CN113985243A - High-precision operational amplifier test system calibration method and device - Google Patents

High-precision operational amplifier test system calibration method and device Download PDF

Info

Publication number
CN113985243A
CN113985243A CN202111038154.6A CN202111038154A CN113985243A CN 113985243 A CN113985243 A CN 113985243A CN 202111038154 A CN202111038154 A CN 202111038154A CN 113985243 A CN113985243 A CN 113985243A
Authority
CN
China
Prior art keywords
operational amplifier
test system
calibration
standard
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN202111038154.6A
Other languages
Chinese (zh)
Other versions
CN113985243B (en
Inventor
丁超
顾翼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
709th Research Institute of CSIC
Original Assignee
709th Research Institute of CSIC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 709th Research Institute of CSIC filed Critical 709th Research Institute of CSIC
Priority to CN202111038154.6A priority Critical patent/CN113985243B/en
Publication of CN113985243A publication Critical patent/CN113985243A/en
Application granted granted Critical
Publication of CN113985243B publication Critical patent/CN113985243B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Amplifiers (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention discloses a calibration method and a device for a high-precision operational amplifier test system, which improve a universal calibration device for the operational amplifier test system by using an equivalent test model, enable the improved calibration recurrence device for the operational amplifier test system to replicate the key parameters of an operational amplifier, realize the quantity tracing of the operational amplifier test system, and calibrate the operational amplifier test system through the difference between the recurrence result and the measurement result, thereby ensuring the working condition that the calibration process is consistent with the actual test working process, enabling the calibration result to be more accurate, realizing the calibration of the high-precision operational amplifier test system and improving the accuracy of the measurement of the key parameters of an operational amplifier device.

Description

High-precision operational amplifier test system calibration method and device
Technical Field
The invention relates to the technical field of integrated circuit test system measurement, in particular to a high-precision operational amplifier test system calibration method and device.
Background
The operational amplifier is the most various and numerous devices in a linear integrated circuit, is widely applied to components of a sensor system, a control system, a communication system and the like of weaponry as a core component of an electronic circuit, and has the characteristics of high integration, low cost and high reliability.
In order to ensure the performance and stability of an operational amplifier in weapon equipment, the national defense military industry is equipped with a corresponding test system to test and screen the operational amplifier. The calibration of the operational amplifier is mainly carried out around main parameters of the operational amplifier, redundant parameters are eliminated on the premise that the operational performance can meet requirements, and the calibration efficiency is improved. These main parameters can be used as characteristic parameters representing the performance of the operational amplifier, and the performance of the test system directly determines the accuracy of the test results of these parameters. Calibration of the operational amplifier test system is therefore necessary.
The application coverage of the service operational amplifier test system in the national defense military industry field is very wide at present, the test system for testing the operational amplifier at present utilizes the operational amplifier test module of the system to complete the test of devices, and the peripheral auxiliary circuits and the test principles of different modules of a test system manufacturer are different, so the modules have no ready calibration standard reference. The mainstream way is to refer to the calibration specification of the corresponding radio meter according to the function thereof. However, the test system differs from a conventional meter in that it is not possible to remove the modules from the test system for individual calibration according to the respective specifications. Firstly, because the board cards belong to a part of the test system, other parts of the test system are required to be matched with the board cards to work normally; secondly, the influence of a connecting cable, a connector assembly, a test adapting circuit and the like between the test system and the object to be calibrated on the test signal is not considered, so that the calibration result is lack of integrity; thirdly, the current test system needs to transfer signals to a desk-top universal instrument for measurement through a calibration board and a cable, and the access mode can affect the performance of the operational amplifier test auxiliary circuit and increase the possibility of introducing calibration result errors; fourthly, the current calibration method is based on the internal module of the test system, calibration is not carried out aiming at the index parameters of the device and the test system, and a calibration method with microelectronic metering characteristics is not formed. It is therefore desirable to provide a calibration method and apparatus for an operational amplifier test system, which can improve the measurement accuracy of the operational amplifier to further improve the performance and stability of the operational amplifier in the weaponry.
Disclosure of Invention
The invention provides a calibration method and a calibration device for a high-precision operational amplifier test system, which are used for overcoming the technical defects.
In order to achieve the above technical object, the present invention provides a calibration method for a high-precision operational amplifier test system, which comprises the following steps:
constructing a test model of the characteristic parameters according to the test principle of the characteristic parameters of the operational amplifier;
combining the universal calibration device of the operational amplifier test system with the test model of the characteristic parameters to obtain a calibration reproduction device of the operational amplifier test system;
the method comprises the steps that an operational amplifier test system calibration recurrence device is connected into an operational amplifier test system, a recurrence result of characteristic parameters is determined according to input signals of the operational amplifier test system calibration recurrence device to the operational amplifier test system, and an output signal of the operational amplifier test system calibration recurrence device is tested according to the operational amplifier test system to obtain a measurement result of the characteristic parameters;
and comparing the recurrence result with the measurement result, and calibrating the operational amplifier test system according to the comparison result.
The invention also provides a high-precision operational amplifier test system calibration system, which comprises a main control module, a signal measurement module and a standard signal source, wherein the signal measurement module and the standard signal source are in communication connection with the main control module; wherein,
the main control module is used for calibrating the size of a signal input to the operational amplifier testing system according to the operational amplifier testing system and controlling a standard signal source to output a reproduction signal of a characteristic parameter based on a testing model according to the characteristic parameter;
the signal measurement module is used for measuring the signal size input to the operational amplifier test system calibration reproduction device by the operational amplifier test system and the signal size output by the operational amplifier test system calibration reproduction device;
and the standard signal source is used for outputting a reproduction signal of the characteristic parameter in the corresponding index range according to the instruction of the main control module.
Compared with the prior art, the calibration method and the calibration device for the high-precision operational amplifier test system improve the general calibration device for the operational amplifier test system by using the equivalent test model, so that the improved calibration and reproduction device for the operational amplifier test system can reproduce the key parameters of the operational amplifier, the magnitude tracing of the operational amplifier test system is realized, and the calibration method for the operational amplifier test system is realized by the difference between the reproduction result and the measurement result, so that the working condition that the calibration process is consistent with the actual test working process can be ensured, the calibration result is more accurate, and the calibration of the high-precision operational amplifier test system is realized.
The method has the advantages that the parameter measurement error of the operational amplifier test system is quantitatively calculated, so that the accuracy of important parameter measurement of the operational amplifier device is improved, the problem of magnitude traceability of typical parameters of a high-precision operational amplifier which is used in large quantities in the weapon equipment is solved, the magnitude of the parameters of the operational amplifier is ensured to be accurate and reliable, and the core technical index of the weapon equipment is improved.
Drawings
FIG. 1 is a block flow diagram illustrating a method for calibrating a high precision operational amplifier test system according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a test model of the common-mode rejection ratio of the operational amplifier according to the embodiment of the invention;
FIG. 3 is a schematic diagram of a test model of an offset voltage of an operational amplifier according to an embodiment of the invention;
FIG. 4 is a schematic diagram of a test model of the bias current of the operational amplifier according to the embodiment of the present invention;
FIG. 5 is a schematic diagram of a test model of the gain bandwidth of an operational amplifier according to an embodiment of the present invention;
FIG. 6 is a block diagram of a system calibration and replication apparatus for testing the common-mode rejection ratio of an operational amplifier according to an embodiment of the present invention;
FIG. 7 is a block diagram of a calibration reproduction apparatus of a test system for offset voltage of an operational amplifier according to an embodiment of the present invention;
FIG. 8 is a block diagram of a system calibration reproduction apparatus for testing the bias current of an operational amplifier according to an embodiment of the present invention;
FIG. 9 is a block diagram of a system calibration reproduction device for testing gain bandwidth of an operational amplifier according to an embodiment of the present invention;
fig. 10 is a block diagram of a calibration apparatus for a high-precision operational amplifier test system according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
Based on the above, an embodiment of the present invention provides a calibration method for a high-precision operational amplifier test system, as shown in fig. 1, which includes the following steps:
and S1, constructing a characteristic parameter test model according to the test principle of the characteristic parameters of the operational amplifier.
In the embodiment of the invention, the characteristic parameters of the operational amplifier are selected according to the performance and the use requirement of the operational amplifier, and the test model of the characteristic parameters is constructed according to the test principle of the selected characteristic parameters of the operational amplifier. The characteristic parameters of the operational amplifier comprise a common mode rejection ratio, an offset voltage, a bias current and a gain bandwidth, and a test model of the characteristic parameters is constructed according to a test principle of selecting the characteristic parameters of the operational amplifier. The specific test model is shown in fig. 2-5.
As shown in fig. 2, the test model of the common mode rejection ratio of the operational amplifier is based on the structure of the operational amplifier, and has two input ends and one output end; wherein the two input ends are connected with the voltage measuring module, and the output end is connected with the voltage setting module.
As shown in fig. 3, the test model of the offset voltage of the operational amplifier is consistent with the test model of the common mode rejection ratio of the operational amplifier.
As shown in fig. 4, the test model of the bias current of the operational amplifier is based on the structure of the operational amplifier, and has two input ends and one output end; the two input ends are connected with the current measuring module, and the output end is connected with the voltage setting module.
As shown in fig. 5, the test model of the gain bandwidth of the operational amplifier is based on the structure of the operational amplifier, and has two input ends and one output end; wherein the two input ends are connected with an alternating current signal source, and the output end is connected with an alternating current voltage measuring module.
And S2, combining the universal calibration device of the operational amplifier test system with the test model of the characteristic parameters to obtain the calibration reproduction device of the operational amplifier test system.
The calibration universal device of the operational amplifier test system is combined with the test model of each characteristic parameter respectively to obtain the calibration recurrence device of the operational amplifier test system of each characteristic parameter.
Specifically, the operational amplifier test system calibration universal device is combined with the test model of the common mode rejection ratio to obtain the test system calibration recurrence device of the operational amplifier common mode rejection ratio, as shown in fig. 6, the test system calibration recurrence device of the operational amplifier common mode rejection ratio includes a main control module, a voltage measurement module, and a standard voltage source, and the voltage measurement module and the standard voltage source are both in communication connection with the main control module.
The main control module is used for calibrating the voltage input by the output end of the reproduction device to the operational amplifier test system according to the operational amplifier test system, and controlling the standard voltage source to output the reproduction voltage of the common mode rejection ratio based on the test model according to the common mode rejection ratio.
The voltage measurement module is used for measuring the voltage input by the operational amplifier test system to the operational amplifier test system calibration recurrence device and the voltage output by the operational amplifier test system calibration recurrence device.
And the standard voltage source is used for outputting the reproduction voltage of the common mode rejection ratio in the corresponding index range from the positive input end and the negative input end of the operational amplifier test system calibration reproduction device according to the instruction of the main control module.
The general calibration device for the operational amplifier test system is combined with the test model of the offset voltage to obtain the calibration and reproduction device for the test system of the offset voltage of the operational amplifier, as shown in fig. 7, the calibration and reproduction device for the test system of the offset voltage of the operational amplifier has the same structure as the calibration and reproduction device for the test system of the common mode rejection ratio of the operational amplifier.
The main control module is used for calibrating the voltage input by the output end of the recurrence device to the operational amplifier testing system according to the operational amplifier testing system, and controlling the standard voltage source to output the recurrence voltage of the offset voltage based on the testing model according to the offset voltage.
The voltage measurement module is used for measuring the voltage input by the operational amplifier test system to the operational amplifier test system calibration recurrence device and the voltage output by the operational amplifier test system calibration recurrence device.
And the standard voltage source is used for outputting the recurrence voltage of the offset voltage in the corresponding index range from the positive input end and the negative input end of the operational amplifier test system calibration recurrence device according to the instruction of the main control module.
The general calibration device for the operational amplifier test system is combined with the test model of the bias current to obtain the calibration and reproduction device for the test system of the bias current of the operational amplifier, as shown in fig. 8, the calibration and reproduction device for the test system of the bias current of the operational amplifier comprises a main control module, a voltage measurement module, a current measurement module and a standard current source, and the voltage measurement module, the current measurement module and the standard voltage source are all in communication connection with the main control module.
The main control module is used for calibrating the voltage input by the output end of the reproduction device to the operational amplifier test system according to the operational amplifier test system, and controlling the standard voltage source to output the reproduction current of the bias current based on the test model according to the bias current.
The voltage measuring module is used for measuring the voltage input by the test system calibration reproduction device of the bias current of the operational amplifier from the test system of the operational amplifier.
The current measuring module is used for measuring the current output by the calibration and reproduction device of the test system of the bias current of the operational amplifier.
And the standard voltage source is used for outputting the reproduction current of the bias current in the corresponding index range from the positive input end and the negative input end of the operational amplifier test system calibration reproduction device according to the instruction of the main control module.
The general calibration device for the operational amplifier test system is combined with the test model of the gain bandwidth to obtain the calibration and reproduction device for the test system of the gain bandwidth of the operational amplifier, as shown in fig. 9, the calibration and reproduction device for the test system of the gain bandwidth of the operational amplifier comprises a main control module, a voltage measurement module and a standard alternating current voltage source, and the voltage measurement module and the standard alternating current voltage source are both in communication connection with the main control module.
The main control module is used for calibrating the alternating-current voltage input to the positive input end and the negative input end of the reproduction device according to the operational amplifier test system, and controlling the standard voltage source to output the reproduction alternating-current voltage of the gain bandwidth based on the test model according to the gain bandwidth.
The voltage measuring module is used for measuring the alternating voltage input to the operational amplifier testing system calibration and reproduction device by the operational amplifier testing system and the alternating voltage output by the operational amplifier testing system calibration and reproduction device.
And the standard voltage source is used for outputting the reproduction alternating voltage of the gain bandwidth in the corresponding index range from the output end of the operational amplifier test system calibration reproduction device according to the instruction of the main control module.
The operational amplifier test system calibration and reproduction device of each characteristic parameter has a plurality of same functional modules, so that the characteristics of the operational amplifier test system calibration and reproduction device of all the characteristic parameters are integrated, and a comprehensive operational amplifier test system calibration and reproduction device can be manufactured.
S3, the operational amplifier test system calibration and reproduction device is connected into the operational amplifier test system, the reproduction result of the characteristic parameter is determined according to the input signal of the operational amplifier test system calibration and reproduction device, and the output signal of the operational amplifier test system calibration and reproduction device is tested according to the operational amplifier test system to obtain the measurement result of the characteristic parameter.
The operational amplifier test system calibration and reproduction device is embedded into the operational amplifier test system by adopting an integrated design, a test signal is input into the operational amplifier test system calibration and reproduction device by the operational amplifier test system, after a main control module in the operational amplifier test system calibration and reproduction device detects the input test signal, a corresponding signal measurement module is controlled to measure the input signal, a standard signal source is controlled to output a reproduction signal with a corresponding size of characteristic parameters according to a test model of the characteristic parameters to be calibrated, namely, a reproduction result, and the operational amplifier test system tests the operational amplifier test system calibration and reproduction device according to the reproduction signal output by the operational amplifier test system calibration and reproduction device to obtain a measurement result of the characteristic parameters.
And S4, comparing the reproduction result with the measurement result, and calibrating the operational amplifier test system according to the comparison result.
The invention relates to a calibration method of a high-precision operational amplifier test system, which improves a universal calibration device of the operational amplifier test system by using an equivalent test model, so that the improved calibration and reproduction device of the operational amplifier test system can reproduce key parameters of an operational amplifier, the magnitude tracing of the operational amplifier test system is realized, and the calibration of the operational amplifier test system is carried out through the difference between a reproduction result and a measurement result, thereby ensuring that the calibration process and the actual test working process keep consistent working conditions, ensuring that the calibration result is more accurate, and realizing the calibration of the high-precision operational amplifier test system.
The method has the advantages that the parameter measurement error of the operational amplifier test system is quantitatively calculated, so that the accuracy of important parameter measurement of the operational amplifier device is improved, the problem of magnitude traceability of typical parameters of a high-precision operational amplifier which is used in large quantities in the weapon equipment is solved, the magnitude of the parameters of the operational amplifier is ensured to be accurate and reliable, and the core technical index of the weapon equipment is improved.
Based on the test model principle of the characteristic parameters, the invention also provides a high-precision operational amplifier test system calibration device, which comprises a main control module, a signal measurement module and a standard signal source, wherein the signal measurement module and the standard signal source are in communication connection with the main control module; wherein,
the main control module is used for controlling a standard signal source to output a reproduction signal of the characteristic parameter according to the size of a signal input to the high-precision operational amplifier test system calibration device by the operational amplifier test system and based on the test model according to the characteristic parameter;
the signal measurement module is used for measuring the signal size input to the high-precision operational amplifier test system calibration device by the operational amplifier test system and the signal size output by the operational amplifier test system calibration reproduction device;
and the standard signal source is used for outputting a reproduction signal of the characteristic parameter in the corresponding index range according to the instruction of the main control module.
Therefore, the high-precision operational amplifier test system calibration device can directly obtain the reproduction result of the characteristic parameters according to the input signals.
The calibration device of the high-precision operational amplifier test system according to the embodiment of the present invention includes a main control module 10, a current measurement module 20, a voltage measurement module 30, a standard voltage source 40, a standard current source 50, and a standard ac voltage source 60, wherein the current measurement module 20, the voltage measurement module 30, the standard voltage source 40, the standard current source 50, and the standard ac voltage source 60 are all in communication connection with the main control module 10; wherein,
the main control module 10 is configured to control one of the standard signal sources, namely the standard voltage source 40, the standard current source 50 and the standard alternating current voltage source 60, to output a recurring signal of a characteristic parameter according to the magnitude of a signal input by the operational amplifier test system to the high-precision operational amplifier test system calibration device and based on a test model according to the characteristic parameter;
the current measuring module 20 is configured to measure a current magnitude input by the operational amplifier testing system to the high-precision operational amplifier testing system calibration apparatus, and a current magnitude output by the operational amplifier testing system calibration replication apparatus;
the voltage measuring module 30 is configured to measure a voltage input by the operational amplifier testing system to the high-precision operational amplifier testing system calibration apparatus, and a voltage output by the operational amplifier testing system calibration replication apparatus;
the standard voltage source 40 is configured to output a reproduction voltage of the characteristic parameter within the corresponding index range according to an instruction of the main control module 10;
the standard current source 50 is configured to output a recurring current of a characteristic parameter within a corresponding index range according to an instruction of the main control module 10;
the standard ac voltage source 60 is configured to output a recurring ac voltage of a characteristic parameter within a corresponding index range according to an instruction of the main control module 10.
Different module combinations are called through the main control module 10, so that numerical values of different characteristic parameters in an index range are reproduced, and information characteristics of the operational amplifier in the test process are simulated. And the range of the coverage parameter is realized by changing the range of the generated signal of the standard signal source.
Each module device in the high-precision operational amplifier test system calibration device adopts an integrated device, and the size of the integrated high-precision operational amplifier test system calibration device is consistent with that of an operational amplifier; and the input and output ports of the calibration device of the high-precision operational amplifier test system are consistent with the input and output ports of the operational amplifier, and specifically, the external interface of the calibration device of the high-precision operational amplifier test system is adapted to the test fixture of the operational amplifier test system, and the package design is carried out in a pin form.
Although the peripheral auxiliary circuits and the test principles of different operational amplifier test systems are different, the test bit size and the test interface of the operational amplifier are consistent with those of the operational amplifier, and the size and the interface of the high-precision operational amplifier test system calibration device are consistent with those of the operational amplifier, so that the high-precision operational amplifier test system calibration device can adapt to different operational amplifier test systems, has higher automation degree, universality and certain portability, and is convenient to be used in different field environments to realize calibration with different types of operational amplifier test systems.
It can be clearly understood by those skilled in the art that, for convenience and brevity of description, the specific working processes of the system, the apparatus and the module described above may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.

Claims (10)

1. A high-precision operational amplifier test system calibration method is characterized by comprising the following steps:
constructing a test model of the characteristic parameters according to the test principle of the characteristic parameters of the operational amplifier;
combining the universal calibration device of the operational amplifier test system with the test model of the characteristic parameters to obtain a calibration reproduction device of the operational amplifier test system;
the method comprises the steps that an operational amplifier test system calibration recurrence device is connected into an operational amplifier test system, a recurrence result of characteristic parameters is determined according to input signals of the operational amplifier test system calibration recurrence device to the operational amplifier test system, and an output signal of the operational amplifier test system calibration recurrence device is tested according to the operational amplifier test system to obtain a measurement result of the characteristic parameters;
and comparing the recurrence result with the measurement result, and calibrating the operational amplifier test system according to the comparison result.
2. The method of claim 1, wherein the characteristic parameters of the operational amplifier include common mode rejection ratio, offset voltage, bias current, and gain bandwidth.
3. The method according to claim 2, wherein the general calibration device for the operational amplifier test system is combined with the test model of the common-mode rejection ratio to obtain the test system calibration reproduction device for the common-mode rejection ratio of the operational amplifier, the test system calibration reproduction device for the common-mode rejection ratio of the operational amplifier comprises a main control module, a voltage measurement module, and a standard voltage source, and the voltage measurement module and the standard voltage source are both in communication connection with the main control module.
4. The method according to claim 3, wherein the general calibration device for the operational amplifier test system is combined with the test model of the offset voltage to obtain a test system calibration reproduction device of the offset voltage of the operational amplifier, and the test system calibration reproduction device of the offset voltage of the operational amplifier has a structure identical to that of the test system calibration reproduction device of the common mode rejection ratio of the operational amplifier.
5. The method for calibrating the high-precision operational amplifier test system according to claim 2, wherein the universal device for calibrating the operational amplifier test system is combined with the test model of the bias current to obtain the test system calibration reproduction device of the bias current of the operational amplifier, the test system calibration reproduction device of the bias current of the operational amplifier comprises a main control module, a voltage measurement module, a current measurement module and a standard current source, and the voltage measurement module, the current measurement module and the standard voltage source are all in communication connection with the main control module;
the voltage measuring module is used for measuring the voltage input by the test system calibration reproduction device of the bias current of the operational amplifier from the test system of the operational amplifier, and the current measuring module is used for measuring the current output by the test system calibration reproduction device of the bias current of the operational amplifier.
6. The method according to claim 2, wherein the general calibration device for the operational amplifier test system is combined with a test model of the gain bandwidth to obtain a test system calibration and reproduction device of the gain bandwidth of the operational amplifier, the test system calibration and reproduction device of the gain bandwidth of the operational amplifier comprises a main control module, a voltage measurement module and a standard alternating current voltage source, and the voltage measurement module and the standard alternating current voltage source are both in communication connection with the main control module.
7. A high-precision operational amplifier test system calibration device is characterized by comprising a main control module, a signal measurement module and a standard signal source, wherein the signal measurement module and the standard signal source are in communication connection with the main control module; wherein,
the main control module is used for calibrating the size of a signal input to the operational amplifier testing system according to the operational amplifier testing system and controlling a standard signal source to output a reproduction signal of a characteristic parameter based on a testing model according to the characteristic parameter;
the signal measurement module is used for measuring the signal size input to the operational amplifier test system calibration reproduction device by the operational amplifier test system and the signal size output by the operational amplifier test system calibration reproduction device;
and the standard signal source is used for outputting a reproduction signal of the characteristic parameter in the corresponding index range according to the instruction of the main control module.
8. The calibration device for the high-precision operational amplifier test system according to claim 7, comprising a main control module, a current measurement module, a voltage measurement module, a standard voltage source, a standard current source and a standard alternating current voltage source, wherein the current measurement module, the voltage measurement module, the standard voltage source, the standard current source and the standard alternating current voltage source are all in communication connection with the main control module; wherein,
the main control module is used for calibrating the magnitude of a signal input by the reproduction device to the operational amplifier testing system according to the operational amplifier testing system, and controlling one standard signal source of a standard voltage source, a standard current source and a standard alternating current voltage source to output a reproduction signal of a characteristic parameter based on a testing model according to the characteristic parameter;
the current measuring module is used for measuring the current input by the operational amplifier testing system to the operational amplifier testing system calibration recurrence device and the current output by the operational amplifier testing system calibration recurrence device;
the voltage measurement module is used for measuring the voltage input by the operational amplifier test system to the operational amplifier test system calibration recurrence device and the voltage output by the operational amplifier test system calibration recurrence device;
and the standard voltage source is used for outputting the reproduction voltage of the characteristic parameters in the corresponding index range according to the instruction of the main control module.
And the standard current source is used for outputting the reproduction current of the characteristic parameters in the corresponding index range according to the instruction of the main control module.
And the standard alternating current voltage source is used for outputting the recurrent alternating current voltage of the characteristic parameters in the corresponding index range according to the instruction of the main control module.
9. A high precision calibration device for an operational amplifier test system as claimed in claim 7, wherein said calibration replication device for an operational amplifier test system is embedded in the operational amplifier test system by using an integrated design.
10. The calibration device for a high precision operational amplifier test system as claimed in claim 7, wherein the input and output ports of the calibration reproduction device for an operational amplifier test system are identical to the input and output ports of the operational amplifier.
CN202111038154.6A 2021-09-06 2021-09-06 Calibration method and device for high-precision operational amplifier test system Active CN113985243B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202111038154.6A CN113985243B (en) 2021-09-06 2021-09-06 Calibration method and device for high-precision operational amplifier test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202111038154.6A CN113985243B (en) 2021-09-06 2021-09-06 Calibration method and device for high-precision operational amplifier test system

Publications (2)

Publication Number Publication Date
CN113985243A true CN113985243A (en) 2022-01-28
CN113985243B CN113985243B (en) 2024-06-11

Family

ID=79735396

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202111038154.6A Active CN113985243B (en) 2021-09-06 2021-09-06 Calibration method and device for high-precision operational amplifier test system

Country Status (1)

Country Link
CN (1) CN113985243B (en)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6643597B1 (en) * 2001-08-24 2003-11-04 Agilent Technologies, Inc. Calibrating a test system using unknown standards
US7235982B1 (en) * 2006-03-31 2007-06-26 Agilent Technologies, Inc. Re-calculating S-parameter error terms after modification of a calibrated port
US8130032B1 (en) * 2010-09-29 2012-03-06 Texas Instruments Incorporated Systems and methods for high-sensitivity detection of input bias current
CN104390754A (en) * 2014-12-10 2015-03-04 四川航天计量测试研究所 Calibration device and calibration method of modal testing equipment
CN104991214A (en) * 2015-07-30 2015-10-21 中国船舶重工集团公司第七0九研究所 Digital integrated circuit direct current parameter standard reproducing method and standard apparatus
US20170146632A1 (en) * 2015-11-20 2017-05-25 Teradyne, Inc. Calibration device for automatic test equipment
CN109493700A (en) * 2018-12-06 2019-03-19 上海图菱新能源科技有限公司 Operational amplifier test macro for Remote Virtual Experiments
US10365345B1 (en) * 2015-12-02 2019-07-30 Anritsu Company Calibration device for use with measurement instruments
US10890642B1 (en) * 2019-07-31 2021-01-12 Keysight Technologies, Inc. Calibrating impedance measurement device
CN112526439A (en) * 2020-12-25 2021-03-19 贵州航天计量测试技术研究所 Standard voltage/charge converter calibration device

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6643597B1 (en) * 2001-08-24 2003-11-04 Agilent Technologies, Inc. Calibrating a test system using unknown standards
US7235982B1 (en) * 2006-03-31 2007-06-26 Agilent Technologies, Inc. Re-calculating S-parameter error terms after modification of a calibrated port
US8130032B1 (en) * 2010-09-29 2012-03-06 Texas Instruments Incorporated Systems and methods for high-sensitivity detection of input bias current
CN104390754A (en) * 2014-12-10 2015-03-04 四川航天计量测试研究所 Calibration device and calibration method of modal testing equipment
CN104991214A (en) * 2015-07-30 2015-10-21 中国船舶重工集团公司第七0九研究所 Digital integrated circuit direct current parameter standard reproducing method and standard apparatus
US20170146632A1 (en) * 2015-11-20 2017-05-25 Teradyne, Inc. Calibration device for automatic test equipment
US10365345B1 (en) * 2015-12-02 2019-07-30 Anritsu Company Calibration device for use with measurement instruments
CN109493700A (en) * 2018-12-06 2019-03-19 上海图菱新能源科技有限公司 Operational amplifier test macro for Remote Virtual Experiments
US10890642B1 (en) * 2019-07-31 2021-01-12 Keysight Technologies, Inc. Calibrating impedance measurement device
CN112526439A (en) * 2020-12-25 2021-03-19 贵州航天计量测试技术研究所 Standard voltage/charge converter calibration device

Non-Patent Citations (5)

* Cited by examiner, † Cited by third party
Title
CHAO DING 等: "STUDY OF RAMAN SPECTRUM CHARACTERISTIC FOR STOMACH CANCER", PMC OF THE 4TH ANNUAL IEEE CONF ON INFORMATION TECHNOLOGY APPLICATIONS IN BIOMEDICINE, UK, 31 December 2003 (2003-12-31), pages 250 - 253 *
丁超 等: "基于FPGA的核级转速变送器设计", 电工技术, no. 11, 30 November 2007 (2007-11-30), pages 14 - 16 *
丁超 等: "基于STM32的燃气轮机振动监测系统的设计", 传感技术学报, vol. 31, no. 04, 31 December 2018 (2018-12-31), pages 645 - 648 *
刘冲;于利红;陈连启;: "集成运放参数测试仪校准装置的开发", 今日电子, no. 03, 15 March 2008 (2008-03-15), pages 101 - 103 *
姚鼎;: "基于DL1000系统的运算放大器参数测试方法研究", 环境技术, no. 04, 25 August 2020 (2020-08-25), pages 138 - 142 *

Also Published As

Publication number Publication date
CN113985243B (en) 2024-06-11

Similar Documents

Publication Publication Date Title
CN104991214B (en) Digital integrated electronic circuit DC parameter standard reproducing method and standard set-up
CN105811982A (en) ADC chip reference voltage testing and calibration method
US20150055264A1 (en) Current-limiting circuit and apparatus
CN117555738B (en) DPS power supply board for memory FT test
CN110658439A (en) Test method and system for protection circuit
CN113985243B (en) Calibration method and device for high-precision operational amplifier test system
US6665627B2 (en) Method and apparatus for evaluating and correcting the tester derating factor (TDF) in a test environment
CN117471274A (en) WAT test system and WAT test device based on Kelvin connection
CN117544121A (en) Differential amplifier and trimming and calibrating method for instrument amplifier
CN116545393A (en) Precise output amplifying circuit, load detection circuit and device using circuit
CN115856750A (en) Device and method for quickly calibrating SOC (System on chip) test system
CN113126014B (en) Calibration system for realizing array parallelism of digital oscilloscope
CN116413533A (en) Automatic line loss calibration method applied to module test fixture
CN113514168B (en) Multi-channel temperature sensor testing device
CN110220606B (en) Temperature measuring device with calibration function and method
CN114296019A (en) Temperature compensation structure of direct current sensor
CN221124835U (en) High-precision electronic load calibration module
CN220043382U (en) Precise output amplifying circuit, load detection circuit and device using circuit
CN112858986B (en) Primary winding leakage current compensation circuit and verification device of current transformer
CN114280519B (en) Error measurement system and method of calibrating device and calibration method and system of testing system
CN115061074B (en) Calibration method and device of resistance measurement circuit and resistance measurement method
US7492181B1 (en) Method and device for enabling the measurement of device under test voltages using a testing instrument of limited range
CN217007654U (en) Calibration device for radio frequency chip type load
CN102506966B (en) Correcting device for flow system
CN219935963U (en) Voltage and current measurement channel of digital bridge and digital bridge

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant