CN113541829B - Test adapter plate, test system and test method - Google Patents
Test adapter plate, test system and test method Download PDFInfo
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- CN113541829B CN113541829B CN202010307840.8A CN202010307840A CN113541829B CN 113541829 B CN113541829 B CN 113541829B CN 202010307840 A CN202010307840 A CN 202010307840A CN 113541829 B CN113541829 B CN 113541829B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
- H04B17/15—Performance testing
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/10—Monitoring; Testing of transmitters
- H04B17/101—Monitoring; Testing of transmitters for measurement of specific parameters of the transmitter or components thereof
- H04B17/102—Power radiated at antenna
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/20—Monitoring; Testing of receivers
- H04B17/29—Performance testing
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- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Mobile Radio Communication Systems (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
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Abstract
The application provides a test adapter plate, a test system and a test method. The test patch panel includes: the device comprises a first interface terminal, a second interface terminal, a switch module and a control unit, wherein the first interface terminal and the second interface terminal are correspondingly arranged and are correspondingly connected through the switch module; the first interface terminal is configured to be electrically connected with a first electrical device; the second interface terminal is configured to be electrically connected with a second electrical device; the control unit is electrically connected with the switch module and is configured to control the opening and closing states of the switches in the switch module; and obtaining the performance parameters of the second electrical equipment under different opening and closing states of the switch. The method and the device can realize quick positioning of the bad antennas, and can detect the problem of mutual interference between the antennas.
Description
Technical Field
The present disclosure relates to the field of performance testing technologies, and in particular, to a testing adapter plate, a testing system, and a testing method.
Background
Currently, in the aspect of antenna performance test, the test is conducted on a single antenna or the active test (radiation emission power and the like) of the whole machine. Aiming at a 5G (5-thgenerator mobile networks, fifth generation mobile communication system) communication module (multi-antenna design), the performance of each antenna needs to be tested independently, the standard is ensured, the conventional test needs to perform a single-antenna passive test, the process is complex and tedious, and the test period is long.
When 5G communication is problematic, and antenna performance analysis is required, it is impossible to quickly locate which antenna performance is poor or the antennas interfere with each other.
Disclosure of Invention
The application provides a test adapter plate, a test system and a test method, which are used for solving the problem that the performance of which antenna cannot be positioned quickly or the antennas interfere with each other in the prior art.
To solve the above problems, the present application discloses a test patch panel, including: a first interface terminal, a second interface terminal, a switch module, and a control unit, wherein,
the first interface terminal and the second interface terminal are correspondingly arranged and are correspondingly connected through the switch module;
the first interface terminal is configured to be electrically connected with a first electrical device;
the second interface terminal is configured to be electrically connected with a second electrical device;
the control unit is electrically connected with the switch module and is configured to control the opening and closing states of the switches in the switch module; and obtaining the performance parameters of the second electrical equipment under different opening and closing states of the switch.
Optionally, the test patch panel further includes: a power amplification module, a power amplifier module,
the power amplification module is electrically connected between the switch module and the second interface terminal and is configured to perform power compensation on line loss in the test adapter board.
Optionally, the test patch panel further includes: the display unit is provided with a display unit,
the control unit is further configured to control the display of the display unit according to the performance parameter.
Optionally, the test patch panel further includes: a data transmission interface is provided with a data transmission interface,
the control unit is further configured to receive a test signal input by a first designated device through the data transmission interface; and/or outputting the performance parameters of the second electrical device to a second designated device through the data transmission interface, so that the second designated device determines the performance condition of the second electrical device according to the performance parameters.
Optionally, the number of switches included in the first interface terminal, the second interface terminal, and the switch module is the same, and each first interface terminal is electrically connected to the corresponding second interface terminal through one switch.
Optionally, the first electrical device is a communication module, the second electrical device is an antenna, the communication module is electrically connected with one of the first interface terminals, the number of the antennas is multiple, and each antenna is correspondingly connected with one of the second interface terminals; the performance parameter of the second electrical device is the transmitting power of each antenna.
Optionally, the first electrical device is a test device, and the second electrical device is a communication module.
Optionally, the first electrical device is a test device and the second electrical device is an antenna.
In order to solve the above problems, the application discloses a test system, which comprises a first electrical device, a second electrical device and the test adapter plate.
Optionally, the test system further includes a first designated device, the first electrical device is a communication module, the second electrical device is an antenna, and the first designated device is a test device;
the test equipment is configured to detect the transmitting power of the antenna and send the transmitting power to the test patch panel.
Optionally, the test system further includes a second specifying device configured to receive the transmission power of the antenna sent by the test patch panel, and determine the performance status of the antenna and the interference between the antennas according to the transmission power.
To solve the above problems, the present application discloses a testing method applied to the testing system described in any one of the above, the method comprising:
controlling the on-off state of a switch in the switch module;
and acquiring performance parameters of the second electrical equipment under different opening and closing states of the switch.
Optionally, the controlling the on-off state of the switch in the switch module includes:
and controlling the opening and closing states of the switches in the switch module according to a preset switch control combination sequence.
Optionally, after the acquiring the performance parameter of the second electrical device in the different opening and closing states of the switch, the method further includes:
and sending the performance parameter of the second electrical equipment to a second designated equipment so that the second designated equipment determines the performance of the second electrical equipment according to the performance parameter.
Compared with the prior art, the application has the following advantages:
the embodiment of the application provides a test adapter plate, a test system and a test method, wherein the test adapter plate can comprise: the device comprises a first interface terminal, a second interface terminal, a switch module and a control unit, wherein the first interface terminal and the second interface terminal are correspondingly arranged and are correspondingly connected through the switch module, the first interface terminal is configured to be electrically connected with first electrical equipment, the second interface terminal is configured to be electrically connected with second electrical equipment, the control unit is electrically connected with the switch module and is configured to control the opening and closing states of a switch in the switch module, and performance parameters of the second electrical equipment are obtained under different opening and closing states of the switch. According to the embodiment of the application, the closed state of the switch in the switch module is controlled to obtain the performance parameters of the second electrical equipment of the switch in different opening and closing states, so that the poor antenna can be rapidly positioned, and the problem of mutual interference between the antennas can be detected.
Drawings
Fig. 1 shows a schematic structural diagram of a test patch panel according to an embodiment of the present application;
fig. 2 is a schematic plan view of a test interposer according to an embodiment of the present application;
FIG. 3 shows a schematic diagram of a test radiation emission power provided by an embodiment of the present application;
FIG. 4 is a schematic diagram illustrating a test communication performance according to an embodiment of the present application;
fig. 5 is a schematic plan view of a test interposer according to an embodiment of the present disclosure in a test state;
fig. 6 is a schematic diagram of testing passive performance of an antenna according to an embodiment of the present application;
fig. 7 is a schematic structural diagram of a power amplification module according to an embodiment of the present application;
FIG. 8 is a schematic structural diagram of a test system according to an embodiment of the present disclosure;
fig. 9 is a flowchart of steps of a testing method according to an embodiment of the present application.
Detailed Description
In order that the above-recited objects, features and advantages of the present application will become more readily apparent, a more particular description of the invention briefly described above will be rendered by reference to specific embodiments that are illustrated in the appended drawings.
Example 1
Referring to fig. 1, a schematic structural diagram of a test patch panel provided in an embodiment of the present application is shown, and as shown in fig. 1, a test patch panel 100 may include a first interface terminal 101, a second interface terminal 103, a switch module 102, and a control unit 104, where the first interface terminal 101 and the second interface terminal 103 are correspondingly disposed and are correspondingly connected through the switch module 102.
In this embodiment, the number of the first interface terminals 101, the second interface terminals 103 and the switch modules 102 is the same, and one or more of the first interface terminals 101 and the second interface terminals 103 are arranged in a one-to-one correspondence, and each of the first interface terminals 101 and the second interface terminals 103 is electrically connected through a switch.
The first interface terminal 101 may be configured to electrically connect with a first electrical device and the second interface terminal 103 may be configured to electrically connect with a second electrical device.
The control unit 104 may be electrically connected to the switch module 102, and the control unit 104 may be configured to control the opening and closing states of the switches in the switch module 102, so as to obtain the performance parameters of the second electrical device when the switches are in different opening and closing states.
In the present embodiment, the performance parameter refers to a performance index parameter of the second electrical device.
In a specific implementation manner of this embodiment, the first electrical device may be a communication module, the second electrical device may be an antenna, the communication module may be electrically connected to one of the first interface terminals 101, and the plurality of antennas may be provided, and each antenna is correspondingly connected to one of the second interface terminals 103. In this case, the performance parameter of the second electrical device is the transmission power of each antenna.
Namely, the antenna is connected with the first interface terminal 101 on the test adapter plate 100 through the communication module, is connected with the second interface terminal 103 on the test adapter plate 100 through the antenna, and controls the closing state of the switch in the switch module 102 through the control unit 104, so that the transmitting power of the antenna can be obtained.
In another specific implementation manner of this embodiment, the first electrical device may be a testing device, and the second electrical device may be a communication module, which may be used to test performance of the communication module.
Of course, in this embodiment, the performance of the test communication module may be divided into two types, 1, the communication performance of the test communication module, 2, and the radiation emission power of the test communication module.
When the communication module is in a working state, the testing device can test the communication performance index of the chip port of the communication module, and in the testing process, the control unit 104 controls the switch in the switch module 102 to be turned on and off one by one to test the performance index of each channel.
In this embodiment, the test device may be any one of a spectrum analyzer, a wireless communication comprehensive tester, a test computer, and the like, and specifically, the test device may be selected according to a service requirement, which is not limited in this embodiment.
When the radiation emission power of the communication module is tested, the communication module can be electrically connected with the first interface terminal 101, the antenna is electrically connected with the second interface terminal 103, and the testing device is connected to the antenna (as shown in fig. 3), and when the communication module enters the working state, the testing device can test the radiation emission power of the whole communication device. In the testing process, the control unit 104 controls the switch in the switch module 102 to automatically test the radiation emission power performance of the communication module in different states. Therefore, the performance of each antenna in the whole machine state can be tested, and the problem of poor performance of which antenna or mutual interference of the antennas can be positioned.
In another specific implementation manner of this embodiment, the first electrical device may be a testing device, and the second electrical device may be a communication module, where the performance of the antenna may be tested.
In this embodiment, the test of the antenna performance may be classified into a test of the antenna passive performance and a test of the antenna active performance.
First, the test of the passive performance of the antenna can be described as follows in connection with fig. 6.
In testing the passive performance of the antenna, the test device may be electrically connected to the first interface terminal 101 and the antenna may be connected to the second interface terminal 103, so that the communication performance index (i.e., the passive communication performance index) of the antenna may be tested by the test device. During the test, the switches in the switch module 102 may be controlled by the control unit 104 to be turned on and off one by one to test the performance index of each antenna.
In testing the active performance of the antenna, the communication module may be electrically connected to the first interface terminal 101, the antenna may be connected to the second interface terminal 103, and the antenna may be connected to a testing device to test the active performance of the antenna by the testing device.
The test adapter plate provided by the embodiment can realize the test of various performance indexes of the communication module and the antenna.
In a preferred embodiment of the present application, a power amplification module is further disposed on the test interposer, and the power amplification module may be electrically connected between the switch module and the second interface terminal, so as to perform power compensation on line loss in the test interposer. The compensation value of the power amplification module to the line loss can be expressed as the following formula (1):
P＝P0-P2(1)
in the above formula (1), P is a power compensation value, P0 is the power sent by the communication module, and P2 is the power at the second interface terminal on the test patch panel.
The power amplifying module provided in this embodiment may be a power amplifying circuit, as shown in fig. 7, and any one of the two power amplifying circuits shown in fig. 7 may be applied to this embodiment, and the specific structure of the power amplifying circuit is not limited in this embodiment.
In another specific implementation manner of the application, the test adapter plate may further include a display unit, and the control unit may control display of the display unit according to the performance parameter obtained by the test.
As shown in fig. 2 and fig. 5, the antenna interface 1 is a first interface terminal in the present embodiment, the antenna interface 2 is a second interface terminal in the present embodiment, the switch module includes a plurality of switches, each switch connects one antenna interface 1 and the antenna interface 2, the control unit can control the display of the indicator lamp or the display unit according to the performance parameters obtained by the test, for example, the control unit can control the display unit to indicate the final result, if the final result is not up to standard, the red lamp is displayed, then the test result output by the test device is analyzed, and which antenna or antennas have defects is positioned. If both are normal, the current signal strength status is displayed.
In another specific implementation manner of the present application, the test patch panel may further include a data transmission interface, such as an I/O (Input/Output) interface shown in fig. 2, 3 and 5, and the control unit may receive, through the data transmission interface, a test signal Input by the first designated device, and/or Output, through the data transmission interface, a performance parameter of the second electrical device to the second designated device, so that the second designated device determines a performance condition of the second electrical device according to the performance parameter.
In this embodiment, the first designated device may be a device such as a test device or an antenna, and the second designated device may be a terminal device, such as a computer, a tablet computer, or the like, where the performance parameters of the second electrical device obtained by the test may be obtained through the second designated device, so as to perform real-time analysis on the performance condition of the second electrical device.
In another specific implementation of the present application, as shown in fig. 3, a power interface 105 may be further preset on the test adapter board 100, where the power interface 105 may be connected to the control unit 104, and when the test adapter board performs a test working state, the control unit 104 may control the conduction of the power interface 105, and connect to a power source through the power interface 105, so as to provide electric energy for the work of the test adapter board 100.
The test adapter plate provided by the embodiment obtains the performance parameters of the second electrical equipment of the switch in different opening and closing states by controlling the closing state of the switch in the switch module.
The test patch panel provided by the embodiment of the application comprises: the device comprises a first interface terminal, a second interface terminal, a switch module and a control unit, wherein the first interface terminal and the second interface terminal are correspondingly arranged and are correspondingly connected through the switch module, the first interface terminal is configured to be electrically connected with first electrical equipment, the second interface terminal is configured to be electrically connected with second electrical equipment, the control unit is electrically connected with the switch module and is configured to control the opening and closing states of a switch in the switch module, and performance parameters of the second electrical equipment are obtained under different opening and closing states of the switch. According to the embodiment of the application, the closed state of the switch in the switch module is controlled to obtain the performance parameters of the second electrical equipment of the switch in different opening and closing states, so that the poor antenna can be rapidly positioned, and the problem of mutual interference between the antennas can be detected.
Example two
Referring to fig. 8, which illustrates a schematic structural diagram of a test system provided in an embodiment of the present application, as shown in fig. 8, a test system 200 may include: the test interposer 201, the first electrical device 202, and the second electrical device 203, wherein the test interposer 201 is the test interposer provided in the first embodiment.
The test adapter plate 201 is provided with a first interface terminal and a second interface terminal, the first interface terminal can be connected with the first electrical equipment 202, the second interface terminal can be connected with the second electrical equipment 203, the test adapter plate 201 is also provided with a control unit and a switch module, and the first interface terminal and the second interface terminal are correspondingly arranged and are correspondingly connected through the switch module.
The control unit may control the closed state of the switch in the switch module, and further may test the performance parameters of the second electrical device 203 in different open/close states of the switch.
In this embodiment, the second electrical device may be an antenna or a communication module. When the second electrical device is an antenna, the first electrical device is a test device, and at this time, the active performance and the passive performance of the antenna can be tested by the test device. When the second electrical equipment is the communication module, the first electrical equipment can be test equipment, and at the moment, the communication performance and the radiation emission power of the communication module can be tested through the test equipment.
In this embodiment, the first electrical device may also be a communication module, where the second electrical device may be an antenna, and the communication module may be electrically connected to a first interface terminal on the test adapter board, and the antenna is correspondingly connected to a second interface terminal on the test adapter board, where the transmitting power of the second electrical device (i.e. the antenna) may be tested.
In a specific implementation manner of the application, the test system may further include a second specifying device, where the second specifying device may be configured to receive the transmitting power of the antenna sent by the test patch panel, and determine the performance state of the antenna and the interference condition between the antennas according to the transmitting power.
According to the test system provided by the embodiment of the application, the closed state of the switch in the switch module on the test adapter plate is controlled to obtain the performance parameters of the second electrical equipment of the switch in different opening and closing states, so that the quick positioning of the bad antenna can be realized, and the problem of mutual interference between the antennas can be detected.
Example III
Referring to fig. 9, a step flowchart of a testing method provided in an embodiment of the present application is shown, where the testing method may be applied to the testing system in the second embodiment, and specifically may include the following steps:
step 901: and controlling the opening and closing states of the switches in the switch module.
Step 902: and acquiring performance parameters of the second electrical equipment under different opening and closing states of the switch.
In this embodiment, the switch-on state in the switch module may be controlled by the control unit on the test patch panel.
In the different closed states of the switch, a performance parameter of the second electrical device can be obtained, for example,
in a specific implementation manner of this embodiment, the first electrical device may be a communication module, the second electrical device may be an antenna, the communication module may be electrically connected to one of the first interface terminals on the test interposer, and the plurality of antennas may be provided, where each antenna is correspondingly connected to one of the second interface terminals on the test interposer. In this case, the performance parameter of the second electrical device is the transmission power of each antenna.
The antenna is connected with a first interface terminal on the test adapter plate through the communication module, is connected with a second interface terminal on the test adapter plate through the antenna, and can acquire the transmitting power of the antenna by controlling the closing state of a switch in the switch module through the control unit.
In another specific implementation manner of this embodiment, the first electrical device may be a testing device, and the second electrical device may be a communication module, which may be used to test performance of the communication module.
Of course, in this embodiment, the performance of the test communication module may be divided into two types, 1, the communication performance of the test communication module, 2, and the radiation emission power of the test communication module.
When the communication module is in a working state, the testing equipment can test the communication performance index of the chip port of the communication module, and in the testing process, the control unit controls the switch in the switch module to be turned on and off one by one to test the performance index of each channel.
In this embodiment, the test device may be any one of a spectrum analyzer, a wireless communication comprehensive tester, a test computer, and the like, and specifically, the test device may be selected according to a service requirement, which is not limited in this embodiment.
When the radiation emission power of the communication module is tested, the communication module can be electrically connected with the first interface terminal, the antenna is electrically connected with the second interface terminal, the testing equipment is connected to the antenna (as shown in fig. 3), and when the communication module enters a working state, the testing equipment can test the radiation emission power of the whole communication equipment. In the testing process, the control unit controls the switch in the switch module to automatically test the radiation emission power performance of the communication module in different states. Therefore, the performance of each antenna in the whole machine state can be tested, and the problem of poor performance of which antenna or mutual interference of the antennas can be positioned.
In another specific implementation manner of this embodiment, the first electrical device may be a testing device, and the second electrical device may be a communication module, where the performance of the antenna may be tested.
In this embodiment, the test of the antenna performance may be classified into a test of the antenna passive performance and a test of the antenna active performance.
First, the test of the passive performance of the antenna can be described as follows in connection with fig. 6.
When the passive performance of the antenna is tested, the testing device and the first interface terminal can be electrically connected, and the antenna can be connected with the second interface terminal, so that the communication performance index (namely, the passive communication performance index) of the antenna can be tested through the testing device. In the testing process, the control unit can control the switches in the switch module to be turned on and off one by one so as to test the performance index of each antenna.
When the active performance of the antenna is tested, the communication module can be electrically connected with the first interface terminal, the antenna is connected with the second interface terminal, and the antenna is connected with the testing equipment, so that the active performance of the antenna can be tested through the testing equipment.
The test adapter plate is also provided with a data transmission interface, and after the performance parameters of the second electrical equipment are acquired, the performance parameters of the second electrical equipment can be sent to the second designated equipment through the data transmission interface, so that the second designated equipment determines the performance condition of the second electrical equipment according to the performance parameters.
According to the testing method provided by the embodiment, the performance parameters of the second electrical equipment under different opening and closing states of the switches are obtained by controlling the opening and closing states of the switches in the switch module, so that the bad antennas can be rapidly positioned, and the problem of mutual interference between the antennas can be detected.
For the foregoing method embodiments, for simplicity of explanation, the methodologies are shown as a series of acts, but one of ordinary skill in the art will appreciate that the present application is not limited by the order of acts described, as some acts may, in accordance with the present application, occur in other orders or concurrently. Further, those skilled in the art will also appreciate that the embodiments described in the specification are all preferred embodiments, and that the acts and modules referred to are not necessarily required in the present application.
In this specification, each embodiment is described in a progressive manner, and each embodiment is mainly described by differences from other embodiments, and identical and similar parts between the embodiments are all enough to be referred to each other.
Finally, it is further noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article or apparatus that comprises the element.
The foregoing has described in detail a test adapter board, a test system and a test method provided by the present application, and specific examples have been used herein to illustrate the principles and embodiments of the present application, where the foregoing examples are provided to assist in understanding the methods of the present application and their core ideas; meanwhile, as those skilled in the art will have modifications in the specific embodiments and application scope in accordance with the ideas of the present application, the present description should not be construed as limiting the present application in view of the above.
Claims (14)
1. A test interposer, comprising: a first interface terminal, a second interface terminal, a switch module, a control unit and a second specifying device, wherein,
the first interface terminals and the second interface terminals are correspondingly arranged, and each first interface terminal and the corresponding second interface terminal are correspondingly connected through one switch module;
the first interface terminal is configured to be electrically connected with a first electrical device;
the second interface terminal is configured to be electrically connected with a second electrical device;
the control unit is electrically connected with the switch module and is configured to control the opening and closing states of the switches in the switch module; obtaining performance parameters of the second electrical equipment under different opening and closing states of the switch;
the control unit is used for outputting the performance parameters of the second electrical equipment to the second designated equipment so that the second designated equipment can determine the performance state of the antenna and the interference condition between the antennas according to the performance parameters of the second electrical equipment.
2. The test interposer of claim 1, further comprising: a power amplification module, a power amplifier module,
the power amplification module is electrically connected between the switch module and the second interface terminal and is configured to perform power compensation on line loss in the test adapter board.
3. The test interposer of claim 1, further comprising: the display unit is provided with a display unit,
the control unit is further configured to control the display of the display unit according to the performance parameter.
4. The test interposer of claim 1, further comprising: a data transmission interface is provided with a data transmission interface,
the control unit is further configured to receive a test signal input by a first designated device through the data transmission interface; and/or outputting the performance parameters of the second electrical device to a second designated device through the data transmission interface, so that the second designated device determines the performance condition of the second electrical device according to the performance parameters.
5. The test patch panel of any one of claims 1 to 4, wherein the number of switches included in the first interface terminal, the second interface terminal, and the switch module are the same, and each of the first interface terminals is electrically connected to a corresponding one of the second interface terminals through one of the switches.
6. The test patch panel of any one of claims 1 to 4, wherein the first electrical device is a communication module, the second electrical device is an antenna, the communication module is electrically connected to one of the first interface terminals, the plurality of antennas are each correspondingly connected to one of the second interface terminals; the performance parameter of the second electrical device is the transmitting power of each antenna.
7. The test interposer of any one of claims 1 to 4, wherein the first electrical device is a test device and the second electrical device is a communication module.
8. The test interposer of any one of claims 1 to 4, wherein the first electrical device is a test device and the second electrical device is an antenna.
9. A test system comprising a first electrical device, a second electrical device and the test patch panel of any one of claims 1 to 8.
10. The test system of claim 9, further comprising a first designated device, the first electrical device being a communication module, the second electrical device being an antenna, the first designated device being a test device;
the test equipment is configured to detect the transmitting power of the antenna and send the transmitting power to the test patch panel.
11. The test system of claim 9, further comprising a second specifying device configured to receive a transmit power of the antenna transmitted by the test patch panel, the performance condition of the antenna and the interference between the antennas being determined from the transmit power.
12. A test method applied to the test system of any one of claims 9 to 11, the method comprising:
controlling the on-off state of a switch in the switch module;
and acquiring performance parameters of the second electrical equipment under different opening and closing states of the switch.
13. The method of claim 12, wherein controlling the on-off state of the switches in the switch module comprises:
and controlling the opening and closing states of the switches in the switch module according to a preset switch control combination sequence.
14. The method of claim 12, further comprising, after said obtaining the performance parameter of the second electrical device in the different open and closed states of the switch:
and sending the performance parameter of the second electrical equipment to a second designated equipment so that the second designated equipment determines the performance of the second electrical equipment according to the performance parameter.
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| CN202010307840.8A CN113541829B (en) | 2020-04-17 | 2020-04-17 | Test adapter plate, test system and test method |
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| CN202010307840.8A CN113541829B (en) | 2020-04-17 | 2020-04-17 | Test adapter plate, test system and test method |
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| US9070968B2 (en) * | 2012-04-02 | 2015-06-30 | Apple Inc. | Methods for characterizing tunable radio-frequency elements in wireless electronic devices |
| CN104219519A (en) * | 2014-09-16 | 2014-12-17 | 硅谷数模半导体（北京）有限公司 | Testing adapter plate, system and method of audio and video interface |
| CN109490757A (en) * | 2018-12-04 | 2019-03-19 | 深圳市万普拉斯科技有限公司 | Wireless radio frequency circuit, electronic equipment and test macro |
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