CN113068450B - Automatic test method for pulse modulation waveform parameters - Google Patents
Automatic test method for pulse modulation waveform parameters Download PDFInfo
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- CN113068450B CN113068450B CN201010047955.4A CN201010047955A CN113068450B CN 113068450 B CN113068450 B CN 113068450B CN 201010047955 A CN201010047955 A CN 201010047955A CN 113068450 B CN113068450 B CN 113068450B
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Abstract
The invention discloses an automatic test method of pulse modulation waveform parameters, which adopts an industrial control computer platform and a PCI bus high-speed digitizer to write a special test program and automatically complete the measurement and parameter recording of the pulse modulation signal waveform parameters. An automatic test program of pulse modulation waveform parameters is developed, and the automatic test program comprises an initialization module, a signal acquisition module, a signal analysis module and a parameter output module, wherein the signal analysis module completes the processing of modulation waveform sine wave parameters and modulation waveform pulse parameters. The problems that an original oscilloscope is more in manual operation steps, long in measurement time and troublesome in manual recording during testing are solved. By adopting the method, the parameters of the pulse modulation waveform can be automatically measured, the output module finishes the output of the sine wave frequency f, the amplitude V and the pulse repetition period T of the pulse modulation waveform, the workload of manual testing is reduced, and the measuring time is shortened.
Description
Technical Field
The invention relates to a pulse signal testing method, which is suitable for automatic testing of pulse modulation waveform parameters of communication in an airplane.
Background
The output signal of the su-30M K2 aircraft internal communication and exchange device POCC 2B is a sine wave modulated by periodic pulses (see figure 1), and the sine wave frequency f, the amplitude V and the pulse repetition period T of the modulated signal are three important parameters which need to be detected during product repair.
The traditional test method is to use an oscilloscope to carry out test, firstly, relevant parameters of the oscilloscope are adjusted, so that sine waves are all displayed on a display screen of the oscilloscope and captured, and the frequency and the amplitude of the sine waves are measured by using the 'measuring' function of the oscilloscope; then, the horizontal parameter of the oscilloscope is adjusted to enable the display screen of the oscilloscope to display more than one period of pulse modulation waveform, and the pulse repetition period is measured by utilizing the 'scale' function of the oscilloscope.
The disadvantages of this test method are: the manual operation steps are more, the measurement time is longer, and the manual recording is more troublesome. Therefore, it is necessary to develop a special test method for the pulse modulated sine wave signal output by the above-mentioned product.
Disclosure of Invention
The invention provides a test method, which adopts an industrial control computer platform and a PCI bus-based high-speed digitizer to compile a special test program and automatically complete the measurement and parameter recording of pulse modulation signal waveform parameters.
The automatic test method of pulse modulation waveform parameters includes industrial control computer, adapter and man-machine interface device, and is characterized by that the PCI bus high-speed digital instrument board card is inserted into the industrial control computer, and the automatic test program of pulse modulation waveform parameters is embedded, and said automatic test program includes initialization module, signal acquisition module, signal analysis module and signal output module.
The initialization module completes initialization of the bus high-speed digitizer board card; the signal acquisition module finishes the acquisition of a signal to be detected after passing through the adapter, and comprises the parameter setting of an input port of the signal to be detected and the setting of an acquired signal, wherein the parameter setting of the input port finishes the parameter configuration of a sampling channel and the parameter configuration of a trigger, and the setting of the acquired signal finishes the configuration of a read signal; the signal output module completes the output of amplitude, frequency and period.
The signal analysis module completes the processing of the sine wave parameters and the pulse parameters of the modulation waveform, including audio measurement and pulse measurement, the sine wave parameters of the carrier signal include amplitude and frequency, and the pulse parameters of the modulation signal are pulse repetition periods. The signal analysis module is added with a signal parameter measurement function which comprises three functions of audio measurement, pulse measurement, waveform component acquisition and the like, the measurement of the frequency, the amplitude and the pulse repetition period of the sine wave is completed, the amplitude output by the audio measurement is subjected to product conversion for one time, a multiplicand is defined as a variable which is used as an input variable of a special calling function, and the waveform component acquisition function is used for displaying a waveform and is used in a test program.
The method solves the problems of more manual operation steps and longer measurement time of the test of the pulse modulated sine wave signal, realizes automatic completion, reduces the workload of manual test and shortens the measurement time.
Drawings
FIG. 1 is a waveform diagram of a measured modulated signal
FIG. 2 is a block diagram of a test hardware configuration
FIG. 3 is a signal flow diagram of a test subroutine
Detailed Description
A method for automatically testing pulse modulation waveform parameters is realized by installing a PCI bus high-speed digitizer board card 3 into an IPC-610H industrial control computer 2, installing system software, development software and a drive program carried by the system software, and completing hardware connection between an adapter 1 and a man-machine interface device 4 with the industrial control computer 2 (see figure 2).
The adapter is used for realizing signal connection between a tested product and the high-speed digitizer, the industrial control computer is used for controlling the whole testing process and processing obtained data, and the human-computer interface is used for realizing the bidirectional communication between an operator and the industrial control computer.
1. High-speed digital instrument board card selection
The high-speed digitizer is a built-in functional plug-in card based on a computer standard bus, is suitable for high-speed application, completes the sampling, parameter measurement and output of signals, has the characteristics of selectable input parameters, multiple channels and selectable use of a high-capacity onboard memory with each channel being as high as 256MB and a plurality of built-in measurement and analysis functions, and selects a PCI _5114 high-speed digitizer component board card.
2. Automatic test program
The automatic test program comprises an initialization module, a signal acquisition module, a signal analysis module and a parameter output module. The specific implementation includes an initialization module 5, an input port parameter setting module 6, a collected signal setting module 7, a signal analysis module 8, a parameter output module 9, and a shutdown module 10 (see fig. 3).
The man-machine interface of the automatic test program is compiled by taking application development software LabWindows CVI8.0 as a platform, mainly receives input information of the man-machine interface, completes test flow management and calling of a special calling function generated by a subprogram VI, and realizes automatic test and output of sine wave frequency f, amplitude V and pulse repetition period T parameters of pulse modulation waveforms.
The test subprogram VI takes a graphical development software LabVIEW 7.1 as a platform, and is compiled by using a waveform parameter measurement function in an application software package attached to the high-speed digitizer, so that initialization, parameter measurement and numerical output of the high-speed digitizer board card are completed.
1) An initialization module: initializing the high-speed digitizer board card, including adding an initialization function, and setting the equipment handle of the board card.
2) Input port parameter setting module: the method comprises the steps of setting input port parameters of a high-speed digitizer board card, including adding and configuring parameter functions, including four functions of longitudinal parameter configuration, channel interface characteristic configuration, transverse timely parameter configuration, signal sampling trigger parameter configuration and the like, and defining four variables as input variables of a special calling function.
3) The acquisition signal setting module: the method comprises the steps of selecting the type and parameters of signal reading of a high-speed digitizer board card, including adding a signal reading parameter configuration function, completing parameter setting of an acquisition process, and defining a variable as an input variable of a special calling function.
4) A signal analysis module: the method comprises the steps of completing parameter measurement of sine wave frequency, amplitude and pulse repetition period by using a signal parameter measurement function, completing parameter measurement by adding the signal parameter measurement function, wherein the parameter measurement comprises three functions of audio measurement, pulse measurement and waveform component acquisition function, performing product conversion on the amplitude output by the audio measurement, defining a multiplicand as a variable serving as an input variable of a special calling function, and using the waveform component acquisition function in a test program to acquire waveform parameters for displaying waveforms.
5) A parameter output module: and adding a signal output function to complete the setting of an indication port for outputting the parameter measurement value, wherein the indication port comprises output variables such as amplitude, frequency, modulation period, array variable Y and the like, and the array variable Y is only used in the debugging of the test program.
6) And (3) closing the module: and adding a closing function, and closing the high-speed digitizer board card to finish the test subprogram.
7) And corresponding the input and output variables defined above to the input and output of the special calling function to be produced, and storing the file as a vi file, and then generating a special calling function file which comprises three files, namely an h header file, a lib library file and a dll dynamic link library.
8) The man-machine interface test program calls the generated special call function to realize the input and output control of the tested signal and automatically complete the test of the sine wave modulated signal parameter modulated by the periodic pulse.
Claims (2)
1. A pulse modulation waveform parameter automatic test method comprises an industrial control computer, an adapter and a man-machine interface device, wherein a PCI bus high-speed digitizer board card is inserted into the industrial control computer, and an automatic test module of pulse modulation waveform parameters is embedded;
the automatic test module is characterized by comprising an initialization module, a signal acquisition module, a signal analysis module and a parameter output module:
the initialization module completes initialization of the bus high-speed digitizer board card;
the signal acquisition module finishes the acquisition of a signal to be detected after passing through the adapter, and comprises the parameter setting of an input port of the signal to be detected and the setting of an acquired signal, wherein the parameter setting of the input port finishes the parameter configuration of a sampling channel and the parameter configuration of a trigger, and the setting of the acquired signal finishes the configuration of a read signal;
the signal analysis module completes the processing of sine wave parameters and pulse parameters of the modulated signals, including audio frequency measurement and pulse measurement, wherein the sine wave parameters comprise amplitude and frequency, and the pulse parameters are pulse repetition periods;
the parameter output module completes the output of amplitude, frequency and period.
2. The method of claim 1, wherein:
the signal analysis module is added with a signal parameter measurement function which comprises three functions of audio measurement, pulse measurement, waveform component acquisition and the like, the measurement of the frequency, the amplitude and the pulse repetition period of the sine wave is completed, the amplitude output by the audio measurement is subjected to product conversion for one time, a multiplicand is defined as a variable which is used as an input variable of a special calling function, and the waveform component acquisition function is used for displaying the waveform and is used in the test module.
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111930101A (en) * | 2020-08-11 | 2020-11-13 | 中国科学技术大学 | Automatic control method of digitizer |
CN114076885A (en) * | 2020-08-11 | 2022-02-22 | 合肥本源量子计算科技有限责任公司 | Quantum chip testing method and device |
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2010
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111930101A (en) * | 2020-08-11 | 2020-11-13 | 中国科学技术大学 | Automatic control method of digitizer |
CN114076885A (en) * | 2020-08-11 | 2022-02-22 | 合肥本源量子计算科技有限责任公司 | Quantum chip testing method and device |
CN114076885B (en) * | 2020-08-11 | 2023-12-12 | 本源量子计算科技(合肥)股份有限公司 | Quantum chip testing method and device |
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