CN113574358B - 异常检测装置及异常检测方法 - Google Patents

异常检测装置及异常检测方法 Download PDF

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CN113574358B
CN113574358B CN201980093996.6A CN201980093996A CN113574358B CN 113574358 B CN113574358 B CN 113574358B CN 201980093996 A CN201980093996 A CN 201980093996A CN 113574358 B CN113574358 B CN 113574358B
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data
learning
interval
abnormality
time
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CN113574358A (zh
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上田宜史
冈岛淳
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Mitsubishi Electric Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00—Subject matter not provided for in other groups of this subclass
    • G01M99/008—Subject matter not provided for in other groups of this subclass by doing functionality tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00—Subject matter not provided for in other groups of this subclass
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
    • G06F11/0736—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment in functional embedded systems, i.e. in a data processing system designed as a combination of hardware and software dedicated to performing a certain function
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751—Error or fault detection not based on redundancy
    • G06F11/0754—Error or fault detection not based on redundancy by exceeding limits
    • G06F11/076—Error or fault detection not based on redundancy by exceeding limits by exceeding a count or rate limit, e.g. word- or bit count limit
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
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  • Evolutionary Computation (AREA)
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  • Data Mining & Analysis (AREA)
  • Life Sciences & Earth Sciences (AREA)
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  • Molecular Biology (AREA)
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  • Mathematical Physics (AREA)
  • Software Systems (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
CN201980093996.6A 2019-03-18 2019-03-18 异常检测装置及异常检测方法 Active CN113574358B (zh)

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PCT/JP2019/011158 WO2020188696A1 (ja) 2019-03-18 2019-03-18 異常検知装置および異常検知方法

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CN113574358B true CN113574358B (zh) 2022-09-20

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KR (1) KR102408756B1 (ja)
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WO (1) WO2020188696A1 (ja)

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Publication number Priority date Publication date Assignee Title
CN113296990B (zh) * 2020-09-30 2022-06-24 阿里云计算有限公司 时序数据的异常识别方法及装置
WO2023276083A1 (ja) * 2021-06-30 2023-01-05 慎平 大杉 情報処理システム、学習済みモデル、情報処理方法、及びプログラム
JP2023044960A (ja) * 2021-09-21 2023-04-03 株式会社日立インダストリアルプロダクツ 機器診断システム
CN117113009B (zh) * 2023-10-23 2024-01-16 合肥亚明汽车部件有限公司 一种数字化工厂设备运行风险预警方法

Family Cites Families (16)

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US5602761A (en) * 1993-12-30 1997-02-11 Caterpillar Inc. Machine performance monitoring and fault classification using an exponentially weighted moving average scheme
JP3427946B2 (ja) * 1994-04-08 2003-07-22 大和製衡株式会社 重量選別機
JP2721799B2 (ja) * 1994-04-14 1998-03-04 四国電力株式会社 機械の異常判定方法
JP2000028781A (ja) * 1998-07-09 2000-01-28 Mitsubishi Electric Corp 制御棒挿入状態監視装置
JP3821225B2 (ja) * 2002-07-17 2006-09-13 日本電気株式会社 時系列データに対する自己回帰モデル学習装置並びにそれを用いた外れ値および変化点の検出装置
JP4573036B2 (ja) * 2005-03-16 2010-11-04 オムロン株式会社 検査装置および検査方法
WO2008114863A1 (ja) * 2007-03-22 2008-09-25 Nec Corporation 診断装置
JP5072693B2 (ja) * 2007-04-11 2012-11-14 キヤノン株式会社 パターン識別装置及びその制御方法、異常パターン検出装置及びその制御方法、プログラム、記憶媒体
CN101256646A (zh) * 2008-03-20 2008-09-03 上海交通大学 轿车客户需求信息聚类分析系统
JP5301310B2 (ja) * 2009-02-17 2013-09-25 株式会社日立製作所 異常検知方法及び異常検知システム
JP2013143009A (ja) * 2012-01-11 2013-07-22 Hitachi Ltd 設備状態監視方法およびその装置
KR20140011064A (ko) * 2012-07-17 2014-01-28 서울과학기술대학교 산학협력단 이상치 탐지 기법을 이용한 가상 계측 결과의 신뢰도 추정 방법
US9146800B2 (en) 2013-07-01 2015-09-29 Mitsubishi Electric Research Laboratories, Inc. Method for detecting anomalies in a time series data with trajectory and stochastic components
JP6573846B2 (ja) * 2016-06-01 2019-09-11 株式会社神戸製鋼所 回転機械の運転状態を診断する診断装置及び診断方法
JP6386520B2 (ja) * 2016-12-13 2018-09-05 ファナック株式会社 数値制御装置及び機械学習装置
JP6877245B2 (ja) * 2017-06-01 2021-05-26 株式会社東芝 情報処理装置、情報処理方法及びコンピュータプログラム

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Publication number Publication date
CN113574358A (zh) 2021-10-29
WO2020188696A1 (ja) 2020-09-24
KR102408756B1 (ko) 2022-06-15
JP6647473B1 (ja) 2020-02-14
JPWO2020188696A1 (ja) 2021-04-01
KR20210114070A (ko) 2021-09-17

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