CN110459260A - Automatic test switching device, method and system - Google Patents
Automatic test switching device, method and system Download PDFInfo
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- CN110459260A CN110459260A CN201910604913.7A CN201910604913A CN110459260A CN 110459260 A CN110459260 A CN 110459260A CN 201910604913 A CN201910604913 A CN 201910604913A CN 110459260 A CN110459260 A CN 110459260A
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- 238000012360 testing method Methods 0.000 title claims abstract description 215
- 238000000034 method Methods 0.000 title abstract description 26
- 238000003860 storage Methods 0.000 claims abstract description 19
- 238000013459 approach Methods 0.000 claims abstract description 14
- 238000004891 communication Methods 0.000 claims description 25
- 238000001514 detection method Methods 0.000 claims description 3
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- 238000010586 diagram Methods 0.000 description 12
- 238000007726 management method Methods 0.000 description 12
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- 101100244014 Neurospora crassa (strain ATCC 24698 / 74-OR23-1A / CBS 708.71 / DSM 1257 / FGSC 987) ppi-5 gene Proteins 0.000 description 3
- 101150023294 PIN4 gene Proteins 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
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- 101150037009 pin1 gene Proteins 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
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- 230000006399 behavior Effects 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
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- 230000005611 electricity Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 238000001387 multinomial test Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Abstract
This application involves field of hardware, it is proposed a kind of automatic test switching device, method and system, automatic test approach tests storage device with testing self-starting test module in terminal, it include multiple self-starting test modules in the test terminal, comprising steps of configuration switching device, can automatically generate the switching command for being input to the test terminal in the state of being connected to the test terminal；The switching device is connected to the test terminal with to the test terminal inputting switching command；The switching of self-starting test module is executed according to the switching command of input.The switching command that can be generated according to the automatic switching control equipment of acquisition, test terminal can be implemented automatic switchover, do not need operator and manually controlled again with external input device.
Description
Technical field
The present invention relates to field of hardware, more particularly to a kind of automatic test switching device, method and system.
Background technique
Memory or the such storage device of hard disk need to be tested for the property during the manufacturing, currently, being usually
Memory or hard disk are plugged on computer main board, tested by running test module on computers.
But during actual test, memory or hard disk usually require to carry out multinomial test, but the behaviour of existing test terminal
After making system boot, can only a specified self-starting test module of automatic running, or run specified two or more simultaneously
A test module, and test module is run simultaneously because there is significant performance interference, hence it is evident that it is infeasible, if desired select
When test module, artificial selection is carried out again after needing waiting system to complete booting, or after the completion of needing to wait previous item to test,
Again by manually switching the next item down test, the process manually waited, time-consuming also Fei Renli by way of mouse or keyboard.Every time
Manual operation mouse or keyboard are needed, it is cumbersome.
And one memory of every test, need to restart a computer.Computer reboots into computer operating system and needs the time, this
Section time domestic demand will be waited manually, be waited after entering operating system, manually select test module by mouse or keyboard again, etc.
To process wastes time and manpower.
Summary of the invention
In order to solve the technical issues of can't realizing automation switching, causing high labor cost of the existing technology,
This application provides a kind of automatic test switching devices, method and system.
In a first aspect, this application provides a kind of automatic test approach, to test in terminal self-starting test module to depositing
Storage device is tested, and includes multiple self-starting test modules in the test terminal, comprising steps of
Switching device is configured, can be automatically generated in the state of being connected to the test terminal and be input to the test terminal
Switching command；
The switching device is connected to the test terminal with to the test terminal inputting switching command；
The switching of self-starting test module is executed according to the switching command of input.
This method provided by the embodiments of the present application, the configuration switching device, in the state for being connected to the test terminal
It is lower to automatically generate the switching command for being input to the test terminal；Include:
It is configured to the test terminal to be identified as switching command according to the level signal of designated pin；
Configuration one is located at the starting module of the test terminal, and the starting module is executed according to the switching command of input
The switching of self-starting test module.
This method provided by the embodiments of the present application, it is described that the switching device is connected to the test terminal with to described
Test terminal inputting switching command, comprising:
The switching device is connected to the test terminal by data-interface；
The current potential pin of the data-interface is connected as high level；
The current potential pin unidirectionally conducts current potential to the status pin of the data-interface by unidirectional order wire circuit；
The switching command is inputted to the test terminal with this.
This method provided by the embodiments of the present application, it is described that self-starting test module is executed according to the switching command of input
Switching, comprising:
Starting module detection data interface data state；
If detecting the switching command of switching device input, starts the corresponding test module of the switching command and surveyed
Examination；
If the switching command of switching device input is not detected, starts preset test module and tested；
Wherein, the corresponding test module of the switching command is different from preset test module.
This method provided by the embodiments of the present application, it is described that self-starting test module is executed according to the switching command of input
Switching, comprising:
Close currently running self-starting test module；
Next self-starting test module to be launched is opened to be tested.
This method provided by the embodiments of the present application, the switching device are connected to the test terminal by serial line interface,
The communication control of configuration control serial line interface in the test terminal, the communication control are connected to the task of the test terminal
Manager, to control the closing and starting that the task manager carries out self-starting test module.
On the other hand the application provides a kind of switching device tested automatically, the switching device include data-interface and
Input circuit, the data-interface include status pin and current potential pin；The input circuit is connected to current potential pin and institute
It states between status pin, for unidirectionally conducting current potential from the current potential pin to the status pin, the switching is generated with this
Instruction.
The device provided by the embodiments of the present application, the data-interface are serial line interface, and wherein DCD pin draws for state
Foot, DTR pin are current potential pin.
The device provided by the embodiments of the present application, the data-interface include for be plugged in the grafting side of serial ports base with
And the lead side for welding lead, the input circuit the lead side of the data-interface be connected to the status pin with
And the current potential pin.
The device provided by the embodiments of the present application, the input circuit include resistance and diode, and the diode is led
It is directed toward by connection current potential pin one end and is connected to described status pin one end in electric direction.
Aspect provides a kind of Auto-Test System to the application again, for testing storage device, Auto-Test System
Including test terminal and foregoing switching device, in which: the test terminal includes communication module, task management module
And multiple self-starting test modules, the communication module are connected for the switching device, the communication module other end connection
In the task management module, the switching device is referred to by the communication module to task management module input switching
It enables, the task management module switches self-starting test module according to switching command.
The system provided by the embodiments of the present application, the test terminal have the data for being connected to the switching device
Interface block, the switching device are inserted into the data-interface seat to establish signal connection, current potential pin in the data-interface seat
It is set as high level.
Above-mentioned technical proposal provided by the embodiments of the present application has the advantages that compared with prior art
The method tested is completed in manual switching compared with prior art, is automatically switched in the embodiment of the present application due to having used
Device, so when needing switch test module, the switching command that can be generated according to the automatic switching control equipment of acquisition tests terminal
Implement to automatically switch, does not need operator and manually controlled again with external input device, and operator opens without waiting
Machine or detection program operation, can save operator's time in the large scale test in producing line, to reduce manpower, save
Production cost.
On the other hand, due to being tested automatically using booting self-starting test module, and switching device progress has been accessed
Automatically switch, so can be left after restarting test terminal, one after storage device to be tested is accessed test terminal by operator
The test process of a storage device no longer needs operator on duty.
Detailed description of the invention
The drawings herein are incorporated into the specification and forms part of this specification, and shows and meets implementation of the invention
Example, and be used to explain the principle of the present invention together with specification.
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, for those of ordinary skill in the art
Speech, without any creative labor, is also possible to obtain other drawings based on these drawings.
Fig. 1 is a kind of automatic test approach flow diagram provided by the embodiments of the present application.
Fig. 2 is a kind of flow diagram of automatic test approach preparation process provided by the embodiments of the present application.
Fig. 3 is a kind of flow diagram of automatic test approach switch step provided by the embodiments of the present application.
Fig. 4 is a kind of structural schematic diagram of switching device provided by the embodiments of the present application.
Fig. 5 is the structural schematic diagram that terminal is tested in a kind of test macro provided by the embodiments of the present application.
Fig. 6 is the structural schematic diagram of another switching device provided by the embodiments of the present application.
Specific embodiment
To keep the purposes, technical schemes and advantages of the embodiment of the present application clearer, below in conjunction with the embodiment of the present application
In attached drawing, the technical scheme in the embodiment of the application is clearly and completely described, it is clear that described embodiment is
A part of the embodiment of the application, instead of all the embodiments.Based on the embodiment in the application, ordinary skill people
Member's every other embodiment obtained without making creative work, shall fall in the protection scope of this application.
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, to the present invention into
Row is further described.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, it is not used to limit
The fixed present invention.
For solve it is of the existing technology waste time and the technical issues of manpower, the embodiment of the present application provide it is a kind of from
Dynamic test method, tests storage device with testing self-starting test module in terminal, includes multiple energy in test terminal
The test module of self-starting, Fig. 1 are a kind of automatic test approach flow diagram provided by the embodiments of the present application.Institute referring to Fig.1
Show, automatic test approach provided by the embodiment it is main comprising steps of
S101 configures a circumscribed switching device, so that switching device can be certainly in the state of being connected to test terminal
Dynamic generation is input to the switching command of test terminal；Art technology is it is understood that switching device may be selected to be various energy
The device of test terminal is connected to by Peripheral Interface, for example, universal serial bus (USB), parallel interface (Centronics)
Or serial line interface (COM) etc., and switching device be also configured as it is a variety of, to input different switching command respectively, not
As limit.
S102, by switching device be connected to test terminal with to test terminal inputting switching command；That is switching dress
The data-interface set in the test terminal by adaptation is connected to test terminal.In a kind of embodiment, may be selected access it is to be measured
After trying storage device, it is inserted into switching device before test terminal booting, in order to which the starting module of test enters operation in booting
Switching command can be detected after system.Certainly, in another embodiment, also can choose also allows in test run state
Insertion switching device switches over instruction input, it is possible to understand that is that this needs to be configured in the test of test terminal with starting module
It is corresponding default, for example, configured with the control flow sequentially switched between multiple test modules is carried out according to a kind of switching command；Or
Person only carries out the setting of nominative testing module testing according to the signal that switching device is not detected；Alternatively, according to one kind is detected
The signal of switching device carries out the setting of particular test module test.It and is survey by the control of the opening opportunity of data interface communication
Before the operation of die trial block or after end of run.
S103, test terminal execute the switching of self-starting test module according to the switching command of input, that is to say, that can be with
It opens corresponding test module according to switching command to be tested, alternatively, being opened according to the signal that switching command is not detected
Preset test module is tested.On the other hand it is also believed that being, in test module operating status, when a test module
After the completion of test, meeting turn-on data interface communication module switches over the detection of instruction, and after detecting switching command, closing is worked as
Before the test program that is currently running, and open next test module and storage device tested.It is understood that test
After terminal receives the instruction of input, it can be closed according to default control corresponding operating module and new module is called to open, this is right
There is more implementation for those skilled in the art, for example is realized based on the task manager of operating system, or pass through
Respective switch is written in test program and controls control.
It is understood that storage device described in embodiment, refers to memory, hard disk or similar data storage.
It is understood that switching device is inserted into test terminal before booting, with this in a kind of aforementioned embodiment
The input of switching command is completed, such operator decides whether to insert as needed after test terminal connects storage device
Enter switching device, hereafter can leave, no longer needs to the starting for waiting operating system.That is, it is believed that by whether being inserted into
Switching device, or which kind of switching device is inserted into determine the test pattern of a storage device to be tested.In this way, can be with
Producing line is that each storage device to be tested configures a dedicated switching device, or according to it is default to specified storage device not
It configures switching device (this can also be correspondingly configured with corresponding test pattern), can be filled for different storages to be tested with this
Setting progress, quickly and accurately test pattern switches.And switching device may be selected to be circulation reuse in this mode.
Fig. 2 is a kind of flow diagram of automatic test approach preparation process provided by the embodiments of the present application.The application is real
In this method that example offer is provided, in the step of configuring switching device, it may particularly include:
S201 is configured to test terminal to be identified as switching command according to the level signal of designated pin；Wherein, described
Configuration test end step includes at least: opening corresponding data interface in test terminal, makes it possible to for receiving switching command, together
When should configure corresponding communication module, transmitted by bus to task management module or test module after instruction in order to receive
Instruction.Communication module is such as the MSComm control suitable for serial line interface.
S202, configuration one is located at the starting module of test terminal, and starting module executes certainly according to the switching command of input
Start the switching of test module.Starting module referred to herein can be task manager, be also possible to similar control control with
It realizes and closes test module and unlatching test module.
Fig. 3 is a kind of flow diagram of automatic test approach switch step provided by the embodiments of the present application.The application is real
Apply example offer this method in, by switching device be connected to test terminal with to test terminal inputting switching command, comprising:
Switching device is connected to test terminal by data-interface by S301.
The current potential pin of S302, data-interface are connected as high level；This point can realize according to the default of communication module,
Communication module can be set as exporting high level signal to current potential pin in presetting.
S303, current potential pin can unidirectionally conduct current potential to the status pin of data-interface by unidirectional order wire circuit.
S304, with this to test terminal inputting switching command.
Automatic switchover instruction just can be generated when being inserted into circumscribed switching device with this, and this technology compares general data
Plug only increases an one-way circuit, it may be said that be a kind of cost control is relatively low automation equipment.
And the switch step in this method provided by the embodiments of the present application, it specifically may include following steps: closing current fortune
Capable self-starting test module；And it opens next self-starting test module to be launched and is tested.
In this method provided by the embodiments of the present application, switching device is specifically to select to be connected to test by serial line interface eventually
End, the communication control of the interior configuration control serial line interface of test terminal, communication control are connected to the task manager of test terminal, with
The closing and starting of control task manager progress self-starting test module.
In the embodiment of the present application, it can be configured with test assignment manager in test terminal and (be equivalent to " starting above-mentioned
Module " or " task manager "), it is flat that test assignment manager can be the interface that one is built into test terminal operating system
Platform, test assignment manager are a kind of modules for being switched on and starting automatically, and opening with operating system synchronous averaging can be set
Machine start unit refers in order to after starting operating system, open the permission of data interface communication control and obtain switching
Signal is enabled, and test assignment manager can call respectively and start or close multiple test modules, can also update each test
The test mode of test module can be labeled as having tested or not tested by the test mode of module.The label side of test mode
Formula can be preset by user or system default setting, for example, test mode is to have tested that one token can be used, test mode
" 0 " label etc. can be used not test, can be cut when a test module detects as one token according to the needs detected
The instruction changed closes the test module while starting the test module of next " 0 " label, until all test modules are completed to survey
Examination.
Though it is understood that can be realized by the way that test assignment manager to be written to the self-starting list of operating system
Operating system automatically turns on.Fig. 4 is a kind of structural schematic diagram of switching device provided by the embodiments of the present application.The application another party
Face, which is also believed that, is to provide a kind of switching device tested automatically, as shown, being the RS-232 with standard in the present embodiment
Serial line interface signal, wherein switching device includes data-interface 1 and input circuit, and data-interface includes status pin
(pin1) and current potential pin (pin4)；Input circuit is connected between current potential pin and status pin, for by current potential pin
Current potential is unidirectionally conducted to status pin, switching command is generated with this.The device provided by the embodiments of the present application, data-interface are string
Line interface, wherein DCD pin (pin1) is status pin, and DTR pin (pin4) is current potential pin.
Aforementioned be referred to can configure there are many switching device, it is to be understood that such as serial line interface has multiple draw
Foot, in order to form different switching device scheme, for example status pin is also an option that as pin6, pin8, pin9 etc., it can
It is a status pin, is also possible to that there are multiple status pins, can so obtain more allocation plan, certain current potential draws
Foot can still use pin4, also can choose the pin that high level can be configured to for pin7 etc..As long as can be formed different
Input signal is not limited thereto.
The device provided by the embodiments of the present application, data-interface include the grafting side and use for being plugged in serial ports base
In the lead side of welding lead, input circuit is connected to status pin and current potential pin in the lead side of data-interface.
Fig. 6 is referred again to, this is the structural schematic diagram of another switching device provided by the embodiments of the present application.In the embodiment
Difference with preceding embodiment is only that the serial line interface 1 and non-standard interface, this is the serial interface of the wire jumper of computer main board
Mouthful, it is that pin serial number is different from standard serial number.It is connect that is, the technical concept of the application is not rely on normal data
Mouth is implemented, as long as being able to achieve to bus feedback specific signals, and task management module is also special by these
The corresponding test mode of property signal Corresponding matching.
The device provided by the embodiments of the present application, input circuit include resistance 3 and diode 2, the conduction side of diode 2
One end of status pin is connected to one end direction by connection current potential pin.Diode 2 is for electric input circuit to be limited to
One-way circuit, and resistance 3 can choose as the current-limiting resistance of a larger resistance value, be selected as 1000 ohm of electricity in specific embodiment
The resistance of resistance value was detected as throat floater in startup self-detection program to avoid status pin, switching device is being opened
Test terminal can be inserted into before machine, to avoid operator that operating system is waited to complete booting.
Fig. 5 is the structural schematic diagram that terminal is tested in a kind of test macro provided by the embodiments of the present application.The application is another
Aspect provides a kind of Auto-Test System, for testing storage device, Auto-Test System include test terminal 10 with
And foregoing switching device, in which: test terminal 10 includes communication module 11, task management module 12 and multiple from opening
Dynamic test module 13, communication module 11 are connected for switching device, and 11 other end of communication module can be connected to task pipe by bus
Manage module 12, switching device by communication module 11 to 12 inputting switching command of task management module, task management module 12
Switch self-starting test module according to switching command.
It will be appreciated by persons skilled in the art that the operating system of test terminal can be any intelligent operating system, such as
ARM, X86, Android system, WINDOWS system etc..Wherein task management module 12 and multiple test modules 13 can be storage
In test terminal fixed memory, it may be selected multiple test modules 13 being packaged in the task management module 12, in order to
Task management module 12 can be called unlatching and shutoff operation to each test module 13, and can be respectively to their fortune
Row state is marked.
The system provided by the embodiments of the present application, test terminal 10 have the data-interface for being connected to switching device
Seat, switching device are inserted into data interface block to establish signal connection, and current potential pin is set as high level in data-interface seat.
The method tested is completed in manual switching compared with prior art, is automatically switched in the embodiment of the present application due to having used
Device, so when needing switch test module, the switching command that can be generated according to the automatic switching control equipment of acquisition tests terminal
Automatic switchover can be implemented, do not need operator and manually controlled again with external input device, and operator without etc.
Wait be switched on or detect program operation, operator's time can be saved in the large scale test in producing line, so that manpower is reduced,
Save production cost.
The embodiments described above only express several embodiments of the present invention, and the description thereof is more specific and detailed, but simultaneously
Limitations on the scope of the patent of the present invention therefore cannot be interpreted as.It should be pointed out that for those of ordinary skill in the art
For, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to guarantor of the invention
Protect range.Therefore, the scope of protection of the patent of the invention shall be subject to the appended claims.
It should be noted that, in this document, the relational terms of such as " first " and " second " or the like are used merely to one
A entity or operation with another entity or operate distinguish, without necessarily requiring or implying these entities or operation it
Between there are any actual relationship or orders.Moreover, the terms "include", "comprise" or its any other variant are intended to
Cover non-exclusive inclusion, so that the process, method, article or equipment for including a series of elements not only includes those
Element, but also including other elements that are not explicitly listed, or further include for this process, method, article or setting
Standby intrinsic element.In the absence of more restrictions, the element limited by sentence "including a ...", it is not excluded that
There is also other identical elements in the process, method, article or apparatus that includes the element.
The above is only a specific embodiment of the invention, is made skilled artisans appreciate that or realizing this hair
It is bright.Various modifications to these embodiments will be apparent to one skilled in the art, as defined herein
General Principle can be realized in other embodiments without departing from the spirit or scope of the present invention.Therefore, of the invention
It is not intended to be limited to the embodiments shown herein, and is to fit to and applied principle and features of novelty phase one herein
The widest scope of cause.
Claims (11)
1. a kind of automatic test approach is tested storage device with testing self-starting test module in terminal, the test
The test module including multiple energy self-startings in terminal, which is characterized in that comprising steps of
Switching device is configured, can be automatically generated in the state of being connected to the test terminal and be input to cutting for the test terminal
Change instruction；
The switching device is connected to the test terminal with to the test terminal inputting switching command；
The switching of self-starting test module is executed according to the switching command of input.
2. automatic test approach as described in claim 1, which is characterized in that the configuration switching device, it is described being connected to
The switching command for being input to the test terminal can be automatically generated in the state of test terminal；Include:
It is configured to the test terminal to be identified as switching command according to the level signal of designated pin；
Configuration one is located at the starting module of the test terminal, and the starting module is executed according to the switching command of input and opened certainly
The switching of dynamic test module.
3. automatic test approach as described in claim 1, which is characterized in that described that the switching device is connected to the survey
Terminal is tried with to the test terminal inputting switching command, comprising:
The switching device is connected to the test terminal by data-interface；
The current potential pin of the data-interface is connected as high level；
The current potential pin unidirectionally conducts current potential to the status pin of the data-interface by unidirectional order wire circuit；
The switching command is inputted to the test terminal with this.
4. automatic test approach as described in claim 1, which is characterized in that described to be executed according to the switching command of input
The switching of self-starting test module, comprising:
Starting module detection data interface data state；
If detecting the switching command of switching device input, starts the corresponding test module of the switching command and tested；
If the switching command of switching device input is not detected, starts preset test module and tested；
Wherein, the corresponding test module of the switching command is different from preset test module.
5. such as the described in any item automatic test approach of Claims 1-4, which is characterized in that the switching device passes through serial
Interface is connected to the test terminal, the communication control of configuration control serial line interface, the communication control in the test terminal
Be connected to the task manager of the test terminal, with control the task manager carry out the closing of self-starting test module with
Starting.
6. a kind of automatic test switching device, which is characterized in that the switching device includes data-interface and input circuit, institute
Stating data-interface includes status pin and current potential pin；The input circuit be connected to current potential pin and the status pin it
Between, for unidirectionally conducting current potential from the current potential pin to the status pin, switching command is generated with this.
7. switching device as claimed in claim 6, which is characterized in that the data-interface is serial line interface, wherein DCD pin
For status pin, DTR pin is current potential pin.
8. switching device as claimed in claim 6, which is characterized in that the data-interface includes for being plugged in serial ports base
Grafting side and lead side for welding lead, the input circuit be connected in the lead side of the data-interface described
Status pin and the current potential pin.
9. such as the described in any item switching devices of claim 6 to 8, which is characterized in that the input circuit includes current-limiting resistance
And diode, the diode conduction direction are directed toward by connection current potential pin one end and are connected to the status pin one
End.
10. a kind of Auto-Test System, for testing storage device, which is characterized in that Auto-Test System includes surveying
Try terminal and such as the described in any item switching devices of claim 6 to 9, in which:
The test terminal includes communication module, task management module and multiple self-starting test modules, the communication module
It is connected for the switching device, the communication module other end is connected to the task management module, and the switching device passes through
The communication module switches certainly to the task management module inputting switching command, the task management module according to switching command
Start test module.
11. Auto-Test System as claimed in claim 10, which is characterized in that the test terminal has for being connected to
The data-interface seat of switching device is stated, the switching device is inserted into the data-interface seat to establish signal connection, the data
Current potential pin is set as high level in interface block.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112068918A (en) * | 2020-09-14 | 2020-12-11 | 上海商米科技集团股份有限公司 | Method for starting electronic equipment and electronic equipment |
| CN117269785A (en) * | 2023-11-23 | 2023-12-22 | 广东省锐驰新能源科技有限公司 | Multi-mode test supervision system of lithium battery pack based on data analysis |
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Denomination of invention: Automatic testing switching device, method, and system Granted publication date: 20210226 Pledgee: Shenzhen Branch of Huishang Bank Co.,Ltd. Pledgor: SHENZHEN TIGO SEMICONDUCTOR Co.,Ltd. Registration number: Y2024980005570 |