CN113899744B - Terahertz-based building material defect detection method and system - Google Patents
Terahertz-based building material defect detection method and system Download PDFInfo
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- 230000007547 defect Effects 0.000 title claims abstract description 54
- 238000001514 detection method Methods 0.000 title claims abstract description 51
- 239000004566 building material Substances 0.000 title claims abstract description 45
- 238000006073 displacement reaction Methods 0.000 claims abstract description 28
- 238000010586 diagram Methods 0.000 claims abstract description 10
- 238000012545 processing Methods 0.000 claims abstract description 8
- 238000002835 absorbance Methods 0.000 claims description 7
- 239000000463 material Substances 0.000 claims description 5
- 238000005259 measurement Methods 0.000 claims description 4
- -1 polytetrafluoroethylene Polymers 0.000 claims description 4
- 229920001343 polytetrafluoroethylene Polymers 0.000 claims description 4
- 239000004810 polytetrafluoroethylene Substances 0.000 claims description 4
- 238000005070 sampling Methods 0.000 claims description 4
- 238000010521 absorption reaction Methods 0.000 claims description 2
- 239000003086 colorant Substances 0.000 claims description 2
- 230000003287 optical effect Effects 0.000 claims 1
- 238000000034 method Methods 0.000 description 11
- 238000005516 engineering process Methods 0.000 description 8
- 230000000694 effects Effects 0.000 description 5
- 239000003365 glass fiber Substances 0.000 description 5
- 239000004035 construction material Substances 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 238000009659 non-destructive testing Methods 0.000 description 2
- 238000001931 thermography Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 241000264877 Hippospongia communis Species 0.000 description 1
- 229910052602 gypsum Inorganic materials 0.000 description 1
- 239000010440 gypsum Substances 0.000 description 1
- 239000012774 insulation material Substances 0.000 description 1
- 230000005865 ionizing radiation Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 238000012285 ultrasound imaging Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
Abstract
The invention discloses a terahertz-based building material defect detection method, which comprises the following steps of: step 1, a terahertz source emits terahertz waves; step 2, the terahertz wave is collimated by a first plano-convex lens and generates a parallel beam, and then is focused into a point light source by a second plano-convex lens; step 3, fixing the sample on a two-dimensional displacement platform, selecting an initial pixel point, and transmitting a point light source to the initial pixel point; step 4, the two-dimensional displacement platform moves to realize continuous scanning of terahertz waves on each pixel point of the sample; step 5, converting the scanned terahertz waves into voltage signals through a terahertz detector; step 6, processing the voltage signal to generate a two-dimensional terahertz scanning intensity diagram of the sample, so as to realize defect detection of the sample; the invention also provides a terahertz-based building material defect detection system, which comprises: the terahertz system comprises a terahertz source, a first plano-convex lens, a second plano-convex lens, a sample, a control cabinet, a terahertz detector, a data acquisition system and a computer.
Description
Technical Field
The invention relates to the field of detection, in particular to a terahertz-based building material defect detection method and system.
Background
Common building materials include gypsum, concrete, thermal insulation materials and the like, and the building materials are widely used in engineering construction in China. Because of construction conditions, manufacturing process and other elements, the internal structure of the building material is easy to generate defects of different types such as cracks, holes, honeycombs and the like, potential safety hazards can be generated once the defects reach a certain degree, and accidents can be caused by the defects under the action of various loads along with the increase of service life. Therefore, it is extremely important to detect the quality of the building material, determine the defect position, and ensure the quality safety.
Currently, commonly used detection methods include techniques such as X-ray, ultrasound, and thermal imaging. The X-ray technology utilizes ionizing radiation to penetrate through a sample, so that potential safety hazards are caused to operators, and the cost is high; ultrasonic technology cannot be effectively transmitted in liquid and gas, so that the application of the ultrasonic technology in nondestructive detection is greatly limited; in thermal imaging technology, it takes a long time for a thermal signal to pass through a building wall and a large phase shift occurs, and it is difficult to describe all material parameters simultaneously.
Disclosure of Invention
The present invention has been made to solve the above-mentioned problems, and an object of the present invention is to provide a method for detecting defects of a building material based on terahertz.
The invention provides a terahertz-based building material defect detection method, which has the characteristics that:
step 1, a terahertz source emits terahertz waves.
And 2, collimating the terahertz wave through a first plano-convex lens and generating a parallel light beam, and focusing the parallel light beam into a point light source through a second plano-convex lens.
And 3, fixing the sample on a two-dimensional displacement platform, selecting an initial pixel point, and transmitting the point light source to the initial pixel point.
And 4, moving the two-dimensional displacement platform, so as to realize continuous scanning of the terahertz waves on each pixel point of the sample.
Step 5, converting the scanned terahertz waves into voltage signals through a terahertz detector;
and 6, processing the voltage signal to generate a two-dimensional terahertz scanning intensity graph of the sample, so as to realize defect detection of the sample.
The terahertz-based building material defect detection method provided by the invention can also have the following characteristics: in the step 1, the terahertz source has the selected power range of 100-300 mW and the frequency range of 0.1-0.3 THz.
The terahertz-based building material defect detection method provided by the invention can also have the following characteristics: in the step 2, the materials of the first plano-convex lens and the second plano-convex lens are polytetrafluoroethylene suitable for THz frequency bands, the diameters of the first plano-convex lens and the second plano-convex lens are 50mm, and the focal lengths of the first plano-convex lens and the second plano-convex lens are 100mm.
The terahertz-based building material defect detection method provided by the invention can also have the following characteristics: in the step 3, the sample is required to be dried and placed in a vacuum box, a two-dimensional displacement platform is arranged between a terahertz source and a terahertz detector, the stroke of the two-dimensional displacement platform is 100mm, the maximum speed is 20mm/s, and a cross roller guide rail is adopted.
The terahertz-based building material defect detection method provided by the invention can also have the following characteristics: in step 4, when each pixel point of the sample is continuously scanned, the distance between two adjacent sampling pixel points is 1mm, and the single measurement time is less than 5s.
The terahertz-based building material defect detection method provided by the invention can also have the following characteristics: in step 5, the terahertz detector is a photoelectric detector suitable for the THz frequency band, and the effective response frequency band is 0.1-3 THz.
The terahertz-based building material defect detection method provided by the invention can also have the following characteristics: the terahertz source, the center of the first plano-convex lens, the center of the second plano-convex lens and the terahertz detector are all located at the same height, and the light paths are guaranteed to be located on the same straight line.
The terahertz-based building material defect detection method provided by the invention can also have the following characteristics: before the detection of the defect detection method of the building material based on terahertz is started, firstly, an input signal is collected in an empty load state, then a sample is placed for collecting an output signal, and the absorbance of the sample is calculated according to the lambert-beer law:
a represents absorbance of the material, I 0 Representing the intensity (W), I of the input signal t K is the absorption coefficient and L is the sample thickness (m) for the intensity (W) of the output signal.
The invention also provides a terahertz-based building material defect detection system, which has the characteristics that:
and the terahertz source is used for emitting terahertz waves.
And the first plano-convex lens is used for collimating the terahertz waves and generating parallel light beams.
And a second plano-convex lens for focusing the parallel light beam into a point light source.
A sample for receiving the transmission of the point light source.
And the control cabinet is used for driving the two-dimensional displacement platform where the sample is positioned to move, and realizing continuous scanning of terahertz waves on each pixel point of the sample.
And the terahertz detector is used for converting the scanned terahertz waves into voltage signals.
And the data acquisition system is used for transmitting the voltage signal to the computer.
And the computer is used for controlling the operation and processing of the control cabinet to generate a two-dimensional terahertz scanning intensity map of the sample.
Effects and effects of the invention
According to the terahertz-based building material defect detection method and system, terahertz waves are emitted by a terahertz source, the terahertz waves are collimated by a first plano-convex lens and generate parallel light beams, the parallel light beams are focused by a second plano-convex lens to form point light sources, a sample is fixed on a two-dimensional displacement platform, initial pixel points are selected, the point light sources are transmitted to the initial pixel points, the two-dimensional displacement platform moves, and therefore continuous scanning of the terahertz waves on each pixel point of the sample is achieved, the scanned terahertz waves are converted into voltage signals by a terahertz detector, the voltage signals are processed, a two-dimensional terahertz scanning intensity diagram of the sample is generated, and defect detection of the sample is achieved. The terahertz scanning imaging technology is adopted in the process, and the method has the advantages of small ionization damage, simplicity and convenience in method, simplicity in operation, high detection speed, high accuracy and the like. Meanwhile, the terahertz-based building material defect detection system adopted by the invention has higher resolution, can detect millimeter-level defects in the building material, and quantitatively analyze the defects. In addition, the invention adopts a non-contact nondestructive testing technology, and can well protect the integrity of the detected object. And the terahertz detection system adopted by the invention has simple design, low cost, easy popularization and wide market application prospect.
Drawings
FIG. 1 is a flow chart of a method for detecting defects of a building material based on terahertz in embodiment 1 of the present invention;
FIG. 2 is a schematic diagram of a terahertz-based building material defect detection system in example 1 of the present invention;
FIG. 3 is a physical view of a concrete sample in example 2 of the present invention;
FIG. 4 is a physical view of a glass fiber sample in example 2 of the present invention;
FIG. 5 is a graph showing the results of terahertz-based detection of defects in a construction material of a concrete sample in example 2 of the present invention;
fig. 6 is a graph showing the results of terahertz-based detection of defects in a construction material of a glass fiber sample in example 2 of the present invention.
Detailed Description
In order to make the technical means, creation characteristics, achievement purposes and effects achieved by the present invention easy to understand, the following embodiments specifically describe the terahertz-based building material defect detection method according to the present invention with reference to the accompanying drawings.
Example 1 ]
In this embodiment, a terahertz-based building material defect detection method is provided.
Fig. 1 is a flowchart of a method for detecting defects of a building material based on terahertz in an embodiment of the invention.
As shown in fig. 1, the terahertz-based building material defect detection method according to this embodiment includes the steps of:
step S1, a terahertz source emits terahertz waves.
The terahertz source is used for detecting light building materials with low density, the power range is 100-300 mW, the frequency range is 0.1-0.3 THz, the higher the power is, the larger the thickness range of the material is, the low-power terahertz source is suitable for detecting light building materials with low density, and the high-power terahertz source is suitable for detecting compact building materials with high density.
And S2, collimating the terahertz wave through a first plano-convex lens and generating a parallel light beam, and focusing the parallel light beam into a point light source through a second plano-convex lens.
The first plano-convex lens and the second plano-convex lens are made of polytetrafluoroethylene suitable for THz frequency bands, the diameters of the first plano-convex lens and the second plano-convex lens are 50mm, and the focal lengths of the first plano-convex lens and the second plano-convex lens are 100mm. In addition, the terahertz waves emitted by the terahertz source 1 are light spots, and after the light spots are collimated by the first plano-convex lens and generate parallel light beams, the parallel light beams are focused by the second plano-convex lens, so that the light beams are focused into point light sources as small as possible, the pixel points in the process of detecting a sample are ensured to be as small as possible, and the point-by-point scanning result is more accurate.
And S3, fixing the sample on a two-dimensional displacement platform, selecting an initial pixel point, and transmitting the point light source to the initial pixel point.
The sample needs to be dried and placed in the vacuum box, so that the influence of the water content and the air humidity in the sample on experimental results is reduced. The two-dimensional displacement platform is arranged between the terahertz source and the terahertz detector, the stroke of the two-dimensional displacement platform is 100mm, the maximum speed is 20mm/s, and a cross roller guide rail is adopted.
And S4, moving the two-dimensional displacement platform, so as to realize continuous scanning of each pixel point of the sample and generate scanned terahertz waves.
The computer controls the control cabinet to work, the control cabinet drives the two-dimensional displacement platform where the sample is located to move, continuous scanning of each pixel point of the sample is achieved, the distance between two adjacent sampling pixel points is 1mm, and single measurement time is less than 5s.
And S5, converting the scanned terahertz waves into voltage signals through a terahertz detector.
The terahertz detector is a photoelectric detector suitable for a THz frequency band, the effective response frequency band is 0.1-3 THz, and the terahertz source, the center of the first plano-convex lens, the center of the second plano-convex lens and the terahertz detector are all at the same height, so that the light paths are on the same straight line, and the terahertz detector can well receive terahertz signals.
And S6, processing the voltage signal to generate a two-dimensional terahertz scanning intensity graph of the sample, and realizing defect detection of the sample.
The data acquisition system records the voltage signal in real time and transmits the voltage signal to the computer.
The embodiment also provides a terahertz-based building material defect detection system.
Fig. 2 is a schematic diagram of a terahertz-based building material defect detection system in an embodiment of the invention.
As shown in fig. 1, the terahertz-based building material defect detection system according to this embodiment includes:
and a terahertz source 1 for emitting terahertz waves.
The first plano-convex lens 2 is used for collimating terahertz waves and generating parallel light beams.
And a second plano-convex lens 3 for focusing the parallel light beam into a point light source.
Sample 4, for receiving the transmission of a point light source.
And the control cabinet 5 is used for driving the two-dimensional displacement platform where the sample is positioned to move so as to realize continuous scanning of terahertz waves on each pixel point of the sample.
And a terahertz detector 6 for converting the scanned terahertz wave into a voltage signal.
And the data acquisition system 7 is used for transmitting the voltage signals to a computer.
And the computer 8 is used for controlling the operation and processing of the control cabinet to generate a two-dimensional terahertz scanning intensity map of the sample.
Example 2 ]
In example 2, a specific application of example 1 is provided.
In this example, concrete and glass fiber were used as building material samples, respectively.
FIG. 3 is a physical diagram of sample a in example 2 of the present invention.
FIG. 4 is a physical diagram of sample b in example 2 of the present invention.
The specific implementation manner of the embodiment is as follows:
in step S1, the terahertz source emits a terahertz wave, and a two-dimensional displacement platform carrying a sample is disposed between the terahertz source and the terahertz detector 6.
Wherein, the terahertz source adopts the power range of 100-300 mW and the frequency range of 0.1-0.3 THz.
And S2, the terahertz wave is collimated by the first plano-convex lens and generates a parallel light beam, the parallel light beam is focused into a point light source by the second plano-convex lens, and the terahertz source, the first plano-convex lens, the second plano-convex lens and the terahertz detector are adjusted to enable focuses of the terahertz source, the first plano-convex lens, the second plano-convex lens and the terahertz detector to be at the same height, so that the terahertz detector can be guaranteed to well receive signals.
The first plano-convex lens and the second plano-convex lens are made of polytetrafluoroethylene suitable for THz frequency bands, the diameters of the first plano-convex lens and the second plano-convex lens are 50mm, and the focal lengths of the first plano-convex lens and the second plano-convex lens are 100mm.
Step S3, firstly, in an idle state, an input signal is collected, then a sample is fixed on a two-dimensional displacement platform, an initial pixel point is selected, and a point light source is transmitted to the initial pixel point.
The sample needs to be dried and placed in the vacuum box, so that the influence of the water content and the air humidity in the sample on experimental results is reduced. The two-dimensional displacement platform is arranged between the terahertz source and the terahertz detector, the stroke of the two-dimensional displacement platform is 100mm, the maximum speed is 20mm/s, and a cross roller guide rail is adopted.
And S4, controlling the two-dimensional displacement platform to travel according to a preset route through a computer, setting a travel route in computer software, and transmitting signals to a control cabinet, so that continuous scanning of each pixel point of a sample is realized, and terahertz waves after scanning are generated.
The computer controls the control cabinet to work, the control cabinet drives the two-dimensional displacement platform where the sample is located to move, continuous scanning of each pixel point of the sample is achieved, the distance between two adjacent sampling pixel points is 1mm, and single measurement time is less than 5s.
And S5, converting the scanned terahertz waves into voltage signals through a terahertz detector and transmitting the voltage signals to a computer.
The terahertz detector is a photoelectric detector suitable for a THz frequency band, the effective response frequency band is 0.1-3 THz, and the terahertz source, the center of the first plano-convex lens, the center of the second plano-convex lens and the terahertz detector are all at the same height, so that the light paths are on the same straight line, and the terahertz detector can well receive terahertz signals.
And S6, processing the voltage signal, outputting the signal and the terahertz data, calculating to obtain the absorbance of the sample, and respectively representing the terahertz data representing each pixel point by different colors according to the absorbance to obtain a two-dimensional terahertz scanning intensity diagram of the building material sample, thereby realizing the defect detection of the sample.
Fig. 5 is a graph of the results of terahertz-based detection of defects in a construction material of a concrete sample in example 2 of the present invention.
Fig. 6 is a graph showing the results of terahertz-based detection of defects in a construction material of a glass fiber sample in example 2 of the present invention.
As shown in fig. 5, square defects or small stones can be found in the concrete sample.
As shown in fig. 6, it can be seen that the glass fiber sample is affected by non-uniformity in thickness or moisture content, and that the image is non-uniform.
Effects and effects of the examples
According to the terahertz-based building material defect detection method and system related to embodiments 1 to 2, terahertz waves are emitted by a terahertz source, the terahertz waves are collimated by a first plano-convex lens and generate parallel light beams, the parallel light beams are focused by a second plano-convex lens to form point light sources, a sample is fixed on a two-dimensional displacement platform, initial pixel points are selected, the point light sources are transmitted to the initial pixel points, the two-dimensional displacement platform moves, so that continuous scanning of the terahertz waves on each pixel point of the sample is realized, the scanned terahertz waves are converted into voltage signals by a terahertz detector, the voltage signals are processed, a two-dimensional terahertz scanning intensity map of the sample is generated, and defect detection on the sample is realized. The terahertz scanning imaging technology is adopted in the process, and the method has the advantages of small ionization damage, simplicity and convenience in method, simplicity in operation, high detection speed, high accuracy and the like. Meanwhile, the terahertz-based building material defect detection system adopted by the invention has higher resolution, can detect millimeter-level defects in the building material, and quantitatively analyze the defects. In addition, the invention adopts a non-contact nondestructive testing technology, and can well protect the integrity of the detected object. And the terahertz detection system adopted by the invention has simple design, low cost, easy popularization and wide market application prospect.
The above embodiments are preferred examples of the present invention, and are not intended to limit the scope of the present invention.
Claims (4)
1. The terahertz-based building material defect detection method is characterized by comprising the following steps of:
step 1, a terahertz source emits terahertz waves;
step 2, the terahertz wave is collimated by a first plano-convex lens and generates a parallel light beam, and the parallel light beam is focused into a point light source by a second plano-convex lens;
step 3, fixing a sample on a two-dimensional displacement platform and selecting an initial pixel point, wherein the point light source transmits to the initial pixel point;
step 4, the two-dimensional displacement platform moves, so that the terahertz waves can continuously scan all pixel points of the sample;
step 5, converting the scanned terahertz waves into voltage signals through a terahertz detector;
step 6, processing the voltage signal to generate a two-dimensional terahertz scanning intensity diagram of the sample, so as to realize defect detection of the sample;
before starting detection, firstly collecting an input signal in an idle state, then placing the sample to collect an output signal, and calculating the absorbance of the sample according to the lambert-beer law:
a represents absorbance of the material, I 0 Representing the intensity (W), I of the input signal t K is the absorption coefficient and L is the sample thickness (m) for the intensity (W) of the output signal;
the terahertz source has the power range of 100-300 mW, the frequency range of 0.1-0.3 THz,
the first plano-convex lens and the second plano-convex lens are made of polytetrafluoroethylene suitable for THz frequency bands,
the terahertz detector is a photoelectric detector suitable for THz frequency bands, the effective response frequency band is 0.1-3 THz,
the terahertz source, the center of the first plano-convex lens, the center of the second plano-convex lens and the terahertz detector are all positioned at the same height, so that the optical paths are ensured to be positioned on the same straight line;
in the step 3, the sample is required to be dried and placed in a vacuum box, the two-dimensional displacement platform is driven by a control cabinet to move, and the control cabinet is controlled by a computer to work;
in the step 5, the voltage signal is recorded by a data acquisition system and transmitted to the computer;
in the step 6, the processing of the voltage signal and the generation of the two-dimensional terahertz scanning intensity diagram are realized by the computer,
in the step 6, the voltage signal is processed, signals and terahertz data are output, the terahertz data representing each pixel point are respectively expressed by different colors according to absorbance, a two-dimensional terahertz scanning intensity diagram of a building material sample is obtained, and defect detection of the sample is realized.
2. The terahertz-based building material defect detection method according to claim 1, wherein:
the diameters of the first plano-convex lens and the second plano-convex lens are 50mm, and the focal lengths are 100mm.
3. The terahertz-based building material defect detection method according to claim 1, wherein:
the two-dimensional displacement platform is arranged between the terahertz source and the terahertz detector, the stroke of the two-dimensional displacement platform is 100mm, the maximum speed is 20mm/s, and a crossed roller guide rail is adopted.
4. The terahertz-based building material defect detection method according to claim 1, wherein:
in step 4, when each pixel point of the sample is continuously scanned, the distance between two adjacent sampling pixel points is 1mm, and the single measurement time is less than 5s.
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