory particle testing tool and comprises a placing groove used for placing memory particles;
the clamp assembly is connected with the mounting plate and can rotate relative to the mounting plate, so that a clamping space is formed between one end of the clamp assembly and the mounting plate, and the clamping space is used for clamping memory particles.
2. The memory granule thin-type test jig according to claim 1, wherein the mounting plate comprises a front plate, a rear plate and clamping plates, the front plate is connected with the rear plate, a portion of the clamping plates are disposed between the front plate and the rear plate, the placement groove is disposed on the front plate, and the front plate and the rear plate are used for fixing the clamping plates and the clamp assembly.
3. The memory granule thin-type test jig according to claim 2, wherein the front plate is provided with a front through hole, the rear plate is provided with a rear through hole corresponding to the front through hole, the front through hole is communicated with the rear through hole, the front through hole and the rear through hole form a hollow groove, and the jig assembly is slidably connected with the mounting plate through the hollow groove.
4. The memory granule thin-type test jig according to claim 3, wherein a chute is provided on an inner wall of the rear through hole in a vertical direction, the jig assembly is provided with a slider corresponding to the chute, and the slider is abutted to the chute, so that the jig assembly can slide in the vertical direction of the mounting plate through the chute.
5. The memory granule thin-type test jig of claim 3, wherein the jig assembly comprises a clamping piece, the clamping piece is disposed on the front plate corresponding to the placement groove and is rotatable relative to the rear plate, such that a clamping space is formed between the clamping piece and the rear plate, and the clamping piece is used for clamping the memory granule.
6. The memory granule thin-type test jig according to claim 5, wherein the clip comprises a grip portion, a clip arm, and a clamping portion, the grip portion being connected to the clamping portion by the clip arm, the grip portion being movable relative to the clamping portion, the clamping portion being configured to fix the memory granule.
7. The memory granule thin-type test jig according to claim 6, wherein the clip further comprises a torsion spring provided on the clip arm and connected to the grip portion and the clip portion, the torsion spring being capable of causing the clip portion to fix the memory granule.
8. The thin test fixture for memory particles according to claim 2, wherein the clamping plate is provided with positioning grooves, the positioning grooves are arranged on two sides of the clamping plate, the concave direction of the positioning grooves is from two sides of the clamping plate to the center, and the positioning grooves are used for positioning and fixing with the test fixture for memory particles.
9. The memory granule thin-type test jig according to claim 8, wherein the clamping plate is provided with a fool-proof groove eccentrically arranged at the bottom of the clamping plate, and the fool-proof groove is used for distinguishing the forward and reverse directions of the clamping plate.
10. The memory granule thin-type test fixture according to claim 1, wherein the mounting plate comprises a limit clamping tenon, the limit clamping tenon is arranged on two sides of the mounting plate, the protruding direction of the limit clamping tenon is a horizontal protrusion from the mounting plate to two sides, and the limit clamping tenon is used for limiting and fixing with the memory granule test fixture.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320515686.2U CN219626326U (en) | 2023-03-07 | 2023-03-07 | Thin test fixture of memory granule |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320515686.2U CN219626326U (en) | 2023-03-07 | 2023-03-07 | Thin test fixture of memory granule |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219626326U true CN219626326U (en) | 2023-09-01 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320515686.2U Active CN219626326U (en) | 2023-03-07 | 2023-03-07 | Thin test fixture of memory granule |
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| Country | Link |
|---|---|
| CN (1) | CN219626326U (en) |
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2023
- 2023-03-07 CN CN202320515686.2U patent/CN219626326U/en active Active
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