CN113094216A - Test system and method of multifunctional mainboard - Google Patents
Test system and method of multifunctional mainboard Download PDFInfo
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- CN113094216A CN113094216A CN201911336533.6A CN201911336533A CN113094216A CN 113094216 A CN113094216 A CN 113094216A CN 201911336533 A CN201911336533 A CN 201911336533A CN 113094216 A CN113094216 A CN 113094216A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2268—Logging of test results
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- General Engineering & Computer Science (AREA)
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- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention relates to a test system and method for a multifunctional main board, which comprises the following sub-steps: (1) the PCI bus is electrically connected with the multifunctional mainboard and each functional module and is connected with a power supply; (2) ensuring the working frequency of the PCI bus to be between 0 and 33 MHz; (3) the first driving unit tests a first transmission rate of the first interface module; (4) judging whether the first transmission rate is between 0 and 60 MB/s; (5) the second driving unit tests a second transmission rate of the second interface module; (6) the red light is on, and the test fails; (7) judging whether the second transmission rate is between 0 and 2.25 GB/s; (8) the green light is on, and the test is successful; (9) the red light is on, and the test fails; (10) the storage module stores data information of the first transmission rate and the second transmission rate. The system and the method for testing the multifunctional mainboard solve the problems of inaccurate signal transmission and incapability of concentrating signals on controlling the mainboard and short circuit, and greatly improve the testing efficiency.
Description
[ technical field ] A method for producing a semiconductor device
The invention relates to the technical field of testing a mainboard, in particular to a testing system and a testing method of a multifunctional mainboard.
[ background of the invention ]
At present, the inside control mainboard that is equipped with of notebook computer of workshop production, this control mainboard and each functional part electric connection, however this control mainboard is mixed and disorderly with each functional part's interconnecting link, the signal of transmission has the diversification, and this signal can't concentrate on same control mainboard, signal transmission's inaccuracy has been caused, even make the circuit take place the short circuit, when customer's demand control mainboard has multiple functions, need change and test many times to the functional part of control mainboard, therefore consume a large amount of time, the problem that efficiency of software testing reduces has been produced.
In view of the above, it is necessary to provide a testing system and a testing method for a multifunctional motherboard to solve the problems of inaccurate signal transmission, inaccurate signal concentration on the same control motherboard, short circuit and low testing efficiency in the prior art.
[ summary of the invention ]
The invention aims to provide a testing system and a testing method of a multifunctional mainboard, and aims to solve the problems that signal transmission generated by a control mainboard at the present stage is inaccurate, signals cannot be concentrated on the same control mainboard, a circuit is short-circuited, and testing efficiency is reduced.
In order to achieve the above object, the present invention provides a testing system for a multifunctional motherboard, comprising:
the power supply module is used for supplying power;
the multifunctional main board is connected with the power supply module, and a first driving program and a second driving program are arranged on the multifunctional main board;
the PCI bus is connected with the multifunctional mainboard, a slot module is arranged on the PLC bus, and the PLC bus is used for centralizing each functional module to be electrically connected with the multifunctional mainboard;
the first interface module is connected with the PCI bus and is used for connecting a port of equipment;
the second interface module is connected with the first interface module and is used for connecting another port of equipment;
the processing module is connected with the second interface module and comprises a first driving unit and a second driving unit, the first driving unit is used for testing the first transmission rate of the first interface module, and the second driving unit is used for testing the second transmission rate of the second interface module;
the display module is connected with the processing module and is used for displaying the test condition of each functional module on the multifunctional mainboard;
and the storage module is connected with the display module and is used for storing the data information of the first transmission rate and the second transmission rate.
Optionally, the operating frequency of the PCI bus is between 0 and 33 MHz.
Optionally, the slot module is a memory slot module, and the memory slot module controls the memory type and capacity of the multifunctional motherboard.
Optionally, the transmission rate of the first driver is between 0 and 60MB/s, and the transmission rate of the second driver is between 0 and 2.25 GB/s.
Optionally, a USB interface is arranged on the first interface module, and an HDMI interface is arranged on the second interface module.
Optionally, a warning light is arranged on the display module, and the warning light comprises a red light and a green light.
Optionally, the test system of the multifunctional motherboard further includes a LAN interface, the LAN interface is connected to a local area network, and a transmission rate of the LAN interface is between 0 and 1000M/s.
The invention also provides a test method of the multifunctional mainboard, which comprises the following steps:
(1) the PCI bus is electrically connected with the multifunctional mainboard and each functional module and is connected with a power supply;
(2) ensuring the working frequency of the PCI bus to be between 0 and 33 MHz;
(3) the first driving unit tests a first transmission rate of the first interface module;
(4) judging whether the first transmission rate is between 0 and 60 MB/s;
(5) the second driving unit tests a second transmission rate of the second interface module;
(6) the red light is on, and the test fails;
(7) judging whether the second transmission rate is between 0 and 2.25 GB/s;
(8) the green light is on, and the test is successful;
(9) the red light is on, and the test fails;
(10) the storage module stores data information of the first transmission rate and the second transmission rate.
Optionally, the multifunctional main board is provided with a first driver and a second driver, a transmission rate of the first driver is 0-60MB/s, and a transmission rate of the second driver is 0-2.25 GB/s.
Optionally, the specific step of the step (8) is that when the first driving unit on the processing module tests that the first transmission rate of the first interface module is between 0 and 60MB/s, and the second driving unit tests that the second transmission rate of the second interface module is between 0 and 2.25GB/s, the warning light on the display module is displayed as a green light, and the test is successful, which indicates that the signals of the functional modules are electrically connected to the multifunctional main board in a concentrated manner.
Compared with the prior art, the testing system and the testing method of the multifunctional mainboard of the invention firstly ensure that the PCI bus is electrically connected with the multifunctional mainboard and each functional module, the power supply is switched on, secondly ensure that the working frequency of the PCI bus is between 0-33MHz, then the first driving unit tests whether the first transmission rate is between 0-60MB/s, if the first transmission rate is between 0-60MB/s, the second driving unit tests the second transmission rate, when the second transmission rate is between 0-2.25GB/s, the green light is on, the testing is successful, which indicates that the signals of each functional module are intensively and electrically connected with the multifunctional mainboard, if the first transmission rate is not between 0-60MB/s or the second transmission rate is not between 0-2.25GB/s, the red light is on, the testing is failed, which indicates that the signal transmission is inaccurate and not concentrated on the same multifunctional mainboard, and then, the storage module stores the data information of the first transmission rate and the second transmission rate, and by utilizing the test system and the test method of the multifunctional mainboard, the problems that signal transmission is inaccurate and signals cannot be concentrated on the same control mainboard and circuit short circuit are solved, and the test efficiency of the multifunctional mainboard is greatly improved.
[ description of the drawings ]
Fig. 1 is a schematic diagram of a test system of the multifunctional motherboard of the present invention.
Fig. 2 is a schematic diagram of a testing method of the multifunctional main board of the present invention.
[ detailed description ] embodiments
To further illustrate the technical means and effects of the present invention, the following detailed description is given with reference to a preferred embodiment of the present invention and the accompanying drawings.
Referring to fig. 1 and fig. 2, fig. 1 is a schematic diagram of a testing system of a multifunctional motherboard of the present invention, fig. 2 is a schematic diagram of a testing method of a multifunctional motherboard of the present invention, and the present invention provides a testing system 100 of a multifunctional motherboard, which includes:
a power module 110, wherein the power module 110 is used for supplying power;
the multifunctional motherboard 120 is connected to the power module 110, a first driver 121 and a second driver 122 are provided on the multifunctional motherboard 120, the first driver 121 is used for starting and operating the first interface module 140, and the second driver 122 is used for starting and operating the second interface module 150;
a PCI bus 130, where the PCI bus 130 is connected to the multifunctional motherboard 120, a slot module is disposed on the PLC bus 130, the PLC bus 130 is configured to centralize each functional module to electrically connect to the multifunctional motherboard 120, and the slot module is configured to insert a memory card to increase a memory capacity of the multifunctional motherboard 120;
a first interface module 140, wherein the first interface module 140 is connected to the PCI bus 130, and the first interface module 140 is used for connecting a port of a device;
a second interface module 150, wherein the second interface module 150 is connected to the first interface module 140, and the second interface module 150 is used for connecting another port of a device;
a processing module 160, wherein the processing module 160 is connected to the second interface module 150, the processing module 160 includes a first driving unit 161 and a second driving unit 162, the first driving unit 161 is used for testing a first transmission rate of the first interface module 140, and the second driving unit 162 is used for testing a second transmission rate of the second interface module 150;
a display module 170, wherein the display module 170 is connected to the processing module 160, and the display module 170 is configured to display a test condition of each functional module on the multifunctional motherboard 120;
a storage module 180, where the storage module 180 is connected to the display module 170, and the storage module 180 is configured to store the data information of the first transmission rate and the second transmission rate.
The operating frequency of the PCI bus 130 is between 0 and 33MHz, so as to avoid the short circuit of the multifunctional motherboard 120.
The slot module is a memory slot module, and the memory slot module controls the memory type and capacity of the multifunctional motherboard 120.
The transmission rate of the first driver 121 is between 0 and 60MB/s, and the transmission rate of the second driver 122 is between 0 and 2.25 GB/s.
The first interface module 140 is provided with a USB interface, and the second interface module 150 is provided with an HDMI interface.
The display module 170 is provided with a warning light, the warning light includes a red light and a green light, when the first driving unit 161 tests that the first transmission rate is between 0 and 60MB/s, and the second driving unit 162 tests that the second transmission rate is between 0 and 2.25GB/s, the green light is on, the test is successful, which indicates that the signals of the functional modules are electrically connected to the multifunctional main board 120 in a concentrated manner, and when the first transmission rate is not between 0 and 60MB/s or the second transmission rate is not between 0 and 2.25GB/s, the red light is on, the test is failed, which indicates that the signal transmission is inaccurate and not concentrated on the same multifunctional main board 120.
The testing system 100 of the multifunctional main board further comprises a LAN interface, the LAN interface is connected with a local area network, and the transmission rate of the LAN interface is between 0 and 1000M/s.
The invention also provides a test method of the multifunctional mainboard, which comprises the following steps:
s101: the PCI bus is electrically connected with the multifunctional mainboard and each functional module and is connected with a power supply;
s102: ensuring the working frequency of the PCI bus to be between 0 and 33 MHz;
s103: the first driving unit tests a first transmission rate of the first interface module;
s104: judging whether the first transmission rate is between 0 and 60 MB/s;
s105: the second driving unit tests a second transmission rate of the second interface module;
s106: the red light is on, and the test fails;
s107: judging whether the second transmission rate is between 0 and 2.25 GB/s;
s108: the green light is on, and the test is successful;
s109: the red light is on, and the test fails;
s110: the storage module stores data information of the first transmission rate and the second transmission rate.
The multifunctional main board is provided with a first driving program and a second driving program, the transmission rate of the first driving program is 0-60MB/s, and the transmission rate of the second driving program is 0-2.25 GB/s.
The specific step of step S108 is that when the first driving unit on the processing module tests that the first transmission rate of the first interface module is between 0MB/S and 60MB/S, and the second driving unit tests that the second transmission rate of the second interface module is between 0 GB/S and 2.25GB/S, the warning light on the display module is displayed as a green light, and the test is successful, which indicates that the signals of the functional modules are electrically connected to the multifunctional motherboard in a concentrated manner.
Compared with the prior art, the testing system 100 and the method of the multifunctional motherboard of the invention firstly electrically connect the PCI bus 130 with the multifunctional motherboard 120 and each functional module, switch on the power supply, secondly ensure that the working frequency of the PCI bus 130 is between 0-33MHz, secondly, when the first driving unit 161 tests that the first transmission rate is between 0-60MB/s and the second driving unit 162 tests that the second transmission rate is between 0-2.25GB/s, the green light is on, the testing is successful, which shows that the signals of each functional module are electrically connected to the multifunctional motherboard 120 in a concentrated manner, then the storage module 180 stores the data information of the first transmission rate and the second transmission rate, by using the testing system 100 and the method of the multifunctional motherboard of the invention, the problems that the signal transmission is not accurate and the signals can not be concentrated on the same control motherboard and the circuit is short-circuited are solved, the test efficiency of the multifunctional main board 120 is also greatly improved.
It should be noted that the present invention is not limited to the above embodiments, and any simple modifications of the above embodiments based on the technical solution of the present invention, equivalent changes and modifications are within the scope of the present invention.
Claims (10)
1. A test system for a multifunctional motherboard, comprising:
the power supply module is used for supplying power;
the multifunctional main board is connected with the power supply module, and a first driving program and a second driving program are arranged on the multifunctional main board;
the PCI bus is connected with the multifunctional mainboard, a slot module is arranged on the PLC bus, and the PLC bus is used for centralizing each functional module to be electrically connected with the multifunctional mainboard;
the first interface module is connected with the PCI bus and is used for connecting a port of equipment;
the second interface module is connected with the first interface module and is used for connecting another port of equipment;
the processing module is connected with the second interface module and comprises a first driving unit and a second driving unit, the first driving unit is used for testing the first transmission rate of the first interface module, and the second driving unit is used for testing the second transmission rate of the second interface module;
the display module is connected with the processing module and is used for displaying the test condition of each functional module on the multifunctional mainboard;
and the storage module is connected with the display module and is used for storing the data information of the first transmission rate and the second transmission rate.
2. The system for testing a multifunction motherboard as recited in claim 1, wherein said PCI bus operates at a frequency between 0-33 MHz.
3. The system for testing a multifunction motherboard according to claim 1, wherein the socket module is a memory socket module, and the memory socket module controls the memory type and capacity of the multifunction motherboard.
4. The system for testing a multifunction board according to claim 1, wherein the transmission rate of the first driver is between 0-60MB/s, and the transmission rate of the second driver is between 0-2.25 GB/s.
5. The system for testing a multifunctional motherboard according to claim 1, wherein a USB interface is provided on the first interface module, and an HDMI interface is provided on the second interface module.
6. The system for testing a multifunctional motherboard of claim 1 wherein said display module is provided with a warning light, said warning light comprising a red light and a green light.
7. The system for testing a multifunction motherboard of claim 1 further comprising a LAN interface, said LAN interface connected to a local area network, said LAN interface having a transmission rate of between 0-1000M/s.
8. A test method of a multifunctional mainboard is characterized by comprising the following steps:
(1) the PCI bus is electrically connected with the multifunctional mainboard and each functional module and is connected with a power supply;
(2) ensuring the working frequency of the PCI bus to be between 0 and 33 MHz;
(3) the first driving unit tests a first transmission rate of the first interface module;
(4) judging whether the first transmission rate is between 0 and 60 MB/s;
(5) the second driving unit tests a second transmission rate of the second interface module;
(6) the red light is on, and the test fails;
(7) judging whether the second transmission rate is between 0 and 2.25 GB/s;
(8) the green light is on, and the test is successful;
(9) the red light is on, and the test fails;
(10) the storage module stores data information of the first transmission rate and the second transmission rate.
9. The method for testing a multifunctional motherboard according to claim 8, wherein the multifunctional motherboard is provided with a first driver and a second driver, the transmission rate of the first driver is between 0 and 60MB/s, and the transmission rate of the second driver is between 0 and 2.25 GB/s.
10. The method according to claim 8, wherein the specific step of step (8) is that when the first driving unit on the processing module tests that the first transmission rate of the first interface module is between 0 and 60MB/s, and the second driving unit tests that the second transmission rate of the second interface module is between 0 and 2.25GB/s, the warning light on the display module is displayed as green light, and the test is successful, which indicates that the signals of the respective function modules are electrically connected to the multifunctional motherboard in a concentrated manner.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201911336533.6A CN113094216A (en) | 2019-12-23 | 2019-12-23 | Test system and method of multifunctional mainboard |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201911336533.6A CN113094216A (en) | 2019-12-23 | 2019-12-23 | Test system and method of multifunctional mainboard |
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| CN113094216A true CN113094216A (en) | 2021-07-09 |
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| CN201911336533.6A Pending CN113094216A (en) | 2019-12-23 | 2019-12-23 | Test system and method of multifunctional mainboard |
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| US20060047982A1 (en) * | 2004-08-27 | 2006-03-02 | Incomm Technologies Co., Ltd. | Mult-interface auto-switch circuit and memory device with dual interface auto-switch circuit |
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| US20110037857A1 (en) * | 2009-08-11 | 2011-02-17 | Wistron Corp. | Method, system and test platform for testing output of electrical device |
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