CN113630289B - Test system and test method for improving production efficiency of gateway equipment - Google Patents
Test system and test method for improving production efficiency of gateway equipment Download PDFInfo
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- 238000012360 testing method Methods 0.000 title claims abstract description 367
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 32
- 238000010998 test method Methods 0.000 title claims description 8
- 230000008878 coupling Effects 0.000 claims description 29
- 238000010168 coupling process Methods 0.000 claims description 29
- 238000005859 coupling reaction Methods 0.000 claims description 29
- 230000032683 aging Effects 0.000 claims description 24
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- 239000003990 capacitor Substances 0.000 claims description 3
- 230000008054 signal transmission Effects 0.000 abstract description 3
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/50—Testing arrangements
Abstract
A test system for improving production efficiency of gateway equipment comprises: the system comprises a circuit control module and a plurality of identical test modules, wherein the test modules are used for testing corresponding gateway equipment, and the circuit control module is used for receiving any test module signal and powering on and powering off the gateway equipment which is tested correspondingly by the test modules; the circuit control module comprises signal processing units and a plurality of switch units, the number of which is equal to that of the test modules, the output ends of the switch units are connected with the gateway equipment, the control ends of the switch units are connected with the signal output ends of the signal processing units, and the control circuit is used for controlling the switch to turn on and off the gateway equipment, so that the production efficiency can be effectively improved compared with the manual on and off of the power, and the labor cost is reduced; the control circuit greatly shortens the connection time through signal transmission between the control circuit and the test module, further improves the production efficiency and reduces the labor cost.
Description
Technical Field
The invention relates to the technical field of communication, in particular to a test system and a test method for improving production efficiency of gateway equipment.
Background
Gateway devices are also known as gateway connectors, protocol converters. The gateway realizes network interconnection above a network layer, is complex network interconnection equipment, is only used for network interconnection of two high-level protocols, and plays an important role in the technical field of communication. In order to provide a high-quality gateway device for the market, the test of the gateway device is also a complex and complex procedure, and the continuous power on/off of the gateway device is required in the test process, and the power on/off needs manual work, so that the production efficiency of the gateway product is reduced, the manpower resource is wasted, and the problem of how to improve the production efficiency of the gateway device on the premise of ensuring the quality of the gateway device is an urgent need to be solved.
Disclosure of Invention
Purpose of (one) application
Therefore, the present invention is directed to a test system and a test method for improving the production efficiency of a gateway device, which are used for shortening the test time and improving the production efficiency of the gateway device.
(II) technical scheme
The application discloses promote gateway equipment production efficiency's test system includes: the circuit control module is used for receiving any test module signal and powering on and powering off the gateway equipment tested correspondingly by the test module;
the test module comprises an electrifying aging test unit, an LED and key test unit, a parameter test unit, a coupling test unit and a WIFI test unit, wherein the electrifying aging test unit, the LED and key test unit, the parameter test unit, the coupling test unit and the WIFI test unit are all used for testing corresponding gateway equipment according to a test sequence;
the circuit control module comprises signal processing units and a plurality of switch units, the number of the switch units is equal to that of the test modules, the signal processing units are provided with signal input ends and signal output ends, the signal input ends are used for receiving signals of any test module, the signal output ends are used for being respectively connected with a plurality of identical switch units, the switch units comprise control ends, input ends and output ends, the switch unit input ends are all used for being connected with a power supply, the switch unit output ends are all used for being connected with gateway equipment, and the switch unit control ends are all connected with the signal output ends of the signal processing units.
In one possible implementation manner, the signal processing unit comprises an SOC chip with a signal receiving end and a signal output end, and the SOC chip receives a signal from the test module through the signal receiving end and outputs a signal through the output end to control the on-off of the switch unit.
In one possible implementation manner, the switching unit comprises a triode and a MOS transistor, the base electrode of the triode is connected with the signal output end of the signal processing unit, the collector electrode of the triode is connected with the gate electrode of the MOS transistor, and the source electrode and the drain electrode of the MOS transistor are respectively connected with the power supply and the gateway device.
In one possible implementation manner, a bypass capacitor is arranged on a connection line between the drain electrode of the MOS tube and the gateway equipment.
In one possible embodiment, the plurality of switching units and the signal processing unit are packaged on the same circuit board.
In one possible implementation manner, the test module signal includes a power-off signal sent by the power-on aging test unit after the test is completed, a power-off signal sent by the LED and key test unit after the test is completed, a power-off signal sent by the parameter test unit after the test is completed, a power-off signal sent by the coupling test unit after the test is completed, and a power-off signal sent by the WIFI test unit after the test is completed.
In one possible implementation manner, the test module signal includes a power-off signal sent by the power-on aging test unit after the test is completed, a power-off signal sent by the LED and key test unit after the test is completed, a power-off signal sent by the parameter test unit after the test is completed, a power-off signal sent by the coupling test unit after the test is completed, and a power-off signal sent by the WIFI test unit after the test is completed.
In one possible implementation, after any unit in the test module is tested and signals, the next unit is tested by switching according to a preset sequence.
In one possible implementation manner, after any unit in the test module completes the test and sends out a signal, the circuit control module receives the signal of the test module and powers off the gateway device corresponding to the test by the test module, and the circuit control module automatically powers on the gateway device corresponding to the test before the next unit test is performed by switching according to the preset sequence.
In one possible implementation manner, the plurality of test modules are disposed at the same PC test end.
As a second aspect of the present application, there is further provided a test method for improving production efficiency of a gateway device: the method comprises the following steps:
s1, correspondingly connecting a circuit control module, a test module, a power supply and gateway equipment to be tested, and enabling the circuit control module, the test module and the gateway equipment to be tested to be in an electrified state.
S2, starting a test module electrifying aging test unit to test the gateway equipment to be tested, electrifying the gateway equipment to be tested according to preset time and preset electrifying voltage after the electrifying aging test unit confirms communication with the corresponding gateway equipment to be tested, sending a power-off signal to a signal processing unit and switching the power-off signal to an LED and key test unit after the electrifying aging test unit finishes the test, powering off the corresponding gateway equipment to be tested after the signal processing unit receives the power-off signal of the electrifying aging test unit, and electrifying the corresponding gateway equipment to be tested in an interval time;
s3, starting a testing module LED and a key testing unit to test whether keys and LED indicator lamps on the gateway equipment to be tested can work normally, after the LED and key testing unit completes testing, sending a power-off signal to a signal processing unit by the LED and key testing unit and switching the power-off signal to a parameter testing unit, powering off the corresponding gateway equipment to be tested after the signal processing unit receives the power-off signal of the LED and key testing unit, and powering on the corresponding gateway equipment to be tested in an interval time;
s4, starting a parameter testing unit of the testing module to write parameters into the gateway equipment to be tested and test the gateway equipment, after the parameter testing unit finishes testing, sending a power-off signal to the signal processing unit by the parameter testing unit, switching the power-off signal to the coupling testing unit, powering off the corresponding gateway equipment to be tested after the signal processing unit receives the power-off signal of the parameter testing unit, and powering on the corresponding gateway equipment to be tested in an interval time;
s5, starting a test module coupling test unit to test the antenna power of the gateway equipment to be tested, after the coupling test unit finishes testing, sending a power-off signal to the signal processing unit by the coupling test unit and switching to the WIFI test unit, and powering off the corresponding gateway equipment to be tested after the signal processing unit receives the power-off signal of the coupling test unit and powering on the corresponding gateway equipment to be tested in an interval time;
s6, starting a WIFI testing unit of a testing module to calibrate and test the WIFI module of the gateway equipment to be tested, after the WIFI testing unit finishes testing, sending a power-off signal to a signal processing unit by the WIFI testing unit, powering off the corresponding gateway equipment to be tested after the signal processing unit receives the power-off signal of the WIFI testing unit, and powering on the corresponding gateway equipment to be tested in an interval time;
s7, manually checking to confirm that the gateway equipment to be tested is separated from the circuit control module, the testing module and the power supply after all the tests are completed.
(III) beneficial effects
According to the test system for improving the production efficiency of the gateway equipment, the test unit included by the test module is used for testing the gateway equipment to be tested, and the necessary part of the gateway equipment is tested on the premise of ensuring the quality, so that the production efficiency is improved; the control circuit controls the switch to turn on and off the gateway equipment, so that the production efficiency can be effectively improved and the labor cost can be reduced compared with the manual on and off of the gateway equipment; the connection time is greatly shortened through signal transmission between the control circuit and the test module, the production efficiency is further improved, and the labor cost is reduced; the signal processing units are arranged between the plurality of test modules and the corresponding control switches, so that signals of different test modules can be distinguished at the same time, and the plurality of gateway devices of the plurality of control switches can be powered on and off through one signal processing unit at the same time, so that the production efficiency is further improved, and the production cost is also reduced.
Additional advantages, objects, and features of the invention will be set forth in part in the description which follows and in part will become apparent to those having ordinary skill in the art upon examination of the following or may be learned from practice of the invention.
Drawings
FIG. 1 is a system diagram of the present invention;
FIG. 2 is a system diagram of a control circuit module of the present invention;
FIG. 3 is a circuit diagram of a first switching unit of the present invention;
fig. 4 is a test flow chart of the present invention.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments of the present invention. The components of the embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the invention, as presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further definition or explanation thereof is necessary in the following figures.
Referring to fig. 1, the application discloses a specific embodiment of a test system for improving production efficiency of gateway devices, including: the circuit control module is used for testing the corresponding gateway equipment, namely one test module is used for correspondingly testing one gateway equipment in the test process, namely the first test module to the eighth test module in the figure 1 are respectively corresponding to the first to eighth gateway equipment to be tested, and the circuit control module is used for receiving any test module signal and powering on and powering off the gateway equipment correspondingly tested by the test module;
the test module comprises an electrifying aging test unit, an LED and key test unit, a writing parameter test unit, a coupling test unit and a WIFI test unit, wherein the electrifying aging test unit is used for carrying out electrifying aging test on gateway equipment to be tested so as to ensure safe use, the LED and key test unit is used for testing whether keys and LED indicator lamps on the gateway equipment to be tested can work normally, the parameter test unit is used for writing parameters into the gateway equipment to be tested and testing the gateway equipment to be tested, the coupling test unit is used for testing antenna power of the gateway equipment to be tested, and the WIFI test unit is used for calibrating a WIFI module of the gateway equipment to be tested.
The power-on aging test unit, the LED and key test unit, the parameter test unit, the coupling test unit and the WIFI test unit are used for testing corresponding gateway equipment to be tested according to the test sequence, wherein the test sequence is that firstly, the power-on aging test unit is used for testing the equipment to be tested, a power supply is communicated with the gateway equipment to be tested, the power-on test is carried out on the gateway equipment to be tested according to the preset time and the preset power-on voltage, then, the LED indicator lamp and the key of the gateway equipment to be tested are tested for the LED and key test unit, the LED indicator lamp and the key are tested through calling a callback function, secondly, the parameter test unit is used for writing parameters into the gateway equipment to be tested and testing the gateway equipment to be tested, the coupling test unit is used for testing antenna power of the gateway equipment to be tested, and finally, the WIFI test unit is used for calibrating the WIFI module of the gateway equipment to be tested.
The test module signals comprise power-off signals sent after the power-on aging test unit is tested, power-off signals sent after the LED and key test unit is tested, power-off signals sent after the parameter test unit is tested, power-off signals sent after the coupling test unit is tested and power-off signals sent after the WIFI test unit is tested; when the test of any unit in the test module is finished and the power-off signal is sent out, the test unit in the test module is switched according to the test sequence to carry out the next unit test, and in the test process, when the test of any unit in the test module is finished and the power-off signal is sent out, the circuit control module receives the test module signal and powers off the gateway equipment which is correspondingly tested by the test module, and before the next unit test is carried out according to the preset sequence, the circuit control module carries out automatic power-on the gateway equipment which is correspondingly tested, and the test unit or the test module is not required to send power-on signals to the circuit control module.
The circuit control module comprises a signal processing unit and a plurality of switch units, namely first to eighth switch units, the number of the switch units is equal to that of the test modules, the signal processing unit is provided with a signal input end and a signal output end, the signal input end is used for receiving signals of any test module, the signal output end is used for being respectively connected with the same switch units, the switch units comprise control ends, input ends and output ends, the switch unit input ends are all used for being connected with a power supply, the switch unit output ends are all used for being connected with gateway equipment, the switch unit control ends are all connected with the signal output ends of the signal processing unit, the circuit control module receives signals of the test modules and is not limited to time-sharing receiving and simultaneous receiving, and the circuit control module only needs to correspondingly feed signals sent by the test modules back to the gateway equipment correspondingly tested by the test modules.
Compared with the prior art, the gateway equipment is only required to be respectively communicated with the test module and the circuit control module in the initial stage of the test, and the control circuit controls the switch to turn on and off the gateway equipment in the middle process of the test, so that compared with the situation that the power connector is manually pulled out for turning on and off the power connector every time in the test process, the production efficiency can be effectively improved, and the labor cost is reduced; the connection time is greatly shortened through signal transmission between the control circuit and the test module, the production efficiency is further improved, and the labor cost is reduced; the signal processing units are arranged between the plurality of test modules and the corresponding control switches, so that signals of different test modules can be distinguished at the same time, and the plurality of gateway devices of the plurality of control switches can be powered on and off through one signal processing unit at the same time, so that the production efficiency is further improved, and the production cost is also reduced.
As shown in fig. 2-3, the signal processing unit includes an SOC chip having a signal receiving end and a signal output end, the SOC chip receives a signal from a test module through the signal receiving end and outputs a signal to control on/off of the switch unit through the output end, the switch unit includes a transistor and a MOS transistor, a base electrode of the transistor is connected with the signal output end of the signal processing unit, a collector electrode of the transistor is connected with a gate electrode of the MOS transistor, a source electrode and a drain electrode of the MOS transistor are respectively connected with a power supply and a gateway device, the MOS transistor plays a role of a switch in the circuit, the transistor is used for controlling the gate voltage of the MOS transistor, when the SOC chip receives a signal of any test device, the SOC chip output end correspondingly outputs a high level or a low level to the switch unit corresponding to the test device, and when the high level or the low level is amplified by the transistor, the gate voltage of the MOS transistor is changed to turn on or off the MOS transistor. In this embodiment, a bypass capacitor is disposed on the connection line between the drain of the MOS transistor and the gateway device, and is used to filter out high-frequency current. In order to integrate the test, in this embodiment, the plurality of switch units and the signal processing unit are packaged on the same circuit board, in the test process, when any unit in the test module completes the test and sends out a power-off signal, the circuit control module receives the test module signal and powers off the gateway device corresponding to the test by the test module, and before the next unit test is performed according to the preset sequence, the circuit control module automatically powers on the gateway device corresponding to the test, the test unit or the test module is not required to send a power-on signal to the circuit control module, and under the control of the SOC chip, the power-off power-on time interval can be controlled within an extremely short time, and the time interval of power-on after the power-off of the MOS transistor can be controlled by time setting.
In this embodiment, the plurality of test modules are disposed at the same PC test terminal.
Based on the above system, the embodiment of the invention also provides a test method for improving the production efficiency of the gateway device, as shown in fig. 4, the test method comprises the following steps:
s1, correspondingly connecting a circuit control module, a test module, a power supply and gateway equipment to be tested, and enabling the circuit control module, the test module and the gateway equipment to be tested to be in an electrified state, wherein the test module is connected with the gateway equipment to be tested, a signal processing unit in the circuit control module is connected with the test module, and a switch control unit in the circuit control module is respectively connected with the power supply and the gateway equipment to be tested.
S2, starting a test module to electrify and age a test unit to test gateway equipment to be tested, after the test module confirms that the test module is communicated with the corresponding equipment to be tested, electrifying the gateway equipment to be tested according to preset time and preset electrifying voltage, wherein the preset time is set according to the quantity of mass production, the preset electrifying voltage is set to 11.5V-12V, after the test of the electrifying and aging test unit is completed, the electrifying and aging test unit sends a power-off signal to a signal processing unit and switches the power-off signal to an LED and key test unit, and the signal processing unit receives the power-off signal of the electrifying and aging test unit and then cuts off power of the corresponding gateway equipment to be tested and electrifies the corresponding gateway equipment to be tested in interval time;
s3, starting a testing module LED and a key testing unit to test whether keys and LED indicator lamps on gateway equipment to be tested can work normally, after the LED and key testing unit finishes testing, the LED and key testing unit sends a power-off signal to a signal processing unit and switches to a parameter testing unit, the signal processing unit receives the power-off signal of the LED and key testing unit and then powers off the corresponding gateway equipment to be tested, and powers on the corresponding gateway equipment to be tested in an interval time, and the specific testing steps of the LED and key testing unit for testing the gateway equipment to be tested are as follows: s31, acquiring mutual exclusion locks, when a plurality of gateway devices to be tested carry out normal operation tests on keys and LED indicator lamps on the gateway devices to be tested, enabling the gateway devices to be tested to firstly carry out the tests, S32, calling a callback function to execute an instruction of opening/closing the LED indicator lamps, S33, calling the callback function to carry out the key tests, S34, acquiring key test results to judge whether the key test results pass the tests, S35, releasing the mutual exclusion locks of the gateway devices to be tested passing the tests when the key LED indicator lamps pass the tests, and completing the LED and key test unit tests.
S4, starting a testing module parameter testing unit to write parameters into gateway equipment to be tested and test the gateway equipment, after the parameter testing unit finishes testing, sending a power-off signal to a signal processing unit by the parameter testing unit and switching the power-off signal to a coupling testing unit, powering off the corresponding gateway equipment to be tested after the signal processing unit receives the power-off signal of the parameter testing unit, and powering on the corresponding gateway equipment to be tested in an interval time, wherein the specific steps of the parameter testing unit for testing the gateway equipment to be tested are as follows: s41, reading a parameter command to be written, S42, writing the parameter command into gateway equipment to be tested, S43, judging whether the result is written successfully according to the return value when writing, and if so, completing the test of the parameter test unit;
s5, starting a test module coupling test unit to test the antenna power of the gateway equipment to be tested, after the coupling test unit finishes testing, sending a power-off signal to a signal processing unit by the coupling test unit and switching the power-off signal to a WIFI test unit, powering off the corresponding gateway equipment to be tested after the signal processing unit receives the power-off signal of the coupling test unit, and powering on the corresponding gateway equipment to be tested in an interval time, wherein the specific steps of the coupling test unit for testing the gateway equipment to be tested are as follows: s51, acquiring an antenna power value by taking the longitudinal default, S52, judging whether the antenna power value is in a preset range, and if so, completing the test of the coupling test unit;
s6, starting a WIFI test unit of a test module to calibrate and test a WIFI module of gateway equipment to be tested, after the WIFI test unit finishes testing, sending a power-off signal to a signal processing unit by the WIFI test unit, powering off corresponding gateway equipment to be tested after the signal processing unit receives the power-off signal of the WIFI test unit, and powering on the corresponding gateway equipment to be tested in an interval time, wherein the specific steps of testing the gateway equipment to be tested by the WIFI test unit are as follows: s61, acquiring an antenna power value by using an ideal DAC value, wherein the antenna power value is the antenna power value in a preset range after coupling test, S61, confirming whether the antenna power value acquired by the ideal DAC value is in the preset range, S63, if the antenna power value acquired by the ideal DAC value is not in the preset range, adjusting the ideal DAC value in a specified range to enable the antenna power value to be in the preset range, storing the adjusted ideal DAC value in a data pool, if the antenna power value acquired by the ideal DAC value is in the preset range, directly storing the ideal DAC value in the data pool, and obtaining a slope value through a slope calculation function to finish testing of a WIFI test unit.
S7, manually checking to confirm that the gateway equipment to be tested is separated from the circuit control module, the testing module and the power supply after all the tests are completed.
The foregoing is merely specific embodiments of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions easily conceivable by those skilled in the art within the technical scope of the present application should be covered in the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (7)
1. A test system for improving production efficiency of gateway equipment, comprising: the system comprises a circuit control module and a plurality of identical test modules, wherein the test modules are used for testing corresponding gateway equipment, and the circuit control module is used for receiving any test module signal and powering on and powering off the gateway equipment which is tested correspondingly by the test modules;
the test module comprises an electrifying aging test unit, an LED and key test unit, a parameter test unit, a coupling test unit and a WIFI test unit, wherein the electrifying aging test unit, the LED and key test unit, the parameter test unit, the coupling test unit and the WIFI test unit are all used for testing corresponding gateway equipment according to a test sequence; when any unit in the test module is tested and signals are sent out, switching according to the test sequence to carry out the next unit test; when any unit in the test module is tested and sends out a signal, the circuit control module receives the signal which is tested and sent out and cuts off the power of the gateway equipment which is tested correspondingly by the test module, and before the next unit test is switched according to the test sequence, the circuit control module automatically cuts on the power of the gateway equipment which is tested correspondingly;
the test module signals comprise a power-off signal sent by the power-on aging test unit after the test is finished, a power-off signal sent by the LED and key test unit after the test is finished, a power-off signal sent by the parameter test unit after the test is finished, a power-off signal sent by the coupling test unit after the test is finished and a power-off signal sent by the WIFI test unit after the test is finished;
the circuit control module comprises signal processing units and a plurality of same switch units, wherein the number of the same switch units is equal to that of the test modules, the signal processing units are provided with signal input ends and signal output ends, the signal input ends are used for receiving signals of any test module, the signal output ends are respectively connected with the same switch units, the switch units comprise control ends, input ends and output ends, the switch unit input ends are all used for being connected with a power supply, the switch unit output ends are all used for being connected with gateway equipment, and the switch unit control ends are all connected with the signal output ends of the signal processing units.
2. The system for improving production efficiency of gateway equipment according to claim 1, wherein the signal processing unit comprises an SOC chip having a signal receiving end and a signal output end, the SOC chip receives a signal from the test module through the signal receiving end and outputs the signal through the signal output end to control on-off of the switch unit.
3. The test system for improving production efficiency of gateway equipment according to claim 2, wherein the switch unit comprises a triode and a MOS tube, the base electrode of the triode is connected with the signal output end of the signal processing unit, the collector electrode of the triode is connected with the grid electrode of the MOS tube, and the source electrode and the drain electrode of the MOS tube are respectively connected with a power supply and the gateway equipment.
4. The test system for improving production efficiency of gateway equipment according to claim 3, wherein a bypass capacitor is arranged on a connection line between the drain of the MOS tube and the gateway equipment.
5. The test system for improving production efficiency of gateway equipment according to claim 2, wherein the plurality of switch units and the signal processing unit are packaged on the same circuit board.
6. The test system for improving production efficiency of gateway equipment according to claim 1, wherein the plurality of test modules are disposed at a same PC test terminal.
7. A test method for improving production efficiency of gateway equipment comprises the following steps: the method is characterized by comprising the following steps of:
s1, correspondingly connecting a circuit control module, a plurality of identical test modules, a power supply and gateway equipment to be tested, and enabling the circuit control module, the plurality of identical test modules and the gateway equipment to be tested to be in an electrified state;
s2, starting an electrifying aging test unit of a plurality of identical test modules to test gateway equipment to be tested, after the electrifying aging test unit confirms that the gateway equipment to be tested is connected with the corresponding gateway equipment to be tested, electrifying the gateway equipment to be tested according to preset time and preset electrifying voltage, after the electrifying aging test unit finishes the test, sending a power-off signal to a signal processing unit of a circuit control module and switching the power-off signal to an LED and key test unit, and after the signal processing unit of the circuit control module receives the power-off signal of the electrifying aging test unit, powering off the corresponding gateway equipment to be tested, and electrifying the corresponding gateway equipment to be tested in interval time;
s3, starting a plurality of LED and key test units of the same test module to test whether keys and LED indicator lamps on the gateway equipment to be tested can work normally, after the LED and key test units finish testing, sending power-off signals to signal processing units of the circuit control module by the LED and key test units and switching the power-off signals to parameter test units, powering off the corresponding gateway equipment to be tested after the power-off signals of the LED and key test units are received by the signal processing units of the circuit control module, and powering on the corresponding gateway equipment to be tested in interval time;
s4, starting parameter test units of a plurality of identical test modules to write parameters into gateway equipment to be tested and test the gateway equipment, after the parameter test units finish testing, sending power-off signals to signal processing units of the circuit control modules by the parameter test units and switching the power-off signals to the coupling test units, powering off the corresponding gateway equipment to be tested after the signal processing units of the circuit control modules receive the power-off signals of the parameter test units, and powering on the corresponding gateway equipment to be tested in interval time;
s5, starting a plurality of coupling test units of the same test module to test the antenna power of the gateway equipment to be tested, after the coupling test unit finishes testing, sending a power-off signal to a signal processing unit of the circuit control module and switching to the WIFI test unit, and after the signal processing unit of the circuit control module receives the power-off signal of the coupling test unit, powering off the corresponding gateway equipment to be tested and powering on the corresponding gateway equipment to be tested in an interval time;
s6, starting WIFI test units of a plurality of identical test modules to calibrate and test the WIFI modules of the gateway equipment to be tested, after the WIFI test units finish testing, sending power-off signals to signal processing units of the circuit control modules by the WIFI test units, powering off the corresponding gateway equipment to be tested after the signal processing units of the circuit control modules receive the power-off signals of the WIFI test units, and powering on the corresponding gateway equipment to be tested in interval time;
s7, manually checking to confirm that the gateway equipment to be tested is separated from the circuit control module, the power supply and the test module connected with the gateway equipment to be tested after all the tests are completed.
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