CN217007654U

CN217007654U - Calibration device for radio frequency chip type load

Info

Publication number: CN217007654U
Application number: CN202220317446.7U
Authority: CN
Inventors: 杜攀; 杨佳鸣; 赵胡; 贾双
Original assignee: SICHUAN YONGXING ELECTRONICS CO LTD
Current assignee: SICHUAN YONGXING ELECTRONICS CO LTD
Priority date: 2022-02-17
Filing date: 2022-02-17
Publication date: 2022-07-19
Anticipated expiration: 2032-02-17

Abstract

The utility model discloses a calibration device of a radio frequency chip type load, which comprises a base and a plurality of calibration groups, wherein the calibration groups are arranged on the base in a column direction or a row direction; one or two SMA connectors are arranged in any calibration group; the base is provided with calibration circuits which are connected with one or two SMA connectors in a one-to-one corresponding manner; and the calibration circuit is spliced and matched with the radio frequency chip type load. Through the scheme, the radio frequency chip type load detection device has the advantages of simple structure, flexibility, reliability and the like, and has high practical value and popularization value in the technical field of radio frequency chip type load detection.

Description

Calibration device for radio frequency chip type load

Technical Field

The utility model relates to the technical field of radio frequency chip type load detection, in particular to a calibration device for a radio frequency chip type load.

Background

The radio frequency chip type load is used as a special product in a chip resistor and is mainly used in the fields of radars, communication, radio frequency modules and the like. With the development of scientific information technology, 5G communication technology is comprehensively spread, the miniaturization requirements in the fields of aerospace communication and the like are improved, and the requirements of radio frequency chip type loads are increased more and more.

The difference between the radio frequency chip type load and the conventional chip resistor is as follows: the bottom electrode is in an asymmetric structure, the radio frequency chip type load is a component with polarity, and the bottom electrode needs to correspond to the front polarity identification. The purpose of the radio frequency chip type load calibration is to eliminate the introduced error of a test fixture (shown in figure 1) on the test result in the process of testing S parameters, so that the test data is more accurate.

At present, the calibration of the radio frequency chip type load in the prior art is the traditional SOLT calibration, namely short circuit-open circuit-load-through calibration, the SOLT calibration is convenient to operate, the measurement accuracy has a great relationship with the precision of a standard part, and the SOLT calibration is generally only suitable for coaxial environment measurement. The calibration is a calibration mode with higher accuracy than SOLT calibration, and is particularly suitable for non-coaxial environment measurement, such as surface-mounted devices on a PCB, waveguides, clamps and on-chip wafer measurement.

Therefore, it is urgently needed to provide a calibration device which has a simple structure and can calibrate a reliable radio frequency chip type load.

SUMMERY OF THE UTILITY MODEL

In view of the above problems, an object of the present invention is to provide a calibration apparatus for a radio frequency chip load, which adopts the following technical solutions:

a calibration device for a radio frequency chip type load comprises a base, a plurality of calibration groups and a plurality of calibration modules, wherein the calibration groups are arranged on the base in a column direction or a row direction; any one calibration group is provided with one or two SMA connectors; the base is provided with calibration circuits which are correspondingly connected with one or two SMA connectors one by one; and the calibration circuit is spliced and matched with the radio frequency chip type load.

Further, a plurality of the calibration groups are arranged in a manner that the length in the column direction or the width in the row direction is increased or decreased in sequence.

Further, the calibration lines are sequentially arranged in an increasing or decreasing manner according to the length in the column direction or the width in the row direction.

Further, the first column or the first row of the calibration set is a first calibration set; the first calibration set is provided with one SMA connector.

Further, a second column or row of the calibration set is a second calibration set; the third column or row of the calibration set is a third calibration set; the second calibration group and the third calibration group are both provided with two SMA connectors; the two SMA connectors are connected with the end parts of the calibration lines in a one-to-one correspondence manner.

Preferably, a plurality of screws are arranged on the side edge of any one calibration group one by one.

Further, the base is in a step shape.

Compared with the prior art, the utility model has the following beneficial effects:

the utility model skillfully arranges a plurality of calibration groups which are arranged in an increasing or decreasing manner in turn according to the length of the radio frequency chip type load so as to be suitable for the installation and connection of the radio frequency chip type loads with different lengths; the utility model realizes the transmission of calibration data by arranging one or two SMA connectors; in conclusion, the utility model has the advantages of simple structure, flexibility, reliability and the like, and has very high practical value and popularization value in the technical field of radio frequency chip type load detection.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope of protection, and it is obvious for those skilled in the art that other related drawings can be obtained according to these drawings without inventive efforts.

FIG. 1 is a schematic structural diagram of a test fixture according to the present invention.

FIG. 2 is a schematic view of the present invention.

Fig. 3 is a perspective view of the present invention.

In the drawings, the names of the parts corresponding to the reference numerals are as follows:

1. a base; 2. a first calibration set; 3. a second calibration set; 4. a third calibration set; 5. calibrating a circuit; 6. and (4) a screw.

Detailed Description

To further clarify the objects, technical solutions and advantages of the present application, the present invention will be further described with reference to the accompanying drawings and examples, and embodiments of the present invention include, but are not limited to, the following examples. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

Examples

As shown in fig. 2 to 3, the present embodiment provides a calibration apparatus for a radio frequency chip load. First, the terms of the numbers such as "first" and "second" used in the present embodiment are used only for distinguishing the same kind of components, and the scope of protection should not be specifically limited. In the present embodiment, the terms of orientation such as "column" and "row" are explained based on the drawings.

Specifically, the calibration device of the present embodiment includes a stepped base 1, and a plurality of calibration sets disposed on the base in a column direction or a row direction; any one calibration group is provided with one or two SMA connectors; the base is provided with calibration circuits which are connected with one or two SMA connectors in a one-to-one corresponding manner; and the calibration circuit is spliced and matched with the radio frequency chip type load. The calibration groups and the calibration lines of the present embodiment are arranged in a sequential increasing or decreasing manner according to the length in the column direction or the width in the row direction. In this embodiment, a plurality of screws are disposed on the side of any one of the calibration sets.

In this embodiment, three calibration sets are taken as an example, wherein the first column or the first row of the calibration set is the first calibration set, and the first calibration set is provided with one SMA connector. A second column or row of calibration sets is a second calibration set; the third column or row of the calibration set is a third calibration set; the second calibration group and the third calibration group are both provided with two SMA connectors; the two SMA connectors are connected with the end parts of the calibration circuit in a one-to-one correspondence manner. Specifically, the SMA connectors of the first calibration set of the present embodiment are reflective ends; the two SMA connectors of the second calibration set are straight-through ends; the two SMA connectors of the third calibration set are delay terminals.

In the embodiment, a radio frequency chip type load to be detected is arranged on a calibration circuit and is electrically connected with an SMA connector; this embodiment performs calibration data transmission through SMA connectors.

In the using process, firstly, connecting the SMA connectors of the calibration device to test equipment (a network analyzer) respectively for calibration operation, and moving out the calibration device after the calibration is finished; and secondly, connecting the test fixture to test equipment (a network analyzer) for testing.

After the first step, the state of the test equipment (network analyzer) is the calibration state of the test fixture, and the state can accurately eliminate the introduced errors of the circuit board, the SMA and the like in the test fixture.

The above-described embodiments are only preferred embodiments of the present invention, and are not intended to limit the scope of the present invention, but all changes that can be made by applying the principles of the present invention and performing non-inventive work on the basis of the principles shall fall within the scope of the present invention.

Claims

1. A calibration device for a radio frequency chip type load is characterized by comprising a base and a plurality of calibration groups arranged on the base in a column direction or a row direction; any one calibration group is provided with one or two SMA connectors; the base is provided with calibration circuits which are connected with one or two SMA connectors in a one-to-one corresponding manner; and the calibration circuit is spliced and matched with the radio frequency chip type load.

2. The device of claim 1, wherein the plurality of calibration sets are arranged in a row direction with a length in the column direction or a width in the row direction.

3. The device of claim 2, wherein the calibration lines are arranged in a row direction length or a column direction width in a gradually increasing or decreasing manner.

4. The calibration device of claim 1 or 2, wherein the first column or the first row of the calibration set is a first calibration set; the first calibration set is provided with an SMA connector.

5. The calibration device of claim 4, wherein the second column or the second row of the calibration set is a second calibration set; the third column or row of the calibration set is a third calibration set; the second calibration group and the third calibration group are both provided with two SMA connectors; the two SMA connectors are connected with the end parts of the calibration circuit in a one-to-one correspondence manner.

6. A calibration device for rf chip loads according to claim 1, 2 or 3, wherein a plurality of screws are provided on each side of the calibration set.

7. The device of claim 1, wherein the base is in the shape of a step.