CN113406101A - 透射光学系统的检查装置 - Google Patents

透射光学系统的检查装置 Download PDF

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Publication number
CN113406101A
CN113406101A CN202110276981.2A CN202110276981A CN113406101A CN 113406101 A CN113406101 A CN 113406101A CN 202110276981 A CN202110276981 A CN 202110276981A CN 113406101 A CN113406101 A CN 113406101A
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CN
China
Prior art keywords
light
optical system
subject
light source
inspection apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202110276981.2A
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English (en)
Chinese (zh)
Inventor
金种佑
吴世珍
李太圭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dongwoo Fine Chem Co Ltd
Original Assignee
Dongwoo Fine Chem Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dongwoo Fine Chem Co Ltd filed Critical Dongwoo Fine Chem Co Ltd
Publication of CN113406101A publication Critical patent/CN113406101A/zh
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • G01N2021/8809Adjustment for highlighting flaws
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511Optical elements other than lenses, e.g. mirrors

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  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Communication System (AREA)
CN202110276981.2A 2020-03-17 2021-03-15 透射光学系统的检查装置 Pending CN113406101A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2020-0032677 2020-03-17
KR1020200032677A KR102306234B1 (ko) 2020-03-17 2020-03-17 투과 광학계 검사 장치

Publications (1)

Publication Number Publication Date
CN113406101A true CN113406101A (zh) 2021-09-17

Family

ID=77677595

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202110276981.2A Pending CN113406101A (zh) 2020-03-17 2021-03-15 透射光学系统的检查装置

Country Status (4)

Country Link
JP (1) JP7126011B2 (ja)
KR (1) KR102306234B1 (ja)
CN (1) CN113406101A (ja)
TW (1) TWI819285B (ja)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007333563A (ja) * 2006-06-15 2007-12-27 Toray Ind Inc 光透過性シートの検査装置および検査方法
CN104237246A (zh) * 2013-06-21 2014-12-24 东友精细化工有限公司 光学薄膜的缺陷辨别方法
KR20170129077A (ko) * 2017-11-06 2017-11-24 동우 화인켐 주식회사 투과 광학계 검사 장치 및 이를 이용한 결함 검사 방법
JP2018009810A (ja) * 2016-07-11 2018-01-18 住友化学株式会社 欠陥検査システム及びフィルム製造装置
CN107796829A (zh) * 2016-08-31 2018-03-13 株式会社理光 检查装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000137001A (ja) 1998-11-02 2000-05-16 Toyobo Co Ltd フィルム光学欠点検査装置
DE102012110793B4 (de) 2012-11-09 2020-09-03 R.A.M. Realtime Application Measurement Gmbh Vorrichtung und Verfahren zur Abbildung eines bahnförmigen Materials
KR20160047360A (ko) 2014-10-22 2016-05-02 동우 화인켐 주식회사 결함 검출 시스템 및 방법
KR20170010675A (ko) 2015-07-20 2017-02-01 주식회사 엘지화학 광학필름 검사장치 및 광학필름 검사방법
TWI696820B (zh) * 2018-02-22 2020-06-21 致茂電子股份有限公司 檢測裝置
KR102162693B1 (ko) * 2018-12-14 2020-10-07 동우 화인켐 주식회사 결함 검출 시스템 및 방법

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007333563A (ja) * 2006-06-15 2007-12-27 Toray Ind Inc 光透過性シートの検査装置および検査方法
CN104237246A (zh) * 2013-06-21 2014-12-24 东友精细化工有限公司 光学薄膜的缺陷辨别方法
JP2018009810A (ja) * 2016-07-11 2018-01-18 住友化学株式会社 欠陥検査システム及びフィルム製造装置
CN107796829A (zh) * 2016-08-31 2018-03-13 株式会社理光 检查装置
KR20170129077A (ko) * 2017-11-06 2017-11-24 동우 화인켐 주식회사 투과 광학계 검사 장치 및 이를 이용한 결함 검사 방법

Also Published As

Publication number Publication date
JP2021148794A (ja) 2021-09-27
JP7126011B2 (ja) 2022-08-25
TW202138753A (zh) 2021-10-16
TWI819285B (zh) 2023-10-21
KR102306234B1 (ko) 2021-09-28
KR20210116041A (ko) 2021-09-27

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