CN102385547A - Method and system for verifying timing sequence calibration function of dynamic random access memory (DRAM) controller - Google Patents
Method and system for verifying timing sequence calibration function of dynamic random access memory (DRAM) controller Download PDFInfo
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- CN102385547A CN102385547A CN2010102681288A CN201010268128A CN102385547A CN 102385547 A CN102385547 A CN 102385547A CN 2010102681288 A CN2010102681288 A CN 2010102681288A CN 201010268128 A CN201010268128 A CN 201010268128A CN 102385547 A CN102385547 A CN 102385547A
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CN201010268128.8A CN102385547B (en) | 2010-08-31 | 2010-08-31 | Method and system for verifying timing sequence calibration function of dynamic random access memory (DRAM) controller |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106383762A (en) * | 2016-08-31 | 2017-02-08 | 西安紫光国芯半导体有限公司 | Verification method used for DRAM (Dynamic Random Access Memory) controller |
CN109960616A (en) * | 2017-12-22 | 2019-07-02 | 龙芯中科技术有限公司 | The adjustment method and system of processor-based memory parameters |
CN111367569A (en) * | 2018-12-26 | 2020-07-03 | 合肥杰发科技有限公司 | Memory calibration system and method and readable storage medium |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1767072A (en) * | 2004-09-09 | 2006-05-03 | 三星电子株式会社 | Error detecting memory module and method |
CN101118788A (en) * | 2007-07-19 | 2008-02-06 | 中兴通讯股份有限公司 | Memory controller automatization testing method and apparatus |
CN101458971A (en) * | 2008-12-02 | 2009-06-17 | 炬力集成电路设计有限公司 | Test system and method for built-in memory |
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1767072A (en) * | 2004-09-09 | 2006-05-03 | 三星电子株式会社 | Error detecting memory module and method |
CN101118788A (en) * | 2007-07-19 | 2008-02-06 | 中兴通讯股份有限公司 | Memory controller automatization testing method and apparatus |
CN101458971A (en) * | 2008-12-02 | 2009-06-17 | 炬力集成电路设计有限公司 | Test system and method for built-in memory |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106383762A (en) * | 2016-08-31 | 2017-02-08 | 西安紫光国芯半导体有限公司 | Verification method used for DRAM (Dynamic Random Access Memory) controller |
CN106383762B (en) * | 2016-08-31 | 2019-01-15 | 西安紫光国芯半导体有限公司 | A kind of verification method for dram controller |
CN109960616A (en) * | 2017-12-22 | 2019-07-02 | 龙芯中科技术有限公司 | The adjustment method and system of processor-based memory parameters |
CN111367569A (en) * | 2018-12-26 | 2020-07-03 | 合肥杰发科技有限公司 | Memory calibration system and method and readable storage medium |
CN111367569B (en) * | 2018-12-26 | 2023-04-28 | 合肥杰发科技有限公司 | Memory calibration system and method and readable storage medium |
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CN102385547B (en) | 2014-04-23 |
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Denomination of invention: Method and system for verifying timing sequence calibration function of dynamic random access memory (DRAM) controller Effective date of registration: 20171102 Granted publication date: 20140423 Pledgee: China Co truction Bank Corp Guangzhou economic and Technological Development Zone sub branch Pledgor: Anyka (Guangzhou) Microelectronics Technology Co., Ltd. Registration number: 2017990001008 |
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