CN113630289A - Test system and test method for improving production efficiency of gateway equipment - Google Patents
Test system and test method for improving production efficiency of gateway equipment Download PDFInfo
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Abstract
A test system for improving production efficiency of gateway equipment comprises: the system comprises a circuit control module and a plurality of same test modules, wherein the test modules are used for testing corresponding gateway equipment, and the circuit control module is used for receiving any test module signal and powering on or powering off the gateway equipment correspondingly tested by the test modules; the circuit control module comprises a signal processing unit and a plurality of switch units, the number of the switch units is equal to that of the test module, the output ends of the switch units are all used for being connected with the gateway equipment, the control ends of the switch units are all connected with the signal output end of the signal processing unit, and the switch is controlled by the control circuit to switch on and off the gateway equipment, so that the production efficiency is effectively improved compared with manual on-off electricity, and the labor cost is also reduced; the control circuit passes through and greatly shortens the joining time through signal transmission between the test module, further promotes production efficiency, reduces the cost of labor.
Description
Technical Field
The invention relates to the technical field of communication, in particular to a test system and a test method for improving the production efficiency of gateway equipment.
Background
The gateway device is also called an internetwork connector and a protocol converter. The gateway realizes network interconnection above a network layer, is complex network interconnection equipment, is only used for interconnection of two networks with different high-level protocols, and plays a very important role in the technical field of communication. In production, the gateway equipment is tested in a complex and complicated process, the gateway equipment needs to be powered on and off continuously in the test process, the power on and off needs to be operated manually, the production efficiency of gateway products is reduced, human resources are wasted, and the problem that how to improve the production efficiency of the gateway equipment on the premise of ensuring the quality of the gateway equipment is in urgent need of solution is solved.
Disclosure of Invention
Object of the application
In view of the above, an object of the present invention is to provide a testing system and a testing method for improving the production efficiency of a gateway device, so as to shorten the testing time and improve the production efficiency of the gateway device.
(II) technical scheme
The application discloses promote test system of gateway equipment production efficiency includes: the system comprises a circuit control module and a plurality of same test modules, wherein the test modules are used for testing corresponding gateway equipment, and the circuit control module is used for receiving any test module signal and powering on or powering off the gateway equipment correspondingly tested by the test modules;
the testing module comprises a power-on aging testing unit, an LED and key testing unit, a parameter testing unit, a coupling testing unit and a WIFI testing unit, wherein the power-on aging testing unit, the LED and key testing unit, the parameter testing unit, the coupling testing unit and the WIFI testing unit individually test corresponding gateway equipment according to a testing sequence;
the circuit control module includes signal processing unit and with a plurality of switch unit that test module quantity equals, signal processing unit has signal input part and signal output part, signal input part is used for receiving arbitrary test module signal, signal output part is used for being connected respectively with a plurality of same switch unit, a plurality of switch unit all include control end, input and output, a plurality of switch unit inputs all are used for being connected with the power, a plurality of switch unit outputs all are used for being connected with gateway equipment, a plurality of switch unit control ends all are connected with signal processing unit signal output part.
In a possible implementation manner, the signal processing unit includes an SOC chip having a signal receiving end and a signal output end, and the SOC chip receives a signal from the test module through the signal receiving end and outputs a signal through the output end to control the on/off of the switch unit.
In a possible implementation manner, the switch unit includes a triode and an MOS transistor, a base of the triode is connected with a signal output end of the signal processing unit, a collector of the triode is connected with a gate of the MOS transistor, and a source and a drain of the MOS transistor are respectively connected with the power supply and the gateway device.
In a possible implementation mode, a bypass capacitor is arranged on a connecting line of the drain electrode of the MOS tube and the gateway equipment.
In one possible embodiment, the plurality of switch units and the signal processing unit are packaged on the same circuit board.
In a possible implementation manner, the test module signal includes a power-off signal sent after the power-on aging test unit completes the test, a power-off signal sent after the LED and key test unit completes the test, a power-off signal sent after the parameter test unit completes the test, a power-off signal sent after the coupling test unit completes the test, and a power-off signal sent after the WIFI test unit completes the test.
In a possible implementation manner, the test module signal includes a power-off signal sent after the power-on aging test unit completes the test, a power-off signal sent after the LED and key test unit completes the test, a power-off signal sent after the parameter test unit completes the test, a power-off signal sent after the coupling test unit completes the test, and a power-off signal sent after the WIFI test unit completes the test.
In a possible implementation manner, after any unit in the test module completes the test and sends out a signal, the next unit is switched according to a preset sequence.
In a possible implementation manner, after any unit in the test module completes the test and sends a signal, the circuit control module receives the test module signal and powers off the gateway device to be tested corresponding to the test module, and the circuit control module automatically powers on the gateway device to be tested corresponding to the test module before switching to perform the next unit test according to the preset sequence.
In a possible implementation manner, the plurality of test modules are arranged at the same PC test end.
As a second aspect of the present application, a test method for improving the production efficiency of gateway equipment is further provided: the method comprises the following steps:
and S1, correspondingly connecting the circuit control module, the test module, the power supply and the gateway equipment to be tested and enabling the circuit control module, the test module and the gateway equipment to be tested to be in a power-on state.
S2, starting a test module power-on aging test unit to test the gateway equipment to be tested, after the power-on aging test unit confirms that the power-on aging test unit is communicated with the corresponding gateway equipment to be tested, carrying out power-on test on the gateway equipment to be tested according to preset time and preset power-on voltage, after the power-on aging test unit finishes the test, sending a power-off signal to a signal processing unit by the power-on aging test unit and switching the power-off signal to an LED and a key test unit, and after receiving the power-off signal of the power-on aging test unit, the signal processing unit powers off the corresponding gateway equipment to be tested and powers on the corresponding gateway equipment to be tested within interval time;
s3, the testing module LED and the key testing unit are started to test whether the keys and the LED indicating lamps on the gateway equipment to be tested can work normally, after the LED and the key testing unit complete testing, the LED and the key testing unit send power-off signals to the signal processing unit and switch to the parameter testing unit, the signal processing unit receives the power-off signals of the LED and the key testing unit, then the corresponding gateway equipment to be tested is powered off, and the corresponding gateway equipment to be tested is powered on within the interval time;
s4, starting a test module parameter test unit to write parameters into the gateway equipment to be tested and test the parameters, after the parameter test unit finishes testing, the parameter test unit sends a power-off signal to a signal processing unit and switches the power-off signal to a coupling test unit, and after the signal processing unit receives the power-off signal of the parameter test unit, the signal processing unit powers off the corresponding gateway equipment to be tested and powers on the corresponding gateway equipment to be tested in interval time;
s5, starting the test module coupling test unit to test the antenna power of the gateway device to be tested, after the coupling test unit finishes testing, the coupling test unit sends a power-off signal to the signal processing unit and switches the power-off signal to the WIFI test unit, and after the signal processing unit receives the power-off signal of the coupling test unit, the signal processing unit powers off the corresponding gateway device to be tested and powers on the corresponding gateway device to be tested in interval time;
s6, starting a WIFI testing unit of the testing module to calibrate and test the WIFI module of the gateway device to be tested, after the WIFI testing unit finishes testing, sending a power-off signal to a signal processing unit by the WIFI testing unit, after receiving the power-off signal of the WIFI testing unit, powering off the corresponding gateway device to be tested by the signal processing unit, and powering on the corresponding gateway device to be tested in interval time;
and S7, manually checking, and separating the gateway equipment to be tested from the circuit control module, the test module and the power supply after confirming that the gateway equipment to be tested completes all tests.
(III) advantageous effects
According to the test system for improving the production efficiency of the gateway equipment, the gateway equipment to be tested is tested through the test unit included by the test module, the necessary part of the gateway equipment is tested on the premise of ensuring the quality, and the production efficiency is improved; the gateway equipment is switched on and off by controlling the switch through the control circuit, so that the production efficiency can be effectively improved and the labor cost can be reduced compared with manual power on and off; the control circuit greatly shortens the connection time through signal transmission with the test module, further improves the production efficiency and reduces the labor cost; the signal processing unit is arranged between the plurality of test modules and the corresponding control switches, signals of different test modules can be distinguished simultaneously, and the production efficiency can be further improved and the production cost can be reduced by simultaneously powering on and powering off the plurality of gateway devices of the plurality of control switches through one signal processing unit.
Additional advantages, objects, and features of the invention will be set forth in part in the description which follows and in part will become apparent to those having ordinary skill in the art upon examination of the following or may be learned from practice of the invention, the objects and other advantages of the invention being set forth in the description which follows.
Drawings
FIG. 1 is a system diagram of the present invention;
FIG. 2 is a system diagram of a control circuit module of the present invention;
FIG. 3 is a circuit diagram of a first switching unit of the present invention;
FIG. 4 is a test flow diagram of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
As shown in fig. 1, the present application discloses a specific embodiment of a test system for improving production efficiency of gateway devices, which includes: the system comprises a circuit control module and a plurality of same test modules, wherein the test modules are used for testing corresponding gateway devices, namely in the test process, one test module correspondingly tests one gateway device, namely, first to eighth test modules in fig. 1 respectively correspond to first to eighth gateway devices to be tested, and the circuit control module is used for receiving any test module signal and powering on and powering off the gateway device correspondingly tested by the test module;
the testing module comprises a power-on aging testing unit, an LED and key testing unit, a write parameter testing unit, a coupling testing unit and a WIFI testing unit, wherein the power-on aging testing unit is used for carrying out power-on aging testing on the gateway equipment to be tested so as to ensure safe use, the LED and key testing unit is used for testing whether the keys and the LED indicator lamps on the gateway equipment to be tested can normally work, the parameter testing unit is used for writing parameters into the gateway equipment to be tested and testing the gateway equipment to be tested, the coupling testing unit is used for testing the antenna power of the gateway equipment to be tested, and the WIFI testing unit is used for calibrating the WIFI module of the gateway equipment to be tested.
The power-on aging test unit, the LED and key test unit, the parameter test unit, the coupling test unit and the WIFI test unit individually test the corresponding gateway equipment to be tested according to a test sequence, the test sequence is that firstly, the equipment is subjected to aging test through the power-on aging test unit, a power supply is communicated with the gateway equipment to be tested, and the gateway equipment to be tested is subjected to power-on test according to preset time and preset power-on voltage, then the LED and key test unit tests the LED indicator light and the key of the gateway equipment to be tested, and the callback function is called to test the LED indicator light and the key, secondly, writing parameters into the gateway equipment to be tested for the parameter testing unit, testing the gateway equipment to be tested, further testing the antenna power of the gateway equipment to be tested for the coupling testing unit, and finally calibrating a WIFI module of the gateway equipment to be tested for the WIFI testing unit.
The test module signals comprise power-off signals sent after the power-on aging test unit completes the test, power-off signals sent after the LED and key test unit completes the test, power-off signals sent after the parameter test unit completes the test, power-off signals sent after the coupling test unit completes the test and power-off signals sent after the WIFI test unit completes the test; when any unit in the test module completes the test and sends out a power-off signal, the test units in the test module are switched according to the test sequence to perform the next unit test, and in the test process, after any unit in the test module completes the test and sends out the power-off signal, the circuit control module receives the test module signal and powers off the gateway equipment correspondingly tested by the test module, and automatically powers on the gateway equipment correspondingly tested by the circuit control module before the next unit test is switched according to the preset sequence, and the test units or the test modules do not need to send power-on signals to the circuit control module.
The circuit control module comprises a signal processing unit and a plurality of switch units with the number equal to that of the test modules, i.e., first to eighth switching units, the signal processing unit having a signal input terminal and a signal output terminal, the signal input end is used for receiving any test module signal, the signal output end is used for being respectively connected with a plurality of same switch units, the switch units comprise control ends, input ends and output ends, the input ends of the switch units are all used for being connected with a power supply, the output ends of the switch units are all used for being connected with gateway equipment, the control ends of the switch units are all connected with the signal output end of the signal processing unit, the circuit control module receives the signals of the test module and is not limited to time-sharing receiving and simultaneous receiving, and the circuit control module only needs to correspondingly feed back the signals sent by the test module to the gateway equipment correspondingly tested by the test module.
Compared with the prior art, the gateway equipment is only required to be respectively communicated with the test module and the circuit control module in the initial test stage, the gateway equipment is controlled to be powered on and powered off through the control circuit control switch in the middle test process, and compared with the method that the power connector is manually pulled out to be powered on and powered off every time in the test process, the production efficiency can be effectively improved, and the labor cost is also reduced; the control circuit greatly shortens the connection time through signal transmission with the test module, further improves the production efficiency and reduces the labor cost; the signal processing unit is arranged between the plurality of test modules and the corresponding control switches, signals of different test modules can be distinguished simultaneously, and the production efficiency can be further improved and the production cost can be reduced by simultaneously powering on and powering off the plurality of gateway devices of the plurality of control switches through one signal processing unit.
As shown in fig. 2-3, the signal processing unit includes an SOC chip having a signal receiving end and a signal output end, the SOC chip receives a signal from the testing module through the signal receiving end and outputs a signal through the output end to control the on/off of the switch unit, the switch unit includes a transistor and an MOS transistor, the base of the transistor is connected to the signal output end of the signal processing unit, the collector of the transistor is connected to the gate of the MOS transistor, the source and the drain of the MOS transistor are respectively connected to the power supply and the gateway device, the MOS transistor in the circuit functions as a switch, the transistor is used to control the gate voltage of the MOS transistor, when the SOC chip receives a signal of any testing device, the output end of the SOC chip correspondingly outputs a high level or a low level to the switch unit corresponding to the testing device, and when the high level or the low level is amplified by the transistor, the gate voltage of the MOS transistor is changed, and then the MOS transistors are turned on or off, in this embodiment, the output end of the SOC chip is provided with connection ports having the same number as the switch units, and after any test module sends an on-off signal, the SOC chip sends a high level or a low level through the corresponding connection port to control the MOS transistor correspondingly connected to the connection port. In this embodiment, a bypass capacitor is disposed on a connection line between the drain of the MOS transistor and the gateway device to filter out the high-frequency current. In order to realize integration, in this embodiment, the switch units and the signal processing unit are packaged on the same circuit board, and in the testing process, after any unit in the testing module is tested and sends out a power-off signal, the circuit control module receives the testing module signal and powers off the gateway device corresponding to the testing module, and before switching to the next unit according to the preset sequence for testing, the circuit control module automatically powers on the gateway device corresponding to the testing without sending a power-on signal to the circuit control module by the testing unit or the testing module, and under the control of the SOC chip, the power-off and power-on time interval can be controlled in a very short time, and the time interval for powering off and then on the MOS transistor can be controlled by the time setting.
In this embodiment, the plurality of test modules are disposed at the same PC test end.
Based on the above system, an embodiment of the present invention further provides a testing method for improving production efficiency of gateway devices, where as shown in fig. 4, the testing method includes the following steps:
and S1, correspondingly connecting the circuit control module, the test module, the power supply and the gateway equipment to be tested and enabling the circuit control module, the test module and the gateway equipment to be tested to be in a power-on state, wherein the test module is connected with the corresponding gateway equipment to be tested, a signal processing unit in the circuit control module is connected with the test module, and a switch control unit in the circuit control module is respectively connected with the power supply and the corresponding gateway equipment to be tested.
S2, starting a testing module power-on aging testing unit to test the gateway equipment to be tested, after the testing module confirms that the testing module is communicated with the corresponding gateway equipment to be tested, carrying out power-on testing on the gateway equipment to be tested according to preset time and preset power-on voltage, wherein the preset time is determined according to the quantity of the mass production, the preset power-on voltage is set to be 11.5V-12V, after the power-on aging testing unit completes testing, the power-on aging testing unit sends a power-off signal to a signal processing unit and switches the power-on signal to an LED and key testing unit, and after the signal processing unit receives the power-off signal of the power-on aging testing unit, the corresponding gateway equipment to be tested is powered off and is powered on in interval time;
s3, the testing module LED and the key testing unit are started to test whether the keys and the LED indicator lamps on the gateway equipment to be tested can work normally, after the LED and the key testing unit complete testing, the LED and the key testing unit send power-off signals to the signal processing unit and switch to the parameter testing unit, the signal processing unit receives the power-off signals of the LED and the key testing unit and then powers off the corresponding gateway equipment to be tested, and the gateway equipment to be tested is powered on within interval time, and the specific testing steps of the LED and the key testing unit for testing the gateway equipment to be tested are as follows: s31, obtaining the mutual exclusion lock, when the plurality of gateway devices to be tested perform normal work tests on the keys and the LED indicator lamps on the gateway devices to be tested, the gateway devices to be tested are firstly tested, S32 calls a callback function to execute an instruction of turning on/off the LED indicator lamps, S33 calls the callback function to perform key test, S34 obtains the key test result to judge whether the test is passed, S35 releases the mutual exclusion lock of the gateway devices to be tested which passes the test if the key LED indicator lamps pass the test, and the test of the LED and key test unit is completed.
S4, starting a test module parameter test unit to write parameters into the gateway equipment to be tested and test the gateway equipment, after the parameter test unit completes the test, the parameter test unit sends a power-off signal to a signal processing unit and switches to a coupling test unit, after the signal processing unit receives the power-off signal of the parameter test unit, the signal processing unit powers off the corresponding gateway equipment to be tested and powers on the corresponding gateway equipment to be tested in the interval time, and the specific steps of the parameter test unit to test the gateway equipment to be tested are as follows: s41, reading a parameter command to be written, S42, executing the parameter command to be written into the gateway equipment to be tested, S43, judging whether the writing of the result is successful according to a returned value during the writing, and if so, completing the test of the parameter test unit;
s5, starting a test module coupling test unit to test the antenna power of the gateway device to be tested, after the coupling test unit finishes testing, the coupling test unit sends a power-off signal to a signal processing unit and switches to a WIFI test unit, after the signal processing unit receives the power-off signal of the coupling test unit, the corresponding gateway device to be tested is powered off, and the corresponding gateway device to be tested is powered on in interval time, wherein the concrete steps of the coupling test unit to test the gateway device to be tested are as follows: s51, calling the channel number to obtain an antenna power value, S52, judging whether the antenna power value is in a preset range, and if so, completing the coupling test unit test;
s6, the WIFI testing unit of the testing module is started to calibrate and test the WIFI module of the gateway device to be tested, after the WIFI testing unit completes testing, the WIFI testing unit sends a power-off signal to the signal processing unit, the signal processing unit receives the power-off signal of the WIFI testing unit and then powers off the corresponding gateway device to be tested, and powers on the corresponding gateway device to be tested in the interval time, and the specific steps of testing the gateway device to be tested by the WIFI testing unit are as follows: s61, obtaining an antenna power value by using the ideal DAC value, wherein the antenna power value is the antenna power value within a preset range after the coupling test, S61, confirming whether the antenna power value obtained by the ideal DAC value is within the preset range, S63, if the antenna power value obtained by the ideal DAC value is not within the preset range, adjusting the ideal DAC value within a specified range to enable the antenna power value to be within the preset range, storing the adjusted ideal DAC value into a data pool, if the antenna power value obtained by the ideal DAC value is within the preset range, directly storing the ideal DAC value into the data pool, and S63, obtaining a slope value through a slope calculation function and storing the slope value to finish the WIFI test unit test.
And S7, manually checking, and separating the gateway equipment to be tested from the circuit control module, the test module and the power supply after confirming that the gateway equipment to be tested completes all tests.
The above description is only for the specific embodiments of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered within the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (10)
1. The utility model provides a promote test system of gateway device production efficiency which characterized in that includes: the system comprises a circuit control module and a plurality of same test modules, wherein the test modules are used for testing corresponding gateway equipment, and the circuit control module is used for receiving any test module signal and powering on or powering off the gateway equipment correspondingly tested by the test modules;
the testing module comprises a power-on aging testing unit, an LED and key testing unit, a parameter testing unit, a coupling testing unit and a WIFI testing unit, wherein the power-on aging testing unit, the LED and key testing unit, the parameter testing unit, the coupling testing unit and the WIFI testing unit individually test corresponding gateway equipment according to a testing sequence;
the circuit control module includes signal processing unit and with a plurality of switch unit that test module quantity equals, signal processing unit has signal input part and signal output part, signal input part is used for receiving arbitrary test module signal, signal output part is used for being connected respectively with a plurality of same switch unit, a plurality of switch unit all include control end, input and output, a plurality of switch unit inputs all are used for being connected with the power, a plurality of switch unit outputs all are used for being connected with gateway equipment, a plurality of switch unit control ends all are connected with signal processing unit signal output part.
2. The testing system for improving the production efficiency of the gateway device according to claim 2, wherein the signal processing unit comprises an SOC chip having a signal receiving end and a signal output end, the SOC chip receives the signal from the testing module through the signal receiving end and outputs the signal through the output end to control the on/off of the switch unit.
3. The system according to claim 2, wherein the switching unit comprises a transistor and an MOS transistor, a base of the transistor is connected to the signal output terminal of the signal processing unit, a collector of the transistor is connected to a gate of the MOS transistor, and a source and a drain of the MOS transistor are respectively connected to the power supply and the gateway device.
4. The system according to claim 3, wherein a bypass capacitor is disposed on a connection line between the drain of the MOS transistor and the gateway device.
5. The testing system for improving the production efficiency of the gateway device according to claim 2, wherein the plurality of switch units and the signal processing unit are packaged on the same circuit board.
6. The testing system for improving the production efficiency of the gateway device according to claim 1, wherein the testing module signals include a power-off signal sent by the power-on aging testing unit after the testing is completed, a power-off signal sent by the LED and key testing unit after the testing is completed, a power-off signal sent by the parameter testing unit after the testing is completed, a power-off signal sent by the coupling testing unit after the testing is completed, and a power-off signal sent by the WIFI testing unit after the testing is completed.
7. The testing system for improving the production efficiency of the gateway device according to claim 6, wherein after any unit in the testing module completes the test and sends a signal, the next unit is switched according to a preset sequence.
8. The system according to claim 7, wherein after any unit in the test module completes the test and sends a signal, the circuit control module receives the test module signal and powers off the gateway device to be tested corresponding to the test module, and the circuit control module automatically powers on the gateway device to be tested corresponding to the test module before the next unit is switched according to the predetermined sequence for testing.
9. The testing system for improving the production efficiency of the gateway device according to claim 1, wherein the plurality of testing modules are disposed at a same PC testing end.
10. A test method for improving the production efficiency of gateway equipment comprises the following steps: the method is characterized by comprising the following steps:
and S1, correspondingly connecting the circuit control module, the test module, the power supply and the gateway equipment to be tested and enabling the circuit control module, the test module and the gateway equipment to be tested to be in a power-on state.
S2, starting a test module power-on aging test unit to test the gateway equipment to be tested, after the power-on aging test unit confirms that the power-on aging test unit is communicated with the corresponding gateway equipment to be tested, carrying out power-on test on the gateway equipment to be tested according to preset time and preset power-on voltage, after the power-on aging test unit finishes the test, sending a power-off signal to a signal processing unit by the power-on aging test unit and switching the power-off signal to an LED and a key test unit, and after receiving the power-off signal of the power-on aging test unit, the signal processing unit powers off the corresponding gateway equipment to be tested and powers on the corresponding gateway equipment to be tested within interval time;
s3, the testing module LED and the key testing unit are started to test whether the keys and the LED indicating lamps on the gateway equipment to be tested can work normally, after the LED and the key testing unit complete testing, the LED and the key testing unit send power-off signals to the signal processing unit and switch to the parameter testing unit, the signal processing unit receives the power-off signals of the LED and the key testing unit, then the corresponding gateway equipment to be tested is powered off, and the corresponding gateway equipment to be tested is powered on within the interval time;
s4, starting a test module parameter test unit to write parameters into the gateway equipment to be tested and test the parameters, after the parameter test unit finishes testing, the parameter test unit sends a power-off signal to a signal processing unit and switches the power-off signal to a coupling test unit, and after the signal processing unit receives the power-off signal of the parameter test unit, the signal processing unit powers off the corresponding gateway equipment to be tested and powers on the corresponding gateway equipment to be tested in interval time;
s5, starting the test module coupling test unit to test the antenna power of the gateway device to be tested, after the coupling test unit finishes testing, the coupling test unit sends a power-off signal to the signal processing unit and switches the power-off signal to the WIFI test unit, and after the signal processing unit receives the power-off signal of the coupling test unit, the signal processing unit powers off the corresponding gateway device to be tested and powers on the corresponding gateway device to be tested in interval time;
s6, starting a WIFI testing unit of the testing module to calibrate and test the WIFI module of the gateway device to be tested, after the WIFI testing unit finishes testing, sending a power-off signal to a signal processing unit by the WIFI testing unit, after receiving the power-off signal of the WIFI testing unit, powering off the corresponding gateway device to be tested by the signal processing unit, and powering on the corresponding gateway device to be tested in interval time;
and S7, manually checking, and separating the gateway equipment to be tested from the circuit control module, the test module and the power supply after confirming that the gateway equipment to be tested completes all tests.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202110803762.5A CN113630289B (en) | 2021-07-15 | 2021-07-15 | Test system and test method for improving production efficiency of gateway equipment |
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| CN202110803762.5A CN113630289B (en) | 2021-07-15 | 2021-07-15 | Test system and test method for improving production efficiency of gateway equipment |
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| CN113630289A true CN113630289A (en) | 2021-11-09 |
| CN113630289B CN113630289B (en) | 2023-06-30 |
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| CN202110803762.5A Active CN113630289B (en) | 2021-07-15 | 2021-07-15 | Test system and test method for improving production efficiency of gateway equipment |
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| US20100153054A1 (en) * | 2008-12-12 | 2010-06-17 | Advantest Corporation | Test apparatus and diagnosis method |
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| CN109342867A (en) * | 2018-09-03 | 2019-02-15 | 惠州市德赛西威智能交通技术研究院有限公司 | On-off electric test device |
| CN111294255A (en) * | 2020-01-22 | 2020-06-16 | 上海极熵数据科技有限公司 | Gateway testing method and storage medium |
| CN112213581A (en) * | 2020-09-28 | 2021-01-12 | 云谷（固安）科技有限公司 | Aging test device, method and system |
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| US20100153054A1 (en) * | 2008-12-12 | 2010-06-17 | Advantest Corporation | Test apparatus and diagnosis method |
| CN104866418A (en) * | 2014-02-26 | 2015-08-26 | 研祥智能科技股份有限公司 | Automatic testing method and system |
| CN206411199U (en) * | 2016-11-16 | 2017-08-15 | 上海移为通信技术股份有限公司 | Electronic equipment machine ageing tester |
| CN109342867A (en) * | 2018-09-03 | 2019-02-15 | 惠州市德赛西威智能交通技术研究院有限公司 | On-off electric test device |
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| CN112213581A (en) * | 2020-09-28 | 2021-01-12 | 云谷（固安）科技有限公司 | Aging test device, method and system |
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Address after: 518000 Room 501, block a, building 8, Shenzhen International Innovation Valley, Dashi Road, Xili community, Xili street, Nanshan District, Shenzhen, Guangdong Patentee after: Shenzhen Yilian Unlimited Technology Co.,Ltd. Address before: 518000 Room 501, block a, building 8, Shenzhen International Innovation Valley, Dashi Road, Xili community, Xili street, Nanshan District, Shenzhen, Guangdong Patentee before: SHENZHEN COMNECT TECHNOLOGY CO.,LTD. |