CN114101156B - Wafer fork cleaning method and device - Google Patents
Wafer fork cleaning method and device Download PDFInfo
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- CN114101156B CN114101156B CN202010861124.4A CN202010861124A CN114101156B CN 114101156 B CN114101156 B CN 114101156B CN 202010861124 A CN202010861124 A CN 202010861124A CN 114101156 B CN114101156 B CN 114101156B
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
- B08B3/024—Cleaning by means of spray elements moving over the surface to be cleaned
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/10—Cleaning by methods involving the use of tools characterised by the type of cleaning tool
- B08B1/12—Brushes
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/30—Cleaning by methods involving the use of tools by movement of cleaning members over a surface
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/30—Cleaning by methods involving the use of tools by movement of cleaning members over a surface
- B08B1/32—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B21/00—Arrangements for supplying or controlling air or other gases for drying solid materials or objects
- F26B21/50—Ducting arrangements from the source of air or other gases to the materials or objects being dried
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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Abstract
Description
技术领域technical field
本发明涉及设备维护技术领域,尤其涉及一种晶圆叉清洗方法及装置。The invention relates to the technical field of equipment maintenance, in particular to a wafer fork cleaning method and device.
背景技术Background technique
晶圆叉,用于承载晶圆,实现晶圆的运送、翻转等,如图1a、图1b、图1c所示,在晶圆叉上与晶圆相接触的位置,容易藏污纳垢。The wafer fork is used to carry the wafer, realize the transportation and flipping of the wafer, etc., as shown in Figure 1a, Figure 1b, and Figure 1c, the position on the wafer fork that is in contact with the wafer is easy to hide dirt.
晶圆叉需要周期性进行维护,包括清洗等等,以防止晶圆的交叉污染。目前,通常在设备不运转的情况下,以人工直接做清洗。Wafer forks need periodic maintenance, including cleaning, etc., to prevent cross-contamination of wafers. At present, it is usually cleaned manually directly when the equipment is not in operation.
但是,这种清洗方式效率并不高,因此,影响产能。However, the efficiency of this cleaning method is not high, therefore, the production capacity is affected.
发明内容Contents of the invention
鉴于上述问题,提出了本发明以便提供一种克服上述问题或者至少部分地解决上述问题的一种晶圆叉清洗方法及装置。In view of the above problems, the present invention is proposed to provide a wafer fork cleaning method and device that overcome the above problems or at least partially solve the above problems.
第一方面,本发明实施例提供了一种晶圆叉清洗装置,包括:In the first aspect, an embodiment of the present invention provides a wafer fork cleaning device, including:
清洗室、设置于清洗室内的喷洒装置和刷子、设置于所述清洗室出入口的气刀;a cleaning room, a spraying device and a brush arranged in the cleaning room, and an air knife arranged at the entrance and exit of the cleaning room;
所述喷洒装置,用于喷淋清洗液;The spraying device is used for spraying cleaning liquid;
所述刷子,用于对待清洗的晶圆叉进行洗刷,以实现边喷淋清洗液边洗刷;The brush is used to scrub the wafer fork to be cleaned, so as to realize scrubbing while spraying the cleaning liquid;
所述气刀,用于对所述待清洗的晶圆叉进行吹扫,以及对清洗后的晶圆叉 干燥。The air knife is used for purging the wafer fork to be cleaned and drying the cleaned wafer fork.
进一步地,在所述喷洒装置集成于所述刷子上时,还包括:Further, when the spraying device is integrated on the brush, it also includes:
第一轨道,设置在所述清洗室顶端,用于承载所述刷子;The first track is arranged on the top of the cleaning chamber and is used to carry the brushes;
第一驱动装置,连接所述刷子,用于驱动所述刷子沿着所述第一轨道移动,以实现边喷淋清洗液边洗刷。The first driving device is connected to the brush and is used to drive the brush to move along the first track, so as to realize washing while spraying cleaning liquid.
进一步地,所述刷子包括:刷头和第一支撑杆;Further, the brush includes: a brush head and a first support rod;
所述第一支撑杆一端设置所述刷头,另一端设置于所述第一轨道上;One end of the first support rod is provided with the brush head, and the other end is provided on the first track;
所述刷头上设置有刷毛,且在刷毛的间隙设置有喷淋清洗液的喷淋孔。The brush head is provided with bristles, and the gaps between the bristles are provided with spray holes for spraying cleaning liquid.
进一步地,在所述喷洒装置与所述刷子并排设置时,还包括:Further, when the spraying device and the brush are arranged side by side, it also includes:
第二支撑杆;second support rod;
第二轨道,设置在所述清洗室顶端,用于承载所述第二支撑杆;a second track, arranged at the top of the cleaning chamber, for carrying the second support rod;
所述第二支撑杆的一端设置于所述第二轨道,另一端连接横板,所述横板一端设置所述刷子,另一端设置所述喷洒装置;One end of the second support rod is arranged on the second track, and the other end is connected to the horizontal plate, the brush is arranged at one end of the horizontal plate, and the spraying device is arranged at the other end;
第二驱动装置,连接所述第二支撑杆,用于驱动所述第二支撑杆沿着所述第二轨道移动,以使所述喷洒装置和所述刷子均沿着所述第二轨道移动,以实现边喷淋清洗液边洗刷。A second driving device, connected to the second support rod, is used to drive the second support rod to move along the second track, so that both the spraying device and the brush move along the second track , to achieve scrubbing while spraying cleaning fluid.
进一步地,在所述清洗室的上部、下部以及侧边均固定设置有所述喷洒装置;Further, the spraying device is fixedly installed on the upper part, the lower part and the side of the cleaning chamber;
还包括:Also includes:
第三轨道,设置在所述清洗室顶端,用于承载所述刷子;The third track is arranged on the top of the cleaning chamber and is used to carry the brushes;
第三驱动装置,连接所述刷子,用于驱动所述刷子沿着所述第三轨道移动,以在所述喷洒装置喷淋清洗液的区域进行洗刷。The third driving device is connected to the brush and is used to drive the brush to move along the third track, so as to perform scrubbing in the area where the cleaning liquid is sprayed by the spraying device.
进一步地,还包括:Further, it also includes:
第四驱动装置,所述第四驱动装置连接所述刷子,用于驱动所述刷子旋转,以实现旋转洗刷。A fourth driving device, the fourth driving device is connected to the brush, and is used to drive the brush to rotate, so as to realize rotary scrubbing.
进一步地,还包括:Further, it also includes:
第五驱动装置,所述第五驱动装置连接所述第二支撑杆,用于驱动所述第二支撑杆旋转,以使所述横板上的刷子和喷洒装置在旋转过程中实现边喷洒清洗液边洗刷。A fifth driving device, the fifth driving device is connected to the second support rod, and is used to drive the rotation of the second support rod, so that the brushes and the spraying device on the horizontal plate can realize side-spray cleaning during the rotation process Scrub the liquid side.
第二方面,本发明还提供了一种晶圆叉清洗方法,包括:In a second aspect, the present invention also provides a wafer fork cleaning method, comprising:
控制将晶圆叉插入清洗室,并控制气刀对待清洗的晶圆叉进行吹扫;Control the insertion of the wafer fork into the cleaning chamber, and control the air knife to purge the wafer fork to be cleaned;
控制开启喷洒装置进行喷淋清洗液,并控制刷子对所述待清洗的晶圆叉进行过洗刷,以实现边喷淋清洗液边洗刷;Controlling the opening of the spraying device to spray the cleaning solution, and controlling the brush to scrub the wafer fork to be cleaned, so as to realize cleaning while spraying the cleaning solution;
控制将所述晶圆叉移出所述清洗室,并控制气刀对清洗后的晶圆叉进行干燥。Controlling the wafer fork to move out of the cleaning chamber, and controlling the air knife to dry the cleaned wafer fork.
进一步地,所述在控制气刀对所述晶圆叉进行吹扫之后,还包括:Further, after controlling the air knife to purge the wafer fork, it also includes:
控制关闭所述气刀;controlling the closing of said air knife;
所述在控制气刀对所述晶圆叉进行干燥之后,还包括:After controlling the air knife to dry the wafer fork, it also includes:
控制关闭所述气刀。Control shuts off the air knife.
进一步地,所述控制开启喷洒装置进行喷淋清洗液,并控制刷子对所述待清洗的晶圆叉进行洗刷,包括:Further, the control turns on the spraying device to spray the cleaning liquid, and controls the brush to scrub the wafer fork to be cleaned, including:
控制开启喷洒装置;Controlling the opening of spraying devices;
控制所述喷洒装置移动或者调整所述喷洒装置的喷洒朝向,使得所述喷洒装置喷淋的清洗液将所述待清洗的晶圆叉全部覆盖;Controlling the movement of the spraying device or adjusting the spraying direction of the spraying device, so that the cleaning liquid sprayed by the spraying device covers all the wafer forks to be cleaned;
控制刷子在喷淋清洗液的区域对所述待清洗的晶圆叉进行旋转洗刷。The brushes are controlled to rotate and scrub the wafer fork to be cleaned in the area where the cleaning solution is sprayed.
本发明实施例中的一个或多个技术方案,至少具有如下技术效果或优点:One or more technical solutions in the embodiments of the present invention have at least the following technical effects or advantages:
本发明提供了一种晶圆叉清洗装置,包括清洗室,设置于清洗室内的喷洒装置和刷子、设置于清洗室出入口的气刀,该喷洒装置,用于喷淋清洗液,刷子,用于对伸入清洗室内的晶圆叉进行洗刷,以实现边喷淋清洗液边洗刷,气刀,用于对待清洗的晶圆叉进行吹扫,以及对清洗后的晶圆叉进行干燥,进而实现对晶圆叉进行有效、自动地清洗,进而避免晶圆的交叉污染,也提高了产能。The invention provides a wafer fork cleaning device, comprising a cleaning room, a spraying device and a brush arranged in the cleaning room, an air knife arranged at the entrance and exit of the cleaning room, the spraying device is used for spraying cleaning liquid, and the brush is used for Scrub the wafer fork extending into the cleaning chamber to achieve cleaning while spraying the cleaning liquid, and the air knife is used to purge the wafer fork to be cleaned and dry the cleaned wafer fork to realize Effective and automatic cleaning of the wafer forks avoids cross-contamination of wafers and increases throughput.
附图说明Description of drawings
通过阅读下文优选实施方式的详细描述,各种其他的优点和益处对于本领域普通技术人员将变得清楚明了。附图仅用于示出优选实施方式的目的,而并不认为是对本发明的限制。而且在整个附图中,用相同的参考图形表示相同的部件。在附图中:Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiment. The drawings are only for the purpose of illustrating a preferred embodiment and are not to be considered as limiting the invention. Also throughout the drawings, the same components are represented by the same reference figures. In the attached picture:
图1a、图1b、图1c示出了晶圆叉的结构示意图;Fig. 1a, Fig. 1b, Fig. 1c show the structural diagram of wafer fork;
图2示出了本发明实施例一中晶圆叉清洗装置的结构示意图;2 shows a schematic structural view of a wafer fork cleaning device in Embodiment 1 of the present invention;
图3示出了本发明实施例一中刷子与喷洒装置集成设置的结构示意图;Figure 3 shows a schematic structural view of the integrated arrangement of brushes and spraying devices in Embodiment 1 of the present invention;
图4示出了本发明实施例一中刷子与喷洒装置并排设置的结构示意图;Figure 4 shows a schematic structural view of brushes and spraying devices arranged side by side in Embodiment 1 of the present invention;
图5示出了本发明实施例一中刷子与喷洒装置单独设置的结构示意图;Fig. 5 shows a schematic structural view of brushes and spraying devices separately provided in Embodiment 1 of the present invention;
图6示出了本发明实施例二中晶圆叉清洗方法的步骤流程示意图。FIG. 6 shows a schematic flowchart of the steps of the wafer fork cleaning method in Embodiment 2 of the present invention.
具体实施方式Detailed ways
下面将参照附图更详细地描述本公开的示例性实施例。虽然附图中显示了本公开的示例性实施例,然而应当理解,可以以各种形式实现本公开而不应被这里阐述的实施例所限制。相反,提供这些实施例是为了能够更透彻地理解本公开,并且能够将本公开的范围完整的传达给本领域的技术人员。Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided for more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.
实施例一Embodiment one
本发明实施例一提供了一种晶圆叉清洗装置,应用于周期性的设备维护中,对晶圆叉进行清洗。Embodiment 1 of the present invention provides a wafer fork cleaning device, which is used in periodic equipment maintenance to clean the wafer fork.
该晶圆叉清洗装置,如图2所示,包括:清洗室101、设置于清洗室101内的喷洒装置102和刷子103、设置于清洗室101出入口的气刀106,该喷洒装置102用于喷淋清洗液;该刷子103,用于对伸入该清洗室101内的晶圆叉进行洗刷,以实现边喷淋清洗液边洗刷;气刀106,用于对待清洗的晶圆叉进行吹扫,以及对清洗后的晶圆叉进行干燥。The wafer fork cleaning device, as shown in Figure 2, comprises: a cleaning
该喷洒装置102不仅能够喷淋清洗液,而且,在喷淋清洗液的同时,不利用刷子103,仅利用冲力,也可将晶圆叉上的杂质冲掉。The
在借助刷子103的洗刷时,能够将清洗液无法冲刷的地方进行洗刷。When washing with the
其中,该喷洒装置102和刷子103可集成在一起,也可以单独设置。Wherein, the
下面就喷洒装置102和刷子103集成在一起的结构和单独设置的结构进行详细描述。The structure of the
如图3所示,在喷洒装置102集成于刷子103上时,该晶圆叉清洗装置,还包括:As shown in Figure 3, when the
第一轨道1041,设置在清洗室101顶端,用于承载刷子103;第一驱动装置1051,连接刷子103,用于驱动刷子沿着第一轨道1041移动,以实现边喷淋清洗液边洗刷。The
在具体的实施方式中,该刷子103包括刷头1031和第一支撑杆1032,该第一支撑杆1032一端设置刷头1031,另一端设置于第一轨道1041上,该刷头1031不仅设置刷毛10311,而且,在刷毛10311的间隙设置喷淋清洗液的喷洒孔1021,进而能够在第一驱动装置1051驱动刷子103沿着第一轨道1041移动时,实现边喷淋清洗液边洗刷。In a specific embodiment, the
在一种可选的实施方式中,该晶圆叉清洗装置还包括:第四驱动装置1054,该第四驱动装置1054连接该刷子103,用于驱动该刷子103旋转,以实现旋转洗刷,采用旋转洗刷的方式,洗刷更加干净,且效率更高。In an optional embodiment, the wafer fork cleaning device further includes: a
如图4所示,该喷洒装置102与刷子103并排设置,该晶圆叉清洗装置,还包括:第二支撑杆;第二轨道1042,设置在清洗室101顶端,用于承载第二支撑杆;第二支撑杆的一端设置于第二轨道1042,另一端连接横板,横板一端设置刷子103,另一端设置喷洒装置102。As shown in Figure 4, the
还包括:第二驱动装置1052,连接第二支撑杆,用于驱动第二支撑杆沿着第二轨道1041移动,以使喷洒装置102和刷子103均沿着第二轨道1041移动,以实现边喷淋清洗液边洗刷。Also includes: a
该晶圆叉清洗装置还包括,第五驱动装置1055,该第五驱动装置1055连接第二支撑杆,用于驱动该第二支撑杆旋转,即围绕该第二支撑杆的轴心旋转,这样,横板也会随着旋转,横板上的刷子103和喷洒装置102也随之旋转,且在旋转过程中,实现边喷淋清洗液边洗刷的目标,且在旋转的过程中,洗刷地更干净。The wafer fork cleaning device also includes a
如图5所示,在清洗室101的上部、下部以及侧边均固定设置有该喷洒装置102,该晶圆叉清洗装置还包括:第三轨道1043,设置在清洗室顶端,用于承载刷子103;第三驱动装置1053,连接刷子103,用于驱动刷子沿着第三轨道1043移动,以在喷洒装置102喷淋清洗液的区域进行洗刷。As shown in Figure 5, the
具体地,该喷洒装置102虽然是固定设置的,但是,设置在上部、下部以及侧边的喷洒装置102均可以实现不同区域的喷淋任务。Specifically, although the
该喷洒装置102还可以实现喷头的转动,以实现不同区域的喷淋任务。The
该刷子103设置于第三轨道1043上,可以沿着第三轨道1043移动,在喷洒装置102喷淋清洗液的区域,该刷子103则移动至该区域进行洗刷,以实现边喷淋清洗液边洗刷的目的。The
在一种可选的实施方式中,该刷子103连接该第四驱动装置1054,该第四驱动装置1054用于驱动刷子103旋转,以实现旋转洗刷,采用旋转洗刷的方式,进而洗刷的更干净,且效率更高。In an optional embodiment, the
在一种可选的实施方式中,在气刀106在晶圆叉进入清洗室101时,进行吹扫,可以将待清洗的晶圆叉表面较大的杂质吹扫掉;在气刀106在晶圆叉离开清洗室101时,进行干燥,将清洗后的晶圆叉表面的水渍吹干。In an optional embodiment, the
上述的清洗液具体可以是去离子水、氨水等。The above-mentioned cleaning solution may specifically be deionized water, ammonia water, or the like.
第一轨道1041、第二轨道1042、第三轨道1043均包括横向移动的轨道,以及纵向移动的轨道,便于刷子103在通过轨道到达晶圆叉的各个部位。The
该第一驱动装置1051、第二驱动装置1052、第三驱动装置1053、第四驱动装置1054、第五驱动装置1055均为电机驱动,其中,第一驱动装置1051、第二驱动装置1052、第三驱动装置1053可以实现刷子103和喷洒装置102的升降和移动,第四驱动装置1054、第五驱动装置1055用于驱动刷子的旋转等等。The
本发明实施例中的一个或多个技术方案,至少具有如下技术效果或优点:One or more technical solutions in the embodiments of the present invention have at least the following technical effects or advantages:
本发明提供了一种晶圆叉清洗装置,包括清洗室,设置于清洗室内的喷洒装置和刷子、设置于清洗室出入口的气刀,该喷洒装置,用于喷淋清洗液,刷子,用于对伸入清洗室内的晶圆叉进行洗刷,以实现边喷淋清洗液边洗刷,气刀,用于对待清洗的晶圆叉进行吹扫,以及对清洗后的晶圆叉进行干燥,进而实现对晶圆叉进行有效、自动地清洗,进而避免晶圆的交叉污染,也提高了产能。The invention provides a wafer fork cleaning device, comprising a cleaning room, a spraying device and a brush arranged in the cleaning room, an air knife arranged at the entrance and exit of the cleaning room, the spraying device is used for spraying cleaning liquid, and the brush is used for Scrub the wafer fork extending into the cleaning chamber to achieve cleaning while spraying the cleaning liquid, and the air knife is used to purge the wafer fork to be cleaned and dry the cleaned wafer fork to realize Effective and automatic cleaning of the wafer forks avoids cross-contamination of wafers and increases throughput.
实施例二Embodiment two
基于相同的发明构思,本发明还提供了一种晶圆叉清洗方法,如图6所示,包括:Based on the same inventive concept, the present invention also provides a wafer fork cleaning method, as shown in Figure 6, comprising:
S601,控制将晶圆叉插入清洗室,并控制气刀对待清洗的晶圆叉进行吹扫;S601, control inserting the wafer fork into the cleaning chamber, and control the air knife to purge the wafer fork to be cleaned;
S602,控制开启喷洒装置进行喷淋清洗液,并控制刷子对所述待清洗的晶圆叉进行洗刷,以实现边喷淋边洗刷;S602, control to turn on the spraying device to spray the cleaning solution, and control the brush to scrub the wafer forks to be cleaned, so as to realize scrubbing while spraying;
S603,控制将所述晶圆叉移出所述清洗室,并控制气刀对清洗后的晶圆叉进行干燥。S603, controlling to move the wafer fork out of the cleaning chamber, and controlling the air knife to dry the cleaned wafer fork.
具体地,该晶圆叉清洗方法主要是通过边喷淋清洗液边洗刷的方式进行洗刷,以使清洗的效率更高。Specifically, the wafer fork cleaning method mainly performs cleaning by spraying the cleaning liquid while cleaning, so as to make the cleaning efficiency higher.
在一种可选的实施方式中,所述在控制气刀对所述晶圆叉进行吹扫之后,还包括:In an optional embodiment, after controlling the air knife to purge the wafer fork, it further includes:
控制关闭所述气刀;controlling the closing of said air knife;
所述在控制气刀对所述晶圆叉进行洗刷之后,还包括:After controlling the air knife to scrub the wafer fork, it also includes:
控制关闭所述气刀。Control shuts off the air knife.
具体地,气刀仅在晶圆叉出入该清洗室的时候开启,在该晶圆叉被清洗的过程中,则控制该气刀处于关闭状态。Specifically, the air knife is only turned on when the wafer fork enters and exits the cleaning chamber, and the air knife is controlled to be in a closed state during the cleaning process of the wafer fork.
通过控制气刀在晶圆叉进入清洗室时,开启吹扫,能够将杂质先进行吹扫,然后,控制气刀在晶圆叉离开清洗时,开启干燥,对清洗后的晶圆叉进行干燥,进而吹清洗后遗留的水渍。By controlling the air knife to turn on the purge when the wafer fork enters the cleaning chamber, the impurities can be purged first, and then the air knife is controlled to turn on the drying when the wafer fork leaves the cleaning room to dry the cleaned wafer fork , and then blow off the water stains left after cleaning.
在一种可选的实施方式中,所述控制开启喷洒装置进行喷淋清洗液,并控制刷子对所述待清洗的晶圆叉进行洗刷,包括:In an optional embodiment, the control to turn on the spraying device to spray the cleaning liquid, and control the brush to scrub the wafer fork to be cleaned, includes:
控制开启喷洒装置;Controlling the opening of spraying devices;
控制所述喷洒装置移动或者调整所述喷洒装置的喷淋朝向,使得所述喷洒装置喷淋的清洗液将所述待清洗的晶圆叉全部覆盖;Controlling the movement of the spraying device or adjusting the spraying direction of the spraying device, so that the cleaning liquid sprayed by the spraying device covers all the wafer forks to be cleaned;
控制刷子在喷淋清洗液的区域对所述待清洗的晶圆叉进行旋转洗刷。The brushes are controlled to rotate and scrub the wafer fork to be cleaned in the area where the cleaning solution is sprayed.
通过控制将喷洒装置与刷子的动作,进而将喷洒装置与刷子有效配合,提高清洗效率。By controlling the action of the spraying device and the brush, the spraying device and the brush are effectively matched to improve the cleaning efficiency.
尽管已描述了本发明的优选实施例,但本领域内的技术人员一旦得知了基本创造性概念,则可对这些实施例作出另外的变更和修改。所以,所附权利要求意欲解释为包括优选实施例以及落入本发明范围的所有变更和修改。While preferred embodiments of the invention have been described, additional changes and modifications to these embodiments can be made by those skilled in the art once the basic inventive concept is appreciated. Therefore, it is intended that the appended claims be construed to cover the preferred embodiment as well as all changes and modifications which fall within the scope of the invention.
显然,本领域的技术人员可以对本发明进行各种改动和变型而不脱离本发明的精神和范围。这样,倘若本发明的这些修改和变型属于本发明权利要求及其等同技术的范围之内,则本发明也意图包含这些改动和变型在内。Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalent technologies, the present invention also intends to include these modifications and variations.
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