CN113878419B - Waveguide tube microwave transmission diagnosis and repair system and diagnosis and repair method thereof - Google Patents

Waveguide tube microwave transmission diagnosis and repair system and diagnosis and repair method thereof Download PDF

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Publication number
CN113878419B
CN113878419B CN202111453427.3A CN202111453427A CN113878419B CN 113878419 B CN113878419 B CN 113878419B CN 202111453427 A CN202111453427 A CN 202111453427A CN 113878419 B CN113878419 B CN 113878419B
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waveguide
unit
temperature
waveguide tube
control unit
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CN113878419A (en
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翟根旺
王国清
王志斌
张庆
李硕
刘延雷
杨龙
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Hebei Communications Investment Group Co ltd
Hengshui Hengfeng Yick Road Asphalt Science & Technology Co ltd
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Hebei Communications Investment Group Co ltd
Hengshui Hengfeng Yick Road Asphalt Science & Technology Co ltd
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B5/00Machines or devices designed for grinding surfaces of revolution on work, including those which also grind adjacent plane surfaces; Accessories therefor
    • B24B5/36Single-purpose machines or devices
    • B24B5/40Single-purpose machines or devices for grinding tubes internally
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B1/00Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
    • B24B1/005Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes using a magnetic polishing agent
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B31/00Machines or devices designed for polishing or abrading surfaces on work by means of tumbling apparatus or other apparatus in which the work and/or the abrasive material is loose; Accessories therefor
    • B24B31/006Machines or devices designed for polishing or abrading surfaces on work by means of tumbling apparatus or other apparatus in which the work and/or the abrasive material is loose; Accessories therefor for grinding the interior surfaces of hollow workpieces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B31/00Machines or devices designed for polishing or abrading surfaces on work by means of tumbling apparatus or other apparatus in which the work and/or the abrasive material is loose; Accessories therefor
    • B24B31/10Machines or devices designed for polishing or abrading surfaces on work by means of tumbling apparatus or other apparatus in which the work and/or the abrasive material is loose; Accessories therefor involving other means for tumbling of work
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B5/00Machines or devices designed for grinding surfaces of revolution on work, including those which also grind adjacent plane surfaces; Accessories therefor
    • B24B5/35Accessories
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B51/00Arrangements for automatic control of a series of individual steps in grinding a workpiece
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00Details of thermometers not specially adapted for particular types of thermometer
    • G01K1/02Means for indicating or recording specially adapted for thermometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K13/00Thermometers specially adapted for specific purposes

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

The invention relates to a waveguide tube microwave transmission diagnosis and repair system and a diagnosis and repair method thereof, which relate to the technical field of waveguide tube diagnosis and maintenance and comprise a detection module and a repair module, wherein the detection module comprises a temperature information acquisition unit, a singlechip control unit, a power supply unit, a cooling unit and an alarm unit; the temperature information acquisition unit is used for detecting the temperature information of the waveguide tube; the cooling unit comprises a cooler and a relay, the relay is arranged between the cooler and the singlechip control unit and is used for controlling the operation of the cooler, and the cooling unit is used for cooling the overheated waveguide tube; the alarm unit is used for carrying out overheating reminding; the single chip microcomputer control unit is used for controlling and calling each unit in the information processing and system, is in signal connection with the temperature information acquisition unit, is in control connection with the cooling unit and the alarm unit, can detect waveguide tube abnormity in time and automatically repairs the waveguide tube.

Description

Waveguide tube microwave transmission diagnosis and repair system and diagnosis and repair method thereof
Technical Field
The invention relates to the technical field of waveguide diagnosis and maintenance, in particular to a diagnosis and repair system for waveguide microwave transmission and a diagnosis and repair method thereof.
Background
The waveguide is generally formed by filling a hollow metal tube with a medium, the surface of which is generally a continuous single surface, and the hollow metal tube with different cross-sectional shapes is called the waveguide because the hollow metal tube limits and guides electromagnetic waves therein. Some characteristics of the electromagnetic wave when propagating in the waveguide require special attention, such as propagation conditions, propagation constants, propagation speed, waveguide wavelength, mode impedance, transmission power, and loss and attenuation. The requirement of small loss and high efficiency when regular waveguides transmit electromagnetic waves is ensured, and the loss and attenuation cannot be too high. In engineering practice, however, waveguides sometimes have difficulty meeting this requirement, and their losses can exceed the theoretical design values by a large amount.
The main reasons of waveguide loss are several, wherein the heat loss is one of the major influences, and because the inner surface of the waveguide is not an ideal conductor, induced current flows through the inner surface of the waveguide, so that heat loss is generated, and the heat loss mainly comes from the surface quality of the inner surface, specifically to a certain wave band, so that the main factor of waveguide loss is also related to the waveguide material, and the larger the surface resistivity of the waveguide wall is, the larger the loss is; in relation to the roughness of the inner wall of the waveguide, the worse the quality of the inner surface, the greater the transmission loss. According to the thought, various waveguide components with large loss are cut by linear cutting, and the phenomenon of solder overflow at the soldered joint is found; step burrs are found at the joint of some parts; poor roughness of the inner surface of the elbow joint and the like. The existence of the phenomenon is equivalent to poor surface roughness quality of the inner cavity of the waveguide, and is one of main reasons for influencing microwave transmission loss.
Disclosure of Invention
The invention provides a waveguide tube microwave transmission diagnosis and repair system and a diagnosis and repair method thereof, which can detect waveguide tube abnormity in time and automatically repair the waveguide tube.
The technical scheme of the invention is as follows:
a waveguide tube microwave transmission diagnosis and repair system comprises a detection module and a repair module, wherein the detection module comprises a temperature information acquisition unit, a single chip microcomputer control unit, a power supply unit, a cooling unit and an alarm unit;
the temperature information acquisition unit is used for detecting the temperature information of the waveguide tube;
the cooling unit comprises a cooler and a relay, the relay is arranged between the cooler and the single chip microcomputer control unit and used for controlling the operation of the cooler, and the cooling unit is used for cooling the overheated waveguide tube;
the alarm unit is used for carrying out overheating reminding;
the singlechip control unit is used for controlling and calling each unit in the information processing and system, is in signal connection with the temperature information acquisition unit, is in control connection with the cooling unit and the alarm unit,
and the power supply unit is in power supply connection with the system and is used for power supply support of the system.
As a further optimization of the solution, the repair module comprises a rotor unit and abrasive particles,
the rotor unit comprises a magnetic component, the rotation axis of the rotor unit is superposed with the central axis of the waveguide tube, the rotor unit is sleeved outside the waveguide tube,
the grinding particles are arranged on the inner side of the waveguide tube, are matched with the rotor unit in a magnetic manner and are used for polishing the inner wall of the waveguide tube;
the rotor unit is in control connection with the single-chip microcomputer control unit.
As a further optimization of the scheme, a sliding table is arranged outside the waveguide tube and comprises a power mechanism, the sliding table takes the axial direction of the waveguide tube as a sliding track, and the sliding table is used for bearing the detection module.
As a further optimization of the scheme, the temperature information acquisition unit comprises a plurality of temperature collectors and a signal conditioning unit,
the plurality of temperature collectors are uniformly distributed around the waveguide tube and are used for collecting the temperatures of different point positions of the waveguide tube, the signal output end of each temperature collector is connected with the single chip microcomputer control unit through the signal conditioning unit,
the signal conditioning unit is used for conditioning the electric signals output by the temperature collector and adjusting the signal intensity to a range which can be processed by the single-chip microcomputer control unit.
As a further optimization of the solution, the sliding table also carries the rotor unit, which comprises a rotating motor and a rotating track,
the rotating motor is in driving connection with the magnetic component (gear drive, screw drive),
the rotating track is sleeved outside the waveguide tube, and the magnetic part rotates along the rotating track.
As a further optimization of the scheme, a feeding device is arranged at the pipe orifice of the waveguide pipe and used for filling the grinding particles.
A waveguide tube microwave transmission diagnosis and repair method is based on a waveguide tube microwave transmission diagnosis and repair system and comprises an abnormality detection step, a preliminary processing step and a repair step;
the abnormality detection step comprises the steps that the temperature information acquisition unit detects the temperature of the waveguide tube and sends detection data to the singlechip control unit;
the preliminary treatment step comprises cooling the waveguide and alarming;
and the repairing step comprises the step that the singlechip control unit calls a repairing module to polish the inner wall of the waveguide.
As a further optimization of the scheme, the abnormality detection step includes that the sliding table is moved repeatedly along the waveguide tube at a set speed under the action of the single chip microcomputer control unit, and each temperature collector is driven by the sliding table to continuously collect the temperature of each point of the waveguide tube along the axial direction of the waveguide tube and transmit data to the single chip microcomputer control unit.
As a further optimization of the scheme, when the temperature detected in the abnormality detection step is higher than a standard threshold value, the singlechip control unit controls the cooler to be started through the relay, the temperature of the waveguide tube at the abnormal position is cooled, and the temperature of the waveguide tube is returned to the abnormality detection step to execute temperature detection after being reduced to the standard threshold value; and if the temperature of the abnormal point of the waveguide tube is not reduced to the standard threshold value through the temperature reduction treatment of the set time, closing the cooler, and starting the alarm unit to execute alarm prompt.
As a further optimization of the scheme, the repairing step includes, after the cooling unit cannot lower the temperature abnormal point to the standard threshold, executing the repairing step, sending the grinding particles to the waveguide tube through the feeding device, transmitting the grinding particles to the temperature abnormal point under the action of the magnetic part, controlling the rotation motor to drive the magnetic part to rotate by the single chip microcomputer control unit, so as to drive the grinding particles to polish the inner wall of the waveguide tube, and driving the grinding particles to be sent out by the sliding table after polishing.
The working principle and the beneficial effects of the invention are as follows:
in engineering practice, the surface roughness of the inner wall of the waveguide increases the heat loss during the transmission of the waveguide, and the influence of the surface roughness needs to be studied intensively. To study the influence of the surface roughness of the inner wall of the waveguide on the transmission loss, it is necessary to start with the surface roughness of the waveguide. At first detection module is under the drive of sliding stand, remove along the waveguide pipe repeatedly with the speed of setting for, indicate the temperature to the waveguide pipe through thermodetector and detect, when the temperature anomaly appears, the cooler work, in time cool down for the waveguide pipe, prevent that the waveguide pipe from damaging, when the cooling effect is not obvious, then explain that the waveguide pipe is inside impaired, the inner wall needs to be polished, then start the restoration module, under the effect of outside rotor unit, drive inside magnetism abrasive particle and polish the waveguide pipe inner wall, thereby realize the restoration to the waveguide pipe.
The invention realizes the automatic detection and repair of the waveguide tube, can feed back in time when an abnormality occurs, and can automatically polish the inner wall of the waveguide tube by the repair module according to the problem point.
Drawings
The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.
FIG. 1 is a block diagram of a waveguide diagnostic repair system;
fig. 2 is a flowchart of acquiring and processing abnormal waveguide temperature signals in example 2.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any inventive step, are intended to be within the scope of the present invention.
A waveguide tube microwave transmission diagnosis and repair system comprises a detection module and a repair module, wherein the detection module comprises a temperature information acquisition unit, a single chip microcomputer control unit, a power supply unit, a cooling unit and an alarm unit; the temperature information acquisition unit is used for detecting the temperature information of the waveguide tube; the cooling unit comprises a cooler and a relay, the relay is arranged between the cooler and the single chip microcomputer control unit and used for controlling the operation of the cooler, and the cooling unit is used for cooling the overheated waveguide tube; the alarm unit is used for carrying out overheating reminding; the single chip microcomputer control unit is used for controlling and calling each unit in the information processing and system, is in signal connection with the temperature information acquisition unit, is in control connection with the cooling unit and the alarm unit, and is in power supply connection with the system and used for power supply support of the system. The repairing module comprises a rotor unit and grinding particles, the rotor unit comprises a magnetic component, the rotating axis of the rotor unit is overlapped with the central axis of the waveguide tube, the rotor unit is sleeved outside the waveguide tube, the grinding particles are arranged inside the waveguide tube, the grinding particles are magnetic and matched with the rotor unit, and the grinding particles are used for polishing the inner wall of the waveguide tube; the rotor unit is in control connection with the single-chip microcomputer control unit.
The invention discloses a detection processing device for detecting abnormal heating or temperature rise caused by the fact that the surface quality of the inner wall of a waveguide tube is reduced in a waveguide transmission state, so that the inner surface resistivity of the waveguide tube is judged to be large, and therefore the loss is large.
In the specific embodiment 1, as shown in fig. 1 of the specification, the single chip microcomputer control unit performs unified control on the system, the sliding table is controlled by the single chip microcomputer control unit to move, and the single chip microcomputer controls the sliding table to perform detection along the waveguide tube. The waveguide tube is externally provided with a sliding table, the sliding table comprises a power mechanism, the sliding table takes the axial direction of the waveguide tube as a sliding track, and the sliding table is used for bearing the detection module. The power mechanism of the sliding table can be realized through a hydraulic cylinder, or can be realized through the transmission of a motor gear or a screw rod, and the like, and the sliding table is used for bearing the temperature information acquisition unit, so that the temperature information acquisition unit can dynamically acquire the temperature information of each point of the waveguide tube along the waveguide section.
The temperature information acquisition unit includes a plurality of temperature collectors and signal conditioning unit, the temperature collector, it is a plurality of the temperature collector encircles waveguide pipe evenly distributed is used for gathering the temperature of the different position of waveguide pipe, the signal output part of temperature collector passes through signal conditioning unit connects the single chip microcomputer control unit, signal conditioning unit is used for the arrangement the electricity signal that the temperature collector output to with signal intensity adjustment to the scope that single chip microcomputer control unit can handle. The temperature collector can use a temperature sensor, an infrared temperature sensor, a colorimetric thermometer, a radiation pyrometer and the like to measure the temperature of each point of the waveguide tube, and the temperature of each point of the waveguide tube can be determined by the temperature collectors, so that the accuracy of a detection result is higher. The temperature collectors are uniformly arranged along the periphery of the section of the waveguide tube and can collect the temperature of each point of one section of the waveguide tube.
The sliding table also bears the rotor unit, the rotor unit comprises a rotating motor and a rotating track, and the rotating motor is in driving connection with the magnetic component; the rotating track is sleeved outside the waveguide tube, and the magnetic part rotates along the rotating track. And a feeding device is arranged at the pipe orifice of the waveguide pipe and is used for filling the grinding particles. The rotor is provided with a magnet, and the magnet can be realized by a permanent magnet or an electromagnet.
In specific embodiment 2, a method for diagnosing and repairing waveguide microwave transmission, which is based on a system for diagnosing and repairing waveguide microwave transmission, includes an abnormality detecting step, a preliminary processing step, and a repairing step;
the abnormality detection step comprises the steps that the temperature information acquisition unit detects the temperature of the waveguide tube and sends detection data to the singlechip control unit;
the preliminary treatment step comprises cooling the waveguide and alarming;
and the repairing step comprises the step that the singlechip control unit calls a repairing module to polish the inner wall of the waveguide.
The abnormal detection step comprises that the sliding table moves along the waveguide tube repeatedly at a set speed under the action of the singlechip control unit, and each temperature collector continuously collects the temperature of each point of the waveguide tube along the axial direction of the waveguide tube under the drive of the sliding table and transmits data to the singlechip control unit.
When the temperature detected in the abnormality detection step is higher than a standard threshold value, the single chip microcomputer control unit controls the cooler to be started through the relay, the temperature of the waveguide tube at the abnormal position is reduced, and the temperature detection is executed by returning to the abnormality detection step after the temperature of the waveguide tube is reduced to the standard threshold value; and if the temperature of the abnormal point of the waveguide tube is not reduced to the standard threshold value through the temperature reduction treatment of the set time, closing the cooler, and starting the alarm unit to execute alarm prompt.
The repairing step comprises the step of executing the repairing step after the temperature abnormal point cannot be reduced to the standard threshold value by the cooling unit, grinding particles are conveyed to the waveguide tube through the feeding device, the grinding particles are transmitted to the temperature abnormal point under the action of the magnetic part, the singlechip control unit controls the rotating motor to drive the magnetic part to rotate, so that the grinding particles are driven to polish the inner wall of the waveguide tube, and the sliding table drives the grinding particles to be conveyed out of the waveguide tube after polishing.
The present invention is not limited to the above preferred embodiments, and any modifications, equivalent substitutions, improvements, etc. within the spirit and principle of the present invention should be included in the protection scope of the present invention.
In specific embodiment 3, as shown in fig. 2 of the specification, the working steps of the single chip microcomputer control unit include that the single chip microcomputer control unit reads the temperature of the insulating layer of the waveguide terminal acquired by the temperature signal acquisition system and judges, and the number of the temperature acquisition units is 8.
If 8 temperature values do not exceed the threshold value T at any time, the single chip microcomputer control unit continuously outputs low level to the alarm and the relay, and the alarm and the relay are kept in an off state.
If any value of the 8 temperature values exceeds the threshold value T at any moment and is kept for more than 1min, the single chip microcomputer control unit outputs a high level signal to the relay, the working state of the relay is switched from a disconnection mode to a conduction mode, the loop is conducted, and the direct current power supply supplies power to the 10 refrigeration pieces to enable the refrigeration pieces to start and operate. Temperature signal acquisition system lasts the collection temperature signal to transmit to single chip microcomputer control unit, when 8 temperature values all do not exceed threshold value T, then single chip microcomputer control unit output low level signal to relay, the relay disconnection, DC power supply stops the power supply:
if the duration of the high-level signal continuously sent to the relay by the single-chip microcomputer control unit reaches 2min, the single-chip microcomputer control unit stops sending the high-level signal, starts sending the low-level signal, the relay is disconnected, the direct-current power supply stops supplying power, and starts sending the high-level signal to the alarm to trigger the alarm to work.
Aiming at the signal receiving and judging of the temperature abnormity, according to the high-performance quality requirement of the variable cross-section waveguide inner wall of the microwave spark instrument, an electric slide rail is designed and arranged outside the complex clutter guide pipe, the electric slide rail comprises a connecting part of each waveguide section, the waveguide pipe is distributed in a way of dividing into two paths and four paths, and therefore the electric slide rail is also grouped and is matched with each waveguide section. Through the diagnosis and the judgment of the temperature signal, the magnetic grinding device arranged on the electric slide rail automatically transmits the signal to the specified position where the temperature is abnormal and needs to be processed through the identification of the signal, and magnetic grinding particles are injected through the preset hole at the port of the waveguide tube and are prepared by uniformly mixing aluminum oxide particles and iron particles. After the grinding particles are injected from the preset hole at the port of the waveguide tube, the grinding particles are automatically carried by the permanent magnet unit arranged outside the waveguide tube and move to the part to be processed on the inner wall of the waveguide tube together, and the precise processing of the inner surface of the waveguide tube is automatically started.
The specific operation steps are that magnetic grinding particles are injected from the inlet part of the waveguide tube, namely the zero standby position of the magnetic grinding unit, real-time position data are sent to a computer terminal through a single chip microcomputer control unit according to temperature abnormal signals, the computer terminal feeds back the position signals to a matched drive of an electric sliding rail which is programmed through received position signals (position coordinates), and therefore the magnetic grinding unit which is arranged on the sliding rail is driven to be transferred to an accurate position which needs to be machined, and the machining is started to wait. The processing parameters are based on the verified experimental processing parameters, and whether the processing effect is achieved is judged by whether the temperature of the processed inner surface is reduced to the normal temperature.
On the slide rail, a magnetic pole unit for fixing the permanent magnet is arranged outside the waveguide tube, the magnetic pole unit is connected with the magnetic poles (N pole and S pole) of the permanent magnet, and the lower part of the magnetic pole unit is connected with a circular panel (made of Q235B steel) for supporting the magnetic pole unit. An air cylinder group connected with the double-magnetic-pole unit based on adjustable magnetic pole gaps is built.
The magnetic pole processing unit body is arranged on the linear movable sliding rail, the sliding rail can bear the magnetic pole processing unit to realize precise feeding and vibration processing movement, the requirement of the error of the parallelism of the movement is controlled within 0.08mm, a complete set of control system is configured, after the temperature abnormal signal can be identified through identification, the movement track program of the sliding rail is compiled through a computer, and in addition, the feeding movement and the position state of the magnetic pole unit body can be realized through the construction of a waveform monitoring and special alarm monitoring system.
The waveguide tube is made of aluminum alloy, and a magnetic brush formed in the waveguide tube is attached to the inner surface of the aluminum waveguide tube in a copying and pressing mode to perform spiral line movement. Along with the relative motion between the waveguide tube and the magnetic abrasive, the magnetic abrasive particles have the functions of sliding, extruding, scribing, cutting and the like on the inner surface of the waveguide tube, so that the inner surface of the waveguide tube is polished. Generally, the roughness of the inner surface of the waveguide should be not more than 3.2 μm according to the national standard, but the surface roughness is greatly reduced in view of the efficiency of the waveguide to transmit waves. By adopting the processing technology, the surface roughness can be greatly reduced by diagnosing and processing the inner surface of the microwave tube in the high-power microwave equipment, and the stability, reliability and transmission power of waveguide transmission are greatly improved.
The method has the advantages that many technological parameters influencing the magnetic grinding machining effect exist for the complex structure and shape characteristics of the waveguide, great uncertainty is provided, and great research significance is provided for analyzing and determining the influence condition of each technological parameter on the machining effect. The technological parameters influencing the magnetic grinding processing effect mainly comprise: abrasive particle parameters, magnetic induction and processing time.
During the magnetic grinding process, the grinding particles of each magnetic grinding material are subjected to magnetic forces Fx and Fy along the directions of the magnetic lines and the equal magnetic bit lines to act on the inner surface of the waveguide tube.
Figure GDA0003474795730000071
Figure GDA0003474795730000072
The resultant force F is:
Figure GDA0003474795730000073
in the above formula, it can be determined that the magnitude of the magnetic force Fx, Fy acting on the magnetic abrasive during the magnetic grinding process is determined by the magnetic susceptibility of the magnetic force, the strength of the magnetic force of the magnetic field and the gradient thereof, and the volume of the magnetic particles. When the grinding particles are in the processing area in the processing process, the resultant force F of the acting force Fx and Fy pulls the grinding materials to the processing area, so that the grinding particles cannot be easily separated from the processing area and effectively act on the processing surface.
Each functional unit in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit. The integrated modules/units, if implemented in the form of software functional units and sold or used as separate products, may be stored in a computer readable storage medium. Based on such understanding, all or part of the flow in the method according to the embodiments of the present invention may also be implemented by a computer program to instruct related hardware, where the computer program may be stored in a computer readable storage medium, and when the computer program is executed by a processor, the computer program may implement the steps of the embodiments of the method. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, an executable file or some intermediate form, etc. The computer readable medium may include: any entity or device capable of carrying computer program code, recording medium, usb disk, removable hard disk, magnetic disk, optical disk, computer Memory, Read-Only Memory (ROM), Random Access Memory (RAM), electrical carrier wave signals, telecommunications signals, software distribution medium, and the like. It should be noted that the computer readable medium may contain other components which may be suitably increased or decreased as required by legislation and patent practice in jurisdictions, for example, in some jurisdictions, in accordance with legislation and patent practice, the computer readable medium does not include electrical carrier signals and telecommunications signals.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present invention, and are intended to be included within the scope of the present invention.

Claims (10)

1. The waveguide tube microwave transmission diagnosis and repair system is characterized by comprising a detection module and a repair module, wherein the detection module comprises a temperature information acquisition unit, a single chip microcomputer control unit, a power supply unit, a cooling unit and an alarm unit;
the temperature information acquisition unit is used for detecting the temperature information of the waveguide tube;
the cooling unit comprises a cooler and a relay, the relay is arranged between the cooler and the single chip microcomputer control unit and used for controlling the operation of the cooler, and the cooling unit is used for cooling the overheated waveguide tube;
the alarm unit is used for giving an alarm prompt and starting the repairing module to repair the abnormal temperature point of the waveguide tube when the cooling unit cannot reduce the temperature of the abnormal temperature point to a standard temperature threshold value;
the singlechip control unit is used for controlling and calling each unit in the information processing and system, is in signal connection with the temperature information acquisition unit, is in control connection with the cooling unit and the alarm unit,
and the power supply unit is in power supply connection with the system and is used for power supply support of the system.
2. The waveguide microwave transmitted diagnostic repair system of claim 1, wherein the repair module comprises a rotor unit and abrasive particles,
the rotor unit comprises a magnetic component, the rotation axis of the rotor unit is superposed with the central axis of the waveguide tube, the rotor unit is sleeved outside the waveguide tube,
the grinding particles are matched with the rotor unit in a magnetic manner and used for grinding the inner wall of the waveguide;
the rotor unit is in control connection with the single-chip microcomputer control unit.
3. The waveguide microwave transmission diagnosis and repair system according to claim 2, wherein a sliding table is arranged outside the waveguide, the sliding table includes a power mechanism, the sliding table uses an axial direction of the waveguide as a sliding track, and the sliding table is used for carrying the detection module.
4. The waveguide microwave transmission diagnostic repair system of claim 3, wherein the temperature information collection unit comprises a plurality of temperature collectors and signal conditioning units,
the plurality of temperature collectors are uniformly distributed around the waveguide tube and are used for collecting the temperatures of different point positions of the waveguide tube, the signal output end of each temperature collector is connected with the single chip microcomputer control unit through the signal conditioning unit,
the signal conditioning unit is used for conditioning the electric signals output by the temperature collector and adjusting the signal intensity to a range which can be processed by the single-chip microcomputer control unit.
5. The waveguide microwave delivery diagnostic repair system of claim 4, wherein the slide table further carries the rotor unit, the rotor unit including a rotating motor and a rotating track,
the rotating motor is in driving connection with the magnetic component;
the rotating track is sleeved outside the waveguide tube, and the magnetic part rotates along the rotating track.
6. The waveguide microwave delivery diagnostic repair system according to claim 5, wherein a feed device is provided at the orifice of the waveguide for filling with the abrasive particles.
7. A waveguide microwave transmission diagnosis and repair method based on the waveguide microwave transmission diagnosis and repair system of claim 6, characterized by comprising an abnormality detection step, a preliminary treatment step, and a repair step;
the abnormality detection step comprises the steps that the temperature information acquisition unit detects the temperature of the waveguide tube and sends detection data to the singlechip control unit;
the preliminary treatment step comprises cooling the waveguide and alarming;
and the repairing step comprises the step that the singlechip control unit calls a repairing module to polish the inner wall of the waveguide.
8. The waveguide tube microwave transmission diagnosis and repair method according to claim 7, wherein the abnormality detection step includes that a sliding table is repeatedly moved along the waveguide tube at a set speed under the movement of the singlechip control unit, and each temperature collector continuously collects the temperature of each point of the waveguide tube along the axial direction of the waveguide tube under the drive of the sliding table and transmits data to the singlechip control unit.
9. The waveguide microwave transmission diagnosis and repair method according to claim 8, wherein when the temperature detected in the abnormality detection step is higher than a standard threshold, the single chip microcomputer control unit controls the cooler to be started through the relay, so as to cool the waveguide temperature abnormality, and when the waveguide temperature is reduced to the standard threshold, the single chip microcomputer control unit returns to the abnormality detection step to perform temperature detection; and if the temperature of the abnormal point of the waveguide tube is not reduced to the standard threshold value through the temperature reduction treatment of the set time, closing the cooler, and starting the alarm unit to execute alarm prompt.
10. The waveguide microwave transmission diagnosis and repair method according to claim 9, wherein the repair step includes, after the cooling unit fails to lower the temperature of the temperature anomaly point to a standard threshold, performing the repair step, sending abrasive particles to the waveguide through a feeding device, the abrasive particles being transferred to the temperature anomaly point under the action of a magnetic component, the single chip microcomputer control unit controlling a rotating motor to drive the magnetic component to rotate, so as to drive the abrasive particles to polish the inner wall of the waveguide, and after polishing, the sliding table driving the abrasive particles to be sent out of the waveguide.
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