CN213922957U

CN213922957U - Carrier for electrical performance test

Info

Publication number: CN213922957U
Application number: CN202121279612.0U
Authority: CN
Inventors: 陶磊
Original assignee: Rongcheer Industrial Technology Suzhou Co ltd
Current assignee: Rongcheer Industrial Technology Suzhou Co ltd
Priority date: 2021-06-09
Filing date: 2021-06-09
Publication date: 2021-08-10
Anticipated expiration: 2031-06-09

Abstract

The application relates to a carrier for electrical performance test, it includes electronic component, still includes: a turntable; the carrier assembly comprises a carrier movably arranged above the turntable, and the top of the carrier is provided with a limiting part for limiting the electronic element; the test assembly comprises a needle die unit arranged right above the carrier and a signal adapter plate connected to the top of the needle die unit, the needle die unit comprises a probe, and one end of the probe penetrates through the signal adapter plate; the test assembly further comprises a code scanning unit, and the carrier assembly further comprises a driving unit for driving the carrier to ascend so that the test point of the electronic element is in contact with the other end of the probe. Through the mode, the carrier for the electrical performance test has the advantages of being accurate in test, stable and reliable.

Description

Carrier for electrical performance test

Technical Field

The application relates to the technical field of detection equipment, in particular to a carrier for electrical performance testing.

Background

With the development of the times, various high-tech electronic products are continuously updated in order to prevent unqualified products from being circulated to the market. The use of a detection device is necessary to effectively reduce the influx of products into the market that do not comply with national standards. The electrical performance (LCR) testing device is used for testing various element parameters of electronic elements, mainly for testing inductance, capacitance and resistance parameters. In the prior art, no carrier specially used for electrical performance (LCR) test exists. Therefore, there is a need to develop a carrier for electrical performance testing.

SUMMERY OF THE UTILITY MODEL

The application aims to provide a carrier for electrical performance testing, and the carrier has the advantages of being accurate in testing, stable and reliable.

The purpose of the application is realized by the following technical scheme:

a carrier for electrical performance testing, comprising an electronic component, further comprising: a turntable; the carrier assembly comprises a carrier movably arranged above the turntable, and the top of the carrier is provided with a limiting part for limiting the electronic element; the test assembly comprises a needle die unit arranged right above the carrier and a signal adapter plate connected to the top of the needle die unit, the needle die unit comprises a probe, and one end of the probe penetrates through the signal adapter plate; the test assembly further comprises a code scanning unit, and the carrier assembly further comprises a driving unit driving the carrier to ascend so that the test point of the electronic element is in contact with the other end of the probe.

Preferably, the driving unit comprises a driving cylinder and a jacking block, the jacking block is arranged at the tail end of an output shaft of the driving cylinder, and the jacking block is arranged below the carrier.

Preferably, the jacking block is arranged below the turntable, and the carrier assembly further comprises a guide unit arranged between the jacking block and the carrier.

Preferably, the guide unit comprises a top plate arranged between the jacking block and the rotary table, a guide shaft penetrating through the rotary table and a shaft sleeve matched with the guide shaft, wherein the guide shaft is connected with the top plate and the carrier.

Preferably, the pin die unit further comprises a pin die for mounting the probe and a cover plate arranged between the pin die and the carrier, and the pin die is detachably connected with the signal adapter plate.

Preferably, the test assembly further comprises a fixing plate for mounting the signal adapter plate, the carrier is movably arranged at the bottom of the fixing plate, a through groove is formed in the bottom of the fixing plate, and the signal adapter plate is connected to the top wall of the through groove.

Preferably, the test assembly further comprises a support seat and a connecting block for connecting the support seat and the fixing plate.

Preferably, the code scanning unit is arranged at the top edge of the support seat, wherein a notch is formed in the side wall of the fixing plate close to the code scanning unit, so that the code scanning area of the electronic element is exposed.

Preferably, the code scanning unit comprises a code scanning gun, a mounting bracket for mounting the code scanning gun and a rotating mechanism for connecting the mounting bracket and the supporting seat.

Preferably, the limiting part comprises a positioning pin for penetrating the edge of the electronic element and a limiting groove matched with the test point.

Compared with the prior art, the method has the following beneficial effects:

according to the carrier for testing the electrical performance, the electronic element is positioned through the limiting part of the carrier, and then the carrier is driven to ascend through the driving unit, so that the probe is in contact with the testing point of the electronic element, and the testing data is obtained. The testing method is simple and easy to realize, and has the advantages of accurate testing, stability and reliability.

Drawings

Fig. 1 is a schematic overall structure diagram of a carrier for electrical performance testing proposed in the present application;

FIG. 2 is a schematic structural view of the carrier assembly and the test assembly of FIG. 1;

FIG. 3 is an exploded view of the partial structure of FIG. 2;

fig. 4 is a schematic structural diagram of the carrier and the electronic component in fig. 1.

In the figure, 100-electronic components; 110-test points; 120-code scanning area; 510-a turntable; 600-a carrier assembly; 610-a carrier; 620-a drive unit; 621-driving cylinder; 622-jacking block; 630-a guiding unit; 631-a top plate; 632-a guide shaft; 633-shaft sleeve; 640-a limiting part; 641-positioning pins; 642-a limit groove; 700-a test assembly; 710-a needle die unit; 711-a probe; 712-needle mold; 713-cover plate; 720-signal adapter board; 730-a fixing plate; 731-through groove; 732-gaps; 740-a support base; 750-connecting blocks; 760-code scanning unit; 761-code scanning gun; 762-mounting brackets; 763 rotating mechanism.

Detailed Description

In order to make the aforementioned objects, features and advantages of the present application more comprehensible, embodiments accompanying the present application are described in detail below with reference to the accompanying drawings. It is to be understood that the specific embodiments described herein are merely illustrative of the application and are not limiting of the application. It should be further noted that, for the convenience of description, only some of the structures related to the present application are shown in the drawings, not all of the structures. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

The terms "comprising" and "having," as well as any variations thereof, in this application are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.

Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.

As shown in fig. 1 to 4, a carrier for electrical performance testing includes an electronic component 100, and further includes: a turntable 510; the carrier assembly 600 comprises a carrier 610 movably arranged above the turntable 510, and a limiting part 640 for limiting the electronic element 100 is arranged at the top of the carrier 610; the test assembly 700 includes a pin module unit 710 disposed right above the carrier 610 and a signal adapter plate 720 connected to the top of the pin module unit 710, the pin module unit 710 includes a probe 711, and one end of the probe 711 penetrates through the signal adapter plate 720; the test assembly 700 further includes a code scanning unit 760, the carrier assembly 600 further includes a driving unit 620 for driving the carrier 610 to ascend so as to make the test points 110 of the electronic component 100 contact with the other ends of the probes 711, the number of the probes 711 is set according to the test points 110 to be tested, the probes 711 are used as a contact medium for electrical testing, the probes 711 can also be replaced by other connectors, the turntable 510 is used for rotational loading of the carrier 610, a plurality of carriers 610 can be disposed on the turntable 510, the electronic component 100 to be tested can be placed in the carrier 610 for testing, and the code scanning unit 760 is configured to scan production lot information of the electronic component 100 to be tested.

In this way, the electronic component 100 is positioned by the position-limiting portion 640 of the carrier 610, and the carrier 610 is driven to ascend by the driving unit 620, so that the probes 711 contact with the test points 110 of the electronic component 100 to obtain test data. The testing method is simple and easy to realize, and has the advantages of accurate testing, stability and reliability.

Further, the driving unit 620 includes a driving cylinder 621 and a jacking block 622, the jacking block 622 is disposed at the end of the output shaft of the driving cylinder 621, the jacking block 622 is disposed below the carrier 610, and the carrier 610 is directly pushed to rise by the jacking block 622, so that the test point 110 is in contact with the other end of the probe 711, thereby achieving the purpose of testing.

Further, the jacking block 622 is disposed below the turntable 510, and the carrier assembly 600 further includes a guiding unit 630 disposed between the jacking block 622 and the carrier 610, so that the lifting movement of the carrier 610 is more stable, and the service life of the apparatus can be prolonged.

Further, the guiding unit 630 includes a top plate 631 disposed between the jacking block 622 and the turntable 510, a guiding shaft 632 penetrating through the turntable 510, and a shaft sleeve 633 matched with the guiding shaft 632, wherein the guiding shaft 632 is connected with the top plate 631 and the carrier 610, the shaft sleeve 633 is connected with the turntable 510, and buffering members such as springs can be disposed between the shaft sleeve 633 and the top plate 631, so that the movement is smoother.

Further, the pin die unit 710 further includes a pin die 712 for mounting the probe 711 and a cover plate 713 disposed between the pin die 712 and the carrier 610, the pin die 712 is detachably connected to the signal adapter plate 720, the pin die 712 and the cover plate 713 jointly form a through hole for the probe 711 to pass through, the pin die 712 and the cover plate 713 protect the probe 711, and the service life of the probe 711 is prolonged.

Further, the test assembly 700 further comprises a fixing plate 730 for mounting the signal adapter plate 720, the carrier 610 is movably arranged at the bottom of the fixing plate 730, the bottom of the fixing plate 730 is provided with a through groove 731, the signal adapter plate 720 is connected to the top wall of the through groove 731, and the structure of the test assembly 700 is specifically limited, so that the test assembly is convenient to process and easy to implement.

Further, the testing assembly 700 further includes a supporting base 740 and a connecting block 750 for connecting the supporting base 740 and the fixing plate 730.

Further, the code scanning unit 760 is disposed at the top edge of the supporting base 740, wherein the fixing plate 730 has a notch 732 disposed on a side wall thereof near the code scanning unit 760, so that the code scanning area 120 of the electronic component 100 is exposed, and the production lot of the test product can be recorded for easy tracking and maintenance.

Further, the code scanning unit 760 comprises a code scanning gun 761, a mounting bracket 762 for mounting the code scanning gun 761, and a rotating mechanism 763 for connecting the mounting bracket 762 and the supporting seat 740, wherein the specific implementation form of the rotating mechanism 763 can be realized by many existing technologies, and the mounting angle of the code scanning gun 761 can be adjusted by setting the rotating mechanism 763.

Further, the position-limiting portion 640 includes a positioning pin 641 for passing through the edge of the electronic component 100 and a position-limiting groove 642 for matching with the test point 110.

The above is only one specific embodiment of the present application, and any other modifications based on the concept of the present application are considered as the protection scope of the present application.

Claims

1. A carrier for electrical performance testing, comprising an electronic component (100), characterized in that it further comprises:

a dial (510);

the carrier assembly (600) comprises a carrier (610) movably arranged above the turntable (510), and the top of the carrier (610) is provided with a limiting part (640) for limiting the electronic element (100);

the test assembly (700) comprises a pin die unit (710) arranged right above the carrier (610) and a signal adapter plate (720) connected to the top of the pin die unit (710), the pin die unit (710) comprises a probe (711), and one end of the probe (711) penetrates through the signal adapter plate (720);

the test assembly (700) further comprises a code scanning unit (760), and the carrier assembly (600) further comprises a driving unit (620) for driving the carrier (610) to ascend so as to enable the test point (110) of the electronic component (100) to be in contact with the other end of the probe (711).

2. The carrier for electrical performance testing according to claim 1, wherein the driving unit (620) comprises a driving cylinder (621) and a lifting block (622), the lifting block (622) is disposed at an end of an output shaft of the driving cylinder (621), and the lifting block (622) is disposed below the carrier (610).

3. The carrier for electrical performance testing of claim 2, wherein the jacking block (622) is disposed below the turntable (510), the carrier assembly (600) further comprising a guiding unit (630) disposed between the jacking block (622) and the carrier (610).

4. The carrier for electrical performance testing as claimed in claim 3, wherein the guiding unit (630) comprises a top plate (631) disposed between the jacking block (622) and the turntable (510), a guiding shaft (632) penetrating the turntable (510), and a shaft sleeve (633) engaged with the guiding shaft (632), wherein the guiding shaft (632) connects the top plate (631) and the carrier (610).

5. The carrier for electrical performance testing as recited in claim 1, wherein the pin die unit (710) further comprises a pin die (712) for mounting the probes (711) and a cover plate (713) disposed between the pin die (712) and the carrier (610), the pin die (712) being detachably connected to the signal adapter plate (720).

6. The carrier for electrical performance testing according to claim 5, wherein the testing assembly (700) further comprises a fixing plate (730) for mounting the signal adapter plate (720), the carrier (610) is movably disposed at the bottom of the fixing plate (730), a through slot (731) is formed at the bottom of the fixing plate (730), and the signal adapter plate (720) is connected to the top wall of the through slot (731).

7. The carrier for electrical performance testing of claim 6, wherein the testing assembly (700) further comprises a support base (740) and a connection block (750) connecting the support base (740) and the fixing plate (730).

8. The carrier for electrical performance testing of claim 7, wherein the code scanning unit (760) is disposed at a top edge of the supporting base (740), wherein a side wall of the fixing plate (730) near the code scanning unit (760) is provided with a notch (732) to expose the code scanning area (120) of the electronic component (100).

9. The carrier for electrical performance testing of claim 8, wherein the code scanning unit (760) comprises a code scanning gun (761) and a mounting bracket (762) for mounting the code scanning gun (761), and a rotating mechanism (763) connecting the mounting bracket (762) and the support base (740).

10. The carrier for electrical performance testing according to claim 1, wherein the limiting portion (640) comprises a positioning pin (641) for penetrating the edge of the electronic component (100) and a limiting groove (642) matched with the testing point (110).