JP3227167U - Electric probe and electric measuring device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a quickly removable electric probe and an electric measuring device. An electric probe includes a probe body, a probe head member, and a first elastic conductive fixture. The probe head member has a connecting end 112 and a measuring end 113 which are provided so as to face each other, and a test pin 111 is bored. The connection end is inserted into the through hole 101 from one end of the probe body, and the measurement end contacts the object to be measured. The first elastic conductive fixture has a hollow tubular structure and is internally provided in the probe body. The connection end is clamped and fixed in the hollow area of the first elastic conductive fixture. The amount of external supporting force formed by the first elastic conductive fixture with respect to the probe body is larger than the amount of clamping holding force formed by the first elastic conductive fixture with respect to the connection end. The electrical measuring device has a pedestal for mounting a plurality of electrical probes. The first elastic conductive fixing member enables quick removal and assembly of the probe head member with respect to the probe main body, which improves convenience of application and maintenance. [Selection diagram] Figure 1A

Description

The present invention relates to an electric measuring product, and more particularly to a quick and removable electric probe which is convenient for application and maintenance to the electric measuring device and an electric measuring device including the electric probe.

After assembling various electronic devices, in order to confirm that all products conform to the standard in terms of electrical transmission, relevant electrical tests are performed before factory shipment, and each is measured using an electrical measuring device.

A known electric measuring device makes contact with an object to be measured through a probe to form electric conduction, and a measuring machine is used to check whether electricity or signal transmission conforms to a standard. However, when the objects to be measured are different, measurement cannot be performed without using a probe corresponding to the electric measuring device, such as the type of electric contact or the demand for electric transmission. Therefore, it is necessary to replace the probe frequently in the measurement work. Currently, many measures are taken by replacing the probe each time. However, this kind of method causes considerable inconvenience in performing the measurement work, and requires a huge amount of work time for replacement. On the other hand, when the electric measuring device is used for a long time, the structure of the contact part is damaged. Even in this case, it is necessary to remove and replace each probe through a complicated procedure, and this portion also becomes inevitable in the measurement work.

Under such an inconvenient situation, the inventor has devised a quick removable electric probe and an electric measuring device including the electric probe, and provides a convenient and excellent solution.

An object of the present invention is to provide a quick removable electric probe and an electric measuring device having the electric probe. According to the present invention, there is an effect that it can be quickly removed and assembled, and it is possible to solve the inconvenient drawback that the replacement of the probe takes time and the cost becomes high in the known art.

To achieve the above object, in one embodiment of the present invention, an electric probe is provided that includes a probe body, a probe head member, and a first elastic conductive fixture. The probe body is formed in a hollow shape and has a through hole at one end. The probe head member is hollow and has test pins formed therein. The probe head member has a connection end installed so as to face each other and a measurement end, the connection end is provided for assembly with the probe main body through the through hole, and the measurement end surface is in contact with and conductive to the object to be measured. To provide. The first elastic conductive fixture is formed in a hollow tubular structure and is attached inside the probe body. When the connecting end of the probe head member is inserted into the probe body through the through hole, the probe head member is located in the hollow area of the first elastic conductive fixing tool and is clamped and fixed by the first elastic conductive fixing tool. The amount of external support force that the fixture forms with respect to the probe body is greater than the amount of clamping and holding force of the connection end of the first elastic conductive fixture. As a result, the probe head member is quickly detached from the probe body by the first elastic conductive fixture, and the assembly effect is achieved. As a result, the separate design of the measurement head member and the probe body is combined with the first elastic conductive fixture structure, which has the advantage of quick and convenient work even when the probe head member is assembled or disassembled, and is convenient for application. Significantly improved, providing a very convenient solution for assembling or disassembling the probe head member.

In one embodiment of the present invention, an electrical measuring device is provided. It includes a pedestal for making a plurality of mounting holes, and the above-described quick removable electric probe provided in each mounting hole. As a result, the electrical measuring device achieves the application advantages of simple and convenient replacement by means of a probe structure that is quickly removable. Especially when a large number of probes need to be replaced for different objects to be measured, the present invention can shorten the time required for the replacement work and simplify the working process.

According to the above-mentioned two embodiments, the quick removable electric probe forms a hollow tubular structure, is installed in the probe body, and after the probe head member and the probe body are assembled, the probe is extended from the connection end. The one end is clamped and fixed to the second elastic conductive fixture in the hollow area of the second elastic conductive fixture, and the external supporting force of the second elastic conductive fixture is clamped and fixed to the second elastic conductive fixture probe. Greater than This improves the stability after mounting the measuring head, and further improves the convenience of exchanging a good separation design due to the quickly removable electric probe.

Preferably, the second elastic conductive fixture has a first end, a second end, and a plurality of first spring pieces, and the first end and the second end are installed to face each other, and A spring piece is provided between the first end and the second end, and the adjacent first spring piece has a first opening. Further, the first elastic conductive fixture may be provided with a third end, a fourth end and a plurality of second spring pieces. The third end and the fourth end are installed opposite to each other, the second spring piece is provided between the third end and the fourth end, and the adjacent second spring piece has the second opening. .. This improves the electrical contact effect and the clamping stability.

In addition, in order to improve the effect of fixing the probe head member to the probe body and to facilitate the assembly, the probe head member has a first section and a second section at the connecting end, and the width of the first section is Is narrower than the width of the second section and forms a step at the connection end.

Preferably, the probe head member is provided with an annular groove in the peripheral portion of the through hole, the probe head member is provided with a positioning portion with respect to the annular groove, and after the probe head member and the probe body are assembled together, the positioning portion Fixed inside the annular groove. As a result, the positional limitation between the probe body and the probe head member and the assembly stability can be greatly improved.

1 is a three-dimensional exploded view of an electric probe according to a preferred embodiment of the present invention (No. 1). 3 is a three-dimensional exploded view of an electric probe according to a preferred embodiment of the present invention (No. 2). FIG. FIG. 3 is an assembled sectional view of an electric probe according to a preferred embodiment of the present invention. 1 is a locally exploded view of an electric measuring device according to a preferred embodiment of the present invention. 1 is an assembly view of an electric measuring device according to a preferred embodiment of the present invention.

Please refer to FIG. 1A, FIG. 1B and FIG. In the present invention, the disclosed quick removable electric probe 1 can be applied to electric measurement of an object to be measured such as a battery and a semiconductor member. The probe main body 10, the probe head member 11, and the 1st elastic conductive fixing tool 12 are included.

The probe body 10 is formed in a hollow shape and has a through hole 101 at one end thereof. The probe head member 11 is also formed in a hollow shape and has a test pin 111 formed therein. The probe head member 11 has a connection end 112 to be installed facing the probe head member 11 and a measurement end 113. Provides for mutual assembly with the probe body 10 through the through hole 101, and the surface of the measurement end 113 provides for contact and conduction with the object to be measured. Among them, the probe head member 11 side to be assembled with the probe main body 10 forms an electrical connection with a measuring machine (not shown), and the probe 11 is, for example, a dilator type probe. Preferably, both ends of the test pin 111 project from the connecting end 112 and the measuring end 113, respectively, as shown in the figure. The first elastic conductive fixture 12 forms a hollow tubular structure and is provided inside the probe body 10, and the connecting end 112 of the probe head member 11 is inserted into the probe body 10 through the through hole 101. In this case, it is located in the hollow area of the first elastic conductive fixing tool 12, is clamped and fixed to the first elastic conductive fixing tool 12, and the first elastic conductive fixing tool 12 has an external supporting force amount formed by the probe main body 10. It is larger than the holding and fixing force formed at the connection end 112 of the first elastic conductive fixing tool 12. As a result, the first elastic conductive fixture 12 can provide the effect that the probe head member 11 can be quickly removed and assembled to the probe body 10, and the replacement time of the probe head member 11 can be significantly shortened. This simplifies the replacement process and greatly improves the convenience when applying electrical measurement.

As described above, when the electric probe is used for a long time, or when measuring many different kinds of DUTs, the problem of probe replacement arises. Conventionally, all parts of the probe are removed one by one, and then replacement members are attached one by one. While a considerable amount of time is required for the replacement work, the space for the electric measuring device is originally insufficient, which makes it inconvenient for the maintenance personnel and difficult to work on. When assembling the quick removable electric probe 1 of the present invention, if the probe head member 11 is inserted into the through hole 101, the connection end 112 is clamped and fixed to the first elastic conductive fixture 12, and the assembly is completed. At the time of removal, the probe head member 11 can be removed from the probe body 10 by pulling out the probe head member 11 in the opposite direction, so that the replacement efficiency and convenience are greatly improved. Especially, when a large number of probe head members 11 are replaced, this advantage becomes more prominent.

After assembling the first elastic conductive fixing tool 12 to the probe body 10, the external supporting force formed on the probe main body 10 by the first elastic conductive fixing tool 12 is such that the first elastic conductive fixing tool 12 is connected to the probe head member 11. Since the amount of clamping force formed at the end 112 is larger than that, the probe head member 11 is not pulled out together with the first elastic conductive fixture 12 when the probe head member 11 is pulled out. Furthermore, according to this method, the first elastic conductive fixing tool 12 can be fixed directly inside the probe main body 10, and the fixing effect can be achieved without newly adding another member or a processing method. Preferably, the first elastic conductive fixture 12 is provided with a third end 121, a fourth end 122, and a plurality of second spring pieces 123. The 3rd end 121 and the 4th end 122 are installed so that it may oppose, the 2nd spring piece 123 may be provided between the 3rd end 121 and the 4th end 122, and it may adjoin to the 2nd spring piece 123. A second hole 1231 is provided. As a result, the stability of assembly of the first elastic conductive fixture 12 into the through hole 101 is improved, and at the same time, the contact end 112 of the probe head member 11 can be provided with better contact conductivity and sandwiching and fixing properties. Further, the first elastic conductive fixture 12 is formed, for example, in a tubular structure in which the middle portion is narrow, both widths are wide, and the central portion is reduced in diameter, so that the first elastic conductive fixture 12 has a better clamping fixing strength with respect to the connection end 112. Let

In order to improve the assembly stability and strength of the probe head member 11 and the probe body 10, the quick removable electric probe 1 of the present invention further includes a second elastic conductive fixing tool 13 formed in a hollow structure. In addition, the probe head member 110 and the probe body 10 are installed inside the probe body 10 and the test pin 111 is protruded from the connection end 112. One end of the test pin 111 projects from the connection end 112 in the hollow area of the second elastic conductive fixture 13. While being clamped and fixed to the second elastic conductive fixing tool 13, the amount of external supporting force of the second elastic conductive fixing tool 13 may be larger than the amount of clamping fixing force of the second elastic conductive fixing tool 13 to the test pin 111. As a result, after the probe head member 11 is assembled to the probe main body 10, it has better clamping and fixing strength and electrical conduction effect. Since the second elastic conductive fixture 13 also has a feature that the amount of external supporting force is larger than the amount of clamping and fixing force with respect to the test pin 111, it is not necessary to newly secure the fixing effect by another member or a processing method, and the probe head member 11 is also provided. When the probe is removed from the probe body 10, the second elastic conductive fixture 13 is stably held by the probe body 10 and is not pulled out together. Regarding the conductive design, when the second elastic conductive fixture 13 is internally provided in the probe body 10, it can be installed in a state in which the probe body 10 and the probe body 10 are not electrically connected to each other, for example, separated by an insulator.

One application of the quick-removable electrical probe 1 is to provide the voltage and current signal conducting portions and the required areas with insulators to avoid mutual contact of components in different conducting paths. As an example, the test pin 111 is, for example, as a voltage conduction path, at the time of mechanical design, the test pin 111 is projected to the end of the connection end 112, assembled to the probe main body 10, and then electrically connected to the measuring machine. The end where the test pin 111 projects from the measuring end 113 is used as a voltage input end, and the other end is used as a voltage output end for transmission to the measuring machine. The measuring end 113 of the probe head member 11 is, for example, a current input end, and is brought into contact with the quickly removable electric probe 1 and the object to be measured, and then a current is measured, the measuring end 113, the connecting end 112, the first elastic conductive fixture 12, The probe body 10 conducts the formed path to the measuring machine. Furthermore, the quick-removable electrical probe 1 corresponds to the second elastic conductive fixture 13 and can have a better front and rear section separation design. Specifically, a conductor 102 is provided on the side of the through-hole 101 facing the probe body 10, and the conductor 102 is electrically connected to the measuring machine, so that the quickly removable electric probe 1 and the object to be measured are brought into contact with each other. After that, the voltage is transmitted to the measuring instrument along this path by forming an electrical connection with the test pin 111 and the conductor 102. Preferably, as shown in FIG. 2, the second elastic conductive fixture 13 is positioned on the probe body 10 while being fixedly attached to one end of the conductor 102, and the test pin 111 is perforated and clamped and fixed. In this structural design, the conductor 102 at the other end of the probe body 10 is left in the probe body 10 when the probe head member 11 is pulled out, which improves the convenience of replacement.

Preferably, the second transparent substrate elastic conductive fixture 13 is provided with a third end 131, a second end 132, and a plurality of second spring pieces 133. The 1st end 131 and the 2nd end 132 are installed in opposition, the 1st spring piece 133 is provided between the 1st end 131 and the 2nd end 132, and between each adjacent 1st spring piece 133. First hole portion 1331 is provided in. As a result, the test pin 111 has a better binding force, the external support force for the probe body 10 is enhanced, and a good conduction effect can be provided by electrical contact.

The connecting end 112 of the probe head member 11 has a first section 1121 and a second section 1122, and since the width of the first section 1121 is narrower than the width of the second section 1122, a step is formed at the connecting end 112. To form. Alternatively, the cross-sectional area of the first section 1121 is smaller than the cross-sectional area of the second section 1122. As an example, when the connection end 112 has a cylindrical shape, the diameter of the first section 1121 is smaller than the diameter of the second section 1122. With this structure, the effect of fixing the position when assembling can be enhanced. Further, in this embodiment, after the probe head member 11 and the probe body 10 have been assembled, the second section 1122 is located in the hollow area of the first elastic conductive fixture 12.

In addition, the probe body 10 forms an annular groove 103 around the through hole 101, the probe head member 11 has a positioning portion 114 corresponding to the annular groove 103, and the probe head member 11 and the probe body 10 are After assembling, the positioning portion 114 is fixed to the annular groove 103. This can improve the positioning effect when the probe head member 11 is assembled. In other words, when the probe head member 11 is attached to the through hole 101, the effect of limiting the attachment depth is achieved by the annular groove 103 and the positioning portion 114, and the positioning portion 114 and the annular groove 103 are brought into contact with each other. After fixing, the operator can know that the probe head member 11 is securely attached to the probe body 10. Further, one end of the positioning portion 114 has a first inclined portion 1141 and a second inclined portion 1031 corresponding to the first inclined portion 1141 inside the annular groove 103 is provided to provide the probe head member 11 and the probe body 10. When and are assembled to each other, the first inclined portion 1141 and the second inclined portion 1031 are fixed so as to correspond to each other. Thereby, the positioning and the fixing effect can be enhanced.

On the surface of the object to be measured, the adhesion phenomenon of the oxide layer is usually generated. Therefore, at the time of measurement, it is necessary to ensure electrical connection between the quickly removable electric probe 1 and the object to be measured. Preferably, a plurality of protruding structures 1131 are provided on the surface of the measuring end 113, and each protruding structure 1131 is formed in a tapered shape and is connected to each other. As a result, when the measuring structure 113 is brought into contact with the object to be measured, the protruding structure 1131 is pierced by the oxide layer on the surface of the object to be measured or is slightly scraped off, thereby quickly removing the electric probe 1 and the object to be measured. The effect of conduction with the measured object can be greatly improved. Of course, the protruding structure 1131 may be provided in a wavy structure, for example.

Please refer to FIGS. 3 and 4 and also to FIGS. 1A to 2. In the present invention, there is provided an electric measuring device 2 including a pedestal 20 and a plurality of the above-mentioned quick removable electric probes. The pedestal 20 is provided with a plurality of mounting holes 201, and the mounting holes 201 are opened according to the contact distribution of the object to be measured, or the mounting holes 201 are densely arranged on the pedestal 20 and then the electrical contact state of the object to be measured. Based on the above, the mounting position of the electric probe 1 which can be quickly removed is selected. A quick removable electric probe 1 is provided in each mounting hole 201. The quickly removable electrical probe 1 includes a respective probe body 10, a probe head member 11, and a first elastic conductive fixture 12. The probe body 10 is formed in a hollow shape and has a through hole 101 at one end thereof. The probe head member 11 is also formed in a hollow shape, and the probe head member 11 has a connection end 112 and a measurement end 113 that are installed so as to face each other. Preferably, both ends of the test pin 111 project from the connecting end 112 and the measuring end 113, respectively. The connection end 112 is provided for mutual assembly with the probe main body 10 through the through hole 101, and the measurement end 113 is provided for contact and conduction with an object to be measured. Among them, the probe head member 11 side to be assembled with the probe main body 10 forms an electrical connection with the measuring machine. The electrical connection method is determined by different measurement requirements or DUTs, and the one shown is only one preferred electrical connection state. The first elastic conductive fixture 11 forms a hollow tubular structure and is installed inside the probe body 10. Among them, the connecting end 112 of the probe head member 11 is inserted into the probe body 10 through the through hole 101, positioned in the hollow area of the first elastic conductive fixing tool 12, and clamped and fixed to the first elastic conductive fixing tool 12. The amount of external supporting force that the first elastic conductive fixture 12 forms on the probe body 10 is larger than the amount of clamping force that the first elastic conductive fixture 12 forms on the connection end 112. As a result, the electric measuring device 2 including the electric probe 1 that can be quickly removed has extremely good exchange efficiency and convenience, and the first elastic conductive member is provided as a structural design for separating the probe head member 11 and the probe body 10 from each other. When combined with the fixing tool 12, a highly convenient effect that it can be quickly removed and assembled can be achieved.

In practical measurement, many probes are provided on one pedestal. Therefore, when it is necessary to replace the connector, the array of probes is in a dense state, and it is not only very inconvenient if the probes are removed and reassembled as in the known art, it is very inconvenient. It takes a lot of work. Since the quick detachable electric probe 1 provided in the electric measuring device 2 of the present invention has an advantage that the probe head member 11 can be quickly removed and assembled without relying on other tools, it takes time to replace the probe. It can be greatly shortened, the convenience of the work can be improved, and the drawbacks currently plagued by those skilled in the art can be surely improved.

When assembling, first, the probe main body 10 is bored in the mounting hole 201 of the pedestal 20, the probe head member 11 side to be combined with the probe main body 10 is electrically connected to the measuring machine, and then the type of the object to be measured. According to the above, the corresponding probe head member 11 is selected, the probe head member 11 is inserted into the probe main body 10 through the through hole 101, and is clamped and fixed to the first elastic conductive fixture 12, thereby completing the assembly work. At the time of measurement, the object to be measured may be attached to the position of the probe head member 11, the pedestal 20 may be oriented to the object to be measured, and the electric probe 1 and the object to be measured may be brought into contact with each other and brought into conduction. When replacing or removing the probe head member 11, the probe head member 11 and the probe body 10 can be separated by pulling out the probe head member 11 in the opposite direction, and subsequently, a new probe head member 11 or another type of probe head member. 11 may be inserted into the through hole 101. In this way, extremely good exchange efficiency and convenience can be achieved. On the other hand, after the first elastic conductive fixing tool 12 is assembled to the probe main body 10, the external supporting force formed by the first elastic conductive fixing tool 12 on the probe main body 10 is determined by the connection between the first elastic conductive fixing tool 12 and the probe head member 11. It is larger than the amount of clamping force formed at the end 112. Therefore, the base is not pulled out together with the probe head member 11. Further, the elasticity of the first elastic conductive fixing tool 12 itself can firmly support the through hole 101.

When measuring the object to be measured, the electric probe 1 which can be quickly removed is brought into contact with the object to be measured and pushed down slightly. Preferably, the pad 104 is provided outside the probe body 10, and the pad 104 is applied to the side surface of the object to be measured near the pedestal 20. Thereby, the effect of stress dispersion can be generated at the time of measurement, and the service life of the electrical measuring device 2 can be reliably extended.

Similarly, the quick removable electric probe 1 may form a hollow tubular structure and may further include a second elastic conductive fixture 13 provided in the probe body 10. After the probe head member 11 and the probe main body 10 are assembled together, one end of the test pin 111 protruding from the connecting end 112 is located in the hollow area of the second elastic conductive fixing tool 13, and is attached to the second elastic conductive fixing tool 13. While being sandwiched and fixed, the amount of external supporting force of the second elastic conductive fixing tool 13 is made larger than the amount of clamping fixing force that the second elastic conductive fixing tool 13 forms on the test pin 111. Further, the second transparent substrate elastic conductive fixture 13 is provided with a first end 131, a second end 132, and a plurality of first spring pieces 133. The 1st end 131 and the 2nd end 132 are installed so that it may oppose, the 1st spring piece 133 may be provided between the 1st end 131 and the 2nd end 132, and each adjacent 1st spring piece 133 may be provided. A first hole portion 1331 is provided between them. As a result, the test pin 111 has a good binding force, the external support force for the probe body 10 is enhanced, and a good conduction effect can be provided by electrical contact. For other related detailed technical details, refer to the description of the electric probe 1 described above.

Further, the connection end 112 of the probe head member 11 is provided with, for example, a first section 1121 and a second section 1122, the width of the first section 1121 is made smaller than the width of the second section 1122, and the connection end 112 has a step structure. To enhance the positioning effect during assembly. Furthermore, after the probe head member 11 and the probe body 10 are assembled, the second section 1122 can be located in the hollow area of the first elastic conductive fixture 12.

In addition, an annular groove 103 is formed around the through hole 101 of the probe main body 10, and a positioning portion 114 corresponding to the annular groove 103 is provided in the probe head member 11 so that the probe head member 11 and the probe main body 10 are connected to each other. After assembling, the positioning portion 114 is fixed to the annular groove 103, whereby the positioning effect of the assembly to the probe head member 11 can be realized. Further, one end of the positioning portion 114 has a first inclined portion 1141 and a second inclined portion 1031 corresponding to the first inclined portion 1141 that is provided inside the annular groove 103 is provided to provide the probe head member 11 and the probe body 10. After mutually assembling, the first inclined portion 1141 and the second inclined portion 1031 are fixed corresponding to each other. This can enhance the positioning and fixing effect.

A plurality of protruding structures 1131 are provided on the surface of the measurement end 113 in order to realize reliable electrical conduction between the electric probe 1 that can be quickly removed during measurement and the object to be measured. The protruding structures 1131 are formed in a tapered shape and are connected to each other. As a result, the protruding structure 1131 penetrates the oxide layer on the surface of the object to be measured or slightly scrapes it when the measuring end 113 is brought into contact with the object to be measured, so that the effect of conduction between the electric probe 1 and the object to be measured can be quickly removed. Can be greatly improved. Of course, the protruding structure 1131 may be provided in a wavy structure, for example. The detailed technical features and achievements of the quick removable probe 1 described above can be referred to the above description and FIGS. 1A to 2, and the description thereof will be omitted.

To summarize the above description, according to the present invention, the structure of the probe head member that comes into contact with the object to be measured is modularized, and then the probe head member is used as a member for conducting and fixing by the first elastic conductive fixture. Quickly remove at the connecting end of the probe for quick assembly effect. Therefore, even when it is necessary to replace the probe head member structure according to different objects to be measured, or when it is necessary to replace the damaged portion due to long-term use, the technology disclosed in the present invention can be used. A good exchange efficiency can be achieved. The quick detachable electric probe of the present invention can be further combined with the second elastic conductive fixing tool to enhance the assembly stability of the probe head part and the probe body, and to realize a better structural separation design for the probe, and to replace it. It is possible to improve convenience.

DESCRIPTION OF SYMBOLS 1 Electric probe 10 Probe body 101 Through hole 102 Conductor 103 Annular groove 1031 Second inclined portion 104 Pad 11 Probe head member 111 Test pin 112 Connection end 1121 First section 1122 Second section 113 Measuring end 1131 Projection structure 114 Positioning portion 1141 1 inclined part 12 1st elastic conductive fixing tool 121 3rd end 122 4th end 123 2nd spring plate 1231 2nd hole 13 2nd elastic conductive fixing tool 131 1st end 132 2nd end 133 1st spring plate 1331 1st 1 hole 2 electric measuring device 20 pedestal 201 mounting hole

Claims (10)

Including a probe body, a probe head member, and a first elastic conductive fixture,
The probe body is formed in a hollow shape, having a through hole at one end thereof,
The probe head member is formed in a hollow shape and is provided with a test pin, and the probe head member has a connection end that is mutually assembled to the probe body through the through hole, and a contact with an object to be measured. It is provided so as to face the measurement end provided for conduction,
The first elastic conductive fixture is a hollow tubular structure, and is internally provided in the probe body,
The connection end of the probe head member is inserted into the probe body through the through hole, the connection end is located in a hollow area of the first elastic conductive fixing tool, and is clamped and fixed to the first elastic conductive fixing tool. The amount of external supporting force formed by the first elastic conductive fixture with respect to the probe body is larger than the amount of clamping fixing force formed by the first elastic conductive fixture at the connection end, whereby the probe head member is An electric probe, wherein the first elastic conductive fixture achieves the effect of being able to quickly remove and assemble the probe body. A hollow tubular structure, further including a second elastic conductive fixture internally provided in the probe body,
After assembling the probe head member and the probe body, one end of the probe protruding from the connection end is located in the hollow area of the second elastic conductive fixing tool and is clamped and fixed to the second elastic conductive fixing tool. The electric probe according to claim 1, wherein the amount of external supporting force of the second elastic conductive fixing device is larger than the amount of clamping holding force of the second elastic conductive fixing device with respect to the probe. The second elastic conductive fixture has a first end, a second end, and a plurality of first spring pieces,
The first end and the second end are installed so as to face each other, and the first spring piece is provided between the first end and the second end. Having a first opening between each,
The first elastic conductive fixture has a third end, a fourth end, and a plurality of second spring pieces,
The second spring piece is installed so that the third end and the fourth end face each other, and the second spring piece is provided between the third end and the fourth end, and is adjacent to the second spring piece. The electric probe according to claim 2, wherein the electric probe has a second opening between each of the two. The probe head member has a first section and a second section at the connection end, the width of the first section is narrower than the width of the second section, and a step is formed at the connection end. The electric probe according to any one of claims 1 to 3, The probe body has an annular groove formed in the peripheral portion of the through hole,
The probe head member is provided with a positioning portion corresponding to the annular groove,
The electric probe according to claim 4, wherein the positioning portion is fixed to the annular groove after the probe body is assembled with the probe head member. An electric measuring device including a pedestal having a plurality of mounting holes, and a plurality of electric probes,
Providing each of the plurality of electric probes in the mounting hole,
Each of the electric probes includes a probe body, a probe head member, and a first elastic conductive fixture.
The probe body is formed in a hollow shape, having a through hole at one end thereof,
The probe head member is formed in a hollow shape and is provided with a test pin, and the probe head member has a connection end that is mutually assembled to the probe body through the through hole, and a contact with an object to be measured. It is provided so as to face the measurement end provided for conduction,
The first elastic conductive fixture is a hollow tubular structure, and is internally provided in the probe body,
The connection end of the probe head member is inserted into the probe body through the through hole, the connection end is located in a hollow area of the first elastic conductive fixing tool, and is clamped and fixed to the first elastic conductive fixing tool. The amount of external supporting force formed by the first elastic conductive fixture with respect to the probe body is larger than the amount of clamping fixing force formed by the first elastic conductive fixture at the connection end, whereby the probe head member is An electrical measuring device, which achieves the effect of being able to quickly remove and assemble the probe body. The electric probe has a hollow tubular structure, and further includes a second elastic conductive fixture internally provided in the probe body,
After assembling the probe head member and the probe body, one end of the probe protruding from the connection end is located in the hollow area of the second elastic conductive fixing tool and is clamped and fixed to the second elastic conductive fixing tool. The electric measuring device according to claim 6, wherein the amount of external supporting force of the second elastic conductive fixture is greater than the amount of clamping force of the second elastic conductive fixture with respect to the probe. The second elastic conductive fixture has a first end, a second end, and a plurality of first spring pieces,
The first end and the second end are installed so as to face each other, and the first spring piece is provided between the first end and the second end. Having a first opening between each,
The first elastic conductive fixture has a third end, a fourth end, and a plurality of second spring pieces,
The second spring piece is installed so that the third end and the fourth end face each other, and the second spring piece is provided between the third end and the fourth end, and is adjacent to the second spring piece. The electrical measurement device according to claim 7, wherein the electrical measurement device has a second opening between each of the two. The probe head member has a first section and a second section at the connection end, the width of the first section is narrower than the width of the second section, and a step is formed at the connection end. The electric measuring device according to claim 6, wherein The probe body has an annular groove formed in the peripheral portion of the through hole,
The probe head member is provided with a positioning portion corresponding to the annular groove,
The electrical measuring device according to claim 9, wherein the positioning portion is fixed to the annular groove after the probe body is assembled with the probe head member.

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