CN209372983U - Microcontroller pin automatically testing parameters platform - Google Patents
Microcontroller pin automatically testing parameters platform Download PDFInfo
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- CN209372983U CN209372983U CN201821621482.2U CN201821621482U CN209372983U CN 209372983 U CN209372983 U CN 209372983U CN 201821621482 U CN201821621482 U CN 201821621482U CN 209372983 U CN209372983 U CN 209372983U
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Abstract
The utility model relates to a kind of microcontroller pin automatically testing parameters platforms, the platform is connect with chip under test, the test platform includes digital multimeter, electronic load, digital power and I/O pin automatically testing platform control panel, the I/O pin automatically testing platform control panel respectively with digital multimeter, chip under test connection, the digital multimeter by relay switch respectively with electronic load, digital power, chip under test connection, the electronic load is connect with I/O pin automatically testing platform control panel, the digital power by relay switch respectively with digital power, chip under test connection.Compared with prior art, the utility model has many advantages, such as to simplify testing process without taking test circuit built again in each test.
Description
Technical field
The utility model relates to microcontroller pin parameter testing technologies, more particularly, to a kind of microcontroller pin parameter
Automatically testing platform.
Background technique
Microcontroller pin parameter testing at present substantially manually put up circuit recycle relevant measuring instrument into
Row measurement, main shortcoming following points:
Testing process is complicated: requiring to build circuit again before test every time, and the circuit theory of different parameters test is not
Together, therefore the building of circuit, debug and the operation of test process is all more time-consuming, tester also need to have it is relevant specially
Industry knowledge and good psychological quality could complete this test job.
Testing expense is expensive: the curve of some failure analyses needs to test mass data if manual testing, tested compared with
For complexity, test result deviation is larger, and test in this case can transfer to other testing factory's Household precise instruments to be tested,
But testing expense is high, general only just to will use when analyzing specific question.
Measuring accuracy is limited: some parameter testings in the identical situation of measuring instrument by environment and operating process influenced compared with
Greatly, make the precision of test data limited.
Utility model content
The purpose of this utility model is exactly to provide a kind of microcontroller to overcome the problems of the above-mentioned prior art
Pin automatically testing parameters platform.
The purpose of this utility model can be achieved through the following technical solutions:
A kind of microcontroller pin automatically testing parameters platform, the platform are connect with chip under test, the test platform
It is automatic including digital multimeter, electronic load, digital power and I/O pin automatically testing platform control panel, the I/O pin
Test platform control panel is connect with digital multimeter, chip under test respectively, and the digital multimeter passes through relay switch point
It is not connect with electronic load, digital power, chip under test, the electronic load and I/O pin automatically testing platform control panel
Connection, the digital power are connect with digital power, chip under test respectively by relay switch.
Preferably, the digital multimeter is six Semi-digital multimeters.
Preferably, the electronic load is programmable electronic load.
Preferably, the digital power is programmable digital power supply.
Preferably, the digital multimeter passes sequentially through relay switch K3, relay switch K1 and chip under test
I/O pin connection, the digital multimeter pass sequentially through the anode of relay switch K4, relay switch K2 and electronic load
Connection, the I/O pin automatically testing platform control panel pass through serial ports and digital multimeter, electronic load and tested core respectively
Piece connection, constitutes microcontroller pin sourcing current test device.
Preferably, the digital multimeter passes sequentially through relay switch K3, relay switch K1 and chip under test
I/O pin connection, the digital multimeter pass sequentially through the cathode of relay switch K4, relay switch K2 and electronic load
Connection, the anode of the digital power are connect with the anode of electronic load, the I/O pin automatically testing platform control panel
It is connect respectively by serial ports with digital multimeter, electronic load and chip under test, constitutes microcontroller pin sink current test dress
It sets.
Preferably, the digital multimeter passes sequentially through relay switch K5, relay switch K1 and chip under test
The connection of I/O pin output interface, the electronic load anode pass sequentially through relay switch K2, relay switch K7 and are tested
The I/O pin input interface of chip connects, and the I/O pin automatically testing platform control panel passes through serial ports and digital versatile respectively
Table, digital power are connected with chip under test, constitute microcontroller pin incoming level characteristic test device.
Preferably, the digital multimeter passes sequentially through relay switch K12, relay switch K5 and digital simulation and turns
Parallel operation DAC connection, the digital multimeter are connected by the anode of relay switch K13 and digital power, the number
The anode of power supply is connected by the VDD pin of relay switch K15 and chip under test, and the digital analog converter successively leads to
Cross the IO pin connection of relay switch K5, relay switch K14 and chip under test, the VSS pin of the chip under test according to
It is secondary to be followed by between relay switch K14 and chip under test I/O pin by relay switch K11, relay switch K9, it is described
The VSS pin of chip under test connect between relay switch K14 and relay switch K5 by relay switch K10, it is described
I/O pin automatically testing platform control panel connect respectively with digital analog converter DAC, digital power and chip under test, constitute
Microcontroller pin diode characteristic test device.
Compared with prior art, the utility model has the advantage that
Without taking test circuit built again in each test, testing process is simplified；Without artificial excessive participation, reduce
The phenomenon that maloperation and test data record error in test process；Test platform survey can be used in partial failure analysis
Examination, reduces high testing expense；Reduce influence of the manual operation to measuring accuracy, improves measuring accuracy；Automatic test stream
Journey, increases test data point at convenient, fast, the efficient less testing time.
Detailed description of the invention
The test structure chart of Fig. 1 microcontroller pin sourcing current；
The test structure chart of Fig. 2 microcontroller pin sink current；
The test structure chart of Fig. 3 microcontroller pin incoming level characteristic；
Fig. 4 microcontroller pin diode characteristic tests structure chart.
Specific embodiment
The following will be combined with the drawings in the embodiments of the present invention, carries out the technical scheme in the embodiment of the utility model
It clearly and completely describes, it is clear that described embodiment is a part of the embodiment of the utility model, rather than is all implemented
Example.Based on the embodiments of the present invention, those of ordinary skill in the art institute without making creative work
The every other embodiment obtained all should belong to the range of the utility model protection.
The utility model controls the stream of various accurate experimental instrument and equipment simulation manual testings using Microcomputer Technology
The automatic test of Cheng Shixian microcontroller pin parameter, and be uploaded to computer after test data is handled and generate files and reports.
Measuring instrument used in this programme includes six Semi-digital multimeters, programmable electronic load, programmable digital
The precision of power supply, measuring instrument directly affects the precision of test data, and measuring instrument, but measuring instrument can be selected according to testing requirement
Device must have programing function.
After being communicatively coupled between test platform and each instrument, select test pattern, test platform can by it is miniature after
Electric control switch switching keeps test circuit corresponding with test pattern, then according to program-controlled Row control instrument automatic measurement
Relevant parameter, and data are uploaded to computer terminal by treated.
As Figure 1-Figure 4, a kind of microcontroller pin automatically testing parameters platform, the platform and chip under test RB005
Connection, the test platform include digital multimeter RB001, electronic load RB002, digital power RB003 and I/O pin from
Dynamic test platform control panel RB004, the I/O pin automatically testing platform control panel RB004 respectively with digital multimeter
RB001, chip under test RB005 connection, the digital multimeter RB001 by relay switch respectively with electronic load
RB002, digital power RB003, chip under test RB005 connection, the electronic load RB002 and I/O pin are tested flat automatically
The RB004 connection of platform control panel, the digital power RB003 by relay switch respectively with digital power RB003, tested core
Piece RB005 connection.
The digital multimeter RB001 is six Semi-digital multimeters.The electronic load RB002 is programmable electricity
Son load.The digital power RB003 is programmable digital power supply.
If Fig. 1 shows, the digital multimeter RB001 passes sequentially through relay switch K3, relay switch K1 and is tested
The I/O pin of chip RB005 connects, and the digital multimeter RB001 passes sequentially through relay switch K4, relay switch K2
It is connect with the anode of electronic load RB002, the I/O pin automatically testing platform control panel RB004 passes through serial ports and number respectively
Word multimeter RB001, electronic load RB002 are connected with chip under test RB005, constitute microcontroller pin sourcing current test dress
It sets.
If Fig. 2 shows, the digital multimeter RB001 passes sequentially through relay switch K3, relay switch K1 and is tested
The I/O pin of chip RB005 connects, and the digital multimeter RB001 passes sequentially through relay switch K4, relay switch K2
It is connect with the cathode of electronic load RB002, the anode of the digital power RB003 connects with the anode of electronic load RB002
It connects, the I/O pin automatically testing platform control panel RB004 passes through serial ports and digital multimeter RB001, electronic load respectively
RB002 is connected with chip under test RB005, constitutes microcontroller pin sink current test device.
If Fig. 3 shows, the digital multimeter RB001 passes sequentially through relay switch K5, relay switch K1 and is tested
The I/O pin output interface of chip RB005 connects, the electronic load RB002 anode pass sequentially through relay switch K2, after
Electric switch K7 is connect with the I/O pin input interface of chip under test RB005, the I/O pin automatically testing platform control panel
RB004 passes through serial ports respectively and connect with digital multimeter RB001, digital power RB003 and chip under test RB005, constitutes micro-control
Device pin incoming level characteristic test device processed.
If Fig. 4 shows, the digital multimeter RB001 passes sequentially through relay switch K12, relay switch K5 and number
The DAC connection of word analog converter, the digital multimeter RB001 pass through relay switch K13's and digital power RB003
Anode connection, the anode of the digital power RB003 pass through the VDD pin of relay switch K15 and chip under test RB005
Connection, the digital analog converter pass sequentially through relay switch K5, relay switch K14 and chip under test RB005's
I/O pin connection, after the VSS pin of the chip under test RB005 passes sequentially through relay switch K11, relay switch K9
It connects between relay switch K14 and chip under test RB005IO pin, the VSS pin of the chip under test RB005 passes through
Relay switch K10 connects between relay switch K14 and relay switch K5, the I/O pin automatically testing platform control
Plate RB004 is connect with digital analog converter DAC, digital power RB003 and chip under test RB005 respectively, constitutes microcontroller
Pin diode characteristic test device.
The micro- course of work of the utility model the following steps are included:
Init state can be entered by powering on rear test platform, can then select corresponding test pattern on computers；
After selecting test pattern, test platform can switch to corresponding test pattern by the on-off of relay switch；
Test platform controls each measuring instrument and completes test operation according to preset testing process, and test data is sent
To computer terminal.
The test pattern specifically includes:
Test pattern one, test platform control relay switch and test circuit are switched to the survey of microcontroller pin sourcing current
Trial assembly is set, and is that push-pull output is high by tested microcontroller pin configuration, then controls programmable electronic load according to default stream
Cheng Jinhang is divided and by partial pressure value Real-time Feedback to test platform, while six Semi-digital multimeter real-time monitoring curent changes will
Current value feeds back to test platform, and test platform will be sent to computer terminal after the data processing received, then carry out next
Group test, until completing the test of all pins；
Test pattern two, test platform control relay switch and test circuit are switched to the survey of microcontroller pin sink current
Trial assembly is set, and is that push-pull output is low by tested microcontroller pin configuration, then controls programmable electronic load according to default stream
Cheng Jinhang is divided and by partial pressure value Real-time Feedback to test platform, while six Semi-digital multimeter real-time monitoring curent changes will
Current value feeds back to test platform, and test platform will be sent to computer terminal after the data processing received, then carry out next
Group test, until completing the test of all pins；
Test pattern three, test platform control relay switch and are switched to microcontroller pin incoming level for circuit is tested
Characteristic test device, and tested microcontroller pin is divided into two groups, first group is configured to input state, second group be configured to it is defeated
It does well and is the mapping of first group of pin, then control programmable digital power supply to first group of pin foot and input a constantly change
The voltage value of change and to the voltage real-time monitoring；The voltage change of six Semi-digital multimeters then real-time monitoring output pin simultaneously
Monitoring result is simultaneously fed back to test platform by situation, and when output pin has low and high level transformation, test platform be will record at this time
Input voltage value, and be sent to computer terminal after test data is handled, then carry out next group of test, until completing institute
There is the test of pin；
Test pattern four, test platform control relay switch and test circuit are switched to microcontroller pin diode spy
Then system safety testing device controls programmable digital power supply and provides the voltage constantly increased, and voltage value Real-time Feedback is returned
Come；Test platform can control the electric current in six Semi-digital multimeter observation circuits at the same time, and by current value Real-time Feedback
Back, it will terminate and test when test platform receives the current value of feedback or voltage value is greater than or equal to limit value, and will connect
It is uploaded to computer terminal after the test data processing received, then carries out next group of test, until completing the test of all pins.
The interface of measuring instrument and test platform is connected in advance, entire test process is after selecting test pattern all in accordance with journey
Flow control journey is automatically performed, and is participated in without artificial, and corresponding test point is done in test data export in computer terminal after the completion of test
Analysis.
Above description is only a specific implementation of the present invention, but the protection scope of the utility model is not limited to
In this, anyone skilled in the art within the technical scope disclosed by the utility model, can be readily occurred in various
Equivalent modifications or substitutions, these modifications or substitutions should be covered within the scope of the utility model.Therefore, this is practical
Novel protection scope should be subject to the protection scope in claims.
Claims (8)
1. a kind of microcontroller pin automatically testing parameters platform, the platform are connect with chip under test (RB005), feature exists
In the test platform includes digital multimeter (RB001), electronic load (RB002), digital power (RB003) and IO pipe
Foot automatically testing platform control panel (RB004), the I/O pin automatically testing platform control panel (RB004) respectively with number ten thousand
With table (RB001), chip under test (RB005) connect, the digital multimeter (RB001) by relay switch respectively with electricity
Son load (RB002), digital power (RB003), chip under test (RB005) connection, the electronic load (RB002) and IO are managed
Foot automatically testing platform control panel (RB004) connection, the digital power (RB003) by relay switch respectively with number
Power supply (RB003), chip under test (RB005) connection.
2. a kind of microcontroller pin automatically testing parameters platform according to claim 1, which is characterized in that the number
Word multimeter (RB001) is six Semi-digital multimeters.
3. a kind of microcontroller pin automatically testing parameters platform according to claim 1, which is characterized in that the electricity
Son load (RB002) is programmable electronic load.
4. a kind of microcontroller pin automatically testing parameters platform according to claim 1, which is characterized in that the number
Word power supply (RB003) is programmable digital power supply.
5. a kind of microcontroller pin automatically testing parameters platform according to claim 1, which is characterized in that the number
Word multimeter (RB001) passes sequentially through relay switch K3, relay switch K1 and the I/O pin of chip under test (RB005) connects
It connects, the digital multimeter (RB001) passes sequentially through relay switch K4, relay switch K2 and electronic load (RB002)
Anode connection, the I/O pin automatically testing platform control panel (RB004) respectively pass through serial ports and digital multimeter
(RB001), electronic load (RB002) and chip under test (RB005) connection, constitute microcontroller pin sourcing current test device.
6. a kind of microcontroller pin automatically testing parameters platform according to claim 1, which is characterized in that the number
Word multimeter (RB001) passes sequentially through relay switch K3, relay switch K1 and the I/O pin of chip under test (RB005) connects
It connects, the digital multimeter (RB001) passes sequentially through relay switch K4, relay switch K2 and electronic load (RB002)
Cathode connection, the anode of the digital power (RB003) connect with the anode of electronic load (RB002), and the IO is managed
Foot automatically testing platform control panel (RB004) respectively by serial ports and digital multimeter (RB001), electronic load (RB002) and
Chip under test (RB005) connection, constitutes microcontroller pin sink current test device.
7. a kind of microcontroller pin automatically testing parameters platform according to claim 1, which is characterized in that the number
Word multimeter (RB001) passes sequentially through relay switch K5, relay switch K1 and the I/O pin of chip under test (RB005) exports
Interface connection, the electronic load (RB002) anode pass sequentially through relay switch K2, relay switch K7 and chip under test
(RB005) I/O pin input interface connection, the I/O pin automatically testing platform control panel (RB004) pass through serial ports respectively
It is connect with digital multimeter (RB001), digital power (RB003) and chip under test (RB005), constitutes the input of microcontroller pin
Level nature test device.
8. a kind of microcontroller pin automatically testing parameters platform according to claim 1, which is characterized in that the number
Word multimeter (RB001) passes sequentially through relay switch K12, relay switch K5 is connect with digital analog converter DAC, described
Digital multimeter (RB001) connect by the anode of relay switch K13 and digital power (RB003), described is digital electric
The anode in source (RB003) is connect by relay switch K15 with the VDD pin of chip under test (RB005), the digital simulation
Converter passes sequentially through relay switch K5, relay switch K14 and connect with the I/O pin of chip under test (RB005), described
The VSS pin of chip under test (RB005) passes sequentially through relay switch K11, relay switch K9 is followed by relay switch K14
Between chip under test (RB005) I/O pin, the VSS pin of the chip under test (RB005) is connect by relay switch K10
Between relay switch K14 and relay switch K5, the I/O pin automatically testing platform control panel (RB004) respectively with
Digital analog converter DAC, digital power (RB003) and chip under test (RB005) connection, constitute microcontroller pin diode
Characteristic test device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821621482.2U CN209372983U (en) | 2018-09-30 | 2018-09-30 | Microcontroller pin automatically testing parameters platform |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821621482.2U CN209372983U (en) | 2018-09-30 | 2018-09-30 | Microcontroller pin automatically testing parameters platform |
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| CN209372983U true CN209372983U (en) | 2019-09-10 |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109270376A (en) * | 2018-09-30 | 2019-01-25 | 上海菱沃铂智能技术有限公司 | A kind of microcontroller pin automatically testing parameters platform and test method |
| CN110736914A (en) * | 2019-10-17 | 2020-01-31 | 南宁影联医学工程有限公司 | detection method for medical equipment interface board |
-
2018
- 2018-09-30 CN CN201821621482.2U patent/CN209372983U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109270376A (en) * | 2018-09-30 | 2019-01-25 | 上海菱沃铂智能技术有限公司 | A kind of microcontroller pin automatically testing parameters platform and test method |
| CN110736914A (en) * | 2019-10-17 | 2020-01-31 | 南宁影联医学工程有限公司 | detection method for medical equipment interface board |
| CN110736914B (en) * | 2019-10-17 | 2022-02-11 | 南宁影联医学工程有限公司 | Detection method of medical equipment interface board |
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