CN108470232A - The automatic detecting and analysing system of microwave components based on flow and method - Google Patents
The automatic detecting and analysing system of microwave components based on flow and method Download PDFInfo
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- CN108470232A CN108470232A CN201810073971.7A CN201810073971A CN108470232A CN 108470232 A CN108470232 A CN 108470232A CN 201810073971 A CN201810073971 A CN 201810073971A CN 108470232 A CN108470232 A CN 108470232A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
- G06Q10/00—Administration; Management
- G06Q10/06—Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
- G06Q10/063—Operations research, analysis or management
- G06Q10/0639—Performance analysis of employees; Performance analysis of enterprise or organisation operations
Abstract
The purpose of the present invention is overcome the deficiencies of the prior art and provide a kind of automatic detecting and analysing system of the microwave components based on flow.This technical solution for using of invention for：A kind of automatic detecting and analysing system of microwave components based on flow, including computer, test instrumentation, microwave components are connected with test instrumentation, test instrumentation and computer communication；It is characterized in that：Computer is to utilize the computer of Agilent IO Libraries virtual test technologies and test environment, including user's authorization module, instrument initialization module, automatic flow configuration module, automatic test module, data memory module, operation log recording module, data query analysis module.
Description
Technical field
The invention belongs to microwave components testing field, more specifically a kind of microwave components based on flow are tested automatically
Analysis system and method.
Background technology
With the high speed development of electronic equipment, requirement of the people to the demand and accurate fine degree of electronic equipment is also got over
Come higher therefore also higher and higher for the component order of accuarcy and demand of composition function unit, traditional test method is
It is required through cannot be satisfied.
Traditional manual testing's method requires height to human resources, and test method is single, and test speed is slow, tests yield
Low, test data can have error, and test data need to be manually recorded, cannot achieve the programming count to test data and analysis.
The appearance of electronics Auto-Test System provides accurate test data and realizes statistical analysis, quickly to reduce human cost
Problem is found to solve the problems, such as.But component test system so far is only capable of to the greatest extent realizing one group of parameter progress to component
Test, cannot achieve the configuration component parameter of procedure.
It is therefore desirable to provide a kind of automatic detecting and analysing system of the microwave components based on flow, may be implemented will be different
Microwave components access in Auto-Test System, by visualization window, adjust initial setting up, you can complete all kinds of parameter indexes
Test, and it is for statistical analysis.Present invention proposition has the characteristics that transplantability, versatility are stronger, also has in engineer application
Effect alleviates the pressure of tester, improves the efficiency and accuracy rate of engineering design and test.
Invention content
Purpose of this invention is to overcome the deficiencies of the prior art and provide a kind of microwave components based on flow to test automatically
Analysis system.
To reach above-mentioned purpose, this technical solution for using of invention for：
A kind of automatic detecting and analysing system of microwave components based on flow, including computer, test instrumentation, microwave components and test
Instrument is connected, test instrumentation and computer communication；It is characterized in that：Computer is virtual using Agilent IO Libraries
The computer of test equipment and test environment, including user's authorization module, instrument initialization module, automatic flow configure mould
Block, automatic test module, data memory module, operation log recording module, data query analysis module.
Wherein：Test instrumentation includes subtest instrument and index measurement instrument, and test instrumentation includes input apparatus signal
Source, output equipment frequency spectrograph, power meter lose net, acoustic meter, oscillograph.
The automatic method for testing and analyzing of the above-mentioned microwave components based on flow, includes the following steps：
（1）User authorizes
Tester logins test system by specified account number cipher；
（2）Instrument initializes
Test environment, while the preset test instrumentation for needing to be related to are virtualized using Agilent IO Libraries, will be surveyed
Try the title of instrument, specification, model, parameter and test method initialization；
（3）Automatic flow configures
The test index procedure configuration of assembly module to be tested will be needed, generates configured list, configured list is removable after preserving
It plants and the later stage changes, the configuration flow in configured list includes input parameter：Initial frequency terminates frequency and acquisition points,
Output parameter includes the maximum value of frequency spectrograph, the value of the pulse power of power meter and oscillograph, and configuration flow can realize pause
Function；
（4）Automatic test
The configuration flow defined is loaded, then input module is numbered into computer, and virtual instrument module is loaded into corresponding
Parsing library and process parameter is parsed, then connecting test component, meter is sent to by the information of the collected component
Calculation machine；Test data is stored in the memory of computer；The Excel titles to be generated are inputted in computer, by the survey in memory
Examination data are taken out and are stored in the Excel file template that has defined, while test data being saved in database；
（5）Operation log recording
The time for logining the system of publishing of user is recorded, which operation record user has carried out, which assembly module tested；
（6）Data query is analyzed
Excel titles are selected, the test data for the configuration flow for having tested completion is loaded into, it is for statistical analysis to data.
The automatic detecting and analysing system of the microwave components based on flow of the present invention opens the Agilent IO of computer
Control can obtain the address of each test instrumentation.User predefine need the specifications parameter of microwave components to be tested with
And testing process carries out the later stage later by being obtained after the completion of automatic test in test data storage to system and local
Statistical analysis.Batch may be implemented in the present invention, accurately the parameter specification value of test suite module, and realizes statistical analysis work(
Energy.
Description of the drawings
Fig. 1 is the system physical topological diagram of the specific embodiment of the invention.
Specific implementation mode
The present invention is illustrated in conjunction with attached drawing.
The automatic detecting and analysing system of microwave components based on flow as shown in Figure 1, microwave components have 7 ports, point
Not Lian Jie 3 subtest instrument and 4 index measurement instrument, above-mentioned all kinds of test instrumentations include input apparatus signal source, defeated
Go out device frequency spectrum instrument, power meter loses net, acoustic meter, the equipment such as oscillograph.The test instrumentation of each test suite parameter passes through double
Head GPIB is connected, and GPIB turns USB and is connected with computer, and external connection of computer control keyboard realizes human-computer interaction, and band is gone back on computer
There are Excel diagramming tools.
Software architecture includes computer as business operation end, and Business Logic includes flow configuration, automatic test, generates
Report, data access call database and library to realize.
The automatic detecting and analysing system of the above-mentioned microwave components based on flow includes user's authorization module, and instrument initializes mould
Block, automatic flow configuration module, automatic test module, data memory module, operation log recording module, data query point
Analyse module.
Various pieces are introduced below：
（1）User's authorization module
Tester needs just login test system by specified account number cipher.This ensures that the secrecy and safety in data
Aspect plays an important role.
（2）Instrument initialization module
Test environment, while the preset base for test instruments for needing to be related to are virtualized using Agilent IO Libraries, it will
The title of instrument and equipment, specification, model, parameter and test method initialization.It is ready for test later.
（3）Automatic flow configuration module
The test index procedure of assembly module to be tested can will be needed to configure, generate configured list.After configured list preserves
Portable and later stage modification.Configuration flow in configured list includes input parameter：Initial frequency terminates frequency and collection point
Number etc., output parameter includes the value etc. of the maximum value of frequency spectrograph, the pulse power of power meter and oscillograph.Configuration flow also may be used
It realizes pause function, to facilitate tester to consult and proofread manually, has effectively achieved artificial and automation height fusion.
（4）Automatic test module
The configuration flow defined is loaded, then input module is numbered into computer, and virtual instrument module is loaded onto phase
The parsing library answered simultaneously parses process parameter, and then connecting test component, the information of the collected component is sent to
Computer.
When test pause and completion, system can all provide corresponding prompt, and same testing process system can realize multiple survey
Examination, i.e., another test can be carried out by clicking automatic test after the completion of test again, and test data can be stored temporarily in computer
Memory in；
The Excel titles to be generated are inputted into computer later, the test data in memory can be taken out and be stored in
In the Excel file template defined, while test data being saved in database, is convenient for the inquiry and export in later stage.
（5）Operation log recording
The time for logining the system of publishing of user can be recorded, which operation record user has carried out, which assembly mould tested
Block, to realize that everyone has responsibility, can also urge on tester, while can also improve the accuracy of test data constantly.
（6）Data query is analyzed
By selecting Excel titles, it can be loaded into the test data for the configuration flow for having tested completion, while can be to data
Corresponding statistical analysis is carried out, data can also be exported in corresponding Excel to facilitate tester and other relevant peoples
Member consults.
Claims (3)
1. a kind of automatic detecting and analysing system of microwave components based on flow, including computer, test instrumentation, microwave components and survey
It tries instrument to be connected, test instrumentation and computer communication；It is characterized in that：Computer is empty using Agilent IO Libraries
The computer of quasi- test equipment and test environment, including user's authorization module, instrument initialization module, automatic flow configure mould
Block, automatic test module, data memory module, operation log recording module, data query analysis module.
2. the automatic detecting and analysing system of the microwave components according to claim 1 based on flow, it is characterised in that：Tester
Table includes subtest instrument and index measurement instrument, and test instrumentation includes input apparatus signal source, output equipment frequency spectrograph, work(
Rate meter loses net, acoustic meter, oscillograph.
3. a kind of automatic method for testing and analyzing of microwave components based on flow, includes the following steps：
（1）User authorizes
Tester logins test system by specified account number cipher；
（2）Instrument initializes
Test environment, while the preset test instrumentation for needing to be related to are virtualized using Agilent IO Libraries, will be surveyed
Try the title of instrument, specification, model, parameter and test method initialization；
（3）Automatic flow configures
The test index procedure configuration of assembly module to be tested will be needed, generates configured list, configured list is removable after preserving
It plants and the later stage changes, the configuration flow in configured list includes input parameter：Initial frequency terminates frequency and acquisition points,
Output parameter includes the maximum value of frequency spectrograph, the value of the pulse power of power meter and oscillograph, and configuration flow can realize pause
Function；
（4）Automatic test
The configuration flow defined is loaded, then input module is numbered into computer, and virtual instrument module is loaded into corresponding
Parsing library and process parameter is parsed, then connecting test component, meter is sent to by the information of the collected component
Calculation machine；Test data is stored in the memory of computer；The Excel titles to be generated are inputted in computer, by the survey in memory
Examination data are taken out and are stored in the Excel file template that has defined, while test data being saved in database；
（5）Operation log recording
The time for logining the system of publishing of user is recorded, which operation record user has carried out, which assembly module tested；
（6）Data query is analyzed
Excel titles are selected, the test data for the configuration flow for having tested completion is loaded into, it is for statistical analysis to data.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111007350A (en) * | 2019-12-23 | 2020-04-14 | 成都天箭科技股份有限公司 | Multifunctional instrument control automatic test system and method thereof |
| CN111897736A (en) * | 2020-08-17 | 2020-11-06 | 深圳信息通信研究院 | Cloud architecture-based automatic testing method and system for Internet of things information products |
| CN112180336A (en) * | 2020-09-30 | 2021-01-05 | 云南省大气探测技术保障中心 | Fixed radar fault diagnosis maintenance processing system |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101303379A (en) * | 2008-05-07 | 2008-11-12 | 中国电子科技集团公司第十研究所 | Method for measuring single terminal port test microwave cavity filter interstage coupling coefficient |
| CN103063957A (en) * | 2012-12-28 | 2013-04-24 | 成都泰格微电子研究所有限责任公司 | Surface mounting microwave component automatic test system |
| CN104076214A (en) * | 2014-06-11 | 2014-10-01 | 南京第五十五所技术开发有限公司 | Multi-channel microwave module automatic test method |
| KR101576433B1 (en) * | 2014-07-30 | 2015-12-11 | 이정환 | Method and apparatus for detecting an abnormally operating device comparing to other devices |
| CN204989336U (en) * | 2015-08-05 | 2016-01-20 | 中国电子科技集团公司第四十一研究所 | Microwave subassembly remote control and measurement system based on long -range desktop |
| CN105699826A (en) * | 2016-04-06 | 2016-06-22 | 中国电子科技集团公司第十三研究所 | Microwave device automatic testing system and method |
-
2018
- 2018-01-25 CN CN201810073971.7A patent/CN108470232A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101303379A (en) * | 2008-05-07 | 2008-11-12 | 中国电子科技集团公司第十研究所 | Method for measuring single terminal port test microwave cavity filter interstage coupling coefficient |
| CN103063957A (en) * | 2012-12-28 | 2013-04-24 | 成都泰格微电子研究所有限责任公司 | Surface mounting microwave component automatic test system |
| CN104076214A (en) * | 2014-06-11 | 2014-10-01 | 南京第五十五所技术开发有限公司 | Multi-channel microwave module automatic test method |
| KR101576433B1 (en) * | 2014-07-30 | 2015-12-11 | 이정환 | Method and apparatus for detecting an abnormally operating device comparing to other devices |
| CN204989336U (en) * | 2015-08-05 | 2016-01-20 | 中国电子科技集团公司第四十一研究所 | Microwave subassembly remote control and measurement system based on long -range desktop |
| CN105699826A (en) * | 2016-04-06 | 2016-06-22 | 中国电子科技集团公司第十三研究所 | Microwave device automatic testing system and method |
Non-Patent Citations (4)
| Title |
|---|
| 周明星: "基于虚拟仪器的微波组件测试系统设计", 《中国优秀博硕士学位论文全文数据库（硕士）工程科技II辑》 * |
| 李俊生: "微波组件自动测试系统的研究", 《长沙通信职业技术学院学报》 * |
| 王婷婷等: "基于GPIB的自动测试系统设计", 《电子测量技术》 * |
| 盛永鑫: "T/R组件自动测试系统", 《国外电子测量技术》 * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111007350A (en) * | 2019-12-23 | 2020-04-14 | 成都天箭科技股份有限公司 | Multifunctional instrument control automatic test system and method thereof |
| CN111897736A (en) * | 2020-08-17 | 2020-11-06 | 深圳信息通信研究院 | Cloud architecture-based automatic testing method and system for Internet of things information products |
| CN111897736B (en) * | 2020-08-17 | 2023-08-04 | 深圳信息通信研究院 | Automatic testing method and system for Internet of things information product based on cloud architecture |
| CN112180336A (en) * | 2020-09-30 | 2021-01-05 | 云南省大气探测技术保障中心 | Fixed radar fault diagnosis maintenance processing system |
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