CN109270376A - A kind of microcontroller pin automatically testing parameters platform and test method - Google Patents
A kind of microcontroller pin automatically testing parameters platform and test method Download PDFInfo
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- CN109270376A CN109270376A CN201811154612.0A CN201811154612A CN109270376A CN 109270376 A CN109270376 A CN 109270376A CN 201811154612 A CN201811154612 A CN 201811154612A CN 109270376 A CN109270376 A CN 109270376A
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- 238000012360 testing method Methods 0.000 title claims abstract description 286
- 238000010998 test method Methods 0.000 title claims abstract description 7
- 238000000034 method Methods 0.000 claims abstract description 16
- 230000008569 process Effects 0.000 claims abstract description 13
- 238000012544 monitoring process Methods 0.000 claims description 15
- 238000012545 processing Methods 0.000 claims description 9
- 230000008859 change Effects 0.000 claims description 7
- 238000012358 sourcing Methods 0.000 claims description 7
- 230000005611 electricity Effects 0.000 claims description 3
- 238000013507 mapping Methods 0.000 claims description 3
- 238000004088 simulation Methods 0.000 claims description 3
- 230000009466 transformation Effects 0.000 claims description 3
- 238000004458 analytical method Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000009781 safety test method Methods 0.000 description 2
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
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Abstract
The present invention relates to a kind of microcontroller pin automatically testing parameters platform and test methods, the platform is connect with chip under test, the test platform includes digital multimeter, electronic load, digital power and I/O pin automatically testing platform control panel, the I/O pin automatically testing platform control panel respectively with digital multimeter, chip under test connection, the digital multimeter by relay switch respectively with electronic load, digital power, chip under test connection, the electronic load is connect with I/O pin automatically testing platform control panel, the digital power by relay switch respectively with digital power, chip under test connection.Compared with prior art, the present invention has many advantages, such as to simplify testing process without taking test circuit built again in each test.
Description
Technical field
It is automatic more particularly, to a kind of microcontroller pin parameter the present invention relates to microcontroller pin parameter testing technology
Test platform and test method.
Background technique
Microcontroller pin parameter testing at present substantially manually put up circuit recycle relevant measuring instrument into
Row measurement, main shortcoming following points:
Testing process is complicated: requiring to build circuit again before test every time, and the circuit theory of different parameters test is not
Together, therefore the building of circuit, debug and the operation of test process is all more time-consuming, tester also need to have it is relevant specially
Industry knowledge and good psychological quality could complete this test job.
Testing expense is expensive: the curve of some failure analyses needs to test mass data if manual testing, tested compared with
For complexity, test result deviation is larger, and test in this case can transfer to other testing factory's Household precise instruments to be tested,
But testing expense is high, general only just to will use when analyzing specific question.
Measuring accuracy is limited: some parameter testings in the identical situation of measuring instrument by environment and operating process influenced compared with
Greatly, make the precision of test data limited.
Summary of the invention
It is an object of the present invention to overcome the above-mentioned drawbacks of the prior art and provide a kind of microcontroller pins
Automatically testing parameters platform and test method.
The purpose of the present invention can be achieved through the following technical solutions:
A kind of microcontroller pin automatically testing parameters platform, the platform are connect with chip under test, the test platform
It is surveyed automatically including digital multimeter, electronic load, digital power and I/O pin automatically testing platform control panel, the I/O pin
Examination platform courses plate is connect with digital multimeter, chip under test respectively, and the digital multimeter is distinguished by relay switch
It is connect with electronic load, digital power, chip under test, the electronic load and I/O pin automatically testing platform control panel connect
It connects, the digital power is connect with digital power, chip under test respectively by relay switch.
Preferably, the digital multimeter is six Semi-digital multimeters.
Preferably, the electronic load is programmable electronic load.
Preferably, the digital power is programmable digital power supply.
Preferably, the digital multimeter passes sequentially through relay switch K3, relay switch K1 and chip under test
I/O pin connection, the digital multimeter pass sequentially through the anode of relay switch K4, relay switch K2 and electronic load
Connection, the I/O pin automatically testing platform control panel pass through serial ports and digital multimeter, electronic load and tested core respectively
Piece connection, constitutes microcontroller pin sourcing current test device.
Preferably, the digital multimeter passes sequentially through relay switch K3, relay switch K1 and chip under test
I/O pin connection, the digital multimeter pass sequentially through the cathode of relay switch K4, relay switch K2 and electronic load
Connection, the anode of the digital power are connect with the anode of electronic load, the I/O pin automatically testing platform control panel
It is connect respectively by serial ports with digital multimeter, electronic load and chip under test, constitutes microcontroller pin sink current test dress
It sets.
Preferably, the digital multimeter passes sequentially through relay switch K5, relay switch K1 and chip under test
The connection of I/O pin output interface, the electronic load anode pass sequentially through relay switch K2, relay switch K7 and are tested
The I/O pin input interface of chip connects, and the I/O pin automatically testing platform control panel passes through serial ports and digital versatile respectively
Table, digital power are connected with chip under test, constitute microcontroller pin incoming level characteristic test device.
Preferably, the digital multimeter passes sequentially through relay switch K12, relay switch K5 and digital simulation and turns
Parallel operation DAC connection, the digital multimeter are connected by the anode of relay switch K13 and digital power, the number
The anode of power supply is connected by the VDD pin of relay switch K15 and chip under test, and the digital analog converter successively leads to
Cross the I/O pin connection of relay switch K5, relay switch K14 and chip under test, the VSS pin of the chip under test according to
It is secondary to be followed by between relay switch K14 and chip under test I/O pin by relay switch K11, relay switch K9, it is described
The VSS pin of chip under test connect between relay switch K14 and relay switch K5 by relay switch K10, it is described
I/O pin automatically testing platform control panel connect respectively with digital analog converter DAC, digital power and chip under test, constitute
Microcontroller pin diode characteristic test device.
A kind of test method using the microcontroller pin automatically testing parameters platform, comprising the following steps:
Init state can be entered by powering on rear test platform, can then select corresponding test pattern on computers；
After selecting test pattern, test platform can switch to corresponding test pattern by the on-off of relay switch；
Test platform controls each measuring instrument and completes test operation according to preset testing process, and test data is sent
To computer terminal.
Preferably, the test pattern specifically includes:
Test pattern one, test platform control relay switch and test circuit are switched to the survey of microcontroller pin sourcing current
Trial assembly is set, and is that push-pull output is high by tested microcontroller pin configuration, then controls programmable electronic load according to default stream
Cheng Jinhang is divided and by partial pressure value Real-time Feedback to test platform, while six Semi-digital multimeter real-time monitoring curent changes will
Current value feeds back to test platform, and test platform will be sent to computer terminal after the data processing received, then carry out next
Group test, until completing the test of all pins；
Test pattern two, test platform control relay switch and test circuit are switched to the survey of microcontroller pin sink current
Trial assembly is set, and is that push-pull output is low by tested microcontroller pin configuration, then controls programmable electronic load according to default stream
Cheng Jinhang is divided and by partial pressure value Real-time Feedback to test platform, while six Semi-digital multimeter real-time monitoring curent changes will
Current value feeds back to test platform, and test platform will be sent to computer terminal after the data processing received, then carry out next
Group test, until completing the test of all pins；
Test pattern three, test platform control relay switch and are switched to microcontroller pin incoming level for circuit is tested
Characteristic test device, and tested microcontroller pin is divided into two groups, first group is configured to input state, second group be configured to it is defeated
It does well and is the mapping of first group of pin, then control programmable digital power supply to first group of pin foot and input a constantly change
The voltage value of change and to the voltage real-time monitoring；The voltage change of six Semi-digital multimeters then real-time monitoring output pin simultaneously
Monitoring result is simultaneously fed back to test platform by situation, and when output pin has low and high level transformation, test platform be will record at this time
Input voltage value, and be sent to computer terminal after test data is handled, then carry out next group of test, until completing institute
There is the test of pin；
Test pattern four, test platform control relay switch and test circuit are switched to microcontroller pin diode spy
Then system safety testing device controls programmable digital power supply and provides the voltage constantly increased, and voltage value Real-time Feedback is returned
Come；Test platform can control the electric current in six Semi-digital multimeter observation circuits at the same time, and by current value Real-time Feedback
Back, it will terminate and test when test platform receives the current value of feedback or voltage value is greater than or equal to limit value, and will connect
It is uploaded to computer terminal after the test data processing received, then carries out next group of test, until completing the test of all pins.
Compared with prior art, the invention has the following advantages that
Without taking test circuit built again in each test, testing process is simplified；Without artificial excessive participation, reduce
The phenomenon that maloperation and test data record error in test process；Test platform survey can be used in partial failure analysis
Examination, reduces high testing expense；Reduce influence of the manual operation to measuring accuracy, improves measuring accuracy；Automatic test stream
Journey, increases test data point at convenient, fast, the efficient less testing time.
Detailed description of the invention
The test structure chart of Fig. 1 microcontroller pin sourcing current；
The test structure chart of Fig. 2 microcontroller pin sink current；
The test structure chart of Fig. 3 microcontroller pin incoming level characteristic；
Fig. 4 microcontroller pin diode characteristic tests structure chart；
Fig. 5 tests main program flow chart.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiment is a part of the embodiments of the present invention, rather than whole embodiments.Based on this hair
Embodiment in bright, those of ordinary skill in the art's every other reality obtained without making creative work
Example is applied, all should belong to the scope of protection of the invention.
The present invention is real using the process that Microcomputer Technology controls various accurate experimental instrument and equipment simulation manual testings
The automatic test of existing microcontroller pin parameter, and be uploaded to computer after test data is handled and generate files and reports.
Measuring instrument used in this programme includes six Semi-digital multimeters, programmable electronic load, programmable digital
The precision of power supply, measuring instrument directly affects the precision of test data, and measuring instrument, but measuring instrument can be selected according to testing requirement
Device must have programing function.
After being communicatively coupled between test platform and each instrument, select test pattern, test platform can by it is miniature after
Electric control switch switching keeps test circuit corresponding with test pattern, then according to program-controlled Row control instrument automatic measurement
Relevant parameter, and data are uploaded to computer terminal by treated.
As Figure 1-Figure 4, a kind of microcontroller pin automatically testing parameters platform, the platform and chip under test RB005
Connection, the test platform include digital multimeter RB001, electronic load RB002, digital power RB003 and I/O pin from
Dynamic test platform control panel RB004, the I/O pin automatically testing platform control panel RB004 respectively with digital multimeter
RB001, chip under test RB005 connection, the digital multimeter RB001 by relay switch respectively with electronic load
RB002, digital power RB003, chip under test RB005 connection, the electronic load RB002 and I/O pin automatically testing platform
Control panel RB004 connection, the digital power RB003 by relay switch respectively with digital power RB003, chip under test
RB005 connection.
The digital multimeter RB001 is six Semi-digital multimeters.The electronic load RB002 is programmable electricity
Son load.The digital power RB003 is programmable digital power supply.
If Fig. 1 shows, the digital multimeter RB001 passes sequentially through relay switch K3, relay switch K1 and is tested
The I/O pin of chip RB005 connects, and the digital multimeter RB001 passes sequentially through relay switch K4, relay switch K2
It is connect with the anode of electronic load RB002, the I/O pin automatically testing platform control panel RB004 passes through serial ports and number respectively
Word multimeter RB001, electronic load RB002 are connected with chip under test RB005, constitute microcontroller pin sourcing current test dress
It sets.
If Fig. 2 shows, the digital multimeter RB001 passes sequentially through relay switch K3, relay switch K1 and is tested
The I/O pin of chip RB005 connects, and the digital multimeter RB001 passes sequentially through relay switch K4, relay switch K2
It being connect with the cathode of electronic load RB002, the anode of the digital power RB003 is connect with the anode of electronic load RB002,
The I/O pin automatically testing platform control panel RB004 passes through serial ports and digital multimeter RB001, electronic load respectively
RB002 is connected with chip under test RB005, constitutes microcontroller pin sink current test device.
If Fig. 3 shows, the digital multimeter RB001 passes sequentially through relay switch K5, relay switch K1 and is tested
The I/O pin output interface of chip RB005 connects, the electronic load RB002 anode pass sequentially through relay switch K2, after
Electric switch K7 is connect with the I/O pin input interface of chip under test RB005, the I/O pin automatically testing platform control panel
RB004 passes through serial ports respectively and connect with digital multimeter RB001, digital power RB003 and chip under test RB005, constitutes micro-control
Device pin incoming level characteristic test device processed.
If Fig. 4 shows, the digital multimeter RB001 passes sequentially through relay switch K12, relay switch K5 and number
Analog converter DAC connection, the digital multimeter RB001 pass through the anode of relay switch K13 and digital power RB003
The anode of connection, the digital power RB003 is connect by relay switch K15 with the VDD pin of chip under test RB005,
The digital analog converter passes sequentially through the I/O pin of relay switch K5, relay switch K14 and chip under test RB005
Connection, the VSS pin of the chip under test RB005 passes sequentially through relay switch K11, relay switch K9 is followed by relay
Between device switch K14 and chip under test RB005IO pin, the VSS pin of the chip under test RB005 passes through relay switch
K10 connects between relay switch K14 and relay switch K5, and the I/O pin automatically testing platform control panel RB004 points
It is not connect with digital analog converter DAC, digital power RB003 and chip under test RB005, constitutes microcontroller pin diode
Characteristic test device.
If Fig. 5 shows, microcontroller pin automatically testing parameters method of the present invention, comprising the following steps:
Init state can be entered by powering on rear test platform, can then select corresponding test pattern on computers；
After selecting test pattern, test platform can switch to corresponding test pattern by the on-off of relay switch；
Test platform controls each measuring instrument and completes test operation according to preset testing process, and test data is sent
To computer terminal.
The test pattern specifically includes:
Test pattern one, test platform control relay switch and test circuit are switched to the survey of microcontroller pin sourcing current
Trial assembly is set, and is that push-pull output is high by tested microcontroller pin configuration, then controls programmable electronic load according to default stream
Cheng Jinhang is divided and by partial pressure value Real-time Feedback to test platform, while six Semi-digital multimeter real-time monitoring curent changes will
Current value feeds back to test platform, and test platform will be sent to computer terminal after the data processing received, then carry out next
Group test, until completing the test of all pins；
Test pattern two, test platform control relay switch and test circuit are switched to the survey of microcontroller pin sink current
Trial assembly is set, and is that push-pull output is low by tested microcontroller pin configuration, then controls programmable electronic load according to default stream
Cheng Jinhang is divided and by partial pressure value Real-time Feedback to test platform, while six Semi-digital multimeter real-time monitoring curent changes will
Current value feeds back to test platform, and test platform will be sent to computer terminal after the data processing received, then carry out next
Group test, until completing the test of all pins；
Test pattern three, test platform control relay switch and are switched to microcontroller pin incoming level for circuit is tested
Characteristic test device, and tested microcontroller pin is divided into two groups, first group is configured to input state, second group be configured to it is defeated
It does well and is the mapping of first group of pin, then control programmable digital power supply to first group of pin foot and input a constantly change
The voltage value of change and to the voltage real-time monitoring；The voltage change of six Semi-digital multimeters then real-time monitoring output pin simultaneously
Monitoring result is simultaneously fed back to test platform by situation, and when output pin has low and high level transformation, test platform be will record at this time
Input voltage value, and be sent to computer terminal after test data is handled, then carry out next group of test, until completing institute
There is the test of pin；
Test pattern four, test platform control relay switch and test circuit are switched to microcontroller pin diode spy
Then system safety testing device controls programmable digital power supply and provides the voltage constantly increased, and voltage value Real-time Feedback is returned
Come；Test platform can control the electric current in six Semi-digital multimeter observation circuits at the same time, and by current value Real-time Feedback
Back, it will terminate and test when test platform receives the current value of feedback or voltage value is greater than or equal to limit value, and will connect
It is uploaded to computer terminal after the test data processing received, then carries out next group of test, until completing the test of all pins.
The interface of measuring instrument and test platform is connected in advance, entire test process is after selecting test pattern all in accordance with journey
Flow control journey is automatically performed, and is participated in without artificial, and corresponding test point is done in test data export in computer terminal after the completion of test
Analysis.
The above description is merely a specific embodiment, but scope of protection of the present invention is not limited thereto, any
Those familiar with the art in the technical scope disclosed by the present invention, can readily occur in various equivalent modifications or replace
It changes, these modifications or substitutions should be covered by the protection scope of the present invention.Therefore, protection scope of the present invention should be with right
It is required that protection scope subject to.
Claims (10)
1. a kind of microcontroller pin automatically testing parameters platform, the platform are connect with chip under test (RB005), feature exists
In the test platform includes digital multimeter (RB001), electronic load (RB002), digital power (RB003) and IO pipe
Foot automatically testing platform control panel (RB004), the I/O pin automatically testing platform control panel (RB004) respectively with number ten thousand
With table (RB001), chip under test (RB005) connect, the digital multimeter (RB001) by relay switch respectively with electricity
Son load (RB002), digital power (RB003), chip under test (RB005) connection, the electronic load (RB002) and IO are managed
Foot automatically testing platform control panel (RB004) connection, the digital power (RB003) by relay switch respectively with number
Power supply (RB003), chip under test (RB005) connection.
2. a kind of microcontroller pin automatically testing parameters platform according to claim 1, which is characterized in that the number
Word multimeter (RB001) is six Semi-digital multimeters.
3. a kind of microcontroller pin automatically testing parameters platform according to claim 1, which is characterized in that the electricity
Son load (RB002) is programmable electronic load.
4. a kind of microcontroller pin automatically testing parameters platform according to claim 1, which is characterized in that the number
Word power supply (RB003) is programmable digital power supply.
5. a kind of microcontroller pin automatically testing parameters platform according to claim 1, which is characterized in that the number
Word multimeter (RB001) passes sequentially through relay switch K3, relay switch K1 and the I/O pin of chip under test (RB005) connects
It connects, the digital multimeter (RB001) passes sequentially through relay switch K4, relay switch K2 and electronic load (RB002)
Anode connection, the I/O pin automatically testing platform control panel (RB004) respectively pass through serial ports and digital multimeter
(RB001), electronic load (RB002) and chip under test (RB005) connection, constitute microcontroller pin sourcing current test device.
6. a kind of microcontroller pin automatically testing parameters platform according to claim 1, which is characterized in that the number
Word multimeter (RB001) passes sequentially through relay switch K3, relay switch K1 and the I/O pin of chip under test (RB005) connects
It connects, the digital multimeter (RB001) passes sequentially through relay switch K4, relay switch K2 and electronic load (RB002)
Cathode connection, the anode of the digital power (RB003) connect with the anode of electronic load (RB002), and the IO is managed
Foot automatically testing platform control panel (RB004) respectively by serial ports and digital multimeter (RB001), electronic load (RB002) and
Chip under test (RB005) connection, constitutes microcontroller pin sink current test device.
7. a kind of microcontroller pin automatically testing parameters platform according to claim 1, which is characterized in that the number
Word multimeter (RB001) passes sequentially through relay switch K5, relay switch K1 and the I/O pin of chip under test (RB005) exports
Interface connection, the electronic load (RB002) anode pass sequentially through relay switch K2, relay switch K7 and chip under test
(RB005) I/O pin input interface connection, the I/O pin automatically testing platform control panel (RB004) pass through serial ports respectively
It is connect with digital multimeter (RB001), digital power (RB003) and chip under test (RB005), constitutes the input of microcontroller pin
Level nature test device.
8. a kind of microcontroller pin automatically testing parameters platform according to claim 1, which is characterized in that the number
Word multimeter (RB001) passes sequentially through relay switch K12, relay switch K5 is connect with digital analog converter DAC, described
Digital multimeter (RB001) connect by the anode of relay switch K13 and digital power (RB003), described is digital electric
The anode in source (RB003) is connect by relay switch K15 with the VDD pin of chip under test (RB005), the digital simulation
Converter passes sequentially through relay switch K5, relay switch K14 and connect with the I/O pin of chip under test (RB005), described
The VSS pin of chip under test (RB005) passes sequentially through relay switch K11, relay switch K9 is followed by relay switch K14
Between chip under test (RB005) I/O pin, the VSS pin of the chip under test (RB005) is connect by relay switch K10
Between relay switch K14 and relay switch K5, the I/O pin automatically testing platform control panel (RB004) respectively with
Digital analog converter DAC, digital power (RB003) and chip under test (RB005) connection, constitute microcontroller pin diode
Characteristic test device.
9. a kind of test method using microcontroller pin automatically testing parameters platform described in claim 1, feature exist
In, comprising the following steps:
Init state can be entered by powering on rear test platform, can then select corresponding test pattern on computers；
After selecting test pattern, test platform can switch to corresponding test pattern by the on-off of relay switch；
Test platform controls each measuring instrument and completes test operation according to preset testing process, and test data is sent to meter
Calculate generator terminal.
10. according to the method described in claim 9, it is characterized in that, the test pattern specifically includes:
Test pattern one, test platform control relay switch and test circuit are switched to microcontroller pin sourcing current test dress
Set, and be that push-pull output is high by tested microcontroller pin configuration, then control programmable electronic load according to default process into
Row partial pressure and by partial pressure value Real-time Feedback to test platform, while six Semi-digital multimeter real-time monitoring curent changes are by electric current
Value feeds back to test platform, and test platform will be sent to computer terminal after the data processing received, then carry out next group of survey
Examination, until completing the test of all pins；
Test pattern two, test platform control relay switch and test circuit are switched to microcontroller pin sink current test dress
Set, and by tested microcontroller pin configuration be push-pull output it is low, then control programmable electronic load according to default process into
Row partial pressure and by partial pressure value Real-time Feedback to test platform, while six Semi-digital multimeter real-time monitoring curent changes are by electric current
Value feeds back to test platform, and test platform will be sent to computer terminal after the data processing received, then carry out next group of survey
Examination, until completing the test of all pins；
Test pattern three, test platform control relay switch and are switched to microcontroller pin incoming level characteristic for circuit is tested
Test device, and tested microcontroller pin is divided into two groups, first group is configured to input state, and second group is configured as output to shape
State and be first group of pin mapping, then control programmable digital power supply to first group of pin foot input one it is continually changing
Voltage value and to the voltage real-time monitoring；The voltage change situation of six Semi-digital multimeters then real-time monitoring output pin simultaneously
And monitoring result is fed back into test platform, when output pin has low and high level transformation, test platform will record at this time defeated
The voltage value entered, and computer terminal is sent to after test data is handled, next group of test is then carried out, until completing all pipes
The test of foot；
Test pattern four, test platform control relay switch and test circuit are switched to the survey of microcontroller pin diode characteristic
Trial assembly is set, and is then controlled programmable digital power supply and is provided the voltage constantly increased, and voltage value Real-time Feedback is returned；With
Test platform can control the electric current in six Semi-digital multimeter observation circuits simultaneously for this, and current value Real-time Feedback is returned,
It will terminate and test when test platform receives the current value of feedback or voltage value is greater than or equal to limit value, and will receive
It is uploaded to computer terminal after test data processing, then carries out next group of test, until completing the test of all pins.
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| CN112198862A (en) * | 2020-09-18 | 2021-01-08 | 中国辐射防护研究院 | On-line experimental test system for total dose effect of extensible microcontroller |
| CN112285529A (en) * | 2020-09-28 | 2021-01-29 | 上海华岭集成电路技术股份有限公司 | Method for controlling relay by using ATE test vector |
| CN112666446A (en) * | 2020-12-16 | 2021-04-16 | 中国电子科技集团公司第四十七研究所 | Current loop transmitter test system and method |
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