CN116559745A - Scanning probe correction method in planar near field method antenna measurement - Google Patents
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Abstract
The invention discloses a scanning probe correction method in planar near-field antenna measurement, which belongs to the technical field of antenna measurement and comprises the following steps: firstly, carrying out planar near field scanning measurement on a radiation near field region of an antenna to be measured to obtain near field amplitude and phase data of the antenna to be measured on a plane; step two, converting the antenna near-field data to an antenna far-field; step three: measuring the gain and the pattern of the scanning probe; step four: and removing the gain and the directional diagram of the scanning probe from the common result to obtain the gain and the far-field directional diagram of the antenna to be tested. The invention carries out probe influence de-embedding through the measured data, removes the probe influence from the common result, can greatly reduce the probe influence, and effectively corrects the gain and the directional diagram measurement result; the method solves the actual evaluation analysis of the probe influence, and has important significance for improving the measurement accuracy of the planar near-field method antenna.
Description
Technical Field
The invention relates to the technical field of antenna measurement, in particular to a scanning probe correction method in planar near field method antenna measurement.
Background
An antenna is an electronic device that emits or receives electromagnetic waves, and is used to achieve the mutual conversion between a free-space electromagnetic field and a guided wave system electromagnetic field, and is a key component in radio equipment. Engineering systems such as radio communication, broadcasting, television, radar, navigation, electronic countermeasure, remote sensing, radio astronomy and the like, which use electromagnetic waves to transmit information, all rely on antennas to work, and the application of the antennas is extremely wide no matter in civil or national defense fields.
Key parameters affecting antenna performance include gain, cross polarization, radiation pattern, etc. The radiation pattern reflects the intensity of radiation or received power of the antenna in different directions in space, and is usually normalized to the maximum value, so that the antenna is a three-dimensional stereogram, and a plurality of important antenna parameters such as phase center, main lobe half-power beam width (HPBW) and the like can be obtained according to the three-dimensional radiation pattern.
Although the three-dimensional radiation pattern relates to only relative values, it is not easy to accurately measure, especially for ultra-low side lobe antennas, measuring the first zero lobe width, etc., where far field testing is no longer applicable, near field measurement methods may be used. The near field measurement is performed in the radiation near field region of the antenna, and by using a probe with known characteristics, the far field characteristics of the antenna to be measured can be deduced through strict mathematical calculation by collecting electric field information on one side of the radiation near field region.
The commonly used near field measurement systems can be classified into a planar near field system, a cylindrical near field system, and a spherical near field system according to the scanning manner. The scanning plane of the planar near field system is a plane and is particularly suitable for directional antennas, array antennas, etc. with a gain of >15 dBi. The number of such antennas in use is large and is currently the most interesting type of antenna. Therefore, the planar near field scanning technology is more and more widely applied, more than 100 planar near field measurement systems are established in China, and the number of the planar near field measurement systems is continuously increasing.
For radiation pattern measurements, NIST reported the analysis of the errors of the planar near field scanning system 18 by paper as early as 80 s in the world, with a high level in the near field measurement field. Korean standard institute of science (KRISS) also has planar near field scanning antenna radiation pattern measurement capability.
For planar near field measurement systems, 4 out of 18 errors are associated with an open waveguide probe as a key component of the received signal. In planar near field measurement, a direct method is adopted to calculate the gain of an antenna to be measured, and a gain value of a probe is required, and in order to obtain a pattern of the antenna to be measured, the pattern of the probe is required to be used for compensating and correcting data after near-field and far-field transformation. The magnitude of the probe can have a large impact on the planar near field antenna measurement and is also the most important component in the uncertainty source.
At present, simulation values are adopted as probes in all plane near field systems for correction, and the actual situation difference cannot be considered in the idealized data, so that the method discusses a correction method based on accurate experimental data.
Disclosure of Invention
The invention aims to solve the problem of influence evaluation of a planar near-field antenna measurement scanning probe on antenna gain to be measured and a pattern measurement result in the prior art, and provides a scanning probe correction method in planar near-field antenna measurement.
In order to achieve the above object, the present invention has the following technical scheme:
a scanning probe correction method in planar near field antenna measurement is characterized by comprising the following steps:
firstly, performing planar near field scanning measurement on a radiation near field region of an antenna to be measured by using two orthogonal scanning probes to obtain near field amplitude and phase data of the antenna to be measured on a plane at a certain distance from the antenna to be measured;
step two, converting the antenna near-field data to an antenna far-field;
measuring gain and a directional diagram of the scanning probe;
and step four, removing the gain and the directional diagram of the scanning probe from the common result to obtain the gain and the far-field directional diagram of the antenna to be detected.
Further, the antenna to be measured is a transmitting antenna, the scanning probe is in an open waveguide form, and the scanning probe moves on a plane at a distance of 3 to 10 wavelengths from the antenna to be measured at a certain interval and is used for collecting field distribution at the radiation near field of the antenna to be measured, wherein the field distribution comprises field amplitude and field phase.
Further, in the first step, the transmission equations at the receiving positions of the two orthogonal scanning probes are respectively:
b′ 0 (P)＝F′a 0 ∫t 10 (K)·s′ 02 (K)e iγd e iK·P dK；
b″ 0 (P)＝F″a 0 ∫t 10 (K)·s″ 02 (K)e iγd e iK·P dK；
wherein ,b′0(P) and b″0 (P) are the outputs of two orthogonal probes, respectively; p is an x, y position vector in the z=d plane; a, a 0 Is the input power of the antenna to be tested; f 'and F' are the impedance correction coefficients between the probe and the load twice, respectively; s' 02(K) and s″02 (K) Plane Wave Reception Coefficients (PWRC) representing the two probes, respectively; k is the component of wavenumber vector K in the xy plane,gamma is the component amplitude of the wavenumber vector k in the z-direction and i is the imaginary unit.
Further, in the second step, the antenna near-field data is transformed into the antenna far-field to obtain angular spectrums D' (K) and D "(K) by fourier transformation:
wherein ,P0 Is the reference point, and and /> and />
In the fourth step, the main polarization component of the antenna to be measured is measured by the probe
wherein ,s′02(K) and s″02 (K) Plane Wave Reception Coefficients (PWRC) representing the two probes, respectively; ρ' s(K) and ρ″s (K) Correction coefficients for both probes; m is the main polarization component and c is the cross polarization component.
In the fourth step, the cross polarization component of the antenna to be measured is measured by the probe to be
Further, the calculation formula of the antenna gain to be measured is:
wherein: g (K) represents the gain and,is the plane admittance in free space; t is t 10 (K) Plane Wave Transmission Coefficient (PWTC) for the antenna to be tested; k is the component of the wave number vector K in the xy-plane, -/->Gamma is the component amplitude of wave number vector k in the z direction; η (eta) 0 Is the characteristic admittance in the transmission line; Γ -shaped structure a Is the reflection coefficient of the antenna;
further, the calculation formula of the antenna pattern to be measured is:
wherein ,is a position vector with a transverse component R +.>
In the third step, gain measurement is carried out on the probe by adopting a three-antenna extrapolation method, and pattern measurement is carried out on the probe by adopting a far-field method.
In summary, the invention has the following advantages:
1. the invention carries out probe influence de-embedding through the measured data, removes the probe influence from the common result, can greatly reduce the probe influence, and effectively corrects the gain and the directional diagram measurement result;
2. compared with the traditional method, the method has the advantage of high accuracy;
3. the method solves the actual evaluation analysis of the probe influence, and has important significance for improving the measurement accuracy of the planar near-field method antenna.
Drawings
FIG. 1 is a schematic diagram of a planar near field measurement system;
FIG. 2 is a diagram of the amplitude of the probe measured-12.4 GHz horizontal component;
FIG. 3 is a measured probe amplitude pattern two (12.4 GHz vertical component);
FIG. 4 is a probe amplitude pattern three (14.9 GHz horizontal component) of measurement;
FIG. 5 is a probe amplitude pattern four (14.9 GHz vertical component) of the measurement;
FIG. 6 is a probe amplitude pattern five (17.9 GHz horizontal component) of the measurement;
FIG. 7 is a diagram of a measured probe amplitude pattern six (17.9 GHz vertical component);
FIG. 8 is a graph comparing measured and simulated patterns at different distances according to the present invention;
FIG. 9 is a graph (E-plane) comparing the effects of the measured and simulated probe patterns on the antenna pattern to be measured in accordance with the present invention;
FIG. 10 is a graph II (H-plane) comparing the effects of the measured and simulated probe patterns on the antenna pattern to be measured in accordance with the present invention;
Detailed Description
In order to more clearly illustrate the present invention, the present invention will be further described with reference to preferred embodiments and the accompanying drawings. It is to be understood by persons skilled in the art that the following detailed description is illustrative and not restrictive, and that this invention is not limited to the details given herein. The terms "first," "second," and the like in the description and in the claims and in the above-described figures, are used for distinguishing between different objects and not necessarily for describing a particular sequential or chronological order. Furthermore, the terms "comprise" and "have," as well as any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those listed steps or elements but may include other steps or elements not listed or inherent to such process, method, or apparatus.
Example 1
The invention provides a scanning probe correction method in planar near field antenna measurement, which comprises the following steps:
step one, in the radiation near field region of the antenna to be measured, performing planar near field scanning measurement by using a probe to obtain near field amplitude and phase data of the antenna to be measured on a plane z with a certain distance d from the antenna to be measured, as shown in fig. 1.
Preferably, the transmitting antenna is an antenna to be measured, the probe is in an open waveguide form, and the two orthogonal probes move on a plane at a distance of 3 to 10 wavelengths from the antenna to be measured at a certain interval and are used for collecting field distribution at the radiation near field of the antenna to be measured, wherein the field distribution comprises field amplitude and field phase.
The transmission equation of the receiving positions of the two probes is b 'respectively' 0 (P)＝F′a 0 ∫t 10 (K)·s′ 02 (K)e iγd e iK·PdK and b″0 (P)＝F″a 0 ∫t 10 (K)·s″ 02 (K)e iγd e iK·P dK。
b′ 0(P) and b″0 (P) are the outputs of two orthogonal probes, respectively; p is an x, y position vector in the z=d plane; a, a 0 Is the input power of the antenna to be tested; f 'and F' are the impedance correction coefficients between the probe and the load twice, respectively; s' 02(K) and s″02 (K) Plane Wave Reception Coefficients (PWRC) representing the two probes, respectively; k is the component of wavenumber vector K in the xy plane,gamma is the component amplitude of the wavenumber vector k in the z direction and i is the imaginary unit.
Step two, converting the antenna near-field data to an antenna far-field;
transforming the antenna near field data to the antenna far field uses fourier transformation to obtain angular spectra D' (K) and D "(K).
wherein ,P0 Is a reference point, usually a center point, and and /> And
measuring gain and a directional diagram of the scanning probe;
specifically, the gain measurement is carried out on the probe by adopting a three-antenna extrapolation method, and MI12-12 antennas are adopted for pairing 2 antennas. The three-antenna extrapolation is a generalized antenna gain measurement method, and gain at infinity of the probe is obtained through digital filtering and polynomial fitting. The method used for the pattern measurement of the probe is far field method.
And step four, removing the gain and the directional diagram of the scanning probe from the common result to obtain the gain and the far-field directional diagram of the antenna to be detected.
Preferably, the main polarization component of the antenna to be measured obtained by probe measurement is:
wherein ,s′02(K) and s″02 (K) Plane Wave Reception Coefficients (PWRC) representing the two probes, respectively;
ρ′ s(K) and ρ″s (K) Correction coefficients for both probes; m is the main polarization component and c is the cross polarization component.
The cross polarization components of the antenna to be measured obtained through probe measurement are as follows:
the gain calculation formula of the antenna to be measured is as follows:
wherein G (K) represents the gain,is the plane wave admittance, η, in free space 0 Is the characteristic admittance in the transmission line; Γ -shaped structure a Is the reflection coefficient of the antenna.
The calculation formula of the directional diagram of the antenna to be measured is as follows:
wherein ：is a position vector with a transverse component R +.>The Plane Wave Transmission Coefficient (PWTC) of the antenna to be measured is t 10 (K) K is the component of the wavenumber vector K in the xy-plane,/->The component amplitude of k in the z direction is γ.
Example 2
In the planar near-field antenna measurement technology, far-field data after near-field and far-field transformation contains not only the parameter information of an antenna but also the parameter information of a sampling probe. To obtain accurate antenna parameters, the characteristics of the probe need to be removed from the near-far field transformed D' (K) and D "(K).
The pattern of the probe needs to be corrected in the pattern measurement of the antenna, and the gain of the probe is used in the direct method antenna gain measurement. The method is implemented by using the correction of ku-band open waveguide probes in portable planar near field antenna measurements with horizontal and vertical scan areas in the 1.5m range.
The probe pattern is measured by a far field method in a darkroom. The measurement distance is 3m, the scanning interval is 0.5 degrees in the azimuth scanning range and 0 to 180 degrees in the polarization scanning range, and the scanning interval is 22.5 degrees. Two orthogonal component pattern data are collected at each location point determined by azimuth angle θ and polarization angle Φ, see fig. 2-7. The influence of the selection of the measurement distance on the measurement result is compared with the result of the simulation value, and the result is shown in fig. 8 of the specification.
The probe gain was measured using a three antenna extrapolation technique, the 2 antennas for pairing were MI12-12 antennas, and the simulation and measurement results are shown in Table 1.
The results of probe corrections using the simulated and measured probe data are shown in table 2 and in fig. 9-10. It can be seen that the influence of the traditional simulation value on the measurement result is larger, and some frequency points exceed 0.5dB, so that the influence on the antenna measurement result is larger, and if the method is adopted, the measurement uncertainty is greatly reduced.
Table 1 measured and simulated probe gain values
Table 2 antenna gain values using measured and simulated values
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims (9)
1. A scanning probe correction method in planar near field antenna measurement is characterized by comprising the following steps:
firstly, performing planar near field scanning measurement on a radiation near field region of an antenna to be measured by using two orthogonal scanning probes to obtain near field amplitude and phase data of the antenna to be measured on a plane at a certain distance from the antenna to be measured;
step two, converting the antenna near-field data to an antenna far-field;
measuring gain and a directional diagram of the scanning probe;
and step four, removing the gain and the directional diagram of the scanning probe from the common result to obtain the gain and the far-field directional diagram of the antenna to be detected.
2. The method according to claim 1, wherein the antenna to be measured is a transmitting antenna, the scanning probe is in the form of an open waveguide, and the scanning probe moves at a certain interval on a plane at a distance of 3 to 10 wavelengths from the antenna to be measured, so as to collect the field distribution of the radiation near field of the antenna to be measured, including the field amplitude and the field phase.
3. The method for correcting a scanning probe for planar near-field antenna measurement according to claim 1, wherein in the first step, the transmission equations at the receiving positions of two orthogonal scanning probes are respectively:
b′ 0 (P)＝F′a 0 ∫t 10 (K)·s′ 02 (K)e iγd e iK·P dK；
b″ 0 (P)＝F″a 0 ∫t 10 (K)·s″ 02 (K)e iγd e iK·P dK；
wherein ,b′0(P) and b″0 (P) are the outputs of two orthogonal probes, respectively; p is x in the z=d plane,a y position vector; a, a 0 Is the input power of the antenna to be tested; f 'and F' are the impedance correction coefficients between the probe and the load twice, respectively; s' 02(K) and s″02 (K) Plane Wave Reception Coefficients (PWRC) representing the two probes, respectively; k is the component of wavenumber vector K in the xy plane,gamma is the component amplitude of the wavenumber vector k in the z-direction and i is the imaginary unit.
4. The method for correcting a scanning probe for planar near-field antenna measurement according to claim 1, wherein in the second step, the antenna near-field data is transformed into the antenna far-field to obtain angular spectrums D' (K) and D "(K) by fourier transform:
wherein ,P0 Is the reference point, and and /> and />
5. The method for correcting scanning probe for planar near field antenna measurement according to claim 1, wherein in step four, main polarization component of antenna to be measured obtained by probe measurement is
wherein ,s′02(K) and s″02 (K) Plane Wave Reception Coefficients (PWRC) representing the two probes, respectively; ρ' s(K) and ρ″s (K) Correction coefficients for both probes; m is the main polarization component and c is the cross polarization component.
6. The method for correcting scanning probe for planar near field antenna measurement as claimed in claim 1, wherein in step four, the cross polarization component of the antenna to be measured obtained by probe measurement is
7. The method for correcting a scanning probe for planar near field antenna measurement as claimed in claim 1, wherein,
the calculation formula of the antenna gain to be measured is:
wherein: g (K) represents the gain and,is the plane admittance in free space; t is t 10 (K) Plane Wave Transmission Coefficient (PWTC) for the antenna to be tested; k is the component of the wave number vector K in the xy-plane, -/->Gamma is the component amplitude of wave number vector k in the z direction; η (eta) 0 Is the characteristic admittance in the transmission line; Γ -shaped structure a Is the reflection coefficient of the antenna.
8. The method for correcting a scanning probe for planar near-field antenna measurement according to claim 1, wherein the calculation formula of the antenna pattern to be measured is:
wherein ,is a position vector with a transverse component R +.>
9. The method for correcting a scanning probe for planar near-field antenna measurement according to claim 1, wherein in the third step, gain measurement is performed on the probe by using a three-antenna extrapolation method, and pattern measurement is performed on the probe by using a far-field method.
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| 李勇等: "平面近场天线测量误差分析", 电子测量与仪器学报, vol. 24, no. 11, 30 November 2010 (2010-11-30), pages 987 - 992 * |
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