CN110221131A - A kind of Terahertz Compact Range test macro based on E-scan antenna - Google Patents
A kind of Terahertz Compact Range test macro based on E-scan antenna Download PDFInfo
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- CN110221131A CN110221131A CN201910596911.8A CN201910596911A CN110221131A CN 110221131 A CN110221131 A CN 110221131A CN 201910596911 A CN201910596911 A CN 201910596911A CN 110221131 A CN110221131 A CN 110221131A
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- 238000012360 testing method Methods 0.000 title claims abstract description 29
- 239000000463 material Substances 0.000 claims description 14
- 230000005611 electricity Effects 0.000 claims description 7
- 239000011358 absorbing material Substances 0.000 claims description 3
- 238000005286 illumination Methods 0.000 claims description 3
- 230000003321 amplification Effects 0.000 claims 1
- 238000003199 nucleic acid amplification method Methods 0.000 claims 1
- 238000000034 method Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 230000005855 radiation Effects 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000010408 sweeping Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000035800 maturation Effects 0.000 description 1
- 210000003739 neck Anatomy 0.000 description 1
- 238000003012 network analysis Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 238000007514 turning Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/02—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
- G01S7/40—Means for monitoring or calibrating
Abstract
The Terahertz Compact Range test macro based on E-scan antenna that the invention discloses a kind of, it include: darkroom, object to be measured, fixed device, vector network analyzer, Terahertz arrow net expansion module, computer, E-scan antenna and power feeding module, the E-scan antenna, power feeding module are respectively positioned on the inside in darkroom, pass through power feeding module control connection between the E-scan antenna and Terahertz arrow net expansion module.Through the above way, a kind of miniaturization, rapid and convenient, inexpensive Terahertz Compact Range can get the radar reflection section of object to be measured or the far-field pattern data of antenna to be measured, replace original surface of emission or holographic grating using completely new active E-scan antenna, reduce system cost, reduce use space while the miniaturization ability that Compact Range is quickly tested being provided.
Description
Technical field
The fields such as industrial detection of the present invention, scientific experiment, test and measuring, more particularly to it is a kind of based on E-scan antenna too
Hertz Compact Range test macro.
Background technique
The radio technologies equipment such as communication, radar, navigation, remote sensing, broadcast, TV is transmitted by radio wave
Information, require the radiation and reception of radio wave.In radio technology equipment, for radiating and receiving electromagnetic wave
Device is known as antenna.Antenna is essential important component in RI radio intelligence broadcasting system, uses vector network point
Analyzer and vector network expansion module can test microwave to core parameters such as the directional diagrams of Terahertz antenna, to obtain
Obtain the Specifeca tion speeification index of antenna.
Obtain antenna parameter index mainly has far field method, near field method and Compact Range method at present.Far field method is costly, the used time
Several months usually needs to be tested in dozens of kilometres distance, and near field method, which needs Near-field Data to be converted to far field data, certain mistake
Difference.
Compact Range measuring system is a kind of antenna measurement system, and the standard that a function admirable can be provided in short distance is flat
Surface wave test section.Past, it was become the spherical wave of feed generation using accurate reflecting surface or holographic grating in short distance
It is changed to plane wave, to meet far field test requirement.Compact Range measuring system is exactly to simulate far field in lesser microwave dark room
Plane wave electromagnetic environment carry out multinomial measurement and research, such as antenna radiation pattern using conventional far field test device and method
Measurement, gain compare, RCS measurement, imaging etc..
Traditional Compact Range measuring system generallys use the transformation in short distance by spherical wave of reflecting surface or holographic grating
For plane wave, as the rising Compact Range measuring system of working frequency faces many challenges:
Require reflecting surface enough simultaneously in Terahertz frequency range Compact Range system requirements reflecting surface machining accuracy higher (precision < 5um)
Greatly to guarantee sufficient dead zone area, the reflecting surface processing that tradition machinery processing method can no longer meet high-accuracy large-scale is wanted
It asks, simultaneous processing cost is also higher and higher.
Tradition deflation field system design is complicated, take up a large area, reflecting surface installation and debugging are time-consuming and laborious, overall use cost
It is high.
Tradition tightens the multi-angle scanning that field system realizes target using mechanical turntable turning function, traditional mechanical turntable
It is limited to mechanical-physical movement characteristic, speed is slow, volume is big.Plurality of application scenes in 5G/6G communication can not be simulated, can not also be mentioned
For quickly and easily Compact Range test function.
Summary of the invention
The present invention solves the technical problem of the radar reflection section for how providing a kind of available object to be measured or
The Terahertz Compact Range test macro of the far-field pattern data of person's antenna to be measured.
In order to solve the above technical problems, the technical solution adopted by the present invention is that: a kind of terahertz based on E-scan antenna is provided
Hereby Compact Range test macro, comprising: darkroom, object to be measured, fixed device, vector network analyzer, Terahertz swear net expanded mode
Block and computer.The darkroom is Terahertz darkroom and has inner space, and the object to be measured, fixed device are respectively positioned on secretly
Chamber interior, the object to be measured are located above the top plane of fixed device.
It is electrically connected between the computer, the computer also expands with vector network analyzer, Terahertz arrow net
It is successively linked in sequence between exhibition module.
The Terahertz Compact Range test macro based on E-scan antenna also includes E-scan antenna and power feeding module, institute
E-scan antenna, the power feeding module stated are respectively positioned on the inside in darkroom, between the E-scan antenna and Terahertz arrow net expansion module
It is controlled and is connected by power feeding module.
Wherein, after the vector network analyzer issues millimeter-wave signal, net expansion module times magnification is sweared through Terahertz
Frequency arrives Terahertz frequency range, obtains terahertz signal, and the terahertz signal is flat by being converted to free space after E-scan antenna
Surface wave;Free space plane wave illumination is to object to be measured, and backtracking to E-scan antenna, electricity sweeps day again after object to be measured reflects
Line is reduced to current signal after receiving, current signal down-converts to millimeter-wave signal, millimeter wave through Terahertz arrow net expansion module
Signal returns to vector network analyzer, and vector network analyzer calculating parameter is simultaneously stored in computer.
Optionally, E-scan antenna is active E-scan antenna.The active E-scan antenna is set as phased array antenna or super
Material E-scan antenna.
Optionally, the phased array antenna includes several antenna elements, and the antenna element is arranged in antenna array
Face.
Optionally, the antenna element includes radiofrequency signal module, phase shifter and amplifier, the radiofrequency signal mould
Successively control connection between block, phase shifter and amplifier.
Optionally, Meta Materials E-scan antenna includes several metamaterial units, and the metamaterial unit forms Meta Materials
Scanning array.
It optionally, include varactor or mems switch in each metamaterial unit.
Optionally, vector network analyzer is substituted by signal source and spectrum analyzer.
Optionally, the absorbing material of relevant work frequency range is set in Terahertz darkroom.
The beneficial effects of the present invention are: a kind of miniaturization, rapid and convenient, inexpensive Terahertz Compact Range can get mesh to be measured
The far-field pattern data of target radar reflection section or antenna to be measured replace original using completely new active E-scan antenna
The surface of emission or holographic grating, reduce system cost, reduce use space at the same provide miniaturization Compact Range quickly test
Ability.
Detailed description of the invention
To describe the technical solutions in the embodiments of the present invention more clearly, make required in being described below to embodiment
Attached drawing is briefly described, it should be apparent that, drawings in the following description are only some embodiments of the invention, for
For those of ordinary skill in the art, without creative efforts, it can also be obtained according to these attached drawings other
Attached drawing, in which:
Fig. 1 is the schematic diagram of one specific embodiment of traditional reflective face Compact Range test macro in the prior art;
Fig. 2 is the schematic diagram of a specific embodiment in the Terahertz Compact Range test macro the present invention is based on E-scan antenna;
Fig. 3 is that the phased array electricity of a specific embodiment in the Terahertz Compact Range test macro the present invention is based on E-scan antenna sweeps day
Line schematic diagram;
Fig. 4 is that the Meta Materials electricity of a specific embodiment in the Terahertz Compact Range test macro the present invention is based on E-scan antenna sweeps day
Line schematic diagram;
Wherein, the appended drawing reference in figure and the corresponding relationship between component names are as follows: 1, darkroom;2, object to be measured;3, electricity is swept
Antenna;31, antenna element;311, radiofrequency signal module;312, phase shifter;313, amplifier;32, metamaterial unit;4, it feeds
Module;5, Terahertz swears net expansion module;6, vector network analyzer;7, computer;8, fixed device.
Specific embodiment
The technical scheme in the embodiments of the invention will be clearly and completely described below, it is clear that described implementation
Example is only a part of the embodiments of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, this field is common
Technical staff's all other embodiment obtained without making creative work belongs to the model that the present invention protects
It encloses.
Attached drawing is please referred to, a kind of Terahertz deflation based on E-scan antenna is provided in one particular embodiment of the present invention
Field test macro, comprising: darkroom 1, object to be measured 2, fixed device 8, vector network analyzer 6, Terahertz swear net expansion module 5
With computer 8.Wherein, the darkroom 1 is Terahertz darkroom and has inner space, the object to be measured 2, fixed device 8
It is respectively positioned on the inside in darkroom 1, the object to be measured 2 is located above the top plane of fixed device 8, and the fixation device 8 is used
In support and fixed object to be measured 2.In implementation process, the absorbing material of relevant work frequency range is provided in Terahertz darkroom.
Object to be measured 2 can also need to configure turntable or mechanical arm specifically to realize that 1,2,3 dimensions turn to.
In implementation process, the vector network analyzer 6 can issue millimeter-wave signal, computer 7, vector network
Analyzer 6, Terahertz arrow net expansion module 5 are respectively positioned on the outside in darkroom 1.It is electrically connected between computer 7.The computer
7 are also successively linked in sequence between vector network analyzer 6, Terahertz arrow net expansion module 5.
In the present invention, the Terahertz Compact Range test macro based on E-scan antenna also includes E-scan antenna 3
With power feeding module 4, the E-scan antenna 3, power feeding module 4 are respectively positioned on the inside in darkroom 1, the E-scan antenna 3 and terahertz
It hereby swears between net expansion module 5 through the control connection of power feeding module 4.
Wherein, in the specific implementation process, after the vector network analyzer 6 issues millimeter-wave signal, through terahertz
Hereby arrow net expansion module 5 amplifies frequency multiplication to Terahertz frequency range, obtains terahertz signal, the terahertz signal sweeps day by electricity
Free space plane wave is converted to after line 3;Free space plane wave illumination is former again after the reflection of object to be measured 2 to object to be measured 2
Road returns to E-scan antenna 3, and E-scan antenna 3 is reduced to current signal after receiving, current signal swears net expansion module 5 through Terahertz
Millimeter-wave signal is down-converted to, millimeter-wave signal returns to vector network analyzer 6, and 6 calculating parameter of vector network analyzer is simultaneously deposited
It is stored in computer 7.Hereafter, computer 7 controls E-scan antenna beam steering the next position, repeats above-mentioned movement, can obtain to
Survey the radar reflection section of target or the far-field pattern data of antenna to be measured.
In a specific embodiment, E-scan antenna 3 is active E-scan antenna;The active E-scan antenna is set as
Phased array antenna or Meta Materials E-scan antenna.
Further, the phased array antenna includes several antenna elements 31, and the antenna element 31 is arranged in
Antenna array.
In a specific implementation process, the antenna element 31 includes radiofrequency signal module 311, phase shifter 312
With amplifier 313, successively control connection between the radiofrequency signal module 311, phase shifter 312 and amplifier 313.
Phased array E-scan antenna is mainly arranged in antenna array, each antenna element using great quantity of small antenna element
By independent switch control, the phase difference emitted based on Huygen's principle by controlling each antenna element can be synthesized and is differently directed
Main beam.Technology maturation is divided into inactive phased array and active phased array according to different structure.
Wherein, in another specific implementation process, the Meta Materials E-scan antenna includes several Meta Materials lists
Member 32, the metamaterial unit 32 form Meta Materials scanning array.Wherein, include in each metamaterial unit 32
Varactor or mems switch.
Meta Materials E-scan antenna is mainly the new antenna that may be constructed entitled leaky-wave antenna using Meta Materials.Work as electromagnetic wave
When propagating along traveling-wave structure, electromagnetic wave can be along traveling-wave structure constantly to external radiation leaky wave, and this structure for generating leaky wave is just
It is leaky-wave antenna.There is " back reflection-end-fire " to frequency scan feature using the leaky-wave antenna that Meta Materials manufacture, sweeping for antenna can be widened
Angle is retouched to -90 ° to+90 °.If varactor, which is introduced into metamaterial modular construction, may be implemented sweeping within the scope of 180 °
It retouches.
In a preferred embodiment, the Terahertz standard antenna and antenna to be measured are also possible to millimeter wave antenna,
The vector network analyzer can need to work independently or cooperate the work of vector network expansion module according to working frequency,
In one preferred embodiment, vector network analyzer 6 is substituted by signal source and spectrum analyzer, the vector network analysis
Instrument 6 changes spectrum analyzer into and signal source is used cooperatively.
Therefore, the invention has the following advantages that a kind of miniaturization, rapid and convenient, inexpensive Terahertz Compact Range can get
The radar reflection section of object to be measured or the far-field pattern data of antenna to be measured, take using completely new active E-scan antenna
For original surface of emission or holographic grating, reduce system cost, reduce use space and meanwhile provide miniaturization Compact Range it is fast
The ability of speed test.
The above description is only an embodiment of the present invention, is not intended to limit the scope of the invention, all to utilize this hair
Equivalent structure or equivalent flow shift made by bright description is applied directly or indirectly in other relevant technology necks
Domain is included within the scope of the present invention.
Claims (7)
1. a kind of Terahertz Compact Range test macro based on E-scan antenna, comprising: darkroom (1), object to be measured (2), fixed dress
(8), vector network analyzer (6), Terahertz arrow net expansion module (5) and computer (7) are set, the darkroom (1) is terahertz
Hereby darkroom and have inner space, the object to be measured (2), fixed device (8) are respectively positioned on the inside of darkroom (1), it is described to
It surveys target (2) to be located above the top plane of fixed device (8), the vector network analyzer (6) issues millimeter-wave signal, institute
Computer (7), vector network analyzer (6), Terahertz arrow net expansion module (5) stated are respectively positioned on the outside of darkroom (1), described
Computer (7) between be electrically connected, the computer (7) also with vector network analyzer (6), Terahertz swear net expanded mode
Block is successively linked in sequence between (5);
It is characterized in that, the Terahertz Compact Range test macro based on E-scan antenna also include E-scan antenna (3) and
Power feeding module (4), the E-scan antenna (3), power feeding module (4) are respectively positioned on the inside of darkroom (1), the E-scan antenna
(3) it is connected between Terahertz arrow net expansion module (5) by power feeding module (4) control,
Wherein, after the vector network analyzer (6) issues millimeter-wave signal, through Terahertz arrow net expansion module (5) amplification
Frequency multiplication obtains terahertz signal to Terahertz frequency range, and the terahertz signal is converted to free sky after passing through E-scan antenna (3)
Between plane wave;Free space plane wave illumination is to object to be measured (2), and backtracking is swept to electricity again after object to be measured (2) reflection
Antenna (3), E-scan antenna (3) are reduced to current signal after receiving, current signal swears net expansion module (5) down coversion through Terahertz
For millimeter-wave signal, millimeter-wave signal returns to vector network analyzer (6), and vector network analyzer (6) calculating parameter simultaneously stores
In computer (7).
2. the Terahertz Compact Range test macro according to claim 1 based on E-scan antenna, which is characterized in that electricity sweeps day
Line (3) is active E-scan antenna;The active E-scan antenna is set as phased array antenna or Meta Materials E-scan antenna.
3. the Terahertz Compact Range test macro according to claim 2 based on E-scan antenna, which is characterized in that described
Phased array antenna includes several antenna elements (31), and the antenna element (31) is arranged in antenna array.
4. the Terahertz Compact Range test macro according to claim 3 based on E-scan antenna, which is characterized in that described
Antenna element (31) includes radiofrequency signal module (311), phase shifter (312) and amplifier (313), the radiofrequency signal module
(311), successively control connection between phase shifter (312) and amplifier (313).
5. the Terahertz Compact Range test macro according to claim 2 based on E-scan antenna, which is characterized in that Meta Materials
E-scan antenna includes several metamaterial units (32), and the metamaterial unit (32) forms Meta Materials scanning array.
6. the Terahertz Compact Range test macro according to claim 5 based on E-scan antenna, which is characterized in that described
It include varactor or mems switch in each metamaterial unit (32).
7. the Terahertz Compact Range test macro according to claim 1 based on E-scan antenna, which is characterized in that Terahertz
Absorbing material is provided in darkroom.
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Cited By (11)
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CN110609259A (en) * | 2019-10-15 | 2019-12-24 | 北京遥感设备研究所 | Vehicle-mounted millimeter wave radar test system |
CN110673136A (en) * | 2019-09-18 | 2020-01-10 | 闫军 | System and method for detecting dynamic RCS and frequency domain of unmanned aerial vehicle |
CN111413552A (en) * | 2020-03-19 | 2020-07-14 | 合肥师范学院 | Antenna near field rapid measurement method |
CN111474418A (en) * | 2020-06-23 | 2020-07-31 | 上海莱天通信技术有限公司 | Compact range collimator based on plane wave comprehensive technology and optimization method thereof |
CN111766453A (en) * | 2020-06-12 | 2020-10-13 | 中国航发北京航空材料研究院 | Radar scattering cross section test system and method of heating element |
CN111879238A (en) * | 2020-07-31 | 2020-11-03 | 北京环境特性研究所 | Device and method for rapidly adjusting size of terahertz time-domain spectroscopy measurement quiet zone |
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CN110673136A (en) * | 2019-09-18 | 2020-01-10 | 闫军 | System and method for detecting dynamic RCS and frequency domain of unmanned aerial vehicle |
CN110673136B (en) * | 2019-09-18 | 2023-01-24 | 闫军 | System and method for detecting dynamic RCS and frequency domain of unmanned aerial vehicle |
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CN111766453A (en) * | 2020-06-12 | 2020-10-13 | 中国航发北京航空材料研究院 | Radar scattering cross section test system and method of heating element |
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CN111879238A (en) * | 2020-07-31 | 2020-11-03 | 北京环境特性研究所 | Device and method for rapidly adjusting size of terahertz time-domain spectroscopy measurement quiet zone |
CN111879238B (en) * | 2020-07-31 | 2022-01-28 | 北京环境特性研究所 | Device and method for rapidly adjusting size of terahertz time-domain spectroscopy measurement quiet zone |
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CN113176454B (en) * | 2021-04-29 | 2023-09-05 | 中国船舶重工集团公司第七二三研究所 | Reflective terahertz liquid crystal phased array surface testing system and method |
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