CN117434300B - Digital acceleration sensor circuit interchangeability multi-station test platform - Google Patents
Digital acceleration sensor circuit interchangeability multi-station test platform Download PDFInfo
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- CN117434300B CN117434300B CN202311328130.3A CN202311328130A CN117434300B CN 117434300 B CN117434300 B CN 117434300B CN 202311328130 A CN202311328130 A CN 202311328130A CN 117434300 B CN117434300 B CN 117434300B
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- 238000012360 testing method Methods 0.000 title claims abstract description 146
- 230000001133 acceleration Effects 0.000 title claims abstract description 21
- 239000000523 sample Substances 0.000 claims description 34
- 239000000758 substrate Substances 0.000 claims description 22
- 238000005056 compaction Methods 0.000 claims description 3
- 238000000034 method Methods 0.000 abstract description 17
- 238000013461 design Methods 0.000 abstract description 4
- 210000004907 gland Anatomy 0.000 description 11
- 238000010586 diagram Methods 0.000 description 7
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000004880 explosion Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P21/00—Testing or calibrating of apparatus or devices covered by the preceding groups
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- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses a digital acceleration sensor circuit interchangeability multi-station test platform, which belongs to the technical field related to accelerometer circuit test, and comprises a base, a test bottom plate circuit fixed on the base by adopting a floating tray, and a product tray positioned above the floating tray, wherein the test bottom plate circuit can realize rapid and safe loading and unloading of a tested object, and ensure that the contact state in the test process is stable so as to realize good test output; the split type design is adopted, the fixing requirement can be realized by a small amount of screw connection or buckle connection among the parts, the operation is convenient and the structure is compact; the test board has quick interchange attribute, and can be realized by only changing the corresponding test board circuit and the corresponding product bracket for the tested objects with the same kind and different structural forms; through the test platform, the efficiency of the test process of the tested object can be greatly improved, and meanwhile, the safety of the test process is fully ensured.
Description
Technical Field
The invention relates to the technical field related to accelerometer circuit testing, in particular to a digital acceleration sensor circuit interchangeability multi-station testing platform.
Background
In the test process of accelerometer circuit product functions and performance indexes, there are quite a lot of test indexes, test environments and operation flows, and in the test process, operation procedures such as assembly of a tested object, lead wires, data transmission reading records and the like exist, and each procedure affects the evaluation result of the tested object.
The conventional accelerometer circuit testing method generally builds a single testing tool circuit component, fixes a tested object with the testing tool circuit component through a screw or other forms through structural design, and meanwhile, establishes a testing environment to meet testing requirements. The method has the problems of low assembly efficiency, single test product, easy occurrence of mechanical damage to the tested object and the like.
Disclosure of Invention
The invention provides a digital acceleration sensor circuit interchangeability multi-station test platform, and aims to solve the technical defects.
The specific technical scheme provided by the invention is as follows:
The invention provides a digital acceleration sensor circuit interchangeability multi-station test platform which comprises a base, a test bottom plate circuit fixed on the base by adopting a floating tray, and a product tray arranged above the floating tray, wherein the floating tray comprises a floating bracket fixed on the base, a guide positioning pin and a product tray positioning pin fixed on the floating bracket, a locking pressing block fixed on the floating bracket by adopting a screw, a fixed buckle and a limiting piece, a concave cavity for placing the product tray is arranged on the floating bracket, the product tray comprises a product bracket arranged on the floating bracket, a rotary shaft seat arranged on the product bracket by adopting the screw, a gland cover arranged on the rotary shaft seat, and a press buckle fixed on the gland cover in a screw-mounting mode, the product bracket is provided with a clamping groove at the corresponding position of the press buckle, and the clamping groove and the press buckle are mutually matched to realize press locking of the product bracket.
Optionally, the base includes the bottom plate, fixes stand on the bottom plate, fix circuit bracket on the stand, install linear bearing and the spring pin on the circuit bracket, fix locking piece and the locating pin on the circuit bracket, the stand adopts threaded connection's form to fix on the bottom plate, the circuit bracket adopts the screw connection's form to fix on the stand.
Optionally, the linear bearing, the spring pin and the positioning pin are fixed on the circuit bracket in an interference fit manner, and the locking piece is fixed on the circuit bracket by a screw.
Optionally, the circuit bracket is provided with a groove for placing the circuit of the test base plate, and the locking piece is located in a threaded groove formed in the circuit bracket.
Optionally, the test base plate circuit includes the circuit base plate that adopts the screw connection to fix on the circuit bracket, fixes elasticity test probe on the circuit base plate, be located circuit base plate edge's connector, wherein, the array is provided with a plurality of elasticity test probe on the circuit base plate, every elasticity test probe corresponds a test station.
Optionally, the circuit substrate is provided with a positioning hole matched with the positioning pin, the positioning pin and the positioning hole are matched with each other to realize positioning of the test substrate circuit on the base, the elastic test probe is welded and connected on the circuit substrate, and the connector is welded and fixed on the circuit substrate.
Optionally, the floating tray is provided with a via hole matched with the elastic test probe, and the elastic test probe directionally slides in the via hole.
Optionally, the locking press block comprises a press block base and a press block handle, the press block base is used for realizing the screw mounting and fixing of the floating tray, the briquetting handle freely rotates around the installation shaft to realize compaction and release of the product tray.
Optionally, the product tray is provided with a test slot at a position corresponding to the elastic test probe, and a test through hole matched with the elastic test probe and the via hole is arranged in the test slot so as to enable the elastic test probe to pass through the test through hole and contact with the tested object.
Optionally, the product bracket is provided with a positioning pin hole matched with the positioning pin, and the product tray is provided with a clamping angle.
The invention has the following beneficial technical effects:
The embodiment of the invention provides a digital acceleration sensor circuit interchangeability multi-station test platform, which comprises a base, a test bottom plate circuit fixed on the base by adopting a floating tray, and a product tray positioned above the floating tray, wherein the floating tray comprises a floating bracket fixed on the base, a guide positioning pin and a product tray positioning pin fixed on the floating bracket, a locking pressing block fixed on the floating bracket by adopting screws, a fixed buckle and a limiting piece, a concave cavity for placing the product tray is arranged on the floating bracket, the product tray comprises a product bracket arranged on the floating bracket, a rotary shaft seat arranged on the product bracket by adopting screws, a gland cover arranged on the rotary shaft seat and a press buckle fixed on the gland cover in a screw mode, the product bracket is provided with a clamping groove at the corresponding position of the press buckle, the clamping groove and the press buckle are mutually matched to realize press locking of the product bracket, a tested object can be rapidly assembled and disassembled, and the contact state in the test process is ensured to be stable, and good test output is realized; the split type design is adopted, the fixing requirement can be realized by a small amount of screw connection or buckle connection among the parts, the operation is convenient and the structure is compact; the test board has quick interchange attribute, and can be realized by only changing the corresponding test board circuit and the corresponding product bracket for the tested objects with the same kind and different structural forms; through the test platform, the efficiency of the test process of the tested object can be greatly improved, and meanwhile, the safety of the test process is fully ensured.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a front view structure of a digital acceleration sensor circuit interchangeability multi-station test platform according to an embodiment of the present invention;
FIG. 2 is a schematic side view of a digital acceleration sensor circuit interchangeability multi-station testing platform according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of an explosion structure of a digital acceleration sensor circuit interchangeability multi-station test platform according to an embodiment of the present invention;
FIG. 4 is a schematic front view of a base according to an embodiment of the present invention;
FIG. 5 is a schematic side view of a base according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of a front view of a test chassis circuit according to an embodiment of the present invention;
FIG. 7 is a schematic diagram of a side view of a test chassis circuit according to an embodiment of the present invention;
FIG. 8 is a schematic elevational view of a floating tray according to an embodiment of the present invention;
FIG. 9 is a schematic side view of a floating tray according to an embodiment of the present invention;
FIG. 10 is a schematic elevational view of a product tray according to an embodiment of the invention;
FIG. 11 is a schematic side view of a product tray according to an embodiment of the present invention;
FIG. 12 is a schematic elevational view of a product carrier according to an embodiment of the invention;
FIG. 13 is a schematic side view of a product carrier according to an embodiment of the invention;
FIG. 14 is a schematic diagram showing an assembly structure of a test chassis circuit and a base according to an embodiment of the present invention;
FIG. 15 is a schematic view showing an assembled structure of a floating tray and a base according to an embodiment of the present invention;
FIG. 16 is a schematic diagram of placement of an object under test according to an embodiment of the present invention;
FIG. 17 is a schematic view of the assembled product tray according to an embodiment of the present invention;
fig. 18 is a schematic diagram of a pressing process of the floating tray according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail below with reference to the accompanying drawings, and it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The following describes a digital acceleration sensor circuit interchangeability multi-station test platform in detail with reference to fig. 1 to 18.
Referring to fig. 1 to 3, the digital acceleration sensor circuit interchangeability multi-station test platform provided by the embodiment of the invention comprises a base 1, a test bottom plate circuit 2 fixed on the base 1 by adopting a floating tray 3, and a product tray 4 positioned above the floating tray 3, wherein the digital acceleration sensor circuit interchangeability multi-station test platform provided by the embodiment of the invention can be used for accelerometer circuit products or circuit test processes with similar structural characteristics and test indexes, realizes rapid and safe loading of a tested object, and ensures stable contact state in the test process so as to realize good test output.
Referring to fig. 4 and 5, the base 1 of the embodiment of the present invention includes a base plate 5, a column 6 fixed to the base plate 5, a circuit bracket 7 fixed to the column 6, a linear bearing 8 and a spring pin 9 mounted on the circuit bracket 7, a locking piece 10 and a positioning pin 11 fixed to the circuit bracket 7, wherein the column 6 is fixed to the base plate 5 in a screw connection manner, and the circuit bracket 7 is fixed to the column 6 in a screw connection manner. The linear bearing 8, the spring pin 9 and the positioning pin 11 are all fixed on the circuit bracket 7 in an interference fit mode, and the locking piece 10 is fixed on the circuit bracket 7 by adopting a screw.
Referring to fig. 4 and 5, the circuit bracket 7 is provided with a groove for placing the test chassis circuit 2, and the locking piece 10 is located in the threaded groove provided on the circuit bracket 7. That is, the circuit bracket 7 of the embodiment of the present invention is provided with a specific groove and a threaded hole in addition to the hole sites for assembling and fixing other components, and the specific groove is used for placing and fixing the test chassis circuit 2.
Referring to fig. 6 and 7, the test board circuit 2 according to the embodiment of the present invention includes a circuit substrate 12 fixed on the circuit bracket 7 by screw connection, elastic test probes 13 fixed on the circuit substrate 12, and connectors 14 located at the edge of the circuit substrate 12, wherein a plurality of elastic test probes 13 are arranged on the circuit substrate 12 in an array, and each elastic test probe 13 corresponds to one test station. The circuit substrate 12 is provided with positioning holes matched with the positioning pins 11, the positioning pins 11 and the positioning holes are matched with each other to realize positioning of the test base plate circuit 2 on the base 1, the elastic test probes 13 are welded on the circuit substrate 12, and the connector 14 is welded and fixed on the circuit substrate 12.
Referring to fig. 6 and 7, a plurality of groups of test stations are arranged on a circuit substrate 12, the overall external structure size is matched with the size of a groove in a circuit bracket 7, a plurality of groups of positioning holes and fixing holes are also arranged on the circuit substrate 12, the positioning holes correspond to the positions of positioning pins 11 arranged on a base 1 so as to realize positioning and placement of a test bottom plate circuit 2, and the fixing holes correspond to the positions of screw holes arranged on the base 1 for fixing the circuit bracket so as to realize screw-mounting and fixing of the test bottom plate circuit 2; the elastic test probes 13 are fixedly assembled with the circuit substrate 12 in a soldering manner, and the connectors 14 are fixedly assembled with the circuit substrate 12 in a screwing manner.
Referring to fig. 8, 9, 10 and 11, the floating tray 3 according to the embodiment of the present invention includes a floating tray 15 fixed on the base 1, a guide positioning pin 16 and a product tray positioning pin 19 fixed on the floating tray 15, a locking pressing block 17 fixed on the floating tray 15 by a screw, a fixing buckle 18 and a limiting piece 20, wherein the floating tray 15 is provided with a cavity for placing the product tray 4, the product tray 4 includes a product tray 21 mounted on the floating tray 15, a swivel shaft seat 22 mounted on the product tray 21 by a screw, a gland 23 mounted on the swivel shaft seat 22 by a swivel shaft, and a press buckle 24 fixed on the gland 23 by a screw, the product tray 21 is provided with a clamping groove 25 at a corresponding position of the press buckle 24, and the clamping groove 25 and the press buckle 24 cooperate with each other to realize press locking of the product tray 21.
Referring to fig. 8, 9,10 and 11, the guide positioning pin 16 and the product tray positioning pin 19 are fixedly assembled with the floating bracket 15 in an interference fit manner, and the locking press block 17, the fixing buckle 18 and the limiting piece 20 are fixedly assembled with the floating bracket 15 in a screw-fit manner. The floating bracket 15 is provided with fixing holes and threaded holes for assembling other parts, and is also provided with grooves for placing the product tray 4, and meanwhile, the floating bracket is also provided with test stations corresponding to the number and the positions of the test base plate circuits 2, and each test station is provided with a through hole matched with the elastic test probes 13 in the test base plate circuits 2 so as to realize directional sliding of the elastic test probes 13, namely, the floating bracket 3 is provided with through holes matched with the elastic test probes 13, and the elastic test probes 13 can directionally slide in the through holes.
Referring to fig. 10 and 11, the locking press 17 includes a press base for achieving screw fixation of the floating tray 3, and a press handle freely rotatable about a mounting shaft to achieve compaction and release of the product tray 4. Specifically, the locking pressing block 17 is composed of a pressing block base and a pressing block handle, the pressing block base is used for being fixed with the screw-mounting of the floating tray 15, the pressing block handle can freely rotate around the mounting shaft to compact and release the product tray 4, meanwhile, the pressing block handle has elastic properties, can be pulled up or released along the direction perpendicular to the plate surface of the floating tray 15, and the pressing requirement on the product tray 4 is achieved by means of self elastic pressure.
Referring to fig. 10, 11, 12 and 13, the swivel shaft seat 22 is fixedly assembled with the product bracket 21 in a screw-type manner, the pressing cover 23 is connected with the swivel shaft 22 through a rotating shaft to realize opening and closing, and the pressing buckle 24 is fixedly assembled with the pressing cover 23 in a screw-type manner. A test groove 27 is arranged on the product bracket at a position corresponding to a test station arranged on the test base plate circuit 2, and a test through hole corresponding to a test probe through hole arranged on the elastic test probe 13 and the floating tray 15 is arranged in the test groove 27 so as to enable the test probe to pass through the test through hole and contact with a tested object; the product bracket is provided with a picking and placing operation space at a proper position of each test station for loading and unloading the tested object; the product bracket should also be designed with anti-reflection features for the tested object in each test station to ensure that the tested object is correctly placed in the test slot. Specifically, a positioning pin hole matched with the positioning pin is formed in the product bracket 21, a clamping angle 26 is formed in the product bracket, and the clamping angle is used for ensuring that a tested object is correctly placed in the test groove to realize anti-reflection of the tested object.
Referring to fig. 14 and 15, in the embodiment of the present invention, after the guide positioning pin 16 is aligned with the linear bearing 8 provided on the base 1 and inserted, the assembly between the floating tray 3 and the base 1 can be completed, after the assembly is completed, the bottom surface of the floating tray 3 is elastically supported by the spring pin 9 provided on the base 1, and when an external force is applied, the floating tray 3 can freely float up and down, and the front end portion of the elastic test probe 13 provided on the test board circuit 2 is inserted into the elastic test probe via hole of the floating tray 15.
Referring to fig. 16, after the gland 23 is opened, the tested object can be placed in the test slot of the product bracket 21, and due to the anti-reverse positioning feature arranged on the product bracket 21, the tested object can be ensured to be placed accurately, so that the test point of the tested object is aligned with the elastic test probe via hole; closing the gland 23 and operating the pressing buckle 24 to clamp the gland 23 so as to fix the tested object.
Referring to fig. 17, the handle of the locking pressing block 17 arranged on the floating tray 3 is rotated to give up an assembly space, the product tray 4 with the measured object placed is taken, the clamping angles at two ends of the rotary shaft seat 22 are wedged into the limiting sheets 20 arranged on the floating tray 3 and are put flat, the positioning holes of the product bracket 21 are matched with the positioning pins corresponding to the product tray 19 arranged on the floating tray 3, the handle of the locking pressing block 17 is pulled upwards, and the locking pressing block is released after rotation, so that the compacting of the product tray 4 by each handle is ensured.
Referring to fig. 18, the two sides of the floating bracket 15 are pressed with appropriate force, and driven by the guiding positioning pin 16 to move in a guiding direction along the linear bearing 8, so that the floating bracket 15 drives the product tray 4 to move downward as a whole to be overlapped with the circuit bracket 7, and meanwhile, the fixing buckle 18 arranged on the floating tray 3 is buckled and fixed with the locking piece 10, so that the tested object can be effectively contacted with the elastic test probe 13 arranged on the test base circuit 2, and the subsequent test work is executed.
The embodiment of the invention provides a digital acceleration sensor circuit interchangeability multi-station test platform, which comprises a base, a test bottom plate circuit fixed on the base by adopting a floating tray, and a product tray positioned above the floating tray, wherein the floating tray comprises a floating bracket fixed on the base, a guide positioning pin and a product tray positioning pin fixed on the floating bracket, a locking pressing block fixed on the floating bracket by adopting screws, a fixed buckle and a limiting piece, a concave cavity for placing the product tray is arranged on the floating bracket, the product tray comprises a product bracket arranged on the floating bracket, a rotary shaft seat arranged on the product bracket by adopting screws, a gland cover arranged on the rotary shaft seat and a press buckle fixed on the gland cover in a screw mode, the product bracket is provided with a clamping groove at the corresponding position of the press buckle, the clamping groove and the press buckle are mutually matched to realize press locking of the product bracket, a tested object can be rapidly assembled and disassembled, and the contact state in the test process is ensured to be stable, and good test output is realized; the split type design is adopted, the fixing requirement can be realized by a small amount of screw connection or buckle connection among the parts, the operation is convenient and the structure is compact; the test board has quick interchange attribute, and can be realized by only changing the corresponding test board circuit and the corresponding product bracket for the tested objects with the same kind and different structural forms; through the test platform, the efficiency of the test process of the tested object can be greatly improved, and meanwhile, the safety of the test process is fully ensured.
It will be apparent to those skilled in the art that various modifications and variations can be made to the embodiments of the present invention without departing from the spirit or scope of the embodiments of the invention. Thus, if such modifications and variations of the embodiments of the present invention fall within the scope of the claims and the equivalents thereof, the present invention is also intended to include such modifications and variations.
Claims (7)
1. The digital acceleration sensor circuit interchangeability multi-station testing platform is characterized by comprising a base, a testing bottom plate circuit fixed on the base by adopting a floating tray, and a product tray positioned above the floating tray, wherein the floating tray comprises a floating bracket fixed on the base, a guide positioning pin and a product tray positioning pin fixed on the floating bracket, a locking pressing block fixed on the floating bracket by adopting screws, a fixing buckle and a limiting piece, a concave cavity for placing the product tray is arranged on the floating bracket, the product tray comprises a product bracket arranged on the floating bracket, a rotary shaft seat arranged on the product bracket by adopting screws, a pressing cover arranged on the rotary shaft seat by adopting a rotating shaft, and a pressing buckle fixed on the pressing cover in a screwing mode, a clamping groove is formed in a corresponding position of the pressing buckle by the product bracket, and the clamping groove and the pressing buckle are mutually matched to realize pressing and locking of the product; the base comprises a bottom plate, an upright post fixed on the bottom plate, a circuit bracket fixed on the upright post, a linear bearing and a spring pin which are arranged on the circuit bracket, and a locking piece and a positioning pin which are fixed on the circuit bracket, wherein the upright post is fixed on the bottom plate in a threaded connection mode, and the circuit bracket is fixed on the upright post in a screw connection mode; the linear bearing, the spring pin and the positioning pin are fixed on the circuit bracket in an interference fit mode, and the locking piece is fixed on the circuit bracket by adopting a screw; the locking briquetting comprises a briquetting base and a briquetting handle, wherein the briquetting base is used for realizing the threaded fixation of the floating tray, and the briquetting handle freely rotates around a mounting shaft to realize the compaction and release of the product tray.
2. The digital acceleration sensor circuit interchangeability multi-station testing platform according to claim 1, wherein the circuit bracket is provided with a groove for placing the testing bottom plate circuit, and the locking piece is positioned in a threaded groove arranged on the circuit bracket.
3. The digital acceleration sensor circuit interchangeability multi-station testing platform according to claim 2, wherein the testing base plate circuit comprises a circuit substrate fixed on the circuit bracket by screw connection, elastic testing probes fixed on the circuit substrate, and connectors positioned at the edge of the circuit substrate, wherein a plurality of elastic testing probes are arranged on the circuit substrate in an array manner, and each elastic testing probe corresponds to one testing station.
4. The digital acceleration sensor circuit interchangeability multi-station testing platform according to claim 3, wherein the circuit substrate is provided with positioning holes matched with the positioning pins, the positioning pins and the positioning holes are matched with each other to realize the positioning of the testing bottom plate circuit on the base, the elastic testing probes are welded on the circuit substrate, and the connector is welded and fixed on the circuit substrate.
5. The digital acceleration sensor circuit interchangeability multi-station testing platform according to claim 4, characterized in that the floating tray is provided with a via hole matched with the elastic testing probe, and the elastic testing probe slides in the via hole in an oriented manner.
6. The digital acceleration sensor circuit interchangeability multi-station testing platform according to claim 5, wherein the product tray is provided with a testing groove at a position corresponding to the elastic testing probe, and a testing through hole matched with the elastic testing probe and the through hole is arranged in the testing groove so as to enable the elastic testing probe to pass through the testing through hole and contact with a tested object.
7. The digital acceleration sensor circuit interchangeability multi-station testing platform according to claim 6, wherein the product bracket is provided with a positioning pin hole matched with the positioning pin, and the product bracket is provided with a clamping angle.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311328130.3A CN117434300B (en) | 2023-10-13 | 2023-10-13 | Digital acceleration sensor circuit interchangeability multi-station test platform |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202311328130.3A CN117434300B (en) | 2023-10-13 | 2023-10-13 | Digital acceleration sensor circuit interchangeability multi-station test platform |
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| CN117434300A CN117434300A (en) | 2024-01-23 |
| CN117434300B true CN117434300B (en) | 2024-09-17 |
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| CN202311328130.3A Active CN117434300B (en) | 2023-10-13 | 2023-10-13 | Digital acceleration sensor circuit interchangeability multi-station test platform |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20160084039A (en) * | 2015-01-05 | 2016-07-13 | 디플러스(주) | Socket for testing product |
| CN116660587A (en) * | 2023-05-11 | 2023-08-29 | 北方联创通信有限公司 | Test fixture and operation method thereof |
| CN220795256U (en) * | 2023-10-13 | 2024-04-16 | 青岛智腾微电子有限公司 | Digital acceleration sensor circuit test platform |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113281638A (en) * | 2021-06-30 | 2021-08-20 | 格力电器（武汉）有限公司 | Circuit board testing device |
| CN215866986U (en) * | 2021-08-03 | 2022-02-18 | 成都长城开发科技有限公司 | Printed circuit board assembly part function test device |
| CN217779274U (en) * | 2022-05-17 | 2022-11-11 | 广东智联半导体装备有限公司 | Board placing platform capable of randomly adjusting size tray |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20160084039A (en) * | 2015-01-05 | 2016-07-13 | 디플러스(주) | Socket for testing product |
| CN116660587A (en) * | 2023-05-11 | 2023-08-29 | 北方联创通信有限公司 | Test fixture and operation method thereof |
| CN220795256U (en) * | 2023-10-13 | 2024-04-16 | 青岛智腾微电子有限公司 | Digital acceleration sensor circuit test platform |
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