CN113552393A

CN113552393A - Test probe seat structure

Info

Publication number: CN113552393A
Application number: CN202010324997.1A
Authority: CN
Inventors: 呙昇华
Original assignee: Yueyun Technology Co ltd
Current assignee: Yueyun Technology Co ltd
Priority date: 2020-04-23
Filing date: 2020-04-23
Publication date: 2021-10-26

Abstract

The invention relates to a test probe seat structure, which comprises a seat body, wherein at least two probes which are insulated from each other and are separated from each other are arranged on the seat body; each probe is clamped on an insulating seat body through a covering plate. By utilizing the structure of the invention, a plurality of groups of probes can be arranged on the seat body with small volume, so that the number of measuring points is increased, in addition, the assembly and the replacement of the probes are quick and convenient, the positioning effect of the probes is good, and the requirements of the operators are met.

Description

Test probe seat structure

Technical Field

The present invention relates to a test probe seat, and more particularly to a test probe seat structure for testing an integrated circuit.

Background

The integrated circuit device is widely used in various electronic products, and the integrated circuit device can be regarded as the most important center of the electronic products. After the manufacture of the integrated circuit device and before the shipment, the manufacturer must use the testing equipment such as probes to perform the function detection of the integrated circuit device; if an abnormality is found, the abnormality must be eliminated so as to avoid the defects of the commodities assembled by the rear-end downstream manufacturer after the shipment and even derive unexpected results.

Because the prior product is light, thin, short and small, the integrated circuit element is also oriented to high density, so that the electrode pad spacing is narrower, and the derived subject is that the probe equipment for testing is also required to increase the density or promote the testing point in the same space; moreover, the diameter of the probe is also finer, so that the probe has a smaller diameter, relatively shortened service life and poor durability; therefore, the probe becomes a high-consumption consumable; the derived problems are whether the structure of the probe arranged on the probe seat is stable, whether the probe is replaced quickly and easily, and whether the stress of the probe is even during testing.

The present invention is developed in view of the limitation that the conventional probe base cannot increase the number of measuring points in the same space due to its large volume, and the problems that the probe is not easy to replace, the structure is unstable, and the stress is not uniform during the test. The inventor has completed the invention by accumulating the rich experience of the industry for decades and applying and acquiring experience and strength solution of a plurality of domestic and foreign patents.

Disclosure of Invention

In order to overcome the defects of difficult replacement, unstable structure, uneven stress during testing and the like of the conventional probe seat, the invention mainly aims to provide a test probe seat structure which can be provided with a plurality of test points in a single probe seat; therefore, the testing efficiency can be improved, and the testing method is suitable for testing the high-density integrated circuit.

Another object of the present invention is to: providing a test probe seat structure, which can ensure that the joint effect of a probe and a probe seat is quite stable through a redesigned clamping structure; when the test is required, the test effect is good, particularly, the stress of the probe is more uniform than that in the prior art, the test capability can be improved, and the trouble that the probe is broken or the test effect is poor due to uneven stress is overcome.

The secondary purpose of the invention is that: the utility model provides a test probe seat structure, its through redesign's clip formula structure, except that the joint effect that enables probe and probe seat is fairly firm, the atress is even, when will carrying out the probe change, also fairly convenient fast can effectively shorten the change time, promotes efficiency of software testing.

In order to achieve the above purpose, the main means of the invention is as follows: in a single holder, two different areas of test probes are provided, insulated from each other.

Preferably, the present invention specifically comprises: in a first embodiment, the probe seat includes a seat body, two cover plates, two probes and a plurality of locking members. The seat body is correspondingly provided with two containing grooves, a spacing body is arranged between the two containing grooves, each containing groove is in a flat arrangement shape, the containing groove is provided with a groove along the edge, the inner end edge of the groove is provided with one or more through holes, and each containing groove is provided with a lock hole; the probe is a needle body made of metal or conductive material, wherein one tip end is a testing end, the other end is a connecting end, the probe can be used for being assembled in the groove, and the connecting end is inserted into the through hole; the cover plate has a shape slightly identical to that of the containing groove, one or more upper lock holes are arranged on the cover plate in a penetrating way, and an upper groove corresponding to the lower groove is arranged on the bottom surface of the cover plate; the probes are arranged between the grooves and the upper grooves between the base body and the cover board and are locked in the upper lock holes of the cover board and the lock holes of the base body through the locking pieces, so that the purpose that the two probes are clamped between the base body and the two cover boards can be achieved.

Preferably, the present invention is also obtained in the second embodiment: the probe seat comprises a seat body, two cover plates, two probes, a plurality of locking pieces and two sandwich plates. The seat body is correspondingly provided with two containing grooves, a spacing body is arranged between the two containing grooves, each containing groove is in a flat shape, each containing groove is provided with a sandwich plate, each sandwich plate is provided with a groove along the edge, the inner end edge of each groove is provided with a through hole, and each sandwich plate is provided with a lock hole; the probe is a needle body made of metal or conductive material, wherein one tip end is a testing end, the other end is a connecting end, the probe can be used for being assembled in the groove, and the connecting end is inserted into the through hole; the covering plate is stacked above the sandwich plate, one or more upper lock holes are arranged on the covering plate in a penetrating way, and an upper groove corresponding to the lower groove is arranged on the bottom surface of the covering plate; the probes are arranged in the groove and the upper groove between the sandwich plate and the cover plate and are locked in the upper lock hole of the cover plate and the lock hole of the sandwich plate through the lock piece, so that the purpose that the two probes are clamped between the sandwich plate and the two cover plates can be achieved. The sandwich plate and the containing groove can be connected in a random bonding mode.

In addition, in the third embodiment: the probe seat comprises a seat body, two cover plates, two probes and a plurality of locking pieces. The seat body is correspondingly provided with two containing grooves, a spacing body is arranged between the two containing grooves, each containing groove is in a flat arrangement shape, a groove is arranged in the containing groove along the edge, and a lock hole is arranged in each containing groove; the probe is a needle body made of metal or conductive material, wherein one tip end is a testing end, the other end is a connecting end, and the probe is slightly ㄣ -shaped; the cover plate has a shape slightly identical to that of the containing groove, one or more upper lock holes are arranged on the cover plate in a penetrating way, an upper groove corresponding to the lower groove is arranged on the bottom surface, and the upper groove is connected with a through hole; the probes are arranged between the groove and the upper groove between the base body and the cover board, the connecting ends of the probes are inserted into the through holes, and then the probes are assembled in the upper lock hole of the cover board and the lock hole of the base body through the lock piece lock, so that the purpose that the two probes are clamped between the base body and the two cover boards can be achieved. The cover plate is further provided with an upper locking opening to provide a lower locking member for locking the cover plate from bottom to top.

In the first embodiment, two or more probe bases can be combined as required, that is, the accommodating groove, the cover plate and the probes on the base can be increased by times as required. Further, the fourth embodiment is described.

Preferably, the seat body is made of an insulating material; in addition, the covering plate, the sandwich plate, the locking piece and the lower locking piece are all made of materials with electric conduction efficiency.

Drawings

FIG. 1 is an exploded perspective view of a first embodiment of the present invention;

FIG. 2 is a perspective assembly view of an embodiment of the present invention;

FIG. 3 is an exploded perspective view of a second embodiment of the present invention;

FIG. 4 is a perspective view of the present invention;

FIG. 5 is an exploded perspective view of a third embodiment of the present invention;

FIG. 6 is a perspective assembly view of three embodiments of the present invention;

fig. 7 is a perspective combination external view of a fourth embodiment of the present invention.

Description of the reference numerals

1. A probe base; 11. a base body; 111. a containing groove; 112. a groove;

113. perforating; 114. a lock hole; 115. a spacer; 12. covering the plywood;

121. an upper lock hole; 122. an upper groove; 13. a probe; 131. a test end;

132. a connecting end; 14. a lock; 2. a probe base; 21. a base body;

211. a containing groove; 215. a spacer; 22. covering the plywood; 221. an upper lock hole;

222. an upper groove; 23. a probe; 231. a test end; 232. a connecting end;

24. a lock; 25. a sandwich panel; 251. a groove; 252. perforating; 253. a lock hole;

24. a lock; 3. a probe base; 31. a base body; 315. a spacer; 311. a containing groove;

312. a groove; 313. a lock hole; 32. covering the plywood; 321. an upper lock hole;

322. an upper groove; 323. locking the opening; 324. perforating; 33. a probe;

331. a test end; 332. a connecting end; 34. a lock; 35. a lower locking piece;

4. a probe base; 41. a probe set; 42. a probe set.

Detailed Description

The details of the structure of the test probe base and the resulting functions of the test probe base of the present invention are described in detail below with reference to the accompanying drawings, which illustrate a preferred embodiment of the present invention:

referring to fig. 1 and 2, in a first embodiment of a test probe base structure according to the present invention, the probe base 1 includes a base body 11, two cover plates 12, two probes 13 and a plurality of locking members 14. The base 11 is correspondingly provided with two receiving slots 111, and a spacing body 115 is arranged between the two receiving slots; each accommodating groove 111 is in a flat shape, a groove 112 is arranged in the edge of the accommodating groove 111 in an extending way, one or more through holes 113 are arranged at the inner end edge of the groove 112, and a lock hole 114 is arranged in each accommodating groove 111; the probe 13 is a metal or conductive needle, wherein one tip is a testing end 131, and the other end is a connecting end 132, the probe 13 can be assembled in the groove 112, and the connecting end 132 is inserted into one of the through holes 113; the cover plate 12 has a shape similar to the containing groove 111, one or more upper lock holes 121 are formed in the cover plate, and an upper groove 122 corresponding to the lower groove 112 is formed in the bottom surface of the cover plate; the two probes 13 are disposed between the base 11 and the two cover plates 12 by placing the probes 13 between the groove 112 and the upper groove 122 between the base 11 and the cover plates 12, and locking the probes in the locking holes 121 of the cover plates 12 and the locking holes 114 of the base 11 by the locking members 14. The base body 11 is made of an insulating material; the cover plate 12 and the locking member 14 are made of an electrically conductive material. With the above configuration, in practice, the test can be performed by using the two probes 13.

Referring to fig. 3 and 4, the present invention can also be implemented in a second embodiment: the probe seat 2 includes a seat body 21, two cover plates 22, two probes 23, a plurality of locking parts 24 and two sandwich plates 25. Two accommodating grooves 211 are correspondingly arranged in the base body 21, a spacing body 215 is arranged between the two accommodating grooves 211, each accommodating groove 211 is in a flat arrangement shape, a sandwich plate 25 is arranged at each accommodating groove 211, a groove 251 is arranged along the edge of each sandwich plate 25, a through hole 252 is arranged at the inner end edge of each groove 251, and a lock hole 253 is arranged in each sandwich plate 25; the probe 23 is a metal or conductive needle, wherein one tip is a testing end 231, and the other end is a connecting end 232, the probe 23 can be assembled in the groove 251, and the connecting end 232 is inserted into the through hole 252; the cover plate 22 is stacked above the sandwich plate 25, one or more upper lock holes 221 are arranged on the cover plate, and an upper groove 222 corresponding to the lower groove 251 is arranged on the bottom surface of the cover plate; the two probes 23 are disposed between the sandwich plate 25 and the cover plate 22 by placing the probes 23 in the groove 251 and the upper groove 222 between the sandwich plate 25 and the cover plate 22, and locking the probes in the locking hole 221 of the cover plate 22 and the locking hole 253 of the sandwich plate 25 by the locking member 24. The sandwich plate and the containing groove can be connected in a random bonding mode; the seat body 21 is made of an insulating material; the cover plate 22, the locking member 24 and the sandwich plate 25 are made of electrically conductive materials. With the above-described structure, the test can be performed by using the two probes 23.

In addition, please refer to fig. 5 and fig. 6, in the third embodiment: the probe seat 3 includes a seat body 31, two cover plates 32, two probes 33 and a plurality of locking parts 34. The base 31 is correspondingly provided with two accommodating grooves 311, a spacing body 315 is arranged between the two accommodating grooves 311, each accommodating groove 311 is in a flat shape, a groove 312 is arranged along the edge of each accommodating groove 311, and each accommodating groove 311 is provided with a locking hole 313; the probe 33 is a needle body made of metal or conductive material, wherein one tip end is a testing end 331, the other end is a connecting end 332, and the probe 33 is slightly ㄣ -shaped; the cover plate 32 has a shape similar to the containing groove 311, one or more upper locking holes 321 are formed through the cover plate, an upper groove 322 corresponding to the lower groove 312 is formed in the bottom surface of the cover plate, and the upper groove 322 is connected with a through hole 324; the two probes 33 are disposed between the base 31 and the two cover plates 32 by placing the probes 33 between the grooves 312 and the upper grooves 322 between the base 31 and the cover plates 32, inserting the connecting ends 332 into the through holes 324, and locking the probes in the locking holes 321 of the cover plates 32 and the locking holes 313 of the base 31 by the locking members 34. The cover plate 32 is further provided with an upper locking notch 323 to lock a lower locking member 35 from bottom to top. The seat body 31 is made of an insulating material; the cover plate 32, the locking member 34 and the lower locking member 35 are made of an electrically conductive material. With the above configuration, the test can be performed by using the two probes 33.

In the first embodiment, two or more probe bases can be combined as required, that is, the accommodating groove, the cover plate and the probes on the base can be increased by times as required; further, the fourth embodiment; the probe holder 4 includes a plurality of probe sets 41 and a plurality of probe sets 42 in pairs.

Although the present invention has been described with reference to the foregoing embodiments, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention. The foregoing description of the preferred embodiments of the present invention is provided for the purpose of illustrating the general principles of the invention and is not to be taken in a limiting sense, since the scope of the present invention is defined by the appended claims.

Claims

1. A test probe seat structure is characterized in that at least two probes which are insulated from each other are arranged in a seat body, and the probes are made of conductive materials.

2. A test probe socket structure, comprising:

the seat body is correspondingly provided with at least two containing grooves, a spacing body is arranged between the two containing grooves, and the seat body is made of insulating materials;

at least two probes, wherein one tip of each probe is a testing end;

at least two cover plates, each of which can be matched with the containing groove to clamp the probe structure through a locking piece and expose the test end of the probe; the cover plate and the locking piece are made of materials with electric conduction functions.

3. The test probe socket structure of claim 2, wherein each receiving cavity has a recess extending to an edge, an inner end of the recess has at least one through hole, and each receiving cavity has a lock hole; the other end of the probe is a connecting end; one or more upper lock holes are arranged on the cover plate in a penetrating way, and an upper groove corresponding to the lower groove is arranged on the bottom surface.

4. The test probe socket structure of claim 2, wherein the probe conductive material is formed with a plurality of receiving slots, cover plates and probes on the socket body, the number of receiving slots, the cover plates and the number of probes being increased as required.

5. A test probe socket structure, comprising:

the seat body is correspondingly provided with two containing grooves, a spacing body is arranged between the two containing grooves, and the seat body is made of insulating materials;

at least two sandwich plates which are respectively jointed at the positions of the containing grooves;

at least two probes, wherein one tip is a testing end;

at least two cover plates which are respectively stacked above the sandwich plates, wherein the probe structure is clamped by the cover plates through a locking piece in a matching way with the sandwich plates, and the test end of the probe is exposed; the cover plate, the sandwich plate and the locking piece are made of materials with electric conduction functions.

6. The test probe socket structure of claim 5, wherein each sandwich plate has a groove extending along an edge thereof, an inner end edge of the groove having at least one through hole, each sandwich plate having a locking hole therein; the other end of each probe opposite to the probe is a connecting end; one or more upper lock holes are arranged on each cover plate in a penetrating way, and an upper groove corresponding to the groove below is arranged on the bottom surface.

7. The test probe socket structure of claim 5, wherein the receiving groove, the cover plate, the sandwich plate and the probe are made of conductive material.

8. A test probe socket structure, comprising:

at least two probes, wherein one tip is a testing end;

at least two cover plates, one or more upper lock holes are arranged on the cover plates in a penetrating way, an upper groove corresponding to the lower groove is arranged on the bottom surface, and the upper groove is connected with a through hole; the covering plate is also provided with an upper locking notch so as to provide a lower locking piece for locking the assembly from bottom to top;

each probe is arranged between the groove and the upper groove between the base body and the cover plate, the connecting end of the probe is inserted into the through hole, and the probe is assembled in the upper lock hole of the cover plate and the lock hole of the base body through a lock piece lock, so that the probe can be clamped between the base body and the cover plate; the cover plate, the locking piece and the lower locking piece are all made of materials with electric conduction efficiency.

9. The test probe socket structure of claim 8, wherein the probe conductive material is formed with a plurality of receiving slots, cover plates and probes on the socket body, the number of receiving slots, cover plates and probes being increased as required.

10. The test probe socket structure of claim 8 wherein the probes are shaped like ㄣ.