CN114050104A - 氮化铝单晶衬底的加工方法及紫外发光器件的制备方法 - Google Patents
氮化铝单晶衬底的加工方法及紫外发光器件的制备方法 Download PDFInfo
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- CN114050104A CN114050104A CN202111338950.1A CN202111338950A CN114050104A CN 114050104 A CN114050104 A CN 114050104A CN 202111338950 A CN202111338950 A CN 202111338950A CN 114050104 A CN114050104 A CN 114050104A
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- aluminum nitride
- single crystal
- crystal substrate
- aluminum
- nitride single
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- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 title claims abstract description 165
- 239000000758 substrate Substances 0.000 title claims abstract description 162
- 239000013078 crystal Substances 0.000 title claims abstract description 115
- 238000003672 processing method Methods 0.000 title claims abstract description 12
- 238000002360 preparation method Methods 0.000 title abstract description 14
- 229920001400 block copolymer Polymers 0.000 claims abstract description 75
- 239000002105 nanoparticle Substances 0.000 claims abstract description 65
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 55
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 54
- 238000000137 annealing Methods 0.000 claims abstract description 46
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract description 21
- 238000001338 self-assembly Methods 0.000 claims abstract description 15
- 229910052757 nitrogen Inorganic materials 0.000 claims abstract description 10
- 238000000034 method Methods 0.000 claims description 58
- 239000000243 solution Substances 0.000 claims description 58
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 claims description 43
- 229910002704 AlGaN Inorganic materials 0.000 claims description 39
- 239000010408 film Substances 0.000 claims description 34
- JLTRXTDYQLMHGR-UHFFFAOYSA-N trimethylaluminium Chemical compound C[Al](C)C JLTRXTDYQLMHGR-UHFFFAOYSA-N 0.000 claims description 31
- 230000008569 process Effects 0.000 claims description 28
- 238000004528 spin coating Methods 0.000 claims description 25
- VSCWAEJMTAWNJL-UHFFFAOYSA-K aluminium trichloride Chemical compound Cl[Al](Cl)Cl VSCWAEJMTAWNJL-UHFFFAOYSA-K 0.000 claims description 18
- 239000002243 precursor Substances 0.000 claims description 18
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 claims description 16
- 238000002791 soaking Methods 0.000 claims description 11
- 229910052594 sapphire Inorganic materials 0.000 claims description 10
- 239000010980 sapphire Substances 0.000 claims description 10
- 229910052751 metal Inorganic materials 0.000 claims description 9
- 239000002184 metal Substances 0.000 claims description 9
- 229920003228 poly(4-vinyl pyridine) Polymers 0.000 claims description 9
- 239000012298 atmosphere Substances 0.000 claims description 8
- 239000011248 coating agent Substances 0.000 claims description 8
- 238000000576 coating method Methods 0.000 claims description 8
- 239000010409 thin film Substances 0.000 claims description 8
- 238000001994 activation Methods 0.000 claims description 7
- 230000000903 blocking effect Effects 0.000 claims description 7
- 238000002347 injection Methods 0.000 claims description 7
- 239000007924 injection Substances 0.000 claims description 7
- 230000007704 transition Effects 0.000 claims description 7
- 238000001816 cooling Methods 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 6
- 229910052582 BN Inorganic materials 0.000 claims description 5
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 claims description 5
- 229910003460 diamond Inorganic materials 0.000 claims description 5
- 239000010432 diamond Substances 0.000 claims description 5
- 238000004519 manufacturing process Methods 0.000 claims description 5
- 229920003229 poly(methyl methacrylate) Polymers 0.000 claims description 5
- 239000004926 polymethyl methacrylate Substances 0.000 claims description 5
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims description 5
- 229910010271 silicon carbide Inorganic materials 0.000 claims description 5
- 239000003960 organic solvent Substances 0.000 claims description 4
- 238000000407 epitaxy Methods 0.000 claims description 2
- 239000007789 gas Substances 0.000 claims description 2
- IXCSERBJSXMMFS-UHFFFAOYSA-N hydrogen chloride Substances Cl.Cl IXCSERBJSXMMFS-UHFFFAOYSA-N 0.000 claims description 2
- 229910000041 hydrogen chloride Inorganic materials 0.000 claims description 2
- 239000011259 mixed solution Substances 0.000 claims description 2
- 230000001681 protective effect Effects 0.000 claims description 2
- 238000007654 immersion Methods 0.000 claims 1
- 230000033228 biological regulation Effects 0.000 abstract description 4
- 239000004065 semiconductor Substances 0.000 abstract description 4
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Natural products CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 17
- 229910021529 ammonia Inorganic materials 0.000 description 12
- 239000000126 substance Substances 0.000 description 11
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 7
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 6
- 230000004888 barrier function Effects 0.000 description 6
- 238000004140 cleaning Methods 0.000 description 6
- 239000008367 deionised water Substances 0.000 description 6
- 229910021641 deionized water Inorganic materials 0.000 description 6
- 239000012299 nitrogen atmosphere Substances 0.000 description 6
- 230000007246 mechanism Effects 0.000 description 5
- XCZXGTMEAKBVPV-UHFFFAOYSA-N trimethylgallium Chemical compound C[Ga](C)C XCZXGTMEAKBVPV-UHFFFAOYSA-N 0.000 description 5
- 239000012808 vapor phase Substances 0.000 description 5
- 238000005406 washing Methods 0.000 description 5
- 229920002125 Sokalan® Polymers 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 4
- 238000011160 research Methods 0.000 description 4
- 238000002156 mixing Methods 0.000 description 3
- 150000004767 nitrides Chemical class 0.000 description 3
- 230000010287 polarization Effects 0.000 description 3
- 230000005701 quantum confined stark effect Effects 0.000 description 3
- 230000007480 spreading Effects 0.000 description 3
- 238000003892 spreading Methods 0.000 description 3
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 3
- 238000000927 vapour-phase epitaxy Methods 0.000 description 3
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000001276 controlling effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 244000005700 microbiome Species 0.000 description 2
- 229920000075 poly(4-vinylpyridine) Polymers 0.000 description 2
- 238000000746 purification Methods 0.000 description 2
- 230000001105 regulatory effect Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000004659 sterilization and disinfection Methods 0.000 description 2
- 239000003153 chemical reaction reagent Substances 0.000 description 1
- 229920001577 copolymer Polymers 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 238000001548 drop coating Methods 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009776 industrial production Methods 0.000 description 1
- 238000001451 molecular beam epitaxy Methods 0.000 description 1
- 239000005416 organic matter Substances 0.000 description 1
- 239000004584 polyacrylic acid Substances 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000026267 regulation of growth Effects 0.000 description 1
- 230000001954 sterilising effect Effects 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 125000003944 tolyl group Chemical group 0.000 description 1
- 230000005428 wave function Effects 0.000 description 1
Images
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02387—Group 13/15 materials
- H01L21/02389—Nitrides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02538—Group 13/15 materials
- H01L21/0254—Nitrides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02614—Transformation of metal, e.g. oxidation, nitridation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02664—Aftertreatments
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02656—Special treatments
- H01L21/02664—Aftertreatments
- H01L21/02694—Controlling the interface between substrate and epitaxial layer, e.g. by ion implantation followed by annealing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
- H01L33/0075—Processes for devices with an active region comprising only III-V compounds comprising nitride compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table
- H01L33/32—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table containing nitrogen
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Led Devices (AREA)
Abstract
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CN202111338950.1A CN114050104B (zh) | 2021-11-12 | 2021-11-12 | 氮化铝单晶衬底的加工方法及紫外发光器件的制备方法 |
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CN202111338950.1A CN114050104B (zh) | 2021-11-12 | 2021-11-12 | 氮化铝单晶衬底的加工方法及紫外发光器件的制备方法 |
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Publication number | Priority date | Publication date | Assignee | Title |
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CN114717660A (zh) * | 2022-04-06 | 2022-07-08 | 松山湖材料实验室 | 氮化铝单晶复合衬底及其制法、应用、应力和/或极化控制方法 |
Citations (10)
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US6218207B1 (en) * | 1998-05-29 | 2001-04-17 | Mitsushita Electronics Corporation | Method for growing nitride semiconductor crystals, nitride semiconductor device, and method for fabricating the same |
WO2002017369A1 (en) * | 2000-08-18 | 2002-02-28 | Showa Denko K.K. | Method of fabricating group-iii nitride semiconductor crystal, metho of fabricating gallium nitride-based compound semiconductor, gallium nitride-based compound semiconductor, gallium nitride-based compound semiconductor light-emitting device, and light source using the semiconductor light-emitting device |
CN101283456A (zh) * | 2005-09-29 | 2008-10-08 | 住友化学株式会社 | Ⅲ-ⅴ族氮化物半导体的制造方法和发光器件的制造方法 |
WO2012144728A2 (ko) * | 2011-04-19 | 2012-10-26 | 한국과학기술원 | 크기 조절이 가능한 나노입자 어레이 제조방법, 이에 의하여 제조된 나노입자 어레이와 그 응용 |
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CN106317415A (zh) * | 2015-06-23 | 2017-01-11 | 中国科学院化学研究所 | 基于嵌段共聚物的Janus纳米颗粒及其制备方法 |
CN108257853A (zh) * | 2018-01-17 | 2018-07-06 | 马鞍山杰生半导体有限公司 | 具有氮化铝膜的紫外led的外延结构及其生长方法 |
CN109659409A (zh) * | 2018-12-05 | 2019-04-19 | 湖北深紫科技有限公司 | 一种led外延结构及其制备方法 |
CN111029443A (zh) * | 2019-12-06 | 2020-04-17 | 松山湖材料实验室 | 利用金属纳米颗粒增强氮化物基led发光效率的方法 |
CN111188090A (zh) * | 2019-10-16 | 2020-05-22 | 中国电子科技集团公司第五十五研究所 | 一种高质量氮化铝薄膜的同质外延生长方法 |
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2021
- 2021-11-12 CN CN202111338950.1A patent/CN114050104B/zh active Active
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WO2002017369A1 (en) * | 2000-08-18 | 2002-02-28 | Showa Denko K.K. | Method of fabricating group-iii nitride semiconductor crystal, metho of fabricating gallium nitride-based compound semiconductor, gallium nitride-based compound semiconductor, gallium nitride-based compound semiconductor light-emitting device, and light source using the semiconductor light-emitting device |
CN101283456A (zh) * | 2005-09-29 | 2008-10-08 | 住友化学株式会社 | Ⅲ-ⅴ族氮化物半导体的制造方法和发光器件的制造方法 |
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CN109659409A (zh) * | 2018-12-05 | 2019-04-19 | 湖北深紫科技有限公司 | 一种led外延结构及其制备方法 |
CN111188090A (zh) * | 2019-10-16 | 2020-05-22 | 中国电子科技集团公司第五十五研究所 | 一种高质量氮化铝薄膜的同质外延生长方法 |
CN111029443A (zh) * | 2019-12-06 | 2020-04-17 | 松山湖材料实验室 | 利用金属纳米颗粒增强氮化物基led发光效率的方法 |
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Cited By (1)
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---|---|---|---|---|
CN114717660A (zh) * | 2022-04-06 | 2022-07-08 | 松山湖材料实验室 | 氮化铝单晶复合衬底及其制法、应用、应力和/或极化控制方法 |
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