CN110459260B - Automatic test switching device, method and system - Google Patents
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- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Abstract
The application relates to the field of hardware testing, and provides an automatic testing switching device, a method and a system, wherein the automatic testing method tests a storage device by using a self-starting testing module in a testing terminal, the testing terminal comprises a plurality of self-starting testing modules, and the method comprises the following steps: the configuration switching device can automatically generate a switching instruction input to the test terminal in a state of being connected to the test terminal; connecting the switching device to the test terminal to input a switching instruction to the test terminal; and executing the switching of the self-starting test module according to the input switching instruction. According to the obtained switching instruction generated by the automatic switching device, the test terminal can implement automatic switching without manual control of an external input device by an operator.
Description
Technical Field
The invention relates to the field of hardware testing, in particular to an automatic testing switching device, method and system.
Background
The memory or the hard disk storage device needs to be subjected to performance testing in the production and manufacturing process, and at present, the memory or the hard disk is generally inserted into a computer mainboard and is tested by running a testing module on a computer.
However, in the actual testing process, a memory or a hard disk usually needs to be tested in multiple items, but after an operating system of the existing testing terminal is started, only an appointed self-starting testing module can be automatically operated, or two or more appointed testing modules can be operated at the same time, and the problem of obvious performance interference exists in the simultaneous operation of the testing modules, which is obviously not feasible. The mouse or the keyboard needs to be manually operated each time, and the operation is complicated.
And the computer needs to be restarted once every time one memory is tested. The computer needs time to restart to enter the computer operating system, manual waiting is needed in the time, after the computer is waited to enter the operating system, the testing module is manually selected through a mouse or a keyboard, and the waiting process wastes time and labor.
Disclosure of Invention
In order to solve the technical problem that automatic switching cannot be realized in the prior art, so that the labor cost is high, the application provides an automatic test switching device, method and system.
In a first aspect, the present application provides an automatic test method for testing a storage device with a self-starting test module in a test terminal, where the test terminal includes a plurality of self-starting test modules, including:
the configuration switching device can automatically generate a switching instruction input to the test terminal in a state of being connected to the test terminal;
connecting the switching device to the test terminal to input a switching instruction to the test terminal;
and executing the switching of the self-starting test module according to the input switching instruction.
In the method provided by the embodiment of the application, the configuration switching device can automatically generate a switching instruction input to the test terminal in a state of being connected to the test terminal; the method comprises the following steps:
configuring the test terminal to recognize a level signal of a designated pin as a switching instruction;
and configuring a starting module positioned at the test terminal, wherein the starting module executes the switching of the self-starting test module according to the input switching instruction.
In the method provided in the embodiment of the present application, the connecting the switching device to the test terminal to input a switching instruction to the test terminal includes:
the switching device is connected to the test terminal through a data interface;
the potential pin of the data interface is connected to a high level;
the potential pin conducts the potential to the state pin of the data interface in a unidirectional mode through a unidirectional conduction circuit;
thereby inputting the switching instruction to the test terminal.
In the method provided by the embodiment of the present application, the executing the switching of the self-starting test module according to the input switching instruction includes:
the starting module detects the data state of the data interface;
if a switching instruction input by a switching device is detected, starting a test module corresponding to the switching instruction for testing;
if the switching instruction input by the switching device is not detected, starting a preset test module for testing;
and the test module corresponding to the switching instruction is different from the preset test module.
In the method provided by the embodiment of the present application, the executing the switching of the self-starting test module according to the input switching instruction includes:
closing the self-starting test module which is currently operated;
and opening the next self-starting test module to be started for testing.
According to the method provided by the embodiment of the application, the switching device is connected to the test terminal through the serial interface, the communication control for controlling the serial interface is configured in the test terminal, and the communication control is connected to the task manager of the test terminal so as to control the task manager to close and start the self-starting test module.
Another aspect of the present application provides a switching device for automatic testing, the switching device includes a data interface and an input circuit, the data interface includes a status pin and a potential pin; the input circuit is connected between a potential pin and the state pin and used for conducting a potential from the potential pin to the state pin in a single direction so as to generate the switching instruction.
In the device provided by the embodiment of the application, the data interface is a serial interface, wherein the DCD pin is a status pin, and the DTR pin is a potential pin.
According to the device provided by the embodiment of the application, the data interface comprises a plug-in side used for being plugged in a serial port female seat and a lead side used for welding a lead, and the input circuit is connected to the state pin and the potential pin on the lead side of the data interface.
In the device provided by the embodiment of the application, the input circuit comprises a resistor and a diode, and the conducting direction of the diode is connected with one end of the potential pin in a pointing manner and is connected with one end of the state pin.
Another aspect of the present application provides an automatic test system for testing a storage device, the automatic test system including a test terminal and the switching device as described above, wherein: the testing terminal comprises a communication module, a task management module and a plurality of self-starting testing modules, wherein the communication module is connected with the switching device, the other end of the communication module is connected with the task management module, the switching device inputs a switching instruction to the task management module through the communication module, and the task management module switches the self-starting testing modules according to the switching instruction.
In the system provided by the embodiment of the application, the test terminal has a data interface seat for connecting to the switching device, the switching device is inserted into the data interface seat to establish signal connection, and a potential pin in the data interface seat is set to a high level.
Compared with the prior art, the technical scheme provided by the embodiment of the application has the following advantages:
compared with the method for completing the test by manual switching in the prior art, the test terminal in the embodiment of the application uses the automatic switching device, so that when the test module needs to be switched, the test terminal can implement automatic switching according to the switching instruction generated by the obtained automatic switching device, the manual control of an external input device is not needed by an operator, the operator does not need to wait for starting or detecting program operation, the time of the operator can be saved during large-scale test on a production line, the labor is reduced, and the production cost is saved.
On the other hand, because the startup self-starting test module is adopted for automatic test and the switching device is accessed for automatic switching, after the storage device to be tested is accessed into the test terminal by an operator, the storage device can leave after the test terminal is restarted, and the test process of one storage device does not need to be attended by the operator any more.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description, serve to explain the principles of the invention.
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without inventive exercise.
Fig. 1 is a schematic flow chart of an automatic testing method according to an embodiment of the present disclosure.
Fig. 2 is a flowchart illustrating preparation steps of an automatic testing method according to an embodiment of the present disclosure.
Fig. 3 is a flowchart illustrating a switching step of an automatic test method according to an embodiment of the present disclosure.
Fig. 4 is a schematic structural diagram of a switching device according to an embodiment of the present application.
Fig. 5 is a schematic structural diagram of a test terminal in a test system according to an embodiment of the present application.
Fig. 6 is a schematic structural diagram of another switching device according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application. In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
In order to solve the technical problem of wasting time and labor in the prior art, an embodiment of the present application provides an automatic testing method, in which a self-starting testing module in a testing terminal is used to test a storage device, the testing terminal includes a plurality of testing modules capable of being self-started, and fig. 1 is a schematic flow diagram of the automatic testing method provided in the embodiment of the present application. Referring to fig. 1, the automatic testing method provided by this embodiment mainly includes the steps of:
s101, configuring an external switching device, so that the switching device can automatically generate a switching instruction input to a test terminal in a state of being connected to the test terminal; it is understood by those skilled in the art that the switching device can be selected from various devices capable of being connected to the test terminal through a peripheral interface, such as a Universal Serial Bus (USB), a parallel interface (Centronics), or a serial interface (COM), and the switching device can be configured in multiple types to input different switching commands, respectively, and is not limited thereto.
S102, connecting the switching device to the test terminal to input a switching instruction to the test terminal; that is to say the switching device is connected to the test terminal via a data interface on the adapted test terminal. In one embodiment, the test terminal may be inserted into the switching device before booting after accessing the storage device to be tested, so that the boot module for testing may detect the switching instruction after booting and entering the operating system. Certainly, in another embodiment, it may also be selected to allow the insertion of the switching device to perform the switching instruction input in the test running state, and it may be understood that a corresponding preset is configured on the test starting module of the test terminal, for example, a control flow for performing sequential switching among a plurality of test modules according to one switching instruction is configured; or, only carrying out the setting of the test of the appointed test module according to the condition that the signal of the switching device is not detected; alternatively, the setting of the test of a specific test module is performed according to the detection of a signal of a switching device. And the open time of the data interface communication is controlled to be before the operation of the test module or after the operation is finished.
And S103, the test terminal executes the switching of the self-starting test module according to the input switching instruction, that is, the corresponding test module can be started for testing according to the switching instruction, or a preset test module is started for testing according to a signal of which the switching instruction is not detected. On the other hand, in the running state of the test module, after the test of one test module is completed, the data interface communication module is started to detect the switching instruction, and after the switching instruction is detected, the currently running test program is closed, and the next test module is started to test the storage device. It can be understood that, after receiving the input instruction, the test terminal may control the corresponding operation module to close and call a new module to open according to the preset, which is implemented by many ways for those skilled in the art, for example, by a task manager based on an operation system, or by writing a corresponding switch control in the test program.
It should be understood that the storage device in the embodiments refers to a memory, a hard disk or a similar data storage device.
It is understood that, in the foregoing embodiment, the switching device is inserted into the test terminal before the power is turned on, so as to complete the input of the switching command, so that the operator can determine whether to insert the switching device according to needs after the test terminal is connected to the storage device, and then leave the test terminal without waiting for the start of the operating system. That is, it can be considered that the test mode of a memory device to be tested is determined by whether or not the switching device is inserted, or which switching device is inserted. Therefore, a special switching device can be configured for each storage device to be tested along a production line, or a switching device is not configured for a specified storage device according to the presetting (corresponding test mode is configured correspondingly), so that the test mode can be accurately and quickly switched for different storage devices to be tested. And in this way the switching means can be selected for streaming reuse.
Fig. 2 is a flowchart illustrating preparation steps of an automatic testing method according to an embodiment of the present disclosure. In the method provided in the embodiment of the present application, in the step of configuring the switching device, the method may specifically include:
s201, configuring a test terminal as a switching instruction according to a level signal of a designated pin; wherein, the step of configuring the test terminal at least comprises: and starting a corresponding data interface in the test terminal to receive the switching instruction, and configuring a corresponding communication module so as to transmit the instruction to the task management module or the test module through the bus after receiving the instruction. The communication module is, for example, an MSComm control adapted for a serial interface.
S202, a starting module located at the test terminal is configured, and the starting module executes the switching of the self-starting test module according to the input switching instruction. The starting module can be a task manager, and can also be a similar control to realize the closing and opening of the test module.
Fig. 3 is a flowchart illustrating a switching step of an automatic test method according to an embodiment of the present disclosure. In the method provided in the embodiment of the present application, connecting the switching device to the test terminal to input the switching instruction to the test terminal includes:
s301, connecting the switching device to the test terminal through the data interface.
S302, connecting a potential pin of a data interface to be a high level; this may be implemented according to a preset of the communication module, and the communication module may be set to output a high level signal to the potential pin in the preset.
S303, the potential pin can conduct the potential to the status pin of the data interface in a unidirectional mode through the unidirectional conduction circuit.
S304, a switching instruction is input to the test terminal.
Therefore, an automatic switching instruction can be generated when the external switching device is inserted, and compared with a common data plug, the technology only adds a one-way circuit, so that the automatic switching device is low in cost control.
The switching step in the method provided by the embodiment of the present application may specifically include the following steps: closing the self-starting test module which is currently operated; and opening the next self-starting test module to be started for testing.
In the method provided by the embodiment of the application, the switching device is specifically selected to be connected to the test terminal through the serial interface, the test terminal is internally provided with the communication control for controlling the serial interface, and the communication control is connected to the task manager of the test terminal so as to control the task manager to close and start the self-starting test module.
In this embodiment, the test terminal may further include a test task manager (equivalent to the aforementioned "start module" or "task manager"), where the test task manager may be an interface platform built in the test terminal operating system, the test task manager is a module that is automatically started when the test terminal is started, and may be provided with a start unit that is started synchronously with the operating system, so that after the operating system is started, the authority of the data interface communication control may be opened and the switching instruction signal may be acquired, and the test task manager may call and start or close the plurality of test modules respectively, and may also update the test states of the test modules, that is, the test states of the test modules may be marked as tested or untested. The marking mode of the test state can be preset by a user or default set by a system, for example, the test state is that a '1' mark can be adopted when the test is tested, the test state is that a '0' mark can be adopted when the test is not tested, and the like, and when one test module detects the '1' mark, the test module is closed and the next test module with the '0' mark is started according to the detected command needing to be switched until all the test modules finish the test.
It will be appreciated that the automatic booting of the operating system may be achieved by writing the test task manager to a self-boot list of the operating system. Fig. 4 is a schematic structural diagram of a switching device according to an embodiment of the present application. Another aspect of the present application can also be considered to provide an automatic test switching device, as shown in the figure, which is illustrated in the present embodiment by a standard RS-232 serial interface, wherein the switching device includes a data interface 1 and an input circuit, the data interface includes a status pin1 and a potential pin 4; the input circuit is connected between the potential pin and the state pin and used for conducting potential from the potential pin to the state pin in a single direction so as to generate a switching instruction. In the device provided by the embodiment of the application, the data interface is a serial interface, wherein the DCD pin (pin1) is a status pin, and the DTR pin (pin4) is a potential pin.
It is mentioned that various switching devices can be configured, and it can be understood that, for example, the serial interface has a plurality of pins, and in order to form different switching device schemes, for example, the status pins can also be selected as pins 6, 8, pin9, etc., that is, one status pin can be used, or a plurality of status pins can be provided, so that more configuration schemes can be obtained, and of course, the potential pin can still use pin4, or can be selected as a pin7, etc., which can be configured as a high-level pin. The present invention is not limited to this, as long as it can form different input signals.
According to the device provided by the embodiment of the application, the data interface comprises a plug-in side used for being plugged in the serial port female seat and a lead side used for welding a lead, and the input circuit is connected to the state pin and the potential pin on the lead side of the data interface.
Referring to fig. 6 again, this is a schematic structural diagram of another switching device provided in the embodiment of the present application. The difference between this embodiment and the previous embodiment is only that the serial interface 1 is not a standard interface, which is a serial interface for jumper wires of a computer motherboard, and only the pin serial number is different from the standard serial number. That is to say, the technical idea of the present application is not implemented by relying on a standard data interface, as long as it can feedback specific signals to the bus, and the task management module matches the specific signals with corresponding test modes.
In the device provided by the embodiment of the application, the input circuit comprises a resistor 3 and a diode 2, and the conducting direction of the diode 2 is pointed to by one end of the connection potential pin to one end of the connection status pin. The diode 2 is used to limit the electrical input circuit to a unidirectional circuit, and the resistor 3 may be a current limiting resistor with a larger resistance value, in the specific embodiment, a resistor with a 1000 ohm resistance value is selected to prevent the status pin from being detected as an overcurrent abnormality in the power-on self-test procedure, so that the switching device can be inserted into the test terminal before the power-on, thereby preventing an operator from waiting for the operating system to complete the power-on.
Fig. 5 is a schematic structural diagram of a test terminal in a test system according to an embodiment of the present application. In another aspect, the present application provides an automatic test system for testing a storage device, the automatic test system includes a test terminal 10 and the switching device as described above, wherein: the test terminal 10 comprises a communication module 11, a task management module 12 and a plurality of self-starting test modules 13, wherein the communication module 11 is connected with a switching device, the other end of the communication module 11 can be connected with the task management module 12 through a bus, the switching device inputs a switching instruction to the task management module 12 through the communication module 11, and the task management module 12 switches the self-starting test modules according to the switching instruction.
As will be appreciated by those skilled in the art, the operating system of the test terminal may be any intelligent operating system, such as an ARM, X86, an android system, a WINDOWS system, and so on. The task management module 12 and the plurality of test modules 13 may be stored in a fixed memory of the test terminal, and the plurality of test modules 13 may be optionally packaged in the task management module 12, so that the task management module 12 may call on and off operations of each test module 13, and may mark their running states respectively.
In the system provided by the embodiment of the present application, the test terminal 10 has a data interface socket for connecting to a switching device, the switching device is inserted into the data interface socket to establish a signal connection, and a potential pin in the data interface socket is set to a high level.
Compared with the method for completing the test by manual switching in the prior art, the test terminal can implement automatic switching according to the switching instruction generated by the obtained automatic switching device when the test module needs to be switched due to the automatic switching device, the manual control of an external input device is not needed by an operator, the operator does not need to wait for starting or detecting program operation, the time of the operator can be saved during large-scale test on a production line, the labor is reduced, and the production cost is saved.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
It is noted that, in this document, relational terms such as "first" and "second," and the like, may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The foregoing are merely exemplary embodiments of the present invention, which enable those skilled in the art to understand or practice the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. An automatic test method for testing a storage device by a self-starting test module in a test terminal, wherein the test terminal comprises a plurality of self-starting test modules, and the method is characterized by comprising the following steps:
the configuration switching device can automatically generate a switching instruction input to the test terminal in a state of being connected to the test terminal;
connecting the switching device to the test terminal to input a switching instruction to the test terminal;
executing the switching of the self-starting test module according to the input switching instruction;
wherein, the connecting the switching device to the test terminal to input a switching instruction to the test terminal includes:
the switching device is connected with the test terminal through a data interface,
the potential pin of the data interface is connected to a high level,
the potential pin conducts the potential to the status pin of the data interface in a unidirectional way through a unidirectional conducting circuit,
thereby inputting the switching instruction to the test terminal.
2. The automatic test method according to claim 1, wherein the configuration switching means is capable of automatically generating a switching command to be input to the test terminal in a state of being connected to the test terminal; the method comprises the following steps:
configuring the test terminal to recognize a level signal of a designated pin as a switching instruction;
and configuring a starting module positioned at the test terminal, wherein the starting module executes the switching of the self-starting test module according to the input switching instruction.
3. The automatic test method of claim 1, wherein the performing of the switching of the self-initiated test module according to the inputted switching instruction comprises:
the starting module detects the data state of the data interface;
if a switching instruction input by a switching device is detected, starting a test module corresponding to the switching instruction for testing;
if the switching instruction input by the switching device is not detected, starting a preset test module for testing;
and the test module corresponding to the switching instruction is different from the preset test module.
4. The automatic test method according to any one of claims 1 to 3, wherein the switching device is connected to the test terminal through a serial interface, a communication control for controlling the serial interface is configured in the test terminal, and the communication control is connected to a task manager of the test terminal to control the task manager to perform the turning off and on of the self-starting test module.
5. The automatic test switching device is characterized by comprising a data interface and an input circuit, wherein the data interface comprises a state pin and a potential pin; the input circuit is connected between a potential pin and the state pin and used for conducting potential from the potential pin to the state pin in a single direction so as to generate a switching instruction.
6. The switching device of claim 5, wherein the data interface is a serial interface, wherein the DCD pin is a status pin and the DTR pin is a potential pin.
7. The switching device of claim 5, wherein the data interface includes a mating side for mating with a serial female socket and a lead side for soldering a lead, the input circuit being connected to the status pin and the potential pin on the lead side of the data interface.
8. The switching device according to any one of claims 5 to 7, wherein the input circuit comprises a current limiting resistor and a diode, and the conduction direction of the diode is directed from the end connected to the potential pin to the end connected to the status pin.
9. An automatic test system for testing a storage device, the automatic test system comprising a test terminal and a switching device according to any one of claims 5 to 8, wherein:
the testing terminal comprises a communication module, a task management module and a plurality of self-starting testing modules, wherein the communication module is connected with the switching device, the other end of the communication module is connected with the task management module, the switching device inputs a switching instruction to the task management module through the communication module, and the task management module switches the self-starting testing modules according to the switching instruction.
10. The automatic test system of claim 9, wherein the test terminal has a data interface socket for connecting to the switching device, the switching device being inserted into the data interface socket to establish a signal connection, the potential pin in the data interface socket being set to a high level.
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| CN117269785B (en) * | 2023-11-23 | 2024-04-02 | 广东省锐驰新能源科技有限公司 | Multi-mode test supervision system of lithium battery pack based on data analysis |
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Denomination of invention: Automatic testing switching device, method, and system Granted publication date: 20210226 Pledgee: Shenzhen Branch of Huishang Bank Co.,Ltd. Pledgor: SHENZHEN TIGO SEMICONDUCTOR Co.,Ltd. Registration number: Y2024980005570 |