CN113899744A - Terahertz-based building material defect detection method and system - Google Patents
Terahertz-based building material defect detection method and system Download PDFInfo
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- 230000007547 defect Effects 0.000 title claims abstract description 58
- 238000001514 detection method Methods 0.000 title claims abstract description 58
- 239000004566 building material Substances 0.000 title claims abstract description 53
- 238000006073 displacement reaction Methods 0.000 claims abstract description 28
- 238000012545 processing Methods 0.000 claims abstract description 8
- 238000002835 absorbance Methods 0.000 claims description 6
- 239000000463 material Substances 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 4
- -1 polytetrafluoroethylene Polymers 0.000 claims description 4
- 229920001343 polytetrafluoroethylene Polymers 0.000 claims description 4
- 239000004810 polytetrafluoroethylene Substances 0.000 claims description 4
- 238000005070 sampling Methods 0.000 claims description 4
- 230000005540 biological transmission Effects 0.000 claims description 3
- 238000010521 absorption reaction Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 description 14
- 238000005516 engineering process Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 239000003365 glass fiber Substances 0.000 description 4
- 238000009659 non-destructive testing Methods 0.000 description 3
- 238000010276 construction Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000004445 quantitative analysis Methods 0.000 description 2
- 238000001931 thermography Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 241000264877 Hippospongia communis Species 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 239000011152 fibreglass Substances 0.000 description 1
- 229910052602 gypsum Inorganic materials 0.000 description 1
- 239000010440 gypsum Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 230000005865 ionizing radiation Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
Abstract
The invention discloses a terahertz-based building material defect detection method, which comprises the following steps of: step 1, a terahertz source emits terahertz waves; step 2, the terahertz waves are collimated through a first plano-convex lens and generate parallel light beams, and then the parallel light beams are focused into a point light source through a second plano-convex lens; step 3, fixing the sample on a two-dimensional displacement platform and selecting an initial pixel point, wherein the point light source transmits to the initial pixel point; step 4, moving the two-dimensional displacement platform to realize continuous scanning of the terahertz waves on each pixel point of the sample; step 5, converting the scanned terahertz waves into voltage signals through a terahertz detector; step 6, processing the voltage signal to generate a two-dimensional terahertz scanning intensity map of the sample, so as to realize the defect detection of the sample; the invention also provides a building material defect detection system based on terahertz, which comprises the following components: the terahertz detector comprises a terahertz source, a first plano-convex lens, a second plano-convex lens, a sample, a control cabinet, a terahertz detector, a data acquisition system and a computer.
Description
Technical Field
The invention relates to the field of detection, in particular to a terahertz-based building material defect detection method and system.
Background
The common building materials include gypsum, concrete, heat insulating materials and the like, and the building materials are widely used in engineering construction in China. Due to elements such as construction conditions, manufacturing processes and the like, the internal structure of the building material is easy to have different types of defects such as cracks, holes, honeycombs and the like, once reaching a certain degree, potential safety hazards are generated, and along with the increase of the service life, the defects can cause accidents under the action of various loads. Therefore, it is very important to detect the quality of the building material, determine the position of the defect, and ensure the quality safety.
Currently, the commonly used detection methods include X-ray, ultrasonic, and thermal imaging techniques. The X-ray technique utilizes ionizing radiation to penetrate the sample, which causes potential safety hazards to operators and is expensive; ultrasonic technology cannot be effectively propagated in liquid and gas, and the application of the ultrasonic technology in nondestructive testing is greatly limited; in thermography, it takes a long time and produces a large phase shift when the thermal signal passes through the building wall, and it is difficult to describe all material parameters at the same time.
Disclosure of Invention
The present invention has been made to solve the above problems, and an object of the present invention is to provide a method for detecting defects in a building material based on terahertz.
The invention provides a terahertz-based building material defect detection method, which is characterized by comprising the following steps of:
step 1, a terahertz source emits terahertz waves.
And 2, collimating the terahertz waves through the first plano-convex lens and generating parallel light beams, and focusing the parallel light beams into point light sources through the second plano-convex lens.
And 3, fixing the sample on a two-dimensional displacement platform and selecting an initial pixel point, wherein the point light source transmits to the initial pixel point.
And 4, moving the two-dimensional displacement platform, so that continuous scanning of the terahertz waves on each pixel point of the sample is realized.
and 6, processing the voltage signal to generate a two-dimensional terahertz scanning intensity map of the sample, so as to realize the defect detection of the sample.
In the building material defect detection method based on terahertz provided by the invention, the method can also have the following characteristics: in the step 1, the power range of the terahertz source is 100-300 mW, and the frequency range is 0.1-0.3 THz.
In the building material defect detection method based on terahertz provided by the invention, the method can also have the following characteristics: in step 2, the first plano-convex lens and the second plano-convex lens are both made of polytetrafluoroethylene suitable for the THz frequency band, the diameters of the first plano-convex lens and the second plano-convex lens are both 50mm, and the focal lengths of the first plano-convex lens and the second plano-convex lens are both 100 mm.
In the building material defect detection method based on terahertz provided by the invention, the method can also have the following characteristics: in the step 3, the sample needs to be dried and placed in a vacuum box, a two-dimensional displacement platform is arranged between a terahertz source and a terahertz detector, the stroke of the two-dimensional displacement platform is 100mm, the maximum speed is 20mm/s, and a cross roller guide rail is adopted.
In the building material defect detection method based on terahertz provided by the invention, the method can also have the following characteristics: in step 4, when each pixel point of the sample is continuously scanned, the distance between two adjacent sampling pixel points is 1mm, and the single measurement time is less than 5 s.
In the building material defect detection method based on terahertz provided by the invention, the method can also have the following characteristics: in the step 5, the terahertz detector is a photoelectric detector suitable for the THz frequency band, and the effective response frequency band is 0.1-3 THz.
In the building material defect detection method based on terahertz provided by the invention, the method can also have the following characteristics: the terahertz source, the center of the first plano-convex lens, the center of the second plano-convex lens and the terahertz detector are all located at the same height, and the light paths where the terahertz source, the center of the first plano-convex lens, the center of the second plano-convex lens and the terahertz detector are located are ensured to be on the same straight line.
In the building material defect detection method based on terahertz provided by the invention, the method can also have the following characteristics: before the terahertz-based building material defect detection method starts detection, firstly, an input signal is collected in an idle state, then, a sample is placed to collect an output signal, and the absorbance of the sample is calculated according to the Lambert-beer law:
a represents the absorbance of the material, I0Indicating the intensity (W), I) of the input signaltThe intensity of the output signal (W), k the absorption coefficient, and L the sample thickness (m).
The invention also provides a building material defect detection system based on terahertz, which is characterized by comprising the following components:
and the terahertz source is used for emitting terahertz waves.
The first plano-convex lens is used for collimating the terahertz waves and generating parallel beams.
And the second plano-convex lens is used for focusing the parallel light beams into a point light source.
A sample for receiving the transmission of a point source of light.
And the control cabinet is used for driving the two-dimensional displacement platform where the sample is located to move, and realizing continuous scanning of the terahertz waves on each pixel point of the sample.
And the terahertz detector is used for converting the scanned terahertz waves into voltage signals.
And the data acquisition system is used for transmitting the voltage signal to the computer.
And the computer is used for controlling the control cabinet to work and processing the two-dimensional terahertz scanning intensity map of the generated sample.
Action and Effect of the invention
According to the building material defect detection method and system based on terahertz, terahertz waves are emitted by a terahertz source, the terahertz waves are collimated through a first plano-convex lens and generate parallel light beams, the parallel light beams are focused into point light sources through a second plano-convex lens, a sample is fixed on a two-dimensional displacement platform, initial pixel points are selected, the point light sources transmit to the initial pixel points, the two-dimensional displacement platform moves, therefore, continuous scanning of the terahertz waves on the pixel points of the sample is achieved, the scanned terahertz waves are converted into voltage signals through a terahertz detector, the voltage signals are processed, a two-dimensional terahertz scanning intensity graph of the sample is generated, and defect detection of the sample is achieved. The process adopts a terahertz scanning imaging technology, and has the advantages of small ionization damage, simple and convenient method, simple operation, high detection speed, high accuracy and the like. Meanwhile, the terahertz-based building material defect detection system has higher resolution, can detect millimeter-level defects in the building material, and can perform quantitative analysis on the defects. In addition, the invention adopts a non-contact nondestructive testing technology, and can well protect the integrity of the tested object. Thirdly, the terahertz detection system adopted by the invention is simple in design, low in cost, easy to popularize and wide in market application prospect.
Drawings
Fig. 1 is a flow chart of a terahertz-based building material defect detection method in embodiment 1 of the present invention;
FIG. 2 is a schematic diagram of a terahertz-based building material defect detection system in embodiment 1 of the present invention;
FIG. 3 is a pictorial view of a concrete sample in example 2 of the present invention;
FIG. 4 is a pictorial view of a sample of fiberglass in example 2 of the present invention;
FIG. 5 is a graph showing the results of the defect detection of the concrete sample based on terahertz building materials in example 2 of the present invention;
fig. 6 is a graph showing the detection result of the defects of the building material based on terahertz of the glass fiber sample in example 2 of the present invention.
Detailed Description
In order to make the technical means, the creation features, the achievement purposes and the effects of the invention easy to understand, the following embodiments specifically describe the building material defect detection method based on terahertz in the present invention with reference to the accompanying drawings.
< example 1>
In the embodiment, a terahertz-based building material defect detection method is provided.
Fig. 1 is a flow chart of a terahertz-based building material defect detection method in an embodiment of the invention.
As shown in fig. 1, the terahertz-based building material defect detection method according to the present embodiment includes the following steps:
in step S1, the terahertz source emits terahertz waves.
The terahertz source is selected within the power range of 100-300 mW and the frequency range of 0.1-0.3 THz, the higher the selected power is, the larger the thickness range of the measured material is, the low-power terahertz source is suitable for detecting low-density light building materials, and the high-power terahertz source is suitable for detecting high-density compact building materials.
And step S2, the terahertz waves are collimated through the first plano-convex lens and generate parallel light beams, and the parallel light beams are focused into point light sources through the second plano-convex lens.
The first plano-convex lens and the second plano-convex lens are both made of polytetrafluoroethylene suitable for THz frequency bands, the diameters of the first plano-convex lens and the second plano-convex lens are both 50mm, and the focal lengths of the first plano-convex lens and the second plano-convex lens are both 100 mm. In addition, terahertz waves emitted by the terahertz source 1 are light spots, need to be collimated by the first plano-convex lens and generate parallel light beams, and then are focused by the second plano-convex lens, so that the light beams are focused into point light sources as small as possible, pixel points during sample detection are guaranteed to be as small as possible, and results after point-by-point scanning are more accurate.
And step S3, fixing the sample on a two-dimensional displacement platform and selecting an initial pixel point, wherein the point light source transmits to the initial pixel point.
Wherein, the sample needs to be dried and placed in a vacuum box, so that the influence of the water content and the air humidity in the sample on the experimental result is reduced. The two-dimensional displacement platform is arranged between the terahertz source and the terahertz detector, the stroke of the two-dimensional displacement platform is 100mm, the maximum speed is 20mm/s, and a cross roller guide rail is adopted.
And step S4, moving the two-dimensional displacement platform, thereby realizing continuous scanning of each pixel point of the sample and generating the scanned terahertz waves.
The computer controls the control cabinet to work, the control cabinet drives the two-dimensional displacement platform where the sample is located to move, continuous scanning of each pixel point of the sample is achieved, the distance between every two adjacent sampling pixel points is 1mm, and the single measurement time is less than 5 s.
In step S5, the scanned terahertz wave is converted into a voltage signal by the terahertz detector.
The terahertz detector is a photoelectric detector suitable for the THz frequency band, the effective response frequency band is 0.1-3 THz, and the terahertz source, the center of the first plano-convex lens, the center of the second plano-convex lens and the terahertz detector are all located at the same height, so that the optical path where the terahertz detector is located is on the same straight line, and the terahertz detector can well receive terahertz signals.
And step S6, processing the voltage signal to generate a two-dimensional terahertz scanning intensity map of the sample, and realizing the defect detection of the sample.
The data acquisition system records the voltage signals in real time and transmits the voltage signals to the computer.
The embodiment also provides a building material defect detection system based on terahertz.
FIG. 2 is a schematic diagram of a terahertz-based building material defect detection system in an embodiment of the invention.
As shown in fig. 1, the terahertz-based building material defect detection system according to the present embodiment includes:
the terahertz source 1 is used for emitting terahertz waves.
The first plano-convex lens 2 is used for collimating the terahertz waves and generating parallel beams.
And the second plano-convex lens 3 is used for focusing the parallel light beams into a point light source.
And the control cabinet 5 is used for driving the two-dimensional displacement platform where the sample is located to move, and realizing continuous scanning of the terahertz waves on each pixel point of the sample.
And the terahertz detector 6 is used for converting the scanned terahertz waves into voltage signals.
And the data acquisition system 7 is used for transmitting the voltage signal to the computer.
And the computer 8 is used for controlling the control cabinet to work and processing the two-dimensional terahertz scanning intensity map of the generated sample.
< example 2>
In example 2, a specific application of example 1 is provided.
In this example, concrete and glass fiber were used as building material samples, respectively.
FIG. 3 is a schematic diagram of sample a in example 2 of the present invention.
FIG. 4 is a physical diagram of sample b in example 2 of the present invention.
The specific implementation manner of this embodiment is:
step S1, the terahertz source emits terahertz waves, and a two-dimensional displacement platform carrying a sample is disposed between the terahertz source and the terahertz detector 6.
Wherein the power range of the terahertz source is 100-300 mW, and the frequency range is 0.1-0.3 THz.
And step S2, the terahertz waves are collimated through the first plano-convex lens and parallel light beams are generated, the parallel light beams are focused into point light sources through the second plano-convex lens, the terahertz source, the first plano-convex lens, the second plano-convex lens and the terahertz detector are adjusted to enable the focuses of the terahertz source, the first plano-convex lens, the second plano-convex lens and the terahertz detector to be at the same height, and the terahertz detector can be guaranteed to receive signals well.
The first plano-convex lens and the second plano-convex lens are both made of polytetrafluoroethylene suitable for THz frequency bands, the diameters of the first plano-convex lens and the second plano-convex lens are both 50mm, and the focal lengths of the first plano-convex lens and the second plano-convex lens are both 100 mm.
And step S3, firstly, acquiring input signals under the no-load state, then fixing the sample on a two-dimensional displacement platform and selecting an initial pixel point, and transmitting the point light source to the initial pixel point.
Wherein, the sample needs to be dried and placed in a vacuum box, so that the influence of the water content and the air humidity in the sample on the experimental result is reduced. The two-dimensional displacement platform is arranged between the terahertz source and the terahertz detector, the stroke of the two-dimensional displacement platform is 100mm, the maximum speed is 20mm/s, and a cross roller guide rail is adopted.
And step S4, controlling the two-dimensional displacement platform to move along a preset route through a computer, setting a moving route in computer software, and transmitting a signal to a control cabinet, so that continuous scanning of each pixel point of the sample is realized, and the scanned terahertz wave is generated.
The computer controls the control cabinet to work, the control cabinet drives the two-dimensional displacement platform where the sample is located to move, continuous scanning of each pixel point of the sample is achieved, the distance between every two adjacent sampling pixel points is 1mm, and the single measurement time is less than 5 s.
And step S5, converting the scanned terahertz waves into voltage signals by the terahertz detector and transmitting the voltage signals to the computer.
The terahertz detector is a photoelectric detector suitable for the THz frequency band, the effective response frequency band is 0.1-3 THz, and the terahertz source, the center of the first plano-convex lens, the center of the second plano-convex lens and the terahertz detector are all located at the same height, so that the optical path where the terahertz detector is located is on the same straight line, and the terahertz detector can well receive terahertz signals.
And step S6, processing the voltage signal, outputting the signal and terahertz data, calculating to obtain the absorbance of the sample, and expressing the terahertz data representing each pixel point by different colors according to the absorbance to obtain a two-dimensional terahertz scanning intensity map of the building material sample, so as to realize the defect detection of the sample.
Fig. 5 is a graph showing the detection result of the defect of the concrete sample based on terahertz building material in example 2 of the present invention.
Fig. 6 is a graph showing the detection result of the defects of the building material based on terahertz of the glass fiber sample in example 2 of the present invention.
As shown in fig. 5, it was found that square defects or small stones were present in the concrete samples.
As shown in fig. 6, it was found that the glass fiber sample was affected by the unevenness of thickness or moisture content, and the image was uneven.
Effects and effects of the embodiments
According to the building material defect detection method and system based on terahertz, according to embodiments 1-2, a terahertz source emits terahertz waves, the terahertz waves are collimated through a first plano-convex lens and generate parallel light beams, the parallel light beams are focused into point light sources through a second plano-convex lens, a sample is fixed on a two-dimensional displacement platform, starting pixel points are selected, the point light sources transmit to the starting pixel points, the two-dimensional displacement platform moves, and therefore continuous scanning of the terahertz waves on the pixel points of the sample is achieved, the scanned terahertz waves are converted into voltage signals through a terahertz detector, the voltage signals are processed, a two-dimensional terahertz scanning intensity graph of the sample is generated, and defect detection of the sample is achieved. The process adopts a terahertz scanning imaging technology, and has the advantages of small ionization damage, simple and convenient method, simple operation, high detection speed, high accuracy and the like. Meanwhile, the terahertz-based building material defect detection system has higher resolution, can detect millimeter-level defects in the building material, and can perform quantitative analysis on the defects. In addition, the invention adopts a non-contact nondestructive testing technology, and can well protect the integrity of the tested object. Thirdly, the terahertz detection system adopted by the invention is simple in design, low in cost, easy to popularize and wide in market application prospect.
The above embodiments are preferred examples of the present invention, and are not intended to limit the scope of the present invention.
Claims (9)
1. A terahertz-based building material defect detection method is characterized by comprising the following steps:
step 1, a terahertz source emits terahertz waves;
step 2, the terahertz waves are collimated through a first plano-convex lens and generate parallel light beams, and the parallel light beams are focused into point light sources through a second plano-convex lens;
step 3, fixing a sample on a two-dimensional displacement platform and selecting an initial pixel point, wherein the point light source transmits to the initial pixel point;
step 4, the two-dimensional displacement platform moves, so that continuous scanning of the terahertz waves to all pixel points of the sample is realized;
step 5, converting the scanned terahertz waves into voltage signals through a terahertz detector;
and 6, processing the voltage signal to generate a two-dimensional terahertz scanning intensity map of the sample, so as to realize the defect detection of the sample.
2. The terahertz-based building material defect detection method as claimed in claim 1, wherein:
in the step 1, the power range of the terahertz source is 100-300 mW, and the frequency range is 0.1-0.3 THz.
3. The terahertz-based building material defect detection method as claimed in claim 1, wherein:
wherein in the step 2, the first plano-convex lens and the second plano-convex lens are both made of polytetrafluoroethylene suitable for THz frequency band,
the diameters of the first plano-convex lens and the second plano-convex lens are both 50mm, and the focal lengths are both 100 mm.
4. The terahertz-based building material defect detection method as claimed in claim 1, wherein:
wherein, in the step 3, the sample needs to be dried and is placed in a vacuum box,
the two-dimensional displacement platform is arranged between the terahertz source and the terahertz detector, the stroke of the two-dimensional displacement platform is 100mm, the maximum speed is 20mm/s, and a cross roller guide rail is adopted.
5. The terahertz-based building material defect detection method as claimed in claim 1, wherein:
in step 4, when each pixel point of the sample is continuously scanned, the distance between two adjacent sampling pixel points is 1mm, and the single measurement time is less than 5 s.
6. The terahertz-based building material defect detection method as claimed in claim 1, wherein:
in the step 5, the terahertz detector is a photoelectric detector suitable for the THz frequency band, and the effective response frequency band is 0.1-3 THz.
7. The terahertz-based building material defect detection method as claimed in claim 1, wherein:
the terahertz source, the center of the first plano-convex lens, the center of the second plano-convex lens and the terahertz detector are all located at the same height, and the light paths are ensured to be located on the same straight line.
8. The terahertz-based building material defect detection method as claimed in claim 1, wherein:
before the terahertz-based building material defect detection method starts detection, firstly, an input signal is collected in an idle state, then, the sample is placed to collect an output signal, and the absorbance of the sample is calculated according to the Lambert-beer law:
a represents the absorbance of the material, I0Indicating the intensity (W), I) of the input signaltThe intensity of the output signal (W), k the absorption coefficient, and L the sample thickness (m).
9. A terahertz-based building material defect detection system is characterized by comprising:
a terahertz source for emitting terahertz waves;
the first plano-convex lens is used for collimating the terahertz waves and generating parallel beams;
the second plano-convex lens is used for focusing the parallel light beams into a point light source;
a sample for receiving the transmission of the point source;
the control cabinet is used for driving the two-dimensional displacement platform where the sample is located to move, and continuous scanning of terahertz waves on each pixel point of the sample is achieved;
the terahertz detector is used for converting the scanned terahertz waves into voltage signals;
the data acquisition system is used for transmitting the voltage signal to the computer;
and the computer is used for controlling the control cabinet to work and processing the two-dimensional terahertz scanning intensity map of the sample.
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