CN113252999A - Antenna plane near-field test method - Google Patents
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Abstract
The antenna plane near-field test method disclosed by the invention has the advantages of high speed, all-weather working and no need of phase measurement. The invention is realized by the following technical scheme: the method comprises the steps of arranging M columns of dual-polarized probes and N rows of dual-polarized probes respectively along an x axis and a y axis according to dx and dy intervals, sending signals from a signal source, carrying out full-electronic sampling test on a tested antenna by the dual-polarized probes arranged in a plane, sending the sampling signals to a phase shifter respectively, sending the signals received by each dual-polarized probe into the phase shifter according to the frequency shift characteristic of Fourier transform by the phase shifter for phase shift, sending the signals passing through the phase shifter into an H-polarization synthesizer and a V-polarization synthesizer, synthesizing the H-polarization signals and the V-polarization signals respectively, sending the synthesized H-polarization signals and the V-polarization signals into a receiver, eliminating the probe effect after the receiver receives the two polarized signals, obtaining a far-field directional diagram of the tested antenna, and realizing the test of a near-field area of the antenna radiation and the simulation of the far-field characteristic of the antenna.
Description
Technical Field
The invention belongs to the technical field of information. Relates to an antenna plane near field test method mainly used for antenna measurement, communication signal measurement and other directions.
Background
The testing and verification of antenna parameters is an indispensable process in the antenna design process. The main content of the antenna test comprises measuring the electrical parameters and radiation parameters of the antenna so as to evaluate the performance of the antenna. The antenna test method comprises a far field test, a compact field test and a plane near field test. The measurement of the antenna goes through a process from far-field measurement to near-field measurement. The far field measurement is to measure the electromagnetic field of the antenna directly in the far field region of the antenna, so the electromagnetic environment in the measurement field and the surrounding range has a large influence on the measurement accuracy, and for some antennas, the measurement distance is requiredThe separation is much greater than 2D2And/lambda, wherein D is the caliber size of the antenna to be measured, and lambda is the working wavelength, and the requirements on the reflection level of a measurement field, multipath and the suppression of electromagnetic environment interference are high, and the requirements are often difficult to meet under the far-field condition. Compact fields are therefore usually used to generate plane waves to simulate a field of wireless length, on the other hand near field testing is used instead of far field testing. Near-field testing has advantages over far-field testing, but also has the disadvantage of being unavoidable — the cost of hardware facilities is much higher than far-field testing. At present, the price of a near-field plane test system of about one hundred square meters is in the order of ten million. Nevertheless, this is still a necessary investment in developing high performance antennas. A new generation of antenna measurement technology is represented by near-field measurement and compact field measurement. The near-field measurement technology utilizes a probe to perform scanning motion on an antenna aperture surface, measures the amplitude and phase on the aperture surface, and then converts near-field data into a far field. Because the near field measurement only needs to measure the field on the antenna aperture surface, the defects of the far field measurement can be avoided, and the method is an independent one-door measurement technology. The near-field measurement comprises a plane near field, a spherical near field, a cylindrical near field and a compact field. Planar near field, each applied to a different practical situation. The antenna near field measuring system is an automatic measuring system which is controlled by a central computer to carry out antenna near field scanning, data acquisition, test data processing and test result display and output. The planar near-field test system comprises a mechanical subsystem and a radio frequency subsystem. The mechanical subsystem mainly comprises a scanning frame, a scanning frame controller, a probe polarization rotating device and various types of waveguide probes. The radio frequency subsystem has two parts of transmitting and receiving. The field in antenna space is usually divided into an inductive field and a radiating field region. The radiation field area is divided into a Fresnel near-field radiation area and a Fraunhofer far-field radiation area. In practice, the boundaries between regions are not abrupt. In the induced field, each object in the area is actually part of the antenna and affects the field around it (as is the case for directional antennas for each object in the area where the field strength is greatest). However, every object in the radiation field region should not affect the field around the antenna. In the induction field region, the field distribution and radiationThe source relationship is larger and even the final radiation pattern shape cannot be identified. In the near field region, the shape of the radiation pattern begins to differentiate. In addition, after radiating the far field zone boundary, the radiation pattern is almost constant with distance and very similar to the radiation pattern at infinite distance. The ideal planar near field scan range is infinite, however, in practical near field testing, the size of the scan plane is limited. The probe with known characteristics is used for antenna plane near-field test, the probe is scanned on a certain plane with a plurality of wavelengths (3-10 lambda) away from an antenna to be tested, the amplitude and phase distribution of the antenna at discrete points of the plane are measured, and the radiation characteristics of a far-field region of the antenna to be tested are determined through strict mathematical transformation so as to determine an antenna far-field directional diagram. The plane near field measurement system realizes the sampling of the antenna radiation near field by moving the probe, the far field directional diagram is calculated by the near field data through data processing, the mechanical movement of the probe is needed in the test process, the sampling of the antenna radiation near field is realized by the spherical near field measurement system by moving the probe, the far field directional diagram is calculated by the near field data through data processing, the mechanical movement of the probe is needed in the test process, and the realization forms of the probe sampling surface are various. In a typical single-probe spherical near-field testing system, measurement point sampling is realized through two-dimensional movement of azimuth and roll, polarization is realized through a polarization rotating shaft for switching between 0 degree and 90 degrees, three axes are provided, and the switching of the positions of sampling points in the whole testing process is completed through mechanical movement. In order to accelerate the testing speed, the multi-probe spherical near-field testing system reduces one-dimensional motion compared with a single-probe spherical near-field testing system, but still has mechanical motion in the direction. The spherical near-field test system based on the mechanical arm has the advantages that pitching and rolling are realized by the aid of the universal mechanical arm, development of special equipment is reduced, and the test efficiency is lower than that of a typical single-probe test system. The compact field measuring antenna mainly draws the far field to the far field requirement: d is more than or equal to 2D2And/lambda, which usually adopts a parabolic metal reflecting plate to reflect spherical waves sent by a feed source through a reflecting surface to form plane waves, and a good quiet zone is formed at a certain distance. Compact fields are one type of near-field measurement, the main advantage being that they can be measured in small microwave obscurationsVarious antenna measurements and studies are performed indoors using conventional far field test equipment and methods. Compact fields, like conventional far fields, require a test turret and therefore test time is the same as far field testing methods. The test system of the quasi-plane wave simulator is a new test technology of the quasi-plane wave simulator, a compact field reflector system is simulated through an antenna array, plane wave distribution of an electric field is formed in a test quiet zone, and an antenna can be placed in the zone for testing. The quasi-plane wave simulator can meet far-field conditions at a short distance, and has the advantages of small structure size, low cost, flexible installation and use and many application scenes. From the viewpoint of test efficiency, the quasi-plane wave simulator still needs to be rotated by the turntable to acquire an antenna pattern, so that the test efficiency is substantially consistent with that of a conventional far field. From the foregoing various antenna testing methods, it is common that a mechanical device is used for sampling, which limits the testing speed and also consumes time for mounting the antenna. The current plane near-field measurement technology mainly adopts near-field sampling according to a sampling theorem, carries out Fourier transformation on sampling data, and then obtains a far-field directional diagram of a measured antenna in an interpolation mode. The method has the disadvantages that in order to obtain the far-field directional diagram of the antenna to be measured, Fourier transformation is required to be carried out after sampling data is finished, and the transformed data is processed to obtain a final result, so that real-time test cannot be carried out, and real-time communication signal link simulation cannot be carried out.
Disclosure of Invention
The invention provides an antenna plane near-field testing method which has high speed, can work in all weather and does not need phase measurement, aiming at the problems that the amplitude and the phase of a signal need to be tested and sampling is realized through mechanical displacement in the plane near-field testing in the prior art.
The above object of the present invention can be achieved by the following technical solutions, and a method for testing a plane near field of an antenna is characterized in that: in an antenna plane near field, with dx and dy as intervals, performing M-row and N-column row dual-polarized probe arrangement along an x axis and a y axis respectively, sending a signal by a signal source, performing full-electronic sampling test on the antenna to be tested by the dual-polarized probes arranged in the plane, sending the sampling signals to a phase shifter respectively, and sending the signal received by each dual-polarized probe to the phase shifter for phase shifting according to the frequency shift characteristic of Fourier transform by the phase shifter according to a pointing angle; and sending the signals passing through the phase shifter to an H polarization synthesizer and a V polarization synthesizer to synthesize H polarization signals and V polarization signals respectively, sending the synthesized H polarization signals and V polarization signals to a receiver, eliminating the probe effect after the receiver receives the two polarized signals, obtaining a far field directional diagram of the antenna to be tested, and realizing the test in the antenna radiation near field area and the simulation of the far field characteristic of the antenna.
Compared with the prior art, the invention has the following beneficial effects:
the invention takes dx and dy as intervals, carries out M rows of probes and N rows of probes along an x axis and a y axis respectively, adopts plane-arranged dual-polarized multi-probe full-electronic sampling to test the antenna to be tested, realizes full-electronic sampling, realizes far-field simulation through a radiation near-field area, can construct a far-field system joint test wireless environment, realizes signal interpolation by utilizing the frequency shift characteristic of Fourier transform, directly obtains a far-field directional diagram level value of the corresponding angle of the antenna in the radiation near-field area, and can realize two main functions: measuring the far field direction of the antenna; and performing far-field system joint test in the antenna radiation near-field area. The phase of a test signal is not needed, the test process is fully electronic, no mechanical device participates, the installation process is simplified, and the test speed is greatly improved.
The invention samples signals through a dual-polarization probe array, then respectively sends the signals to a phase shifter, shifts the phase of the signals received by each probe according to the frequency shift characteristic of Fourier transform to obtain the phase-shifted signals of the probes with different pointing angles, realizes signal interpolation, then the signals enter a synthesizer to synthesize the sampled signals to obtain the far-field directional diagram of the antenna to be tested, and tests the near field of the antenna radiation and simulates the far-field characteristic of the antenna. Because interpolation of Fourier transform is not carried out any more, testing and simulation of antenna far-field characteristics can be realized in an antenna radiation near field, flow test of an antenna and simulation of antenna far-field characteristics in a near field area can be realized by using the method, and antenna testing efficiency is obviously improved.
Drawings
FIG. 1 is a schematic diagram of the positions of a dual-polarized probe and an antenna to be measured for antenna plane near-field measurement according to the present invention;
FIG. 2 is a schematic view of a dual polarized probe arrangement of the present invention;
FIG. 3 is a schematic diagram of a receive antenna pattern test principle;
fig. 4 is a schematic diagram of a transmit antenna pattern test principle.
Detailed Description
Refer to fig. 1 and 2. According to the method, in an antenna plane near field, with dx and dy as intervals, M-row and N-column row dual-polarized probes are arranged along an x axis and a y axis respectively, a signal source sends out a signal, the dual-polarized probes arranged in the plane fully electronically sample and test an antenna to be tested, the sampled signals are sent to a phase shifter respectively, and the phase shifter sends a signal received by each dual-polarized probe into the phase shifter according to a frequency shift characteristic of Fourier transform according to a pointing angle to shift the phase; and sending the signals passing through the phase shifter to an H polarization synthesizer and a V polarization synthesizer to synthesize H polarization signals and V polarization signals respectively, sending the synthesized H polarization signals and V polarization signals to a receiver, eliminating the probe effect after the receiver receives the two polarized signals, obtaining a far field directional diagram of the antenna to be tested, and realizing the test in the antenna radiation near field area and the simulation of the far field characteristic of the antenna.
The probes are arranged in M columns of N rows of dual polarized probes at dx and dy intervals along the x-axis and y-axis respectively, or the data of the same scan are collected at specific x, y points on the grid.
The measured antenna establishes a coordinate system by using a plane near-field rectangular coordinate xyz, and the distance between the measured antenna and the dual-polarization probe is r0Establishing a rectangular coordinate system x ' y ' Z ' of the dual-polarized probe, arranging M rows and N rows of dual-polarized probes along the x axis and the y axis of a planar near-field rectangular coordinate system xyz respectively by taking dx and dy as intervals, and measuring the distance Z between the antenna to be measured and the array of the dual-polarized probes0A grid is formed on the plane of the dual-polarized probe, and signals transmitted by the antenna to be measured are collected at specific x and y coordinate points on the grid by the dual-polarized probe.
The dual-polarized probe is smaller than the wavelength lambda corresponding to the highest frequency at adjacent sampling intervalsAnd half, setting the propagation coefficient interval between the x direction and the y direction of the plane near-field rectangular coordinate system as follows:
measuring the measured antenna in two mutually orthogonal directions of x and y, and Z ═ Z0The signal transmitted by the antenna to be measured is sampled on a plane, and the propagation vector of the antenna to be measured is
Wherein Z is0A coordinate value representing the probe in the Z-axis,
is a unit propagation vector, kx、ky、kzRepresenting the components of the propagation vector in the x, y, z directions,
unit vectors representing directions x, y, z, λ is the wavelength of the signal used in the test, θ is the pitch angle,
is the azimuth angle.
The dual-polarized probe carries out near-field sampling according to the sampling theorem, and each sample data passes through each probe according to the Fourier frequency conversion shift characteristicSampling signal P of probeB(m, n) is phase-shifted, and the resultant signal is I (k)x0,ky0) According to the starting value m of the probe along the x direction of the plane near-field rectangular coordinateStartAnd an end value mStop＝mstart+ M-1, initial value n of probe n in y direction of planar near field rectangular coordinateStartEnd value: n isStop＝nStart+ N-1, obtaining a composite signal of the dual-polarization probe:
wherein s represents a natural number, s is 1,2,3 …, PB(m, n) is the signal level received by the (m, n) th probe, kx0K representing the antenna under testxValue of (a), ky0K representing the antenna under testyE is the base of the natural logarithm, j represents the unit of an imaginary number, z0The coordinate values of the plane of the dual-polarized probe on the z axis are represented, M represents the number of the dual-polarized probe along the x direction, N represents the number of the dual-polarized probe along the y direction, M represents the number of columns of the dual-polarized probe along the x direction, and N represents the number of rows of the dual-polarized probe along the y direction.
See fig. 2. In the antenna plane near-field test, the dual-polarized probe uses x ' y ' z ' as a rectangular coordinate system, the row number of the dual-polarized probe in the y direction is N, the column number of the dual-polarized probe in the x direction is M, the probe interval in the y direction is dy, and the probe interval in the x direction is dx to carry out row-column arrangement.
See fig. 3. In the directional diagram test of the receiving antenna, the azimuth angle is determined according to the pitch angle theta
Angle, calculating the measured valueCoordinate of antenna pointing value (k)x0,ky0) Angle of pitch theta component Eθ(kx0,ky0) And the azimuthal angle phi component
Obtaining the pointing angle (k)x0,ky0) Antenna pattern level values of: c. C1Is a proportionality constant.
According to the V polarization directional diagram of the dual-polarized probe at (-k)x0,ky0) Directional diagram theta component value under directional angle
H polarization pattern is (-k)x0,ky0) Directional diagram theta component value under directional angle
Pattern at-k for V polarizationx0,ky0) Directional diagram under directional angle
Value of component
The direction diagram of the probe in H polarization is (-k)x0,ky0) Directional diagram under directional angle
Value of component
Calculating the day to be measuredFinger correction value delta (k)x0,ky0)。
Wherein: k is a radical ofx0K representing the antenna under testxPointing value, ky0K representing the antenna under testyA pointing value.
See fig. 4. In the directional diagram test of the transmitting antenna, a signal sent by a signal source passes through a tested antenna, reaches a dual-polarization probe, and then is sent to a phase shifter according to the principle that the phase shifter
The phase-shifted signal is sent to a receiver through an H-polarization synthesizer and a V-polarization synthesizer to obtain a pointing angle (k) in the receiverx0,ky0) The antenna pattern level values of the lower, m denotes the probe number in the x-direction and n denotes the probe number in the y-direction.
The foregoing shows and describes the general principles and broad features of the present invention and advantages thereof. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are described in the specification and illustrated only to illustrate the principle of the present invention, but that various changes and modifications may be made therein without departing from the spirit and scope of the present invention, which fall within the scope of the invention as claimed. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (10)
1. A near field test method for an antenna plane is characterized by comprising the following steps: in an antenna plane near field, with dx and dy as intervals, performing M-row and N-column row dual-polarized probe arrangement along an x axis and a y axis respectively, sending a signal by a signal source, performing full-electronic sampling test on the antenna to be tested by the dual-polarized probes arranged in the plane, sending the sampling signals to a phase shifter respectively, and sending the signal received by each dual-polarized probe to the phase shifter for phase shifting according to the frequency shift characteristic of Fourier transform by the phase shifter according to a pointing angle; and sending the signals passing through the phase shifter to an H polarization synthesizer and a V polarization synthesizer to synthesize H polarization signals and V polarization signals respectively, sending the synthesized H polarization signals and V polarization signals to a receiver, eliminating the probe effect after the receiver receives the two polarized signals, obtaining a far field directional diagram of the antenna to be tested, and realizing the test in the antenna radiation near field area and the simulation of the far field characteristic of the antenna.
2. The antenna planar near field test method of claim 1, wherein: the measured antenna establishes a coordinate system by using a plane near-field rectangular coordinate xyz, and the distance between the measured antenna and the dual-polarization probe is r0Establishing a rectangular coordinate system x ' y ' Z ' of the dual-polarized probe, arranging M rows and N rows of dual-polarized probes along the x axis and the y axis of a planar near-field rectangular coordinate system xyz respectively by taking dx and dy as intervals, and measuring the distance Z between the antenna to be measured and the array of the dual-polarized probes0A grid is formed on the plane of the dual-polarized probe, and signals transmitted by the antenna to be measured are collected at specific x and y coordinate points on the grid by the dual-polarized probe.
3. The antenna planar near field test method of claim 2, characterized by: the dual-polarized probe is characterized in that the adjacent sampling interval is smaller than half of the wavelength lambda corresponding to the highest frequency, and the propagation coefficient interval in the x and y directions of a plane near-field rectangular coordinate system is as follows:
measuring the measured antenna in two mutually orthogonal directions of x and y, and Z ═ Z0The signal transmitted by the antenna to be measured is sampled on a plane, and the propagation vector of the antenna to be measured is
kz＝k·cosθ
Wherein Z is0A coordinate value representing the probe in the Z-axis,
is a unit propagation vector, kx、ky、kzRepresenting the components of the propagation vector in the x, y, z directions,
unit vectors representing directions x, y, z, λ is the wavelength of the signal used in the test, θ is the pitch angle,
is the azimuth angle.
4. The antenna planar near field test method of claim 3, wherein: the dual-polarized probe carries out near-field sampling according to the sampling theorem, and the sampling data is utilized to carry out the sampling of the sampling signal P passing through each probe according to the Fourier transform frequency shift characteristicB(m, n) is phase-shifted, and the resultant signal is I (k)x0,ky0)。
5. The antenna planar near field test method of claim 4, wherein: the dual-polarized probe head starts from the value m of the probe head along the x direction of the plane near-field rectangular coordinateStartAnd an end value mstop＝mstart+ M-1, initial value n of probe n in y direction of planar near field rectangular coordinateStartEnd value: n isStop＝nStart+ N-1, obtaining a composite signal of the dual-polarization probe:
wherein s is a natural number, 1,2,3 …, and PB(m, n) is the signal level received by the (m, n) th probe, kx0K representing the antenna under testxValue of (a), ky0K representing the antenna under testyE is the base of the natural logarithm, j represents the unit of an imaginary number, z0The coordinate values of the plane of the dual-polarized probe on the z axis are represented, M represents the number of the dual-polarized probe along the x direction, N represents the number of the dual-polarized probe along the y direction, M represents the number of columns of the dual-polarized probe along the x direction, and N represents the number of rows of the dual-polarized probe along the y direction.
6. The antenna planar near field test method of claim 1, wherein: in the antenna plane near-field test, the dual-polarized probe uses x ' y ' z ' as a rectangular coordinate system, the row number of the dual-polarized probe in the y direction is N, the column number of the dual-polarized probe in the x direction is M, the probe interval in the y direction is dy, and the probe interval in the x direction is dx to carry out row-column arrangement.
7. The antenna planar near field test method of claim 1, wherein: the signal from the signal source passes through the synthetic signal I (k) of the V-polarization synthesizerx0,ky0) Obtaining a vertical polarization component Iv(kx0,ky0) The composite signal I (k) through the H polarization synthesizerx0,ky0) Obtaining a horizontal polarization component IH(kx0,ky0)。
8. The antenna planar near field test method of claim 7, wherein: according to the V polarization directional diagram of the dual-polarized probe at (-k)x0,ky0) Directional diagram pitch angle theta component value under directional angle
H polarization pattern is (-k)x0,ky0) Directional diagram pitch angle theta component value under directional angle
Pattern at-k for V polarizationx0,ky0) Azimuth angle of directional diagram under directional angle
Value of component
The direction diagram of the probe in H polarization is (-k)x0,ky0) Azimuth angle of directional diagram under directional angle
Value of component
Calculating the correction value delta (k) of the antenna finger to be measuredx0,ky0) And is and
wherein: k is a radical ofx0K representing the antenna under testxPointing value, ky0K representing the antenna under testyA pointing value.
9. The antenna planar near field test method of claim 1 or 5, characterized by: in the test of a receiving antenna directional diagram, a receiver is tested according to a pitch angle theta angle and an azimuth angle
Angle, calculating the coordinate (k) of the pointing value of the antenna to be measuredx0,ky0) Angle of pitch thetaQuantity Eθ(kx0,ky0) And the azimuthal angle phi component
And is
Obtaining the pointing angle (k)x0,ky0) Antenna pattern level values of: c. C1Is a proportionality constant.
10. The antenna planar near field test method of claim 6, wherein: in the directional diagram test of the transmitting antenna, a signal sent by a signal source passes through a tested antenna and then reaches a dual-polarization probe and then is sent into a phase shifter according to the principle that the phase shifter
Phase shifting, and obtaining the pointing angle (k) at the receiver via the H-polarization combiner and the V-combinerx0,ky0) Antenna pattern level values where m denotes the number of probes in the x-direction and n denotes the number of probes in the y-direction.
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Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103424066A (en) * | 2013-08-26 | 2013-12-04 | 中国科学院空间科学与应用研究中心 | Method for using circularly polarized antenna far field phase difference for calculating rotation offset of electric field probe |
| CN106291129A (en) * | 2015-06-01 | 2017-01-04 | 北京空间飞行器总体设计部 | Phased array antenna far-field pattern measuring method |
| CN106443209A (en) * | 2016-12-03 | 2017-02-22 | 刘科宏 | Test system and method for active base station antenna three-dimensional space distant field radiation characteristics |
| CN106841828A (en) * | 2017-02-23 | 2017-06-13 | 上海霍莱沃电子系统技术股份有限公司 | A kind of near field antenna test system and its method of testing based on frequency division |
| CN107219410A (en) * | 2017-06-21 | 2017-09-29 | 西安空间无线电技术研究所 | A kind of Planar Near-Field Measurement modification method based on probe frequency sweep shift offset |
| CN107390037A (en) * | 2017-07-06 | 2017-11-24 | 广东曼克维通信科技有限公司 | Antenna near-field test device and method |
| US20190004102A1 (en) * | 2017-06-29 | 2019-01-03 | Keysight Technologies, Inc. | Advanced antenna performance testing |
| CN109142891A (en) * | 2018-09-25 | 2019-01-04 | 北京理工大学 | Antenna near-field test probe and method based on Rydberg atom quantum coherence effect |
| US20190086459A1 (en) * | 2017-07-07 | 2019-03-21 | The Governors Of The University Of Alberta | Systems and methods for measuring and characterizing antenna performance |
| CN209264836U (en) * | 2018-11-05 | 2019-08-16 | 上海益麦电磁技术有限公司 | A kind of Compact Range Antenna testing system based on array antenna |
| CN110470914A (en) * | 2019-07-13 | 2019-11-19 | 西安电子科技大学 | It is a kind of based on iterative Fourier transform algorithm without phase near field antenna measurements method |
| CN209821290U (en) * | 2018-11-21 | 2019-12-20 | 上海益麦电磁技术有限公司 | Compact range antenna testing device based on 3D probe array |
| CN112034264A (en) * | 2020-08-18 | 2020-12-04 | 苏州益谱电磁科技有限公司 | Multi-probe compact range antenna test system and generation method |
-
2021
- 2021-04-30 CN CN202110483020.9A patent/CN113252999B/en active Active
Patent Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103424066A (en) * | 2013-08-26 | 2013-12-04 | 中国科学院空间科学与应用研究中心 | Method for using circularly polarized antenna far field phase difference for calculating rotation offset of electric field probe |
| CN106291129A (en) * | 2015-06-01 | 2017-01-04 | 北京空间飞行器总体设计部 | Phased array antenna far-field pattern measuring method |
| CN106443209A (en) * | 2016-12-03 | 2017-02-22 | 刘科宏 | Test system and method for active base station antenna three-dimensional space distant field radiation characteristics |
| CN106841828A (en) * | 2017-02-23 | 2017-06-13 | 上海霍莱沃电子系统技术股份有限公司 | A kind of near field antenna test system and its method of testing based on frequency division |
| CN107219410A (en) * | 2017-06-21 | 2017-09-29 | 西安空间无线电技术研究所 | A kind of Planar Near-Field Measurement modification method based on probe frequency sweep shift offset |
| US20190004102A1 (en) * | 2017-06-29 | 2019-01-03 | Keysight Technologies, Inc. | Advanced antenna performance testing |
| CN107390037A (en) * | 2017-07-06 | 2017-11-24 | 广东曼克维通信科技有限公司 | Antenna near-field test device and method |
| US20190086459A1 (en) * | 2017-07-07 | 2019-03-21 | The Governors Of The University Of Alberta | Systems and methods for measuring and characterizing antenna performance |
| CN109142891A (en) * | 2018-09-25 | 2019-01-04 | 北京理工大学 | Antenna near-field test probe and method based on Rydberg atom quantum coherence effect |
| CN209264836U (en) * | 2018-11-05 | 2019-08-16 | 上海益麦电磁技术有限公司 | A kind of Compact Range Antenna testing system based on array antenna |
| CN209821290U (en) * | 2018-11-21 | 2019-12-20 | 上海益麦电磁技术有限公司 | Compact range antenna testing device based on 3D probe array |
| CN110470914A (en) * | 2019-07-13 | 2019-11-19 | 西安电子科技大学 | It is a kind of based on iterative Fourier transform algorithm without phase near field antenna measurements method |
| CN112034264A (en) * | 2020-08-18 | 2020-12-04 | 苏州益谱电磁科技有限公司 | Multi-probe compact range antenna test system and generation method |
Non-Patent Citations (2)
| Title |
|---|
| A.YAGHJIAN ET AL.: "An overview of near-field antenna measurements", 《IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION》 * |
| 程猛: "DBF天线系统测试方法研究", 《中国优秀博硕士学位论文全文数据库（硕士） 信息科技辑》 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116559745A (en) * | 2023-04-12 | 2023-08-08 | 成都飞机工业（集团）有限责任公司 | Scanning probe correction method in planar near field method antenna measurement |
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