CN113506590A - Independent accurate temperature control solid state hard drives aging testing module - Google Patents
Independent accurate temperature control solid state hard drives aging testing module Download PDFInfo
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- CN113506590A CN113506590A CN202110811755.XA CN202110811755A CN113506590A CN 113506590 A CN113506590 A CN 113506590A CN 202110811755 A CN202110811755 A CN 202110811755A CN 113506590 A CN113506590 A CN 113506590A
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- solid state
- aging
- carrier
- state disk
- shell
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
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- Testing Of Individual Semiconductor Devices (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
Abstract
The invention relates to an independent accurate temperature control solid state disk aging test module, which comprises a shell, an air duct tail pipe, an exhaust fan and a carrier, wherein the shell is provided with a tail pipe; the shell, the air duct tail pipe and the exhaust fan are sequentially communicated from front to back; the shell is flat, the front part of the shell is provided with an aging chamber with an opening, and the rear part of the shell is provided with control chambers which are arranged at intervals up and down; the inner end of the aging chamber is provided with a butt joint test plug, the top and the bottom of the aging chamber are respectively provided with a heating sheet, and a temperature sensor is arranged in the aging chamber; the carrier can be slidably inserted into the aging chamber, and the socket of the solid state disk to be tested is connected with the butt joint test plug; the carrier is positioned between the two heating sheets and forms an air duct communicated with the air duct tail pipe; according to the invention, the air channels communicated with the air channel tail pipes are formed at the top and the bottom of the carrier, and the two heating sheets are matched, so that the solid state disk can be independently and accurately controlled in temperature, the test accuracy is improved, and the device has the advantages of simple and compact structure, small size and the like.
Description
Technical Field
The invention relates to the technical field of high-temperature aging tests, in particular to an independent and accurate temperature control solid state disk aging test module.
Background
The high-temperature aging test equipment is a high-temperature and severe environment test equipment which is simulated aiming at high-performance electronic products, is important experimental equipment for improving the stability and the reliability of products, is an important production process for improving the quality and the competitiveness of products of various production enterprises, and is widely applied to the fields of power electronics, computers, communication, biological pharmacy and the like.
With the rapid development of the solid state disk industry, the performance requirement on the test equipment is higher and higher, and therefore, many solid state disk high-temperature aging test equipment appears in the market, such as an SSD solid state disk aging test cabinet disclosed in prior art 201821206547.7 and a solid state disk high-temperature aging test equipment disclosed in prior art 202020508858.X, during the test of the prior art: the method comprises the following steps that a plurality of solid state disks are tested in a high-temperature box at the same time, and because the temperature control is not uniform after the high-temperature box is loaded, the solid state disks often have nonuniform temperature step by step to cause different performances of the solid state disks, so that the test effect and the result accuracy are influenced; like the large high-temperature test equipment applied to the reliability test of the solid state disk disclosed in the prior art 201721456171.0, although a plurality of independent aging rooms are arranged, each aging room is bulky, so that the carrying is inconvenient, and the laboratory area is greatly occupied.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provide an independent and accurate temperature control solid state disk aging test module.
In order to achieve the purpose, the invention adopts the technical scheme that: an aging test module for an independent precise temperature control solid state disk comprises a shell, an air duct tail pipe, an exhaust fan and a carrier;
the shell, the air duct tail pipe and the exhaust fan are sequentially communicated from front to back;
the shell is flat, the front part of the shell is provided with an aging chamber with an opening, and the rear part of the shell is provided with control chambers which are arranged at intervals up and down;
the inner end of the aging chamber is provided with a butt joint test plug, the top and the bottom of the aging chamber are respectively provided with a heating sheet, and a temperature sensor is arranged in the aging chamber;
the control room is respectively connected with the butt joint test plug, the heating plate, the temperature sensor and the air draft fan;
the carrier can be slidably inserted into the aging chamber, and the socket of the solid state disk to be tested is connected with the butt joint test plug; the carrier is positioned between the two heating sheets and forms an air duct communicated with the air duct tail pipe.
Preferably, two sides of the aging chamber are respectively provided with a guide strip which is horizontally placed; and guide sliding chutes corresponding to the guide strips are respectively arranged on two sides of the carrier.
Preferably, the outer ends of the two guide strips are provided with guide parts which are obliquely arranged outwards.
Preferably, clamping grooves are respectively arranged on two sides of an inlet of the aging chamber; and lock components which can stretch into the clamping grooves are respectively arranged on two sides of the handle of the carrier.
Preferably, each group of the locking assemblies comprises an accommodating groove arranged in the carrier handle and an F-shaped locking block arranged in the accommodating groove; the lock piece includes the lock body, set up the tapered end that can stretch into in the draw-in groove outside the lock body, set up the spacing portion that prevents the lock piece roll-off holding tank inside the lock body, set up the extrusion portion that can stretch out the carrier handle on the lock body, set up the guide pillar that inboard and parallel placement with the lock body in the extrusion portion, overlap and establish the spring that drives the tapered end and move toward the draw-in groove on the guide pillar.
Preferably, the inner side of the lock head is provided with a chamfer.
Preferably, the two sides and the top and the bottom of the inlet of the aging chamber are provided with guide surfaces which are obliquely arranged outwards.
Preferably, two sides of the control chamber are respectively provided with oppositely-arranged ventilation openings.
Due to the application of the technical scheme, compared with the prior art, the invention has the following advantages:
1. according to the invention, through the design of an ultra-narrow air channel, the temperature of the solid state disk can be accurately controlled independently by matching two heating sheets, the temperature control precision can reach 1 ℃, and the test precision is improved;
2. the air channel communicated with the air channel tail pipe is formed at the top and the bottom of the carrier, so that the air channel has the advantages of simple and compact structure, small size and the like;
3. the invention has the advantages of modular design, stacking and convenient rapid assembly.
Drawings
The technical scheme of the invention is further explained by combining the accompanying drawings as follows:
FIG. 1 is a schematic structural diagram of an independent accurate temperature control solid state disk aging test module according to the present invention;
FIG. 2 is a vertical sectional view of the independent precise temperature control solid state disk aging test module according to the present invention;
FIG. 3 is a horizontal sectional view of the independent precise temperature control solid state disk aging test module according to the present invention;
FIG. 4 is an enlarged view of a portion of FIG. 2 at A;
FIG. 5 is an enlarged view of a portion of FIG. 3 at A;
fig. 6 is a schematic structural view of the carrier of the present invention after the solid state disk is mounted thereon.
Wherein: 1. a housing; 11. a card slot; 12. a vent; 13. a control room; 14. butting a test plug; 15. a heating plate; 16. an air duct; 17. a guide strip; 18. a guide portion; 19. a guide surface; 2. an air duct tail pipe; 3. an air draft fan; 4. a carrier; 41. accommodating grooves; 42. a lock body; 43. a lock head; 44. a limiting part; 45. a pressing section; 46. a guide post; 47. a spring; 48. a guide chute; 49. a handle; 5. a solid state disk; 51. and (4) inserting the socket.
Detailed Description
The invention is described in further detail below with reference to the figures and the embodiments.
Fig. 1-6 show an independent accurate temperature control solid state disk aging test module according to the present invention, which includes a housing 1, an air duct tail pipe 2, an induced draft fan 3 and a carrier 4;
the shell 1, the air duct tail pipe 2 and the exhaust fan 3 are sequentially communicated from front to back;
the shell 1 is flat, the front part of the shell is provided with an open aging chamber, and the rear part of the shell is provided with a control chamber 13 which is arranged at an upper and lower interval;
the inner end of the aging chamber is provided with a butt joint test plug 14, the top and the bottom of the aging chamber are respectively provided with a heating sheet 15, and a temperature sensor is arranged in the aging chamber;
the control room 13 is respectively connected with the butt joint test plug 14, the heating plate 15, the temperature sensor and the air draft fan 3 through wires;
the carrier 4 can be slidably inserted into the aging chamber, and the socket 51 of the solid state disk 5 to be tested is connected with the butt joint test plug 14; the carrier 4 is positioned between the two heating sheets 15 and forms an air duct 16 communicated with the air duct tail pipe 2; the air duct has only a 1mm gap.
When in work: a worker inserts the carrier 4 provided with the solid state disk 5 to be tested into the aging chamber, connects the socket 51 of the solid state disk 5 to be tested with the butt joint test plug 14, independently and accurately controls the temperature of the solid state disk 5 to be tested through the control chamber 13, and heats the solid state disk through the two heating sheets 15 when the temperature sensor detects that the temperature in the aging chamber is lower than a set temperature, so that the solid state disk reaches the set temperature; when the temperature sensor detects that the temperature in the aging room is higher than the set temperature, the heat is dissipated through the exhaust fan 3 to enable the temperature to reach the set temperature; the temperature control precision can reach 1 ℃, so that the precise temperature control of the solid state disk 5 and the precise result of the aging test are realized.
Further, guide strips 17 which are horizontally placed are respectively arranged on two sides of the aging chamber; two sides of the carrier 4 are respectively provided with a guide sliding chute 48 corresponding to the guide strip 17; when the carrier 4 is inserted into the aging chamber, the guide strips 17 on two sides of the aging chamber are respectively positioned in the guide sliding grooves 48 on two sides of the carrier 4, so that the guiding effect is achieved, the carrier 4 can be ensured to be positioned in the middle of the two heating sheets 15, and the temperature is more uniform.
Further, the outer ends of the two guide strips 17 are provided with guide portions 18 which are obliquely arranged outwards, so that a guide effect is achieved, and the guide strips 17 on the two sides of the aging chamber can conveniently slide into the guide sliding grooves 48 on the two sides of the carrier 4.
Furthermore, clamping grooves 11 are respectively arranged on two sides of an inlet of the aging chamber; two sides of the handle 49 of the carrier 4 are respectively provided with a locking component which can extend into the clamping groove 11; the invention can play a limiting role by matching the locking component with the clamping groove 11, and can fix the carrier 4 in the aging chamber.
Further, each group of the locking components comprises an accommodating groove 41 arranged in the handle 49 and an F-shaped locking block arranged in the accommodating groove 41; the lock block comprises a lock body 42, a lock head 43 arranged outside the lock body 42 and capable of extending into the clamping groove 11, a limiting part 44 arranged inside the lock body 42 and used for preventing the lock block from sliding out of the accommodating groove 41, an extrusion part 45 arranged on the lock body 42 and capable of extending out of a handle 49, a guide pillar 46 arranged on the inner side of the extrusion part 45 and parallel to the lock body 42, and a spring 47 sleeved on the guide pillar 46 and used for driving the lock head 43 to move into the clamping groove 11; after the carrier 4 is inserted into the aging chamber, the lock 43 extends into the slot 11 under the elastic force of the spring 47, so that the carrier 4 is fixed in the aging chamber; when the carrier 4 needs to be taken out of the aging chamber, the extrusion part 45 is pressed down, the elastic force of the spring 47 is overcome to enable the lock body 42 to move towards the direction far away from the clamping groove 11, the lock head 43 is enabled to be separated from the clamping groove 11, then the carrier 4 is taken out of the aging chamber, finally the extrusion part 45 is loosened, the lock body 42 drives the extrusion part 45 to return to the initial position under the elastic force of the spring 47, and meanwhile, the lock block can be prevented from sliding out of the accommodating groove 41 under the action of the limiting part 44.
Further, the inner side of the lock 43 is provided with a chamfer to play a guiding role, so that the lock 43 can conveniently extend into the clamping groove 11.
Further, the both sides and the top and the bottom of ageing room entry all are provided with the spigot surface 19 of leaning out the placing, play the guide effect, and the carrier 4 of being convenient for stretches into in the ageing room.
Furthermore, the two sides of the control chamber 13 are respectively provided with the ventilation openings 12 which are oppositely arranged, so that the heat dissipation effect is achieved, and the temperature in the control chamber 13 is conveniently reduced.
The above is only a specific application example of the present invention, and the protection scope of the present invention is not limited in any way. All the technical solutions formed by equivalent transformation or equivalent replacement fall within the protection scope of the present invention.
Claims (8)
1. The utility model provides an independent accurate accuse temperature solid state hard drives aging testing module which characterized in that: comprises a shell, an air duct tail pipe, an exhaust fan and a carrier;
the shell, the air duct tail pipe and the exhaust fan are sequentially communicated from front to back;
the shell is flat, the front part of the shell is provided with an aging chamber with an opening, and the rear part of the shell is provided with control chambers which are arranged at intervals up and down;
the inner end of the aging chamber is provided with a butt joint test plug, the top and the bottom of the aging chamber are respectively provided with a heating sheet, and a temperature sensor is arranged in the aging chamber;
the control room is respectively connected with the butt joint test plug, the heating plate, the temperature sensor and the air draft fan;
the carrier can be slidably inserted into the aging chamber, and the socket of the solid state disk to be tested is connected with the butt joint test plug; the carrier is positioned between the two heating sheets and forms an air duct communicated with the air duct tail pipe.
2. The aging test module for the independent precise temperature control solid state disk according to claim 1, wherein: guide strips which are horizontally arranged are respectively arranged on two sides of the aging chamber; and guide sliding chutes corresponding to the guide strips are respectively arranged on two sides of the carrier.
3. The aging test module for the independent precise temperature control solid state disk according to claim 2, wherein: the outer ends of the two guide strips are provided with guide parts which are obliquely arranged outwards.
4. The aging test module for the independent precise temperature control solid state disk according to any one of claims 1 to 3, wherein: clamping grooves are respectively formed in two sides of an inlet of the aging chamber; and lock components which can stretch into the clamping grooves are respectively arranged on two sides of the handle of the carrier.
5. The aging test module for the independent precise temperature control solid state disk according to claim 4, wherein: each group of locking components comprises an accommodating groove arranged in the carrier handle and an F-shaped locking block arranged in the accommodating groove; the lock piece includes the lock body, set up the tapered end that can stretch into in the draw-in groove outside the lock body, set up the spacing portion that prevents the lock piece roll-off holding tank inside the lock body, set up the extrusion portion that can stretch out the carrier handle on the lock body, set up the guide pillar that inboard and parallel placement with the lock body in the extrusion portion, overlap and establish the spring that drives the tapered end and move toward the draw-in groove on the guide pillar.
6. The aging test module for the independent precise temperature control solid state disk according to claim 5, wherein: and a chamfer is arranged on the inner side of the lock head.
7. The aging test module for the independent precise temperature control solid state disk according to claim 6, wherein: and guide surfaces which are obliquely arranged outwards are arranged on the two sides, the top and the bottom of the inlet of the aging chamber.
8. The aging test module for the independent precise temperature control solid state disk according to claim 7, wherein: and ventilation openings which are oppositely arranged are respectively arranged at two sides of the control chamber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110811755.XA CN113506590A (en) | 2021-07-19 | 2021-07-19 | Independent accurate temperature control solid state hard drives aging testing module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110811755.XA CN113506590A (en) | 2021-07-19 | 2021-07-19 | Independent accurate temperature control solid state hard drives aging testing module |
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| Publication Number | Publication Date |
|---|---|
| CN113506590A true CN113506590A (en) | 2021-10-15 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110811755.XA Pending CN113506590A (en) | 2021-07-19 | 2021-07-19 | Independent accurate temperature control solid state hard drives aging testing module |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115754686A (en) * | 2023-01-09 | 2023-03-07 | 法特迪精密科技（苏州）有限公司 | Temperature cycle aging test socket and test method |
-
2021
- 2021-07-19 CN CN202110811755.XA patent/CN113506590A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115754686A (en) * | 2023-01-09 | 2023-03-07 | 法特迪精密科技（苏州）有限公司 | Temperature cycle aging test socket and test method |
| CN115754686B (en) * | 2023-01-09 | 2023-04-14 | 法特迪精密科技（苏州）有限公司 | Temperature cycle aging test socket and test method |
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