CN103616569A - Method for correcting near-field test phases of millimeter wave plane - Google Patents
Method for correcting near-field test phases of millimeter wave plane Download PDFInfo
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Abstract
The invention provides a method for correcting near-field test phases of a millimeter wave plane. The method comprises the steps that step 1, a set XY plane is scanned and four points in a zone with strong signals are selected to serve as phase sampling points; step 2, preset periods are set, plane scanning is conducted on the four points, and collection moments, collection data and collection positions of the four points in each period are determined; step 3, according to data variable quantity of the selected four points, the phase of each point in the scanned plane is corrected; step 4, Fourier transform is conducted on the corrected data of the whole scanned plane, far-field data are calculated through near-field data, and the near-field far-field transformation formula is . According to the technical scheme, a function relationship, corresponding to the sampling points, of phase drift and time is established through the method that the positions of the appointed sampling points on the scanned plane and the sampling data in the positions are recorded, phase compensation of the data of the whole scanned plane is achieved through the interpolation mode, and therefore the measurement accuracy of a near-field measurement system under a millimeter wave frequency band is improved.
Description
Technical field
The invention belongs to near-field test technical field, in particular a kind of millimeter-wave planar near-field test phase correction method.
Background technology
Since antenna is invented, its application in fields such as communication, radar and national defence grows with each passing day, and becomes part indispensable in wireless device.Antenna performance accurately whether, have influence on the performance of whole system.Antenna measurement becomes step indispensable in Antenna Design process, is one of important topic of studying of people.
Antenna measurement is to attend by the design of antenna to occur, is the testing authentication to the guidance of Antenna Design and performance.Whether whether measuring method is accurately directly connected to it corollary system practical.And along with the development of national defence and information industry, more and more higher to the requirement of antenna, the analysis of high performance modern antennas be unable to do without advanced measuring technology and measuring system with design.Various numerical value or resolution design method are all to take various models as basis, carry out phantom antenna, and these models are just similar to a kind of of actual antennas, and they and practical problems always exist difference more or less, and their degree of approximation will be checked by experiment measuring.In addition, measuring technique also can diagnose in time and find to design a model in problem, to model is revised and is improved.On the one hand, high-precision test macro is instructing the design of high performance antenna.On the other hand, high performance antenna is had higher requirement to the precision of measuring system and measuring method, and this just requires to adopt new method and technology to assess the performance of antenna.
Along with the progress of computer technology and the development of modern surveying means, antenna measurement technology has also obtained major progress, has formed many measuring methods, comprises far-field measurement, near field measurement and Compact Range measurement etc.
Far-Field antennas measurement system refers in the radiation far-field region of antenna, directly obtains the far-field performance parameter of antenna.Under general situation, Antenna Far Field measuring distance R need meet R >=2D2/ λ, the full-size that D is antenna aperture, and brother is the operation wavelength of antenna.For large-scale antenna, far field distance generally cannot realize, moreover is subject to the impact of environment and site factors, and realization condition and the precision of far-field measurement are very restricted.
Near field measurement is within the scope of antenna near region, tries to achieve the far-field characteristic of antenna.Because it is not subject to distant effect in far field test and the impact of external environment, have measuring accuracy high, safe and secret, can all weather operations etc. series of advantages, and can well simulate and control various electromagnetic environments, and effectively compensate various measuring error by suitable software, its measuring accuracy is even better than far-field measurement, thereby more and more applied, be the emphasis problem that people study always, is also one of main method of current high performance antenna measurement.
The plane wave that Compact Range produces by means of catoptron, loudspeaker, array etc. comes the place of emulation indefinite length.Its dead zone diameter, because being subject to the impact of parabolic mirror edge diffraction, generally only has 1/3 reflecting surface diameter.Moreover indoor reflection, amplitude cone disappears, edge diffraction, feed is revealed and offset-fed causes effects limit such as passiveness measure the quality in place, the application of Compact Range antenna measurement is very limited.
Although near-field test can meet the requirement that some far field antenna tests do not reach, in millimeter wave test frequency range, want to measure accurately, all energy that sampling probe must go out antenna transmission all capture.Some high-gain aerials of picture, as reflector antenna and phased array antenna, the energy that these antenna sends all concentrates in the direction vertical with antenna aperture, in order to test the antenna of these types, must use high-accuracy positioning system.Simultaneously in order to guarantee the precision of antenna measurement, probe must meet minimum and be sampled as half sample interval of aerial signal wavelength, therefore, realize relatively and a near field measurement accurately of AUT, and the exact position of probe and flatness thereof are vital.
Yet, the technical limitation that can not break through due to mechanical process capacity and cable etc., near-field test error under millimeter wave frequency band or very large, be mainly reflected in 2 points, a stepping accuracy that is embodied in mechanical scanner, the error that repetitive positioning accuracy and linearity etc. produce, another is embodied in the increase along with the test duration of radio-frequency cable or mechanical scanner, produce thermal effect and cause the deformation of radio-frequency cable and plant equipment, the error that this all can bring about big influence to test data, such as with the good Ge Er cable of Performance Ratio, in 10GHz, external environment condition changes one degree Celsius, the temperature difference producing makes the cable of 1m produce the antenna measurement error of 0.5 degree, and pure mechanical precision and the existing performance of cable leaned on guarantees that measuring accuracy is also proved to be infeasible.
Uranology in practical application, rocket, the own warp-wise of antenna actual operating frequency used of radar etc. has even arrived the research range of submillimeter wave far above 40GHz, yet because required measuring distance restriction is tested in far field, the reasons such as RF loss and environment, far field system is not high to the test of this respect accuracy always, along with the development of near field antenna test macro in recent years and the ripe and increasing scientific research personnel of measuring technology are to near-field test system, the understanding of test performance, near-field test system becomes the first-selection to millimeter wave submillimeter wave AUT test gradually, overcome on the one hand the drawback of far field system testing, conscientiously met again on the other hand the demand to the millimeter wave Sub-MM Wave Antenna debugging in existing research.
Although we know that near field system can meet our the measurement debugging to millimeter wave submillimeter wave researching antenna, yet as He Jianshe holds the shielded anechoic chamber of this measuring system, as He Jianshe is a set of, meet the system of our test and debugging demand, the requirement of system Construction how supplier is proposed, how to solve the system Construction restriction bringing higher than the limit module of 40GHz frequency, we but have many uncertain.
At low frequency test phase, the main finishing by mechanical scanner at present guarantees measuring accuracy, only need a simple mechanical scanning frame just can form complete acquisition system, this does not have much problems, because low frequency frequency range is not also very high to the accuracy requirement of mechanical scanner, the error of the precision of plant equipment and phase of cable drift can not cause the error that can not receive to test result.
Its principle of work is to leave in body to be measured (DUT) 3～5 λ distances, the probe that oneself knows by electrical characteristics scans amplitude and the phase data of sampling electromagnetic field on a certain plane in DUT near region or curved surface, pass through strict mathematic(al) manipulation (FFT) again and calculate the electrical characteristics of the far zone field of DUT, this technology is referred to as near-field measurement technique.Near field measurement method has been mainly used in antenna measurement (radiation problem measurement) since the seventies from last century, it does data sampling in the near region of antenna to be measured (AUT), and can obtain the far-field characteristic of antenna by the data that obtain through mathematic(al) manipulation, as far-field pattern etc.
For Radiation Near-Field Measurement, the difference surperficial according to sampling, can be divided into two-dimensional scanning technique, cylinder scanning technology and spherical scanning technology.And Planar Near-Field Measurement technology is to study the earliest, apply maximum measuring methods in near-field measurement technique, oneself is widely used for measuring the far-field radiation characteristic of antenna.At present, oneself is mature on the whole the basic theories of planar near-field antenna measurement, its core is that the nearly Far-Zone Field Transformation of plane while considering probe impact (having probe compensation) is theoretical, the coupled wave equation while considering probe impact (having probe compensation) between AUT and probe and the formula of being determined Antenna Far Field directional diagram to be measured by Near-field Data.About lotus root, close equation and by Near-field Data, determined that the derivation of the formula of Antenna Far Field directional diagram to be measured has two kinds of methods substantially, a kind of is theory based on Scattering of Plane Waves matrix, and another kind is based on reciprocal theorem.
The size of measurement face, should guarantee that the level of edge is so low that can to have ignored.This is certainly relevant with the dynamic range of measuring system and scope and the precision of desired expectation far-field pattern.Generally should make the field of measuring face truncated position than the low 30～40dB in centre, for the narrow beam antenna of many antenna with side radiation directions, if be only concerned about the directional diagram near the little angular domain of side direction, the sample interval of near field measurement can increase according to condition; And for super low sidelobe antenna, in order to reduce secondary lobe measuring error, general sample interval is less than λ/2.
At millimeter wave frequency band, there is at present the error that adopts flatness compensate function to reduce phase place, his principle is by equipment such as high precision transit or laser trackers, the flatness of scanning support to be detected, by detecting data, set up error correction form, when carrying out flat scanning, error information is carried out to linear interpolation and compensate in plane of movement, make the plane of scanning motion idealized as far as possible.
Planar near-field Antenna testing system does not have the algorithm of phase place correction in low frequency frequency range at present, generally adopt hardware device and adopt high phase-compensated cable to guarantee the degree of stability of phase place, but at millimeter wave high band even more, only rely on hardware device can not meet the precision of system requirements, the phase drift error producing though comprise positioning precision and cable temperature to increase.
At millimeter wave frequency band, there is at present the error that adopts flatness compensate function to reduce phase place, but the error that this compensation way only can be drawn hardware plant equipment is revised as much as possible, but the phase place causing for the more responsive cable of temperature changes, really do not take into account, cannot carry out Planar Near-Field Measurement to the antenna of millimeter wave frequency band.
Therefore, there is defect in prior art, needs to improve.
Summary of the invention
Technical matters to be solved by this invention is for the deficiencies in the prior art, and a kind of millimeter-wave planar near-field test phase correction method is provided.
Technical scheme of the present invention is as follows:
A millimeter-wave planar near-field test phase correction method, wherein, comprises the following steps:
Step 1: the XY face of setting is carried out to flat scanning, and four points in the stronger region of selected signal are phase-samplomh point;
Step 2: predetermined period is set above-mentioned 4 points are carried out to flat scanning, determine the collection moment, image data, the collection position of 4 points in each cycle;
Step 3: by the data variation amount of selected these 4 points is carried out to phase place correction to each point in scanning plane; Wherein, correction formula is:
D[i, j]=A[i, j] * B[i, j] i=1,2 ... n, j=1,2 ... n; Wherein, D is data after revising; A is image data; B is for revising data; I is that X-axis collection is counted; J is that Y-axis collection is counted; N counts for gathering;
Step 4: the revised data of whole scanning plane are carried out to Fourier transform, calculate far field data by Near-field Data, nearly Far-Zone Field Transformation formula is as follows:
Described millimeter-wave planar near-field test phase correction method, wherein, described flat scanning adopts three-axis moving tracker; Described collection position and collection are obtained by laser tracker constantly.
Described millimeter-wave planar near-field test phase correction method, wherein, in described step 2, described predetermined period is the cycle of 3-4 predetermined amount of time.
Adopt such scheme, sampling point position by appointment on writing scan face and the sampled data under this position are set up phase drift that sampled point is corresponding and the funtcional relationship of time, mode by interpolation realizes the phase compensation to whole scanning plane data, improves the measuring accuracy of near-field test system under millimeter wave frequency band.
Accompanying drawing explanation
Fig. 1 is system connection diagram of the present invention.
Fig. 2 is test philosophy process flow diagram of the present invention.
Fig. 3 is system data of the present invention collection point schematic diagram.
Fig. 4 is data interpolating schematic diagram of the present invention.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention is described in detail.
As shown in Figure 1, hardware device of the present invention is mainly comprised of vector network analyzer 10, four axes motion scanning support 11, near field probes 12, emitting antenna 13, transmitting support 14, main control computer 16 etc.Wherein, vector network analyzer 10 connects radio frequency output port to emitting antenna 13 by radio-frequency cable 15, receiving port connects the receiving transducer 12 on scanning support 11 by radio-frequency cable, 16 of main control computers carry out co-ordination by controlling software by equipment such as LAN (Local Area Network) or outer net control vector network analyzer 10 and scanning supports 11, also comprise position adjustments controller 17 gated sweep frame 11 test philosophy process flow diagrams as shown in Figure 2: in Fig. 2
When near field probes is carried out two-dimensional surface scanning on scanning support, when the location point through setting in advance, except record is now the data of this location point, also to record the moment of image data, collection point schematic diagram as shown in Figure 3, is selected arbitrarily 4 points, i.e. P1, P2, P3, P4 in Fig. 3; By periodicity, set acquisition time interval △ t, the corresponding one group of data p of each △ t, has so just become p(p1 corresponding to △ t array, p2, p3 ... pn) array, take p1 as benchmark, forms (p2-p1, p3-p1, p4-p1 ... pn-p1) error array.
Use one-line interpolation, if xi is in X between two points (xj, xj+1), the method is carried out interpolation yi between the line segment that connects (xj, xj+1).Be illustrated in fig. 4 shown below, in Fig. 4, L
1, L
3, L
4
Be respectively the interpolated point in interpolation array.
In Fig. 4, there is following formula one:
Adopt such scheme, can not only be useful in millimeter wave frequency band, also can be useful in centimeter wave frequency range, improved the accuracy of microwave current millimeter-wave planar near-field test.
The present invention proposes a kind of laser tracker that utilizes in conjunction with mechanical scanner, sampling point position by appointment on writing scan face and the sampled data under this position are set up phase drift that sampled point is corresponding and the funtcional relationship of time, mode by interpolation realizes the phase compensation to whole scanning plane data, improves the measuring accuracy of near-field test system under millimeter wave frequency band.
On the basis of above-described embodiment, further, a kind of millimeter-wave planar near-field test phase correction method, wherein, comprises the following steps:
Step 1: the XY face of setting is carried out to flat scanning, and four points in the stronger region of selected signal are phase-samplomh point;
Step 2: predetermined period is set above-mentioned 4 points are carried out to flat scanning, determine the collection moment, image data, the collection position of 4 points in each cycle;
Step 3: by the data variation amount of selected these 4 points is carried out to phase place correction to each point in scanning plane; Wherein, correction formula is:
D[i, j]=A[i, j] * B[i, j] i=1,2 ... n, j=1,2 ... n; Wherein, D is data after revising; A is image data; B is for revising data; I is that X-axis collection is counted; J is that Y-axis collection is counted; N counts for gathering;
Step 4: the revised data of whole scanning plane are carried out to Fourier transform, calculate far field data by Near-field Data, nearly Far-Zone Field Transformation formula is as follows:
Described flat scanning adopts three-axis moving tracker; Described collection position and collection are obtained by laser tracker constantly.
In described step 2, described predetermined period is the cycle of 3-4 predetermined amount of time.
Adopt such scheme, sampling point position by appointment on writing scan face and the sampled data under this position are set up phase drift that sampled point is corresponding and the funtcional relationship of time, mode by interpolation realizes the phase compensation to whole scanning plane data, improves the measuring accuracy of near-field test system under millimeter wave frequency band.
Should be understood that, for those of ordinary skills, can be improved according to the above description or convert, and all these improvement and conversion all should belong to the protection domain of claims of the present invention.
Claims (2)
1. a millimeter-wave planar near-field test phase correction method, is characterized in that, comprises the following steps:
Step 1: the XY face of setting is carried out to flat scanning, and four points in the stronger region of selected signal are phase-samplomh point;
Step 2: predetermined period is set above-mentioned 4 points are carried out to flat scanning, determine the collection moment, image data, the collection position of 4 points in each cycle;
Step 3: by the data variation amount of selected these 4 points is carried out to phase place correction to each point in scanning plane; Wherein, correction formula is:
D[i, j]=A[i, j] * B[i, j] i=1,2 ... n, j=1,2 ... n; Wherein, D is data after revising; A is image data; B is for revising data; I is that X-axis collection is counted; J is that Y-axis collection is counted; N counts for gathering;
Step 4: the revised data of whole scanning plane are carried out to Fourier transform, calculate far field data by Near-field Data, nearly Far-Zone Field Transformation formula is as follows:
2. millimeter-wave planar near-field test phase correction method as claimed in claim 1, is characterized in that, described flat scanning adopts three-axis moving tracker; Described collection position and collection are obtained by laser tracker constantly.
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