CN109710480A - A kind of memory mirror card adjustment method and its system - Google Patents
A kind of memory mirror card adjustment method and its system Download PDFInfo
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- CN109710480A CN109710480A CN201910020273.5A CN201910020273A CN109710480A CN 109710480 A CN109710480 A CN 109710480A CN 201910020273 A CN201910020273 A CN 201910020273A CN 109710480 A CN109710480 A CN 109710480A
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Abstract
The invention discloses a kind of memory mirror card adjustment method and its systems, including on memory mirror card to be measured after insertion memory bar, and the processor of memory mirror card to be measured, which sends basic commissioning instruction, to carry out basic function commissioning to memory mirror card to be measured；Meet fundamentals of forecasting commissioning in basic commissioning result to require and after the memory mirror card at the golden finger interface of memory mirror card to be measured insertion simulation computer end, the processor of the memory mirror card at simulation computer end, which is sent, reads and writes basic commissioning instruction, to call itself default read-write line up procedure to be written and read basic commissioning to memory mirror card to be measured；After read-write commissioning result meets the requirement of read-write commissioning and memory mirror card insertion to be measured enters host, host generation transmitting-receiving commissioning instruction carries out data transmit-receive commissioning to memory mirror card to be measured and meets default transmitting-receiving commissioning condition up to receiving and dispatching commissioning result.Test process of the invention can be set according to demand, and limitation is smaller, and the testing reliability after subsequent insertion host is higher.
Description
Technical field
The present invention relates to memory hardware debugging technique fields, more particularly to a kind of memory mirror card adjustment method and its are
System.
Background technique
Memory is one of most important component in computer, the operation that can system stable, the reliability of memory to Guan Chong
It wants.In order to improve the reliability of memory, memory mirror is most common mode, and the basic principle of memory mirror is system while depositing
In a kind of two pieces or muti-piece DDR (Double Data Rate, Double Data Rate synchronous DRAM, memory standards) memories
Module, once the memory modules in one of channel break down (or data transmission fault), Memory Controller Hub will be by number
According on the memory modules for being transferred to another channel, to avoid service disconnection, to improve the reliability of system, guarantee computer
The normal operation of function.And memory mirror card is just realized the function and is generated.
For memory mirror card since board space is limited, the access speed of internal storage data is fast, so the function of memory mirror card
Difficult point is mainly on the function of interface is realized, if interface commissioning passes through, the major function of memory mirror card, which is debugged, to be completed.It is logical
The DIMM of an insertion mainboard is had on normal memory mirror card, and (Dual-Inline-Memory-Modules, dual inline type are deposited
Storage module (i.e. memory bar) interface) golden finger interface and two are used to insert the dimm socket of memory bar, as shown in Figure 1.
It is mainly at present the memory bar that memory mirror card insertion is entered to host board for the means of testing of memory mirror card, with
Host carries out joint test and debugging, to verify the correctness and stability of memory mirror card function.But there are one for this mode
Fixed limitation and unpredictability.When one piece of completely new, function is inserted directly into mainboard without the memory mirror card of test
Memory bank after, since the means for being able to cooperate memory mirror card commissioning in host are limited, and staff is typically only capable to make
With the test program that has had at present in host, and the program in host can not be programmed according to the demand of itself, because
This, when the memory mirror card that do not cross after tested is inserted directly into the mainboard of host, many tests are unable to complete, test process office
It is sex-limited larger, and when delay machine or error in data occurs in system, it can not quick positioning failure.
Therefore, how to provide a kind of memory mirror card adjustment method that test process limitation is small and its system is this field
The current problem to be solved of technical staff.
Summary of the invention
The object of the present invention is to provide a kind of memory mirror card adjustment method and its system, by memory mirror card insertion to be measured
The memory mirror card for entering first to be inserted into before host simulation computer end is tested, and test process can be set according to demand
Fixed, limitation is smaller；And the testing reliability after subsequent insertion host is higher.
In order to solve the above technical problems, the present invention provides a kind of memory mirror card adjustment methods, comprising:
After being inserted into memory bar on memory mirror card to be measured, the processor of the memory mirror card to be measured sends basic commissioning
Instruction to carry out basic function commissioning to the memory mirror card to be measured；
It is inserted in the golden finger interface that basic commissioning result meets the requirement of fundamentals of forecasting commissioning and the memory mirror card to be measured
After the memory mirror card for entering simulation computer end, the processor of the memory mirror card at the simulation computer end sends read-write basis
Commissioning instruction, to call itself default read-write line up procedure to be written and read basic commissioning to the memory mirror card to be measured；
It is described after read-write commissioning result meets the requirement of read-write commissioning and the memory mirror card insertion to be measured enters the host
Host generates transmitting-receiving commissioning instruction, carries out data transmit-receive commissioning to the memory mirror card to be measured until transmitting-receiving commissioning result is full
The default transmitting-receiving commissioning condition of foot.
Preferably, the basic function, which is tested, includes:
The data-transformation facility of the memory bar slot interface of the memory mirror card to be measured is tested；
The function of the processor of the memory mirror card to be measured is tested.
Preferably, the read-write basic test includes:
The data-transformation facility of the golden finger interface of the memory mirror card to be measured is tested.
Preferably, the mistake that the data-transformation facility of the golden finger interface to the memory mirror card to be measured is tested
Journey specifically:
The processor observation of the memory mirror card to be measured enters itself data and order, if can be normally written
It in the memory bar of the memory mirror card to be measured, is written if normal, records data and order be written and pass through itself connection
First on-line debugging tool is shown；
The data itself being written and order are fed back to the memory at the simulation computer end by the memory mirror card to be measured
Mirror image card, the data and order that the processor observation of the memory mirror card at the simulation computer end enters itself are recorded
The the second on-line debugging tool connected by itself is shown；
Two groups of data of record and order are compared the host, if comparing consistent, the memory mirror to be measured
The data-transformation facility of the golden finger interface of card is normal, otherwise the data-transformation facility of the golden finger interface of memory mirror card to be measured
It is to be debugged.
Preferably, the read-write basic test further include:
It tests between the memory mirror card to be measured and the memory mirror card at the simulation computer end and is written and read
When readwrite performance parameter.
Preferably, the data transmit-receive, which is tested, includes:
Data transmit-receive performance when carrying out data transmit-receive operation is tested between the memory mirror card to be measured and the host
Parameter.
Preferably, the memory mirror card to be measured is identical with the memory mirror card at the simulation computer end.
Preferably, the processor is on-site programmable gate array FPGA.
In order to solve the above technical problems, the present invention also provides a kind of memory mirror card debugging system, including memory to be measured
Mirror image card, simulation computer end memory mirror card, host；
After being inserted into memory bar on memory mirror card to be measured, the processor of the memory mirror card to be measured, for sending base
The instruction of plinth commissioning carries out basic function commissioning to the memory mirror card to be measured；
It is inserted in the golden finger interface that basic commissioning result meets the requirement of fundamentals of forecasting commissioning and the memory mirror card to be measured
After the memory mirror card for entering simulation computer end, the processor of the memory mirror card at the simulation computer end is read for sending
Basic commissioning instruction is write, basis is written and read to the memory mirror card to be measured according to itself default read-write line up procedure to call
Commissioning；
After read-write commissioning result meets the requirement of read-write commissioning and the memory mirror card insertion to be measured enters host, the master
Machine carries out data transmit-receive commissioning to the memory mirror card to be measured until transmitting-receiving commissioning knot for generating transmitting-receiving commissioning instruction
Fruit meets default transmitting-receiving commissioning condition.
Preferably, further includes:
The first on-line debugging tool being connect with the memory mirror card to be measured；With the memory mirror at the simulation computer end
As the second on-line debugging tool of card connection.
The present invention provides a kind of memory mirror card adjustment method and its systems, firstly, when inserting on memory mirror card to be measured
After entering memory bar, commissioning instruction is issued by the processor on memory mirror card to be measured to complete the basis to memory mirror card to be measured
Function commissioning；Later, memory mirror card to be measured is inserted into the memory mirror at another simulation computer end by golden finger interface
Card completes memory mirror card to be measured as host to read and write basic commissioning by the memory mirror card at simulation computer end, aforementioned
Commissioning after the completion of, then the memory mirror card insertion to be measured after the completion of commissioning is entered into host and is tested.As it can be seen that in the present invention,
After completing basic function commissioning, and it is indirect memory mirror card insertion to be measured is entered in the mainboard of host, but first will be to be measured interior
It deposits mirror image card insertion and enters and tested in another memory mirror card as computer terminal, later again by memory mirror card insertion to be measured
Enter host.Under this mode, the memory mirror card at simulation computer end can be with local programming, therefore, staff first
It can be programmed, make it have required come the memory mirror card to computer terminal according to the test and debugging demand of itself
Test and debugging function, so that test process degrees of freedom are higher, limitation is smaller.And the present invention is in advance by computer
The memory mirror card at end has carried out memory mirror card to be measured to read and write basic commissioning, by the memory mirror card at simulation computer end
On processor debug tool, can quickly position the failure of memory mirror card to be measured and be debugged, make memory mirror card
Before host co-operation, the commissioning of read-write capability needed for capable of completing memory mirror card whole to be measured is avoided as much as possible
After memory mirror card insertion to be measured enters host, the case where host can not normally be read and write and host can not quickly positioning failure be asked
Topic, improves the reliability of memory mirror card test, and reduces time and the workload of host joint debugging, shortens product week
Phase.
Detailed description of the invention
It to describe the technical solutions in the embodiments of the present invention more clearly, below will be to institute in the prior art and embodiment
Attached drawing to be used is needed to be briefly described, it should be apparent that, the accompanying drawings in the following description is only some implementations of the invention
Example, for those of ordinary skill in the art, without creative efforts, can also obtain according to these attached drawings
Obtain other attached drawings.
Fig. 1 is the structural schematic diagram of memory mirror card；
Fig. 2 is a kind of flow chart of the process of memory mirror card adjustment method provided by the invention；
A kind of Fig. 3 structure for the memory mirror card that memory mirror card insertion to be measured enters simulation computer end provided by the invention is shown
It is intended to.
Specific embodiment
Core of the invention is to provide a kind of memory mirror card adjustment method and its system, by memory mirror card insertion to be measured
The memory mirror card for entering first to be inserted into before host simulation computer end is tested, and test process can be set according to demand
Fixed, limitation is smaller；And the testing reliability after subsequent insertion host is higher.
In order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below in conjunction with the embodiment of the present invention
In attached drawing, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described embodiment is
A part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, those of ordinary skill in the art
Every other embodiment obtained without making creative work, shall fall within the protection scope of the present invention.
The present invention provides a kind of memory mirror card adjustment methods, and referring to figure 1 and figure 2, Fig. 1 is memory mirror card
Structural schematic diagram；Fig. 2 is a kind of flow chart of the process of memory mirror card adjustment method provided by the invention；This method comprises:
Step s1: after being inserted into memory bar on memory mirror card to be measured, the processor of memory mirror card to be measured sends basis
Commissioning instruction carries out basic function commissioning to memory mirror card to be measured；
It is understood that had on memory mirror card one insertion mainboard DIMM golden finger interface and two be used to
The dimm socket for inserting memory bar, further includes a processor, as shown in Figure 1.The test of memory mirror card, mainly to connecing above
Mouth, slot and processor are tested, and are guaranteed in the normal of interface, slot and processor and then verifying memory mirror card
Can whether data transmission be normal and after insertion memory bar in slot, normal read-write etc. is carried out to memory bar.Therefore, first
It first needs that memory bar will be inserted into the slot of mirror image card to be tested, the processor of mirror image card to be tested sends basic function tune later
Survey instruction, come test mirror image card to be tested slot normality and cabling delay etc. characteristics.Memory mirror card to be measured at this time
Independent test does not need to be inserted on the memory mirror card at simulation computer end.Wherein, to be measured in order to normally be tested
It shows on trial as being provided with an interface on card for connecting host by cable.In addition, being can choose at this time by two memory bars point
It is not inserted on two dimm sockets, can also individually test two interface functions, i.e., first in slot A in insertion one
It deposits item and carries out commissioning, after the completion of test, then be inserted into memory bar in slot B and carry out commissioning, specifically using which kind of mode present invention
Without limitation.
Step s2: meet the golden finger interface of the requirement of fundamentals of forecasting commissioning and memory mirror card to be measured in basic commissioning result
After being inserted into the memory mirror card at simulation computer end, the processor of the memory mirror card at simulation computer end sends read-write basis and adjusts
Instruction is surveyed, to call itself default read-write line up procedure to be written and read basic commissioning to memory mirror card to be measured；
It is understood that shown in Figure 3, a kind of Fig. 3 memory mirror card insertion to be measured provided by the invention enters simulation meter
Calculate the structural schematic diagram of the memory mirror card of generator terminal.For host, due to can only directly utilize existing line up procedure in host,
And can not be according to the change and increase of the progress test program of self-demand voluntarily, therefore limitation is larger.Also, work as memory mirror
As card is to return in plate (for the first time in insertion board), the uncertain situation of function directly to carry out joint debugging, host with host for the first time
It is limited by program, it is likely that can not quick positioning failure, it is also possible to which host occur can not be communicated with memory mirror card
The case where.Therefore, in the present invention, the memory mirror card to be measured after basis is debugged will be completed and be firstly inserted into simulation computer end
Mirror image card is deposited to be tested, this is because the line up procedure in the memory mirror card at simulation computer end can by staff into
Row programming, therefore can meet the needs of test as far as possible, so that it is stuck in memory mirror before host co-operation, it can
Institute functional commissioning of the memory mirror card including host-side interface is completed as completely as possible, to greatly reduced
The time of joint debugging and workload, shorten production life cycle, commissioning it is more efficient.And it is first depending on the interior of simulation computer end
It deposits after mirror image card carried out preliminary read-write commissioning to memory mirror card to be measured, can also avoid memory mirror card to be measured as far as possible
After being inserted into host, so that the case where host can not work normally appearance, and in this test process, it can be calculated by simulation
The debug tool of processor on the memory mirror card of generator terminal, quickly positions the failure of board, and solves memory mirror card and may deposit
The problem of, improve the reliability of test.
In the process, memory mirror card to be measured is the memory mirror being inserted into as " memory bar " as simulation computer end
On the dimm socket of picture card.
Step s3: after read-write commissioning result meets the requirement of read-write commissioning and memory mirror card insertion to be measured enters host, host
Transmitting-receiving commissioning instruction is generated, data transmit-receive commissioning is carried out to memory mirror card to be measured until transmitting-receiving commissioning result meets default receive
Send out commissioning condition.
The present invention provides a kind of memory mirror card adjustment methods, firstly, when being inserted into memory bar on memory mirror card to be measured
Afterwards, commissioning instruction is issued by the processor on memory mirror card to be measured to complete the basic function tune to memory mirror card to be measured
It surveys；Later, memory mirror card to be measured is inserted into the memory mirror card at another simulation computer end by golden finger interface, by mould
The memory mirror card of quasi- computer terminal completes to read and write basic commissioning to memory mirror card to be measured as host, and aforementioned commissioning is complete
Cheng Hou, then the memory mirror card insertion to be measured after the completion of commissioning is entered into host and is tested.As it can be seen that in the present invention, completing basis
After function commissioning, and it is indirect memory mirror card insertion to be measured is entered in the mainboard of host, but first by memory mirror card to be measured
It is inserted into another memory mirror card as computer terminal and is tested, memory mirror card insertion to be measured is entered into host again later.
Under this mode, the memory mirror card at simulation computer end can be with local programming, therefore first, and staff can basis
The test and debugging demand of itself, are programmed come the memory mirror card to computer terminal, make it have required test and tune
Function is tried, so that test process degrees of freedom are higher, limitation is smaller.And the present invention is in advance by the memory of computer terminal
Mirror image card has carried out memory mirror card to be measured to read and write basic commissioning, by the processing on the memory mirror card at simulation computer end
The debug tool of device can quickly position the failure of memory mirror card to be measured and be debugged, and so that memory mirror is stuck in host total
Before work, the commissioning of read-write capability needed for capable of completing memory mirror card whole to be measured is avoided as much as possible memory to be measured
After mirror image card insertion enters host, the case where host can not normally be read and write and host can not quick positioning failure the problem of, improve
The reliability of memory mirror card test, and reduce time and the workload of host joint debugging, shorten production life cycle.
Specifically, above-mentioned basic function test includes:
The data-transformation facility of the memory bar slot interface of memory mirror card to be measured is tested；
The function of the processor of memory mirror card to be measured is tested.
Wherein, carrying out test process to the data-transformation facility of the memory bar slot interface of memory mirror card to be measured can be with
Are as follows: the processor of memory mirror card to be measured is written and read control to the memory bar of insertion, is carried out using the debug tool of processor
Debugging, obtains optimal delay parameter etc., keeps memory bar read-write capability correct, i.e., so that memory bar slot interface is normal.In addition,
Testing the function of the processor of memory mirror card to be measured can be with are as follows: emulated memory item failure situation, detection processing
Whether device can still be written and read memory bar, if cannot, it is debugged, until processor can be in memory bar
Memory bar can be still written and read when failure.Wherein, the method for emulated memory item failure situation here is
There are direct fault locations to test circuit on the board of memory mirror card, when it needs direct fault location, passes through the side such as toggle switch
The reset signal of memory bar is set to effectively by formula, is enabled memory bar be in reset state, be can not work normally, that is, be modeled as memory bar
The case where failure.
Specifically, read-write basic test includes:
The data-transformation facility of the golden finger interface of memory mirror card to be measured is tested.
It is understood that memory mirror card needs golden finger interface being inserted into host when in use.Therefore, if golden finger
There are problems for the data-transformation facility of interface, then memory mirror card is not available.Therefore, it is necessary to the golden finger of memory mirror card
The data-transformation facility of interface is tested.
It is further known that the process tested the data-transformation facility of the golden finger interface of memory mirror card to be measured has
Body are as follows:
Processor (the passing through debug tool) observation of memory mirror card to be measured enters itself data and order, if
It can be normally written in the memory bar of memory mirror card to be measured, be written if normal, record data and order be written and pass through certainly
First on-line debugging tool of body connection is shown；
The data itself being written and order are fed back to the memory mirror card at simulation computer end, mould by memory mirror card to be measured
The data and order that processor (the passing through debug tool) observation of the memory mirror card of quasi- computer terminal enters itself are remembered
Record is shown by the second on-line debugging tool of itself connection；
Two groups of data of record and order are compared host, if comparing consistent, the golden hand of memory mirror card to be measured
Refer to that the data-transformation facility of interface is normal, otherwise the data-transformation facility of the golden finger interface of memory mirror card to be measured is to be debugged.
It is understood that data and the write-in situation of order are tracked according to debug tool in the present embodiment,
Whether correct whether understanding data and order can be normally written and be written data in real time, to be verified golden finger interface
Afterwards, data can normal transmission and data transmission procedure whether there is situations such as damaging or losing, and then realize verifying gold
The purpose of the data-transformation facility of finger interface.Certainly, the above is only a kind of preferred embodiments, in other embodiments, can also
The data-transformation facility of golden finger interface is verified using other verification process, this is not limited by the present invention.
Specifically, read-write basic test further include:
Test read-write when being written and read between memory mirror card to be measured and the memory mirror card at simulation computer end
Performance parameter.Here readwrite performance parameter includes reading delay and writing delay, and certainly, readwrite performance parameter can also include other
Parameter, such as the accuracy etc. of processor analysis data, this is not limited by the present invention.
It is understood that for the debug tool of processor on the memory mirror card by simulation computer end, quickly
It positions and solves the problems, such as that there may be stuck in memory mirror before host co-operation, complete memory mirror memory mirror card
As institute functional commissioning of the card including host-side interface, need to test memory mirror card to be measured and as computer terminal
Readwrite performance parameter when being written and read between memory mirror card is simultaneously adjusted it, to reduce subsequent memory to be measured
Mirror image card and host carry out workload when joint debugging.Wherein here test readwrite performance parameter is it can be appreciated that global function tune
Examination.Detailed process are as follows: board B (the memory mirror card at simulation computer end) simulation framework sends read write command, and data pass through plate
After golden finger interface, data encoding processing and the memory bar slot interface of blocking A (memory mirror card to be measured), save to memory bar
In；Data are taken out from memory bar again, by memory bar slot interface, board A processor in data decoding and gold
After finger interface, the processor of board B is fed back to, the accuracy and read-write delay of the processor analysis data of board B, seeing is
It is no to meet the needs of system, if not satisfied, then continuing to debug, until functional performance meets.Certainly, the above is only one
The specific test process of kind, the present invention do not limit the specific test process of read-write basic test.
Specifically, above-mentioned data transmit-receive test includes:
Data transmit-receive performance parameter when carrying out data transmit-receive operation is tested between memory mirror card and host to be measured.Data
Transmitting-receiving performance parameter may include read-write delay or adjustable delay parameter of memory mirror card itself to be measured etc., the present invention couple
This is not construed as limiting.
It is understood that after the completion of the aforementioned function of memory mirror card to be measured is tested, it can be by memory mirror card insertion to be measured
Enter onto the memory bar slot of host mainboard, joint debugging is carried out with host, at this time according to association between memory mirror card and host to be measured
View carries out sending and receiving data test, when there is data acquisition incorrect, appropriate adjustment read-write delay or memory mirror to be measured
The adjustable delay parameter for blocking itself, until host system can operate normally.The purpose of the process is to make
Memory mirror card to be measured can carry out normal data transmit-receive with host, so that the memory mirror card after the completion of test can
In practical application, normally being communicated with host.
Preferably, memory mirror card to be measured is identical with the memory mirror card at simulation computer end.
It is understood that using two pieces of duplicate memory mirror cards in the present embodiment.One piece of card emulated memory control
Device function processed, simulation computer end, and other one piece of memory mirror card is (and to be measured as the equipment end for realizing memory mirror function
Memory mirror card).One Memory Controller Hub of processor simulation on the memory mirror card at simulation computer end accesses memory, access
The memory mirror card being inserted into the equipment end DIMM interface (i.e. memory bar slot interface) of this plate, such two pieces of memory mirror cards
Cooperation, one is from the Basic function testing of completion memory mirror card based on one.In this mode, data therebetween
When transmission, avoids because of situations such as the problems such as component is incompatible or agreement is incompatible caused error of transmission, improve survey
The reliability of examination.
Preferably, processor is FPGA (Field Programmable Gate Array, field-programmable gate array
Column).It is understood that staff can be facilitated to carry out local programming to processor as processor using FPGA, come real
Now meet whole commissioning processes of self-demand；Also, it is limited scarce that FPGA overcomes original programming device gate circuit number again
Point, thus can satisfy test item it is more in the case where test and debug program setting demand.Certainly, other classes can also be used
The processor of type, this is not limited by the present invention.
The present invention also provides a kind of memory mirror card debugging systems, including memory mirror card to be measured, simulation computer end
Memory mirror card, host；
After being inserted into memory bar on memory mirror card to be measured, the processor of the memory mirror card to be measured, for sending base
The instruction of plinth commissioning to carry out basic function commissioning to the memory mirror card to be measured；
It is inserted in the golden finger interface that basic commissioning result meets the requirement of fundamentals of forecasting commissioning and the memory mirror card to be measured
After the memory mirror card for entering simulation computer end, the processor of the memory mirror card at the simulation computer end is read for sending
Basic commissioning instruction is write, basis is written and read to the memory mirror card to be measured according to itself default read-write line up procedure to call
Commissioning；
After read-write commissioning result meets the requirement of read-write commissioning and the memory mirror card insertion to be measured enters host, the master
Machine carries out data transmit-receive commissioning to the memory mirror card to be measured until transmitting-receiving commissioning knot for generating transmitting-receiving commissioning instruction
Fruit meets default transmitting-receiving commissioning condition.
In a preferred embodiment, the system further include:
The first on-line debugging tool being connect with the memory mirror card to be measured；With the memory mirror at the simulation computer end
As the second on-line debugging tool of card connection.
Wherein, here the first on-line debugging tool and the second on-line debugging tool can be oscillograph.Certainly, at other
In embodiment, the first on-line debugging tool and the second on-line debugging tool can refer both to the oscillograph of the simulation of host.Exist above
The function of line debugging tool is to show to test result, and the instruction that can be inputted according to user comes to test result
Waveform carries out the operation such as parameter acquisition, and can also generate corresponding waveform generation instruction and be sent to corresponding memory mirror card
Deng.
It is apparent to those skilled in the art that for convenience and simplicity of description, the system of foregoing description
Specific work process, can refer to corresponding processes in the foregoing method embodiment, details are not described herein.
Above several specific embodiments are only the preferred embodiment of the present invention, and above several specific embodiments can be with
Any combination, the embodiment obtained after combination is also within protection scope of the present invention.It should be pointed out that for the art
For those of ordinary skill, relevant speciality technical staff deduced out in the case where not departing from spirit of that invention and concept thereof other change
Into and variation, should all be included in the protection scope of the present invention.
It should also be noted that, in the present specification, relational terms such as first and second and the like be used merely to by
One entity or operation are distinguished with another entity or operation, without necessarily requiring or implying these entities or operation
Between there are any actual relationship or orders.Moreover, the terms "include", "comprise" or its any other variant meaning
Covering non-exclusive inclusion, so that the process, method, article or equipment for including a series of elements not only includes that
A little elements, but also including other elements that are not explicitly listed, or further include for this process, method, article or
The intrinsic element of equipment.In the absence of more restrictions, the element limited by sentence "including a ...", is not arranged
Except there is also other identical elements in the process, method, article or apparatus that includes the element.
Claims (10)
1. a kind of memory mirror card adjustment method characterized by comprising
After being inserted into memory bar on memory mirror card to be measured, the processor of the memory mirror card to be measured sends basic commissioning instruction
To carry out basic function commissioning to the memory mirror card to be measured；
Mould is inserted into the golden finger interface that basic commissioning result meets the requirement of fundamentals of forecasting commissioning and the memory mirror card to be measured
After the memory mirror card of quasi- computer terminal, the processor of the memory mirror card at the simulation computer end, which is sent, reads and writes basic commissioning
Instruction, to call itself default read-write line up procedure to be written and read basic commissioning to the memory mirror card to be measured；
After read-write commissioning result meets the requirement of read-write commissioning and the memory mirror card insertion to be measured enters the host, the host
It generates transmitting-receiving commissioning to instruct, data transmit-receive commissioning is carried out to the memory mirror card to be measured until transmitting-receiving commissioning result meets in advance
If receiving and dispatching commissioning condition.
2. the method according to claim 1, wherein basic function test includes:
The data-transformation facility of the memory bar slot interface of the memory mirror card to be measured is tested；
The function of the processor of the memory mirror card to be measured is tested.
3. the method according to claim 1, wherein the read-write basic test includes:
The data-transformation facility of the golden finger interface of the memory mirror card to be measured is tested.
4. according to the method described in claim 3, it is characterized in that, the golden finger interface to the memory mirror card to be measured
The process tested of data-transformation facility specifically:
The processor observation of the memory mirror card to be measured enters itself data and order, if can be normally written described
It in the memory bar of memory mirror card to be measured, is written if normal, records data and order be written by the first of itself connection
On-line debugging tool is shown；
The data itself being written and order are fed back to the memory mirror at the simulation computer end by the memory mirror card to be measured
Card, the data and order that the processor observation of the memory mirror card at the simulation computer end enters itself carry out record and pass through
Second on-line debugging tool of itself connection is shown；
Two groups of data of record and order are compared the host, if comparing unanimously, the memory mirror card to be measured
The data-transformation facility of golden finger interface is normal, and otherwise the data-transformation facility of the golden finger interface of memory mirror card to be measured waits adjusting
Examination.
5. according to the method described in claim 3, it is characterized in that, the read-write basic test further include:
It tests when being written and read between the memory mirror card to be measured and the memory mirror card at the simulation computer end
Readwrite performance parameter.
6. the method according to claim 1, wherein data transmit-receive test includes:
Data transmit-receive performance parameter when carrying out data transmit-receive operation is tested between the memory mirror card to be measured and the host.
7. method according to claim 1-6, which is characterized in that the memory mirror card to be measured and the simulation
The memory mirror card of computer terminal is identical.
8. method according to claim 1-6, which is characterized in that the processor is field programmable gate array
FPGA。
9. a kind of memory mirror card debugging system, which is characterized in that the memory including memory mirror card to be measured, simulation computer end
Mirror image card, host；
After being inserted into memory bar on memory mirror card to be measured, the processor of the memory mirror card to be measured, for sending basic tune
Instruction is surveyed to carry out basic function commissioning to the memory mirror card to be measured；
Mould is inserted into the golden finger interface that basic commissioning result meets the requirement of fundamentals of forecasting commissioning and the memory mirror card to be measured
After the memory mirror card of quasi- computer terminal, the processor of the memory mirror card at the simulation computer end, for sending read-write base
The instruction of plinth commissioning is written and read basic tune to the memory mirror card to be measured according to itself default read-write line up procedure to call
It surveys；
After read-write commissioning result meets the requirement of read-write commissioning and the memory mirror card insertion to be measured enters host, the host is used
In generating transmitting-receiving commissioning instruction, data transmit-receive commissioning is carried out to the memory mirror card to be measured until transmitting-receiving commissioning result meets
Default transmitting-receiving commissioning condition.
10. system according to claim 9, which is characterized in that further include:
The first on-line debugging tool being connect with the memory mirror card to be measured；With the memory mirror card at the simulation computer end
Second on-line debugging tool of connection.
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| CN113376502A (en) * | 2021-04-26 | 2021-09-10 | 曙光信息产业(北京)有限公司 | FPGA board card testing method and device, server and computer readable storage medium |
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