CN105652050A - Multiplex waveform output system and method - Google Patents
Multiplex waveform output system and method Download PDFInfo
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- CN105652050A CN105652050A CN201610173041.XA CN201610173041A CN105652050A CN 105652050 A CN105652050 A CN 105652050A CN 201610173041 A CN201610173041 A CN 201610173041A CN 105652050 A CN105652050 A CN 105652050A
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- output
- waveform
- multichannel
- mcu
- testing apparatus
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/28—Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
Abstract
The invention discloses a multiplex waveform output system and method. The system comprises multiplex waveform output equipment and test equipment; the multiplex waveform output equipment comprises a power source switching unit, an MCU, multiple function waveform generation chips, multiple output channels, an information collecting and processing unit and a display unit, the multiple function waveform generation chips are controlled by the MCU and outputs corresponding waveforms, each function waveform generation chip is connected with one output channel, each output channel is connected with the test equipment, the information collecting and processing unit collects output waveform data of the function waveform generation chips, processes the waveform data into digital signals, transmits the digital signals to the MCU to compare the signals with a set value, and the MCU conducts self-adjustment, outputs a waveform amplitude value and calibrates output. The multiplex waveform output system and method have the advantages that multiple waveforms with adjustable amplitude values can be output at the same time, and the output system has high output precision, facilitates complete appliance test of test equipment and has a display function.
Description
Technical field
The present invention relates to complete machine field tests, in particular to a kind of Multichannel Waveform output system and method.
Background technology
Signal generator is a kind of equipment that can provide various frequency, waveform and output level electrical signal. When measuring the amplitude characteristic of various telecommunication system or telecommunication apparatus, frequency response characteristic, transport property and other electrical parameter, and the characteristic measuring components and parts with parameter time, be used as signal source or the source of excitation of test. Current signal generator is several passages wave form output only, can only meet the needs of testing apparatus (as: data acquisition unit) when debugging test in early stage. Owing to data acquisition unit connects the signal input on tens tunnels simultaneously, the complete machine test of the inconvenient data acquisition unit of only several passages waveforms, its test result close to reality, so just can not can not ensure there is higher output accuracy. In addition, along with the Requirement Increases of production test, only several passages wave form output can not meet the requirement generating test.
Summary of the invention
The technical problem to be solved in the present invention is, for the above-mentioned defect of prior art, it is provided that a kind of can simultaneously the adjustable Multichannel Waveform of output amplitude, there is higher output accuracy, facilitate the complete machine of testing apparatus to test, there is the Multichannel Waveform output system of display function and method.
The technical solution adopted for the present invention to solve the technical problems is: a kind of Multichannel Waveform output system of structure, comprise Multichannel Waveform output equipment and testing apparatus, described Multichannel Waveform output equipment comprises Power convert unit, MCU, multichannel function waveform generation chip, multiple-channel output passage, Information Collecting & Processing unit and display unit, the input terminus of described Power convert unit is connected with AC power, output terminal is connected with described MCU, power for described MCU after carrying out voltage transitions, described in multichannel, the input terminus of function waveform generation chip is all connected with described MCU, for accepting the control of described MCU and export corresponding waveform, described in multichannel, function waveform generation chip also connects successively, described in each, the output terminal of function waveform generation chip all connects a described output channel, output channel described in each is also all connected with described testing apparatus, described Information Collecting & Processing unit is connected with described function waveform generation chip, for the output waveform data of described function waveform generation chip is gathered, and it is sent to described MCU after being processed into numerary signal and set(ting)value contrasts, described MCU carries out inherent regulation output waveform amplitude and calibrates output, described display unit is connected with described MCU, for showing the result that described testing apparatus gathers.
In Multichannel Waveform output system of the present invention, described Multichannel Waveform output equipment also comprises output key and serial line interface, described output key is connected with described MCU, sends wave form output order for controlling MCU, and described testing apparatus is sent to described MCU by described serial line interface and prepares signal or/and test data.
In Multichannel Waveform output system of the present invention, described serial line interface is serial communication pattern SPI (SerialPeripheralInterface, Serial Peripheral Interface (SPI)).
In Multichannel Waveform output system of the present invention, described Multichannel Waveform output equipment also comprises JATG interface, and described JATG interface is connected with described MCU and carries out two-way communication.
In Multichannel Waveform output system of the present invention, the voltage of described output channel is greater than 115VAC.
In Multichannel Waveform output system of the present invention, the number of described output channel is greater than 10.
In Multichannel Waveform output system of the present invention, described testing apparatus is data acquisition unit, and the number of described data acquisition unit is one or more.
The present invention also relates to a kind of Multichannel Waveform output intent, comprises the steps:
A) by the interface insertion Multichannel Waveform output equipment of the test panel of testing apparatus, connect the switchboard that power supply is described Multichannel Waveform output equipment and testing apparatus and power;
B) connecting after normally, described testing apparatus is fed back one by serial communication pattern SPI to described Multichannel Waveform output equipment and is prepared signal;
C) according to testing the quantity, the type of output waveform and the size of amplitude that need to set output channel, and by Information Collecting & Processing unit, output set(ting)value will be carried out real time calibration;
D) after setting described output set(ting)value, pressing output key, the output waveform of setting exports to described testing apparatus from the output channel of correspondence, and described Multichannel Waveform output equipment also continues to calibrate while test;
E) described Multichannel Waveform output equipment carries out serial communication with described testing apparatus while test, and the result that described testing apparatus gathers is shown.
Implement Multichannel Waveform output system and the method for the present invention, there is following useful effect: owing to employing MCU, multichannel function waveform generation chip, multiple-channel output passage, Information Collecting & Processing unit and display unit, multichannel function waveform generation chip can waveform that simultaneously output multi-channel is different, the output waveform data of function waveform generation chip can be gathered by Information Collecting & Processing unit, continue to calibrate by MCU while test, can ensure that Multichannel Waveform output equipment has higher output accuracy like this, display unit can display test equipment gather result, so it can the simultaneously adjustable Multichannel Waveform of output amplitude, there is higher output accuracy, the complete machine of testing apparatus is facilitated to test, there is display function.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, it is briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, it is also possible to obtain other accompanying drawing according to these accompanying drawings.
Fig. 1 is the structural representation of system in Multichannel Waveform output system of the present invention and method embodiment;
Fig. 2 is the schema of method in described embodiment.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is only the present invention's part embodiment, instead of whole embodiments. Based on the embodiment in the present invention, those of ordinary skill in the art, not making other embodiments all obtained under creative work prerequisite, belong to the scope of protection of the invention.
In Multichannel Waveform output system of the present invention and embodiment of the method, the structural representation of its Multichannel Waveform output system is as shown in Figure 1. in Fig. 1, this Multichannel Waveform output system comprises the Multichannel Waveform output equipment 1 and testing apparatus 2 that are connected, wherein, Multichannel Waveform output equipment 1 is by 220VAC ac power supply, this Multichannel Waveform output equipment 1 comprises Power convert unit 11, MCU12, multichannel function waveform generation chip, multiple-channel output passage, Information Collecting & Processing unit 15 and display unit 16, wherein, the input terminus of Power convert unit 11 is connected with AC power, output terminal is connected with MCU12, its function is exactly changed by the voltage of AC power, be converted to the service voltage of applicable MCU12 normal operation, it is that MCU12 powers by this service voltage, MCU12 is as control chip, output waveform can be set by MCU12, control can export corresponding waveform by function waveform generation chip.
In the present embodiment, the input terminus of multichannel function waveform generation chip is all connected with MCU12, for accepting the control of MCU12 and export corresponding waveform, multichannel function waveform generation chip also connects successively, the output terminal of each function waveform generation chip all connects an output channel, each output channel is also all connected with testing apparatus 2, Information Collecting & Processing unit 15 is connected with function waveform generation chip, for the output waveform data of function waveform generation chip is gathered, and it is sent to MCU12 after being processed into numerary signal, above-mentioned data signal and set(ting)value (output waveform that MCU12 sets in advance) are contrasted by MCU12, MCU12 starts to carry out inherent regulation output waveform amplitude and calibrates output. owing to the waveform of setting can export to testing apparatus 2 from corresponding output channel, Multichannel Waveform output equipment 1 can continue to calibrate while test, can ensure that multichannel function waveform generation chip has higher output accuracy like this. in the present embodiment, concrete, can needing, according to test, the size arranging the quantity of output channel, the type of output waveform and amplitude, output set(ting)value all can be carried out real time calibration by the Information Collecting & Processing unit 15 of multichannel function waveform generator inside by these numerical value arranged. the result that above-mentioned display unit 16 is connected with MCU12, gathers for display test equipment 2.
Fig. 1 depicts n function waveform generation chip and n output channel as an example, n be greater than 1 integer, for convenience of description, this n function waveform generation chip is called the first function waveform generation chip 131 ..., the n-th function waveform generation chip 13n, this n output channel is called the first output channel 141 ..., the n-th output channel 14n. The present embodiment can select the function waveform generation chip of respective numbers according to wave form output quantity. Certainly, the quantity of output channel is corresponding with the quantity of function waveform generation chip. The Multichannel Waveform output system of the present embodiment can simultaneously the adjustable Multichannel Waveform of output amplitude, there is higher output accuracy, facilitate the complete machine of testing apparatus to test, there is display function, actual Working environment can better be simulated, it is possible to make test result more close to reality.
In the present embodiment, this Multichannel Waveform output equipment 1 also comprises output key 17 and serial line interface 18, wherein, export key 17 to be connected with MCU12, send wave form output order for controlling MCU, concrete is exactly after setting output set(ting)value, pressing output key, the waveform of setting will export to testing apparatus 2 from corresponding output channel. Testing apparatus 2 is sent to MCU12 by serial line interface and prepares signal or/and test data. In the present embodiment, serial line interface 18 is serial communication pattern SPI. Testing apparatus 2 is communicated with Multichannel Waveform output equipment 1 by serial communication pattern SPI, and the data tested all can be communicated by serial line interface 18. While Multichannel Waveform output equipment 1 is tested, carry out serial communication with testing apparatus 2, and the result that testing apparatus 2 gathers is shown.
In the present embodiment, Multichannel Waveform output equipment 1 also comprises JATG interface 19, JATG interface 19 and is connected with MCU12 and carries out two-way communication. In the present embodiment, the number of output channel is greater than 10, so just can export the output waveform on more than 10 tunnels of different frequency and amplitude simultaneously. The voltage of output channel is set to be greater than 115VAC. In the present embodiment, above-mentioned testing apparatus 2 is data acquisition unit, and the number of data acquisition unit is one or more. Also a data acquisition unit can be tested exactly, it is also possible to need to test multiple data acquisition unit simultaneously. Its actual application mode is more flexible. Multichannel Waveform output system in the present embodiment can realize Multichannel Waveform and export simultaneously, and output waveform amplitude is adjustable, and is set to higher than 115VA by the voltage of output channel, has display function simultaneously.
The present embodiment also relates to a kind of Multichannel Waveform output intent, and its schema is as shown in Figure 2. In Fig. 2, this Multichannel Waveform output intent comprises the steps:
Step S01 is by the interface insertion Multichannel Waveform output equipment of the test panel of testing apparatus, connect the switchboard that power supply is Multichannel Waveform output equipment and testing apparatus to power: in this step, first need in the interface insertion Multichannel Waveform output equipment by the test panel of testing apparatus, connect power supply, it may also be useful to the switchboard that this power supply is Multichannel Waveform output equipment and testing apparatus is powered. Certainly, in some situations of the present embodiment, in the present embodiment, the testing apparatus that Multichannel Waveform output equipment is corresponding is data acquisition unit, certainly, in some situations of the present embodiment, above-mentioned testing apparatus can also be other except data acquisition unit equipment for testing.
Step S02 connects after normally, testing apparatus is fed back one by serial communication pattern SPI to Multichannel Waveform output equipment and is prepared signal: in this step, connect after normally, testing apparatus can be fed back one to Multichannel Waveform output equipment and prepare signal, feed back one particular by serial communication pattern SPI to Multichannel Waveform output equipment and prepare signal, in the present embodiment, the data of test all can be communicated by serial line interface.
Step S03 needs the quantity of setting output channel, the type of output waveform and the size of amplitude according to test, and by Information Collecting & Processing unit, output set(ting)value will be carried out real time calibration: in this step, according to testing the quantity, the type of output waveform and the size of amplitude that need to set output channel, output set(ting)value all can be carried out real time calibration by the Information Collecting & Processing unit of multichannel function waveform generation chip internal by these numerical value arranged. So just can improve
Step S04 sets after exporting set(ting)value, press output key, the output waveform of setting exports to testing apparatus from the output channel of correspondence, Multichannel Waveform output equipment also continues to calibrate while test: in this step, set after exporting set(ting)value, press output key, the output waveform of setting will export to testing apparatus from the output channel of correspondence, while test, Multichannel Waveform output equipment can continue to calibrate, and can ensure that Multichannel Waveform output equipment has higher output accuracy like this.
Step S05 Multichannel Waveform output equipment carries out serial communication with testing apparatus while test, and the result of testing apparatus collection is shown: in this step, Multichannel Waveform output equipment carries out serial communication with testing apparatus while test, and the result of testing apparatus collection is shown. Multichannel Waveform output intent in the present embodiment can realize the wave form output of multichannel adjustable voltage, with display function, it is possible to realize the waveform that multiple-channel output is different as required.
In a word, the present invention can simulate actual Working environment more accurately, while realizing Multichannel Waveform output, it is possible to facilitate the complete machine of testing apparatus to test, make test result more close to reality.
The foregoing is only the better embodiment of the present invention, not in order to limit the present invention, within the spirit and principles in the present invention all, any amendment of doing, equivalent replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (8)
1. a Multichannel Waveform output system, it is characterized in that, comprise Multichannel Waveform output equipment and testing apparatus, described Multichannel Waveform output equipment comprises Power convert unit, MCU, multichannel function waveform generation chip, multiple-channel output passage, Information Collecting & Processing unit and display unit, the input terminus of described Power convert unit is connected with AC power, output terminal is connected with described MCU, power for described MCU after carrying out voltage transitions, described in multichannel, the input terminus of function waveform generation chip is all connected with described MCU, for accepting the control of described MCU and export corresponding waveform, described in multichannel, function waveform generation chip also connects successively, described in each, the output terminal of function waveform generation chip all connects a described output channel, output channel described in each is also all connected with described testing apparatus, described Information Collecting & Processing unit is connected with described function waveform generation chip, for the output waveform data of described function waveform generation chip is gathered, and it is sent to described MCU after being processed into numerary signal and set(ting)value contrasts, described MCU carries out inherent regulation output waveform amplitude and calibrates output, described display unit is connected with described MCU, for showing the result that described testing apparatus gathers.
2. Multichannel Waveform output system according to claim 1, it is characterized in that, described Multichannel Waveform output equipment also comprises output key and serial line interface, described output key is connected with described MCU, sends wave form output order for controlling MCU, and described testing apparatus is sent to described MCU by described serial line interface and prepares signal or/and test data.
3. Multichannel Waveform output system according to claim 2, it is characterised in that, described serial line interface is serial communication pattern SPI.
4. Multichannel Waveform output system according to claim 1 and 2, it is characterised in that, described Multichannel Waveform output equipment also comprises JATG interface, and described JATG interface is connected with described MCU and carries out two-way communication.
5. Multichannel Waveform output system according to claim 1, it is characterised in that, the voltage of described output channel is greater than 115VAC.
6. Multichannel Waveform output system according to claim 5, it is characterised in that, the number of described output channel is greater than 10.
7. Multichannel Waveform output system according to claim 1, it is characterised in that, described testing apparatus is data acquisition unit, and the number of described data acquisition unit is one or more.
8. a Multichannel Waveform output intent, it is characterised in that, comprise the steps:
A) by the interface insertion Multichannel Waveform output equipment of the test panel of testing apparatus, connect the switchboard that power supply is described Multichannel Waveform output equipment and testing apparatus and power;
B) connecting after normally, described testing apparatus is fed back one by serial communication pattern SPI to described Multichannel Waveform output equipment and is prepared signal;
C) according to testing the quantity, the type of output waveform and the size of amplitude that need to set output channel, and by Information Collecting & Processing unit, output set(ting)value will be carried out real time calibration;
D) after setting described output set(ting)value, pressing output key, the output waveform of setting exports to described testing apparatus from the output channel of correspondence, and described Multichannel Waveform output equipment also continues to calibrate while test;
E) described Multichannel Waveform output equipment carries out serial communication with described testing apparatus while test, and the result that described testing apparatus gathers is shown.
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CN111239526A (en) * | 2020-02-28 | 2020-06-05 | 山东中科先进技术研究院有限公司 | Aircraft communication controller testing arrangement |
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