CN211478541U - Testing jig for flexible circuit board - Google Patents
Testing jig for flexible circuit board Download PDFInfo
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- CN211478541U CN211478541U CN201921896176.4U CN201921896176U CN211478541U CN 211478541 U CN211478541 U CN 211478541U CN 201921896176 U CN201921896176 U CN 201921896176U CN 211478541 U CN211478541 U CN 211478541U
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- base
- circuit board
- flexible circuit
- test
- flip
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Abstract
The utility model discloses a test fixture of flexible circuit board, be in including box body and setting needle mould mechanism on the box body, needle mould mechanism includes: a base disposed on the case; the base is provided with a test card position used for placing the flexible circuit board; the flip cover is rotatably connected with the base; the flip cover is provided with a probe module corresponding to the test card position, and the probe module is provided with a plurality of round-head probes; and the elastic force adjusting module is positioned between the test clamping position and the base and used for changing the distance between the test clamping position and the base under the action of external force. The utility model discloses a test fixture of flexible circuit board can not cause the indentation to display panel's flexible circuit board, improves production efficiency.
Description
Technical Field
The utility model relates to a test fixture technical field, in particular to test fixture of flexible circuit board.
Background
With the progress of science and technology, flexible circuit boards are rapidly developed in the present society, and are widely applied to display panels of mobile phones, computers and the like. In order to ensure the service life of mobile phones and computer screens, a series of performance index tests need to be performed on the display panel, and the test method generally includes installing the display panel in a test fixture and connecting the display panel with a flexible circuit board to achieve conduction tests of the display panel.
The test fixture in the prior art mainly comprises two types of test fixtures, one type is a pull rod type test fixture which has the defects of large occupied space, inconvenience in storage, high pull rod and inconvenience in operation of personnel, and the other type is a connector type test fixture which has the defects of low test speed and low efficiency caused by the fact that the flexible circuit board is easy to generate obvious contact traces and is placed in a connector, and the connector is easy to damage and needs to be frequently maintained or replaced, so that the production efficiency is seriously influenced.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a flexible circuit board's test fixture, this flexible circuit board's test fixture can not cause the indentation to display panel's flexible circuit board, improves production efficiency.
In order to realize the purpose, the technical scheme of the utility model is that:
the utility model provides a test fixture of flexible circuit board, its includes the box body and sets up pin mould mechanism on the box body, wherein, pin mould mechanism includes: a base disposed on the case; the base is provided with a test card position used for placing the flexible circuit board; the flip cover is rotatably connected with the base; the flip cover is provided with a probe module corresponding to the test card position, and the probe module is provided with a plurality of round-head probes; and the elastic force adjusting module is positioned between the test clamping position and the base and used for changing the distance between the test clamping position and the base under the action of external force.
Furthermore, the upper surface of the base is provided with a fixing hole; the test clamping position is provided with a mounting hole which penetrates through the test clamping position from top to bottom; the needle die mechanism further comprises a positioning piece which is arranged in the mounting hole in a penetrating mode and is in threaded fit with the fixing hole.
Furthermore, a first positioning blind hole is formed in the upper surface of the base; the lower surface of the test clamping position is provided with a second positioning blind hole matched with the first positioning blind hole; the elasticity adjusting module is a spring piece, the lower end of the spring piece is in abutting contact with the first positioning blind hole, and the upper end of the spring is in abutting contact with the second positioning blind hole.
Furthermore, the probe module is fixedly connected with the flip cover through a locking piece; the upside trompil of mounting hole with the retaining member phase-match, just flip is located directly over the base, the central axis of mounting hole with the central axis of retaining member is in on the same axis.
Furthermore, the pin die mechanism also comprises a flexible connecting belt, and the flexible connecting belt is provided with a first end and a second end; the upper surface of the base is provided with a first open slot for the first end of the flexible connecting belt to pass through the first open slot and then be connected with the test host in the box body; and a second slot is formed in the lower surface of the flip cover, and the second end of the flexible connecting belt passes through the second slot and then is connected with the probe module.
Further, the flexible connecting belt is made of a material which can conduct electricity and can deform elastically.
Furthermore, the base is provided with a buckle component for fixing the relative position of the flip cover and the base when the flip cover is positioned right above the base.
Further, flip through the pivot with the base rotates to be connected, the cover is equipped with the torsional spring in the pivot, the one end of torsional spring with flip's lower surface top supports the contact, the other end with the upper surface top of base supports the contact.
Compared with the prior art, the utility model discloses following technological effect has at least:
adopt the flexible circuit board's of above-mentioned structure test fixture, its probe module adopts the button head probe, can prevent to visit produced indentation when to the test of flexible circuit board, moreover elasticity adjusting module can adjust the button head through elasticity and visit the test pressure to the flexible circuit board to realize that the test does not keep the trace to handle, improve production efficiency.
For a better understanding and an implementation, the present invention is described in detail below with reference to the accompanying drawings.
Drawings
Fig. 1 is a schematic view of a test fixture for a flexible circuit board according to the present invention;
fig. 2 is a schematic view of a testing jig (omitting a flexible connecting band) for a flexible circuit board according to the present invention;
fig. 3 is a schematic diagram of a testing jig (omitting a flexible connecting band and a testing clip) for a flexible circuit board according to the present invention;
FIG. 4 is an enlarged schematic view of A in FIG. 3;
fig. 5 is a bottom view of the test card of the present invention.
[ reference numerals ]
100 case
210 base 211 test card
212 spring element 213 fixing hole
214 mounting hole
216 first positioning blind hole 217 and second positioning blind hole
218 first slot
220 flip 221 probe module
222 retaining member 223 second slot
230 flexible connecting belt
240 buckle assembly
250 rotating shaft 251 torsion spring
Detailed Description
In order to fully understand the objects, features and effects of the present invention, the conception, specific structure and technical effects of the present invention will be further described with reference to the accompanying drawings.
As shown in fig. 1, a test fixture for a flexible circuit board includes a box 100 and a pin mold mechanism disposed on the box 100, wherein the pin mold mechanism includes:
a base 210 provided on the cartridge 100; the base 210 is provided with a test card position 211 for placing the flexible circuit board;
a flip 220 rotatably connected to the base 210; the flip 220 is provided with a probe module 221 corresponding to the test card 211, and the probe module 221 is provided with a plurality of round-head probes;
and the elastic force adjusting module is located between the test card 211 and the base 210, and is used for changing the distance between the test card 211 and the base 210 under the action of an external force.
Use the utility model discloses a during detection fixture, place flexible circuit board's test position on test screens 211, close flip 220, the button head probe on flip 220 can contact and carry out the conduction test to flexible circuit board with flexible circuit board's test position. The probe adopts the button head probe, can prevent that the probe from testing produced indentation to flexible circuit board. Because the elasticity adjusting module is arranged between the test clamping position 211 and the base 210, the probe can play a role in buffering when falling down, and no trace is left in the test.
Compared with the prior art, the utility model discloses a detection tool, the button head probe is to when the test screens pushes down, the test screens compresses elasticity adjusting module under the pressure effect for the test screens with distance between the base reduces, moreover elasticity adjusting module still provides reverse elasticity to the test screens, in order to realize the non-rigid contact of flexible circuit board and button head probe prevents the indentation appears in the flexible circuit board.
As shown in fig. 2 and 3, the present invention is provided with a fixing hole 213 on the upper surface of the base 210; the test card 211 is provided with a mounting hole 214 penetrating from top to bottom; the needle mold mechanism further includes a positioning member, which is inserted into the mounting hole 214 and is in threaded fit with the fixing hole 213.
Specifically, the setting element is the screw, through the screw with fixed orifices screw-thread fit, in order with the test screens with the base is connected.
Further, the probe module 221 is fixedly connected with the flip 220 through the locking member 222; the upside trompil and the retaining member 222 phase-match of mounting hole 214, and flip 220 is located 210 bases directly over, the central axis of mounting hole 214 is in same axis with the central axis of retaining member 222, is convenient for when flip 220 closes, two retaining members 222 and two mounting holes 214 phase-matches on the flip 220, thereby make flip and base are closed completely, so that the button head probe can contact with the test site of flexible circuit board better, avoid because of flip and the incomplete produced detection error of base closure, improve and detect the success rate.
Wherein, retaining member 222 is the screw, because the circumstances of the retaining member outstanding probe module 221 lower surface can appear, consequently, the test screens with after the pedestal connection is accomplished, the high needs on setting element top are less than test screens 211 upper surface height, just the setting element top with the difference in height between the upper surface of test screens is greater than the outstanding height of retaining member to when flip 220 is closed, the retaining member can be in the mounting hole, thereby ensure flip 220 with the base is closed completely.
As shown in fig. 4 and 5, the present invention is provided with a first positioning blind hole 216 on the upper surface of the base; the lower surface of the test clamping position 211 is provided with a second positioning blind hole 217 matched with the first positioning blind hole; the elasticity adjusting module is a spring part 212, the lower end of the spring part abuts against and contacts with the first positioning blind hole, and the upper end of the spring abuts against and contacts with the second positioning blind hole to buffer the pressure of the probe and prevent the spring part from deviating in the using process.
Further, the base 210 is provided with a fastening component 240 for fixing the relative position of the flip 220 and the base 210 when the flip 220 is located right above the base 210, so that the round-head probe cannot be moved in the detection process, and the detection stability is improved.
As shown in fig. 1, further, the pin mold mechanism further comprises a flexible connecting band 230, wherein the flexible connecting band 230 has a first end and a second end; a first slot 218 is formed in the upper surface of the base 210, so that the first end of the flexible connecting band 230 passes through the first slot 218 and then is connected to a test host in the box 100; the lower surface of the flip 220 is formed with a second slot 223, so that the second end of the flexible connecting band 230 passes through the second slot 223 and then is connected to the probe module 221.
Further, the flexible connection strap 230 is made of a material that can conduct electricity and can elastically deform, and specifically, the flexible connection strap is a flat cable.
The utility model discloses a built-in mode of flexonics area compare in the external mode of flexonics area, can reduce external right flexonics area's damage, increase of service life. Moreover, the widths of the first slot 218 and the second slot 223 are both greater than the width of the flexible connection band 230, so that the flexible connection band can freely stretch when the flip is opened or closed, and the flexible connection band is prevented from being damaged by folding when the flip is closed with the base.
As shown in fig. 2 and 3, further, the flip cover 220 is rotatably connected to the base 210 through a rotating shaft 250, the rotating shaft 250 is sleeved with a torsion spring 251, one end of the torsion spring 251 abuts against and contacts with the lower surface of the flip cover 220, and the other end abuts against and contacts with the upper surface of the base 210, so that the flip cover can be automatically reset when not in use.
The present invention is not limited to the above embodiment, and if various modifications or variations of the present invention do not depart from the spirit and scope of the present invention, they are intended to be covered if they fall within the scope of the claims and the equivalent technology of the present invention.
Claims (8)
1. The utility model provides a test fixture of flexible circuit board, its includes the box body and sets up pin mould mechanism on the box body, its characterized in that, pin mould mechanism includes:
a base disposed on the case; the base is provided with a test card position used for placing the flexible circuit board;
the flip cover is rotatably connected with the base; the flip cover is provided with a probe module corresponding to the test card position, and the probe module is provided with a plurality of round-head probes;
and the elastic force adjusting module is positioned between the test clamping position and the base and used for changing the distance between the test clamping position and the base under the action of external force.
2. The testing fixture of the flexible circuit board according to claim 1, characterized in that:
the upper surface of the base is provided with a fixing hole;
the test clamping position is provided with a mounting hole which penetrates through the test clamping position from top to bottom;
the needle die mechanism further comprises a positioning piece which is arranged in the mounting hole in a penetrating mode and is in threaded fit with the fixing hole.
3. The testing fixture of the flexible circuit board according to claim 2, characterized in that:
the upper surface of the base is provided with a first positioning blind hole;
the lower surface of the test clamping position is provided with a second positioning blind hole matched with the first positioning blind hole;
the elasticity adjusting module is a spring piece, the lower end of the spring piece is in abutting contact with the first positioning blind hole, and the upper end of the spring is in abutting contact with the second positioning blind hole.
4. The testing fixture of the flexible circuit board according to claim 2, characterized in that:
the probe module is fixedly connected with the turnover cover through a locking piece;
the upside trompil of mounting hole with the retaining member phase-match, just flip is located directly over the base, the central axis of mounting hole with the central axis of retaining member is in on the same axis.
5. The testing fixture of the flexible circuit board according to claim 1, characterized in that:
the pin die mechanism further comprises a flexible connecting belt, and the flexible connecting belt is provided with a first end and a second end;
the upper surface of the base is provided with a first open slot for the first end of the flexible connecting belt to pass through the first open slot and then be connected with the test host in the box body;
and a second slot is formed in the lower surface of the flip cover, and the second end of the flexible connecting belt passes through the second slot and then is connected with the probe module.
6. The testing fixture of the flexible circuit board according to claim 5, characterized in that:
the flexible connecting belt is made of a material which can conduct electricity and deform elastically.
7. The testing fixture of the flexible circuit board according to claim 1, characterized in that:
the base is provided with a buckle component used for fixing the relative position of the flip cover and the base when the flip cover is positioned right above the base.
8. The testing fixture of the flexible circuit board according to claim 1, characterized in that:
flip through the pivot with the base rotates to be connected, the cover is equipped with the torsional spring in the pivot, the one end of torsional spring with flip's lower surface top supports the contact, the other end with the upper surface top of base supports the contact.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921896176.4U CN211478541U (en) | 2019-11-05 | 2019-11-05 | Testing jig for flexible circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921896176.4U CN211478541U (en) | 2019-11-05 | 2019-11-05 | Testing jig for flexible circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211478541U true CN211478541U (en) | 2020-09-11 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921896176.4U Active CN211478541U (en) | 2019-11-05 | 2019-11-05 | Testing jig for flexible circuit board |
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| CN (1) | CN211478541U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113873865A (en) * | 2021-10-18 | 2021-12-31 | 霸州市云谷电子科技有限公司 | FPC turns over a tool |
-
2019
- 2019-11-05 CN CN201921896176.4U patent/CN211478541U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113873865A (en) * | 2021-10-18 | 2021-12-31 | 霸州市云谷电子科技有限公司 | FPC turns over a tool |
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