CN109342867A - On-off electric test device - Google Patents
On-off electric test device Download PDFInfo
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- CN109342867A CN109342867A CN201811020550.4A CN201811020550A CN109342867A CN 109342867 A CN109342867 A CN 109342867A CN 201811020550 A CN201811020550 A CN 201811020550A CN 109342867 A CN109342867 A CN 109342867A
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- circuit
- microcontroller
- test
- switching circuit
- communication interface
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The present invention relates to a kind of on-off electric test devices comprising microcontroller, memory, display screen, communication interface, voltage detecting circuit and switching circuit；Memory, switching circuit, voltage detecting circuit and communication interface are connect with microcontroller respectively, and switching circuit, communication interface and voltage detecting circuit are also respectively connected with test product；Microcontroller is connected for control switch circuit, powers to test product；The test data of test product is received by communication interface；The shutdown of control switch circuit, and obtain the load voltage that voltage detecting circuit detects；According to the opening time of switching circuit, turn-off time, the receiving time of test data and load voltage, test result information is generated；It controls display screen and shows test result information.Above-mentioned on-off electric test device structure is simple and small volume, can judge automatically test product can normal switch machine and detection switch machine duration, and reduce human intervention, promote testing efficiency and test accuracy rate.
Description
Technical field
The present invention relates to electronic technology fields, more particularly to a kind of on-off electric test device.
Background technique
With the development of science and technology, the electronic product development cycle shortens, many kinds of, wants to electronic product reliability
Ask also increasingly strict, wherein on-off electrical testing is a kind of important method for examining electronic product reliability.
Row programmable switch power supply collocation host computer commonly used in the trade to carry out on-off electrical testing to electronic product at present.It can compile
Journey Switching Power Supply volume is larger, and needs host computer of arranging in pairs or groups, and is not convenient to use.And divide since programmable switch power supply does not have
Function is analysed, host computer can only be controlled by and powered to electronic product, therefore programmable switch power supply can not directly judge test product
Whether normal boot-strap or shutdown, host computer need to be connected and judge or dependent on eye-observation.The former is easy to appear compatibility
Problem leads to test errors or interruption；It is inaccurate that the latter is easy to cause test data, and personnel's making time is more, low efficiency.
Another aspect programmable switch power supply also needs artificial by host computer setting energization retention time or power-off time, operating process
It is comparatively laborious.
Summary of the invention
Based on this, it is necessary to a kind of on-off electric test device is provided, the on-off electrical testing of complete independently electronic product is capable of,
And it can be reduced human input, promote testing efficiency.
In one embodiment, a kind of on-off electric test device is provided comprising microcontroller, display screen, leads to memory
Believe interface, voltage detecting circuit and switching circuit；The memory, the switching circuit, the voltage detecting circuit and described
Communication interface is connect with the microcontroller respectively, and the switching circuit, the communication interface and the voltage detecting circuit are also
It is separately connected test product；The microcontroller is used for: being controlled the switching circuit conducting, is powered to the test product；It is logical
Cross the test data that the communication interface receives the test product；The switching circuit shutdown is controlled, and obtains the voltage
The load voltage that detection circuit detects；It is connect according to the opening time of the switching circuit, turn-off time, the test data
Between time receiving and the load voltage, test result information is generated；It controls the display screen and shows the test result information.
The microcontroller is also used to send the test data to host computer in one of the embodiments,.
The on-off electric test device further includes current foldback circuit in one of the embodiments, the overcurrent protection
Circuit is separately connected the switching circuit and the test product.
The on-off electric test device includes multiple switch circuit and multiple overcurrent protections electricity in one of the embodiments,
Road, one end of each switching circuit connect the microcontroller, and the other end of each switching circuit passes through a current foldback circuit
Connect a test product；The voltage detecting circuit is plurality of voltages detection circuit, and the voltage detecting circuit connection is described micro-
Controller and each test product；The communication interface is multichannel communication interface, and the multichannel communication interface connection is described micro-
Controller and each test product.
The communication interface is multichannel asynchronous transmission interface in one of the embodiments,.
The switching circuit is PMOS switch circuit in one of the embodiments,.
The on-off electric test device further includes key module in one of the embodiments, the key module connection
The microcontroller.
The on-off electric test device further includes clock circuit in one of the embodiments, the clock circuit connection
The microcontroller.
The on-off electric test device further includes state circuit for lamp in one of the embodiments, the state circuit for lamp
Connect the microcontroller；The microcontroller is also used to control the status lamp circuit point when the switching circuit is connected
It is bright；When switching circuit shutdown, controls the state circuit for lamp and close.
The on-off electric test device further includes power module in one of the embodiments, the power module it is defeated
Enter end connection external power supply, the output end of the power module connects the microcontroller.
Above-mentioned on-off electric test device is by microcontroller, memory, display screen, communication interface, voltage detecting circuit and opens
Powered-down road is constituted, and structure is simple and small volume.Microprocessor according to can obtain test data and obtain test data when
Between judge automatically test product can normal boot-strap and booting duration, can judge automatically test product according to load voltage just
Often shutdown and shutdown duration are powered retention time or power-off time without artificial setting, without eye-observation test result,
Therefore human input can be reduced, promotes testing efficiency, while improving test accuracy rate.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the on-off electric test device of one embodiment of the invention；
Fig. 2 is the structural schematic diagram of the on-off electric test device of another embodiment of the present invention；
Fig. 3 is the structural schematic diagram of the on-off electric test device of further embodiment of this invention；
Fig. 4 is the structural schematic diagram of the on-off electric test device of another embodiment of the invention.
Specific embodiment
In order to make the foregoing objectives, features and advantages of the present invention clearer and more comprehensible, with reference to the accompanying drawing to the present invention
Specific embodiment be described in detail.Many details are explained in the following description in order to fully understand this hair
It is bright.But the invention can be embodied in many other ways as described herein, those skilled in the art can be not
Similar improvement is done in the case where violating intension of the present invention, therefore the present invention is not limited by the specific embodiments disclosed below.
Referring to Fig. 1, the structural schematic diagram of the on-off electric test device 10 for one embodiment of the invention.As shown in Figure 1, should
On-off electric test device 10 includes microcontroller 101, memory 102, display screen 103, communication interface 104, voltage detecting circuit
105 and switching circuit 106.Wherein memory 102, switching circuit 106, voltage detecting circuit 105 and communication interface points 104 not with
Microcontroller 101 connects, and switching circuit 106, communication interface 104 and voltage detecting circuit 105 are also respectively connected with test product 20.
Wherein, microcontroller 101 is connected for control switch circuit 106, powers to test product 20；Pass through communication interface
104 receive the test data of test product 20；Control switch circuit 106 turns off, and obtains what voltage detecting circuit 105 detected
Load voltage；According to the opening time of switching circuit 106, turn-off time, the receiving time of test data and load voltage, generate
Test result information；And control display screen 103 shows test result information.Memory 102 is for storing test result letter
Breath.Further, memory 102 is also used to store the information such as testing time and testing time.Further, memory 102 is gone back
For storing the test data of test product 20, such as memory 102 is by the booting Log data of test product 20 when each test
It completely preserves, host computer export is connected when to need and is checked.
In one embodiment, switching circuit 106 includes control terminal, power supply terminal and connection terminal, wherein control terminal
Son connection microcontroller 101, power supply terminal connect external power supply, and connection terminal is for connecting test product.Above-mentioned on-off electrical measurement
Trial assembly is set power on after, 101 output switch control signal of microcontroller, control switch circuit 106 be connected, thus be test product 20
Power supply, test product booting.Communication interface 104 is connect with test product, is used for transmission the test data of test product 20, such as
Test data is booting daily record data, i.e. Log data.If 20 energy normal boot-strap of test product, microcontroller 101 can pass through communication
Interface 104 receives the test data of test product 20, therefore microcontroller 101 can be according to whether the survey of test product 20 can be received
Examination data come judge test product 20 whether can normal boot-strap, can also according to from start to supply power to test product 20 receive by
The duration surveyed between the test data of product 20 is switched on required duration to detect test product 20.
In one embodiment, microcontroller 101 starts after powering to test product 20, if in the first preset time period
Test data is not received, then judges 20 boot failure of test product, microcontroller 101 generates boot failure information at this time, and
It controls display screen 103 and shows the boot failure information.Wherein, the duration of the first preset time period should be greater than the general of test product
Be switched on duration.
In one embodiment, after microcontroller 101 judges 20 energy normal boot-strap of test product, generation, which is switched on, successfully to be believed
Breath, and control display screen 103 and show the booting successful information.Further, microcontroller 101 also controls the display of display screen 103
The booting duration of test product 20.
Voltage detecting circuit 105 is used to detect the load voltage of test product, after test product 20 is switched on successfully, load
Voltage should be greater than 0, after test product 20 shuts down, and load voltage is equal to 0.In the test data for receiving test product 20
Afterwards, 101 control switch circuit 106 of microcontroller turns off, and stops powering to test product 20.Microcontroller 101 obtains voltage inspection
The load voltage that slowdown monitoring circuit 105 detects indicates that test product successfully shuts down when load voltage is 0.At this point, microcontroller
Device 101 generates shutdown successful information, and controls display screen 103 and show the shutdown successful information.Further, microcontroller 101
It is also used to load voltage be reduced to the duration between 0 and detect needed for test product 20 shuts down according to turning off from switching circuit 106
Duration, microcontroller 101 be also used to control display screen 103 show test product 20 shutdown duration information.
In one embodiment, after the shutdown of 101 control switch circuit 106 of microcontroller, if in the second preset time period
Load voltage is continuously detected greater than 0, then judges the shutdown failure of test product 20, microcontroller 101 generates shutdown failure at this time
Information, and control display screen 103 and show the shutdown failure information.Wherein, the duration of the second preset time period should be greater than tested production
The general shutdown duration of product.
Wherein, test result information include be switched on successfully, boot failure, shut down successfully, shut down fail, be switched on duration, pass
One of information such as machine duration are a variety of.Microcontroller 101 except control display screen 103 show above-mentioned test result information it
Outside, also controllable display screen 103 shows the information such as testing time, the time tested every time.
Above-mentioned on-off electric test device is by microcontroller, memory, display screen, communication interface, voltage detecting circuit and opens
Powered-down road is constituted, and structure is simple and small volume.Microprocessor according to can obtain test data and obtain test data when
Between judge automatically test product can normal boot-strap and booting duration, can judge automatically test product according to load voltage just
Often shutdown and shutdown duration are powered retention time or power-off time without artificial setting, without eye-observation test result,
Therefore human input can be reduced, promotes testing efficiency, while improving test accuracy rate.
In one embodiment, as shown in Fig. 2, above-mentioned on-off electric test device 10 further includes current foldback circuit 107, institute
It states current foldback circuit 107 and is separately connected the switching circuit 106 and the test product 20, that is, switching circuit 106 passed through
Stream protection circuit 107 connects test product 20.In the present embodiment, current foldback circuit 107 is used for current limliting, prevents due to electric current mistake
Above-mentioned on-off electric test device or test product are damaged greatly.
In one embodiment, for convenience of testing simultaneously multiple test products, on-off electric test device 10 includes
Multiple switch circuit and multiple current foldback circuits, one end of each switching circuit connect the microcontroller, each switch electricity
The other end on road connects a test product by a current foldback circuit；Such as the control terminal of each switching circuit respectively connect it is micro-
One output pin of controller 101, the connection terminal of each switching circuit respectively pass through the tested production of current foldback circuit connection one
Product.Wherein, the power supply terminal of each switching circuit is separately connected external power supply, and external power supply provides the DC voltage of 3V to 40V.
The voltage detecting circuit is plurality of voltages detection circuit, and the voltage detecting circuit connects the microcontroller and each tested production
Product；The communication interface is multichannel communication interface, for example, multichannel UART (Universal Asynchronous
Receiver/Transmitter, universal asynchronous receiving-transmitting transmitter) interface.The multichannel communication interface connects the microcontroller
Device and each test product.
As shown in figure 3, on-off electric test device 10 includes four switching circuits and four mistakes by taking four TCH test channels as an example
Stream protection circuit, correspondingly, communication interface are four-way UART interface, and voltage detecting circuit is four road voltage detecting circuits, should
On-off electric test device can simultaneously measure four test products.
In one embodiment, the switching circuit is PMOS switch circuit.Such as on-off electric test device includes four
PMOS switch circuit, can MCU control under on or off, realize the opening and closing of the power supply of different TCH test channels.
In one embodiment, on-off electric test device further includes power module, and the input terminal of power module connects external
The output end of power supply, power module connects the microcontroller.The voltage that power module is used to provide external power supply turns
It changes, to power for microcontroller 101.
In one embodiment, as shown in figure 4, other than power module, on-off electric test device further includes key mould
One of block, clock circuit and state circuit for lamp are a variety of.
Wherein, the key module connects the microcontroller 101.Key module is used for the setting information for inputting user
It is input to microcontroller 101.Power off time, testing time and testing time can be arranged by key module in user, make on-off
Electric test device 10 can provide more diversified test mode for user.
Wherein, the clock circuit connects the microcontroller 101.When clock circuit is that on-off electric test device 10 provides
Clock signal.In conjunction with key module and clock circuit, settable time and date.Wherein, clock circuit uses independent power supply.
Wherein, microcontroller 101 described in status lamp circuit connection；The microcontroller 101 is also used to when the switch electricity
When road is connected, controls the status lamp circuit and light；When switching circuit shutdown, controls the state circuit for lamp and close.
In such manner, it is possible to indicate the working condition of on-off electric test device 10.
In one embodiment, state circuit for lamp includes multiple status lamps, the wherein quantity of status lamp and switching circuit
Quantity is identical, and the corresponding switching circuit of each status lamp.When the conducting of some switching circuit, the control of microcontroller 101 should
The corresponding status lamp of switching circuit is lighted.When the shutdown of some switching circuit, it is corresponding that microcontroller 101 controls the switching circuit
Status lamp extinguishes.In such manner, it is possible to indicate the working condition of each TCH test channel.
In one embodiment, display screen 103 is liquid crystal display.
The on-off electric test device of the embodiment of the present invention can reduce test equipment connection complexity, simplify test environment
It is operated with personnel, avoids leading to test errors and interruption because of instrument problems；Timing controlled multi-channel test channel opening can be distinguished
Or it closes；Full-automatic testing may be implemented, be not necessarily to human attendance, test result is very clear；Research staff can be improved and test effect
Rate, and high reliablity, low manufacture cost.
Each technical characteristic of embodiment described above can be combined arbitrarily, for simplicity of description, not to above-mentioned reality
It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, all should be considered as described in this specification.
In addition, term " first ", " second " are used for descriptive purposes only and cannot be understood as indicating or suggesting relative importance
Or implicitly indicate the quantity of indicated technical characteristic.Define " first " as a result, the feature of " second " can be expressed or
Implicitly include at least one this feature.In the description of the present invention, the meaning of " plurality " is at least two, such as two, three
It is a etc., unless otherwise specifically defined.
The embodiments described above only express several embodiments of the present invention, and the description thereof is more specific and detailed, but simultaneously
It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art
It says, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to protection of the invention
Range.Therefore, the scope of protection of the patent of the invention shall be subject to the appended claims.
Claims (10)
1. a kind of on-off electric test device, which is characterized in that including microcontroller, memory, display screen, communication interface, voltage
Detection circuit and switching circuit；
The memory, the switching circuit, the voltage detecting circuit and the communication interface respectively with the microcontroller
Connection, the switching circuit, the communication interface and the voltage detecting circuit are also respectively connected with test product；
The microcontroller is used for:
The switching circuit conducting is controlled, is powered to the test product；
The test data of the test product is received by the communication interface；
The switching circuit shutdown is controlled, and obtains the load voltage that the voltage detecting circuit detects；
According to the opening time of the switching circuit, turn-off time, the receiving time of the test data and the load voltage,
Generate test result information；
It controls the display screen and shows the test result information.
2. on-off electric test device according to claim 1, which is characterized in that the microcontroller is also used to host computer
Send the test data.
3. on-off electric test device according to claim 1, it is characterised in that:
The on-off electric test device further includes current foldback circuit, and the current foldback circuit is separately connected the switching circuit
And the test product.
4. on-off electric test device according to claim 3, it is characterised in that:
The on-off electric test device includes multiple switch circuit and multiple current foldback circuits, and one end of each switching circuit connects
The microcontroller is connect, the other end of each switching circuit connects a test product by a current foldback circuit；
The voltage detecting circuit is plurality of voltages detection circuit, and the voltage detecting circuit connects the microcontroller and each quilt
Survey product；
The communication interface is multichannel communication interface, and the multichannel communication interface connects the microcontroller and each tested production
Product.
5. on-off electric test device according to any one of claims 1 to 4, which is characterized in that the communication interface is more
Channel asynchronous transmission interface.
6. on-off electric test device according to any one of claims 1 to 4, which is characterized in that the switching circuit is
PMOS switch circuit.
7. on-off electric test device according to any one of claims 1 to 4, which is characterized in that the on-off electrical testing dress
Setting further includes key module, and the key module connects the microcontroller.
8. on-off electric test device according to any one of claims 1 to 4, which is characterized in that the on-off electrical testing dress
Setting further includes clock circuit, and the clock circuit connects the microcontroller.
9. on-off electric test device according to any one of claims 1 to 4, which is characterized in that the on-off electrical testing dress
Setting further includes state circuit for lamp, microcontroller described in the status lamp circuit connection；
The microcontroller is also used to, and when switching circuit conducting, is controlled the status lamp circuit and is lighted；When the switch
When circuit turns off, controls the state circuit for lamp and close.
10. on-off electric test device according to any one of claims 1 to 4, which is characterized in that the on-off electrical testing dress
Setting further includes power module, and the input terminal of the power module connects external power supply, and the output end of the power module connects institute
State microcontroller.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811020550.4A CN109342867A (en) | 2018-09-03 | 2018-09-03 | On-off electric test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811020550.4A CN109342867A (en) | 2018-09-03 | 2018-09-03 | On-off electric test device |
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| CN109342867A true CN109342867A (en) | 2019-02-15 |
Family
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| Application Number | Title | Priority Date | Filing Date |
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| CN201811020550.4A Pending CN109342867A (en) | 2018-09-03 | 2018-09-03 | On-off electric test device |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN110046066A (en) * | 2019-04-15 | 2019-07-23 | 珠海妙存科技有限公司 | A kind of intelligent terminal automation power failure test system and its test cabinet |
| CN112666452A (en) * | 2019-10-15 | 2021-04-16 | 成都欧珀移动通信有限公司 | Circuit board test structure and device |
| CN113630289A (en) * | 2021-07-15 | 2021-11-09 | 深圳市亿联无限科技有限公司 | Test system and test method for improving production efficiency of gateway equipment |
| CN113704039A (en) * | 2021-09-03 | 2021-11-26 | 北京同方信息安全技术股份有限公司 | Auxiliary test equipment, system and method for computer product test |
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Application publication date: 20190215 |