CN101118788A - Memory controller automatization testing method and apparatus - Google Patents
Memory controller automatization testing method and apparatus Download PDFInfo
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Cited By (19)
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CN101976582A (en) * | 2010-10-15 | 2011-02-16 | 北京航天测控技术开发公司 | Storage modeling method and device |
CN102158374A (en) * | 2011-05-12 | 2011-08-17 | 瑞斯康达科技发展股份有限公司 | Bandwidth speed limiting testing method and testing device |
CN102214258A (en) * | 2011-06-15 | 2011-10-12 | 福州瑞芯微电子有限公司 | Verification platform aiming at image processing class of IP circuits |
CN102280142A (en) * | 2010-06-10 | 2011-12-14 | 英业达股份有限公司 | Memory detection method |
CN102385547A (en) * | 2010-08-31 | 2012-03-21 | 安凯(广州)微电子技术有限公司 | Method and system for verifying timing sequence calibration function of dynamic random access memory (DRAM) controller |
CN101996265B (en) * | 2009-08-25 | 2012-11-21 | 安凯(广州)微电子技术有限公司 | Verification system and method for memory controller |
CN101923494B (en) * | 2009-06-17 | 2013-05-08 | 安凯(广州)微电子技术有限公司 | Memory controller verification system, method and scoreboard |
CN104504209A (en) * | 2014-12-29 | 2015-04-08 | 浪潮(北京)电子信息产业有限公司 | PHY (Physical layer) characteristic simulation method and PHY characteristic simulation system |
CN105229619A (en) * | 2013-05-16 | 2016-01-06 | 超威半导体公司 | There is the accumulator system of appointed area memory access scheduling |
WO2016078307A1 (en) * | 2014-11-20 | 2016-05-26 | 深圳市中兴微电子技术有限公司 | Configurable on-chip interconnection system and method and apparatus for implementing same, and storage medium |
CN105654993A (en) * | 2016-02-22 | 2016-06-08 | 深圳市同创国芯电子有限公司 | Function verification method and platform for DDR3 SDRAM (double data rate 3 synchronous dynamic random access memory) controller |
CN105718222A (en) * | 2016-01-27 | 2016-06-29 | 珠海全志科技股份有限公司 | Adaptive device and method for updating DRAM configuration |
CN106326046A (en) * | 2015-06-30 | 2017-01-11 | 上海华虹集成电路有限责任公司 | Verification environment platform of storage controller |
CN110459260A (en) * | 2019-07-05 | 2019-11-15 | 深圳市金泰克半导体有限公司 | Automatic test switching device, method and system |
WO2020083367A1 (en) * | 2018-10-26 | 2020-04-30 | Changxin Memory Technologies, Inc. | Chip testing method, device, electronic apparatus and computer readable medium |
CN111210863A (en) * | 2019-12-30 | 2020-05-29 | 深圳佰维存储科技股份有限公司 | Method, device and equipment for testing embedded memory and computer storage medium |
CN115422115A (en) * | 2022-11-01 | 2022-12-02 | 山东云海国创云计算装备产业创新中心有限公司 | Coding method, system, storage medium and equipment based on bus |
WO2023000358A1 (en) * | 2021-07-19 | 2023-01-26 | 长鑫存储技术有限公司 | Storage device testing method, testing device and system |
US11893284B2 (en) | 2021-07-19 | 2024-02-06 | Changxin Memory Technologies, Inc. | Method, device and system for testing memory devices |
Families Citing this family (1)
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CN103035300A (en) * | 2012-12-20 | 2013-04-10 | 北京航天测控技术有限公司 | Modeling method and boundary scan test method for DDR2 memory |
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2007
- 2007-07-19 CN CNB2007101294996A patent/CN100573728C/en not_active Expired - Fee Related
Cited By (35)
Publication number | Priority date | Publication date | Assignee | Title |
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CN101923494B (en) * | 2009-06-17 | 2013-05-08 | 安凯(广州)微电子技术有限公司 | Memory controller verification system, method and scoreboard |
CN101996265B (en) * | 2009-08-25 | 2012-11-21 | 安凯(广州)微电子技术有限公司 | Verification system and method for memory controller |
CN102280142B (en) * | 2010-06-10 | 2013-11-20 | 英业达股份有限公司 | Memory detection method |
CN102280142A (en) * | 2010-06-10 | 2011-12-14 | 英业达股份有限公司 | Memory detection method |
CN102385547A (en) * | 2010-08-31 | 2012-03-21 | 安凯(广州)微电子技术有限公司 | Method and system for verifying timing sequence calibration function of dynamic random access memory (DRAM) controller |
CN102385547B (en) * | 2010-08-31 | 2014-04-23 | 安凯(广州)微电子技术有限公司 | Method and system for verifying timing sequence calibration function of dynamic random access memory (DRAM) controller |
CN101976582A (en) * | 2010-10-15 | 2011-02-16 | 北京航天测控技术开发公司 | Storage modeling method and device |
CN102158374A (en) * | 2011-05-12 | 2011-08-17 | 瑞斯康达科技发展股份有限公司 | Bandwidth speed limiting testing method and testing device |
CN102158374B (en) * | 2011-05-12 | 2014-05-14 | 瑞斯康达科技发展股份有限公司 | Bandwidth speed limiting testing method and testing device |
CN102214258B (en) * | 2011-06-15 | 2013-03-06 | 福州瑞芯微电子有限公司 | Verification platform aiming at image processing class of IP circuits |
CN102214258A (en) * | 2011-06-15 | 2011-10-12 | 福州瑞芯微电子有限公司 | Verification platform aiming at image processing class of IP circuits |
CN105229619A (en) * | 2013-05-16 | 2016-01-06 | 超威半导体公司 | There is the accumulator system of appointed area memory access scheduling |
US11474703B2 (en) | 2013-05-16 | 2022-10-18 | Advanced Micro Devices, Inc. | Memory system with region-specific memory access scheduling |
WO2016078307A1 (en) * | 2014-11-20 | 2016-05-26 | 深圳市中兴微电子技术有限公司 | Configurable on-chip interconnection system and method and apparatus for implementing same, and storage medium |
US10198374B2 (en) | 2014-11-20 | 2019-02-05 | Sanechips Technology Co. Ltd. | Configurable on-chip interconnection system and method and apparatus for implementing same, and storage medium |
CN104504209B (en) * | 2014-12-29 | 2018-04-17 | 浪潮(北京)电子信息产业有限公司 | A kind of PHY characteristic Simulations method and system |
CN104504209A (en) * | 2014-12-29 | 2015-04-08 | 浪潮(北京)电子信息产业有限公司 | PHY (Physical layer) characteristic simulation method and PHY characteristic simulation system |
CN106326046A (en) * | 2015-06-30 | 2017-01-11 | 上海华虹集成电路有限责任公司 | Verification environment platform of storage controller |
CN106326046B (en) * | 2015-06-30 | 2019-10-01 | 上海华虹集成电路有限责任公司 | The verification environment platform of Memory Controller |
CN105718222A (en) * | 2016-01-27 | 2016-06-29 | 珠海全志科技股份有限公司 | Adaptive device and method for updating DRAM configuration |
CN105718222B (en) * | 2016-01-27 | 2019-05-28 | 珠海全志科技股份有限公司 | A kind of self-reacting device and method updating DRAM configuration |
CN105654993B (en) * | 2016-02-22 | 2018-11-06 | 深圳市紫光同创电子有限公司 | Function verification method and platform for DDR3 sdram controllers |
CN105654993A (en) * | 2016-02-22 | 2016-06-08 | 深圳市同创国芯电子有限公司 | Function verification method and platform for DDR3 SDRAM (double data rate 3 synchronous dynamic random access memory) controller |
US11145386B2 (en) | 2018-10-26 | 2021-10-12 | Changxin Memory Technologies, Inc. | Chip testing method, device, electronic apparatus and computer readable medium |
WO2020083367A1 (en) * | 2018-10-26 | 2020-04-30 | Changxin Memory Technologies, Inc. | Chip testing method, device, electronic apparatus and computer readable medium |
CN111105839A (en) * | 2018-10-26 | 2020-05-05 | 长鑫存储技术有限公司 | Chip testing method and device, electronic equipment and computer readable medium |
CN111105839B (en) * | 2018-10-26 | 2022-04-15 | 长鑫存储技术有限公司 | Chip testing method and device, electronic equipment and computer readable medium |
CN110459260A (en) * | 2019-07-05 | 2019-11-15 | 深圳市金泰克半导体有限公司 | Automatic test switching device, method and system |
CN110459260B (en) * | 2019-07-05 | 2021-02-26 | 深圳市金泰克半导体有限公司 | Automatic test switching device, method and system |
CN111210863B (en) * | 2019-12-30 | 2021-10-19 | 深圳佰维存储科技股份有限公司 | Method, device and equipment for testing embedded memory and computer storage medium |
CN111210863A (en) * | 2019-12-30 | 2020-05-29 | 深圳佰维存储科技股份有限公司 | Method, device and equipment for testing embedded memory and computer storage medium |
WO2023000358A1 (en) * | 2021-07-19 | 2023-01-26 | 长鑫存储技术有限公司 | Storage device testing method, testing device and system |
US11893284B2 (en) | 2021-07-19 | 2024-02-06 | Changxin Memory Technologies, Inc. | Method, device and system for testing memory devices |
CN115422115A (en) * | 2022-11-01 | 2022-12-02 | 山东云海国创云计算装备产业创新中心有限公司 | Coding method, system, storage medium and equipment based on bus |
CN115422115B (en) * | 2022-11-01 | 2023-02-24 | 山东云海国创云计算装备产业创新中心有限公司 | Coding method, system, storage medium and equipment based on bus |
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Effective date of registration: 20151030 Address after: Dameisha Yantian District of Shenzhen City, Guangdong province 518085 Building No. 1 Patentee after: SANECHIPS TECHNOLOGY Co.,Ltd. Address before: 518057 Nanshan District high tech Industrial Park, Guangdong, South Road, science and technology, ZTE building, legal department Patentee before: ZTE Corp. |
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Application publication date: 20080206 Assignee: Xi'an Chris Semiconductor Technology Co.,Ltd. Assignor: SANECHIPS TECHNOLOGY Co.,Ltd. Contract record no.: 2019440020036 Denomination of invention: Memory controller automatization testing method and apparatus Granted publication date: 20091223 License type: Common License Record date: 20190619 |
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